GE Phasor XS Quick Reference Manual

GE
Inspection Technologies

Phasor XS™

Quick Reference Guide

021-247-407, rev. 2

©2008 General Electric Company.

All rights reserved. We reserve the right to technical modications without prior notice.

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2

Guide to the Keypad

-- Mode Selector: Phased Array or Conventional Operating Modes•

• -- View Select: Frame and/or A-Scan

• -- Gain Increment/Decrement: Press and hold to change between

digital and analog gain

• -- ZOOM View: Expand the display to entire screen
Press again to return to normal view mode

• -- Home Key: Returns the instrument to the phased array

or conventional Home Menu. If held for 3 seconds, automatically

performs a focal law calculation

• -- Freeze Key: Freezes the displayed image(s). If held for 3 seconds,

automatically generates and stores a report

3

Guide to the Keypad cont...

• -- Power Key: On and off

• -- Test Key: Switches from Home to Knob Menu
Function Rotary Knob – Rotate the right-hand knob to change the value of •

the selected function.

Gain Rotary Knob – Rotate the left-hand knob to change the instrument’s •

gain.

4

Setting Up

Press •
Press • to choose between PHASED ARRAY and
CONVENTIONAL
Set units of measurement and operating language by •

pressing to activate the CONFIG menu. Then activate the

REGIONAL submenu. Press next to UNITS or LANGUAGE and
turn the Function Knob to adjust.

5

Other basic features to adjust are accessed as follows •

Date – • CONFIG then STARTUP
Time – • CONFIG then STARTUP
Display Brightness – • CONFIG then STARTUP
Background Color – • DISPLAY then BACKGRND
Amplitude Color Palette – • DISPLAY then IMAGE
Date and Time Format – • CONFIG then REGIONAL

6

Connecting a Probe

Move the connector release lever to the open (left) position. Attach the
phased array probe connector the front of the instrument so that the
connector’s attached cable points upward. Then move the release

lever to the right.

connector

release knob

Orient connector with
cable pointing up

Phased Array

Probe Port

7

Conguring for a Probe and Wedge

Access the probe and wedge settings by pressing to activate the
PROBE menu. Then activate the PRB GEO submenu. Press next to

FREQUENCY, or NUMBER of ELEMENT, or PITCH to input values printed
on the probe body. Other probe and wedge features are adjusted as
follows:

Probe Part Number – • PROBE then PRB DAT
Probe Serial Number – • PROBE then PRB DAT
Wedge Part Number – • PROBE then WDGE DAT
Wedge Serial Number – • PROBE then WDGE DAT
Wedge Velocity – • PROBE then WDGE GEO

8

Conguring for a Probe and Wedge

Access the probe and wedge settings by pressing to activate the
PROBE menu. Wedge features are adjusted as follows:

Wedge Offset Z – • PROBE then WDGE GEO (user measured
from Probe Index Point to contact surface – set to 0 when no
wedge is installed)

Wedge Angle – • PROBE then WDGE GEO ( user measured
wedge angle – set to 0 when no wedge is installed)

Wedge Front – • PROBE then WDGE GEO (user measured
from Probe Index Point to wedge’s front edge – required to use
the origin offset feature)

Origin Offset – • PROBE then OFFSET (user measured from
wedge’s front edge to the target)

9

Conguring for a Probe and Wedge

10

Conguring for a Probe and Wedge

Markings on the probe body indicate the location of element 1 and the
direction that additional elements are arranged. To dene the
orientation of the probe’s elements with respect to the wedge’s
geometry, access PROBE menu then WDGE DAT submenu.

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12

Dening the Scan – LINEAR

The sequence in which the phased array probe’s elements re are
dened using features located in the SCAN menu.
For LINEAR scan types set the following:

SCAN TYPE – • ELECTRNC (choose linear)
WAVE TYPE – • ELECTRNC (shear or longitudinal)
ANGLE START – • SCAN PATT (constant ring angle for linear)
First Element – • APERATURE (element where it begins)
Number of Steps – • APERATURE (number of steps in scan)
APRERATURE SIZE – • (number of elements in the step)
APRERATURE STEP – • (number of elements stepped from one

step to the next in the linear scan)
CALC – • SCAN PATT (calculate delay laws)

13

Dening the Scan - SECTOR

The sequence and pattern at which the phased array probe’s ele­ments re are dened using features located in the SCAN menu. For
SECTOR scan types set the following:

SCAN TYPE – • ELECTRNC (choose sector)
WAVE TYPE – • ELECTRNC (shear or longitudinal)
ANGLE START – • SCAN PATT (starting angle for sector scan)
ANGLE STOP – • SCAN PATT (stopping angle for sector scan)
ANGLE STEP – • SCAN PATT (angular increment between steps)
First Element – • APERATURE (element where it begins)
APRERATURE SIZE – • (number of elements in the step)
CALC – • SCAN PATT (calculate delay laws – required with

changes in scan denition)

14

Pulser and Receiver Setup

Access the UT menu to set the Pulser and Receiver operation •
Pulser Voltage – PULSER
Pulser Width (in nanoseconds) – • PULSER

[(1/probe frequency) /2]
Receiver Frequency – • RECEIVER (includes lter settings)
Rectication – • RECEIVER (includes halfwave, fullwave, and RF)

15

Gate Position and Operating Modes

The instrument has two gates (A and B) which are congured by rst
pressing to access the UT menu:

Select Gate to be Positioned – • GATE POS
Gate Starting Point – • GATE POS
Gate Width – • GATE POS
Gate Threshold – • GATE POS
Time of Flight Calculation – • GATEMODE (TOF MODE to Peak or

Flank)
Gate Triggering Logic – • GATEMODE (A gate with positive logic

triggers when crossed, negative logic triggers when not crossed,
and also allows gate to be disabled)

Display or Hide Active Gate – • GATEMODE

16

Viewing Scans

With the phased array probe coupled to a test piece, there are various
ways to view the resulting scans and measured data.

Press to choose between A-Scan, Sector (or Linear) Scan, or both A
and Sector (or Linear Scan).

Press to access the DISPLAY menu and determine the measured
results displayed as follows :

Link the A and Sector (or Linear) Scans Vertical Size – • VIEW
then set ASCAN MODE to BUD (Beam Ultrasonic Depth)

Display Leg Lines – • DISPLAY then BACKGRND, COLOR LEG on.
Control the On-Screen Beam Cursor - press • two times then
Right Knob.

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Press • the LEG to change the number of displayed Legs (which

represent each pass of the ultrasound through the test piece).

Press • , UT, BASE, DISPLAY DELAY to adjust the Display Delay
Press • to set the Gain Increment Value -- The amount of gain

change with each click of the Gain Knob. Options include a user­dened gain step and a gain knob LOCK. Press and hold to
switch between analog and digital gain.

18

Viewing Measured Results

To determine which measured results are displayed, press to
access the DISPLAY menu

Set Readings in Each of the Four Small Boxes – • RESULTS1
Set Readings in the Large Box – • RESULTS2

CHOICES INCLUDE:

BEAM— Angular position of the Beam Cursor
P%A/B— Peak amp. of all beams in scan currently captured by

Gate A or B(as a % of FSH)
PSA/B— Soundpath distance of peak beams in scan currently
captured by Gate A or B
PPA/B— Projection distance of all beams in scan currently
captured by Gate A or B

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PDA/B— Material depth of all beams in scan currently captured by
Gate A or B.
PZA/B— Minimum material depth (incorrected according to
material thickness) of all beams in scan currently captured
by Gate A or B
A%A/B— Amplitude (as a % of full-screen height) of the highest echo
to cross A-Gate or B-Gate in the beam selected by the
beam cursor.
SA/SB— Sound-Path distance or duration represented by the highest
echo to cross a Gate in the beam selected by the cursor.

SBA— Useful for calibration of the material velocity.
PA/PB Projection distance according to the origin (front of the

wedge if “Probe/Origin Offset”= 0 from the probe’s index

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point (PIP) to the reflector represented by the A-Gate echo.

DA/B— Material-thickness depth from the testpiece surface,
volume corrected.
ZA— Depth from surface, angle corrected, without leg correction
according to material thickness.

OFF— No reading will be displayed in the reading box.

21

Zero Oset

If origin offset = 0, measurement are done from the front wedge

Top

Top

Backwall

P (for origin offset = 0)

D

Z

D

S

Volume
Corrected

Angle
Corrected

22

<>Zero Oset

If origin offset is less than or greater than zero:

Top

Top

Backwall

Origin offset

P<0

P>0

D

Z

D

S

23

Freezing the Display

The displayed image and measured values can be frozen by pressing

. The freeze menu appears across the bottom of the display. Use

these features to manipulate or evaluate the frozen image.

CURSOR 1—Operate a horizontal cursor with the Gain Knob and a
Vertical or Beam Cursor with the Function Knob. It also allows the user
to display an ORIGIN LINE corresponding to the WEDGE FRONT plus
ORIGIN OFFSET (if any) distances to represent the user-dened

target location.

CURSOR 2—Operate a second (color coded) horizontal cursor with the
Gain Knob and a Vertical or Beam Cursor with the Function Knob. This
menu also allows the user to display an ORIGIN LINE corresponding to
the WEDGE FRONT plus ORIGIN OFFSET (if any)

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MEAS 1—Select up to four READING options that correspond to the
point dened by the intersection of CURSOR 1’s horizontal and vertical

components.

MEAS 2—Select up to four READING options that correspond to the
intersecting point dened by the intersection of CURSOR 2’s horizontal

and vertical components.

RESULTS1—Display the four READINGS that were operational prior to
freezing the display.

OFFLN DB—Change the Gain that’s applied to the frozen display.
FILENAME—Launch the data set naming (or report generating)

process.

25

Working with Data Sets

Instrument settings and report contents can be stored in a data set
le. When recalled, instrument settings are automatically returned

to those found in the stored data set. Access the data set related

functions by pressing to activate the FILES menu. A new Data Set is
created as follows:

Press • next to ACTION until STORE DATASET appears.
Press • twice next to FILENAME. Use the two knobs and the

instrument’s text-entry feature to input the new data set’s name.

Press • next to SOURCE/DEST until the desired le-saving desti-
nation appears.

INT MEMORY – A limited number of data sets can be stored in the •

instrument

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SD CARD – Primary destination for data sets •
DIALOG PROBE – Abbreviated data sets can be stored in dialog •
probes

With the desired data set name input, press • next to ENTER to
complete the data set creation process.

An existing Data Set is recalled, as follows:•

Press • next to ACTION until RECALL DATASET appears.
Press • next to SOURCE/DEST until the le’s current location

appears.
Press • next to FILENAME. Turn the Function Knob until the

desired data set is listed.
Press • next to ENTER to recall the data set, automatically

setting the instrument’s parameters to the stored conguration.

27

Working with Data Sets

Instrument settings and report contents can be stored in a data set
le. Stored data sets can be deleted or edited. Access the data set
related functions by pressing to activate the FILES menu.
An existing Data Set is deleted as follows (refer to Card 2 for help in
making adjustments):

Press • next to ACTION until CLEAR DATASET appears.
Press • next to SOURCE/DEST until the le’s current location

appears.
Press • next to FILENAME. Turn the Function Knob until the

desired data set is listed.
Press • next to ENTER to delete the data set, press when

indicated to conrm the deletion. Data sets can not be recovered.

28

An existing and active Data Set is edited, as follows:

With the data set active, change instrument settings as desired.

Press • next to ACTION until STORE DATASET appears.
Press • next to SOURCE/DEST until the current data set’s

storage location appears.
Make no changes to the name of the active data set. Press •

next to ENTER to complete the data set saving process. The
existing data set will be overwritten with the modied version.

29

Generating Reports

Reports can be generated and stored on the instrument’s SD card.

These reports can contain various user-selected components includ­ing instrument settings, displayed image, report header, and memo.

Reports are generated in much the same way as a data set le (refer
to Card 2 for help in making adjustments):

Press • to access the FILES menu.
Press • below HEADER, MEMO, or REPORT to determine the

report’s contents. Press next to EDIT, then turn the knobs to
input header or memo text. Make the following settings:

HDR IN REPORT – Set to YES to include a header
MEMO IN REPORT – Set to YES to include a ve-line memo
PARMS IN REPORT – Set to YES to include a listing of settings

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IMAGE IN REPORT – Set to YES to include display image

Press • next to ACTION until STORE REPORT appears.
Press • twice next to FILENAME. Use the two knobs and the

instrument’s text-entry feature to input the new report’s name.
Press • next to SOURCE/DEST until the SD CARD destination ap-

pears. Reports can only be stored on SD cards.
With the desired data set name input, press • next to ENTER to

complete the data set creation process. The SD card display icon
will flash.

Pressing and holding • for three seconds will automatically
store a report.

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Contact Us

USA

GE Inspection Technologies
50 Industrial Park Rd.

Lewistown, PA 17044

T: 717.242.0327

F: 717.242.2606

Germany

GE Inspection Technologies

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T: +49.2233.601.111

F: +49.2233.601.555

France

GE Inspection Technologies

68 chemin des Ormeaux
F-69760 Limonest

T: +33.472.179.216

F: +33.472.179.254

China

GE Inspection Technologies

5F, Hongcao Building

421 Hongcao Road
Shanghai 200233, China
T: +86.21.3414.4620

F: +86.21.6485.7191

Japan

Medie Corp Bldg.8
2-4-14 Kichijoji-honcho,

Musashino-shi,
Tokyo 180-0004 Japan
T: +81.422.67.7067

F: +81.422.67.7068

UK & Ireland

GE Inspection Technologies
892 Charter Avenue

Canley Coventry CV4 8AF

T: +44.2476.47.25.63

F: +44.2476.46.80.15