Hioki ST5680 Communications Command Instruction Manual

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ST5680

HIOKI ST5680A966-00

Communications Command

DC HIPOT TESTER

Instruction Manual

Dec. 2022 Edition 1 ST5680A966-00 22-12H

This manual explains the communication commands for Model ST5680 DC Hipot



Tester. Please refer to the instruction manual for Model ST5680 for details regarding



command settings. Although all reasonable care has been taken in the production of this manual,



should you nd any points which are unclear or in error, please contact your local

distributor or the HIOKI International Sales Department at os-com@hioki.co.jp. In the interest of product development, the contents of this manual may be subject



to revision without notice.

Unauthorized copying and replication of the contents of this instruction manual are



Contents

HIOKI ST5680A966-00

1 Introduction ............................................................................................................................................. 2

Message Format ..................................................................................................................................... 2

Output Queue and Input Buffer ............................................................................................................. 6

Status Byte Register .............................................................................................................................. 7

Event Resisters ....................................................................................................................................... 9

Response Format ................................................................................................................................. 14

Measured Value in case of Measurement Error ................................................................................ 18

Item to return to Initial State ................................................................................................................ 18

Errors during Communication ............................................................................................................ 18

2 Message List .......................................................................................................................................... 19

3 Message Reference............................................................................................................................... 28

Standard Commands ........................................................................................................................... 29

Event Register ....................................................................................................................................... 33

Tes t M o de .............................................................................................................................................. 34

Withstand Voltage Test ........................................................................................................................ 35

Insulation Resistance Test .................................................................................................................. 43

Program Test ......................................................................................................................................... 49

BDV Measurement ................................................................................................................................ 56

Test Common ........................................................................................................................................ 62

Panel Memory ....................................................................................................................................... 66

Data Memory ......................................................................................................................................... 70

EXT. I/O ................................................................................................................................................... 72

System ................................................................................................................................................... 74

Run ......................................................................................................................................................... 81

Measured Value Output ........................................................................................................................ 82

On-Screen Display ................................................................................................................................ 99

Screen Saving ..................................................................................................................................... 103

File Saving ........................................................................................................................................... 104

Communication ................................................................................................................................... 112

Compatibility Mode............................................................................................................................. 118

4 List of Initialization Items ................................................................................................................... 119

5 Sample programs ................................................................................................................................ 123

Created in Visual C#

6 Device Compliance Requirements [GP-IB] ...................................................................................... 133

......................................................................................................................... 123

1 Introduction

HIOKI ST5680A966-00

When creating a program, using the command monitor function displays commands and responses on the measurement screen. For command monitor function, please see the instruction manual of this instrument.

Various messages are provided to control the instrument in the interface. Messages include program messages sent from a computer or other controller to the instrument and response messages sent from the instrument to the controller.

Program Messages

Controller Instrument

Response Messages

Communication commands are classified as follows.

Program Messages

Communication

commands

Response Messages

Command Messages

Query Messages

Commands with data should be entered in the specified data format.

Message Format

 Program Messages

Program messages can be divided into command and query messages.

(1) Command Messages

Instruction to control equipment such as equipment setting and reset (Example) Instruction to set momentary out function

:SYSTem:MOMentary:OUT 1

Header section Space Data part

(2) Query Messages

Instructions to query operation results, measurement results, or equipment setting status (Example) Instruction to query momentary out function

:SYSTem:MOMentary:OUT?

Header section Question mark

See “Header” (p. 3), “Separator” (p. 4), and “Data part” (p. 5).

HIOKI ST5680A966-00

 Response Messages

Receives a query message and creates it when the syntax is checked. If any error occurs when a query message is received, no response message will be created to match that query message.

 Command Syntax

Command names are chosen for instructions that are as understandable as possible to the function to be executed, and yet can be shortened. The mandate name itself is called the “long form” and its shortened form is called the “short form”. This document describes the part of the short form as a large character and the rest in small letters, but accepts either large or small characters.

START OK (Long form) STAR OK (Short form) STA Error

The response message from the instrument is returned in a large character long form.

Headers



A header is always required for program messages.

(1) Command Program Header

There are three types: simple command type, compound command type, and Standard Command type.

• Simple Command type Header

• Combined Command type Header

• Standard Command type Header

(2) Query Program Header

Used to query the result of an action to a device command, the result of a measurement, or the current device setting status. As in the example below, the question mark

:S TATe ? :SYSTem:MOMentary:OUT?

Header consisting of a single word beginning with an English letter

:STOP

Header consisting of multiple simple command type headers separated by colon (:)

:SYSTem:MOMentary:OUT

A header starting with an asterisk ‘software’ indicating that it is a Standard Command (provided by IEEE

488.2)

∗RST

(?) is attached at the end of the program header.

HIOKI ST5680A966-00

 Message Terminators

The instrument accepts the following as a message terminator (delimiter).

[RS-232C/USB/LAN]

• CR

• LF

• CR+LF

[GP-IB]

•

• LF

• CR+LF

• EOI

• EOI with CR

• EOI with LF

• EOI with CR+LF

In addition, the following can be selected as terminators for response messages, depending on the interface settings. For settings, see “Setting for message terminators” (p.113, p.113 , p.11 5 , p.116).

[RS-232C/USB/LAN]

• CR

• LF

• CR+LF

[GP-IB]

•

• EOI with LF

• EOI with CR+LF

EOI with CR

 Separators

(1) Message Unit Separator

Multiple messages can be written on a single line by connecting each with a semicolon (;).

:SYSTem:MOMentary:OUT 1;∗IDN?

If the message is described continuously, if an error occurs in the sentence, message from after that to the

•

message terminator will not be executed.

(2) Header Separator

Messages with headers and data are separated into the header and data parts by using a blank (ASCII code 20h).

:SYSTem:MOMentary:OUT 1

(3) Data Separator

Messages with multiple data separate between data by comma (,).

:SYSTem:DATE 22,1,1

HIOKI ST5680A966-00

 Data Formats

The instrument uses “character data,” “decimal numeric value data,” and “string data” in the data section, and is more used to commands.

(1) Character Data

It is data that always starts with English letters and consists of English letters and numbers. Character data accepts both large and small characters, but response messages from this instrument are always returned in large letters. In the Command data part <1/0/ON/OFF >, for 0 is OFF, 1 behaves similar to ON, query response OFF is 0, ON is 1.

:SYSTem:MOMentary:OUT OFF

(2) Decimal Numeric Value Data

Numerical data formats include NR1, NR2, and NR3 formats. Each accepts both signed and unsigned numerical values. For unsigned numerical value treat as a positive numerical value. If the precision of the numerical value exceeds the handling range of the instrument, it is rounded off.

• NR1 integer data (Example: +12, -23, 34)

• NR2 decimal data (Example: +1.23, -23.45, 3.456)

• NR3 floating point exponential display data (Example: +1.0E-2、-2.3E+4))

A format that includes all three of these types is called an “NRf format.” For response data, the format is specified for each command and sent in that format.

:CONFigure:WITHstand:VOLTage:LEVel 11

:MONitor:VOLTage?

(3) String Data

[GP-IB]

8.400E+03

String data surrounds the front and rear with a quota mark.

•

• Data consisting of 8 bit ASCII characters.

• Characters that can not be handled by this instrument are an error.

• Quotation mark, transmission from this instrument is only double quote (") but reception accepts both double quote and single quote (').

:FILE:NAME "D ATA "

This instrument is not fully compatible with IEEE 488.2. As much as possible, use the data shown in the reference.

HIOKI ST5680A966-00

 Omission of Compound Command type Header

What the leading parts of the compound commands are common (example: :SYSTem:BEEPer:

VOLume:PASS

command (example:

This common part is called the “current path,” and until it is cleared, subsequent commands are analyzed as if the “current path” is omitted.

and :SYSTem:BEEPer:VOLume:FAIL) can omit the common part of the

:SYSTem:BEEPer:VOLume) only if they continue to describe them.

The following example illustrates the use of the current path.

Usual notation

:SYSTem:BEEPer:VOLume:PASS 1; :SYSTem:BEEPer:VOLume:FAIL 5

Abbreviated notation

:SYSTem:BEEPer:VOLume:PASS 1; FAIL 5

This is the current path and can be omitted in the following commands.

The current path can be a power-up, a reset by keystroke, or a colon (:) at the beginning of the command and clears on detection of message terminators. Messages of the Standard Command type can be executed regardless of the current path. It also does not affect the current path.

Simple and compound command type headers do not need to be prefixed with a colon (:). However, to prevent confusion with abbreviations and malfunctions, we recommends prefixing the command with (:).

Output Queue and Input Buffer

Output Queue



The response message is stored in the output queue and cleared when the controller reads the data. Otherwise, the output queue is cleared when

• Power-on

• Device clear [GP-IB].

• Query of error

Input Buffer



The capacity of the input buffer is 1460 bytes. When the buffer runs out of space, the operation stops until that space becomes available.

NOTES: The length of a single line of command should be less than 1460 bytes.

bit7 bit6

bit5 bit4 bit3 bit2 bit1 bit0

SRQ

MSS

& →

Disjunction

← & & & & &

bit7 bit6

bit5 bit4 bit3 bit2 bit1 bit0

Service Requests

(SRER)

HIOKI ST5680A966-00

Status Byte Register

[GP-IB]

This instrument uses the status model specified in IEEE 488.2 for the part related to serial polling by the Service Request function. An event is a matter that causes a Service Request to occur.

Standard Event Status Register information Service Request Information on output queue data Information on Event Status Register 0 generation of SRQ Error occurrence information

Unused

↓ ↑ ↓ ↓ ↓ ↓ ↓ ↓

↑ ↑ ↑ ↑ ↑ ↑ ↑

Unused 0

ESB MAV Unused ERR Unused ESB0

Conceptual diagram of Service Request generation

Status Byte Register (STB)

Enable Register

The Status Byte Register is set to the event register and output queue information. From among this information, the Service Request enable register allows you to select what you need. If the selected information is set, bit 6 (MSS Master Summary Status bit) of the Status Byte Register is set, generating an SRQ (Service Request) message, which in turn generates a Service Request.

NOTES: SRQ (Service Request) is a GP-IB only function.

However, STB (Status Byte Register) information can also be obtained via RS-232C/USB/LAN by using the ∗STB? command.

STB (Status Byte Register) information can be obtained by using the

∗STB? command.

[RS-232C/USB/LAN]

RS-232C/USB/LAN does not have the ability to generate Service Requests. However, it is possible to set SRER and read STB.

bit7

Unused

When a

Represents the logical OR of the other bits in the Status Byte Register (STB).

Standard Represents the logical OR of the It is cleared when the output by the *ESR? command.

Message It is set to “1” when there is a message in the output queue.

bit3

Unused

Error bit If there is error information, it is set to It is reset when error information is output by the :SYSTem:ERRor? command.

bit1

Unused

Event summary (logical OR) bit 0 Represents the logical OR of Event Status Register 0.

HIOKI ST5680A966-00

 Status Byte Register (STB)

The Status Byte Register is an 8-bit register that is output from the instrument to the controller when performing serial polls. The MSS bit is set to “1” when any bit in the Status Byte Register changes from “0” to “1” among the bits set to be available in the Service Request enable register. At the same time, the SRQ bit is set to “1” and a Service Request is generated.

The SRQ bit is always synchronized with the Service Request and is read only when it is serially polled and cleared at the same time. The MSS bit is only read by the

∗CLS command, for example.

∗STB? query, but is not cleared until the event is cleared by the

SRQ

bit6

MSS

bit5 ESB

bit4 MAV

bit2 ERR

bit0 ESB0

Service Request is sent out, it is set to “1”.

Event summary (logical OR) bit

Standard Event Status Register.

Standard Event Status Register value is

-available

“1”.

Service Request Enable Register (SRER)



The Service Request Enable Register is a register that allows each bit to be “1” the corresponding bits in the Status Byte Register become available.

HIOKI ST5680A966-00

Event Resisters

Power-On Flag

It is set to restored from a power failure.

Not used in this unit.

User Request

Command error (Ignore commands up to the message terminator)

It is set to received command.

•

• When a command that does not exist in this instrument is received

Execution error

It is set to some reason.

•

• If another function is running and cannot be performed

Equipment-Dependent Error

It is set to reasons other than command error, query of error, or execution error.

Query

It is set to queue.

•

• If data in the output queue is lost

Not used in this unit.

Request Control

Completion of Operation

•

completed

HIOKI ST5680A966-00

Standard Event Status Register (SESR)



The Standard Event Status Register is an 8-bit register. When any bit in the Standard Event Status Register is set to “1” among the bits set to be available in the Standard Event Status Enable Register, bit 5 (ESB) in the Status Byte Register is set to “1”.

See “Standard Event Status Register (SESR) and Standard Event Status Enable

(p.11)

The contents of the Standard Event Status Register are cleared when:

• When the ∗CLS command is executed

• When an event register query is executed (∗ESR?)

• When the power is turned on again

bit7 PON

bit6

bit5 CME

bit4 EXE

bit3 DDE

URQ

(Unused)

“1” when the power is turned on or when the power is

“1” when there is a grammatical or semantic error in the

Errors in the program header If the number of data is different from that specified If the data format is different from that specified

“1” when the received command cannot be executed for

If the specified data is outside the setting range If the specified data cannot be set

“1” when the command could not be executed due to

Error (Clears the output queue)

“1” when an error occurs in processing related to the output

bit2 QYE

When data overflows the output queue

bit1

bit0 OPC

RQC

(Unused)

When the ∗OPC command is executed When the operation of all messages up to the *OPC command is

Status Byte Register (STB)

SRQ

MSS

Standard Event Status Register (SESR)

PON

URQ

CME

EXE

DDE

QYE

RQC

OPC

Standard Event Status Enable Register (SESER)

HIOKI ST5680A966-00

Standard Event Status Enable Register (SESER)



The Standard Event Status Enable Register enables the corresponding bit in the Standard Event Status Register by setting each bit to “1”.

Standard Event Status Register (SESR) and Standard Event Status Enable Register (SESER)

bit6 bit5 bit4

ESB M AV

bit7 bit6 bit5 bit4 bit3 bit2 bit1 bit0

↑

Disjunction ← & & & & & & & &

PON URQ CME EXE DDE QYE RQC OPC

↓ ↓ ↓ ↓ ↓ ↓ ↓ ↓

↑ ↑ ↑ ↑ ↑ ↑ ↑ ↑

bit7 bit6 bit5 bit4 bit3 bit2 bit1 bit0

Unique Event Status Register 0 (ESR0)

bit7 - Unused

bit6 - Unused

bit5 - Unused

bit4 - Unused

bit3

EOM

Test completed

bit2

LFAIL

LOWER FAIL judgment

bit1

UFAIL

UPPER FAIL judgment

bit0

PASS

PASS judgment

Status Byte Register (STB)

bit2 bit1 bit0

ESB0

Event Status Register 0 (ESR0)

bit7 bit6 bit5 bit4 bit3 bit2 bit1 bit0

Disjunction & & & & & & & &

bit7 bit6 bit5 bit4 bit3 bit2 bit1 bit0

Event Status Enable Register 0 (ESER0)

Read

Write

*STB?

*SRE?

*SRE

*ESR?

Standard Event Status Enable Register

*ESE?

*ESE

:ESR0?

:ESE0?

:ESE0

HIOKI ST5680A966-00

Unique Event Status Register (ESR0)



A single Event Status register is provided to manage the instrument's events. The Event Status register is an 8-bit register.

If any bit in the Event Status register is set to “1” among the bits set to be available in the Event Status enable register, the following occurs.

• For Event Status Register 0: Bit 0 (ESB0) of the Status Byte Register (STB) is “1”.

The contents of Event Status register 0 are cleared when:

• When the CLS command is executed

• When an event register query is executed (:ESR0?)

•

When the power is turned on again

Event Status Register 0 (ESR0) and Unique Event Status Enable Register 0 (ESER0)

↓ ↓ ↓ ↓ ↓ ↓ ↓ ↓

↑ ↑ ↑ ↑ ↑ ↑ ↑ ↑

Unused Unused Unused Unused

Read/Write Each Register



Status Byte Register

Service Request Enable Register

EOM LFA IL UFAIL PASS

Standard Event Status Register

Event Status Register 0

Event Status Enable Register 0

Commands

Contents

GTL

Go To Local

The remote state is released and the local state is set.

LLO

Local Lock Out

All keys, including local keys, are rendered inoperable.

DCL

Device CLear

Clears the input buffer and output queue.

Device Clear

Trigger

HIOKI ST5680A966-00

GP-IB Commands



The interface function allows the following commands to be used.

SDC Selected

GET Group Execute

Clears the input buffer and output queue.

When in READY state, the test is started.

Positive value

□ □ □ . □ □ □ . □ □ .

□

D C

Positive value

□ □ □ □

□ □ □

□ □

□

Positive value

□ □ □ . □ □ □ □ □ . □ □ □ □ . □ □

□

Positive value

□ □ □ □ □ □ □ □ □

Negative value

- □ □ □ □ - □ □ □ - □ □

Positive

value

□ □

□

Positive value

□ □ □ □ □ . □ □ .

□

HIOKI ST5680A966-00

Response Format

• Interval time (withstand voltage test, insulation resistance test), remaining test time (withstand voltage test, insulation resistance test), elapsed test time (withstand voltage test, insulation resistance test, BDV measurement)

Units: s, NR2 numerical format

• Test frequency (withstand voltage test, BDV measurement)

Test voltage (withstand voltage test), initial voltage (BDV measurement), end voltage (BDV measurement), voltage

step (BDV measurement), median breakdown voltage (BDV measurement), average breakdown voltage (BDV measurement)

Unit: V, NR1 numerical format

• Dielectric breakdown voltage standard deviation (BDV measurement)

Units: V, NR2 numerical format

• Test voltage (insulation resistance test)

Unit: V, NR1 numerical value format

• Start voltage (withstand voltage test)

Unit: %, NR1 numerical value format

• Test time (withstand voltage test, insulation resistance test), voltage rise time (withstand voltage test, insulation resistance test), voltage fall time (withstand voltage test, insulation resistance test)

Units: s, NR1 or NR2 numerical value format

Positive value

□ □ . □ □ .

□

Positive value

□ □ □ . □ □ □ . □ □ □ . □ □

□

value

□ □

□

Positive value

□ □ □ □ □ □ □ □ □ □ □ □ . □ □ □ . □ □ □ . □ □ □ □ . □ □ □ □ □ . □ □ □ □

□

Positive value

□ □ . □ □ □ . □

□

Positive value

□ □ □ □ □ □ □ □ □ □ □ . □ □

Positive value

□ □ □ □ □

□

HIOKI ST5680A966-00

• Judgment waiting time (withstand voltage test, insulation resistance test)

Units: s, NR2 numerical value format

• Test upper limit (withstand voltage test), test lower limit (withstand voltage test), current upper limit reference value (BDV measurement)

Units: mA, NR2 numerical value format

• Upper current limit of ARC discharge detection function (withstand voltage test, BDV measurement)

Positive

Unit: %, NR1 numerical value format

• Test upper limit (insulation resistance test), test lower limit (insulation resistance test)

Units: MΩ, NR1 or NR2 numerical value format

• Distance between electrodes (BDV measurement)

Units: mm, NR2 numerical value format

• Voltage rise rate (BDV measurement)

Units: V/s, NR1 or NR2 numerical value format

• Voltage holding time for each step (BDV measurement)

Units: s, NR1 numerical value format

Positive value

□ □ □ . □ □ □ □ □ . □ □ □ □ . □ □

□

Positive value

□ □ □ . □ □ □ □ □ . □ □ □ □ . □ □

□

Positive value

□ □ □ . □ □ □ . □ □ .

□

W I R B D V

R A T E S T E

□ □ □ □ - □ □ - □ □ □ □ : □ □ : □ □

P A S S U F A I L L F A I L U L F A I L O F F

P A S S F A I

N O N E P A S S F A I

Positive

value

□

HIOKI ST5680A966-00

• Median dielectric breakdown strength (BDV measurement), average dielectric breakdown strength (BDV measurement)

Units: kV/mm NR2 numerical value format

• Dielectric breakdown voltage standard deviation (BDV measurement)

Units: V/mm NR2 numerical value format

• Judgment threshold value for contact check (withstand voltage test, insulation resistance test)

Units: nF, NR2 numerical value format

• Test mode

• Te s t method (BDV measurement)

• Test start date and time

• Judgment result

• Test results (programmed test mode)

• Contact check judgment result

• Timer type

NR1 numerical value format

3 0 0 u A 3 m A 3 0 m A 3 0 0 m A N O N E

1 0 0 k o h m 1 M o h m 1 0 M o h m 1 0 0 M o h m 1 G o h m 1 0 G o h m 1 0 0 G o h m N O N E

Positive value

□ . □ □ □ E ± □

□

Negative value

- □ . □ □ □ E ± □

□

Positive value

□ . □ □ □ E ± □

□

Positive value

□ . □ □ □ E ± □

□

Positive value

□ . □ □ □ E ± □

□

Positive value

□ . □ □ □ E ± □

□

Positive value

□ □ □ □ □

□

HIOKI ST5680A966-00

• Measuring range (withstand voltage test)

• Measuring range (insulation resistance test)

• Voltage measurements (withstand voltage test, insulation resistance test)

Unit: V, NR3 numerical value format

• Measured voltage (BDV measurement)

Unit: V, NR3 numerical value format

• Measured current (withstand voltage test, insulation resistance test, BDV measurement), offset cancellation

correction value (withstand voltage test)

Unit: A, NR3 numerical value format

• Resistance measurements (withstand voltage test, insulation resistance test), offset cancellation correction values

(insulation resistance test)

Unit: Ω, NR3 numerical value format

• Contact check correction value (withstand voltage test, insulation resistance test), contact check measurement value

(withstand voltage test, insulation resistance test)

Unit: F, NR3 numerical value format

• Number of points (measured value voltage, measured value current, measured value resistance)

NR1 numerical value format

turned on

(GP-IB only)

Device-Specific Features (test conditions, correction values, etc.)

Output Queue

✓

Input Buffer

✓

Status Byte Register

✓

Event Register

Enable Register

✓

- - -

Current Path

✓

HIOKI ST5680A966-00

Measured Value in case of Measurement Error

• Overflow

1.000E+24 or the maximum value of the measurement range

• Underflow

0.000E+00

• Auto range no judgment

3.333E+33

*1. Depending on the setting for the measured value at the time of range-over *2. Waveform data and trend data are not dependent on the setting for the measured value at the time of

range-over 1.000E+24

Item to return to Initial State

item

When the

power is

*1 *2

Reset the

instrument

*RST

command

Device

clear

*CLS

command

✓

*1. Clear MAV bit (bit4) only. *2. Clear all bits except the MAV bit. *3. Except for the PON bit (bit7).

Errors during Communication

Executing a message in the following cases, it will result in an error.

• Command error

If the spelling of the message is incorrect If the data portion of the command or query is in the wrong format

• Query of error

When the controller is unable to send a response message because the instrument is in a state where it cannot receive the message

• Run error

When set with data other than the specified character or numerical value data

✓

- -

✓

Classification

Communication commands

Feature

Reference

Standard

*CLS

Clear Event Status Register

p. 29

*IDN?

Inquiry of device ID (identification code)

p. 29

*OPC

After all running operations are completed, set the Operation Complete bit in the Standard Event Status Register (SESR) to 1.

p. 29

*OPC?

Respond 1 after all running operations are completed.

p. 29

*OPT?

Query of installed options

p. 30

*RST

Initialization of equipment

p. 30

*TRG

Start of test

p. 30

*TST?

Run self-test and query of result

p. 30

*WAI

After command processing is completed, subsequent commands are executed.

p. 31

*ESE

Standard Event Status Enable Register (SESER) setting

p. 31

*ESE?

Standard Event Status Enable Register (SESER) query

p. 31

*ESR?

Standard Event Status Register (SESR) query

p. 31

*SRE

Service Request Enable Register (SRER) setting

p. 32

*SRE?

Service Request Enable Register (SRER) query

p. 32

*STB?

Status Byte Register (STB) query

p. 32

Event Register

:ESE0

Event Status Enable Register 0 (ESER0) setting

p. 33

:ESE0?

Event Status Enable Register 0 (ESER0) query

p. 33

:ESR0?

Event Status Register 0 (ESR0) query

p. 33

Te s t Mode

:MODE

Test mode setting

p. 34

:MODE?

Test mode query

p. 34

Withstand Voltage

:CONFigure:WITHstand:STEP:INTerval

Setting for the interval time for withstand voltage test

p. 35

:CONFigure:WITHstand:STEP:INTerval?

Query of interval time for withstand voltage test

p. 35

:CONFigure:WITHstand:VOLTage:LEVel

Setting for test voltage for withstand voltage test

p. 35

:CONFigure:WITHstand:VOLTage:LEVel?

Query of test voltage for withstand voltage test

p. 35

:CONFigure:WITHstand:VOLTage:STARt

Setting for the starting voltage for withstand voltage test

p. 36

:CONFigure:WITHstand:VOLTage:STARt?

Query of the starting voltage for withstand voltage test

p. 36

:CONFigure:WITHstand:TIMer

Setting for the test time for withstand voltage test

p. 36

:CONFigure:WITHstand:TIMer?

Query of the test time for withstand voltage test

p. 36

:CONFigure:WITHstand:RISE:TIMer

Setting for the voltage rise time for withstand voltage test

p. 37

:CONFigure:WITHstand:RISE:TIMer?

Query of the voltage rise time for withstand voltage test

p. 37

:CONFigure:WITHstand:FALL:TIMer

Setting for the voltage drop time for withstand voltage test

p. 37

HIOKI ST5680A966-00

2 Message List

Commands

Test

Classification

Communication commands

Feature

Reference

:CONFigure:WITHstand:FALL:TIMer?

Query of the voltage drop time for withstand voltage test

p. 37

:CONFigure:WITHstand:JUDGment:DELay

Setting for the judgment waiting time for withstand voltage test

p. 38

CONFigure:WITHstand:JUDGment:DELay?

Query of judgment waiting time for withstand voltage test

p. 38

:CONFigure:WITHstand:LIMit:UPPer

Setting for the upper test limit for withstand voltage test

p. 38

:CONFigure:WITHstand:LIMit:UPPer?

Query of the upper test limit for withstand voltage test

p. 38

:CONFigure:WITHstand:LIMit:LOWer

Setting for the lower test limit for withstand voltage test

p. 39

:CONFigure:WITHstand:LIMit:LOWer?

Query of the lower test limit for withstand voltage tests

p. 39

CONFigure:WITHstand:LIMit:LOWer:STATe

ON/OFF setting of the lower test limit for withstand voltage test

p. 39

:CONFigure:WITHstand:LIMit:LOWer:STATe?

Query of ON/OFF of the lower test limit for withstand voltage test

p. 39

:CONFigure:WITHstand:ARC:STATe

Setting for the ARC discharge detection function for withstand voltage test

p. 40

:CONFigure:WITHstand:ARC:STATe?

Query of the ARC discharge detection function for withstand voltage test

p. 40

:CONFigure:WITHstand:ARC:LIMit

Setting for the upper current limit of the ARC discharge detection function for withstand voltage test

p. 40

:CONFigure:WITHstand:ARC:LIMit?

Query of the upper current limit value of the ARC discharge detection function for withstand voltage test

p. 41

:CONFigure:WITHstand:OFFSet:CANCel

Setting for the offset cancel function for withstand voltage test

p. 41

:CONFigure:WITHstand:OFFSet:CANCel?

Query of the offset cancel function for withstand voltage test

p. 41

:CONFigure:WITHstand:OFFSet:CANCel:V ALue?

Query of offset cancellation correction value for withstand voltage test

p. 41

:CONFigure:WITHstand:CONTactcheck:TH

Setting for the threshold value for judging contact checks in withstand voltage test

p. 42 :CONFigure:WITHstand:CONTactcheck:TH Reshold?

Query of the threshold value for judging contact checks in withstand voltage test

p. 42

:CONFigure:WITHstand:CONTactcheck:VA Lue?

Query of the contact check correction value for withstand voltage test

p. 42

Insulation

:CONFigure:INSulation:STEP:INTerval

Setting for the interval time for insulation resistance test

p. 43

:CONFigure:INSulation:STEP:INTerval?

Query of interval time for insulation resistance test

p. 43

:CONFigure:INSulation:VOLTage:LEVel

Setting for test voltage for insulation resistance test

p. 43

:CONFigure:INSulation:VOLTage:LEVel?

Query of test voltage for insulation resistance test

p. 43

:CONFigure:INSulation:TIMer

Setting for the test time for insulation resistance test

p. 44

:CONFigure:INSulation:TIMer?

Query of the test time for insulation resistance test

p. 44

:CONFigure:INSulation:RISE:TIMer

Setting for the voltage rise time for insulation resistance test

p. 44

:CONFigure:INSulation:RISE:TIMer?

Query of the voltage rise time for insulation resistance test

p. 44

:CONFigure:INSulation:FALL:TIMer

Setting for the voltage drop time for insulation resistance test

p. 45

:CONFigure:INSulation:FALL:TIMer?

Query of the voltage drop time for insulation resistance test

p. 45

HIOKI ST5680A966-00

Reshold

Resistance Test

Classification

Communication commands

Feature

Reference

:CONFigure:INSulation:JUDGment:DELay

Setting for the judgment waiting time for insulation resistance test

p. 45

:CONFigure:INSulation:JUDGment:DELay?

Query of judgment waiting time for insulation resistance test

p. 45

:CONFigure:INSulation:LIMit:UPPer

Setting for the upper test limit for insulation resistance test

p. 46

:CONFigure:INSulation:LIMit:UPPer?

Query of the upper test limit for insulation resistance test

p. 46

:CONFigure:INSulation:LIMit:UPPer:STATe

ON/OFF setting of the upper test limit for insulation resistance test

p. 46

:CONFigure:INSulation:LIMit:UPPer:STATe?

Query of ON/OFF of the upper test limit for insulation resistance test

p. 46

:CONFigure:INSulation:LIMit:LOWer

Setting for the lower test limit for insulation resistance test

p. 47

:CONFigure:INSulation:LIMit:LOWer?

Query of the lower test limit for insulation resistance test

p. 47

:CONFigure:INSulation:OFFSet:CANCel

Setting for the offset cancel function for insulation resistance test

p. 47

:CONFigure:INSulation:OFFSet:CANCel?

Query of the offset cancel function for insulation resistance test

p. 47

:CONFigure:INSulation:OFFSet:CANCel:VA Lue?

Query of offset cancellation correction value for insulation resistance test

p. 48

:CONFigure:INSulation:CONTactcheck:TH

Setting for the threshold value for judging contact checks in insulation resistance testing

p. 48

:CONFigure:INSulation:CONTactcheck:TH

Query of the threshold value for judging contact checks in insulation resistance testing

p. 48 :CONFigure:INSulation:CONTactcheck:VAL ue?

Query of the contact check correction value in insulation resistance testing

p. 48

Program Test

:CONFigure:PROGram:COUNt

Setting for the number of test steps for programmed test

p. 49

:CONFigure:PROGram:COUNt?

Query of the number of test steps for programmed test

p. 49 :CONFigure:PROGram:SELect

Selection of program steps

p. 49

:CONFigure:PROGram:SELect?

Query of select program steps

p. 49

:CONFigure:PROGram:COPY

Copying program steps

p. 49

:CONFigure:PROGram:INSert

Insert program steps

p. 50

:CONFigure:PROGram:DELete

Delete program steps

p. 50

:CONFigure:PROGram:CLEar

Initialization of program steps

p. 50

:CONFigure:PROGram:MODE

Setting for the test mode for the program steps

p. 50

:CONFigure:PROGram:MODE?

Query of the test mode for the program steps

p. 50

:CONFigure:PROGram:EDIT:STEP

Setting for test mode and test conditions for program steps (withstand voltage test)

p. 51

:CONFigure:PROGram:EDIT:STEP?

Query of test mode and test conditions for program steps (withstand voltage test)

p. 52

:CONFigure:PROGram:EDIT:STEP

Setting for test mode and test conditions for program steps (insulation resistance test)

p. 53

:CONFigure:PROGram:EDIT:STEP?

Query of test mode and test conditions for program steps (insulation resistance test)

p. 54 :CONFigure:PROGram:OFFSet:CANCel:V ALue?

Query of offset cancellation correction values for all steps of the program test

p. 54

:CONFigure:PROGram:CONTactcheck:VAL ue?

Query of contact check correction values for all steps of the program test

p. 55

HIOKI ST5680A966-00

Reshold

Reshold?

Classification

Communication commands

Feature

Reference

BDV Measurement

:CONFigure:BDV:METHod

Setting for the test method for BDV measurement

p. 56

:CONFigure:BDV:METHod?

Query of the test method for BDV measurement

p. 56

:CONFigure:BDV:ELECtrode:DISTance

Setting for the distance between electrodes for BDV measurement

p. 56

:CONFigure:BDV:ELECtrode:DISTance?

Query of the distance between electrodes for BDV measurement

p. 56

:CONFigure:BDV:COUNt

Setting for the number of tests for BDV measurement

p. 57

:CONFigure:BDV:COUNt?

Query of the number of tests for BDV measurement

p. 57

:CONFigure:BDV:VOLTage:STARt

Setting for the initial voltage for BDV measurement

p. 57

:CONFigure:BDV:VOLTage:STARt?

Query of the initial voltage for BDV measurement

p. 57

:CONFigure:BDV:VOLTage:END

Setting for the end voltage for BDV measurement

p. 57

:CONFigure:BDV:VOLTage:END?

Query of the end voltage for BDV measurement

p. 58

:CONFigure:BDV:VOLTage:STEP

Setting for the voltage step for BDV measurement

p. 58

:CONFigure:BDV:VOLTage:STEP?

Query of the voltage step for BDV measurement

p. 58

:CONFigure:BDV:RISE:RATE

Setting for the voltage rise rate for BDV measurement

p. 58

:CONFigure:BDV:RISE:RATE?

Query of the voltage rise rate for BDV measurement

p. 58

:CONFigure:BDV:HOLD:TIMer

Setting for the voltage holding time for each stage of BDV measurement

p. 59

:CONFigure:BDV:HOLD:TIMer?

Query of the voltage holding time for each stage of BDV measurement

p. 59

:CONFigure:BDV:STEP:COUNt

Setting for the number of steps for BDV measurement

p. 59

:CONFigure:BDV:STEP:COUNt?

Query of the number of steps for BDV measurement

p. 59

:CONFigure:BDV:LIMit:UPPer

Setting for the current upper limit reference value for BDV measurement

p. 60

:CONFigure:BDV:LIMit:UPPer?

Query of the current upper limit reference value for BDV measurement

p. 60

:CONFigure:BDV:ARC:STATe

ON/OFF setting of ARC discharge detection function for BDV measurement

p. 60

:CONFigure:BDV:ARC:STATe?

Query of ON/OFF of ARC discharge detection function for BDV measurement

p. 60

:CONFigure:BDV:ARC:LIMit

Setting for the upper current limit of the ARC discharge detection function for BDV measurement

p. 61

:CONFigure:BDV:ARC:LIMit?

Query of the upper current limit of the ARC discharge detection function for BDV measurement

p. 61

Te s t C ommon

:SYSTem:DC:WITHstand:VOLTage:LIMit

Setting for the limiting voltage for the DC withstand voltage test

p. 62

:SYSTem:DC:WITHstand:VOLTage:LIMit?

Query of the limiting voltage for the DC withstand voltage test

p. 62

:SYSTem:INSulation:VOLTage:LIMit

Setting for the voltage limit for insulation resistance test

p. 62

:SYSTem:INSulation:VOLTage:LIMit?

Query of the voltage limit for insulation resistance test

p. 62 :SYSTem:CONTactcheck:VERify

Setting for the contact check function

p. 62

HIOKI ST5680A966-00

Classification

Communication commands

Feature

Reference

:SYSTem:CONTactcheck:VERify?

Query of the contact check function

p. 63

:SYSTem:INSulation:TERMinate

Setting for the insulation resistance test end mode

p. 63

:SYSTem:INSulation:TERMinate?

Query of the insulation resistance test end mode

p. 63

:SYSTem:JUDGe:FAIL

Setting for operation at the time of FAIL judgment

p. 63

:SYSTem:JUDGe:FAIL?

Query of operation at the time of FAIL judgment

p. 63

:SYSTem:WITHstand:RANGe:AUTO

Setting for the auto-range function for withstand voltage test

p. 64

:SYSTem:WITHstand:RANGe:AUTO?

Query of the auto-range function for withstand voltage test

p. 64

:SYSTem:INSulation:RANGe:AUTO

Setting for the auto-range function for insulation resistance test

p. 64

:SYSTem:INSulation:RANGe:AUTO?

Query of the auto-range function for insulation resistance test

p. 64

:SYSTem:RANGe:AUTO:DATA:KEEP

Setting for the use of the previous value of data during auto-range

p. 64

:SYSTem:RANGe:AUTO:DATA:KEEP?

Query of the use of the previous value of data during auto-range

p. 65

:SYSTem:FORMat:OVER

Setting for the measured value at the time of range-over is exceeded

p. 65

:SYSTem:FORMat:OVER?

Query of the measured value at the time of range-over is exceeded

p. 65

Panel Memory

:PANel:SAVE

Storage of test conditions

p. 66

:PANel:SAVE?

Query of panel memory storage status

p. 66

:PANel:SAVE:DATE?

Query of the date and time of panel memory storage

p. 67 :PANel:LOAD

Loading test conditions

p. 67

:PANel:NAME?

Query of panel name

p. 68

:PANel:REName

Change panel name

p. 68

:PANel:DELete

Delete panel memory

p. 69

:PANel:LIST?

Query of panel No. of stored panel memory

p. 69

Data Memory

:MEMory:FETCh?

Query of test results stored in data memory

p. 70 :MEMory:SAVE

Save test results stored in data memory

p. 70

:MEMory:COUNt?

Query of test results stored in data memory

p. 71 :MEMory:CONTrol

Setting for data memory function

p. 71

:MEMory:CONTrol?

Query of data memory function

p. 71

:MEMory:CLEar

Delete data memory

p. 71

EXT. I/O

:IO:MODE?

Query of NPN/PNP switch status

p. 72

:IO:OUTPut

Output of versatile output terminal

p. 72

:IO:WITHstand:JUDGe:TIMing

Setting for judgment signal output timing for withstand voltage test

p. 72

:IO:WITHstand:JUDGe:TIMing?

Query of judgment signal output timing for withstand voltage test

p. 72

:IO:INSulation:JUDGe:TIMing

Setting for the output timing of the judgment signal for the insulation resistance test

p. 73

:IO:INSulation:JUDGe:TIMing?

Query of the output timing of the judgment signal for the insulation resistance test

p. 73

:IO:TEST:SIGNal

Setting for TEST signal output timing

p. 73

:IO:TEST:SIGNal?

Query of TEST signal output timing

p. 73

System

:SYSTem:BEEPer:VOLume:PASS

Buzzer volume setting for PASS judgment

p. 74

HIOKI ST5680A966-00

Classification

Communication commands

Feature

Reference

:SYSTem:BEEPer:VOLume:PASS?

Query of buzzer volume setting for PASS judgment

p. 74

:SYSTem:BEEPer:VOLume:FAIL

Buzzer volume setting for FAIL judgment

p. 74

:SYSTem:BEEPer:VOLume:FAIL?

Query buzzer volume setting for FAIL judgment

p. 74 :SYSTem:MOMentary:OUT

Momentary out function setting

p. 74

:SYSTem:MOMentary:OUT?

Momentary out function query

p. 74

:SYSTem:KEYLock

Perform keylock

p. 75

:SYSTem:KEYLock?

Key lock status query

p. 75

:SYSTem:KEYLock:PASScode

Key lock passcode setting

p. 75

:SYSTem:KEYLock:UNLock

Unlocking the key lock

p. 75

:SYSTem:LOCal

Release of remote status

p. 75

:SYSTem:CALibration:PERiod

Setting for calibration due date

p. 76

:SYSTem:CALibration:PERiod?

Query of calibration due date

p. 76

:SYSTem:CALibration:PERiod:CHECk

Setting for calibration due date check function

p. 76 :SYSTem:CALibration:PERiod:CHECk?

Query of due date check function

p. 76

:SYSTem:GFI

Setting for GFI function

p. 76

:SYSTem:GFI?

Query of GFI function

p. 77

:SYSTem:DATE

Setting for date

p. 77

:SYSTem:DATE?

Query of date

p. 77

:SYSTem:TIME

Setting for time

p. 77

:SYSTem:TIME?

Query of time

p. 78

:SYSTem:SERialno?

Query of serial number

p. 78

:SYSTem:RESet

Initialization of equipment

p. 78

:SYSTem:ERRor?

Query of error and clear error

p. 79

:SYSTem:VERSion?

Query of SCPI version

p. 80

:SYSTem:FPGA?

Query of FPGA version No.

p. 80

:PRESet

Initialization of equipment

p. 80

Run

:STARt

Start of test

p. 81

:STOP

Forced termination of test, forced termination of correction measurement

p. 81 : S TATe ?

Equipment status query

p. 81

:STARt:CORRection

Start of correction measurement

p. 81

Measured Value

:FETCh:RESult:WITHstand?

Query of the test results of withstand voltage test

p. 82

:FETCh:RESult:INSulation?

Query of the test results of insulation resistance test

p. 83 :FETCh:RESult:PROGram?

Query of the test results for program test

p. 83

:FETCh:RESult:PROGram:STEP:COUNt?

Query of the number of steps to be tested in the program test

p. 83

:FETCh:RESult:PROGram:STEP?

Query of the test results for each step of the program test

p. 84

:FETCh:RESult:BDV?

Query of the test results of BDV measurement

p. 85

:FETCh:RESult:BDV:TEST:COUNt?

Query of the number of test runs for BDV measurement

p. 85

:FETCh:RESult:BDV:TEST?

Query of the test results for each test of BDV measurement

p. 85

:FETCh:MEASure:WITHstand:TEXT?

Query of the measured value in text format for withstand voltage test

p. 86

:FETCh:MEASure:WITHstand:BINary?

Query of the measured value in binary form for withstand voltage test

p. 87

:FETCh:MEASure:INSulation:TEXT?

Query of the measured value in text format for insulation resistance test

p. 88

HIOKI ST5680A966-00

Output

Classification

Communication commands

Feature

Reference

:FETCh:MEASure:INSulation:BINary?

Query of the measured value in binary form for insulation resistance test

p. 89

:FETCh:MEASure:BDV:TEXT?

Query of the measured value in text format for BDV measurements

p. 90

:FETCh:MEASure:BDV:BINary?

Query of the measured value in binary form for BDV measurements

p. 91

:FETCh:CONTactcheck:WITHstand?

Query of the contact check results for withstand voltage test

p. 92

:FETCh:CONTactcheck:INSulation?

Query of the contact check results for insulation resistance test

p. 92

:FETCh:CONTactcheck:PROGram?

Query of the contact check results for each step of the program test

p. 92

:FETCh:MEASure:ERRor:WITHstand?

Query of the measurement error in withstand voltage test

p. 93

:FETCh:MEASure:ERRor:INSulation?

Query of the measurement error in insulation resistance test

p. 93

:FETCh:MEASure:ERRor:PROGram?

Query of the measurement error for each step of the program test

p. 94

:FETCh:MEASure:ERRor:BDV?

Query of the measurement error for each test of BDV measurement

p. 95 :MONitor:VOLTage?

Query of voltage measured value

p. 97

:MONitor:CURRent?

Query of current measured value

p. 97

:MONitor:RESistance?

Query of resistance measured value

p. 97

:MONitor:ETIMe?

Query of the test elapsed time

p. 98

On-Screen Display

:DISPlay:SCReen

Display screen settings

p. 99

:DISPlay:SCReen?

Query of display screen

p. 99

:DISPlay:GRAPh

Display graph settings

p. 99

:DISPlay:GRAPh?

Query of display graph

p. 99

:DISPlay:VOLTage:COLor

Voltage display color setting

p. 100

:DISPlay:VOLTage:COLor?

Query of voltage display color

p. 100

:DISPlay:CURRent:COLor

Current display color setting

p. 101

:DISPlay:CURRent:COLor?

Query of current display color

p. 101

:DISPlay:RESistance:COLor

Resistance display color setting

p. 102

:DISPlay:RESistance:COLor?

Query of resistance display color

p. 102

Screen Saving

:HCOPy:SDUMp:DATA?

Obtaining an image of the display screen

p. 103

File Saving

:FILE:SAVE

Execute file save

p. 104

:FILE:SAVE:MODE

Setting for behavior when saving a file

p. 104

:FILE:SAVE:MODE?

Query of behavior when saving a file

p. 104

:FILE:SAVE:TEXT

Setting for saving measurement result when saving file

p. 104

:FILE:SAVE:TEXT?

Query of saving measurement result when saving a file

p. 104

:FILE:SAVE:TEXT:TEST

Setting for saving test result when saving measurement result

p. 105

:FILE:SAVE:TEXT:TEST?

Query of saving test result when saving measurement result

p. 105

:FILE:SAVE:TEXT:WAVeform

Setting for saving waveform data when saving measurement result

p. 105

:FILE:SAVE:TEXT:WAVeform?

Query of saving waveform data when saving measurement result

p. 105

:FILE:SAVE:TEXT:TRENd

Setting for trend data storage when saving measurement result

p. 105

:FILE:SAVE:TEXT:TRENd?

Query of trend data storage when saving measurement result

p. 106

:FILE:SAVE:BINary:WAVeform

Setting for saving waveform data in binary format when saving file

p. 106

HIOKI ST5680A966-00

Classification

Communication commands

Feature

Reference

:FILE:SAVE:BINary:WAVeform?

Query of saving waveform data in binary format when saving file

p. 106

:FILE:SAVE:BINary:TRENd

Setting for saving trend data in binary format when saving file

p. 106

:FILE:SAVE:BINary:TRENd?

Query of saving trend data in binary format when saving file

p. 106

:FILE:SAVE:SCReen

Setting for screen save when saving a file

p. 107

:FILE:SAVE:SCReen?

Query of screen save when saving a file

p. 107

:FILE:FORMat:QUOTe

Setting for quotation marks when saving file

p. 107

:FILE:FORMat:QUOTe?

Query of quotation marks when saving file

p. 107

:FILE:FORMat:ITEM:DELimiter

Setting for item delimiters when saving file

p. 107

:FILE:FORMat:ITEM:DELimiter?

Query of item delimiters when saving file

p. 108

:FILE:FORMat:DECimal:CHARacter

Setting for the decimal point character when saving a file

p. 108

:FILE:FORMat:DECimal:CHARacter?

Query of the decimal point character when saving a file

p. 108

:FILE:FORMat:DATE

Setting for date format when saving file

p. 108

:FILE:FORMat:DATE?

Query of date format when saving file

p. 108

:FILE:FORMat:DATE:DELimiter

Setting for the date delimiter when saving a file

p. 108

:FILE:FORMat:DATE:DELimiter?

Query of the date delimiter when saving a file

p. 109

:FILE:TYPE:PICTure

Setting for the image type when saving a file

p. 109

:FILE:TYPE:PICTure?

Query of the image type when saving a file

p. 109

:FILE:NAME

Setting for the file name when saving file

p. 109

:FILE:NAME?

Query of the file name when saving file

p. 109

:FILE:FOLDer

Setting for the folder name when saving file

p. 109

:FILE:FOLDer?

Query of the folder name when saving file

p. 110

:FILE:INFormation?

Query of USB flash drive information

p. 110

:FILE:PANel:SAVE

Save panel memory to USB flash drive

p. 110

:FILE:PANel:LOAD

Load panel memory from USB flash drive

p. 110

:FILE:PANel:ALL:SAVE

Save panel memory and various setting information to USB flash drive

p. 111

:FILE:PANel:ALL:LOAD

Load panel memory and various setting information from USB flash drive

p. 111

Communication

:SYSTem:COMMunicate:HEADer

Setting for presence/absence of response message headers

p. 112

:SYSTem:COMMunicate:HEADer?

Query of presence/absence of response message headers

p. 112

:SYSTem:COMMunicate:MONitor

Command monitor display setting

p. 112

:SYSTem:COMMunicate:MONitor?

Command monitor display query

p. 112

:SYSTem:COMMunicate:USB:FUNCtion

Setting for USB interface functions

p. 112

:SYSTem:COMMunicate:USB:FUNCtion?

Query of USB interface functions

p. 113

:SYSTem:COMMunicate:USB:TERMinator

USB communication message terminator setting

p. 113

:SYSTem:COMMunicate:USB:TERMinator?

USB communication message terminator query

p. 113

:SYSTem:COMMunicate:LAN:TERMinator

LAN communication message terminator setting

p. 113

HIOKI ST5680A966-00

Classification

Communication commands

Feature

Reference

:SYSTem:COMMunicate:LAN:TERMinator?

LAN communication message terminator query

p. 113

:SYSTem:COMMunicate:LAN:IPADdress

LAN IP address settings

p. 114

:SYSTem:COMMunicate:LAN:IPADdress?

LAN IP address query

p. 114

:SYSTem:COMMunicate:LAN:SMASk

LAN subnet mask settings

p. 114

:SYSTem:COMMunicate:LAN:SMASk?

LAN subnet mask query

p. 114

:SYSTem:COMMunicate:LAN:GATeway

LAN default gateway settings

p. 114

:SYSTem:COMMunicate:LAN:GATeway?

LAN default gateway query

p. 115

:SYSTem:COMMunicate:LAN:CONTrol

LAN port number setting

p. 115

:SYSTem:COMMunicate:LAN:CONTrol?

LAN port number query

p. 115

:SYSTem:COMMunicate:LAN:UPDate

Finalize LAN settings

p. 115

:SYSTem:COMMunicate:LAN:MAC?

MAC address query

p. 115

:SYSTem:COMMunicate:RS232C:TERMina tor

RS-232C communication message terminator settings

p. 115

:SYSTem:COMMunicate:RS232C:TERMina tor?

RS-232C communication message terminator query

p. 116

:SYSTem:COMMunicate:RS232C:SPEed

RS-232C communication speed setting

p. 116

:SYSTem:COMMunicate:RS232C:SPEed?

RS-232C communication speed query

p. 116

:SYSTem:COMMunicate:RS232C:HANDsh ake

RS-232C handshake settings

p. 116

:SYSTem:COMMunicate:RS232C:HANDsh ake?

RS-232C handshake query

p. 116

:SYSTem:COMMunicate:GPIB:TERMinator

Message terminator settings for GP-IB communication

p. 116

:SYSTem:COMMunicate:GPIB:TERMinator ?

Message terminator query for GP-IB communication

p. 117

:SYSTem:COMMunicate:GPIB:ADDRess

GP-IB address settings

p. 117

:SYSTem:COMMunicate:GPIB:ADDRess?

GP- IB address query

p. 117

Compatibility Mode

:COMMand:COMPatible

Command compatibility mode setting

p. 118

:COMMand:COMPatible?

Command compatibility mode query

p. 118

HIOKI ST5680A966-00

Standard Event Status Enable Register (SESER) setting

Syntax

Commands

∗ESE <mask value>

<mask value> = 0 to 255 (NR1)

Description Example

∗ESE 32

Set the CME bit (bit 5) of the Standard Event Status Enable Register (SESER) to 1.

NOTES:

Bits 1 and 6 are not used in this instrument.

No.

Description

The characters surrounded by this symbol represent the parameters required to send the command.

Indicates the content of the command.

The following is an explanation of the data part of the command or the response message.

Explain the command.

An example of actual command usage.

Here is some advice on the use of communication commands.

2 4 3 5 6

HIOKI ST5680A966-00

3 Message Reference

Set the mask pattern for the Standard Event Status Enable Register (SESER). The initial value (at power-on) is 0.

Describes the syntax of communication commands.

Command, Query

Controller Instrument

Response

Clear Event Status Register

Syntax

Commands

*CLS

Description

Clear the Event Status Register. The bits in the Status Byte Register corresponding to the Event Status Register are also cleared. Errors are also cleared.

Example

Clear the Event Status Register.

NOTES:

The MAV bit (bit4) in the Status Byte Register (STB) is not cleared.

Query of equipment ID (identification code)

Syntax

Query

*IDN?

Response

<Manufacturer's name>,<Model name>,<Serial number>,<software version>

Description

Return the ID of the equipment.

Example

*IDN?

123456789, and the software version is V1.00.

NOTES:

No header is attached to the response message.

After all running operations are completed, set the operation complete bit in the Standard Event Status Register (SESR) to 1

Syntax

Commands

*OPC

Description

command.

Example

*OPC

Respond 1 after all running operations are completed

Syntax

Query

*OPC?

Response

Description

command.

Example

*OPC?

The last process has been completed.

NOTES:

No header is attached to the response message.

HIOKI ST5680A966-00

Standard Commands

*CLS

HIOKI,ST5680,123456789,V1.00

The manufacturer's name is HIOKI, the model name is ST5680, the serial number is

Set the OPC bit (bit0) of the Standard Event Status Register (SESR) to 1 when the processing of an incomplete command is complete. It will stop accepting subsequent commands until completion, but will accept the :STOP

*ESR? 1

The previous process has completed and the OPC bit (bit0) in the Standard Event Status

When the processing of an incomplete command is completed, it responds with a 1. It will stop accepting subsequent commands until completion, but will accept the :STOP

Inquiry installed options

Syntax

Query

*OPT?

Response

<0/GPIB/RS232C>

board installed, RS232C: RS-232C interface board installed

Description

Return the options installed in the instrument.

Example

*OPT?

RS-232C interface board is installed.

NOTES:

No header is attached to the response message.

Initialization of equipment

Syntax

Commands

*RST

Description

Set this instrument to the initialize setting.

See “Initialization items list” (p. 119 )

Example

*RST

Performs initialization of the instrument.

NOTES:

TEST or corrected measurement status results in an execution error.

Start of test

Syntax

Commands

*TRG

Description

Start the test.

resistance test → withstand voltage test, and programmed test, proceed to the next stage.

Example

*TRG

Start the test.

NOTES:

If the momentary out function is set to be enabled, an execution error will occur.

Run self-test and query of result

Syntax

Query

*TST?

Response

<mask value> = 0 to 31 (NR1)

Description

bit 7 bit 6 bit 5 bit 4 bit 3 bit 2 bit 1 bit 0

Example

*TST?

correctly, discontinue use and request repair.

NOTES:

Any status other than READY, it will result in an execution error.

HIOKI ST5680A966-00

<0/GPIB/RS232C> = 0: no interface board installed, GPIB: GP-IB interface

RS232C

Panel memory and communication interface settings are not initialized.

When in the interval state of withstand voltage test → insulation resistance test, insulation

Any condition other than READY or interval, it will result in an execution error.

Performs a self-test of the instrument and returns the results.

Return 0 for no error.

128

- - -

A ROM error has occurred. Since there is a possibility that the test cannot be performed

No header is attached to the response message.

SRAM

Error

VRAM

Error

SDRAM

Error

Internal

RAM Error

ROM

Error

After command processing is completed, subsequent commands are executed.

Syntax

Commands

*WAI

Description

Wait for incomplete commands to be processed.

command.

Example

Wait for incomplete commands to be processed.

Standard Event Status Enable Register (SESER) settings

Syntax

* ESE <mask value>

<mask value> = 0 to 255 (NR1)

Description

Set the mask pattern for the Standard Event Status Enable Register (SESER). The initial

128 64 32 16 8 4 2 1

bit 7 bit 6 bit 5 bit 4 bit 3 bit 2 bit 1 bit 0

PON

URQ

CME

EXE

DDE

QYE

RQC

OPC

Example

Set the CME bit (bit 5) of the Standard Event Status Enable Register (SESER) to 1.

NOTES:

Bits 1 and 6 are not used in this instrument.

Standard Event Status Enable Register (SESER) query

Syntax

Query

*ESE?

Response

<mask value> = 0 to 255 (NR1)

Description

Return the mask pattern of the Standard Event Status Enable Register (SESER).

128 64 32 16 8 4 2 1

bit 7 bit 6 bit 5 bit 4 bit 3 bit 2 bit 1 bit 0

PON

URQ

CME

EXE

DDE

QYE

RQC

OPC

Example

*ESE?

CME bit (bit 5) of the Standard Event Status Enable Register (SESER) is set to 1.

NOTES:

Bits 1 and 6 are not used in this instrument.

Standard Event Status Register (SESR) query

Syntax

Query

*ESR?

Response

<register value> = 0 to 255 (NR1)

Description

Return the contents of the Standard Event Status Register (SESR) and clears the register.

128 64 32 16 8 4 2 1

bit 7 bit 6 bit 5 bit 4 bit 3 bit 2 bit 1 bit 0

Example

*ESR?

The CME bit (bit 5) in the Standard Event Status Register (SESR) has been set to 1.

NOTES:

Bits 1 and 6 are not used in this instrument.

HIOKI ST5680A966-00

It will stop accepting subsequent commands until completion, but will accept the :STOP

*WAI

Commands

value (at power-on) is 0.

*ESE 32

No header is attached to the response message.

PON URQ CME EXE DDE QYE RQC OPC

No header is attached to the response message.

Service Request Enable Register (SRER) settings

Syntax

Commands

* SRE <mask value>

<mask value> = 0 to 255 (NR1)

Description

- - ESB

MAV

ERR

ESB0

Example

*SRE 33

(SRER) to 1.

Service Request Enable Register (SRER) query

Syntax

Query

*SRE?

Response

<mask value> = 0 to 255 (NR1)

Description

Return the mask pattern for the Service Request Enable Register (SRER).

128 64 32 16 8 4 2 1

bit 7 bit 6 bit 5 bit 4 bit 3 bit 2 bit 1 bit 0

- - ESB

MAV

ERR

ESB0

Example

*SRE?

to 1.

NOTES:

No header is attached to the response message.

Status Byte Register (STB) query

Syntax

Query

*STB?

Response

<register value> = 0 to 255 (NR1)

Description

bit 7 bit 6 bit 5 bit 4 bit 3 bit 2 bit 1 bit 0

Example

*STB?

ESB0 bit (bit 0) of the Status Byte Register (STB) has been set to 1.

NOTES:

No header is attached to the response message.

HIOKI ST5680A966-00

Set the mask pattern for the Service Request Enable Register (SRER). The initial value (at power-on) is 0.

128

bit 7

Set the ESB0 bit (bit 0) and the ESB bit (bit 5) of the Service Request Enable Register

bit 6

bit 5

bit 4

bit 3

bit 2

bit 1

bit 0

ESB0 bit (bit 0) and ESB bit (bit 5) of the Service Request Enable Register (SRER) are set

Return the contents of the Status Byte Register (STB).

128

- MSS ESB MAV - ERR - ESB0

Event Status Enable Register 0 (ESER0) settings

Syntax

Commands

:ESE0 <mask value>

<mask value> = 0 to 255 (NR1)

Description

bit 7 bit 6 bit 5 bit 4 bit 3 bit 2 bit 1 bit 0

- - - - EOM

LFAIL

UFAIL

PASS

Example

:ESE0 8

Set the EOM bit (bit 3) of the Event Status Enable Register 0 (ESER0) to 1.

NOTES:

Bits 4 through 7 are not used in this instrument.

Event Status Enable Register 0 (ESER0) query

Syntax

Query

:ESE0?

Response

<mask value> = 0 to 255 (NR1)

Description

Return the mask pattern for Event Status Enable Register 0 (ESER0).

128 64 32 16 8 4 2 1

- - - - EOM

LFAIL

UFAIL

PASS

Example

The EOM bit (bit 3) of the Event Status Enable Register 0 (ESER0) is set to 1.

NOTES:

Bits 4 through 7 are not used in this instrument.

Event Status Register 0 (ESR0) query

Syntax

Query

:ESR0?

Response

<register value> = 0 to 255 (NR1)

Description

Return the contents of the Event Status Register 0 (ESR0) and clears the register.

128 64 32 16 8 4 2 1

bit 7 bit 6 bit 5 bit 4 bit 3 bit 2 bit 1 bit 0

- - - - EOM

LFAIL

UFAIL

PASS

Example

:ESR0?

The EOM bit (bit 3) in the Event Status Register 0 (ESR0) has been set to 1.

NOTES:

Bits 4 through 7 are not used in this instrument.

HIOKI ST5680A966-00

Event Register

Event Status Enable Register 0 (ESER0) settings

128

:ESE0? 8

bit 7

bit 6

bit 5

bit 4

bit 3

bit 2

bit 1

bit 0

Test mode setting

Syntax

Commands

:MODE <Test mode>

<Test mode> = W: Withstand voltage test, IR: Insulation resistance test, WIR:

measurement

Description

Set the test mode.

Example

:MODE W

Set the test mode to withstand voltage test.

NOTES:

Any status other than READY, it will result in an execution error.

Test mode query

Syntax

Query

:MODE?

Response

<Test mode> = W: Withstand voltage test, IR: Insulation resistance test, WIR:

measurement

Description

Return the test mode setting.

Example

:MODE?

The test mode is set to withstand voltage test.

HIOKI ST5680A966-00

Test Mode

Withstand voltage test → Insulation resistance test, IRW: Insulation resistance test → Withstand voltage test, PROGram: Programmed test, BDV: BDV

Withstand voltage test → Insulation resistance test, IRW: Insulation resistance test → Withstand voltage test, PROGRAM: Programmed test, BDV: BDV

Setting for the interval time for withstand voltage test

Syntax

Commands

:CONFigure:WITHstand:STEP:INTerval <Interval time/TRIGger>

<Interval time/TRIGger> = 0.1 to 100.0 [s] (NRf), TRIGger:STOP until START key is pressed

Description

Set the interval time for the withstand voltage test.

Example

:CONFigure:WITHstand:STEP:INTerval 1.0

Set the interval time for the withstand voltage test to 1.0 s.

NOTES:

Any status other than READY, it will result in an execution error.

measurement.

Query of interval time for withstand voltage test

Syntax

Query

:CONFigure:WITHstand:STEP:INTerval?

Response

<Interval time/TRIGGER> = 0.1 to 100.0 [s] (NR2), TRIGGER:START until START key is pressed

Description

Return the interval time setting for the withstand voltage test.

Example

:CONFigure:WITHstand:STEP:INTerval?

The interval time for the withstand voltage test is set to 1.0 s.

NOTES:

Execution error occurs when the test mode is insulation resistance test or BDV measurement.

Setting test voltage for withstand voltage test

Syntax

Commands

:CONFigure:WITHstand:VOLTage:LEVel <Test voltage>

<Test voltage> = 10 to 8000 [V] (NR1)

Description

Set the test voltage for the withstand voltage test.

offset cancel correction value, and contact check correction value become initial values.

Example

:CONFigure:WITHstand:VOLTage:LEVel 100

Set the test voltage for the withstand voltage test to 100 V.

NOTES:

execution error occurs.

Query of test voltage for withstand voltage test

Syntax

Query

:CONFigure:WITHstand:VOLTage:LEVel?

Response

<Test voltage> = 10 to 8000 [V] (NR1)

Description

Return the test voltage setting for the withstand voltage test.

Example

:CONFigure:WITHstand:VOLTage:LEVel?

The test voltage for the withstand voltage test is set to 100 V.

NOTES:

Execution error occurs when the test mode is insulation resistance test or BDV measurement.

HIOKI ST5680A966-00

Withstand Voltage Test

Execution error occurs when the test mode is insulation resistance test or BDV

1.0

When the test voltage for the withstand voltage test is changed, the offset cancel function,

Any status other than READY, it will result in an execution error. Execution error occurs when the test mode is insulation resistance test or BDV measurement. If a voltage greater than the limit voltage for the DC withstand voltage test is set, an

100

Setting the starting voltage for withstand voltage tests

Syntax

Commands

:CONFigure:WITHstand:VOLTage:STARt <Start voltage>

<Start voltage> = 0 to 99 [%] (NR1)

Description

Set the starting voltage for the withstand voltage test.

Example

:CONFigure:WITHstand:VOLTage:STARt 1

Set the starting voltage for the withstand voltage test to 1%.

NOTES:

Any status other than READY, it will result in an execution error.

test time of withstand voltage test + 0.1 s (when the start voltage of withstand voltage test is other than 0%),” it will result in an execution error.

Query the starting voltage for withstand voltage tests

Syntax

Query

:CONFigure:WITHstand:VOLTage:STARt?

Response

<Start voltage> = 0 to 99 [%] (NR1)

Description

Return the starting voltage setting for the withstand voltage test.

Example

:CONFigure:WITHstand:VOLTage:STARt?

The starting voltage for the withstand voltage test is set at 1%.

NOTES:

Execution error occurs when the test mode is insulation resistance test or BDV measurement.

Setting the test time for withstand voltage tests

Syntax

Commands

:CONFigure:WITHstand:TIMer <Test time/CONTinue>

<Test time/CONTinue> = 0.1 to 999.0 [s] (NRf), CONTinue: test continuously

Description

Set the test time for the withstand voltage test.

Example

:CONFigure:WITHstand:TIMer 1.0

Set the test time for the withstand voltage test to 1.0 s.

NOTES:

CONTinue cannot be set in program test mode.

When the judgment waiting time for withstand voltage test is set other than OFF, setting the

voltage of withstand

voltage test is other than 0%),” will cause an execution error.

Query the test time for withstand voltage tests

Syntax

Query

:CONFigure:WITHstand:TIMer?

<Test time/CONTINUE> = 0.1 to 999.0 [s] (NR2), CONTINUE: test continuously

Description

Return the test time setting for the withstand voltage test.

Example

The test time for the withstand voltage test is set to 1.0 s.

NOTES:

Execution error occurs when the test mode is insulation resistance test or BDV measurement.

HIOKI ST5680A966-00

Execution error occurs when the test mode is insulation resistance test or BDV measurement.

When the test time of the withstand voltage test is set other than CONTinue and the judgment wait time of the withstand voltage test is set other than OFF, setting the value of “Judgment wait time of withstand voltage test ≥ voltage rise time of withstand voltage test +

Any status other than READY, it will result in an execution error. Execution error occurs when the test mode is insulation resistance test or BDV measurement.

value of “Judgment wait time of withstand voltage test ≥ voltage rise time of withstand voltage test + test time of withstand voltage test + 0.1 s (when the start

Response

:CONFigure:WITHstand:TIMer?

1.0

Setting the voltage rise time for withstand voltage tests

Syntax

Commands

:CONFigure:WITHstand:RISE:TIMer <Voltage rise time>

<Voltage rise time> = 0.1 to 300.0 [s] (NRf)

Description

Set the voltage rise time for the withstand voltage test.

Example

:CONFigure:WITHstand:RISE:TIMer 1.0

Set the voltage rise time for the withstand voltage test 1.0 s.

NOTES:

Any status other than READY, it will result in an execution error.

test time of withstand voltage test + 0.1 s (when the start voltage of withstand voltage test is other than 0%),” it will result in an execution error.

Query the voltage rise time for withstand voltage tests

Syntax

Query

:CONFigure:WITHstand:RISE:TIMer?

<Voltage rise time> = 0.1 to 300.0 [s] (NR2)

Description

Return the voltage rise time setting for the withstand voltage test.

Example

The voltage rise time for the withstand voltage test is set to 1.0 s.

NOTES:

Execution error occurs when the test mode is insulation resistance test or BDV measurement.

Setting for the voltage drop time for withstand voltage tests

Syntax

Commands

:CONFigure:WITHstand:FALL:TIMer <Voltage drop time/OFF>

<Voltage drop time/OFF> = 0.1 to 300.0 [s] (NRf), OFF: no voltage drop time

Description

Set the voltage drop time for the withstand voltage test.

Example

:CONFigure:WITHstand:FALL:TIMer 1.0

Set the voltage drop time for the withstand voltage test to 1.0 s.

NOTES:

Any status other than READY, it will result in an execution error.

When the contact check function performs a contact check, an execution error occurs.

Query of the voltage drop time for withstand voltage tests

Syntax

Query

:CONFigure:WITHstand:FALL:TIMer?

Response

<Voltage drop time/OFF> = 0.1 to 300.0 [s] (NR2), OFF: no voltage drop time

Description

Return the voltage drop time setting for the withstand voltage test.

Example

:CONFigure:WITHstand:FALL:TIMer?

The voltage drop time for the withstand voltage test is set to 1.0 s.

NOTES:

Execution error occurs when the test mode is insulation resistance test or BDV measurement.

HIOKI ST5680A966-00

Execution error occurs when the test mode is insulation resistance test or BDV measurement. When the test time of the withstand voltage test is set other than CONTinue and the judgment wait time of the withstand voltage test is set other than OFF, setting the value of “Judgment wait time of withstand voltage test ≥ voltage rise time of withstand voltage test +

Response

:CONFigure:WITHstand:RISE:TIMer?

1.0

Execution error occurs when the test mode is insulation resistance test or BDV measurement.

1.0

Setting of judgment waiting time for withstand voltage test

Syntax

Commands

:CONFigure:WITHstand:JUDGment:DELay <Judgment wait time/OFF>

<Judgment wait time/OFF> = 0.1 to 99.9 [s] (NRf), OFF: Do not set decision wait time

Description

Set the judgment wait time for the withstand voltage test.

Example

Set the judgment wait time for the withstand voltage test to 1.0 s.

NOTES:

Any status other than READY, it will result in an execution error.

(when the start voltage of withstand

voltage test is other than 0%),” will cause an execution error.

Query of judgment wait time for withstand voltage test

Syntax

Query

:CONFigure:WITHstand:JUDGment:DELay?

<Judgment wait time/OFF> = 0.1 to 99.9 [s] (NR2), OFF: Do not set Judgment wait time

Description

Return the judgment wait time setting for the withstand voltage test.

Example

The judgment time for the withstand voltage test is set to 1.0 s.

NOTES:

Execution error occurs when the test mode is insulation resistance test or BDV measurement.

Setting for the upper test limit value for withstand voltage tests

Syntax

Commands

:CONFigure:WITHstand:LIMit:UPPer<Upper test limit value>

<Upper test limit value> = 0.010 to 100.0 [mA] (NRf)

Description

Set the upper limit value of the current value that is the criterion for pass/fail judgment in the

function and offset cancel correction value become the initial values.

Example

:CONFigure:WITHstand:LIMit:UPPer 0.1

Set the upper test limit value of the withstand voltage test to 0.1 mA.

NOTES:

Any status other than READY, it will result in an execution error.

value of “upper test limit value ≤ lower test limit value,” it will result in an execution error.

Query of the upper test limit value for withstand voltage tests

Syntax

Query

:CONFigure:WITHstand:LIMit:UPPer?

Response

<Upper test limit value> = 0.010 to 100.0 [mA] (NR2)

Description

Return the upper test limit value setting for the withstand voltage test.

Example

:CONFigure:WITHstand:LIMit:UPPer?

The test upper limit value for the withstand voltage test is set at 0.1 mA.

NOTES:

Execution error occurs when the test mode is insulation resistance test or BDV measurement.

HIOKI ST5680A966-00

:CONFigure:WITHstand:JUDGment:DELay 1.0

Execution error occurs when the test mode is insulation resistance test or BDV measurement. When the test time of the withstand voltage test is set other than CONTinue, setting the value of “Judgment wait time of withstand voltage test ≥ voltage rise time of withstand voltage test + test time of withstand voltage test + 0.1 s

Response

:CONFigure:WITHstand:JUDGment:DELay?

1.0

withstand voltage test. When the upper test limit value for the withstand voltage test is changed, the offset cancel

Execution error occurs when the test mode is insulation resistance test or BDV measurement. When ON/OFF is set to ON for the lower limit value of the withstand voltage test, setting a

0.100

Setting for the lower test limit value for withstand voltage tests

Syntax

Commands

:CONFigure:WITHstand:LIMit:LOWer <Lower test limit value>

<Lower test limit value> = 0.010 to 100.0 [mA] (NRf)

Description

in the

withstand voltage test.

Example

Set the lower test limit value of the withstand voltage test to 0.1 mA.

NOTES:

Any status other than READY, it will result in an execution error.

value of “Upper test limit value ≤ lower test limit value,” it will result in an execution error.

Query of the lower test limit for withstand voltage tests

Syntax

Query

:CONFigure:WITHstand:LIMit:LOWer?

<Lower test limit value> = 0.010 to 100.0 [mA] (NR2)

Description

Return the lower test limit value setting for the withstand voltage test.

Example

The test lower limit value for the withstand voltage test is set at 0.1 mA.

NOTES:

Execution error occurs when the test mode is insulation resistance test or BDV measurement.

ON/OFF setting of the lower test limit value for withstand voltage test

Syntax

Commands

:CONFigure:WITHstand:LIMit:LOWer:STATe <1/0/ON/OFF>

Judgment is not made at the lower test limit value

Description

Set the lower test limit value ON/OFF for the withstand voltage test.

Example

:CONFigure:WITHstand:LIMit:LOWer:STATe 1

Set to judge at the lower test limit value for the withstand voltage test.

NOTES:

Any status other than READY, it will result in an execution error.

“Upper test limit

voltage test to ON causes an execution error.

Query of ON/OFF of the lower test limit for withstand voltage test

Syntax

Query

:CONFigure:WITHstand:LIMit:LOWer:STATe?

Response

<1/0>

<1/0> = 1: Judgment is made at the lower test limit value, 0: Judgment is not made at the lower test limit value

Description

Return the ON/OFF setting of the lower test limit for the withstand voltage test.

Example

:CONFigure:WITHstand:LIMit:LOWer:STATe?

It is set to be judged at the lower limit value of the test for the withstand voltage test.

NOTES:

Execution error occurs when the test mode is insulation resistance test or BDV measurement.

HIOKI ST5680A966-00

Set the lower limit value of the current value that is the criterion for pass/fail judgment

:CONFigure:WITHstand:LIMit:LOWer 0.1

Execution error occurs when the test mode is insulation resistance test or BDV measurement. When ON/OFF is set to ON for the lower limit value of the withstand voltage test, setting a

Response

:CONFigure:WITHstand:LIMit:LOWer?

0.100

<1/0/ON/OFF> = 1/ON: Judgment is made at the lower test limit value, 0/OFF:

Execution error occurs when the test mode is insulation resistance test or BDV measurement. When the upper and lower test limits value of the withstand voltage test are value ≤ lower test limit value,” setting ON/OFF of the lower test limit value of the withstand

Setting the ARC discharge detection function for withstand voltage tests

Syntax

Commands

:CONFigure:WITHstand:ARC:STATe <OFF/CONTinue/STOP>

<OFF/CONTinue/STOP> = OFF: Arc beyond the upper current limit value is not

and the test stops

Description

Set the ARC discharge detection function for withstand voltage test.

Example

:CONFigure:WITHstand:ARC:STATe STOP

stop the test.

NOTES:

Any status other than READY, it will result in an execution error.

measurement.

Query of the ARC discharge detection function for withstand voltage test

Syntax

Query

:CONFigure:WITHstand:ARC:STATe?

<OFF/CONTINUE/STOP> = OFF: Arc beyond the upper current limit value is

detected and the test stops

Description

Return the setting of the ARC discharge detection function of the withstand voltage test.

Example

voltage test and the test is stopped.

NOTES:

Execution error occurs when the test mode is insulation resistance test or BDV measurement.

Setting the upper current limit value of the ARC discharge detection function for withstand voltage tests

Syntax

Commands

:CONFigure:WITHstand:ARC:LIMit <Upper current limit value>

<Upper current limit value> = 1 to 50 [%] (NR1)

Description

Set the upper current limit value for the ARC discharge detection function in the withstand voltage test.

Example

:CONFigure:WITHstand:ARC:LIMit 3

voltage test to 3 %.

NOTES:

Any status other than READY, it will result in an execution error.

measurement.

HIOKI ST5680A966-00

detected, CONTinue: Arc beyond the upper current limit value is detected and the test continues, STOP: Arc beyond the upper current limit value is detected

Set the voltage withstand test to detect arcs that exceed the upper current limit value and

Execution error occurs when the test mode is insulation resistance test or BDV

Response

not detected, CONTINUE: Arc beyond the upper current limit value is detected and the test continues, STOP: Arc beyond the upper current limit value is

:CONFigure:WITHstand:ARC:STATe? :STOP

The test is set to detect arcs that exceed the upper current limit value in the withstand

Set the upper current limit value of the ARC discharge detection function for the withstand

Execution error occurs when the test mode is insulation resistance test or BDV

Query of the upper current limit value of the ARC discharge detection function for withstand voltage tests

Syntax

Query

:CONFigure:WITHstand:ARC:LIMit?

Response

<Upper current limit value> = 1 to 50 [%] (NR1)

Description

Return the upper current limit value setting for the ARC discharge detection function of the withstand voltage test.

Example

:CONFigure:WITHstand:ARC:LIMit?

voltage test is set at 3 %.

NOTES:

Execution error occurs when the test mode is insulation resistance test or BDV measurement.

Setting for the offset cancel function for withstand voltage test

Syntax

Commands

:CONFigure:WITHstand:OFFSet:CANCel <1/0/ON/OFF>

<1/0/ON/OFF> = 1/ON: offset cancellation correction value is subtracted from

subtracted from the measured value

Description

Set the offset cancel function for withstand voltage test.

Example

the withstand voltage test.

NOTES:

Any status other than READY, it will result in an execution error.

measurement.

Query of the offset cancel function for withstand voltage test

Syntax

Query

:CONFigure:WITHstand:OFFSet:CANCel?

<1/0>

<1/0> = 1: offset cancellation correction value is subtracted from the measured

measured value

Description

Return the offset cancel function setting for the withstand voltage test.

Example

:CONFigure:WITHstand:OFFSet:CANCel?

the withstand voltage test.

NOTES:

measurement.

Query of the offset cancellation correction value for withstand voltage test

Syntax

Query

:CONFigure:WITHstand:OFFSet:CANCel:VALue?

Response

<Correction value> = 0.0000E+00 to 1.0000E-02 [A] (NR3)

Description

Return the offset cancellation compensation value for the withstand voltage test.

Example

:CONFigure:WITHstand:OFFSet:CANCel:VALue?

The offset cancellation correction value for the withstand voltage test is 0.001 mA.

NOTES:

Execution error occurs when the test mode is insulation resistance test or BDV measurement.

HIOKI ST5680A966-00

The upper current limit value of the ARC discharge detection function for withstand

the measured value, 0/OFF: offset cancellation correction value is not

:CONFigure:WITHstand:OFFSet:CANCel 1

Set the offset cancellation correction value to be subtracted from the measured value in

Execution error occurs when the test mode is insulation resistance test or BDV

Response

value, 0: offset cancellation correction value is not subtracted from the

The offset cancellation correction value is set to be subtracted from the measured value in

Execution error occurs when the test mode is insulation resistance test or BDV

1.000E-06

Setting for the threshold value for judging contact checks in withstand voltage tests

Syntax

Commands

:CONFigure:WITHstand:CONTactcheck:THReshold <Threshold value>

<Threshold value> = 1.0 to 100.0 [nF] (NRf)

Description

Set the judgment threshold value for the contact check of the withstand voltage test.

Example

:CONFigure:WITHstand:CONTactcheck:THReshold 1.0

nF.

NOTES:

Any status other than READY, it will result in an execution error.

measurement.

Query of the threshold value for judging contact checks in withstand voltage tests

Syntax

Query

:CONFigure:WITHstand:CONTactcheck:THReshold?

<Threshold value> = 1.0 to 100.0 [nF] (NR2)

Description

Return the judgment threshold value setting for the withstand voltage test contact check.

Example

1.0 nF.

NOTES:

measurement.

Query of the contact check correction value for withstand voltage test

Syntax

Query

:CONFigure:WITHstand:CONTactcheck:VALue?

Response

<Correction value> = 0.000E+00 or more [F] (NR3)

Description

Return the contact check correction value for the withstand voltage test.

Example

:CONFigure:WITHstand:CONTactcheck:VALue?

The contact check correction value for the withstand voltage test is 1 nF.

NOTES:

measurement.

HIOKI ST5680A966-00

Set the judgment threshold value for the contact check of the withstand voltage test to 1.0

Execution error occurs when the test mode is insulation resistance test or BDV

Response

:CONFigure:WITHstand:CONTactcheck:THReshold?

1.0

The judgment threshold value for the contact check of the withstand voltage test is set to

Execution error occurs when the test mode is insulation resistance test or BDV

1.000E-09

Return -4.444E+30 if no correction measurement is performed. Execution error occurs when the test mode is insulation resistance test or BDV

Setting the interval time for insulation resistance test

Syntax

Commands

:CONFigure:INSulation:STEP:INTerval <Interval time/TRIGger>

<Interval time/TRIGger> = 0.1 to 100.0 [s] (NRf), TRIGger:STOP until START key is pressed

Description

Set the interval time for insulation resistance test.

Example

:CONFigure:INSulation:STEP:INTerval 1.0

Set the interval time for the insulation resistance test to 1.0 s.

NOTES:

Any status other than READY, it will result in an execution error. Execution error occurs when the test mode is withstand voltage test or BDV measurement.

Query the interval time for insulation resistance test

Syntax

Query

:CONFigure:INSulation:STEP:INTerval?

Response

<Interval time/TRIGGER> = 0.1 to 100.0 [s] (NR2), TRIGGER:START until START key is pressed

Description

Return the interval time setting for the insulation resistance test.

Example

:CONFigure:INSulation:STEP:INTerval?

The interval time for insulation resistance test is set to 1.0 s

NOTES:

Execution error occurs when the test mode is withstand voltage test or BDV measurement.

Setting test voltage for insulation resistance test

Syntax

Commands

:CONFigure:INSulation:VOLTage:LEVel <Test voltage>

<Test voltage> = 10 to 2000 [V] (NR1)

Description

Set the test voltage for the insulation resistance test.

values.

Example

:CONFigure:INSulation:VOLTage:LEVel 20

Set the test voltage for the insulation resistance test to 20 V.

NOTES:

in an execution error.

Query of test voltage for insulation resistance test

Syntax

Query

:CONFigure:INSulation:VOLTage:LEVel?

Response

<Test voltage> = 10 to 2000 [V] (NR1)

Description

Return the test voltage setting for the insulation resistance test.

Example

:CONFigure:INSulation:VOLTage:LEVel?

The test voltage for the insulation resistance test is set to 20 V.

NOTES:

Execution error occurs when the test mode is withstand voltage test or BDV measurement.

HIOKI ST5680A966-00

Insulation Resistance Test

1.0

When the test voltage for the insulation resistance test is changed, the offset cancel function, offset cancel correction value, and contact check correction value become initial

Any status other than READY, it will result in an execution error. Execution error occurs when the test mode is withstand voltage test or BDV measurement. Setting a voltage greater than the limit voltage for the insulation resistance test, it will result

Setting for the test time for insulation resistance test

Syntax

Commands

:CONFigure:INSulation:TIMer <Test time/CONTinue>

<Test time/CONTinue> = 0.1 to 999.0 [s] (NRf), CONTinue: test continuously

Description

Set the test time for the insulation resistance test.

Example

:CONFigure:INSulation:TIMer 1.0

Set the test time for the insulation resistance test to 1.0 s.

NOTES:

CONTinue cannot be set in program test mode.

execution error.

Query of the test time for insulation resistance test

Syntax

Query

:CONFigure:INSulation:TIMer?

Response

<Test time/CONTINUE> = 0.1 to 999.0 [s] (NR2), CONTINUE: test continuously

Description

Return the test time setting for the insulation resistance test.

Example

:CONFigure:INSulation:TIMer?

The test time of the insulation resistance test is set to 1.0 s.

NOTES:

Execution error occurs when the test mode is withstand voltage test or BDV measurement.

Setting for the voltage rise time for insulation resistance test

Syntax

:CONFigure:INSulation:RISE:TIMer <Voltage rise time>

<Voltage rise time> = 0.1 to 300.0 [s] (NRf)

Description

Set the voltage rise time for the insulation resistance test.

Example

Set the voltage rise time for the insulation resistance test to 1.0 s.

NOTES:

Any status other than READY, it will result in an execution error.

er than OFF, setting the value of

resistance test + test time for insulation resistance test,” causes an execution error.

Query of the voltage rise time for insulation resistance test

Syntax

Query

:CONFigure:INSulation:RISE:TIMer?

Response

<Voltage rise time> = 0.1 to 300.0 [s] (NR2)

Description

Return the voltage rise time setting for the insulation resistance test.

Example

:CONFigure:INSulation:RISE:TIMer?

The voltage rise time for the insulation resistance test is set to 1.0 s.

NOTES:

Execution error occurs when the test mode is withstand voltage test or BDV measurement.

HIOKI ST5680A966-00

Any status other than READY, it will result in an execution error. Execution error occurs when the test mode is withstand voltage test or BDV measurement.

When the judgment waiting time for insulation resistance test is set other than OFF, setting the value of “Judgment waiting time for insulation resistance test ≥ voltage rise time for insulation resistance test + test time for insulation resistance test,” it will result in an

1.0

Commands

:CONFigure:INSulation:RISE:TIMer 1.0

Execution error occurs when the test mode is withstand voltage test or BDV measurement. When the test time of the insulation resistance test is set other than CONTinue and the judgment wait time of the insulation resistance test is set oth “Judgment waiting time for insulation resistance test ≥ voltage rise time for insulation

1.0

Setting for the voltage drop time for insulation resistance test

Syntax

Commands

:CONFigure:INSulation:FALL:TIMer <Voltage drop time/OFF>

<Voltage drop time/OFF> = 0.1 to 300.0 [s] (NRf), OFF: no voltage drop time

Description

Set the voltage drop time for the insulation resistance test.

Example

:CONFigure:INSulation:FALL:TIMer 1.0

Set the voltage drop time for the insulation resistance test to 1.0 s.

NOTES:

Any status other than READY, it will result in an execution error.

When the contact check function performs a contact check, an execution error occurs.

Query of the voltage drop time for insulation resistance test

Syntax

Query

:CONFigure:INSulation:FALL:TIMer?

<Voltage drop time/OFF> = 0.1 to 300.0 [s] (NR2), OFF: no voltage drop time

Description

Return the voltage drop time setting for the insulation resistance test.

Example

The voltage drop time for the insulation resistance test is set to 1.0 s.

NOTES:

Execution error occurs when the test mode is withstand voltage test or BDV measurement.

Setting of judgment waiting time for insulation resistance test

Syntax

Commands

:CONFigure:INSulation:JUDGment:DELay <Judgment wait time/OFF>

wait time

Description

Set the judgment waiting time for the insulation resistance test.

Example

:CONFigure:INSulation:JUDGment:DELay 1.0

Set the judgment wait time for the insulation resistance test to 1.0 s.

NOTES:

Any status other than READY, it will result in an execution error.

execution error.

Query of judgment waiting time for insulation resistance test

Syntax

Query

:CONFigure:INSulation:JUDGment:DELay?

Response

<Judgment wait time/OFF> = 0.1 to 99.9 [s] (NR2), OFF: Do not set Judgment wait time

Description

Return the judgment wait time setting for the insulation resistance test.

Example

:CONFigure:INSulation:JUDGment:DELay?

The judgment wait time of the insulation resistance test is set to 1.0 s.

NOTES:

Execution error occurs when the test mode is withstand voltage test or BDV measurement.

HIOKI ST5680A966-00

Execution error occurs when the test mode is withstand voltage test or BDV measurement.

Response

:CONFigure:INSulation:FALL:TIMer?

1.0

<Judgment wait time/OFF> = 0.1 to 99.9 [s] (NRf), OFF: Do not set decision

Execution error occurs when the test mode is withstand voltage test or BDV measurement. When the test time for insulation resistance test is set other than CONTinue, setting the value of “Judgment waiting time for insulation resistance test ≥ voltage rise time for insulation resistance test + test time for insulation resistance test,” it will result in an

1.0

Setting for the upper test limit value for insulation resistance test

Syntax

Commands

:CONFigure:INSulation:LIMit:UPPer <Upper test limit value>

<Upper test limit value> = 0.01 to 99990 [MΩ] (NRf)

Description

insulation resistance test.

Example

:CONFigure:INSulation:LIMit:UPPer 0.1

Set the upper test limit value for insulation resistance testing at 0.1 MΩ.

NOTES:

Any status other than READY, it will result in an execution error.

of “Upper test limit value ≤ lower test limit value,” it will result in an execution error.

Query of the upper test limit value for insulation resistance test

Syntax

Query

:CONFigure:INSulation:LIMit:UPPer?

<Upper test limit value> = 0.01 to 99990 [MΩ] (NR2)

Description

Return the upper test limit value setting for the insulation resistance test.

Example

The upper test limit value of the insulation resistance test is set to 0.1 MΩ.

NOTES:

Execution error occurs when the test mode is withstand voltage test or BDV measurement.

ON/OFF setting of the upper test limit value for insulation resistance test

Syntax

Commands

:CONFigure:INSulation:LIMit:UPPer:STATe <1/0/ON/OFF>

Judgment is not made at the upper test limit value

Description

Set the test upper limit value ON/OFF for the insulation resistance test.

Example

:CONFigure:INSulation:LIMit:UPPer:STATe 1

Set to judge at the upper test limit value of the insulation resistance test.

NOTES:

Any status other than READY, it will result in an execution error.

insulation resistance test to ON causes an execution error.

Query for ON/OFF of the upper test limit value for insulation resistance test

Syntax

Query

:CONFigure:INSulation:LIMit:UPPer:STATe?

Response

<1/0>

<1/0> = 1: Judgment is made at the upper test limit value, 0: Judgment is not made at the upper test limit value

Description

Return the ON/OFF setting of the upper test limit value for insulation resistance testing.

Example

It is set to be judged at the upper test limit value of the insulation resistance test.

NOTES:

Execution error occurs when the test mode is withstand voltage test or BDV measurement.

HIOKI ST5680A966-00

Set the upper limit value of resistance value, which is the criterion for pass/fail judgment in

Execution error occurs when the test mode is withstand voltage test or BDV measurement. If the test upper limit ON/OFF is set to ON for the insulation resistance test, setting a value

Response

:CONFigure:INSulation:LIMit:UPPer?

0.1000

<1/0/ON/OFF> = 1/ON: Judgment is made at the upper test limit value, 0/OFF:

Execution error occurs when the test mode is withstand voltage test or BDV measurement. When the upper and lower test limits value of the insulation resistance test are “Upper test limit value ≤ lower test limit value,” setting ON/OFF of the upper test limit value of the

:CONFigure:INSulation:LIMit:UPPer:STATe? 1

Setting for the lower test limit value for insulation resistance tests

Syntax

Commands

:CONFigure:INSulation:LIMit:LOWer <Lower test limit value>

<Lower test limit value> = 0.01 to 99990 [MΩ] (NRf)

Description

When the lower test limit value for the insulation resistance test is changed, the offset cancel function and offset cancel correction value become the initial values.

Example

:CONFigure:INSulation:LIMit:LOWer 0.1

Set the lower test limit value for insulation resistance testing at 0.1 MΩ.

NOTES:

Any status other than READY, it will result in an execution error.

of “Upper test limit value ≤ lower test limit value,” it will result in an execution error.

Query of the lower test limit value for insulation resistance test

Syntax

Query

:CONFigure:INSulation:LIMit:LOWer?

<Lower test limit value> = 0.01 to 99990 [MΩ] (NR2)

Description

Return the lower test limit value setting for the insulation resistance test.

Example

The lower test limit value of the insulation resistance test is set to 0.1 MΩ.

NOTES:

Execution error occurs when the test mode is withstand voltage test or BDV measurement.

Setting for the offset cancel function for insulation resistance test

Syntax

Commands

:CONFigure:INSulation:OFFSet:CANCel <1/0/ON/OFF>

subtracted from the measured value

Description

Set the offset cancel function for insulation resistance test.

Example

:CONFigure:INSulation:OFFSet:CANCel 1

the insulation resistance test.

NOTES:

Any status other than READY, it will result in an execution error. Execution error occurs when the test mode is withstand voltage test or BDV measurement.

Query of the offset cancel function for insulation resistance test

Syntax

Query

:CONFigure:INSulation:OFFSet:CANCel?

Response

<1/0>

<1/0> = 1: offset cancellation correction value is subtracted from the measured

measured value

Description

Return the offset cancel function setting for the insulation resistance test.

Example

the insulation resistance test.

NOTES:

Execution error occurs when the test mode is withstand voltage test or BDV measurement.

HIOKI ST5680A966-00

Set the lower limit value of resistance value, which is the criterion for pass/fail judgment in insulation resistance test.

Execution error occurs when the test mode is withstand voltage test or BDV measurement. If the test upper limit ON/OFF is set to ON for the insulation resistance test, setting a value

Response

:CONFigure:INSulation:LIMit:LOWer?

0.1000

Set the offset cancellation correction value to be subtracted from the measured value in

<1/0/ON/OFF> = 1/ON: offset cancellation correction value is subtracted from the measured value, 0/OFF: offset cancellation correction value is not

value, 0: offset cancellation correction value is not subtracted from the

:CONFigure:INSulation:OFFSet:CANCel? 1

The offset cancellation correction value is set to be subtracted from the measured value in

Query of offset cancel correction value for insulation resistance test

Syntax

Query

:CONFigure:INSulation:OFFSet:CANCel:VALue?

Response

<Correction value> = 0.000E+00 or more [Ω] (NR3)

Description

Return the offset cancellation correction value for the insulation resistance test.

Example

:CONFigure:INSulation:OFFSet:CANCel:VALue?

The offset cancel correction value for the insulation resistance test is 1.000 MΩ.

NOTES:

Execution error occurs when the test mode is withstand voltage test or BDV measurement.

Setting for the threshold for judging contact checks in insulation resistance test

Syntax

Commands

:CONFigure:INSulation:CONTactcheck:THReshold <Threshold value>

<Threshold> = 1.0 to 100.0 [nF] (NRf)

Description

Set the judgment threshold value for the insulation resistance test contact check.

Example

Set the judgment threshold value for the insulation resistance test contact check to 1.0 nF.

NOTES:

Any status other than READY, it will result in an execution error. Execution error occurs when the test mode is withstand voltage test or BDV measurement.

Query of the threshold for judging contact checks in insulation resistance test

Syntax

Query

:CONFigure:INSulation:CONTactcheck:THReshold?

<Threshold> = 1.0 to 100.0 [nF] (NR2)

Description

Return the judgment threshold value setting for the insulation resistance test contact check.

Example

:CONFigure:INSulation:CONTactcheck:THReshold?

nF.

NOTES:

Execution error occurs when the test mode is withstand voltage test or BDV measurement.

Query of the contact check correction value in insulation resistance test

Syntax

Query

:CONFigure:INSulation:CONTactcheck:VALue?

Response

<Correction value> = 0.000E+00 or more [F] (NR3)

Description

Return the contact check correction value for the insulation resistance test.

Example

:CONFigure:INSulation:CONTactcheck:VALue?

The contact check correction value for the insulation resistance test is 1 nF.

NOTES:

Execution error occurs when the test mode is withstand voltage test or BDV measurement.

HIOKI ST5680A966-00

1.000E+06

:CONFigure:INSulation:CONTactcheck:THReshold 1.0

Response

1.0

The judgment threshold value for the insulation resistance test contact check is set to 1.0

1.000E-09

Return -4.444E+30 if no correction measurement is performed.

Setting for the number of test steps for programmed tests

Syntax

Commands

:CONFigure:PROGram:COUNt <Number of steps>

<Number of steps> = 1 to 50 (NR1)

Description

Set the number of test steps for program test.

Example

:CONFigure:PROGram:COUNt 2

Set the number of test steps for the program test to 2.

NOTES:

Any status other than READY, it will result in an execution error. When the test mode is other than program test, an execution error occurs.

Query of the number of test steps for program test

Syntax

Query

:CONFigure:PROGram:COUNt?

Response

<Number of steps> = 1 to 50 (NR1)

Description

Return the setting for the number of test steps in the program test.

Example

:CONFigure:PROGram:COUNt?

The number of test steps for the program test is set to 2.

NOTES:

When the test mode is other than program test, an execution error occurs.

Selection of program steps

Syntax

Commands

:CONFigure:PROGram:SELect <Step No.>

<Step No.> = 1 to 50 (NR1)

Description

Select a program step.

Example

:CONFigure:PROGram:SELect 2

Select program step 2.

NOTES:

When the test mode is other than program test, an execution error occurs.

Query of select program steps

Syntax

Query

:CONFigure:PROGram:SELect?

Response

<Step No.> = 1 to 50 (NR1)

Description

Return the selected program step.

Example

:CONFigure:PROGram:SELect?

Program step 2 is selected.

NOTES:

When the test mode is other than program test, an execution error occurs.

Copying program steps

Syntax

Commands

:CONFigure:PROGram:COPY <Copy source step No.>,<Copy destination step No.>

<Copy source step No.> = 1 to 50 (NR1) <Copy destination step No.> = 1 to 50 (NR1)

Description

Copy a program step from the source step to the destination step.

Example

:CONFigure:PROGram:COPY 2,3

Copy program step 2 to program step 3.

NOTES:

Any status other than READY, it will result in an execution error. When the test mode is other than program test, an execution error occurs.

HIOKI ST5680A966-00

Program Test

Any status other than READY, it will result in an execution error.

Insert program steps

Syntax

Commands

:CONFigure:PROGram:INSert <Step No.>

<Step No.> = 1 to 49 (NR1)

Description

Program steps after the inserted step No. are moved backward.

Example

:CONFigure:PROGram:INSert 2

Insert a new program step into program step 2.

NOTES:

Any status other than READY, it will result in an execution error. When the test mode is other than program test, an execution error occurs.

Delete program steps

Syntax

:CONFigure:PROGram:DELete <Step No.>

<Step No.> = 1 to 50 (NR1)

Description

Delete the program step. The program step behind the deleted program step is moved forward.

Example

:CONFigure:PROGram:DELete 2

Delete program step 2.

NOTES:

When the test mode is other than program test, an execution error occurs.

Initialization of program steps

Syntax

Commands

:CONFigure:PROGram:CLEar <Step No./ALL>

<Step No./ ALL> = 1 to 50 (NR1), ALL: All steps

Description

Initializes the specified program step.

Example

:CONFigure:PROGram:CLEar 2

Initialize program step 2.

NOTES:

Any status other than READY, it will result in an execution error. When the test mode is other than program test, an execution error occurs.

Setting for the test mode for the program steps

Syntax

Commands

:CONFigure:PROGram:MODE <Test mode>

<Test mode>=W: withstand voltage test, IR: insulation resistance test

Description

Set the test mode for the program steps.

Example

:CONFigure:PROGram:MODE W

Set the test mode of the program step to the withstand voltage test.

NOTES:

Any status other than READY, it will result in an execution error. When the test mode is other than program test, an execution error occurs.

Query of the test mode for the program steps

Syntax

Query

:CONFigure:PROGram:MODE?

Response

< Te s t mode>

<Test mode>=W: withstand voltage test, IR: insulation resistance test

Description

Return the test mode setting for the program step.

Example

:CONFigure:PROGram:MODE?

The test mode of the program step is set to withstand voltage test.

NOTES:

When the test mode is other than program test, an execution error occurs.

HIOKI ST5680A966-00

Insert a new program step with default settings.

Commands

Any status other than READY, it will result in an execution error.

Setting of test mode and test conditions for program steps (withstand voltage test)

Syntax

Commands

:CONFigure:PROGram:EDIT:STEP <Step No.>, <Test mode>,

check method>

<Step No.> = 1 to 50 (NR1)

<Offset cancel function> = 1/ON: Enable offset cancel function, 0/OFF: Disable

<DC contact check method> = DISCharge

Description

Set the test mode and test conditions for the program step.

Example

1,W,0.1,DC,10,0,OFF,0.1,0.1,OFF,OFF,0.011,0,0.010,OFF,1,0,1.0,DISCharge

NOTES:

When the contact check function performs a contact check, only OFF can be set for the

“Judgment

ON/OFF of the lower test limit value to ON, it will result in an execution error.

HIOKI ST5680A966-00

<Interval time>, <Test frequency>, <Test voltage>, <Start voltage>, <DC superimposed voltage>, <Test time>, <Voltage rise time>, <Voltage drop time>, <Judgment wait time>, <Upper test limit value>, <Lower test limit value ON/OFF>, <Lower test limit value>, <ARC discharge detection function>, <Upper current limit value of ARC discharge detection function>, <Offset cancel function>, <Judgment threshold value of contact check>, <DC contact

<Test mode>=W: withstand voltage test <Interval time> = 0.1 to 100.0 [s] (NRf), TRIGger:Stop until START key is pressed <Test frequency> = DC <Test voltage> = 10 to 8000 [V] (NR1) <Start voltage> = 0 to 99 [%] (NR1) <DC superimposed voltage> = OFF <Test time> = 0.1 to 999 [s] (NRf) <Voltage rise time> = 0.1 to 300 [s] (NRf) <Voltage drop time> = 0.1 to 300 [s] (NRf), OFF: Do not set voltage drop time <Judgment wait time> = 0.1 to 99.9 [s] (NRf), OFF: Do not set judgment wait time <Upper test limit value> = 0.010 to 100.0 [mA] (NRf) < Lower test limit value ON/OFF> = 1/ON: Judgment is made at the lower test limit value, 0/OFF: Judgment is not made at the lower test limit value <Lower test limit value> = 0.010 to 100.0 [mA] (NRf) <ARC discharge detection function> = OFF: No detection, CONTinue: Arc exceeding the upper current limit value is detected and the test continues, STOP: Arc exceeding the upper current limit value is detected and the test stops <Upper current limit value of ARC discharge detection function> = 1 to 50 [%] (NR1)

offset cancel function <Judgment threshold value of contact check> = 1.0 to 100.0 [nF] (NRf)

:CONFigure:PROGram:EDIT:STEP

voltage drop time. Any status other than READY, it will result in an execution error. When the test mode is other than program test, an execution error occurs. Setting a test voltage greater than the limit voltage for the DC withstand voltage test, it will result in an execution error. If a value other than OFF is set for the DC superimposed voltage, an execution error occurs. When a value other than OFF is set for the judgment wait time, setting a value of wait time ≥ voltage rise time + test time + 0.1 s (when the start voltage of the withstand voltage test is other than 0%),” it will result in an execution error. If the upper and lower test limits are “Upper test limit value ≤ Lower test limit value,” setting

Query of test mode and test conditions for program steps (withstand voltage test)

Syntax

Query

:CONFigure:PROGram:EDIT:STEP? <Step No.>

<Step No.> = 1 to 50 (NR1)

<Start voltage>, <DC superimposed voltage>, <Test time>, <Voltage rise time>,

contact check method>

<Step No.> = 1 to 50 (NR1)

<Offset cancel function> = 1/ON: Enable offset cancel function, 0/OFF: Disable

<DC contact check method> = DISCHARGE

Description

Return the test mode and test condition settings for the program step.

Example

:CONFigure:PROGram:EDIT:STEP? 1

1,0, 1.0,DISCHARGE

NOTES:

When the test mode is other than program test, an execution error occurs.

HIOKI ST5680A966-00

Response <Step No.>, <Test mode>, <Interval time>, <Test frequency>, <Test voltage>,

<Voltage drop time>, <Judgment wait time>, <Upper test limit value>, <Lower test limit value ON/OFF>, <Lower test limit value>, <ARC discharge detection function>, <Upper current limit value of ARC discharge detection function>, <Offset cancel function>, <Judgment threshold value of contact check>, <DC

offset cancel function <Judgment threshold value of contact check> = 1.0 to 100.0 [nF] (NR2)

1,W, 0.1,DC , 10, 0,OFF, 0.1, 0.1,OFF,OFF, 0.011,0, 0.010,OFF,

Setting of test mode and test conditions for program steps (Insulation resistance test)

Syntax

Commands

:CONFigure:PROGram:EDIT:STEP <Step No.>, <Test mode>,

method>

<Step No.> = 1 to 50 (NR1)

cel function, 0/OFF: Disable

<DC contact check method> = DISCharge

Description

Set the test mode and test conditions for the program step.

Example

1,IR,0.1,10,0.1,0.1,OFF,OFF,0,100.0,1.000,0,1.0,DISCharge

NOTES:

When the contact check function performs a contact check, only OFF can be set for the

“Judgment

setting ON/OFF of the upper test limit value to ON, it will result in an execution error.

HIOKI ST5680A966-00

<Interval time>, <Test voltage>, <Test time>, <Voltage rise time>, <Voltage drop time>, <Judgment wait time>, <Upper test limit value ON/OFF>, <Upper test limit value>, <Lower test limit value>, <Offset cancel function>, <Judgment threshold value of contact check>, <DC contact check

<Test mode>= IR: insulation resistance test <Interval time> = 0.1 to 100.0 [s] (NRf), TRIGger:Stop until START key is pressed <Test voltage> = 10 to 2000 [V] (NR1) <Test time> = 0.1 to 999 [s] (NRf) <Voltage rise time> = 0.1 to 300 [s] (NRf) <Voltage drop time> = 0.1 to 300 [s] (NRf), OFF: Do not set voltage drop time <Judgment wait time> = 0.1 to 99.9 [s] (NRf), OFF: Do not set judgment wait time <Upper test limit value ON/OFF> = 1/ON: Judgment is made at the upper test limit value, 0/OFF: Judgment is not made at the upper test limit value

<Upper test limit value> = 0.01 to 99990 [MΩ] (NRf) <Lower test limit value> = 0.01 to 99990 [MΩ] (NRf)

<Offset cancel function> = 1/ON: Enable offset can offset cancel function <Judgment threshold value of contact check> = 1.0 to 100.0 [nF] (NRf)

:CONFigure:PROGram:EDIT:STEP

voltage drop time. Any status other than READY, it will result in an execution error. When the test mode is other than program test, an execution error occurs. Setting a test voltage greater than the limit voltage, it will result in an execution error. When a value other than OFF is set for the judgment wait time, setting a value of wait time ≥ Voltage rise time + Test time,” it will result in an execution error. If the upper and lower test limits values are “Upper test limit value ≤ lower test limit value,”

Query of test mode and test conditions for program steps (insulation resistance test)

Syntax

Query

:CONFigure:PROGram:EDIT:STEP? <Step No.>

<Step No.> = 1 to 50 (NR1)

test limit value>, <Lower test limit value>, <Offset

check method>

<Step No.> = 1 to 50 (NR1)

<Offset cancel function> = 1/ON: Enable offset cancel function, 0/OFF: Disable

<DC contact check method> = DISCHARGE

Description

Return the test mode and test condition settings for the program step.

Example

:CONFigure:PROGram:EDIT:STEP? 1

1.0,DISCHARGE

NOTES:

When the test mode is other than program test, an execution error occurs.

Query of offset cancellation correction values for all steps of the program test

Syntax

Query

:CONFigure:PROGram:OFFSet:CANCel:VALue?

Response

For the step of withstand voltage test:

<Correction value> = 0.000E+00 or more [Ω] (NR3)

Description

Return offset cancellation correction values for all steps of the program test. If the number of test steps in a programmed test is 2 or more, the correction values for each step are separated by a message terminator.

Example

:CONFigure:PROGram:OFFSet:CANCel:VALue?

Return offset cancellation correction values for all steps of the program test.

NOTES:

No header is attached to the response message. When the test mode is other than program test, an execution error occurs.

HIOKI ST5680A966-00

Response <Step No.>, <Test mode>, <Interval time>, <Test voltage>, <Test time>,

<Voltage rise time>, <Voltage drop time>, <Judgment wait time>, <Upper test limit value ON/OFF>, <Upper cancel function>, <Judgment threshold value of contact check>, <DC contact

<Upper test limit value> = 0.01 to 99990 [MΩ] (NRf) <Lower test limit value> = 0.01 to 99990 [MΩ] (NRf)

offset cancel function <Judgment threshold value of contact check> = 1.0 to 100.0 [nF] (NR2)

1,IR, 0.1, 10, 0.1, 0.1,OFF,OFF,0, 100.0 , 1.000 ,0,

1.000E-06

1.001E-06

<Correction value> = 0.000E+00 to 1.000E-02 [A] (NR3)

For insulation resistance test step :

Query of contact check correction values for all steps of the program test

Syntax

Query

:CONFigure:PROGram:CONTactcheck:VALue?

Response

<Correction value> = 0.000E+00 or more [F] (NR3)

Description

Return offset cancellation correction values for all steps of the program test.

number of test steps in a programmed test is 2 or more, the correction values for each

step are separated by a message terminator.

Example

:CONFigure:PROGram:CONTactcheck:VALue?

Return offset cancellation correction values for all steps of the program test.

NOTES:

No header is attached to the response message.

When the test mode is other than program test, an execution error occurs.

HIOKI ST5680A966-00

If the

1.000E-09

2.000E-09

Return -4.444E+30 if no correction measurement is performed.

Setting for the test method for BDV measurement

Syntax

Commands

:CONFigure:BDV:METHod <Test method>

<Test method> = RATE: Continuous step-up voltage test, STEP: Step-up voltage test

Description

Set the test method for BDV measurement.

initial values.

Example

:CONFigure:BDV:METHod RATE

Set the test method for BDV measurement to the continuous step-up voltage test.

NOTES:

Any status other than READY, it will result in an execution error. When the test mode is other than BDV measurement, an execution error occurs.

Query of the test method for BDV measurement

Syntax

Query

:CONFigure:BDV:METHod?

Response

<Test method> = RATE: Continuous step-up voltage test, STEP: Step-up voltage test

Description

Return the test method setting for BDV measurement.

Example

:CONFigure:BDV:METHod?

The test method for BDV measurement is set to continuous step-up voltage test.

NOTES:

When the test mode is other than BDV measurement, an execution error occurs.

Setting for the distance between electrodes for BDV measurement

Syntax

Commands

:CONFigure:BDV:ELECtrode:DISTance <Distance between electrodes>

<Distance between electrodes> = 0.01 to 10.0 [mm] (NRf)

Description

Set the distance between electrodes for BDV measurement.

Example

:CONFigure:BDV:ELECtrode:DISTance 0.1

Set the distance between electrodes for BDV measurement to 0.1 mm.

NOTES:

When the test mode is other than BDV measurement, an execution error occurs.

Query of the distance between electrodes for BDV measurement

Syntax

Query

:CONFigure:BDV:ELECtrode:DISTance?

Response

<Distance between electrodes> = 0.01 to 10.0 [mm] (NR2)

Description

Return the distance between electrodes setting for BDV measurement.

Example

:CONFigure:BDV:ELECtrode:DISTance?

The distance between electrodes for BDV measurement is set to 0.1 mm.

NOTES:

When the test mode is other than BDV measurement, an execution error occurs.

HIOKI ST5680A966-00

BDV Measurement

When the test method of BDV measurement is changed, the initial voltage, end voltage, voltage rise rate, voltage step, each step voltage holding time, and number of steps are the

RATE

Any status other than READY, it will result in an execution error.

0.10

Setting for the number of tests for BDV measurement

Syntax

Commands

:CONFigure:BDV:COUNt <Number of tests>

<Number of tests> = 1 to 20 (NR1)

Description

Set the number of tests for BDV measurement.

Example

:CONFigure:BDV:COUNt 2

Set the number of tests for BDV measurement to 2.

NOTES:

Any status other than READY, it will result in an execution error. When the test mode is other than BDV measurement, an execution error occurs.

Query of the number of tests for BDV measurement

Syntax

Query

:CONFigure:BDV:COUNt?

<Number of tests> = 1 to 20 (NR1)

Description

Return the setting for the number of tests for the BDV measurement.

Example

The number of tests for BDV measurement is set to 2.

NOTES:

When the test mode is other than BDV measurement, an execution error occurs.

Setting for the initial voltage for BDV measurement

Syntax

Commands

:CONFigure:BDV:VOLTage:STARt <Initial voltage>

<Initial voltage> = 10 to 7999 [V] (NR1)

Description

Set the initial voltage for BDV measurement.

Example

:CONFigure:BDV:VOLTage:STARt 100

Set the initial voltage for BDV measurement to 100 V.

NOTES:

Any status other than READY, it will result in an execution error.

error.

Query of the initial voltage for BDV measurement

Syntax

Query

:CONFigure:BDV:VOLTage:STARt?

Response

<Initial voltage> = 10 to 7999 [V] (NR1)

Description

Return the initial voltage setting for BDV measurement.

Example

:CONFigure:BDV:VOLTage:STARt?

The initial voltage for BDV measurement is set to 100 V.

NOTES:

When the test mode is other than BDV measurement, an execution error occurs.

Setting for the end voltage for BDV measurement

Syntax

Commands

:CONFigure:BDV:VOLTage:END <End voltage>

<End voltage> = 11 to 8000 [V] (NR1)

Description

Set the end voltage for BDV measurement.

Example

:CONFigure:BDV:VOLTage:END 4000

Set the end voltage for the BDV measurement to 4000 V.

NOTES:

execution error.

HIOKI ST5680A966-00

Response

:CONFigure:BDV:COUNt? 2

When the test mode is other than BDV measurement, an execution error occurs. If the test method for BDV measurement is set to continuous step-up voltage test, setting the voltage higher than the end voltage for BDV measurement, it will result in an execution

100

Any status other than READY, it will result in an execution error. When the test mode is other than BDV measurement, an execution error occurs. If the test method for BDV measurement is set to the step-up voltage test, an execution error occurs. If the voltage is set lower than the initial voltage for BDV measurement, it will result in an

Query of the end voltage for BDV measurement

Syntax

Query

:CONFigure:BDV:VOLTage:END?

Response

<End voltage> = 11 to 8000 [V] (NR1)

Description

Return the setting for the end voltage of the BDV measurement.

Example

:CONFigure:BDV:VOLTage:END?

The end voltage for BDV measurement is set to 4000 V.

NOTES:

When the test mode is other than BDV measurement, an execution error occurs.

Setting for the voltage step for BDV measurement

Syntax

:CONFigure:BDV:VOLTage:STEP <Voltage step/ PERCent10>

<Voltage step/PERCent10> = 10 to 5000 [V] (NR1), PERCent10: 10% of initial voltage

Description

Set the voltage step for BDV measurement.

Example

Set the voltage step for BDV measurement to 100 V.

NOTES:

execution error occurs.

Query of the voltage step for BDV measurement

Syntax

Query

:CONFigure:BDV:VOLTage:STEP?

Response

initial voltage

Description

Return the voltage step setting for the BDV measurement.

Example

:CONFigure:BDV:VOLTage:STEP?

The voltage step for BDV measurement is set to 100 V.

NOTES:

When the test mode is other than BDV measurement, an execution error occurs.

Setting for the voltage rise rate for BDV measurement

Syntax

Commands

:CONFigure:BDV:RISE:RATE <Voltage rise rate>

<Voltage rise rate> = 1/2/5/10/12/20/50/100/200/500/1000/2000/5000 [V/s]

Description

Set the voltage rise rate for BDV measurements.

Example

Set the voltage rise rate for BDV measurement to 2 V/s.

NOTES:

Any status other than READY, it will result in an execution error.

error occurs.

Query of the voltage rise rate for BDV measurement

Syntax

Query

:CONFigure:BDV:RISE:RATE?

<Voltage rise rate> = 1/2/5/10/12/20/50/100/200/500/1000/2000/5000 [V/s]

Description

Return the voltage rise rate setting for BDV measurement.

Example

:CONFigure:BDV:RISE:RATE?

The voltage boost rate for BDV measurement is set to 2 V/s.

HIOKI ST5680A966-00

4000

Commands

:CONFigure:BDV:VOLTage:STEP 100

<Voltage step/PERCENT10> = 10 to 5000 [V] (NR1), PERCENT10: 10% of

100

:CONFigure:BDV:RISE:RATE 2

When the test mode is other than BDV measurement, an execution error occurs. If the test method for BDV measurement is set to the step-up voltage test, an execution

Response

NOTES:

When the test mode is other than BDV measurement, an execution error occurs.

Setting for the voltage holding time for each stage of BDV measurement

Syntax

Commands

:CONFigure:BDV:HOLD:TIMer <Voltage holding time for each stage/HOLD>

I/O or accepting

stage

Description

Set the voltage holding time for each stage of BDV measurement.

Example

:CONFigure:BDV:HOLD:TIMer 2

Set the voltage holding time for each step of the BDV measurement to 2 s.

NOTES:

Any status other than READY, it will result in an execution error.

execution error occurs.

Query of the voltage holding time for each stage of BDV measurement

Syntax

Query

:CONFigure:BDV:HOLD:TIMer?

Response

<Voltage holding time for each stage/HOLD> = 1 to 300 [s] (NR1), HOLD:

or accepting

stage

Description

Return the voltage holding time setting for each stage of the BDV measurement.

Example

The voltage holding time for each stage of BDV measurement is set to 2 s.

NOTES:

When the test mode is other than BDV measurement, an execution error occurs.

Setting for the number of steps for BDV measurement

Syntax

:CONFigure:BDV:STEP:COUNt <Number of steps>

<Number of steps> = 2 to 20 (NR1)

Description

Set the number of steps in the BDV measurement.

Example

:CONFigure:BDV:STEP:COUNt 3

Set the number of steps in the BDV measurement to 3.

NOTES:

execution error occurs.

Query of the number of steps for BDV measurement

Syntax

Query

:CONFigure:BDV:STEP:COUNt?

Response

<Number of steps> = 2 to 20 (NR1)

Description

Return the setting for the number of steps in the BDV measurement.

Example

:CONFigure:BDV:STEP:COUNt?

The number of steps for BDV measurement is set to 3.

NOTES:

When the test mode is other than BDV measurement, an execution error occurs.

HIOKI ST5680A966-00

<Voltage holding time for each stage/HOLD> = 1 to 300 [s] (NR1), HOLD: Pressing the START key or inputting the START signal of EXT. the *TRG command or accepting the :STARt command to proceed to the next

When the test mode is other than BDV measurement, an execution error occurs. If the test method for BDV measurement is set to the continuous step-up voltage test, an

Pressing the START key or inputting the START signal of EXT. I/O the *TRG command or accepting the :STARt command to proceed to the next

:CONFigure:BDV:HOLD:TIMer? 2

Commands

Setting for the current upper limit reference value for BDV measurement

Syntax

Commands

:CONFigure:BDV:LIMit:UPPer <Current upper limit reference value>

<Current upper limit reference value> = 0.010 to 100.0 [mA] (NRf)

Description

Set the current upper limit reference value for BDV measurement.

Example

:CONFigure:BDV:LIMit:UPPer 0.1

Set the current upper limit reference value for BDV measurement to 0.1 mA.

NOTES:

Any status other than READY, it will result in an execution error. When the test mode is other than BDV measurement, an execution error occurs.

Query of the current upper limit reference value for BDV measurement

Syntax

Query

:CONFigure:BDV:LIMit:UPPer?

<Current upper limit reference value> = 0.010 to 100.0 [mA] (NR2)

Description

Return the setting of the current upper reference value for BDV measurement.

Example

The current upper limit reference value for BDV measurement is set at 0.1 mA.

NOTES:

When the test mode is other than BDV measurement, an execution error occurs.

ON/OFF setting of ARC discharge detection function for BDV measurement

Syntax

Commands

:CONFigure:BDV:ARC:STATe <1/0/ON/OFF>

0/OFF: Arc beyond the upper current limit value is not detected

Description

Set the ON/OFF of the ARC discharge detection function for BDV measurement.

Example

:CONFigure:BDV:ARC:STATe 1

Set the BDV measurement to detect arcs that exceed the upper current limit value.

NOTES:

Any status other than READY, it will result in an execution error. When the test mode is other than BDV measurement, an execution error occurs.

Query of ON/OFF of ARC discharge detection function for BDV measurement

Syntax

Query

:CONFigure:BDV:ARC:STATe?

Response

<1/0>

<1/0> = 1: Arc beyond the upper current limit value is detected, 0: Arc beyond the upper current limit value is not detected

Description

Return the ON/OFF of ARC discharge detection function setting for BDV measurements.

Example

:CONFigure:BDV:ARC:STATe?

The BDV measurement is set to detect arcs that exceed the upper current limit value.

NOTES:

When the test mode is other than BDV measurement, an execution error occurs.

HIOKI ST5680A966-00

Response

:CONFigure:BDV:LIMit:UPPer?

0.100

<1/0/ON/OFF> = 1/ON: Arc beyond the upper current limit value is detected,

Setting for the upper current limit value of the ARC discharge detection function for BDV measurement

Syntax

Commands

:CONFigure:BDV:ARC:LIMit <Upper current limit value>

<Upper current limit value> = 1 to 50 [%] (NR1)

Description

measurement.

Example

measurement to 3 %.

NOTES:

Any status other than READY, it will result in an execution error. When the test mode is other than BDV measurement, an execution error occurs.

Query of the upper current limit value of the ARC discharge detection function for BDV measurement

Syntax

Query

:CONFigure:BDV:ARC:LIMit?

<Upper current limit value> = 1 to 50 [%] (NR1)

Description

Return the upper current limit value setting for the ARC discharge detection function of the BDV measurement.

Example

measurement is set at 3 %.

NOTES:

When the test mode is other than BDV measurement, an execution error occurs.

HIOKI ST5680A966-00

Set the upper current limit value of the ARC discharge detection function for BDV

:CONFigure:BDV:ARC:LIMit 3

Set the upper current limit value of the ARC discharge detection function for BDV

Response

:CONFigure:BDV:ARC:LIMit? 3

The upper current limit value of the ARC discharge detection function for BDV

Setting for the limit voltage for the DC withstand voltage test

Syntax

Commands

:SYSTem:DC:WITHstand:VOLTage:LIMit <Limit voltage>

<Limit voltage> = 10 to 8000 [V] (NR1)

Description

Set the limit voltage for the DC withstand voltage test.

Example

:SYSTem:DC:WITHstand:VOLTage:LIMit 100

Set the limit voltage for the DC withstand voltage test to 100 V.

NOTES:

Any status other than READY, it will result in an execution error.

Query of the limit voltage for the DC withstand voltage test

Syntax

Query

:SYSTem:DC:WITHstand:VOLTage:LIMit?

Response

<Limit voltage> = 10 to 8000 [V] (NR1)

Description

Return the limit voltage setting for the DC withstand voltage test.

Example

:SYSTem:DC:WITHstand:VOLTage:LIMit?

The limit voltage for the DC withstand voltage test is set to 100 V.

Setting for the limit voltage for insulation resistance test

Syntax

Commands

:SYSTem:INSulation:VOLTage:LIMit <Limit voltage>

<Limit voltage> = 10 to 2000 [V] (NR1)

Description

Set the limit voltage for insulation resistance test.

Example

:SYSTem:INSulation:VOLTage:LIMit 100

Set the limit voltage for the insulation resistance test to 100 V.

NOTES:

Any status other than READY, it will result in an execution error.

Query of the limit voltage for insulation resistance test

Syntax

Query

:SYSTem:INSulation:VOLTage:LIMit?

Response

<Limit voltage> = 10 to 2000 [V] (NR1)

Description

Return the limit voltage setting for the insulation resistance test.

Example

:SYSTem:INSulation:VOLTage:LIMit?

The limit voltage for the insulation resistance test is set to 100 V.

Setting for the contact check function

Syntax

Commands

:SYSTem:CONTactcheck:VERify <Contact check function>

contact check

Description

Set the contact check to be performed.

Example

:SYSTem:CONTactcheck:VERify ON

Set the contact check to be performed.

NOTES:

Any status other than READY, it will result in an execution error.

setting the contact check function ON will result in an execution error.

HIOKI ST5680A966-00

Test Common

100

<Contact check function> = OFF: Do not perform contact check, ON: Perform

If the output timing of the judgment signal for the withstand voltage test or the judgment signal for the insulation resistance test is set to output ON when the test is completed,

Query of the contact check function

Syntax

Query

:SYSTem:CONTactcheck:VERify?

Response

contact check

Description

Return the settings for the contact check function.

Example

:SYSTem:CONTactcheck:VERify?

It is set to perform contact check.

Setting for the insulation resistance test end mode

Syntax

:SYSTem:INSulation:TERMinate <CONTinue/PASS/FAIL>

<CONTinue/PASS/FAIL> = CONTinue: Test until set time, PASS: End with PASS judgment, FAIL: End with FAIL judgment

Description

Set the insulation resistance test end mode.

Example

:SYSTem:INSulation:TERMinate PASS

Set the insulation resistance test end mode to end with PASS judgment.

NOTES:

Any status other than READY, it will result in an execution error.

Query of the insulation resistance test end mode

Syntax

Query

:SYSTem:INSulation:TERMinate?

Response

PASS judgment, FAIL: End with FAIL judgment

Description

Return the setting for the insulation resistance test end mode.

Example

:SYSTem:INSulation:TERMinate?

The insulation resistance test end mode is set to end with PASS judgment.

Setting for operation at FAIL judgment

Syntax

:SYSTem:JUDGe:FAIL <STOP/CONTinue>

<STOP/CONTinue> = STOP: Test ended, CONTinue: Test continued

Description

Set the operation at the time of FAIL judgment.

Example

:SYSTem:JUDGe:FAIL STOP

Set the operation at the time of FAIL judgment to test termination.

NOTES:

Any status other than READY, it will result in an execution error.

Query of operation at the time of FAIL judgment

Syntax

Query

:SYSTem:JUDGe:FAIL?

Response

<:STOP/CONTINUE>

<:STOP/CONTINUE> = STOP: Test ended, CONTINUE: Test continued

Description

Return the setting of the operation at the time of FAIL judgment.

Example

:SYSTem:JUDGe:FAIL?

Operation at the time of FAIL judgment is set to test end.

HIOKI ST5680A966-00

<Contact check function> = OFF: Do not perform contact check, ON: Perform

Commands

<CONTINUE/PASS/FAIL> = CONTINUE: Test until set time, PASS: End with

PASS

Commands

:STOP

Setting for the auto-range function for withstand voltage test

Syntax

Commands

:SYSTem:WITHstand:RANGe:AUTO <1/0/ON/OFF>

<1/0/ON/OFF> = 1/ON: Enable the auto-range function of the withstand voltage test, 0/OFF: Disable the auto-range function of the withstand voltage test.

Description

Set the auto-range function for the withstand voltage test.

Example

:SYSTem:WITHstand:RANGe:AUTO 1

Set the auto-range function of the withstand voltage test to enable.

NOTES:

Any status other than READY, it will result in an execution error.

Query of the auto-range function for withstand voltage test

Syntax

Query

:SYSTem:WITHstand:RANGe:AUTO?

<1/0>

<1/0> = 1: Auto-range function for withstand voltage test is enabled, 0: Auto-range function for withstand voltage test is disabled

Description

Return the auto-range function setting of the withstand voltage test.

Example

The auto-range function of the withstand voltage test is set to enable.

Setting for the auto-range function for insulation resistance test

Syntax

Commands

:SYSTem:INSulation:RANGe:AUTO <1/0/ON/OFF>

<1/0/ON/OFF> = 1/ON: Enable auto-range function of insulation resistance test, 0/OFF: Disable auto-range function of insulation resistance test

Description

Set the auto-range function for insulation resistance test.

Example

:SYSTem:INSulation:RANGe:AUTO 1

Set the auto-range function of the insulation resistance test to Enabled.

NOTES:

Any status other than READY, it will result in an execution error.

Query of the auto-range function for insulation resistance test

Syntax

Query

:SYSTem:INSulation:RANGe:AUTO?

<1/0>

<1/0> = 1: Auto-range function of insulation resistance test is enabled, 0: Auto-range function of insulation resistance test is disabled

Description

Return the auto-range function setting of the insulation resistance test.

Example

The auto-range function of the insulation resistance test is set to enable.

Setting for the use of the previous value of data during auto-ranging

Syntax

Commands

:SYSTem:RANGe:AUTO:DATA:KEEP <1/0/ON/OFF>

<1/0/ON/OFF> = 1/ON: Enables the use of the previous value of data during

auto-range

Description

Set the use of the previous value of the data during auto-range.

Example

:SYSTem:RANGe:AUTO:DATA:KEEP 1

Set the use of the previous value of the data during auto-range to Enabled.

NOTES:

Any status other than READY, it will result in an execution error.

HIOKI ST5680A966-00

Response

:SYSTem:WITHstand:RANGe:AUTO? 1

Response

:SYSTem:INSulation:RANGe:AUTO? 1

auto-range, 0/OFF: Disables the use of the previous value of data during

Query of the use of the previous value of data during auto-ranging

Syntax

Query

:SYSTem:RANGe:AUTO:DATA:KEEP?

Response

<1/0>

Disables the use of the previous value of data during auto-range

Description

Return the setting of the use of the previous value of the data being auto-range.

Example

:SYSTem:RANGe:AUTO:DATA:KEEP?

The use of the previous value of the data during auto-ranging is set to enable.

Setting for the measured value when range-over

Syntax

Commands

:SYSTem:FORMat:OVER <TYPE1/TYPE2>

of the measurement range

Description

Set the measured value at the time of range-over.

Example

:SYSTem:FORMat:OVER TYPE2

Set the measured value at the time of range-over to TYPE2.

NOTES:

Waveform and trend data are always processed with TYPE1 regardless of the setting of

Any status other than READY, it will result in an execution error.

Query of the measured value at the time of range-over

Syntax

Query

:SYSTem:FORMat:OVER?

Response

<TYPE1/TYPE2> = TYPE1:Return 1E+24, TYPE2:Return the maximum value of the measurement range

Description

Return the setting of the measured value at the time of range-over.

Example

:SYSTem:FORMat:OVER?

The measured value at the time of range-over is set to TYPE2.

HIOKI ST5680A966-00

<1/0> = 1: Enables the use of the previous value of data during auto-range, 0:

<TYPE1/TYPE2> = TYPE1:Return 1E+24, TYPE2:Return the maximum value

this command.

TYPE2

Storage of test conditions

Syntax

Commands

:PANel:SAVE <Panel No.>,<"Panel name">

For withstand voltage test mode:

<"Panel name"> = (max. 10 characters)

Description

Save the test conditions to the panel memory of the specified panel No.

Example

:PANel:SAVE 1,"PANEL1"

Save the test condition to the panel memory of panel No. 1 under the name "PANEL1".

NOTES:

Any status other than READY, it will result in an execution error.

resistance test, insulation resistance test → withstand voltage test.

Query of panel memory storage status

Syntax

:PANel:SAVE? <Panel No.>

For withstand voltage test mode:

<Panel No.> = 1 to 10

Response

<1/0>

<1/0> = 1:Saved, 0:Not saved

Description

Return the panel memory storage status of the specified panel No.

Example

:PANel:SAVE? 1

Panel memory for panel No. 1 has already been saved.

NOTES:

An execution error occurs when the test mode is withstand voltage test → insulation resistance test, insulation resistance test → withstand voltage test.

HIOKI ST5680A966-00

Panel Memory

<Panel No.> = 1 to 64 <"Panel name"> = (max. 10 characters)

For insulation resistance test mode:

<Panel No.> = 1 to 64 <"Panel name"> = (max. 10 characters)

For program test mode:

<Panel No.> = 1 to 30 <"Panel name"> = (max. 10 characters)

For BDV measurement mode:

<Panel No.> = 1 to 10

An execution error occurs when the test mode is withstand voltage test → insulation

Query

<Panel No.> = 1 to 64

For insulation resistance test mode:

<Panel No.> = 1 to 64

For program test mode:

<Panel No.> = 1 to 30

For BDV measurement mode:

Query of the date and time of panel memory storage

Syntax

Query

:PANel:SAVE:DATE? <Panel No.>

For withstand voltage test mode:

<Panel No.> = 1 to 10

<Year> = 0 to 99 (NR1)

<Second> = 0 to 59 (NR1)

Description

Return the date and time the panel memory of the specified panel No. is saved.

Example

:PANel:SAVE:DATE? 1

11:37:29.

NOTES:

Specifying a panel No. that has not been saved will result in an execution error.

Loading test conditions

Syntax

Commands

:PANel:LOAD <Panel No.>

For withstand voltage test mode:

<Panel No.> = 1 to 10

Description

Load test conditions from the panel memory of the specified panel No.

Example

:PANel:LOAD 1

Load test conditions from the panel memory of panel No. 1.

NOTES:

Any status other than READY, it will result in an execution error.

Specifying a panel No. that has not been saved will result in an execution error.

HIOKI ST5680A966-00

<Panel No.> = 1 to 64

For insulation resistance test mode:

<Panel No.> = 1 to 64

For program test mode:

<Panel No.> = 1 to 30

For BDV measurement mode:

Response

<Month> = 1 to 12 (NR1) <Day> = 1 to 31 (NR1) <Hour> = 0 to 23 (NR1) <Minute> = 0 to 59 (NR1)

20, 2,21,11,37,29

The date and time of the panel memory save for panel No. 1 is February 21, 2020,

An execution error occurs when the test mode is withstand voltage test → insulation

resistance test, insulation resistance test → withstand voltage test.

<Panel No.> = 1 to 64

For insulation resistance test mode:

<Panel No.> = 1 to 64

For program test mode:

<Panel No.> = 1 to 30

For BDV measurement mode:

An execution error occurs when the test mode is withstand voltage test → insulation resistance test, insulation resistance test → withstand voltage test.

Query of panel name

Syntax

Query

:PANel:NAME? <Panel No.>

For withstand voltage test mode:

<Panel No.> = 1 to 10

<"Panel name">

<"Panel name"> = (max. 10 characters)

Description

Return the panel name of the panel memory of the specified panel No.

Example

:PANel:NAME? 1

The panel memory panel name for panel No. 1 is "PANEL1".

NOTES:

Specifying a panel No. that has not been saved will result in an execution error.

Change panel name

Syntax

Commands

:PANel:REName <Panel No.>,<"Panel name">

For withstand voltage test mode:

<"Panel name"> = (max. 10 characters)

Description

Change the panel name in the panel memory of the specified panel No.

Example

:PANel:REName 1,"PANEL_1"

Change the panel name in the panel memory of panel No. 1 to "PANEL_1".

NOTES:

Any status other than READY, it will result in an execution error.

Specifying a panel No. that has not been saved will result in an execution error.

HIOKI ST5680A966-00

<Panel No.> = 1 to 64

For insulation resistance test mode:

<Panel No.> = 1 to 64

For program test mode:

<Panel No.> = 1 to 30

For BDV measurement mode:

Response

"PANEL1"

No header is attached to the response message. An execution error occurs when the test mode is withstand voltage test → insulation

resistance test, insulation resistance test → withstand voltage test.

<Panel No.> = 1 to 64 <"Panel name"> = (max. 10 characters)

For insulation resistance test mode:

<Panel No.> = 1 to 64 <"Panel name"> = (max. 10 characters)

For program test mode:

<Panel No.> = 1 to 30 <"Panel name"> = (max. 10 characters)

For BDV measurement mode:

<Panel No.> = 1 to 10

An execution error occurs when the test mode is withstand voltage test → insulation resistance test, insulation resistance test → withstand voltage test.

Delete panel memory

Syntax

Commands

:PANel:DELete <Panel No./ALL>

For withstand voltage test mode:

<Panel No./ ALL> = 1 to 10, ALL: All panels

Description

Delete the panel name in the panel memory of the specified panel No.

Example

:PANel:DELete 1

Delete the panel memory of panel No. 1.

NOTES:

Any status other than READY, it will result in an execution error.

Specifying a panel No. that has not been saved will result in an execution error.

Query of panel No. of stored panel memory

Syntax

Query

:PANel:LIST?

Response

Description

Return the list of panel No. In the saved panel memory, separated by comma (,).

Example

:PANel:LIST?

Saved panel memories are panel No. 1, 2, 3, and 4.

NOTES:

resistance test, insulation resistance test → withstand voltage test.

HIOKI ST5680A966-00

<Panel No./ ALL> = 1 to 64, ALL: All panels

For insulation resistance test mode:

<Panel No./ ALL> = 1 to 64, ALL: All panels

For program test mode:

<Panel No./ ALL> = 1 to 30, ALL: All panels

For BDV measurement mode:

An execution error occurs when the test mode is withstand voltage test → insulation resistance test, insulation resistance test → withstand voltage test.

1, 2, 3, 4

No header is attached to the response message. If the number of saved panel memories is 0, 0 is returned.

An execution error occurs when the test mode is withstand voltage test → insulation

Query of test results stored in data memory

Syntax

Query

:MEMory:FETCh?

Response

<Test mode>,<Test start date and time>,<Voltage measured value>,<Current

range>,<Remaining test time>,<Judgment result>,<Timer type>

<Timer type> = 0: Test time, 1: Voltage rise time (NR1)

Description

Return the test results stored in data memory. If there is more than one test result, each result is separated by a message terminator.

Example

:MEMory:FETCh?

Return the test results stored in data memory.

NOTES:

No header is attached to the response message.

Once the data memory is full, no further test results will be stored. To save a new test result,

If the test results are not stored in data memory, an execution error occurs.

Save test results stored in data memory

Syntax

Commands

:MEMory:SAVE <"File name">

<"File name"> = (max. 251 characters)

Description

Save the test results stored in data memory to a USB memory device by specifying a file

time, please specify up to 250 characters.

Example

:MEMory:SAVE "/MEMORY/DATA1"

"/MEMORY/DATA1".

NOTES:

If you do not specify a slash (/) at the beginning of the file name, please specify the file name

If the USB flash device is not connected, an execution error will occur.

HIOKI ST5680A966-00

Data Memory

measured value>,<Resistance measured value>,<Measurement

<Test mode>=W: withstand voltage test, IR: insulation resistance test <Test start date and time> = YYYYY-MM-DD HH:MM:SS (YYYYY:year, MM:month, DD:day, HH:hour, MM:minute, SS:second) <Voltage measured value> = [V] (NR3) <Current measured value> = [A] (NR3)

<Resistance measured value> = [Ω] (NR3)

<Measurement range> = Withstand voltage test mode : 300uA, 3mA, 30mA, 100mA, NONE (no measured value) / Insulation resistance test mode : 100kohm, 1Mohm, 10Mohm, 100Mohm, 1Gohm, 10Gohm, 100Gohm, NONE (no measured value) <Remaining test time> = [s] (NR2) <Judgment result> = PASS:PASS, UFAIL:UPPER FAIL, LFAIL:LOWER FAIL, ULFAIL:UPPER LOWER FAIL, OFF:Other

W,2020-03-13 15:55:36, 1.000E+03, 2.000E-03, 0.000E+00,3mA, 30.0,PASS,0 W,2020-03-13 15:55:46, 1.000E+03, 2.010E-03, 0.000E+00,3mA, 30.1,PASS,0

When the test mode is insulation resistance test, the current measurement value is blank. Executing this command clears the contents of the data memory.

read the contents of the data memory with this command or delete the contents of the data memory by executing the :MEMory:CLEar command. Any status other than READY, it will result in an execution error. When the test mode is BDV measurement, an execution error occurs.

name. The file name extension does not need to be specified. If the beginning of the file name is not a slash (/), a slash is added to the beginning. At this

Save the test results stored in the data memory to a USB flash device with the file name

within 250 characters. Executing this command clears the contents of the data memory. Any status other than READY, it will result in an execution error. When the test mode is BDV measurement, an execution error occurs. If the test results are not stored in data memory, an execution error occurs.

Query of test results stored in data memory

Syntax

Query

:MEMory:COUNt?

Response

<Number of data> = 0 to 32000 (NR1)

Description

Return the test results stored in data memory.

Example

:MEMory:COUNt?

The number of test results stored in data memory is 2.

NOTES:

When the test mode is BDV measurement, an execution error occurs.

Setting for data memory function

Syntax

Commands

:MEMory:CONTrol <1/0/ON/OFF>

<1/0/ON/OFF> = 1/ON: Save test results in data memory, 0/OFF: Do not save test results in data memory

Description

Set the data memory function.

Example

Set the test results to be stored in data memory.

NOTES:

Any status other than READY, it will result in an execution error. When the test mode is BDV measurement, an execution error occurs.

Query of data memory function

Syntax

Query

:MEMory:CONTrol?

<1/0>

<1/0> = 1: Save test results in data memory, 0: Do not save test results in data memory

Description

Return the data memory function setting.

Example

:MEMory:CONTrol?

It is set to store test results in data memory.

NOTES:

When the test mode is BDV measurement, an execution error occurs.

Delete data memory

Syntax

Commands

:MEMory:CLEar

Description

Delete all test results stored in data memory.

Example

:MEMory:CLEar

Delete all test results stored in data memory.

NOTES:

Any status other than READY, it will result in an execution error. When the test mode is BDV measurement, an execution error occurs.

HIOKI ST5680A966-00

:MEMory:CONTrol 1

Response

Query of NPN/PNP switch status

Syntax

Query

:IO:MODE?

Response

<Switch status> = NPN/PNP

Description

Return the status of the NPN/PNP switch on the back of the unit.

Example

:IO:MODE?

The switch is set to NPN.

Output of versatile output terminal

Syntax

:IO:OUTPut <Terminal>,<Data>

<Terminal>> = OUT0/OUT1 <Data> = 0 to 1 (NR1)

Description

Output data to the versatile output terminal.

Example

:IO:OUTPut OUT0,1

Output 1 to the versatile output terminal OUT0.

Setting for judgment signal output timing for withstand voltage test

Syntax

Commands

:IO:WITHstand:JUDGe:TIMing <MEASure/TEST>

<MEASure/TEST> = MEASure: Output ON when test is completed and test voltage is OFF, TEST: Output ON when test is completed

Description

Set the output timing of the judgment result of the withstand voltage test.

Example

:IO:WITHstand:JUDGe:TIMing TEST

when the test is completed.

NOTES:

Any status other than READY, it will result in an execution error. If the contact check function is set to perform contact check, setting output ON when the test is completed will result in an execution error.

Query of judgment signal output timing for withstand voltage test

Syntax

Query

:IO:WITHstand:JUDGe:TIMing?

<MEASURE/TEST> = MEASURE: Output ON when test is completed and test voltage is OFF, TEST: Output ON when test is completed

Description

Return the output timing setting of the judgment result of the withstand voltage test.

Example

:IO:WITHstand:JUDGe:TIMing?

when the test is completed.

HIOKI ST5680A966-00

EXT. I/O

NPN

Commands

Set the output timing of the judgment result of the withstand voltage test to output ON

Response

TEST

The output timing of the judgment result of the withstand voltage test is set to output ON

Setting for the output timing of the judgment signal for the insulation resistance test

Syntax

Commands

:IO:INSulation:JUDGe:TIMing <MEASure/TEST>

<MEASure/TEST> = MEASure: Output ON when test is completed and test voltage is OFF, TEST: Output ON when test is completed

Description

Set the output timing of the judgment result of the insulation resistance test.

Example

:IO:INSulation:JUDGe:TIMing TEST

when the test is completed.

NOTES:

Any status other than READY, it will result in an execution error.

t ON when the test

is completed will result in an execution error.

Query of the output timing of the judgment signal for the insulation resistance test

Syntax

Query

:IO:INSulation:JUDGe:TIMing?

<MEASURE/TEST> = MEASURE: Output ON when test is completed and test voltage is OFF, TEST: Output ON when test is completed

Description

Return the setting of the output timing of the judgment result of the insulation resistance test.

Example

ON when the test is completed.

Setting for TEST signal output timing

Syntax

Commands

:IO:TEST:SIGNal <PROBe/TEST/RISE/MEASure>

<PROBe/TEST/RISE/MEASure> = PROBe: Output ON from test start until test

judgment output turns OFF

Description

Set the output timing of the TEST signal of EXT. I/O.

Example

:IO:TEST:SIGNal MEASure

until the judgment output is turned O F F.

NOTES:

Any status other than READY, it will result in an execution error.

Query of TEST signal output timing

Syntax

Query

:IO:TEST:SIGNal?

<PROBE/TEST/RISE/MEASURE> = PROBE: Output ON from test start until

start until judgment output turns OFF

Description

Return the output timing setting of the TEST signal of EXT. I/O.

Example

:IO:TEST:SIGNal?

test until the judgment output is turned OFF.

HIOKI ST5680A966-00

Set the output timing of the judgment result of the insulation resistance test to output ON

If the contact check function is set to perform contact check, setting outpu

Response

:IO:INSulation:JUDGe:TIMing? TEST

The output timing of the judgment result of the insulation resistance test is set to output

voltage turns OFF, TEST: Output ON during test time, RISE: Output ON from test start until test voltage is reached, MEASure: Output ON from test start until

Set the output timing of the TEST signal of EXT. I/O to output ON from the start of the test

Response

test voltage turns OFF, TEST: Output ON during test time, RISE: Output ON from test start until test voltage is reached, MEASURE: Output ON from test

MEASURE

The output timing of the TEST signal of EXT. I/O is set to output ON from the start of the

Buzzer volume setting for PASS judgment

Syntax

Commands

:SYSTem:BEEPer:VOLume:PASS <Volume/OFF>

<Volume/OFF> = 1 to 5 (NR1), OFF: No buzzer sound

Description

Set the volume of the buzzer at the time of PASS judgment.

Example

:SYSTem:BEEPer:VOLume:PASS 2

Set the buzzer volume at the time of PASS judgment to 2.

Query of buzzer volume setting for PASS judgment

Syntax

Query

:SYSTem:BEEPer:VOLume:PASS?

<Volume/OFF> = 1 to 5 (NR1), OFF: No buzzer sound

Description

Return the buzzer volume setting for the PASS judgment.

Example

SYSTem:BEEPer:VOLume:PASS?

The buzzer volume at the time of PASS judgment is set to 2.

Buzzer volume setting for FAIL judgment

Syntax

Commands

:SYSTem:BEEPer:VOLume:FAIL <Volume/OFF>

<Volume/OFF> = 1 to 5 (NR1), OFF: No buzzer sound

Description

Set the volume of the buzzer at the time of FAIL judgment.

Example

:SYSTem:BEEPer:VOLume:FAIL 2

Set the buzzer volume at the time of FAIL judgment to 2.

Query of buzzer volume setting for FAIL judgment

Syntax

Query

:SYSTem:BEEPer:VOLume:FAIL?

Response

<Volume/OFF> = 1 to 5 (NR1), OFF: No buzzer sound

Description

Return the buzzer volume setting for the FAIL judgment.

Example

:SYSTem:BEEPer:VOLume:FAIL?

The buzzer volume at the time of FAIL judgment is set to 2.

Momentary out function setting

Syntax

:SYSTem:MOMentary:OUT <1/0/ON/OFF>

<1/0/ON/OFF> = 1/ON: Enable momentary output function, 0/OFF: Disable momentary output function

Description

Set the momentary out function.

Example

Set the momentary out function to Enabled.

Momentary out function query

Syntax

Query

:SYSTem:MOMentary:OUT?

Response

<1/0>

<1/0> = 1: Momentary out function enabled, 0: Momentary out function disabled

Description

Return the momentary out function setting.

Example

:SYSTem:MOMentary:OUT?

The momentary out function is set to enable.

HIOKI ST5680A966-00

System

Response

Commands

:SYSTem:MOMentary:OUT 1

Perform key lock

Syntax

Commands

:SYSTem:KEYLock

Description

Set the key lock status.

Example

Set the key lock status.

Key lock status query

Syntax

Query

:SYSTem:KEYLock?

Response

<1/0>

<1/0> = 1: Key locked, 0: Not key locked

Description

Return the status of the key lock.

Example

:SYSTem:KEYLock?

Key locked

Key lock passcode setting

Syntax

Commands

:SYSTem:KEYLock:PASScode <"Passcode"/None>

<"Passcode"> = 0 to 9 (max. 4 characters)

Description

Set the passcode for the key lock.

The factory passcode is set to“0000.”

Example

:SYSTem:KEYLock:PASScode "5680"

Set the key lock passcode to “5680.”

NOTES:

When the passcode exceeds 4 characters.

Unlocking the key lock

Syntax

Commands

:SYSTem:KEYLock:UNLock <"Passcode"/None>

<"Passcode"> = 0 to 9 (max. 4 characters)

Description

The factory passcode is set to “0000.”

Example

:SYSTem:KEYLock:UNLock "5680"

Specify the passcode “5680” to unlock the key lock.

NOTES:

The following cases will result in an execution error.

If you forget the passcode, do a full reset and return to factory setting.

Release of remote status

Syntax

Commands

:SYSTem:LOCal

Description

The remote state is released and the local state is set.

Example

:SYSTem:LOCal

The remote state is released and the local state is set.

HIOKI ST5680A966-00

:SYSTem:KEYLock

If you omit the passcode, it will be set to no passcode.

The following cases will result in an execution error.

・When the key is locked. ・When the passcode contains invalid characters (such as alphabetic characters, spaces,

slashes, etc.).

・

Unlock the key lock. If a passcode is set, specify the passcode in the command data.

・When the key is locked. ・When the passcode contains invalid characters (such as alphabetic characters, spaces,

slashes, etc.).

・When the passcode exceeds 4 characters. ・When the passcode is wrong.

Setting for calibration due date

Syntax

Commands

:SYSTem:CALibration:PERiod <Year>,<Month>,<Day>

<Year> = 0 to 99 (NR1)

<Day> = 1 to 31 (NR1)

Description

Set the calibration due date.

Example

Set the calibration deadline to February 21, 2020.

NOTES:

Dates can range from January 1, 2000 to December 31, 2099.

If a non-existent date is specified, an execution error will occur.

Query of calibration due date

Syntax

Query

:SYSTem:CALibration:PERiod?

<Year> = 0 to 99 (NR1)

<Day> = 1 to 31 (NR1)

Description

Return the calibration due date setting.

Example

The calibration due date is set for February 21, 2020.

Setting for calibration due date check function

Syntax

Commands

:SYSTem:CALibration:PERiod:CHECk <1/0/ON/OFF>

<1/0/ON/OFF> = 1/ON: Enable calibration due date check function, 0/OFF: Disable calibration due date check function

Description

Set the calibration due date check function.

Example

:SYSTem:CALibration:PERiod:CHECk 1

Set the calibration due date check function to Enabled.

Query of calibration due date check function

Syntax

Query

:SYSTem:CALibration:PERiod:CHECk?

Response

<1/0>

<1/0> = 1: Calibration due date check function enabled, 0: Calibration due date check function disabled

Description

Return the calibration due date check function setting.

Example

:SYSTem:CALibration:PERiod:CHECk?

The calibration due date check function is set to enable.

Setting for GFI function

Syntax

:SYSTem:GFI <1/0/ON/OFF>

<1/0/ON/OFF> = 1/ON: Enable GFI function, 0/OFF: Disable GFI function

Description

Set the GFI function.

Example

:SYSTem:GFI 1

Set the GFI function to Enabled.

HIOKI ST5680A966-00

<Month> = 1 to 12 (NR1)

:SYSTem:CALibration:PERiod 20,2,21

Therefore, the first two digits of the year are fixed at “20” and the last two digits of the year are set at “year.”

Response

<Month> = 1 to 12 (NR1)

:SYSTem:CALibration:PERiod? 20, 2,21

Commands

Query of GFI function

Syntax

Query

:SYSTem:GFI?

Response

<1/0>

<1/0> = 1: GFI function enabled, 0: GFI function disabled

Description

Return the GFI function setting.

Example

:SYSTem:GFI?

The GFI function is set to enable.

Setting for date

Syntax

:SYSTem:DATE <Year>,<Month>,<Day>

<Year> = 0 to 99 (NR1)

<Day> = 1 to 31 (NR1)

Description

Set the date. The date is backed up by a rechargeable battery inside the instrument.

Example

:SYSTem:DATE 20,2,21

Set the date to February 21, 2020.

NOTES:

If a non-existent date is specified, an execution error will occur.

Query of date

Syntax

Query

:SYSTem:DATE?

Response

<Day> = 1 to 31 (NR1)

Description

Return the date. The date is backed up by a rechargeable battery inside the instrument.

Example

:SYSTem:DATE?

The date is February 21, 2020.

Setting for time

Syntax

:SYSTem:TIME <Hour>,<Minute>,<Second>

<Hour> = 0 to 23 (NR1)

<Second> = 0 to 59 (NR1)

Description

Set the time. The time is backed up by a rechargeable battery inside the instrument.

Example

:SYSTem:TIME 11,37,15

Set the time to 11:37:15.

HIOKI ST5680A966-00

Commands

<Month> = 1 to 12 (NR1)

Dates can range from January 1, 2000 to December 31, 2099. Therefore, the first two digits of the year are fixed at “20” and the last two digits of the year are set at “year.”

20, 2,21

<Year> = 0 to 99 (NR1) <Month> = 1 to 12 (NR1)

Commands

<Minute> = 0 to 59 (NR1)

Query of time

Syntax

Query

:SYSTem:TIME?

Response

<Second> = 0 to 59 (NR1)

Description

The time is backed up by a rechargeable battery inside the instrument.

Example

:SYSTem:TIME?

The time is 11:37:29.

Query of serial number

Syntax

Query

:SYSTem:SERialno?

Response

Description

Return the serial number.

Example

:SYSTem:SERialno?

The serial number is 123456789.

Initialization of equipment

Syntax

Commands

:SYSTem:RESet

Description

Set this instrument to the initialize setting.

See “Initialization items list” (p. 119 )

Example

:SYSTem:RESet

Performs initialization of the instrument.

NOTES:

TEST or corrected measurement status results in an execution error.

HIOKI ST5680A966-00

<Hour> = 0 to 23 (NR1) <Minute> = 0 to 59 (NR1)

Return the time.

11,37,29

123456789

Communication interface settings are not initialized.

Query of error and clear error

Syntax

Query

:SYSTem:ERRor?

Response

<"Error message"> = (enclosed in double quotes)

Description

If an error has occurred, it returns an error and clears the error. If an error occurs, the ERR

-400,"Query error"

Example

:SYSTem:ERRor?

A command error has occurred.

HIOKI ST5680A966-00

<Error No.> = (NR1)

bit (bit 2) in the Status Byte Register (STB) is set to 1 until it is read by this command or

*CLS command is executed. However, it is not cleared in the event of a device error.

If an error has occurred, an error No. and error message are returned. If no error occurs, error No. 0 and the message "No error" are returned.

Response List 0,"No error"

-100,"Command error"

-102,"Syntax error"

-200,"Execution error"

-220,"Parameter error"

-313,"Backup lost"

-315,"Setting backup lost"

-330,"Self-test failed"

-335,"ADJUST FAILED"

-341,"PANEL LOAD FAILED"

-342,"TIME SETTING ERROR"

-343,"JUDGE SETTING ERROR"

-344,"DELAY SETTING ERROR"

-345,"VOLTAGE LIMIT ERROR"

-346,"POWER OVER ERROR"

-347,"CONTACT SETTING ERR"

-348,"HARDWARE ERROR"

-349,"HARDWARE ERROR"

-350,"DOUBLE ACTION"

-360,"Communication error"

-361,"Rs232c Parity error"

-362,"Rs232c Framing error"

-363,"Rs232c overrun"

-365,"Time out error"

-370,"Module backup failed"

-371,"Bad Slot/Ch"

-372,"Module backup failed"

-373,"INTERLOCK STATE"

-374,"REMOTE CONNECTER"

-375,"GROUND FAULT"

-376,"OVERLOAD"

-377,"SUPPLY VOLTAGE FREQ ERROR"

-378,"POWER TEMP ERROR"

-379,"SUPPLY VOLTAGE ERROR"

-380,"HIGHLOAD POWER OUTAGE"

-381,"OVERLOAD POWER OUTAGE"

-382,"OUTPUT TIME LIMIT"

-383,"POWER SYSTEM ERROR"

-384,"UNKNOWN DEVICE"

-386,"POWER SUPPLY ERROR"

-387,"OVERHEAT"

-388,"FAN ERROR"

-389,"LED ERROR"

-390,"POWER SUPPLY ERROR"

-100,"Command error"

Query of SCPI version

Syntax

Query

:SYSTem:VERSion?

Response

Description

Return the version of SCPI with which this instrument complies.

Example

:SYSTem:VERSion?

The SCPI version with which this instrument complies is 1990.0.

Query of FPGA version No.

Syntax

Query

:SYSTem:FPGA? <Type/None>

<Type/None> = MAIN:Main FPGA, SUB:Sub FPGA, None:Main FPGA

Response

Description

Return the FPGA version No. of this instrument.

Example

:SYSTem:FPGA? MAIN

The version No. of the main FPGA of this instrument is A1234567.

Initialization of equipment

Syntax

Commands

:PRESet

Description

Set this instrument to the initialize setting.

See “Initialization items list” (p. 119 )

Example

:PRESet

Performs initialization of the instrument.

NOTES:

TEST or corrected measurement status results in an execution error.

HIOKI ST5680A966-00

1990.0

A1234567

Panel memory and communication interface settings are not initialized.

Start of test

Syntax

Commands

:STARt

Description

Start the test.

resistance test → withstand voltage test, and programmed test, proceed to the next stage.

Example

:STARt

Start the test.

NOTES:

Any condition other than READY or interval will result in an execution error. If the momentary out function is set to be enabled, an execution error will occur.

Forced termination of test, forced termination of correction measurement

Syntax

Commands

:STOP

Description

Force termination of test or correction measurement when in TEST state.

Example

:STOP

Force termination of the test.

Equipment state query

Syntax

Query

:S TATe ?

<State>

<State> = WPASS: Withstand voltage test READY state (PASS), IPASS:

Interval state, PROTECTION: Protection state, NULL: Other

Description

Return the state of the equipment.

Example

: S TATe ?

RREADY state (unmeasured) of withstand voltage test.

Start of correction measurement

Syntax

Commands

:STARt:CORRection

Description

Start correction measurement.

proceed to the next step.

Example

Start correction measurement.

NOTES:

Any condition other than READY or interval will result in an execution error.

resistance test, insulation resistance test → withstand voltage test, BDV measurement.

HIOKI ST5680A966-00

Run

When in the interval state of withstand voltage test → insulation resistance test, insulation

Response

Insulation resistance test READY state (PASS), WUFAIL: Withstand voltage test READY state (UPPER FAIL), IUFAIL: Insulation resistance test READY state (UPPER FAIL), WLFAIL: Withstand voltage test READY state (LOWER FAIL), ILFAIL: Insulation resistance test READY state (LOWER FAIL), WULFAIL: Withstanding voltage test READY state (UPPER LOWER FAIL), IULFAIL: Insulation resistance test READY state (UPPER LOWER FAIL), WREADY: Withstanding voltage test READY state (not measured), IREADY: Insulation resistance test READY state (not measured), BDVREADY: BDV measurement READY state, WTEST: Withstanding voltage test TEST state or withstand voltage test compesation measurement state, ITEST: Insulation resistance test TEST state or insulation resistance test compesation measurement state, BDVTEST: BDV measurement TEST state, INTERVAL:

WREADY

When in the interval state of the compensatio measurement of the programmed test,

:STARt:CORRection

If the momentary out function is set to be enabled, an execution error will occur.

An execution error occurs when the test mode is withstand voltage test → insulation

Query of the test results of withstand voltage test

Syntax

Query

:FETCh:RESult:WITHstand?

Response

< Te s t m o de>,<Test start date and time>,<Test frequency>,<Voltage measured

result>,<Timer type>

<Timer type> = 0: Test time, 1: Voltage rise time (NR1)

Description

Return the test results of the withstand voltage test.

Example

:FETCh:RESult:WITHstand?

test time.

NOTES:

No header is attached to the response message.

insulation resistance test or insulation resistance test → withstand voltage test, an execution

error occurs.

HIOKI ST5680A966-00

Measured Value Output

value>,<Current measured value>,<Resistance measured value>,<Measurement range>,<Remaining test time>,<Judgment

<Test mode>=W: withstand voltage test <Test start date and time> = YYYYY-MM-DD HH:MM:SS (YYYYY:year, MM:month, DD:day, HH:hour, MM:minute, SS:second) <Test frequency> = DC <Voltage measured value> = [V] (NR3) <Current measured value> = [A] (NR3)

<Resistance measured value> = [Ω] (NR3)

<Measurement range> = 300uA, 3mA, 30mA, 100mA, NONE (no measured value) <Remaining test time> = [s] (NR2) <Judgment result> = PASS:PASS, UFAIL:UPPER FAIL, LFAIL:LOWER FAIL, ULFAIL:UPPER LOWER FAIL, OFF:Other

W,2020-03-13 15:55:36,DC , 1.000E+03, 2.000E-03, 0.000E+00,3mA, 30.0,PASS,0

The test start date and time is 2020-03-13 15:55:36, the test frequency is DC, the voltage measurement is 1000 V, the current measurement is 2.000 mA, the measurement range is 3 mA, the remaining test time is 30.0 s, the judgment result is PASS, the timer type is

Any condition other than READY, interval will result in an execution error. An execution error occurs when the test mode is insulation resistance test, programmed test, BDV measurement.

If the immediately preceding test is not a withstand voltage test, withstand voltage test →

Query of the test results of insulation resistance test

Syntax

Query

:FETCh:RESult:INSulation?

Response

<Test mode>,<Test start date and time>,<Voltage measured value>,

<Timer type> = 0: Test time, 1: Voltage rise time (NR1)

Description

Return the test results of the insulation resistance test.

Example

:FETCh:RESult:INSulation?

remaining test time is 10.0 s, the judgment result is PASS, and the timer type is test time.

NOTES:

No header is attached to the response message.

insulation resistance test, a withstand voltage test

execution error occurs.

Query of the test results for program test

Syntax

Query

:FETCh:RESult:PROGram?

Response

<Test results> = PASS:PASS, FAIL:FAIL

Description

Return the test results of the program test.

Example

:FETCh:RESult:PROGram?

The test result of the program test is FAIL.

NOTES:

No header is attached to the response message.

If the immediately preceding test is not a program test, an execution error occurs.

Query the number of steps to be tested in the program test

Syntax

Query

:FETCh:RESult:PROGram:STEP:COUNt?

<Number of steps> = 1 to 50 (NR1)

Description

Return the number of steps in which the program test was conducted.

Example

:FETCh:RESult:PROGram:STEP:COUNt?

The number of steps to be tested in the program test is 5.

NOTES:

If the immediately preceding test is not a program test, an execution error occurs.

HIOKI ST5680A966-00

<Resistance measured value>,<Measurement range>,<Remaining test time>,

<Test mode>= IR: insulation resistance test <Test start date and time> = YYYYY-MM-DD HH:MM:SS (YYYYY:year, MM:month, DD:day, HH:hour, MM:minute, SS:second) <Voltage measured value> = [V] (NR3)

<Resistance measured value> = [Ω] (NR3)

<Measurement rangeジ> = 100kohm, 1Mohm, 10Mohm, 100Mohm, 1Gohm, 10Gohm, 100Gohm, NONE (no measurements) <Remaining test time> = [s] (NR2) <Judgment result> = PASS:PASS, UFAIL:UPPER FAIL, LFAIL:LOWER FAIL, ULFAIL:UPPER LOWER FAIL, OFF:Other

IR,2020-03-13 15:55:36, 5.000E+02, 1.000E+08,100Mohm, 10.0,PASS,0

The test start date and time is 2020-03-13 15:55:36, the voltage measurement is 500 V,

the resistance measurement is 100.0 MΩ, the measurement range is 100Mohm, the

Any condition other than READY, interval will result in an execution error. An execution error occurs when the test mode is withstand voltage test, program test, BDV measurement. If the immediately preceding test is not an

→ insulation resistance test or an insulation resistance test → withstand voltage test, an

FAIL

Any status other than READY, it will result in an execution error. When the test mode is other than program test, an execution error occurs.

Response

No header is attached to the response message. Any status other than READY, it will result in an execution error. When the test mode is other than program test, an execution error occurs.

Query of the test results for each step of the program test

Syntax

Query

:FETCh:RESult:PROGram:STEP? <Step No.>

<Step No.> = 1 to 50 (NR1)

If the specified step is a withstand voltage test:

<Test mode>,<Test start date and time>, <Test frequency>, <Voltage measured

If the specified step is a withstand voltage test:

<Timer type> = 0: Test time, 1: Voltage rise time (NR1)

Description

Return the step-by-step test results of the program test.

Example

:FETCh:RESult:PROGram:STEP? 3

result is PASS, and the timer type is test time.

NOTES:

If the immediately preceding test is not a program test, an execution error occurs.

HIOKI ST5680A966-00

Response

value>,<Current measured value>,<Resistance measured value>, <Measurement range>,<Remaining test time>,<Judgment result>,<Timer type>

If the specified step is an insulation resistance test:

<Test mode>,<Test start date and time>,<Voltage measured value>, <Resistance measured value>,<Measurement range>,<Remaining test time>,

<Resistance measured value> = [Ω] (NR3)

If the specified step is an insulation resistance test:

<Test mode>= IR: insulation resistance test <Test start date and time> = YYYYY-MM-DD HH:MM:SS (YYYYY:year, MM:month, DD:day, HH:hour, MM:minute, SS:second) <Voltage measured value> = [V] (NR3)

<Resistance measured value> = [Ω] (NR3)

<Measurement range> = 100kohm, 1Mohm, 10Mohm, 100Mohm, 1Gohm, 10Gohm, 100Gohm, NONE (no measurements) <Remaining test time> = [s] (NR2) <Judgment result> = PASS:PASS, UFAIL:UPPER FAIL, LFAIL:LOWER FAIL, ULFAIL:UPPER LOWER FAIL, OFF:Other

IR,2020-03-13 15:55:36, 5.000E+02, 1.000E+08,100Mohm, 10.0,PASS,0

Step No. 3 is an insulation resistance test, the test start date and time is 2020-03-13 15:55:36, the voltage measurement is 500 V, the resistance measurement is 100.0 MΩ, the measurement range is 100Mohm, the remaining test time is 10.0 s, the judgment

No header is attached to the response message. Any condition other than READY, interval will result in an execution error. When the test mode is other than program test, an execution error occurs.

Query of the test results of BDV measurement

Syntax

Query

:FETCh:RESult:BDV?

Response

<Test mode>,<Test method>,<Test start date and time>,<Median breakdown

deviation>,<Elapsed test time>

<Elapsed test time> = [s] (NR2)

Description

Return the test results of the BDV measurement.

Example

:FETCh:RESult:BDV?

standard deviation is 47.140 V/mm, and the elapsed test time is 3.1 s.

NOTES:

No header is attached to the response message.

If the immediately preceding test is not a BDV measurement, an execution error occurs.

Query the number of test runs for BDV measurement

Syntax

Query

:FETCh:RESult:BDV:TEST:COUNt?

Response

<Number of tests> = 1 to 20 (NR1)

Description

Return the number of times the BDV measurement has been tested.

Example

:FETCh:RESult:BDV:TEST:COUNt?

The number of tests performed for BDV measurement is 5.

NOTES:

No header is attached to the response message.

If the immediately preceding test is not a BDV measurement, an execution error occurs.

HIOKI ST5680A966-00

voltage>,<Dielectric breakdown voltage average>,<Breakdown voltage standard deviation>,<Median dielectric breakdown strength>,<Dielectric breakdown strength average>,<Dielectric breakdown strength standard

<Test ,mode> = BDV: BDV measurement <Test method> = RATE: Continuous step-up voltage test, STEP: Step-up voltage test <Test start date and time> = YYYYY-MM-DD HH:MM:SS (YYYYY:year, MM:month, DD:day, HH:hour, MM:minute, SS:second) <Median breakdown voltage> = [V] (NR1) <Dielectric breakdown voltage average> = [V] (NR1) <Breakdown voltage standard deviation> = [V] (NR2) <Median dielectric breakdown strength> = [/] (NR2) <Dielectric breakdown strength average> = [/] (NR2) <Dielectric breakdown strength standard deviation> = [V/] (NR2)

BDV,RATE,2020-03-13 15:55:36, 38, 38, 0.471, 3.800, 3.767, 47.140,

3.1

The test start date and time is 2020-03-13 15:55:36, the median breakdown voltage is 38 V, the dielectric breakdown voltage average is 38 V, the breakdown voltage standard deviation is 0.471 V, the median dielectric breakdown strength is 3.800 kV/mm, the dielectric breakdown strength average is 3.767 kV/mm, the dielectric breakdown strength

Any status other than READY, it will result in an execution error. When the test mode is other than BDV measurement, an execution error occurs.

Query of the test results for each test of BDV measurement

Syntax

Query

:FETCh:RESult:BDV:TEST? <Test No.>

<Test No.> = 1 to 20 (NR1)

Voltage>,<Dielectric breakdown strength>

<Current measured value> = [A] (NR3)

<Dielectric breakdown strength> = [kV/mm] (NR2)

Description

Return the test result for each test of the BDV measurement.

Example

:FETCh:RESult:BDV:TEST? 5

breakdown voltage of 38 V, and the breakdown strength of 3.800 kV/mm.

NOTES:

If the immediately preceding test is not a BDV measurement, an execution error occurs.

Query of the measured value in text format for withstand voltage test

Syntax

Query

:FETCh:MEASure:WITHstand:TEXT? <Data type>,<Value type>[,<Wave number/ALL>]

<Data type> = TRENd:Trend data, WAVeform:Waveform data

<Wave number/ALL> = 1 or more (NR1), ALL: All sections

For voltage measured value:

<Current value> = [A] (NR3)

Description

Return the measured value of the withstand voltage test in text format.

Example

:FETCh:MEASure:WITHstand:TEXT? WAVeform,V,1

Return the waveform data of one wave of voltage for withstand voltage test in text format.

NOTES:

If the immediately preceding test is not a withstand voltage test, an execution error occurs.

HIOKI ST5680A966-00

Response <Current measured value>,<Elapsed test time>,<Breakdown

<Elapsed test time> = [s] (NR2) <Breakdown Voltage> = [V] (NR1)

2.000E-03, 3.1, 38, 3.800

Test No. 5 has the measured current value of 2.000 mA, the test elapsed time of 3.1 s, the

No header is attached to the response message. Any status other than READY, it will result in an execution error. When the test mode is other than BDV measurement, an execution error occurs.

<Value type> = V: Voltage, I: Current

Response

For current measured value:

8000, 2.000E+01, 2.100E+01, ... 2.200E+01

No header is attached to the response message. Wave number/ALL cannot be specified when the data type is trend data. Return the entire section. Any status other than READY, it will result in an execution error. An execution error occurs when the test mode is other than withstand voltage test.

For voltage measured value:

<Number of points> = (NR1) <Voltage value> = [V] (NR3)

For current measured value:

<Number of points> = (NR1)

Query of the measured value in binary form for withstand voltage test

Syntax

Query

:FETCh:MEASure:WITHstand:BINary? <Data type>,<Value type>[,<Wave number/ALL>]

<Data type> = TRENd:Trend data, WAVeform:Waveform data

<Wave number/ALL> = 1 or more (NR1), ALL: All sections

Response

Description

Return the measured value of the withstand voltage test in binary format.

bit unsigned integer, and the measured value data is output as

1 2 3 4 5 6 7 8 9 10 11 12 13 14 15 16 …

(Hexadecimal)

Number

digits

Number of points

Example

:FETCh:MEASure:WITHstand:BINary? WAVeform,V,1

format.

NOTES:

No header is attached to the response message.

software handshake, an execution error occurs.

HIOKI ST5680A966-00

<Value type> = V: Voltage, I: Current

As shown in the figure below, binary data outputs the number of byte digits and the number of bytes (the total number of measured value data points and the total number of bytes of the entire measured value data) at the beginning, followed by the number of points and measured value data, and finally the terminator. The number of points is a 32a single-precision floating-point number (binary32) in little-endian format.

Binary

23 36 31 34 34 30 31 36 10 27 00 00 41 20 00 00 … 0d(0a) (0a)

Contents #

#6144016....

Return the waveform data of one wave of voltage for withstand voltage test in binary

Wave number/ALL cannot be specified when the data type is trend data. Return the entire section. Any status other than READY, it will result in an execution error. If the immediately preceding test is not a withstand voltage test, an execution error occurs. An execution error occurs when the test mode is other than withstand voltage test. If the communication interface is RS-232C and the communication handshake is set to

Byte count

Measured value

CR(LF)

(LF)

Query the measured value in text format for insulation resistance test

Syntax

Query

:FETCh:MEASure:INSulation:TEXT? <Data type>,<Value type>[,<Wave number/ALL>]

<Data type> = TRENd:Trend data, WAVeform:Waveform data

<Wave number/ALL> = 1 or more (NR1), ALL: All sections

For voltage measured value:

>, ...

value>

For voltage measured value:

<Resistance value> = [Ω] (NR3)

Description

Return the measured value of an insulation resistance test in text format.

Example

:FETCh:MEASure:INSulation:TEXT? TRENd,R

Return resistance trend data from insulation resistance tests in text format.

NOTES:

occurs.

HIOKI ST5680A966-00

<Value type> = V: Voltage, I: Current, R: Resistance

Response

For current measured value:

For resistance measured value:

<Number of points>,<Resistance value>,<Resistance value>, ... <Resistance

<Number of points> = (NR1) <Voltage value> = [V] (NR3)

For current measured value:

<Number of points> = (NR1) <Current value> = [A] (NR3)

For resistance measured value:

<Number of points> = (NR1)

8000, 1.000E+04, 2.000E+04, ... 3.000E+04

No header is attached to the response message. The value type resistance can be specified when the data type is trend data. Wave number/ALL cannot be specified when the data type is trend data. Return the entire section. Any status other than READY, it will result in an execution error. An execution error occurs when the test mode is other than the insulation resistance test. If the immediately preceding test is not an insulation resistance test, an execution error

Query of the measured value in binary form for insulation resistance test

Syntax

Query

:FETCh:MEASure:INSulation:BINary? <Data type>,<Value type>[,<Wave number/ALL>]

<Data type> = TRENd:Trend data, WAVeform:Waveform data

<Wave number/ALL> = 1 or more (NR1), ALL: All sections

Response

Description

Return the measured value of an insulation resistance test in binary format.

1 2 3 4 5 6 7 8 9 10 11 12 13 14 15 16 …

(Hexadecimal)

Number

digits

Number of

Example

:FETCh:MEASure:INSulation:BINary? TRENd,R

Return resistance trend data from insulation resistance tests in binary format.

NOTES:

No header is attached to the response message.

software handshake, an execution error occurs.

HIOKI ST5680A966-00

<Value type> = V: Voltage, I: Current, R: Resistance

As shown in the figure below, binary data outputs the number of byte digits and the number of bytes (the total number of measured value data points and the total number of bytes of the entire measured value data) at the beginning, followed by the number of points and measured value data, and finally the terminator. The number of points is a 32-bit unsigned integer, and the measured value data is output as a single-precision floating-point number (binary32) in little-endian format.

Binary

23 36 31 34 34 30 31 36 10 27 00 00 41 20 00 00 … 0d(0a) (0a)

Contents #

#6144016....

The value type resistance can be specified when the data type is trend data. Wave number/ALL cannot be specified when the data type is trend data. Return the entire section. Any status other than READY, it will result in an execution error. An execution error occurs when the test mode is other than the insulation resistance test. If the immediately preceding test is not an insulation resistance test, an execution error occurs. If the communication interface is RS-232C and the communication handshake is set to

Byte count

points Measured value

CR(LF)

(LF)

Query of the measured value in text format for BDV measurements

Syntax

Query

:FETCh:MEASure:BDV:TEXT? <Data type>,<Value type>[,<Wave number/ALL>]

<Data type> = TRENd:Trend data, WAVeform:Waveform data

<Wave number/ALL> = 1 or more (NR1), ALL: All sections

For voltage measured value:

>, ...

<Current value> = [A] (NR3)

Description

Return the measured value of the BDV measurement in text format.

Example

:FETCh:MEASure:BDV:TEXT? WAVeform,I,1

format.

NOTES:

If the immediately preceding test is not a BDV measurement, an execution error occurs.

HIOKI ST5680A966-00

<Value type> = V: Voltage, I: Current

Response

For current measured value:

For voltage measured value:

<Number of points> = (NR1) <Voltage value> = [V] (NR3)

For current measured value:

<Number of points> = (NR1)

8000, 2.000E-06, 3.000E-06, ... 4.000E-06

Return the waveform data of one wave of the current of the BDV measurement in text

No header is attached to the response message. Wave number/ALL cannot be specified when the data type is trend data. Return the entire section. Any status other than READY, it will result in an execution error. When the test mode is other than BDV measurement, an execution error occurs.

Query of the measured value in binary form for BDV measurements

Syntax

Query

:FETCh:MEASure:BDV:BINary? <Data type>,<Value type>[,<Wave number/ALL>]

<Data type> = TRENd:Trend data, WAVeform:Waveform data

<Wave number/ALL> = 1 or more (NR1), ALL: All sections

Response

Description

Return the measured value of the BDV measurement in binary format.

bit unsigned integer, and the measured value data is output as

1 2 3 4 5 6 7 8 9 10 11 12 13 14 15 16 …

(Hexadecimal)

Number

digits

Number of points

Example

:FETCh:MEASure:BDV:BINary? WAVeform,I,1

format.

NOTES:

No header is attached to the response message.

software handshake, an execution error occurs.

HIOKI ST5680A966-00

<Value type> = V: Voltage, I: Current

Binary

23 36 31 34 34 30 31 36 10 27 00 00 41 20 00 00 … 0d(0a) (0a)

Contents #

#6144016....

Return the waveform data of one wave of the current of the BDV measurement in binary

Wave number/ALL cannot be specified when the data type is trend data. Return the entire section. Any status other than READY, it will result in an execution error. When the test mode is other than BDV measurement, an execution error occurs. If the immediately preceding test is not a BDV measurement, an execution error occurs. If the communication interface is RS-232C and the communication handshake is set to

Byte count

Measured value

CR(LF)

(LF)

Query of the contact check results for withstand voltage test

Syntax

Query

:FETCh:CONTactcheck:WITHstand?

Response

<Measured value> = [F] (NR3)

Description

Return the contact check results of the withstand voltage test.

Example

:FETCh:CONTactcheck:WITHstand?

The contact check result is PASS and the contact check measurement is 1 nF.

NOTES:

No header is attached to the response message.

ulation resistance test or insulation resistance test → withstand voltage test, an execution

error occurs.

Query of the contact check results for insulation resistance test

Syntax

Query

:FETCh:CONTactcheck:INSulation?

Response

<Judgment result> = NONE: Not checked, PASS: No error, FAIL: Contact error <Measured value> = [F] (NR3)

Description

Return the contact check result of the insulation resistance test.

Example

:FETCh:CONTactcheck:INSulation?

The contact check result is PASS and the contact check measurement is 1 nF.

NOTES:

No header is attached to the response message.

If the immediately preceding test is not an insulation resistance test, a withstand voltage test

execution error occurs.

Query of the contact check results for each step of the program test

Syntax

Query

:FETCh:CONTactcheck:PROGram? <Step No.>

<Step No.> = 1 to 50 (NR1)

Response

<Judgment result> = NONE: Not checked, PASS: No error, FAIL: Contact error <Measured value> = [F] (NR3)

Description

Return the contact check results for each step of the program test.

Example

:FETCh:CONTactcheck:PROGram? 3

measurement is 1 nF.

NOTES:

No header is attached to the response message.

If the immediately preceding test is not a program test, an execution error occurs.

HIOKI ST5680A966-00

<Judgment result> = NONE: Not checked, PASS: No error, FAIL: Contact error

PASS, 1.000E-09

Any condition other than READY, interval will result in an execution error. An execution error occurs when the test mode is insulation resistance test, programmed test, BDV measurement.

If the immediately preceding test is not a withstand voltage test, withstand voltage test →

ins

PASS, 1.000E-09

Any condition other than READY, interval will result in an execution error. An execution error occurs when the test mode is withstand voltage test, program test, BDV measurement.

→ insulation resistance test or an insulation resistance test → withstand voltage test, an

PASS, 1.000E-09

The judgment result of the contact check in step No. 3 is PASS, and the contact check

Any condition other than READY, interval will result in an execution error. When the test mode is other than program test, an execution error occurs.

Query of the measurement error in withstand voltage test

Syntax

Query

:FETCh:MEASure:ERRor:WITHstand?

Response

Description

44:Resistance overflow

Example

:FETCh:MEASure:ERRor:WITHstand?

Discharge timeout and contact error occurred during measurement.

NOTES:

No header is attached to the response message.

insulation resistance test or insulation resistance test → withstand voltage test, an execution

error occurs.

HIOKI ST5680A966-00

Return a list of error numbers, separated by a comma (,) of errors that occurred during withstand voltage test measuremens. If there is no error during measurement, 0 is returned.

Error No. list 1:Discharge timeout 2:Contact error 3:Output error 17:Overload 18:GFI error 19:ARC error 20:Power supply error 21:VMONI board error 29:Unsent error 30: Arithmetic error 31:FSI error 32:AD error 35:Voltage value underflow 36:Voltage value overflow 41:Current value underflow 42:Current value overflow 43:Resistance underflow

1, 2

Any condition other than READY, interval will result in an execution error. An execution error occurs when the test mode is insulation resistance test, programmed test, BDV measurement. If the immediately preceding test is not a withstand voltage test, withstand voltage test →

Query of the measurement error in insulation resistance test

Syntax

Query

:FETCh:MEASure:ERRor:INSulation?

Response

Description

44:Resistance overflow

Example

:FETCh:MEASure:ERRor:INSulation?

Discharge timeout and contact error occurred during measurement.

NOTES:

No header is attached to the response message.

insulation resistance test, a withstand voltage test

execution error occurs.

HIOKI ST5680A966-00

Return a list of error numbers, separated by a comma (,) of errors that occurred during insulation resistance test measurements. If there is no error during measurement, 0 is returned.

Error No. list 1:Discharge timeout 2:Contact error 3:Output error 17:Overload 18:GFI error 19:ARC error 20:Power supply error 21:VMONI board error 29:Unsent error 30:Arithmetic error 31:FSI error 32:AD error 35:Voltage value underflow 36:Voltage value overflow 41:Current value underflow 42:Current value overflow 43:Resistance underflow

1, 2

→ insulation resistance test or an insulation resistance test → withstand voltage test, an

Query of the measurement error for each step of the program test

Syntax

Query

:FETCh:MEASure:ERRor:PROGram? <Step No.>

<Step No.> = 1 to 50 (NR1)

Response

Description

Return a list of error numbers, separated by a comma (,) of errors that occurred during

44:Resistance overflow

Example

:FETCh:MEASure:ERRor:PROGram? 3

Discharge timeout and contact error occurred during measurement in step No. 3.

NOTES:

No header is attached to the response message.

If the immediately preceding test is not a program test, an execution error occurs.

HIOKI ST5680A966-00

measurement at each step of the program test. If there is no error during measurement, 0 is returned.

Error No. list 1:Discharge timeout 2:Contact error 3:Output error 17:Overload 18:GFI error 19:ARC error 20:Power supply error 21:VMONI board error 29:Unsent error 30:Arithmetic error 31:FSI error 32:AD error 35:Voltage value underflow 36:Voltage value overflow 41:Current value underflow 42:Current value overflow 43:Resistance underflow

1, 2

Any condition other than READY, interval will result in an execution error. When the test mode is other than program test, an execution error occurs.

Query of the measurement error for BDV measurement

Syntax

Query

:FETCh:MEASure:ERRor:BDV? <Test No.>

<Test No.> = 1 to 20 (NR1)

Response

Description

Return a list of error numbers, separated by a comma (,) of errors that occurred during the

32:AD error

Example

:FETCh:MEASure:ERRor:BDV? 5

In test No. 5, an output error occurred during the measurement.

NOTES:

No header is attached to the response message.

If the immediately preceding test is not a BDV measurement, an execution error occurs.

HIOKI ST5680A966-00

measurement for each BDV measurement test. If there is no error during measurement, 0 is returned.

Error No. list 1:Discharge timeout 2:Contact error 3:Output error 17:Overload 18:GFI error 19:ARC error 20:Power supply error 21:VMONI board error 29:Unsent error 30:Arithmetic error 31:FSI error

Any status other than READY, it will result in an execution error. When the test mode is other than BDV measurement, an execution error occurs.

Query of voltage measured value

Syntax

Query

:MONitor:VOLTage?

Response

<Voltage measured value> = [V] (NR3)

Description

Return the voltage measured value.

Example

:MONitor:VOLTage?

The voltage measured value is 8400 V.

NOTES:

No header is attached to the response message. An execution error will occur in conditions other than TEST or correction measurement.

Query of current measured value

Syntax

Query

:MONitor:CURRent?

Response

<Current measured value>[,<Measurement range>]

<Current measured value> = [A] (NR3)

100mA, NONE (no measured value)

Description

Return the current measured value.

Example

The current measured value is 200.0 mA and the measurement range is 3 mA.

NOTES:

No header is attached to the response message.

An execution error occurs when the test mode is an insulation resistance test.

Query of resistance measured value

Syntax

Query

:MONitor:RESistance?

<Resistance measured value>[,<Measurement range>]

<Resistance measured value> = [Ω] (NR3)

(no measured value)

Description

Return the resistance measured value.

Example

The resistance measured value is 100.0 GΩ and the measurement range is 100 Gohm.

NOTES:

No header is attached to the response message.

When the test mode is BDV measurement, an execution error occurs.

HIOKI ST5680A966-00

8.400E+03

<Measurement range> = Withstand voltage test mode 300uA, 3mA, 30mA,

:MONitor:CURRent?

2.000E-01,3mA

The measuremetn range is returned when the test mode is withstand voltage test. An execution error will occur in conditions other than TEST or correction measurement.

Response

<Measurement range> = Withstand voltage test mode : 300uA, 3mA, 30mA, 100mA, NONE (no measured value) / Insulation resistance test mode : 100kohm, 1Mohm, 10Mohm, 100Mohm, 1Gohm, 10Gohm, 100Gohm, NONE

:MONitor:RESistance?

1.000E+11,100Gohm

The measurement range is returned when the test mode is withstand voltage test or insulation resistance test. An execution error will occur in conditions other than TEST or correction measurement.

Query of the test elapsed time

Syntax

Query

:MONitor:ETIMe?

Response

(NR1)

Description

start of the test to the present is returned.

Example

:MONitor:ETIMe?

Elapsed time is 10.0 s. Timer type is test time.

NOTES:

No header is attached to the response message. An execution error will occur in conditions other than TEST or correction measurement.

HIOKI ST5680A966-00

<Elapsed time> = [s] (NR2) <Timer type> = 0: Test time, 1: Voltage rise time (NR1), 2: voltage drop time

Return the elapsed test time. When the timer type is test time, the remaining time from the set test time is returned. When the timer type is test time and the test time is set to OFF, the elapsed time from the

10,0,0

Display screen settings

Syntax

Commands

:DISPlay:SCReen <Display screen>

<Display screen> = BOTH: Measured value and graphs, NUMeric: Measured value, GRAPh: graphs

Description

Set the display screen.

Example

:DISPlay:SCReen BOTH

Set the display screen to measured values and graphs.

NOTES:

An execution error occurs when the test mode is withstand voltage test → insulation resistance test, insulation resistance test → withstand voltage test, program test.

Query of display screen

Syntax

Query

:DISPlay:SCReen?

Response

<Display screen> = BOTH: Measured value and graphs, NUMeric: Measured value, GRAPh: graphs

Description

Return the display screen setting.

Example

:DISPlay:SCReen?

The display screen is set to measured values and graphs.

NOTES:

An execution error occurs when the test mode is withstand voltage test → insulation resistance test, insulation resistance test → withstand voltage test, program test.

Display graph setting

Syntax

Commands

:DISPlay:GRAPh <Display graph>

<Display graph> = TRENd:Trend data, WAVeform:Waveform data

Description

Set the display graph.

Example

:DISPlay:GRAPh TRENd

Set the display graph to trend data.

NOTES:

resistance test, insulation resistance test → withstand voltage test, program test.

Query of display graph

Syntax

Query

:DISPlay:GRAPh?

Response

<Display graph> = TRENd:Trend data, WAVeform:Waveform data

Description

Return the setting for the display graph.

Example

:DISPlay:GRAPh?

The display graph is set to trend data.

NOTES:

An execution error occurs when the test mode is withstand voltage test → insulation resistance test, insulation resistance test → withstand voltage test, program test.

HIOKI ST5680A966-00

On-Screen Display

BOTH

An execution error occurs when the test mode is withstand voltage test → insulation

TREND

Hioki ST5680 Communications Command Instruction Manual

Specifications and Main Features

Frequently Asked Questions

User Manual

1 Introduction

Message Format

Output Queue and Input Buffer

Status Byte Register

Event Resisters

Response Format

Measured Value in case of Measurement Error

Item to return to Initial State

Errors during Communication

2 Message List

3 Message Reference

Standard Commands

Event Register

Test Mode

Withstand Voltage Test

Insulation Resistance Test

Program Test

BDV Measurement

Test Common

Panel Memory

Data Memory

EXT. I/O

System

Measured Value Output

On-Screen Display