ST4030
HIOKI ST4030A976-01
ST4030A
Firmware Version 1.20
Additions and Changes
IMPULSE WINDING TESTER
Feb. 2023 Revised edition 1
ST4030A976-01
EN
[600629281]
HIOKI ST4030A976-01
Contents
HIOKI ST4030A976-01
1 Overview ................................................................................................................................. 1
2 Selecting the Measurement Mode .......................................................................................... 2
3 Rise Time ................................................................................................................................ 3
3.1 Waveform Graph Display .................................................................................................. 3
3.2 Setting the Rise Time Calculation Formula ....................................................................... 4
4 Waveform Trigger Position ...................................................................................................... 5
4.1 Setting Waveform Trigger Positions .................................................................................. 5
5 Automatically Setting the Waveform Judgment Scope and Judgment Threshold Values ........ 7
5.1 Automatically Setting the Waveform Judgment Scope ...................................................... 8
5.2 Automatically Setting the Waveform Judgment Threshold Values .................................... 9
5.3 Waveform Judgment Threshold Values Formulas ............................................................ 11
5.4 Compatibility of Automatically Configured Waveform Judgment Scope and
Judgment Threshold Values ........................................................................................... 12
6 Continuous Application ......................................................................................................... 13
6.1 Enabling Continuous Application ..................................................................................... 13
7 Discharge Starting Voltage Testing (RPDIV) ......................................................................... 14
7.1 Screen Configuration ...................................................................................................... 14
7.2 Starting Testing and Checking Test Results .................................................................... 15
7.3 Recorded Data Display ................................................................................................... 17
7.4 Applied Voltages ............................................................................................................. 18
7.5 Number of Applied Pulses ............................................................................................... 19
7.6 Sampling Frequency and Number of Sampling Data ...................................................... 20
7.7 Return Conditions ........................................................................................................... 21
7.8 Rise Time ........................................................................................................................ 22
7.9 Trigger Position ............................................................................................................... 23
7.10 Discharge Starting Voltage Judgment Conditions ......................................................... 24
8 Automatic Voltage Adjustment .............................................................................................. 25
8.1 Global Automatic Voltage Adjustment ............................................................................. 26
8.2 Table-specific Automatic Voltage Adjustment .................................................................. 27
8.3 Screen Display ................................................................................................................ 28
9 Manual Voltage Adjustment .................................................................................................. 29
9.1 Screen Display ................................................................................................................ 30
10 Degaussing Pulse/Measurement Pulse Detection Signal Output ....................................... 31
ST4030A976-01
11 Extension to Area Detection Threshold Settings ................................................................. 32
HIOKI ST4030A976-01
11.1 Screen Display .............................................................................................................. 34
12 Fixing Startup Mode ............................................................................................................ 35
13 Permanently Enabling the Interlock Function ...................................................................... 36
14 Permanently Enabling Level Operation of the EXT. I/O STOP Pin ...................................... 36
15 Background Color ............................................................................................................... 37
16 Auto Saving of Files ............................................................................................................ 38
17 Extension to the Voltage Error Setting ................................................................................ 39
18 Expansion of System Information ....................................................................................... 40
19 Other Changes ................................................................................................................... 41
19.1 Communication Commands .......................................................................................... 41
19.2 BDV Mode..................................................................................................................... 41
19.3 File Screen .................................................................................................................... 41
19.4 STOP Button ................................................................................................................. 41
19.5 Downgrading ................................................................................................................. 41
HIOKI ST4030A976-01
1 Overview
The following functionality has been added to version 1.20 of the firmware:
• Measuring impulse voltage rise time
• Changing the positioning of master and measured waveforms
• Automatically setting waveform judgment scope and threshold values
• Applying voltage pulses continuously
• Performing discharge starting voltage testing that complies with the IEC 61934 procedure
• Changing the screen to a background color that’s easy to see for printing
• Automatically saving only data that is associated with a FAIL judgment
• Reducing voltage variability caused by variations in workpiece characteristics
• Adjusting the applied voltage value during testing without changing the applied voltage value setting
• Determining whether output pulses are degaussing or measurement pulses
• Setting separate upper and lower limit values for area judgment
• Changing the instrument’s operation so that it always starts up in the same mode
• Changing the instrument’s operation so that the interlock function is always enabled (cannot be undone)
• Changing the instrument’s operation to switch the EXT. IO STOP pin from edge operation to level operation
(cannot be undone)
• New communication commands
• Other
1
will acquire test conditions settings, judgment condition settings, and a
2 3 4
5*1
HIOKI ST4030A976-01
2 Selecting the Measurement Mode
An RPDIV measurement mode has been added for models equipped with the ST9000 Discharge Detection Upgrade.
Tap [MODE] on the measurement screen to display a measurement mode selection window. You can select from
five measurement modes.
1
1
2
3
SETTING
TEST
BDV
Selects test conditions settings mode.
The instrument
master waveform.
Selects test mode.
The instrument will call up the test conditions set in test conditions settings mode and use
them to test workpieces.
Selects insulation breakdown testing (BDV) mode.
The instrument will perform impulse testing by gradually increasing the voltage applied to
the workpiece under test to determine the voltage at which insulation breakdown occurs.
4
5
*1: Models equipped with ST9000 Discharge Detection Upgrade o n l y.
NONE
RPDIV
Selects no-voltage-application mode.
Output from the instrument will be disabled for safety reasons.
Tests discharge status by performing impulse testing in which the applied voltages comply
with the IEC 61934 procedure.
*1
2
HIOKI ST4030A976-01
3 Rise Time
This functionality measures rise time.
It has been added to test conditions settings mode, test mode, BDV mode, and RPDIV mode.
3.1 Waveform Graph Display
The rise time is displayed at the top left of the waveform graph.
1
P:XX/XX
1
Number of applied pulse / total number of pulses
*1
*1: During continuous application, only the number of applied pulses is shown.
*2: The display will switch between crest and tail length depending on the selected calculation formula.
xxxV
+X.XX[μs]
Maximum peak voltage value for the response waveform
*2
Rise time
3
HIOKI ST4030A976-01
3.2 Setting the Rise Time Calculation Formula
This section describes how to enable/disable display of waveform rise times and set the formula used to calculate
them.
Test conditions settings mode (Measurement screen) [MODE] > [SETTING] > [OUTPUT] > [RISE TIME]
BDV mode (Measurement screen) [MODE] > [BDV] > [OUTPUT] > [RISE TIME]
RPDIV mode (Measurement screen) [MODE] > [RPDIV] > [OUTPUT] > [RISE TIME]
RPDIV mode screen
1. Tap [RISE TIME] (rise time display format).
Enable/disable the waveform rise time display and set the calculation formula.
OFF
30%to90%
0%to100%
1
Disables calculation and display of rise time.
Uses the lightning impulse voltage waveform calculation formula. Displays the
crest and tail length.
Uses the switching impulse voltage waveform calculation formula. Displays the
10%to90%
TRANSIENT
crest and tail length.
Uses the lightning impulse current waveform calculation formula. Displays the
crest and tail length.
Uses the transient response calculation formula. Displays the rise time.
In this case, the rise time is the time required for the voltage to increase from
10% to 90% of 0 V to the initial peak voltage.
4
circuit’s equivalent circuit, but they can still be used for judgment purposes.
HIOKI ST4030A976-01
4 Waveform Trigger Position
This functionality allows you to select the method used to position the master waveform and measured waveforms.
It has been added to test conditions settings mode, test mode, BDV mode, and RPDIV mode.
4.1 Setting Waveform Trigger Positions
Test conditions settings mode (Measurement screen) [MODE] > [SETTING] > [OUTPUT] > [TRIG POS]
BDV mode (Measurement screen) [MODE] > [BDV] > [OUTPUT] > [TRIG POS]
RPDIV mode (Measurement screen) [MODE] > [RPDIV] > [OUTPUT] > [TRIG POS]
Example RPDIV mode screen
1. Tap [TRIG POS] (trigger position).
AUTO
MINUS
FALL
RISE
Aligns waveforms’ display positions based on their second zero-cross position.
Aligns waveforms just before they approach 0 V from their minimum values
Aligns waveforms’ display positions based on their initial zero-cross positions.
Aligns waveforms’ display positions based on their rising edges.
1
*1
*1
*1
*1: If the trigger position cannot be detected due to the condition of the voltage waveform, the setting will be changed
automatically to another condition.
To use the same setting as used by firmware older than version 1.10, select [AUTO].
IMPORTANT
Setting the trigger position to any setting other than AUTO will cause the LC and RC values waveform
processing scope to diverge from the resonance range.
In such cases, the LC and RC values will differ from values calculated based on the LCR resonance
5
HIOKI ST4030A976-01
Waveform trigger position: AUTO
The locations of the second zero-cross of the master waveform and measured waveform
are aligned on the screen.
Waveform trigger position: RISE
The locations of the rising edges of the master waveform and the measured waveform
are aligned on the screen.
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HIOKI ST4030A976-01
5 Automatically Setting the Waveform Judgment Scope and Judgment
Threshold Values
The judgment scope and judgment threshold values used during voltage calibration can be set automatically.
Automatic configuration can be used to determine provisional settings for use in testing of judgment operation and
determining judgment threshold values.
Values can be set separately using the following judgment functions:
• Surface comparison judgment [AREA]
• Differential surface area comparison judgment [DIFF AREA]
• Flutter detection judgment [FLUTTER]
• Secondary differential detection judgment [LAPLACIAN]
• LC and RC values judgment [LCRC AREA]
*1: The judgment scope for LC and RC values judgment is set automatically.
*1
7
HIOKI ST4030A976-01
5.1 Automatically Setting the Waveform Judgment Scope
Surface area comparison judgment, differential surface area comparison judgment, flutter detection judgment, and
secondary differential detection judgment
(Measurement screen) [MODE] > [SETTING] > [JUDGE] > [AREA], [DIFF AREA], [FLUTTER], [LAPLACIAN] >
[AUTO SET]
1. Tap [AUTO SCOPE].
OFF
ALL
ORIGINAL
*1: This setting can be used for general judgment.
*2: This is the same scope as used in the firmware prior to version 1.10.
1
Disables automatic configuration of the judgment scope.
Includes the entire acquired waveform length in the judgment scope.
Enables the judgment function.
Sets the judgment scope so that it consists primarily of the self-resonance scope.
Enables the judgment function.
*1
*2
8
HIOKI ST4030A976-01
5.2 Automatically Setting the Waveform Judgment Threshold Values
Surface area comparison judgment, differential surface area comparison judgment, flutter detection judgment, and
secondary differential detection judgment
(Measurement screen) [MODE] > [SETTING] > [JUDGE] > [AREA], [DIFF AREA], [FLUTTER], [LAPLACIAN] >
[AUTO SET]
1. Tap [AUTO LIMIT] and select whether to configure threshold values automatically.
OFF
ON
2. If setting threshold values automatically, tap [VA R I AT IO N ] and select whether to add the equivalent of 6 σ of
variation in judgment values (as a variability value).
OFF
ON
3. Tap [MARGIN] and set the amount of allowance (margin value) to give threshold values when setting them
Disables automatic configuration of threshold values.
Sets threshold values automatically.
Enables the judgment function.
Does not add variability.
Adds variability.
2 3 1
automatically.
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HIOKI ST4030A976-01
LC and RC values judgment
(Measurement screen) [MODE] > [SETTING] > [JUDGE] > [LCRC AREA] > [AUTO SET]
1. Tap [AUTO LIMIT] and select whether to configure threshold values automatically.
OFF
ON
2. If setting threshold values automatically, tap [VA R I AT IO N ] and select whether to add the equivalent of 6 σ of
variation in judgment values (as a variability value).
OFF
ON
3. If setting the LC threshold value automatically, tap [MARGIN LC] and set the amount of allowance (margin value)
to give the threshold value.
4. If setting the RC threshold value automatically, tap [MARGIN RC] and set the amount of allowance (margin value)
Disables automatic configuration of threshold values.
Sets threshold values automatically.
Enables the judgment function.
Does not add variability.
Adds variability.
2
3 1
4
to give the threshold value.
10
+ (Average of FLUTTER judgment measured values during voltage calibration) ×
HIOKI ST4030A976-01
5.3 Waveform Judgment Threshold Values Formulas
Threshold values are automatically set using the following formulas:
AREA upper limit
AREA lower limit
DIFF AREA
FLUTTER
+ Average of AREA judgment measured values during voltage calibration
+ Margin setting
+ Variability measured value
- Average of AREA judgment measured values during voltage calibration
- Margin setting
- Variability measured value
+ Average of DIFF AREA judgment measured values during voltage calibration
+ Margin setting
+ Variability measured value
+ Average of FLUTTER judgment measured values during voltage calibration
margin setting
*1
*1
*1
*1
LAPLACIAN
LCRC AREA LC upper
limit
LCRC AREA LC lower
limit
LCRC AREA RC
upper limit
LCRC AREA RC lower
limit
+ Variability measured value
+ Average of LAPLACIAN judgment measured values during voltage calibration
+ (Average of LAPLACIAN judgment measured values during voltage calibration) ×
margin setting
+ Variability measured value
+ Average of LC judgment measured values during voltage calibration
+
(Average of LC judgment measured values during voltage calibration) × margin setting
+ Variability measured value
- Average of LC judgment measured values during voltage calibration
- (Average of LC judgment measured values during voltage calibration) × margin setting
- Variability measured value
+ Average of RC judgment measured values during voltage calibration
+
(Average of RC judgment measured values during voltage calibration) × margin setting
+ Variability measured value
- Average of RC judgment measured values during voltage calibration
-
(Average of RC judgment measured values during voltage calibration) × margin setting
- Variability measured value
*1: Under ideal conditions, the average of AREA judgment and DIFF AREA judgment measured values is 0. The
average value may be slightly greater than 0 because waveforms acquired during a large number of attempted
measurements may diverge slightly from the master waveform.
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HIOKI ST4030A976-01
5.4 Compatibility of Automatically Configured Waveform Judgment Scope and Judgment Threshold Values
Make the following settings to configure firmware version 1.10 for the same operation as [AUTO SET] automatic
configuration under the firmware prior to version 1.10.
Surface area comparison judgment, differential surface area comparison judgment, flutter detection judgment, and
secondary differential detection judgment
AUTO SET AUTO SCOPE AUTO LIMIT VA R I ATI O N MARGIN
OFF OFF ON ON
ON ORIGINAL ON ON
LC and RC values judgment
AUTO SET AUTO SCOPE AUTO LIMIT VA R I ATI O N MARGIN
No setting
When a settings file saved using the firmware prior to version 1.10 is loaded, the data will be converted to the above
settings.
Since the waveform judgment scope and judgment threshold settings have been expanded, you may encounter
changes in control when checking the status of settings using communication commands. For more information,
please see the Communication Command Instruction Manual.
Fixed to ON ON ON
Set value.
Set value.
Set value.
12
IMPORTANT
displayed.
HIOKI ST4030A976-01
6 Continuous Application
This setting applies voltage pulses continuously from the start of measurement until measurement stops due to
STOP button input.
Testing can also be started and stopped using communications or the external control terminal.
6.1 Enabling Continuous Application
(Measurement screen) [MODE] > [SETTING] > [OUTPUT] > [PULSE]
1. Tap [CONTINUOUS] to select the continuous application setting.
OFF
ON
1
Performs measurement according to the number of applied pulses and the number of
degaussing pulses.
Applies voltage pulses continuously.
• No degaussing pulses are applied during continuous application.
• During continuous application, the screen will be redrawn after each applied pulse, and the previously applied
pulse waveform will be cleared.
• To display multiple previously applied pulse waveforms, enable overlay display of waveforms.
• During continuous application, the instrument will only record waveform data for the last pulse waveform to
be applied.
• When judgment is enabled, only the judgment results for the last pulse waveform to be applied will be
13
1
Test conditions settings
5
7
HIOKI ST4030A976-01
7 Discharge Starting Voltage Testing (RPDIV)
This function tests discharge status by performing impulse testing in which the applied voltages comply with the
IEC 61934 procedure.
The operation procedure is the same as for BDV mode, but there are differences in the conditions set as part of the
testing process.
*1: Models equipped with ST9000 Discharge Detection Upgrade o n l y.
*1
7.1 Screen Configuration
3
4
1 2
5 6
7
Graph display Displays waveform graphs.
Menu icons
2
[GRAPH]
3
4
display
Judgment value display Displays the voltage setting and judgment values during testing.
[SAVE]
6
Measurement results
display area
MODE : Selects the measurement mode.
OUTPUT : Sets the test conditions.
JUDGE : Sets the judgment conditions.
SYSTEM : Configures the system.
FILE : USB host
Sets the graph display.
Displays the settings for the application start voltage, max. voltage, and voltage
change width.
Saves the test results to USB flash drive.
Displays the test results.
14
3
PDIV： XXXXV (XXXXV) Partial discharge inception voltage
HIOKI ST4030A976-01
7.2 Starting Testing and Checking Test Results
Testing is started by pressing the START button on the instrument. (It can also be started using communications or
the external control terminal.)
When testing completes, the test results will be output to the screen, communications, and external control terminals
(EXT. I/O).
Impulse testing is carried out by incrementing the voltage by the voltage change width, from the set applied voltage
to the maximum applied voltage, and recording the incidence of discharge. Once the maximum applied voltage has
been reached, impulse testing is applied by decrementing the voltage by the voltage change width and recording
the incidence of discharge.
1
2
1
2
Voltage
monitor
Judgment
values
Measurement
results
Displays the current applied voltage value.
DCHG： XXσ Max. deviation of discharge amount
Vpeak： XXσ Max. misalignment width from standard of the peak voltage value
FREQ： XXσ Max. misalignment width from standard of the vibration frequency
Test voltage value (measured voltage value)
RPDIV： XXXXV (XXXXV) Repeated partial discharge inception voltage
Test voltage value (measured voltage value)
MAX V: XXXXV (XXXXV) Return voltage
Test voltage value (measured voltage value)
3
*1
RPDEV：XXXXV (XXXXV) Repeated partial discharge extinction voltage
Test voltage value (measured voltage value)
REF VAL：XXXXV (XXXXV) RPDEV reference value
Test voltage value (measured voltage value)
PDEV： XXXXV (XXXXV) Partial discharge extinction voltage
Test voltage value (measured voltage value)
REF VAL: XXXXV (XXXXV) PDEV reference value
Test voltage value (measured voltage value)
15
*2
*3
HIOKI ST4030A976-01
*1: Test voltage after switching from the rising voltage to the falling voltage process.
*2: To take into account variability in discharge incidence, the largest test voltage that does not exceed the test
voltage that resulted in a discharge incidence of 50% or more during the falling voltage process is recorded.
The value is not displayed if the voltage is the same as [RPDEV].
*3: To take into account variability in discharge incidence, of the test voltages that resulted in a discharge incidence
of 0% during the falling voltage process, the highest voltage value that is less than the [RPDEV] reference value
is recorded.
The value is not displayed if the voltage is the same as [PDEV].
16
HIOKI ST4030A976-01
7.3 Recorded Data Display
This part of the screen displays the number of data points that the instrument has recorded.
1
1
Pulse information
2
S: XX : Number of waveforms recorded by the instrument
P: XX/XX : Number of pulses applied at the current applied voltage / total number of
pulses
*1
xxxV : Maximum peak voltage value for the response waveform
+X.XX[μs] : Rise time
Internal memory
2
*1: Only waveform data for major test voltages such as the measurement start voltage, PDIV, and RPDIV is
recorded.
Up to 32 waveforms can be recorded.
*2: The display will switch between crest and tail length depending on the selected calculation formula.
IMPORTANT
*2
• Although waveform data is not recorded to the instrument’s internal memory, judgment values for all applied
pulses for all voltages are recorded.
• Data recorded to the internal memory in test mode is cleared when the instrument is switched to RPDIV mode.
• Data recorded to the internal memory in RPDIV mode is cleared when the instrument is switched to another
mode.
17
HIOKI ST4030A976-01
7.4 Applied Voltages
(Measurement screen) [MODE] > [RPDIV] > [OUTPUT]
1. Tap [START] and set the application start voltage.
Application will start with the set voltage.
ST4030
ST4030A
2. Tap [TOP] and set the maximum applied voltage.
The instrument will perform the test while incrementing the voltage until the set voltage is reached. Once the
maximum applied voltage is reached, the instrument will continue testing while decrementing the voltage until the
application start voltage is reached.
ST4030
ST4030A
3. Tap [STEP] and set the voltage change width.
ST4030
ST4030A
Values greater than 100 V may be entered, but they will be treated as 100 V.
100 V to 3300 V (resolution: 10 V)
100 V to 4200 V (resolution: 10 V)
100 V to 3300 V (resolution: 10 V)
100 V to 4200 V (resolution: 10 V)
10 V to 100 V (resolution: 10 V)
10 V to 100 V (resolution: 10 V)
1
2
3
IMPORTANT
When the [VOLT ERROR] setting is enabled
• If a discharge is detected at the application start voltage, the test will terminate with a VOLTAGE ERROR.
• If the measured voltage does not increase to the applied voltage, the test will terminate with a VOLTAGE
ERROR.
The BDV and RPDIV modes share the same settings, including for applied voltages.
For example, changing the settings in BDV mode will change the same settings in RPDIV mode.
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HIOKI ST4030A976-01
7.5 Number of Applied Pulses
(Measurement screen) [MODE] > [RPDIV] > [OUTPUT] > [PULSE]
1
2
1. Tap the buttons to set the number of test pulses to be applied.
▲
▼
C
2. Tap [PERIOD] to set the pulse application duration interval.
IMPORTANT
There is no degaussing pulse setting in RPDIV mode.
Increases the setting by 1.
Decreases the setting by 1.
Reverts the setting to the default value.
19
◀
▶
◀
▶
HIOKI ST4030A976-01
7.6 Sampling Frequency and Number of Sampling Data
(Measurement screen) [MODE] > [RPDIV] > [OUTPUT] > [SAMPLING]
1. Tap the buttons to set the sampling frequency.
If you are unable to acquire the entire response waveform due to its long oscillation period, you can increase the
length of the acquired waveform by decreasing the sampling frequency.
Setting range：10 MHz, 20 MHz, 50 MHz, 100 MHz, 200 MHz
Decreases the frequency by 1.
Increases the setting by 1.
2. Tap the buttons to set the number of sampling data.
If part of the end of the waveform has an extremely small voltage amplitude after you’ve determined the length of
the acquired waveform by adjusting the sampling frequency, you can decrease the number of sampling data so that
unnecessary parts of the waveform are not acquired.
1
2
3
Setting range: 1001 to 8001 points (resolution: 1000 points)
Decreases the setting by 1000.
Increases the setting by 1000.
3. Tap [AUTO SET] and select automatic configuration of the waveform acquisition range.
Sets the sampling frequency and number of sampling data automatically at the time of voltage calibration to optimize
the waveform acquisition range.
OFF
ON
Disables automatic configuration.
Enables automatic configuration.
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HIOKI ST4030A976-01
7.7 Return Conditions
(Measurement screen) [MODE] > [RPDIV] > [OUTPUT]
1
2
1. Tap [TURN BACK] and set the return conditions.
Set the conditions used to stop incrementing the applied voltage and start decrementing it.
TOP
100 %
90 %
80 %
70 %
60 %
6 sigma
12 sigma
24 sigma
Return at the maximum applied voltage.
Return once the discharge incidence reaches 100%.
Return once the discharge incidence reaches 90%.
Return once the discharge incidence reaches 80%.
Return once the discharge incidence reaches 70%.
Return once the discharge incidence reaches 60%.
Return once the maximum deviation in the discharge amount reaches 6σ.
Return once the maximum deviation in the discharge amount reaches 12σ.
Return once the maximum deviation in the discharge amount reaches 24σ.
*1*2
*1*2
*1*2
*1: The value of σ varies with discharge judgment threshold values.
*2: Operation will return regardless of whether the discharge incidence has reached 50%.
2.
Tap [ O N E WAY] and set whether to make increments only.
The ON setting causes changes in the applied voltage to be limited to increments.
OFF
ON
Both increment and decrement the applied voltage.
Limits changes in the applied voltage to increments.
21
HIOKI ST4030A976-01
7.8 Rise Time
(Measurement screen) [MODE] > [RPDIV] > [OUTPUT]
1. Tap [RISE TIME] and set the rise time.
Enable/disable the waveform rise time display and set the calculation formula.
OFF
30%to90%
0%to100%
10%to90%
TRANSIENT
Disables calculation of rise time. Rise time will not be displayed.
Uses the lightning impulse voltage waveform calculation formula to display the crest and tail
length.
Uses the switching impulse voltage waveform calculation formula to display the crest and tail
length.
Uses the lightning impulse current waveform calculation formula to display the crest and tail
length.
This rise time is generally used with voltage waveforms.
In this case, the rise time is the time required for the voltage to increase from 10% to 90% of 0 V
to the initial peak voltage.
1
22
HIOKI ST4030A976-01
7.9 Trigger Position
(Measurement screen) [MODE] > [RPDIV] > [OUTPUT]
1
1. Tap [TRIG POS] and set the trigger position.
AUTO
MINUS
FALL
RISE
Aligns waveforms’ display positions based on their second zero-cross position.
Aligns waveforms just before they approach 0 V from their minimum values.
Aligns waveforms’ display positions based on their initial zero-cross positions.
Aligns waveforms’ display positions based on their rising edges.
*1
*1
*1
*1: If the trigger position cannot be detected due to the condition of the voltage waveform, the setting will be changed
automatically to another condition.
23
HIOKI ST4030A976-01
7.10 Discharge Starting Voltage Judgment Conditions
(Measurement screen) [MODE] > [RPDIV] > [JUDGE]
1
1. Tap [DISCHARGE] and set the discharge amount judgment conditions.
Setting range: OFF, 3σ to 100σ (resolution: 1σ)
2. Tap [Vpeak] and set the peak voltage value variability judgment conditions.
A discharge will be determined to have occurred if the instrument detects fluctuations that exceed the product of the
peak voltage average value.
Setting range: OFF, 0% to 100% (resolution: 1%)
3. Tap [FREQ] and set the oscillation frequency variability judgment conditions.
Setting range: OFF, 0% to 100% (resolution: 1%)
A discharge will be determined to have occurred if the instrument detects fluctuations that exceed the product of the
average value of waveforms’ first period and this setting.
2
3
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HIOKI ST4030A976-01
8 Automatic Voltage Adjustment
The voltage applied to workpieces may exhibit variability if there are variations in the workpiece’s characteristics.
When automatic voltage adjustment is enabled and the number of degaussing pulses is set to 1 or more, the
instrument will measure the magnitude of the degaussing pulse voltage and adjust the output voltage so that the
voltage that is applied to the workpiece more closely approaches the applied voltage setting.
• The adjustment range is limited to prevent the output voltage from becoming excessively high, for example in the
event of an open or short-circuited workpiece.
• The upper limit on the adjustment range can be changed using communication commands. The lower limit is fixed.
• Adjustment can be performed even if there is no master waveform because voltage calibration has not been
performed.
• Since multiple degaussing pulses cause adjustment to be repeated for each degaussing pulse, such settings
allow the voltage that is applied to workpieces to more closely approach the applied voltage setting.
• Adjustment settings may apply globally to all ST4030A operation or to individual tables. Table settings take
precedence.
• You can configure the adjustment process so that either the voltage value at the first waveform peak or the voltage
value corresponding to the maximum amplitude of the entire waveform approaches the applied voltage setting.
• Automatic adjustment is performed in test conditions settings mode ([SETTING]) and test mode ([TEST]).
• The valid adjustment range is -25% to +50%. The upper limit can be lowered to 0% using communication
commands.
IMPORTANT
• If the adjustment value exceeds the limits, measurement will be performed without adjusting the output voltage.
• If the adjusted voltage value exceeds the valid output voltage range, measurement will be performed without
adjusting the output voltage.
• The fact that measurement was performed without adjusting the output voltage will not cause any change in
the measurement status. It is recommended to acquire the magnitude and adjustment status of the waveform
voltage using communication commands after measurement and then change processing as necessary based
on the results.
25
HIOKI ST4030A976-01
8.1 Global Automatic Voltage Adjustment
(Measurement screen) [SYSTEM]
1
1. Tap [AUTO ADJ.] and configure global automatic voltage adjustment (which applies across all instrument
operation).
OFF
TOP
MAX
Disables automatic adjustment.
Adjusts the magnitude of the voltage value at the first waveform peak so that it approaches
the applied voltage setting.
Adjusts the magnitude of the voltage value corresponding to the maximum amplitude of
the entire waveform so that it approaches the applied voltage setting.
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HIOKI ST4030A976-01
8.2 Table-specific Automatic Voltage Adjustment
(Measurement screen) [OUTPUT]
1.
Tap [VOLT ADJ.] and configure table-specific automatic voltage adjustment.
COMMON
OFF
TOP
MAX
Uses the global automatic voltage adjustment setting (which applies across all instrument
operation).
Disables automatic adjustment.
Adjusts the magnitude of the voltage value at the first waveform peak so that it approaches
the applied voltage setting.
Adjusts the magnitude of the voltage value corresponding to the maximum amplitude of
the entire waveform so that it approaches the applied voltage setting.
1
27
Automatic voltage adjustment icon
HIOKI ST4030A976-01
8.3 Screen Display
When automatic voltage adjustment is performed, an [ A ] icon appears in the applied voltage box in the test
conditions settings display area at the bottom left of the screen.
A green icon is shown if the number of degaussing pulses
A gray icon is used if the number of degaussing pulses is 0.
is 1 or greater.
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HIOKI ST4030A976-01
9 Manual Voltage Adjustment
This section describes how to adjust the output voltage by a user-specified amount without changing the applied
voltage setting.
• This setting can only be changed using communication commands.
• You can set either a percentage or a voltage value.
• Adjustment can be performed even if there is no master waveform because voltage calibration has not been
performed.
• Unlike automatic voltage adjustment, the output voltage is adjusted directly. Adjustment can be performed even if
the number of degaussing pulses is zero.
• Unlike automatic voltage adjustment, only a global setting is available.
• Measurement can be performed with both automatic voltage adjustment and manual adjustment enabled.
• Manual adjustment is performed in test conditions settings mode ([SETTING]) and test mode ([TEST]).
• The valid adjustment range when specifying a percentage is -50% to +50%. The valid adjustment range when
specifying a voltage is 100 V to 4200 V (ST4030: 100 V to 3300 V). When specifying a voltage, adjustment is only
performed when the specified voltage falls within the range of -50% to +50% of the applied voltage setting.
To ensure safety, automatic voltage adjustment is disabled under the following circumstances:
• When the instrument starts up
• When the applied voltage is changed
• When the measurement mode is changed
• When a table is loaded
• When a settings file is loaded
IMPORTANT
• To ensure safety, manual adjustment cannot be configured using the screen. It can only be configured using
communication commands. Enable manual voltage adjustment only when necessary due to the measurement
process. Processes and control, including error processing, should be designed so that it is not necessary to
enable manual adjustment.
• If the adjusted voltage value exceeds the valid output voltage range, measurement will be performed without
adjusting the output voltage.
• The fact that measurement was performed without adjusting the output voltage will not cause any change in
the measurement status. It is recommended to acquire the magnitude and adjustment status of the waveform
voltage using communication commands after measurement and then change processing as necessary based
on the results.
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Manual voltage adjustment icon
HIOKI ST4030A976-01
9.1 Screen Display
When manual voltage adjustment is performed, an [ M ] icon appears in the applied voltage box in the test conditions
settings display area at the bottom left of the screen.
The voltage value will change to the post-adjustm
ent value, which will be shown in red.
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HIOKI ST4030A976-01
10 Degaussing Pulse/Measurement Pulse Detection Signal Output
The instrument can output signals for determining whether the impulse voltage output from the voltage output
terminal is a degaussing pulse or a measurement pulse.
・This setting can be changed using communication commands.
・A signal indicating degaussing pulse generation is output from EXT. I/O OUT0.
・A signal indicating measurement pulse generation is output from EXT. I/O OUT1.
・The signals are output in test conditions settings mode ([SETTING]) and test mode ([TEST]).
Example output timing (2 degaussing pulses and 2 measurement pulses)
IMPORTANT
• The output state of EXT. I/O general-purpose output is overwritten.
• The timing of changes to detection signal output and pulse output is not synchronized. This functionality is not
suitable for use in applications where the detection signal is used as a trigger to measure the pulse.
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HIOKI ST4030A976-01
11 Extension to Area Detection Threshold Settings
This section describes how to set the upper and lower limit values separately for area comparison detection
([AREA]).
Setting the upper limit value for the area comparison judgment ([AREA]) threshold value
(Measurement screen） [MODE] > [SETTING] > [JUDGE] > [AREA]
2
1. Tap [+LIMIT].
2. Enter the upper limit value for the area comparison detection threshold using the numeric keypad.
Setting range: -99.99%～+99.99% (Resolution: 0.01%)
OFF
3. Tap [SET] to accept the setting.
If you set the upper limit value so that it is lower than the lower limit value, the upper and lower limit values will be
reversed.
1
3
Disables judgment.
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HIOKI ST4030A976-01
Setting the lower limit value for the area comparison judgment ([AREA]) threshold value
(Measurement screen) [MODE] > [SETTING] > [JUDGE] > [AREA]
2
1
1. Tap [-LIMIT].
2. Enter the lower limit value for the area comparison detection threshold using the numeric keypad.
Setting range: -99.99%～+99.99% (Resolution: 0.01%)
OFF
3. Tap [SET] to accept the setting.
If you set the lower limit value so that it is higher than the upper limit value, the upper and lower limit values will be
reversed.
3
Disables judgment.
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HIOKI ST4030A976-01
11.1 Screen Display
If the upper and lower limit values are equal, and the upper and lower limit values’ signs are reversed, only the
upper limit value will be displayed.
This display is the same as that used in firmware version V1.10.
If the upper and lower limit values differ or have the same sign, both the upper and lower limit values will be displayed,
with the former above the latter.
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HIOKI ST4030A976-01
12 Fixing Startup Mode
The following settings can be made using communication commands so that the ST4030A always starts up in the
same measuring mode when it is powered on.
NORMAL
KEEP
NONE
SETTING
GENERAL
BDV
RPDIV
*1: When using the ST9000
Please refer to the Communication Command Instruction Manual for more information.
Same operation as in V1.05 and V1.10
If the instrument was in the key lock state when it was turned off, it will start up in
the same mode as when it was turned off.
If the instrument was not in the key lock state when it was turned off, it will start up
in voltage application disabled mode.
Causes the instrument to always start up in the same mode as when it was turned
off.
Causes the instrument to start up in voltage application disabled mode.
Causes the instrument to start up in test conditions settings mode.
Causes the instrument to start up in test mode.
Causes the instrument to start up in break down voltage test (BDV) mode.
1
Causes the instrument to start up in RPDIV mode. *
IMPORTANT
• Performing a full reset will not reset this setting.
• To change this setting, please configure it using communication commands.
• The setting may be initialized when the instrument is repaired or calibrated.
• This setting is not among the test conditions that can be saved to a USB flash drive.
• If you downgrade to firmware earlier than V1.20, the setting will remain, but its functionality will be disabled.
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HIOKI ST4030A976-01
13 Permanently Enabling the Interlock Function
This section describes how to enable the interlock pin permanently with communication commands.
Once set, this function cannot be undone.
If this function is enabled, you will be able to operate the screen and change settings even when the interlock
function is engaged.
Please refer to the communication command user manual for more information.
IMPORTANT
• Performing a full reset will not reset this setting.
• The setting is stored in the instrument’s nonvolatile memory. You can use communication commands to verify
that the setting has not been deleted, for example due to a nonvolatile memory failure.
• If you need to revert the setting to its original value, please contact your authorized Hioki distributor or reseller.
• Please cycle the instrument’s power after changing this setting.
• The setting may be initialized when the instrument is repaired or calibrated.
• This setting is not among the test conditions that can be saved to a USB flash drive.
• If you downgrade to firmware earlier than V1.20, the setting will remain, but its functionality will be disabled.
14 Permanently Enabling Level Operation of the EXT. I/O STOP Pin
Although the EXT. I/O STOP pin is set to edge operation in the instrument’s standard configuration, it can be set to
level operation using communication commands.
Once set, this setting cannot be undone.
Please refer to the Communication Command Instruction Manual for more information.
IMPORTANT
・Performing a full reset will not reset this setting.
・The setting is stored in the instrument’s nonvolatile memory. You can use communication commands to verify
that the setting has not been deleted, for example due to a nonvolatile memory failure.
・If you need to revert the setting to its original value, please contact your authorized Hioki distributor or reseller.
• Please cycle the instrument’s power after changing this setting.
• The setting may be initialized when the instrument is repaired or calibrated.
• This setting is not among the test conditions that can be saved to a USB flash drive.
• If you downgrade to firmware earlier than V1.20, the setting will remain, but its functionality will be disabled.
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HIOKI ST4030A976-01
15 Background Color
You can set the background color of the waveform display area to white.
This setting makes it easier to see waveforms when image data is saved as a file.
(Measurement screen) [SYSTEM]
1
1. Tap [SCRN COLOR] and set the screen background color.
BLACK
GRAPH (1)
GRAPH (2)
WHITE (1)
WHITE (2)
IMPORTANT
Change settings before measurement. Changing settings after measurement starts may cause the waveform
Selects black as the background color.
Selects white as the background color for the waveform display area only.
Selects white as the background color for the waveform display area only.
The waveform color will be changed to facilitate easy viewing.
Selects white as the background color for the entire waveform screen.
Selects white as the background color for the entire waveform screen.
The waveform color will be changed to facilitate easy viewing.
display to be cleared.
37
Enables automatic saving of only data with a FAIL judgment after measurement
HIOKI ST4030A976-01
16 Auto Saving of Files
This setting configures whether to automatically save measurements that generated a FAIL judgment to the USB
flash drive.
(Measurement screen) [FILE] > [SETUP]
1. Tap [AUTO] to enable auto saving.
OFF
ON
1
Disables automatic saving of data after measurement completes.
Enables automatic saving of data after measurement completes.
FAIL
completes.
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HIOKI ST4030A976-01
17 Extension to the Voltage Error Setting
The voltage error setting has been extended.
(Measurement screen) [SYSTEM] > [SYSTEM]
1.
Tap [VOLT ERROR] to configure the voltage error setting.
OFF
ON
ONORSTOP Enables voltage errors in the [SETTING] and [TEST] modes.
Disables voltage errors.
Enables voltage errors.
In the [BDV] and [RPDIV] modes, measurement will complete with no error having
occurred even if the instrument is unable to apply the voltage up to the test voltage.
1
39
function has been permanently
HIOKI ST4030A976-01
18 Expansion of System Information
System information shown for the instrument has been expanded.
(Measurement screen) [SYSTEM] > [INFO]
Serial No.
Software Version
FPGA Main
FPGA Receive
MAC Address
USB ID
Interface Board
EXT. I/O Mode
Indicates the serial number.
Indicates the firmware version.
Indicates the main FPGA version.
Indicates the sub-FPGA version.
Indicates the instrument’s MAC address.
Indicates the USB ID.
Indicates the name of the optional interface board in use.
[--]: No interface board in use
Indicates the external control terminal (EXT. I/O) output mode.
NPN: Current sink output mode
Option
ALWAYS INTERLOCK
STARTUP MODE
EXT. I/O STOP
INTERNAL CAPACITY
PNP: Current source output mode
Indicates whether the ST9000 Discharge Detection Upgrade (option)
is present.
Indicates whether the interlock
enabled.
Indicates whether the startup mode has been fixed.
Indicates the STOP pin (EXT. I/O) operating mode.
Indicates the capacity of the instrument’s internal discharge capacitor.
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HIOKI ST4030A976-01
19 Other Changes
19.1 Communication Commands
A number of new communication commands have been added. Please see the Communication Command
Instruction Manual for more information.
19.2 BDV Mode
It is now possible to perform measurements up to the maximum voltage in BDV mode, even if the test voltage is set
for more than 32 steps.
In this case, waveform data is thinned so that it fits into 32 steps before being saved by the instrument.
19.3 File Screen
When attempting to overwrite an existing file with the same name, you can now choose whether to do so.
Write-protected files and folders cannot be deleted or renamed.
19.4 STOP Button
To improve safety, it is no longer possible to start measurement using the external control terminal (EXT. I/O) or
communication commands while the STOP button on the instrument is being pressed.
19.5 Downgrading
If you downgrade the instrument’s firmware from V1.20 to a version released prior to V1.20, please initialize the
instrument by performing a full reset as described in Section 14.2 of the Instruction Manual. The instrument will not
start up until this step is performed.
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HIOKI ST4030A976-01
HIOKI ST4030A976-01
HIOKI ST4030A976-01
www.hioki.com/
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