ST4030
HIOKI ST4030A976-01
ST4030A
Firmware Version 1.20
Additions and Changes
IMPULSE WINDING TESTER
Feb. 2023 Revised edition 1
ST4030A976-01
EN
[600629281]
HIOKI ST4030A976-01
Contents
HIOKI ST4030A976-01
1 Overview ................................................................................................................................. 1
2 Selecting the Measurement Mode .......................................................................................... 2
3 Rise Time ................................................................................................................................ 3
3.1 Waveform Graph Display .................................................................................................. 3
3.2 Setting the Rise Time Calculation Formula ....................................................................... 4
4 Waveform Trigger Position ...................................................................................................... 5
4.1 Setting Waveform Trigger Positions .................................................................................. 5
5 Automatically Setting the Waveform Judgment Scope and Judgment Threshold Values ........ 7
5.1 Automatically Setting the Waveform Judgment Scope ...................................................... 8
5.2 Automatically Setting the Waveform Judgment Threshold Values .................................... 9
5.3 Waveform Judgment Threshold Values Formulas ............................................................ 11
5.4 Compatibility of Automatically Configured Waveform Judgment Scope and
Judgment Threshold Values ........................................................................................... 12
6 Continuous Application ......................................................................................................... 13
6.1 Enabling Continuous Application ..................................................................................... 13
7 Discharge Starting Voltage Testing (RPDIV) ......................................................................... 14
7.1 Screen Configuration ...................................................................................................... 14
7.2 Starting Testing and Checking Test Results .................................................................... 15
7.3 Recorded Data Display ................................................................................................... 17
7.4 Applied Voltages ............................................................................................................. 18
7.5 Number of Applied Pulses ............................................................................................... 19
7.6 Sampling Frequency and Number of Sampling Data ...................................................... 20
7.7 Return Conditions ........................................................................................................... 21
7.8 Rise Time ........................................................................................................................ 22
7.9 Trigger Position ............................................................................................................... 23
7.10 Discharge Starting Voltage Judgment Conditions ......................................................... 24
8 Automatic Voltage Adjustment .............................................................................................. 25
8.1 Global Automatic Voltage Adjustment ............................................................................. 26
8.2 Table-specific Automatic Voltage Adjustment .................................................................. 27
8.3 Screen Display ................................................................................................................ 28
9 Manual Voltage Adjustment .................................................................................................. 29
9.1 Screen Display ................................................................................................................ 30
10 Degaussing Pulse/Measurement Pulse Detection Signal Output ....................................... 31
ST4030A976-01
11 Extension to Area Detection Threshold Settings ................................................................. 32
HIOKI ST4030A976-01
11.1 Screen Display .............................................................................................................. 34
12 Fixing Startup Mode ............................................................................................................ 35
13 Permanently Enabling the Interlock Function ...................................................................... 36
14 Permanently Enabling Level Operation of the EXT. I/O STOP Pin ...................................... 36
15 Background Color ............................................................................................................... 37
16 Auto Saving of Files ............................................................................................................ 38
17 Extension to the Voltage Error Setting ................................................................................ 39
18 Expansion of System Information ....................................................................................... 40
19 Other Changes ................................................................................................................... 41
19.1 Communication Commands .......................................................................................... 41
19.2 BDV Mode..................................................................................................................... 41
19.3 File Screen .................................................................................................................... 41
19.4 STOP Button ................................................................................................................. 41
19.5 Downgrading ................................................................................................................. 41
HIOKI ST4030A976-01
1 Overview
The following functionality has been added to version 1.20 of the firmware:
• Measuring impulse voltage rise time
• Changing the positioning of master and measured waveforms
• Automatically setting waveform judgment scope and threshold values
• Applying voltage pulses continuously
• Performing discharge starting voltage testing that complies with the IEC 61934 procedure
• Changing the screen to a background color that’s easy to see for printing
• Automatically saving only data that is associated with a FAIL judgment
• Reducing voltage variability caused by variations in workpiece characteristics
• Adjusting the applied voltage value during testing without changing the applied voltage value setting
• Determining whether output pulses are degaussing or measurement pulses
• Setting separate upper and lower limit values for area judgment
• Changing the instrument’s operation so that it always starts up in the same mode
• Changing the instrument’s operation so that the interlock function is always enabled (cannot be undone)
• Changing the instrument’s operation to switch the EXT. IO STOP pin from edge operation to level operation
(cannot be undone)
• New communication commands
• Other
1
will acquire test conditions settings, judgment condition settings, and a
2 3 4
5*1
HIOKI ST4030A976-01
2 Selecting the Measurement Mode
An RPDIV measurement mode has been added for models equipped with the ST9000 Discharge Detection Upgrade.
Tap [MODE] on the measurement screen to display a measurement mode selection window. You can select from
five measurement modes.
1
1
2
3
SETTING
TEST
BDV
Selects test conditions settings mode.
The instrument
master waveform.
Selects test mode.
The instrument will call up the test conditions set in test conditions settings mode and use
them to test workpieces.
Selects insulation breakdown testing (BDV) mode.
The instrument will perform impulse testing by gradually increasing the voltage applied to
the workpiece under test to determine the voltage at which insulation breakdown occurs.
4
5
*1: Models equipped with ST9000 Discharge Detection Upgrade o n l y.
NONE
RPDIV
Selects no-voltage-application mode.
Output from the instrument will be disabled for safety reasons.
Tests discharge status by performing impulse testing in which the applied voltages comply
with the IEC 61934 procedure.
*1
2
HIOKI ST4030A976-01
3 Rise Time
This functionality measures rise time.
It has been added to test conditions settings mode, test mode, BDV mode, and RPDIV mode.
3.1 Waveform Graph Display
The rise time is displayed at the top left of the waveform graph.
1
P:XX/XX
1
Number of applied pulse / total number of pulses
*1
*1: During continuous application, only the number of applied pulses is shown.
*2: The display will switch between crest and tail length depending on the selected calculation formula.
xxxV
+X.XX[μs]
Maximum peak voltage value for the response waveform
*2
Rise time
3
HIOKI ST4030A976-01
3.2 Setting the Rise Time Calculation Formula
This section describes how to enable/disable display of waveform rise times and set the formula used to calculate
them.
Test conditions settings mode (Measurement screen) [MODE] > [SETTING] > [OUTPUT] > [RISE TIME]
BDV mode (Measurement screen) [MODE] > [BDV] > [OUTPUT] > [RISE TIME]
RPDIV mode (Measurement screen) [MODE] > [RPDIV] > [OUTPUT] > [RISE TIME]
RPDIV mode screen
1. Tap [RISE TIME] (rise time display format).
Enable/disable the waveform rise time display and set the calculation formula.
OFF
30%to90%
0%to100%
1
Disables calculation and display of rise time.
Uses the lightning impulse voltage waveform calculation formula. Displays the
crest and tail length.
Uses the switching impulse voltage waveform calculation formula. Displays the
10%to90%
TRANSIENT
crest and tail length.
Uses the lightning impulse current waveform calculation formula. Displays the
crest and tail length.
Uses the transient response calculation formula. Displays the rise time.
In this case, the rise time is the time required for the voltage to increase from
10% to 90% of 0 V to the initial peak voltage.
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circuit’s equivalent circuit, but they can still be used for judgment purposes.
HIOKI ST4030A976-01
4 Waveform Trigger Position
This functionality allows you to select the method used to position the master waveform and measured waveforms.
It has been added to test conditions settings mode, test mode, BDV mode, and RPDIV mode.
4.1 Setting Waveform Trigger Positions
Test conditions settings mode (Measurement screen) [MODE] > [SETTING] > [OUTPUT] > [TRIG POS]
BDV mode (Measurement screen) [MODE] > [BDV] > [OUTPUT] > [TRIG POS]
RPDIV mode (Measurement screen) [MODE] > [RPDIV] > [OUTPUT] > [TRIG POS]
Example RPDIV mode screen
1. Tap [TRIG POS] (trigger position).
AUTO
MINUS
FALL
RISE
Aligns waveforms’ display positions based on their second zero-cross position.
Aligns waveforms just before they approach 0 V from their minimum values
Aligns waveforms’ display positions based on their initial zero-cross positions.
Aligns waveforms’ display positions based on their rising edges.
1
*1
*1
*1
*1: If the trigger position cannot be detected due to the condition of the voltage waveform, the setting will be changed
automatically to another condition.
To use the same setting as used by firmware older than version 1.10, select [AUTO].
IMPORTANT
Setting the trigger position to any setting other than AUTO will cause the LC and RC values waveform
processing scope to diverge from the resonance range.
In such cases, the LC and RC values will differ from values calculated based on the LCR resonance
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HIOKI ST4030A976-01
Waveform trigger position: AUTO
The locations of the second zero-cross of the master waveform and measured waveform
are aligned on the screen.
Waveform trigger position: RISE
The locations of the rising edges of the master waveform and the measured waveform
are aligned on the screen.
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HIOKI ST4030A976-01
5 Automatically Setting the Waveform Judgment Scope and Judgment
Threshold Values
The judgment scope and judgment threshold values used during voltage calibration can be set automatically.
Automatic configuration can be used to determine provisional settings for use in testing of judgment operation and
determining judgment threshold values.
Values can be set separately using the following judgment functions:
• Surface comparison judgment [AREA]
• Differential surface area comparison judgment [DIFF AREA]
• Flutter detection judgment [FLUTTER]
• Secondary differential detection judgment [LAPLACIAN]
• LC and RC values judgment [LCRC AREA]
*1: The judgment scope for LC and RC values judgment is set automatically.
*1
7
HIOKI ST4030A976-01
5.1 Automatically Setting the Waveform Judgment Scope
Surface area comparison judgment, differential surface area comparison judgment, flutter detection judgment, and
secondary differential detection judgment
(Measurement screen) [MODE] > [SETTING] > [JUDGE] > [AREA], [DIFF AREA], [FLUTTER], [LAPLACIAN] >
[AUTO SET]
1. Tap [AUTO SCOPE].
OFF
ALL
ORIGINAL
*1: This setting can be used for general judgment.
*2: This is the same scope as used in the firmware prior to version 1.10.
1
Disables automatic configuration of the judgment scope.
Includes the entire acquired waveform length in the judgment scope.
Enables the judgment function.
Sets the judgment scope so that it consists primarily of the self-resonance scope.
Enables the judgment function.
*1
*2
8
HIOKI ST4030A976-01
5.2 Automatically Setting the Waveform Judgment Threshold Values
Surface area comparison judgment, differential surface area comparison judgment, flutter detection judgment, and
secondary differential detection judgment
(Measurement screen) [MODE] > [SETTING] > [JUDGE] > [AREA], [DIFF AREA], [FLUTTER], [LAPLACIAN] >
[AUTO SET]
1. Tap [AUTO LIMIT] and select whether to configure threshold values automatically.
OFF
ON
2. If setting threshold values automatically, tap [VA R I AT IO N ] and select whether to add the equivalent of 6 σ of
variation in judgment values (as a variability value).
OFF
ON
3. Tap [MARGIN] and set the amount of allowance (margin value) to give threshold values when setting them
Disables automatic configuration of threshold values.
Sets threshold values automatically.
Enables the judgment function.
Does not add variability.
Adds variability.
2 3 1
automatically.
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HIOKI ST4030A976-01
LC and RC values judgment
(Measurement screen) [MODE] > [SETTING] > [JUDGE] > [LCRC AREA] > [AUTO SET]
1. Tap [AUTO LIMIT] and select whether to configure threshold values automatically.
OFF
ON
2. If setting threshold values automatically, tap [VA R I AT IO N ] and select whether to add the equivalent of 6 σ of
variation in judgment values (as a variability value).
OFF
ON
3. If setting the LC threshold value automatically, tap [MARGIN LC] and set the amount of allowance (margin value)
to give the threshold value.
4. If setting the RC threshold value automatically, tap [MARGIN RC] and set the amount of allowance (margin value)
Disables automatic configuration of threshold values.
Sets threshold values automatically.
Enables the judgment function.
Does not add variability.
Adds variability.
2
3 1
4
to give the threshold value.
10
+ (Average of FLUTTER judgment measured values during voltage calibration) ×
HIOKI ST4030A976-01
5.3 Waveform Judgment Threshold Values Formulas
Threshold values are automatically set using the following formulas:
AREA upper limit
AREA lower limit
DIFF AREA
FLUTTER
+ Average of AREA judgment measured values during voltage calibration
+ Margin setting
+ Variability measured value
- Average of AREA judgment measured values during voltage calibration
- Margin setting
- Variability measured value
+ Average of DIFF AREA judgment measured values during voltage calibration
+ Margin setting
+ Variability measured value
+ Average of FLUTTER judgment measured values during voltage calibration
margin setting
*1
*1
*1
*1
LAPLACIAN
LCRC AREA LC upper
limit
LCRC AREA LC lower
limit
LCRC AREA RC
upper limit
LCRC AREA RC lower
limit
+ Variability measured value
+ Average of LAPLACIAN judgment measured values during voltage calibration
+ (Average of LAPLACIAN judgment measured values during voltage calibration) ×
margin setting
+ Variability measured value
+ Average of LC judgment measured values during voltage calibration
+
(Average of LC judgment measured values during voltage calibration) × margin setting
+ Variability measured value
- Average of LC judgment measured values during voltage calibration
- (Average of LC judgment measured values during voltage calibration) × margin setting
- Variability measured value
+ Average of RC judgment measured values during voltage calibration
+
(Average of RC judgment measured values during voltage calibration) × margin setting
+ Variability measured value
- Average of RC judgment measured values during voltage calibration
-
(Average of RC judgment measured values during voltage calibration) × margin setting
- Variability measured value
*1: Under ideal conditions, the average of AREA judgment and DIFF AREA judgment measured values is 0. The
average value may be slightly greater than 0 because waveforms acquired during a large number of attempted
measurements may diverge slightly from the master waveform.
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