GE USIPIxx Brochure

Measurement & Control

High-End Electronics Platform for Ultrasonic Testing Machines

USIP|xx

The USIP|xx electronics platform for ultrasonic testing machines provides the operating electronics for a wide range of ultrasonic testing systems. It processes the gathered inspection data at very high speeds to offer fast on-line inspection with exceptional probability of detection (POD).

• Designed to meet high-end testing requirements

• Offers up to ﬁve times increased productivity

• Can handle up to 768 parallel phased array channels per rack to provide comprehensive phased array operation

• Uses Ethernet-connected modules to ensure high data throughput to communicate with the Control-PC

• Can be used with conventional or phased array transducers including 2D Matrix probes

• Can be easily integrated within a user’s individual environment by signal exchange via Interbus

• Modular design facilitates easy maintenance

• Architecture facilitates access to raw data for subsequent evaluation and future upgradeability

USIP|xx Speciﬁcations

USIP|xx

Conﬁguration • 64 channels per board

• Up to 768 channels in a rack

• Up to 8 racks connected together

Pulsers • 25 V to 200 V supply voltage, adjustable in 5 V steps

• Negative rectangle

• Adjustable width 20 ns to 1000 ns in 5 ns steps

• Max. PRF 20 KHz

• Adjustable delay 0 – 80 µs in 2.5 ns steps

Receivers • 4 Vpp input voltage

• 0.5 - 15 MHz bandwidth (-3 dB)

• 80 dB dynamic range (per channel)

• Delay 0–80 µs in 5 ns steps

Digitizers • Sampling frequency of 50 MHz

• Up-sampling up to 400 MHz

• 20 bits amplitude/channel; up to 24 bit for formed beam

Interfaces • External PRF input

• 4 x encoders + 2 Index

• Up to 8 x 128 TDR, 32GPIO, 3 x Interbus

• 3 x light barrier inputs

• Gigabit Ethernet to PC

Phased Array features • Focusing, steering and scanning

• Aperture size from 1 to 256 elements

• Memory sub-cycles (no ﬁring) with water path suppression (Paint Brush)

• Pulse echo, Through-transmission, Pitch-catch

• Up to 4096 cycles

Data Stream & Evaluation • Up to 8 parallel evaluations per board and per cycle

• Up to 8 status A-Scans (512 pts) with echo-max

• Data A-Scan with 400 MHz sampling rate (max. 4096 samples)

• Raw A-Scan with 50 MHz sampling rate (max. 32.000 samples)

• 5 gates including Interface trigger gate, measurement resolution 2,5 ns

• Individual gain per gate (Local Gain)

• 128 evaluation channels per board

• 512 delay law sets per board

Signal processing • Pre-deﬁned and customizable digital ﬁlter

• Upsampling, downsampling

• A-Scan compression

www.ge-mcs.com

GEIT-60017EN (04/13)

© 2013 General Electric Company. All Rights Reserved. Speciﬁcations are subject to change without notice. GE is a registered trademark of General Electric Company. Other company or product names mentioned in this document may be trademarks or registered trademarks of their respective companies, which are not afﬁliated with GE.