GE Krautkramer USM 35X Operator's Manual

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Page 1

Krautkramer USM 35X Issue 01, 04/2005 0-1

Contents

1 Introduction ........................................ 1-1

1.1 Safety information ..................................... 1-2

Batteries ...................................................... 1-2

Software ...................................................... 1-2

Defects/errors and exceptional stresses ..... 1-3

1.2 Important information on

ultrasonic testing ...................................... 1-3

Preconditions for testing with

ultrasonic test equipment ............................ 1-3

Operator training .......................................... 1-4

Technical test requirements ........................ 1-4

Limits of testing .......................................... 1-5

Ultrasonic wall thickness measurement ...... 1-5

Effect of the test object’s material .............. 1-5

Effect of temperature variations .................. 1-6

Measurement of remaining wall

thickness .................................................... 1-6

Ultrasonic evaluation of flaws ..................... 1-6

Flaw boundary method ................................ 1-6

Echo display comparison method ............... 1-7

1.3 The USM 35X family .................................. 1-8

The different instrument versions ................ 1-8

Special features .......................................... 1-9

1.4 How to use this manual .......................... 1-10

1.5 Layout and presentation in this

manual ..................................................... 1-11

Attention and Note symbols ...................... 1-11

Listings ..................................................... 1-11

Operating steps ......................................... 1-11

2 Standard package and

accessories ........................................ 2-1

2.1 Standard package ..................................... 2-3

2.2 Recommended accessories ..................... 2-5

Contents

1 Introduction ........................................ 1-1

1.1 Safety information ..................................... 1-2

Batteries ...................................................... 1-2

Software ...................................................... 1-2

Defects/errors and exceptional stresses ..... 1-3

1.3 The USM 35X family .................................. 1-8

The different instrument versions ................ 1-8

Special features .......................................... 1-9

1.4 How to use this manual .......................... 1-10

1.5 Layout and presentation in this

manual ..................................................... 1-11

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0-2 Issue 01, 04/2005 Krautkramer USM 35X

Contents

3 Initial start-up ...................................... 3-1

3.1 Power supply ............................................. 3-2

Operation using the power supply unit ........ 3-2

Operation using batteries ............................ 3-3

Charging the batteries ................................. 3-5

3.2 Connecting a probe .................................. 3-7

3.3 Starting the USM 35X ................................ 3-8

Switching on ................................................ 3-8

Reset .......................................................... 3-8

Information lines in the startup screen ........ 3-8

4 Principles of operation ...................... 4-1

4.1 Operator’s controls ................................... 4-2

4.2 Screen display ........................................... 4-3

Functions on the display ............................. 4-4

Other displays ............................................. 4-5

4.3 Keys and rotary knobs .............................. 4-6

Function keys ............................................. 4-6

On/Off key .................................................. 4-6

Special keys ............................................... 4-7

Rotary knobs ............................................... 4-8

4.4 Operational concept .................................. 4-8

Setting the functions ................................... 4-9

4.5 Important basic settings ......................... 4-10

Selecting the language .............................. 4-10

Selecting units .......................................... 4-11

Setting the date ......................................... 4-12

Setting the time ......................................... 4-13

4.6 Basic settings of the display .................. 4-14

Selecting the color scheme ....................... 4-14

Setting the lighting .................................... 4-14

Contents

3 Initial start-up ...................................... 3-1

3.1 Power supply ............................................. 3-2

Operation using the power supply unit ........ 3-2

Operation using batteries ............................ 3-3

Charging the batteries ................................. 3-5

4.3 Keys and rotary knobs .............................. 4-6

Function keys ............................................. 4-6

On/Off key .................................................. 4-6

Special keys ............................................... 4-7

Rotary knobs ............................................... 4-8

4.4 Operational concept .................................. 4-8

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Contents

5 Operation ............................................ 5-1

5.1 Overview of the functions ......................... 5-2

Function groups first operating level ........... 5-3

Function groups second operating level ...... 5-3

Function groups third operating level .......... 5-4

5.2 Setting the gain ......................................... 5-5

Defining the dB incrementation for gain ...... 5-5

5.3 Adjusting the display range

(function group BASE) .............................. 5-6

RANGE (Display range) .............................. 5-6

MTLVEL (Sound velocity) ........................... 5-7

D-DELAY (Display starting point) ................ 5-7

P-DELAY (Probe delay)............................... 5-8

5.4 Adjusting the pulser

(function group PULS) .............................. 5-9

DAMPING (Probe matching) ....................... 5-9

POWER (Intensity) ................................... 5-10

DUAL (Pulser-receiver separation) ............ 5-10

PRF-MOD (Pulse repetition frequency) ..... 5-11

5.5 Adjusting the receiver

(function group RECV) ............................ 5-11

FINE G (Fine adjustment of gain) ............. 5-12

dBSTEP .................................................... 5-12

REJECT .................................................... 5-12

FREQU (Frequency range) ........................ 5-13

RECTIFY (Rectification) ............................ 5-13

5.6 Setting the gates

(function groups aGAT and bGAT) ......... 5-14

Tasks of the gates..................................... 5-14

aLOGIC/bLOGIC (Evaluation logic of

the gates) .................................................. 5-15

aSTART/bSTART (Starting points of

the gates) .................................................. 5-16

aWIDTH/bWIDTH (Width of the gates) ...... 5-16

aTHRSH/bTHRSH (Response and

measurement threshold of the gates) ........ 5-16

Contents

5 Operation ............................................ 5-1

5.1 Overview of the functions ......................... 5-2

Function groups first operating level ........... 5-3

Function groups second operating level ...... 5-3

Function groups third operating level .......... 5-4

5.5 Adjusting the receiver

(function group RECV) ............................ 5-11

FINE G (Fine adjustment of gain) ............. 5-12

dBSTEP .................................................... 5-12

REJECT .................................................... 5-12

FREQU (Frequency range) ........................ 5-13

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0-4 Issue 01, 04/2005 Krautkramer USM 35X

Contents

5.7 Calibrating the USM 35X......................... 5-17

Calibrating the display range ..................... 5-17

Choosing the measuring point ................... 5-17

Calibration with straight- and

angle-beam probes .................................... 5-18

Calibration with dual-element (TR)

probes ....................................................... 5-21

5.8 Measuring ................................................ 5-23

General notes ............................................ 5-23

5.9 Measurement of dB difference

(function group REF) .............................. 5-25

Recording a reference echo ...................... 5-26

Deleting a reference echo ......................... 5-26

Echo comparison ...................................... 5-27

5.10 Classification of welds

(function group AWS) .............................. 5-28

Rating of welds according to AWS ............ 5-28

5.11 Calculation of flaw position

(function group TRIG) ............................. 5-31

ANGLE (Angle of incidence) ................... 5-32

X-VALUE (X-value of the probe)................ 5-32

COLOR ..................................................... 5-33

THICKNE (Material thickness) .................. 5-33

DIAMET (Outside diameter of the test

object) ....................................................... 5-33

5.12 Data saving

(function group MEM) ............................. 5-34

Storing a data set ...................................... 5-35

Deleting a data set .................................... 5-35

Deleting all data set .................................. 5-36

Recalling a stored data set ....................... 5-36

5.13 Dataset management

(function group DATA) ............................. 5-38

TESTINF (Storing additional

information) ............................................... 5-39

PREVIEW (Dataset preview) .................... 5-41

DIR (Dataset directory) ............................. 5-42

SETTING (Function list)............................ 5-42

Contents

5.7 Calibrating the USM 35X......................... 5-17

Calibrating the display range ..................... 5-17

Choosing the measuring point ................... 5-17

Calibration with straight- and

angle-beam probes .................................... 5-18

Calibration with dual-element (TR)

probes ....................................................... 5-21

ANGLE (Angle of incidence) ................... 5-32

X-VALUE (X-value of the probe)................ 5-32

COLOR ..................................................... 5-33

THICKNE (Material thickness) .................. 5-33

DIAMET (Outside diameter of the test

object) ....................................................... 5-33

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Contents

5.14 Configuring the USM 35X for a test

application ............................................... 5-43

TOF (Selecting the measuring point) ......... 5-44

S-DISP (Zoomed display of reading) ......... 5-46

MAGNIFY (Gate spreading) ...................... 5-48

A-Scan (Setting the A-scan) ..................... 5-48

Configuring the measurement line ............. 5-49

Setting the display .................................... 5-50

FILLED (Echo display mode) .................... 5-51

VGA .......................................................... 5-51

SCHEME .................................................. 5-51

LIGHT (LCD backlight) .............................. 5-52

SCALE (Configuring the measurement

line) ........................................................... 5-52

5.15 General configuration ............................. 5-53

DIALOG (Selecting the language) ............. 5-53

UNIT (Selecting units of measurement) .... 5-54

BAUD-R (Baud rate for transmission) ........ 5-55

PRINTER (Printer for test report) .............. 5-55

COPYMOD (Assignment of the

key) ... 5-55

TIME/DATE (Setting the time and date) .... 5-56

ANAMOD .................................................. 5-57

HORN ........................................................ 5-58

EVAMOD (Echo evaluation) ...................... 5-58

5.16 Other functions with special keys .......... 5-59

Freeze ....................................................... 5-59

Zooming the echo display ......................... 5-59

The key ............................................... 5-59

5.17 Status symbols and LEDs ...................... 5-60

Status symbols ......................................... 5-60

LEDs ......................................................... 5-60

5.18 Distance-amplitude curve

(only USM 35X DAC and USM 35S) ........ 5-61

DACMOD (Activating DAC/TCG) ............... 5-62

DACECHO (Recording reference curve) .... 5-63

T-CORR (Sensitivity correction) ................ 5-64

OFFSET (Distance of multiple DAC) ......... 5-65

Echo evaluation with DAC ......................... 5-65

Contents

5.14 Configuring the USM 35X for a test

application ............................................... 5-43

TOF (Selecting the measuring point) ......... 5-44

S-DISP (Zoomed display of reading) ......... 5-46

MAGNIFY (Gate spreading) ...................... 5-48

A-Scan (Setting the A-scan) ..................... 5-48

TIME/DATE (Setting the time and date) .... 5-56

ANAMOD .................................................. 5-57

HORN ........................................................ 5-58

EVAMOD (Echo evaluation) ...................... 5-58

5.16 Other functions with special keys .......... 5-59

Freeze ....................................................... 5-59

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0-6 Issue 01, 04/2005 Krautkramer USM 35X

Contents

5.19 Distance-amplitude curve according to JIS Z3060-2002 (only USM 35X DAC

and USM 35S) .......................................... 5-66

DACMOD (Activating DAC according

to JIS) ....................................................... 5-67

DACECHO (Recording reference curve) .... 5-68

BOLDLI (Choice of a registration curve).... 5-70

T-CORR (Sensitivity correction) ................ 5-70

OFFSET (Distance of multiple DAC) ......... 5-70

Echo evaluation with DAC ......................... 5-71

5.20 Evaluation according to the DGS

method (only USM 35X S) ...................... 5-71

Measuring with DGS ................................. 5-71

Selecting the DGS mode .......................... 5-73

Default settings for the DGS

measurement ............................................ 5-73

Recording the reference echo and

displaying the DGS curve ......................... 5-75

Evaluation of reflectors ............................. 5-76

Transfer correction..................................... 5-78

Sound attenuation ..................................... 5-78

Locks, error messages ............................. 5-81

Validity of the DGS method ....................... 5-81

6 Documentation .................................. 6-1

6.1 Printing data .............................................. 6-2

Preparing the printer .................................... 6-2

Preparing the USM 35X .............................. 6-2

Printing ........................................................ 6-3

6.2 Documentation with UltraDOC ................. 6-4

7 Maintenance and care ....................... 7-1

7.1 Care of the instrument .............................. 7-2

7.2 Care of the batteries .................................. 7-3

Care of the batteries.................................... 7-3

Charging the batteries ................................. 7-3

How to handle alkaline batteries.................. 7-4

7.3 Maintenance .............................................. 7-5

Contents

5.19 Distance-amplitude curve according to JIS Z3060-2002 (only USM 35X DAC

and USM 35S) .......................................... 5-66

DACMOD (Activating DAC according

to JIS) ....................................................... 5-67

DACECHO (Recording reference curve) .... 5-68

BOLDLI (Choice of a registration curve).... 5-70

Locks, error messages ............................. 5-81

Validity of the DGS method ....................... 5-81

6 Documentation .................................. 6-1

6.1 Printing data .............................................. 6-2

Preparing the printer .................................... 6-2

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Krautkramer USM 35X Issue 01, 04/2005 0-7

Contents

7.4 Recycling ................................................... 7-6

General view of the device .......................... 7-6

Materials for separate disposal ................... 7-8

Further materials and components ........... 7-10

Recycling data of master device ............... 7-12

8 Interfaces and peripherals ................ 8-1

8.1 Interfaces ................................................... 8-2

8.2 I/O interface ............................................... 8-4

Contact assignment of the

LEMO-1-B socket ....................................... 8-5

8.3 RS 232 interface ........................................ 8-6

Contact assignment of the Sub-D socket ... 8-6

8.4 RGB interface ............................................. 8-7

8.5 Data exchange ........................................... 8-8

Connecting a printer or a PC ....................... 8-8

Activation of serial communication ............. 8-8

Printing data ................................................ 8-9

Technical Specifications according to EN 12668-1

8.6 Remote control .......................................... 8-9

Syntax and timing ..................................... 8-11

Functions and remote control codes ......... 8-17

Other remote control codes ....................... 8-24

Control codes for the rotary knobs/

function keys ............................................ 8-26

9 Appendix ............................................ 9-1

9.1 Function directory ..................................... 9-2

9.2 EC declaration of conformity ................... 9-7

9.3 Manufacturer/Service addresses .............. 9-8

9.4 Spare parts list ........................................ 9-10

10 Changes ........................................... 10-1

11 Index ................................................. 11-1

Contents

7.4 Recycling ................................................... 7-6

General view of the device .......................... 7-6

Materials for separate disposal ................... 7-8

Further materials and components ........... 7-10

Recycling data of master device ............... 7-12

8.6 Remote control .......................................... 8-9

Syntax and timing ..................................... 8-11

Functions and remote control codes ......... 8-17

Other remote control codes ....................... 8-24

Control codes for the rotary knobs/

function keys ............................................ 8-26

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0-8 Issue 01, 04/2005 Krautkramer USM 35X

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Krautkramer USM 35X Issue 01, 04/2005 1-1

Introduction 1

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1-2 Issue 01, 04/2005 Krautkramer USM 35X

Introduction Safety information

1.1 Safety information

The USM 35X has been designed and tested according to DIN EN 61 010 Part 1, 2002, Safety requirements for electrical measuring, control and lab equipment, and was technically in perfectly safe and faultless condition when leaving the manufacturing works.

In order to maintain this condition and to ensure a safe operation, you should urgently read the following safety information before putting the instrument into operation.

A Attention:

The USM 35X is an instrument for materials testing. Any use for medical applications or other purposes is not allowed!

The USM 35X may only be used in industrial environments!

The USM 35X is waterproof according to IP 66. The USM 35X can be operated with batteries or a power supply unit.

The power supply unit has the electrical safety class II.

Batteries

For the battery operation of the USM 35X, we recommend the use of a lithium-ion battery. The operation using alkaline batteries, NiMH or NiCad cells is likewise possible. You should only use the products recommended by us for the battery operation.

You can charge the lithium-ion battery within the instrument itself or in an external battery charger. If you want to use NiMH or NiCad cells, you have to charge them in an external battery charger.

As soon as you connect the power supply unit to the USM 35X, the battery power supply is interrupted. If a lithium-ion battery is inserted, the charging process starts automatically when you connect the instrument to the mains supply. Please refer to chapter 3.1 on power supply, and to chapter 7 on how to handle batteries.

Software

According to the current state of the art, software is never completely free from errors. Before using any software-controlled test equipment, please make sure

Introduction Safety information

1.1 Safety information

Batteries

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Krautkramer USM 35X Issue 01, 04/2005 1-3

IntroductionSafety information

that the required functions operate perfectly in the intended combination.

If you have any questions about the use of your test equipment, please contact your nearest representative of GE Inspection Technologies.

Defects/errors and exceptional stresses

If you have reason to believe that a safe operation of your USM 35X is no longer possible, you have to disconnect the instrument and secure it against unintentional reconnection. Remove the batteries if necessary.

A safe operation is e.g. no longer possible

• if the instrument shows visible damages,

• if the instrument no longer operates perfectly,

• after prolonged storage under adverse conditions (e.g. exceptional temperatures and/or especially high air humidity, or corrosive environmental conditions),

• after being subjected to heavy stresses during transportation.

1.2 Important information on ultrasonic testing

Please read the following information before using your USM 35X. It is important that you understand and observe this information to avoid any operator errors that might lead to false test results. This could result in personal injuries or damages to property.

Preconditions for testing with ultrasonic test equipment

This operating manual contains essential information on how to operate your test equipment. In addition, there are a number of factors which affect the test results. A description of these factors would go beyond the scope of an operating manual. The following list therefore only mentions the three most important conditions for a safe and reliable ultrasonic inspection:

• the operator training

• the knowledge of special technical test requirements

and limits

• the choice of appropriate test equipment.

IntroductionSafety information

that the required functions operate perfectly in the intended combination.

If you have any questions about the use of your test equipment, please contact your nearest representative of GE Inspection Technologies.

1.2 Important information on ultrasonic testing

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1-4 Issue 01, 04/2005 Krautkramer USM 35X

Introduction Important information on ultrasonic testing

Operator training

The operation of an ultrasonic test device requires a proper training in ultrasonic test methods.

A proper training comprises for example adequate knowledge of:

• the theory of sound propagation

• the effects of sound velocity in the test material

• the behavior of the sound wave at interfaces between different materials

• the propagation of the sound beam

• the influence of sound attenuation in the test object and the influence of surface quality of the test object.

Lack of such knowledge could lead to false test results with unforeseeable consequences. You can contact for example NDT societies or organizations in your country (DGZfP in Germany; ASNT in the USA), or also GE Inspection Technologies, for information concerning existing possibilities for the training of ultrasonic inspectors as well as on the qualifications and certificates that can finally be obtained.

Technical test requirements

Every ultrasonic test is subject to specific technical test requirements. The most important ones are:

• the definition of the scope of inspection

• the choice of the appropriate test method

• the consideration of material properties

• the determination of limits for recording and evaluation.

It is the task of those with overall responsibility for testing to ensure that the inspector is fully informed about these requirements. The best basis for such information is experience with identical test objects. It is also essential that the relevant test specifications be clearly and completely understood by the inspector.

GE Inspection Technologies regularly holds specialized training courses in the field of ultrasonic testing. The scheduled dates for these courses will be given to you on request.

Introduction Important information on ultrasonic testing

Operator training

The operation of an ultrasonic test device requires a proper training in ultrasonic test methods.

A proper training comprises for example adequate knowledge of:

• the theory of sound propagation

Technical test requirements

Every ultrasonic test is subject to specific technical test requirements. The most important ones are:

• the definition of the scope of inspection

• the choice of the appropriate test method

• the consideration of material properties

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Krautkramer USM 35X Issue 01, 04/2005 1-5

IntroductionImportant information on ultrasonic testing

Limits of testing

The information obtained from ultrasonic tests only refers to those parts of the test object which are covered by the sound beam of the probe used.

Any conclusions from the tested parts to be applied to the untested parts of the test object should be made with extreme caution.

Such conclusions are generally only possible in cases where extensive experience and proven methods of statistical data acquisition are available.

The sound beam can be completely reflected from boundary surfaces within the test object so that flaws and reflection points lying deeper remain undetected. It is therefore important to make sure that all areas to be tested in the test object are covered by the sound beam.

Ultrasonic wall thickness measurement

All ultrasonic wall thickness measurements are based on a time-of-flight measurement. Accurate measurement results require a constant sound velocity in the test object. In test objects made of steel, even with

varying alloying constituents, this condition is mostly fulfilled. The variation in sound velocity is so slight that it is only of importance for high-precision measurements. In other materials, e.g. nonferrous metals or plastics, the sound velocity variations may be even larger and thus affect the measuring accuracy.

Effect of the test object’s material

If the test object’s material is not homogeneous, the sound may propagate at different sound velocities in different parts of the test objects. An average sound velocity should then be taken into account for the range calibration. This is achieved by means of a reference block whose sound velocity corresponds to the average sound velocity of the test object.

If substantial sound velocity variations are to be expected, then the instrument calibration should be readjusted to the actual sound velocity values at shorter time intervals. Failure to do so may lead to false thickness readings.

IntroductionImportant information on ultrasonic testing

Limits of testing

The information obtained from ultrasonic tests only refers to those parts of the test object which are covered by the sound beam of the probe used.

Any conclusions from the tested parts to be applied to the untested parts of the test object should be made

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1-6 Issue 01, 04/2005 Krautkramer USM 35X

Introduction Important information on ultrasonic testing

Effect of temperature variations

The sound velocity within the test object also varies as a function of the material’s temperature. This can cause appreciable errors in measurements if the instrument has been calibrated on a cold reference block and is then used on a warm or hot test object. Such measurement errors can be avoided either by warming the reference block to the same temperature before calibrating, or by using a correction factor obtained from tables.

Measurement of remaining wall thickness

The measurement of the remaining wall thickness on plant components, e.g. pipes, tanks and reaction vessels of all types which are corroded or eroded from the inside, requires a perfectly suitable gauge and special care in handling the probe.

The inspectors should always be informed about the corresponding nominal wall thicknesses and the likely amount of wall thickness losses.

Ultrasonic evaluation of flaws

In present-day test practice, there are basically two different methods of flaw evaluation:

If the diameter of the sound beam is smaller than the extent of the flaw, then the beam can be used to explore the boundaries of the flaw and thus determine its area.

If, however, the diameter of the sound beam is larger than the size of the flaw, the maximum echo response from the flaw must be compared with the maximum echo response from an artificial flaw provided for comparison purposes.

Flaw boundary method

The smaller the diameter of the probe’s sound beam, the more accurately the boundaries (and therefore the flaw area) can be determined by the flaw boundary method. If, however, the sound beam is relatively broad, the flaw area determined can substantially differ from the actual flaw area. Care should therefore be taken to select a probe which will give a sufficiently narrow beam at the position of the flaw.

Introduction Important information on ultrasonic testing

Effect of temperature variations

Ultrasonic evaluation of flaws

In present-day test practice, there are basically two different methods of flaw evaluation:

If the diameter of the sound beam is smaller than the extent of the flaw, then the beam can be used to explore the boundaries of the flaw and thus determine its

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IntroductionImportant information on ultrasonic testing

Echo display comparison method

The echo from a small, natural flaw is usually smaller than the echo from an artificial comparison flaw, e.g. circular disc flaw of the same size. This is due, for instance, to the roughness of the surface of a natural flaw, or to the fact that the beam does not impinge on it at right angles.

If this fact is not taken into account when evaluating natural flaws, there is a danger of underestimating their magnitude.

In the case of very jagged or fissured flaws, e.g. shrink holes in castings, it may be that the sound scattering occurring at the boundary surface of the flaw is so strong that no echo at all is produced. In such cases, a different evaluation method should be chosen, e.g. use of the backwall echo attenuation in the evaluation.

The distance sensitivity of the flaw echo plays an important part when testing large components. Attention should be paid here to choosing artificial comparison flaws which are as far as possible governed by the same ”distance laws” as the natural flaws to be evaluated.

The ultrasonic wave is attenuated in any material. This sound attenuation is very low, e.g. in parts made of fine-grained steel, likewise in many small parts made of other materials. However, if the sound wave travels larger distances through the material, a high cumulative sound attenuation can result even with small attenuation coefficients. There is then a danger that echoes from natural flaws appear too small. For this reason, an estimate must always be made of the effects of attenuation on the evaluation result and taken into account if applicable.

If the test object has a rough surface, part of the incident sound energy will be scattered at its surface and is not available for the test. The larger this initial scattering, the smaller the flaw echoes appear, and the more errors occur in the evaluation result.

It is therefore important to take the effect of the test object’s surfaces on the height of the echo into account (transfer correction).

IntroductionImportant information on ultrasonic testing

Echo display comparison method

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Introduction The USM 35X family

1.3 The USM 35X family

The USM 35X is a lightweight and compact ultrasonic flaw detector especially suitable for

• locating and evaluating material defects,

• measuring wall thicknesses,

• saving and documenting test results.

With its frequency range from 0.5 to 20 MHz and a maximum calibration range of 10 m (steel), the USM 35X is designed for use on large workpieces and in highresolution measurements.

The different instrument versions

The USM 35X is available in several versions which are desgined for different applications:

• USM 35X Standard version for universal ultrasonic test applications.

• USM 35X DAC The multiple DAC curves and time-corrected gain enable a field-oriented echo amplitude evaluation according to almost all international test specifications.

• USM 35X S DGS evaluation mode in addition to multiple DAC curves and TCG. DGS curves are stored for all narrow-band singleelement probes; amplitude evaluation is carried out either in dB above DAC curve or equivalent reflector size (ERS).

• Data Logger option

This option is available for all USM 35X versions and is used for the recording and documentation of thickness readings.

Introduction The USM 35X family

1.3 The USM 35X family

The USM 35X is a lightweight and compact ultrasonic flaw detector especially suitable for

• locating and evaluating material defects,

• measuring wall thicknesses,

The different instrument versions

The USM 35X is available in several versions which are desgined for different applications:

• USM 35X Standard version for universal ultrasonic test applications.

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IntroductionThe USM 35X family

Special features

• low weight (2.2 kg including lithium-ion battery) and compact size

• waterproof instrument case with protection class IP 66

• long operating time (> 12 hours) by means of lithiumion battery with internal and external charging possibility

• handy – equipped with a non-slip, ratcheting prop-up stand, also used as handle

• rotary knobs for direct adjustment of gain as well as for changing the currently selected function

• two independant gates for accurate wall thickness measurements from the workpiece surface up to the first echo, or between two backwall echoes, including measurement on coated workpieces with a resolution of 0.01 mm (up to 100 mm), referred to steel

• magnify gate: spreading of the gate range over the entire screen width

• 5.7", 1/4 VGA-TFT color display to display the digitized signals (320 × 240 pixels, 115 × 86 mm )

• VGA interface for the connection of an external monitor

• color display of gates for an easier distinction

• easily recognizable reflection geometry when using angle-beam probes by the variation of A-scan or background color at every deflection point

• data memory: 800 data sets, including alphanumeric description, documentation possibility via a printer

• increased calibration range: up to 9999 mm (steel), depending on the frequency range

• semiautomatic two point calibration

• pulse repetition frequency variable in ten steps to avoid phantom echoes when testing large workpieces

• choice of frequency range for the connected probe

• signal display mode: full-wave rectification, positive half-wave or negative halv-wave and radio frequency

• display of 4 readings plus 1 reading zoomed in the A-scan, user-configurable

IntroductionThe USM 35X family

Special features

• low weight (2.2 kg including lithium-ion battery) and compact size

• waterproof instrument case with protection class IP 66

• long operating time (> 12 hours) by means of lithium-

• VGA interface for the connection of an external monitor

• color display of gates for an easier distinction

• easily recognizable reflection geometry when using angle-beam probes by the variation of A-scan or background color at every deflection point

• data memory: 800 data sets, including alphanumeric

Page 18

1-10 Issue 01, 04/2005 Krautkramer USM 35X

Introduction How to use this manual

1.4 How to use this manual

The present operating manual applies to all instrument versions of the USM 35X. Differences in the functions or setting values are always marked.

Before operating the USM 35X for the first time, it is absolutely necessary that you read the chapters 1, 3 and 4 of this manual. They will inform you about the necessary preparations of the instrument, give you a description of all keys and screen displays, and explain the operating principle.

In doing this, you will avoid any errors or failures of the instrument and be able to use the full range of instrument functions.

You will find the latest changes to this operating manual in chapter 10

Changes

. It describes corrections that have become necessary at short notice and have not yet been included in the general manual. If no corrections have become necessary, this chapter is empty.

The specifications/Technical Specifications according to EN 12668-1 for the USM 35X family can be found in the attachment at the end of this operating manual.

The Data Logger option, which can be applied to all USM 35X versions, is described in a chapter of its own – at the end of the operating manual. All functions referring to the Data Logger and the tolerance monitor are described here. At the same time, the standard operating manual applies to all other functions.

Introduction How to use this manual

1.4 How to use this manual

The present operating manual applies to all instrument versions of the USM 35X. Differences in the functions or setting values are always marked.

Before operating the USM 35X for the first time, it is

The specifications/Technical Specifications according to EN 12668-1 for the USM 35X family can be found in the attachment at the end of this operating manual.

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Krautkramer USM 35X Issue 01, 04/2005 1-11

IntroductionLayout and presentation in this manual

1.5 Layout and presentation in this manual

To make it easier for you to use this manual, all operating steps, notes, etc., are always presented in the same way. This will help you find individual pieces of information quickly.

Attention and Note symbols

A Attention:

The Attention symbol indicates peculiarities and special aspects in the operation which could affect the accuracy of the results.

H Note:

Note contains e.g. references to other chapters or spe-

cial recommendations for a function.

Listings

Listings are presented in the following form:

• Variant A

• Variant B

• ...

Operating steps

Operating steps appear as shown in the following example:

– Loosen the two screws at the bottom.

– Remove the cover.

– ...

IntroductionLayout and presentation in this manual

1.5 Layout and presentation in this manual

To make it easier for you to use this manual, all operating steps, notes, etc., are always presented in the same way. This will help you find individual pieces of information quickly.

Listings

Listings are presented in the following form:

• Variant A

• Variant B

• ...

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1-12 Issue 01, 04/2005 Krautkramer USM 35X

Page 21

Krautkramer USM 35X Issue 01, 04/2005 2-1

Standard package and accessories 2

Page 22

2-2 Issue 01, 04/2005 Krautkramer USM 35X

Standard package and accessories

This chapter informs you about the standard package and the accessories available for the USM 35X.

It describes

• accessories included in the standard package,

• recommended accessories.

Standard package and accessories

This chapter informs you about the standard package and the accessories available for the USM 35X.

It describes

• accessories included in the standard package,

• recommended accessories.

Page 23

Krautkramer USM 35X Issue 01, 04/2005 2-3

Standard package and accessories

2.1 Standard package

Product code Description Order number

Ultrasonic testing kit

consisting of:

USM 35X Compact Ultrasonic Flaw Detector, basic version

with LEMO-1-TRIAX connectors 36 060 or with BNC connectors 36 061

USM 35X DAC Compact Ultrasonic Flaw Detector, DAC version

with LEMO-1-TRIAX connectors 36 062 or with BNC connectors 36 063

USM 35X S Compact Ultrasonic Flaw Detector, DAC/TCG and

DGS evaluation with LEMO-1-TRIAX connectors 36 064 or with BNC connectors 36 065

Standard package

Standard package and accessories

2.1 Standard package

Product code Description Order number

Ultrasonic testing kit

consisting of:

USM 35X Compact Ultrasonic Flaw Detector, basic version

Standard package

Page 24

2-4 Issue 01, 04/2005 Krautkramer USM 35X

Standard package and accessories Standard package

Product code Description Order number

UM 30 Transport case 35 654

AC power supply/battery charger 102 163

Operating manual in English 48 001

Standard package and accessories Standard package

Product code Description Order number

UM 30 Transport case 35 654

AC power supply/battery charger 102 163

Operating manual in English 48 001

Page 25

Krautkramer USM 35X Issue 01, 04/2005 2-5

Standard package and accessoriesRecommended accessories

2.2 Recommended accessories

Product code Description Order number

Operating manual in German 48 002

Operating manual in French 48 003

Operating manual in Spanish 48 004

Operating manual in Japanese 48 005

Operating manual in Chinese 48 006

LI-ION Li-Ion battery NI2020, 10.8 V, 6.6 Ah 102 208

DR36 Battery charger for external charging

of the Li-Ion battery 35 297

NCA 1-6 6 NiCd cells, 3 Ah (alternatively to Li-Ion) 25 810

Energy 16 Desk rapid charger for external charging

of NiMH or NiCd cells 101 729

UM 32 Protection bag including neck strap 35 655

UD 20 PC cable, 25-pin (PC), 9-pin (instrument) 32 291

Standard package and accessoriesRecommended accessories

2.2 Recommended accessories

Product code Description Order number

Operating manual in German 48 002

Operating manual in French 48 003

Page 26

2-6 Issue 01, 04/2005 Krautkramer USM 35X

Standard package and accessories

Product code Description Order number

UD 31 PC cable, 9-pin (PC), 9-pin (instrument) 34 943

UD 30 Seiko Printer cable, 9-pin (instrument)/9-pin (printer) 18 495

UD 32 Epson Printer cable, 9-pin (instrument)/25-pin (printer) 34 944

Adapter 25/9-pin for printer cable UD 19-1 on USM 35X 16 121

Serial-to-parallel printer cable (Patton Model 2029) 101 761

Adapter cable RS232 – USB 35 838

UM 25 Analog cable, 8-pin Lemo plug (instrument), open ended 35 268

UM 31 VGA adapter for connection of an external monitor 35 653

UM 28 D Option: Data Logger (retrofittable to all versions) 35 800

UM 200 W UltraDOC data communication software for USM 35 024

U 100 W UltraDOC 33 829

PZ-USM Calibration certificate according to EN 12668-1 35 263

Epson LX Matrix printer for mains operation, single sheet and

continuous stationary 17 995

Seiko DPU Thermal printer for mains and battery operation 17 993

Recommended accessories

Standard package and accessories

Product code Description Order number

UD 31 PC cable, 9-pin (PC), 9-pin (instrument) 34 943

UD 30 Seiko Printer cable, 9-pin (instrument)/9-pin (printer) 18 495

UD 32 Epson Printer cable, 9-pin (instrument)/25-pin (printer) 34 944

Recommended accessories

Page 27

Krautkramer USM 35X Issue 01, 04/2005 3-1

Initial start-up 3

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3-2 Issue 01, 04/2005 Krautkramer USM 35X

Initial start-up

Connecting the instrument

Connect the USM 35X to the mains socket-outlet using the corresponding power supply unit. The plug receptacle is at the top left of the USM 35X.

– Push the Lemo plug of the power supply unit into the

plug receptacle until it snaps into place with a clearly audible click.

Power supply

3.1 Power supply

The USM 35X can be operated with an external power pack adaptor or with batteries.

You can connect the USM 35X to the mains supply system even if it carries batteries. The battery power is then automatically interrupted.

Operation using the power supply unit

Mains connection

The power supply unit is delivered with two different power cables – for Euro and USA standard.

Initial start-up

Connecting the instrument

Connect the USM 35X to the mains socket-outlet using the corresponding power supply unit. The plug receptacle is at the top left of the USM 35X.

– Push the Lemo plug of the power supply unit into the

plug receptacle until it snaps into place with a clearly audible click.

Power supply

3.1 Power supply

The USM 35X can be operated with an external power pack adaptor or with batteries.

You can connect the USM 35X to the mains supply system even if it carries batteries. The battery power is

Page 29

Krautkramer USM 35X Issue 01, 04/2005 3-3

Initial start-upPower supply

– When pulling off the Lemo plug, withdraw the metal

bushing on the plug first in order to release the lock.

The power supply unit is automatically set to any nominal voltage between 90 VAC and 240 VAC.

Operation using batteries

Use either a lithium-ion battery or 6 standard C-cells (NiCad, NiMH, or alkaline cells) for the battery operation. We recommend the use of a lithium-ion battery. It has a higher capacity and consequently ensures a longer operating time of the instrument.

Inserting batteries

The battery compartment is situated at the instrument back; the lid is fastened with 2 attachment screws.

– Press the two attachment screws of the battery

compartment downward in order to loosen them.

– Lift the lid off upward. To the right in the open battery

compartment, you will see two springs and several connection pins.

– Insert the battery into the battery compartment. To

do this, first press the right side of the battery against the springs of the battery compartment. Make sure that the socket on the right side of the battery is connected with the connection pins in the battery compartment.

Initial start-upPower supply

– When pulling off the Lemo plug, withdraw the metal

bushing on the plug first in order to release the lock.

The power supply unit is automatically set to any nominal voltage between 90 VAC and 240 VAC.

Operation using batteries

– Lift the lid off upward. To the right in the open battery

compartment, you will see two springs and several connection pins.

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3-4 Issue 01, 04/2005 Krautkramer USM 35X

Initial start-up

– Insert the batteries into the battery compartment and

check the right polarity.

– Close the battery compartment and fasten the

attachment screws.

Checking the battery charge of lithium-ion batteries

The lithium-ion battery is equipped with a battery charge indicator. The battery charge indicator is situated at the front right of the battery. Four LEDs indicate the charge level of battery. Check the battery charge before inserting the battery into the instrument.

The number of LEDs that are on has the following meaning:

• 4 LEDs – battery charge 100 ... 76%

• 3 LEDs – battery charge 75 ... 51%

• 2 LEDs – battery charge 50 ... 26%

• 1 LED – battery charge 25 ... 10%

• 1 LED flashing – battery charge <10%

Power supply

Initial start-up

– Close the battery compartment and fasten the

attachment screws.

Checking the battery charge of lithium-ion batteries

The lithium-ion battery is equipped with a battery charge indicator. The battery charge indicator is situated at the front right of the battery. Four LEDs indicate the

Power supply

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Krautkramer USM 35X Issue 01, 04/2005 3-5

Initial start-up

– Press the button PUSH at the front side of the

battery. Four LEDs indicate the charge level of battery.

H Note:

You can also check the battery charge even if the battery is located in the battery compartment of the instrument.

Battery charge indicator

In the measurement line of the USM 35X, an inverted B appears if the battery charge is low.

Power supply

H Note:

If the icon for low battery charge appears, you should urgently close your test job and exchange the batteries. You should take replacement batteries with you if you aim to carry out measurements on site.

Charging the batteries

You can charge the lithium-ion battery either directly in the instrument or by means of an external battery charger. You always need an external battery charger to charge standard C-cells.

Internal charging

Requirement:

• Lithium-ion battery, order number 102 208

• Power supply/charger unit, order number 102 163

If a battery is located in the instrument, the charging process is started automatically when you connect the plug-in power supply unit. You can carry out ultrasonic inspections and charge a battery at the same time.

Initial start-up

Power supply

H Note:

Charging the batteries

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3-6 Issue 01, 04/2005 Krautkramer USM 35X

Initial start-up

The charging time is 10 hours with a simultaneous ultrasonic inspection. If the instrument is not being used for ultrasonic inspections, the charging time is 8 hours. This charging time applies to ambient temperatures from 25 to 30 °C. Please take into consideration that the batteries are not charged to their full capacity at higher temperatures.

The LED display on the plug-in power supply unit indicates the status of the charging process.

Power supply

green LED yellow LED red LED Status

off flashing off no battery detected

off flashing dark/bright flashing bright/dark charging at low power

off on off quick charging phase 1

flashing dark/bright flashing bright/dark off quick charging phase 2

on off off battery charged

off off flashing bright/dark temperature error, auto-reversible

off off on csharging error, permanent

External charging

Lithium-ion batteries can be charged by means of an external battery charger. We recommend the battery charger with the order number 35 297. To charge single NiCad or NiMH cells, you need the external desktop battery charger with the order number 101 729.

Initial start-up

Power supply

External charging

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Krautkramer USM 35X Issue 01, 04/2005 3-7

Initial start-up

3.2 Connecting a probe

To prepare the USM 35X for operation, you have to connect a probe to it. Any Krautkramer probe can be used for the USM 35X, provided the appropriate cable is available and the operating frequency is within an adequate range.

The USM 35X is available with the probe connectors LEMO-1-TRIAX or BNC.

The probe is connected to the sockets at the top right on the instrument casing. Both connector sockets are equally suitable (connected in parallel) for connecting probes equipped with only one ultrasonic element (ultrasonic transducer) so that it does not matter which one of the two sockets is used.

When connecting a dual-element (TR) probe (having one transmitter element and one receiver element), or two probes (of which one is transmitting and the other one receiving), attention should be paid to connecting the transmitter element to the right-hand socket (transmitter, marked with black circle at the rear of the instrument case) and the receiver element to the left-hand socket (receiver, marked with red circle).

A Attention:

If this is not taken into account, the consequence would be a mismatching which may lead to considerable power losses or even to echo waveform distortions.

Receiver Transmitter

Connecting a probe

Initial start-up

3.2 Connecting a probe

A Attention:

If this is not taken into account, the consequence would be a mismatching which may lead to considerable power losses or even to echo waveform distortions.

Receiver Transmitter

Connecting a probe

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3-8 Issue 01, 04/2005 Krautkramer USM 35X

Initial start-up

3.3 Starting the USM 35X

Switching on

To start the USM 35X, press the switch-on key .

The start display of the USM 35X appears; here you will also see the current software version of the instrument. The instrument carries out a self-check and then switches over to stand-by mode.

The settings of all function values and the basic settings (language and units) are the same as before switching-on of the instrument.

Reset

If any functions can no longer be operated after a warm start, or if you want to reset the instrument to the basic setup, then you should carry out a cold start by simultaneously pressing the and the key.

The cold start message “Basic Initialization” is displayed. The instrument is initialized and reset to its basic setup (dialog language: English, for more details on how to select the language, please refer to chapter 4).

A Attention:

All saved data are deleted.

Information lines in the startup screen

You can enter two lines (each with up to 39 characters) for information purposes in the startup screen. For this use the remote function (codes I1 and I2, refer to chapter 8).

Starting the USM 35X

Initial start-up

3.3 Starting the USM 35X

Switching on

To start the USM 35X, press the switch-on key .

The start display of the USM 35X appears; here you

Reset

The cold start message “Basic Initialization” is dis-

Starting the USM 35X

Page 35

Krautkramer USM 35X Issue 01, 04/2005 4-1

Principles of operation 4

Page 36

4-2 Issue 01, 04/2005 Krautkramer USM 35X

Principles of operation Operator’s controls

Keys for selecting a function

Rotary knob for direct setting of the current function

Rotary knob for direct gain setting

Special keys for special instrument functions

Keys for selecting a function group

On/Off key

4.1 Operator’s controls

LED A: Gate alarm

R: Rejection D: Dual on

Key for changing the operation level

Principles of operation Operator’s controls

Keys for selecting a function

Special keys for special instrument functions

4.1 Operator’s controls

LED A: Gate alarm

R: Rejection D: Dual on

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Krautkramer USM 35X Issue 01, 04/2005 4-3

Principles of operationScreen display

4.2 Screen display

The USM 35X has a digital screen for the display of

• A-scan in the normal mode

• A-scan in the zoom mode

The zoom mode is activated using the key .

H Note:

The screen display always shows the gain and the adjusted dB step value. All other functions are locked in zoom mode.

Principles of operationScreen display

4.2 Screen display

The USM 35X has a digital screen for the display of

• A-scan in the normal mode

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4-4 Issue 01, 04/2005 Krautkramer USM 35X

Principles of operation Screen display

Functions on the display

The names of the five function groups are displayed at the bottom of the screen. The currently selected function group is highlighted.

Indicated at the right of the display, next to the A-scan, are the functions of the corresponding function group. The display of the functions disappears in the zoom mode.

Principles of operation Screen display

Functions on the display

The names of the five function groups are displayed at the bottom of the screen. The currently selected function group is highlighted.

Page 39

Krautkramer USM 35X Issue 01, 04/2005 4-5

Principles of operationScreen display

Amplitude height

Gate A (%)

Sound path

Gate A

Amplitude height

Gate B (%)

Sound path

Gate B

Status indicator:

TOF = Flank

Other displays

The measurement line below the screen display shows values of settings, measured values, and status indications. As an alternative, a scale can be shown here, giving an overview of the echo positions.

H Note:

Every measurement value can also be shown in an enlarged display at the top right corner of the A-scan (setting in the function group MEAS, function S-DISP).

H Note:

You can configure the four positions of the measurement line for set and measured values as required (function group MSEL). Please refer to chapter 5.14, section

Configuring the measurement line

on this sub-

ject.

Example of a measurement line

Principles of operationScreen display

Other displays

Page 40

4-6 Issue 01, 04/2005 Krautkramer USM 35X

Principles of operation Keys and rotary knobs

4.3 Keys and rotary knobs

Function keys

For changing between operation levels (below),

For selection of the function groups (below) and

For selection of the functions (right).

On/Off key

For turning the device on or off.

Principles of operation Keys and rotary knobs

4.3 Keys and rotary knobs

Function keys

For changing between operation levels (below),

For selection of the function groups (below) and

Page 41

Krautkramer USM 35X Issue 01, 04/2005 4-7

Principles of operationKeys and rotary knobs

Special keys

To directly activate individual instrument functions:

To choose the increment for the gain setting

To freeze the A-scan

To display a zoomed A-scan

To transfer the data

To record measured values and to save the data

Principles of operationKeys and rotary knobs

Special keys

To directly activate individual instrument functions:

To choose the increment for the gain setting

To freeze the A-scan

To display a zoomed A-scan

Page 42

4-8 Issue 01, 04/2005 Krautkramer USM 35X

Principles of operation

Rotary knobs

The USM 35X is equipped with two rotary knobs.

The left-hand rotary knob enables you to directly set the gain; the right-hand rotary knob serves for setting the currently selected function.

The two rotary knobs enable both step-by-step and accelerated settings. You can define a setting step by step by slightly operating the rotary knob which will snap into place at the next setting. To accelerate the setting, operate the rotary knob continuously, i.e. at a constant speed. This enables you to quickly bridge great differences between the settings.

Keys and rotary knobs

4.4 Operational concept

The USM 35X is an easy-to-use instrument. It has three operating levels, and you can change between them by pressing the key. You will recognize your currently active operating level by the number on the separation line between the first and the second function group.

If the instrument is equipped with the Data Logger option, a fourth operating level is added to the existing ones.

Each operating level contains five function groups.

First operating level

Second operating level

Third operating level

Principles of operation

Rotary knobs

The USM 35X is equipped with two rotary knobs.

The left-hand rotary knob enables you to directly set the gain; the right-hand rotary knob serves for setting the currently selected function.

Keys and rotary knobs

4.4 Operational concept

Page 43

Krautkramer USM 35X Issue 01, 04/2005 4-9

Principles of operation

Setting the functions

Shown below the A-scan are five function groups that you can directly select using the corresponding key. The selected function group is highlighted and the corresponding four functions are displayed next to the A-scan on the right. You can likewise directly select the individual functions using the corresponding keys.

Functions with double assignments

Some functions have double assignments. You will recognize the functions with double assignments by an arrow (icon >) after the function name.

Toggle between the two functions by repeatedly pressing the corresponding key

Coarse and fine adjustment of functions

You can choose between coarse and fine adjustment for some functions. You can toggle between these two adjustment modes by pressing the corresponding

key several times. The fine adjustment is identified

by an asterisk preceding the function value.

The following functions offer a choice between coarse and fine adjustment:

Function Function group

RANGE BASE MTLVEL BASE D-DELAY BASE aSTART aGAT aWIDTH aGAT bWIDTH bGAT S-REF1 CAL S-REF2 CAL ANGLE TRIG THICKNE TRIG DIAMET TRIG

For more details on the adjustment possibilities, please read from page 5-5 onward.

Operational concept

Principles of operation

Setting the functions

The following functions offer a choice between coarse and fine adjustment:

Function Function group

RANGE BASE MTLVEL BASE D-DELAY BASE

Operational concept

Page 44

4-10 Issue 01, 04/2005 Krautkramer USM 35X

Principles of operation

4.5 Important basic settings

Selecting the language

Select the language in which the function names should be displayed on the screen in the function DIALOG (Function group CFG1). The following languages are available:

• German

• English (default setting)

• French

• Italian

• Spanish

• Portuguese

• Dutch

• Swedish

• Slovenian

• Romanian

• Finnish

• Czech

• Danish

• Hungarian

• Croatian

• Russian

• Slovakian

• Norwegian

• Polish

• Japanese

H Note:

More dialog languages can be added on request.

– If necessary, go to the third operating level.

– In the function group CFG1 select the function

DIALOG.

Important basic settings

Principles of operation

4.5 Important basic settings

Selecting the language

Select the language in which the function names should be displayed on the screen in the function DIALOG (Function group CFG1). The following languages are

• Russian

• Slovakian

• Norwegian

• Polish

• Japanese

H Note:

Important basic settings

Page 45

Krautkramer USM 35X Issue 01, 04/2005 4-11

Principles of operationImportant basic settings

H Note:

Double assignment of the function DIALOG/UNIT (icon >). Toggle between the two functions by repeatedly pressing the corresponding key

– Select the required language by means of the right-

hand rotary knob.

Selecting units

In the function UNIT (function group CFG1) you can choose your favorite units between mm or inch.

– If necessary, go to the third operating level.

– In the function group CFG1 select the function UNIT.

H Note:

Double assignment of the function DIALOG/UNIT (icon >). Toggle between the two functions by repeatedly pressing the corresponding key .

– Set the required unit by means of the right-hand

rotary knob.

A Attention:

Select your units immediately when you start working with the USM 35X because if you change the unit, all the current settings are deleted, and the basic setup is loaded again.

Principles of operationImportant basic settings

H Note:

Double assignment of the function DIALOG/UNIT (icon >). Toggle between the two functions by repeatedly pressing the corresponding key

– Select the required language by means of the right-

hand rotary knob.

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4-12 Issue 01, 04/2005 Krautkramer USM 35X

Principles of operation

In order not to delete anything by accident, a safety prompt is displayed in the measurement line.

– If you are sure that you want to change the unit,

press the

key belonging to the function UNIT one

more time.

The unit is now changed, the current data are deleted.

– If you want to abort the process, press any other

key. The previous setting is kept in that case.

Setting the date

The date is saved together with the test results. You can set it in the function DATE (function group CFG2).

A Attention:

Please take into account that the USM 35X only indicates the year with two digits.

You should always make sure that you use correctly set values of date. Test results may otherwise be falsified.

– If necessary, change to the third operation level.

– Select the function DATE in the function group

CFG2.

H Note:

Double assignment of the function DATE/TIME (icon >). Toggle between the two functions by repeatedly pressing the corresponding key .

– Use the left-hand rotary knob to select the value that

you want to vary, e.g. the day.

– Use the right-hand rotary knob to vary the selected

value.

Important basic settings

Principles of operation

In order not to delete anything by accident, a safety prompt is displayed in the measurement line.

– If you are sure that you want to change the unit,

press the

key belonging to the function UNIT one

more time.

The unit is now changed, the current data are

– If necessary, change to the third operation level.

– Select the function DATE in the function group

CFG2.

Important basic settings

Page 47

Krautkramer USM 35X Issue 01, 04/2005 4-13

Principles of operation

Setting the time

The function TIME (function group CFG2) serves for setting the current hour of time. It is saved together with the test results.

A Attention:

You should always make sure that you are using the correct time settings. Test results may otherwise be falsified.

Don’t forget to manually set the time when changing from winter to summer time.

– If necessary, change to the third operation level.

– Select the function TIME in the function group CFG2.

H Note:

Double assignment of the function DATE/TIME (icon >). Toggle between the two functions by repeatedly pressing the corresponding key .

– Use the left-hand rotary knob to select the value that

you want to vary, e.g. the hour.

– Use the right-hand rotary knob to vary the selected

value.

Important basic settings

Principles of operation

Setting the time

The function TIME (function group CFG2) serves for setting the current hour of time. It is saved together with the test results.

A Attention:

Important basic settings

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4-14 Issue 01, 04/2005 Krautkramer USM 35X

Principles of operation

4.6 Basic settings of the display

The equipment of the USM 35X includes a high-resolution color display. You can optimize the display settings to your individual viewing habits and to the operational environment.

Selecting the color scheme

You can use the function SCHEME (function group LCD) to choose one of four color schemes. The color

scheme determines the color of all displays and that of the background. You cannot vary the colors of gates because they are fixed as follows:

• Gate A – red

• Gate B – green

• Gate C – blue

H Note:

All color schemes are suitable for indoor use. For outdoor use, we recommend the color schemes 3 and 4.

Basic settings of the display

– If necessary, change to the third operation level.

– Select the function SCHEME in the function group

LCD.

– Use the right-hand rotary knob to choose the required

color scheme.

Setting the lighting

Use the function LIGHT (function group LCD) to set the display lighting. You can choose between the default lighting max. and a lighting in the economy mode min..

H Note:

The economy mode reduces the current consumption and consequently increases the operating time in battery operation.

– If necessary, change to the third operation level.

– Select the function LIGHT in the function group LCD.

– Use the right-hand rotary knob to set the required

lighting.

Principles of operation

4.6 Basic settings of the display

The equipment of the USM 35X includes a high-resolution color display. You can optimize the display settings to your individual viewing habits and to the operational environment.

Basic settings of the display

– If necessary, change to the third operation level.

– Select the function SCHEME in the function group

LCD.

– Use the right-hand rotary knob to choose the required

color scheme.

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Krautkramer USM 35X Issue 01, 04/2005 5-1

Operation 5

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5-2 Issue 01, 04/2005 Krautkramer USM 35X

Operation Overview of the functions

5.1 Overview of the functions

The functions of the USM 35X are combined to form function groups on three operating levels.

If the instrument has the option Data Logger, there is an additional fourth operation level.

– Press the key to change between the operating

levels.

– Press the key to select the function group shown

above it.

– Press the key to select the function shown next

to it. The setting of the selected function is carried out via the right-hand rotary knob.

The gain function is always directly available via the left-hand rotary knob.

You can carry out important functions (switch on/off, dB-step, freeze, zoom and report printout) by pressing the special keys (ref. chapter 4).

You will also find an overview of the function groups and their functions on the fold-out page.

Each operating level contains five function groups. You will recognize your currently active operating level by the number on the separation line between the first and the second function group.

First operating level

Second operating level

Third operating level

H Note:

If the instrument is equipped with the Data Logger option, a fourth operating level is added. For this, refer to the corresponding chapter

Option Data Logger.

Operation Overview of the functions

5.1 Overview of the functions

The functions of the USM 35X are combined to form function groups on three operating levels.

If the instrument has the option Data Logger, there is an additional fourth operation level.

Each operating level contains five function groups. You will recognize your currently active operating level by the number on the separation line between the first and the second function group.

First operating level

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OperationOverview of the functions

Function groups first operating level

BASE The functions that you find here are re-

quired for the basic adjustment of the screen displays.

PULS Combined in this group are the functions

that serve for the adjustment of pulser.

RECV Combined in this group are the functions

that serve for the adjustment of receiver.

aGAT All functions for setting the gate A can be

found in this group.

bGAT All functions for setting the gate B can be

found in this group.

Function groups second operating level

CAL This function group makes functions for the

semiautomatic calibration available to you.

REF This function group serves for measuring

the dB difference between a reference echo and the reflector echo.

AWS This is where you will find all functions for

the classification of flaws in welds according to the AWS D1.1 specification.

DAC This is the function group where you can

set the functions for the DAC (only USM 35X DAC and USM 35X S).

JDAC The DAC functions in this function group

are modified to allow for a flaw evaluation according to JIS (Japanese Industrial Standard) Z3060-2002 (only USM 35X DAC

and USM 35X S).

OperationOverview of the functions

Function groups first operating level

BASE The functions that you find here are re-

quired for the basic adjustment of the screen displays.

PULS Combined in this group are the functions

that serve for the adjustment of pulser.

Function groups second operating level

CAL This function group makes functions for the

semiautomatic calibration available to you.

REF This function group serves for measuring

the dB difference between a reference echo and the reflector echo.

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Operation

DGS This function group serves for the ampli-

tude evaluation according to the DGS method (only USM 35X S).

TRIG Combined in this group are the functions

required for angle beaming using anglebeam probes for the display of a (reduced) projection distance and depth position of a reflector (for plane-parallel and circular curved test components).

MEM These functions serve for storing, loading

and deleting of data sets.

DATA The functions of this group serve for the

dataset management and documentation.

Function groups third operating level

MEAS In this group, you can define the measuring

point, select a parameter for the zoomed measured-value display in the A-scan as well as for the setting of the Magnify function, and you can select different settings for the A-scan.

MSEL This is where you configure your measure-

ment line. You can choose one display for each of the four positions.

LCD This is the function group where you can

set the LCD contrast and backlight as well as the echo display mode on the screen.

CFG1 Functions for the configuration: unit, dialog

language, printer driver and assignment of the key

CFG2 Other functions for configuration: time and

date, alarm horn; plus the changeover between the evaluation modes

Overview of the functions

Operation

DGS This function group serves for the ampli-

tude evaluation according to the DGS method (only USM 35X S).

TRIG Combined in this group are the functions

required for angle beaming using angle-

Function groups third operating level

MEAS In this group, you can define the measuring

point, select a parameter for the zoomed measured-value display in the A-scan as well as for the setting of the Magnify function, and you can select different settings for the A-scan.

Overview of the functions

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OperationSetting the gain

5.2 Setting the gain

This function, operated via the left-hand rotary knob, enables you to quickly and directly set the gain.

You can use the gain to adjust the required sensitivity in order to control the echo amplitudes.

– Turn the left-hand rotary knob to set the gain. The

current gain is indicated in the top left corner of the screen.

Defining the dB incrementation for gain

You can use the key to select a certain incrementation for setting the gain. You have a choice between 6 steps:

• 0.0 dB (locked)

• 0.5 dB

• 1.0 dB

• 2.0 dB

• 6.0 dB

• 6.5 … 20.0 dB

H Note:

The setting 0.0 dB locks the gain in this way preventing any accidental change of setting.

You can determine the step size of the sixth step using the function dBSTEP in the function group RECV.

– Press to change between the six steps.

The corresponding step size setting is indicated below the current gain on the screen.

OperationSetting the gain

5.2 Setting the gain

This function, operated via the left-hand rotary knob, enables you to quickly and directly set the gain.

You can use the gain to adjust the required sensitivity in order to control the echo amplitudes.

Defining the dB incrementation for gain

You can use the key to select a certain incrementation for setting the gain. You have a choice between 6 steps:

• 0.0 dB (locked)

• 0.5 dB

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Operation

5.3 Adjusting the display range (function group BASE)

The function group BASE enables you to make the basic adjustment of the display range. The display on the screen must be adjusted for the material to be tested (function MTLVEL) and for the probe used (function P-DELAY).

– If required, go to the first operating level.

– Select the function group BASE.

Adjusting the display range (function group BASE)

H Note:

In order to accurately adjust the material velocity and the probe delay, please read the section

Calibrating the

USM 35X

, chapter 5.7, beforehand.

RANGE (Display range)

You can adjust the range for your measurement in RANGE.

• Coarse adjustment: from 0.5 mm ... 1400 (9999) mm in even steps

• Fine adjustment: up to 9.99 mm in steps of 0.01 mm up to 99.9 mm in steps of 0.1 mm up to 999 mm in steps of 1 mm

H Note:

The adjustment range for the display range depends on the frequency range setting (function FREQU in function group RECV).

Operation

5.3 Adjusting the display range (function group BASE)

Adjusting the display range (function group BASE)

H Note:

In order to accurately adjust the material velocity and the probe delay, please read the section

Calibrating the

USM 35X

, chapter 5.7, beforehand.

RANGE (Display range)

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OperationAdjusting the display range (function group BASE)

Frequency range Adjustment range (c = 5920 m/s)

0.2 to 1 MHz 0.5 to 9999 mm/0.02" to 390"

0.5 to 4 MHz 0.5 to 9999 mm/0.02" to 390"

0.8 to 8 MHz 0.5 to 1420 mm/0.02" to 50" 2 to 20 MHz 0.5 to 1420 mm/0.02" to 50"

– Select the function RANGE.

– If required, toggle between coarse and fine adjust-

ment.

– Adjust the required value by means of the right-hand

rotary knob.

MTLVEL (Sound velocity)

Use MTLVEL to set the sound velocity within the test object. You can use sound velocities between 1000 and 15000 m/s.

• Coarse adjustment, in steps as follows (m/s): 15000 9000 5000 2000 14000 8000 4000 1600 13000 7000 3250 1450 12000 6320 3130 1000 11000 6000 3000 10000 5920 2730

• Fine adjustment 1000 ... 15000 in steps of 1 m/s

A Attention:

Always ensure that the function MTLVEL is correctly set. The USM 35X calculates all range and distance indications on the basis of the value adjusted here.

– Select the function MTLVEL.

– If required, toggle between coarse and fine adjust-

ment.

– Adjust the required value by means of the right-hand

rotary knob.

D-DELAY (Display starting point)

Here you can choose whether to display the adjusted range (for example 250 mm) starting from the surface of the test object, or in a section of the test object starting at a later point. This allows you to shift the complete screen display and consequently also the display zero.

OperationAdjusting the display range (function group BASE)

Frequency range Adjustment range (c = 5920 m/s)

0.2 to 1 MHz 0.5 to 9999 mm/0.02" to 390"

0.5 to 4 MHz 0.5 to 9999 mm/0.02" to 390"

0.8 to 8 MHz 0.5 to 1420 mm/0.02" to 50" 2 to 20 MHz 0.5 to 1420 mm/0.02" to 50"

– Select the function RANGE.

• Fine adjustment 1000 ... 15000 in steps of 1 m/s

A Attention:

Always ensure that the function MTLVEL is correctly set. The USM 35X calculates all range and distance indications on the basis of the value adjusted here.

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Operation Adjusting the display range (function group BASE)

If the display should for example start from the surface of the test object, the value in D-DELAY must be set to 0.

• Coarse adjustment –10 mm ... 1024 mm/–0.3" ... 40" in even steps

• Fine adjustment up to 99.9 mm/9.999" in steps of 0.01 mm/0.001" up to 1024 mm/10" in steps of 0.1 mm/0.001"

– Select the function D-DELAY.

– If required, toggle between coarse and fine adjust-

ment.

– Adjust the value for the display starting point by

means of the right-hand rotary knob.

P-DELAY (Probe delay)

Every probe has a delay line between the transducer element and the coupling face. This means that the initial pulse must first pass through this delay line before the sound wave can enter the test object. You can compensate for this influence of the delay line in the function P-DELAY.

H Note:

If the value for P-DELAY is not known, read the section

Calibrating the USM 35X

, chapter 5.7, in order to deter-

mine this value.

– Select the function P-DELAY.

– Adjust the value for the probe delay by means of the

right-hand rotary knob.

Operation Adjusting the display range (function group BASE)

If the display should for example start from the surface of the test object, the value in D-DELAY must be set to 0.

• Coarse adjustment –10 mm ... 1024 mm/–0.3" ... 40" in even steps

• Fine adjustment up to 99.9 mm/9.999" in steps of 0.01 mm/0.001"

P-DELAY (Probe delay)

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Operation

5.4 Adjusting the pulser (function group PULS)

You will find all functions for the adjustment of the pulser in the function group PULS.

– If required, go to the first operating level.

– Select the function group PULS.

DAMPING (Probe matching)

This function serves for matching the probe. You can use it to adjust the damping of the probe’s oscillating circuit and to consequently change the height, width and resolution of the echo display.

• low This setting has a lower damping effect and produces higher and broader echoes.

• high This setting reduces the echo height but mostly also produces narrow echoes with higher resolution.

– Select the function DAMPING.

– Set the required value by means of the right-hand

rotary knob.

Adjusting the pulser (function group PULS)

Operation

5.4 Adjusting the pulser (function group PULS)

You will find all functions for the adjustment of the pulser in the function group PULS.

– If required, go to the first operating level.

DAMPING (Probe matching)

This function serves for matching the probe. You can use it to adjust the damping of the probe’s oscillating circuit and to consequently change the height, width and resolution of the echo display.

• low

Adjusting the pulser (function group PULS)

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Operation Adjusting the pulser (function group PULS)

POWER (Intensity)

Use the function POWER to set the pulser voltage. You can choose between two settings:

• high – high voltage

• low – low voltage

The setting high is recommended for all inspections in which maximum sensitivity is important, e.g. for the detection of small flaws. Choose the setting low for broadband probes or if narrow echoes are required (better lateral resolution).

– Select the function POWER.

– Use the right-hand rotary knob to choose the required

setting.

DUAL (Pulser-receiver separation)

You can use the function DUAL to activate the pulserreceiver separation.

• off Single-element operation; the probe connection sockets are connected in parallel.

• on Dual mode for the use with dual-element (TR) probes; the left-hand socket (red) is connected with the amplifier input whereas the initial pulse is available at the right-hand socket (black).

• through Through-transmission mode for the use with two separate probes; the receiver is connected with left (red), the pulser is connected with right (black).

– Select the function DUAL.

– Use the right-hand rotary knob to choose the required

setting.

If the DUAL function is active, the LED D (dual) is on.

Operation Adjusting the pulser (function group PULS)

POWER (Intensity)

Use the function POWER to set the pulser voltage. You can choose between two settings:

• high – high voltage

• low – low voltage

DUAL (Pulser-receiver separation)

You can use the function DUAL to activate the pulserreceiver separation.

• off Single-element operation; the probe connection sockets are connected in parallel.

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OperationAdjusting the pulser (function group PULS)

PRF-MOD(Pulse repetition frequency)

The pulse repetition frequency indicates the number of times an initial pulse is triggered per second. You can determine whether you need the highest possible PRF value, or whether you are satisfied with a low value. You have 10 steps available for the setting; step 1 means the lowest PRF value.

The larger your workpiece, the smaller PRF values are needed in order to avoid phantom echoes. In the case of smaller PRF values, however, the A-scan update rate becomes lower; for this reason, high values are required if a workpiece should be scanned fast.

The best way to determine the suitable PRF value is by experimenting: start from the highest step and reduce the value until there are no more phantom echoes.

– Select the function PRF-MOD.

– Adjust the required value by means of the right-hand

rotary knob.

5.5 Adjusting the receiver (function group RECV)

You will find all functions for the adjustment of the pulser in the function group RECV.

– If required, go to the first operating level.

– Select the function group RECV.

H Note:

Double assignment of the function FINE G/dBSTEP (icon >). Toggle between the two functions by repeatedly pressing the corresponding key .

OperationAdjusting the pulser (function group PULS)

PRF-MOD(Pulse repetition frequency)

5.5 Adjusting the receiver (function group RECV)

You will find all functions for the adjustment of the pulser in the function group RECV.

– If required, go to the first operating level.

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Operation

FINE G (Fine adjustment of gain)

This function serves for the fine adjustment of the current gain value. The fine adjustment is possible over a range of 40 steps within the range of approx. 4 dB. The displayed gain value will not change.

Adjustment range: –10 ... +30

– Select the function FINE G.

– Use the right-hand rotary knob to adjust the value for

the fine gain.

dBSTEP

Use this function to set a step size for the gain variation by means of the key . The value set here is subsequently available to you as the sixth step for the stepwise gain variation. You have a free choice of the value within the setting range.

Setting range: 6.5 ... 20 dB

– Select the function dBSTEP.

– Set the value for the gain by means of the right-hand

rotary knob.

REJECT

The function REJECT allows you to suppress unwanted echo indications, for example structural noise from your test object.

The % screen height setting indicates the minimum height that the echoes should attain in order for them to be displayed on the screen at all. The Reject setting cannot be higher than the lowest threshold setting (minus 1 %) of any gate.

A Attention:

You should handle this function with great caution, as it may of course happen that you suppress echoes from flaws as well. Many test specifications expressly forbid using the reject function.

– Select the function REJECT.

– Set the required percentage value by means of the

right-hand rotary knob.

The LED R is therefore lit with active REJECT function.

Adjusting the receiver (function group RECV)

Operation

FINE G (Fine adjustment of gain)

Adjustment range: –10 ... +30

REJECT

The function REJECT allows you to suppress unwanted echo indications, for example structural noise from your test object.

The % screen height setting indicates the minimum height that the echoes should attain in order for them to

Adjusting the receiver (function group RECV)

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OperationAdjusting the receiver (function group RECV)

FREQU (Frequency range)

In this function, you can adjust the operating frequency according to the frequency of your probe.

You have a choice between four frequency ranges:

• 0.2 ... 1 MHz

• 0.5 ... 4 MHz

• 0.8 ... 8 MHz

• 2 ... 20 MHz

– Select the function FREQU.

– Adjust the required value by means of the right-hand

rotary knob.

RECTIFY (Rectification)

You can select the rectification mode of the echo pulses according to your application in the function RECTI- FY. You have the following options to choose from:

• full-w (= full-wave)

All half-waves are displayed above the baseline.

• pos hw (= positive half-wave)

Only positive half-waves are displayed.

• neg hw (= negative half-wave)

Only negative half-waves are displayed.

• rf (= radio frequency)

Only applies to the display range up to 50 mm (steel).

– Select the function RECTIFY.

– Use the right-hand rotary knob to adjust the required

setting.

OperationAdjusting the receiver (function group RECV)

FREQU (Frequency range)

In this function, you can adjust the operating frequency according to the frequency of your probe.

You have a choice between four frequency ranges:

• 0.2 ... 1 MHz

RECTIFY (Rectification)

You can select the rectification mode of the echo pulses according to your application in the function RECTI- FY. You have the following options to choose from:

• full-w (= full-wave)

All half-waves are displayed above the baseline.

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Operation Setting the gates (function groups aGAT and bGAT)

5.6 Setting the gates (function groups aGAT and bGAT)

All functions for setting the (dual) gate are arranged in the function group aGAT and bGAT.

– If required, go to the first operating level.

– Select the function group aGAT or bGAT.

H Note:

If you have an instrument equipped with the Data Logger option at your disposal, you’ll be additionally able to use the C gate including all corresponding functions.

Tasks of the gates

• It monitors the range of the test object where you expect to detect a flaw. If an echo exceeds or falls below the gate, an alarm signal is output via the LED A.

• The gates A and B are independant of one another. Gate A can also have the function of an echo-start gate.

• The gate chooses the echo for the digital time-offlight or amplitude measurement. The measured value is indicated in the measurement line.

H Note:

Error alarms can be triggered unter certain circumstances. These are caused by intermediate conditions in instrument operation occuring when the instrument is

Operation Setting the gates (function groups aGAT and bGAT)

5.6 Setting the gates (function groups aGAT and bGAT)

All functions for setting the (dual) gate are arranged in the function group aGAT and bGAT.

H Note:

If you have an instrument equipped with the Data Logger option at your disposal, you’ll be additionally able to use the C gate including all corresponding functions.

Tasks of the gates

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Operation

used, i.e. when function parameters are changed. Possible alarms occuring during instrument operation (setting of functions) are to be ignored.

Display of gates

To make the assignment easier, the gates are displayed in different colors. You cannot vary the colors of gates because they are fixed as follows:

• Gate A – red

• Gate B – green

• Gate C – blue

aLOGIC/bLOGIC (Evaluation logic of the gates)

This function allows you to choose the method for triggering the gate alarm. The alarm is output to the LED A on the front panel of the USM 35X. There are four setting options available:

Setting the gates (function groups aGAT and bGAT)

• off – Evaluation logic off The alarm and measurement capability are switched off. The gate is not visible.

• pos – Coincidence The alarm (LED A) is on if the preset response threshold of the gate is exceeded within the displayed range.

• neg – Anticoincidence The alarm (LED A) is on if the preset response threshold of the gate is not reached within the displayed range.

• a trig – Triggering by interface echo When using gate A as echo-start gate (setting of the evaluation logic for gate B)

– Select the function aLOGIC or bLOGIC.

– Set the required alarm logic by means of the right-

hand rotary knob.

H Note:

The alarm and measurement function of the gates is only active within the display range.

Operation

used, i.e. when function parameters are changed. Possible alarms occuring during instrument operation (setting of functions) are to be ignored.

Display of gates

To make the assignment easier, the gates are displayed in different colors. You cannot vary the colors of gates

Setting the gates (function groups aGAT and bGAT)

• off – Evaluation logic off The alarm and measurement capability are switched off. The gate is not visible.

• pos – Coincidence The alarm (LED A) is on if the preset response threshold of the gate is exceeded within the displayed range.

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Operation

aSTART/bSTART (Starting points of the gates)

You can fix the starting point of the gates A or B within the adjustment range of 0 ... 9999 mm/250".

– Select the function aSTART or bSTART.

– Uuse the right-hand rotary knob to adjust the required

setting.

aWIDTH/bWIDTH (Width of the gates)

You can determine the gate width within the range of

0.2 ... 9999 mm/0.008 ... 250".

– Select the function aWIDTH or bWIDTH.

– Use the right-hand rotary knob to adjust the required

value.

aTHRSH/bTHRSH (Response and measurement threshold of the gates)

You can determine the threshold value of the gates within the range of 10 to 90 % screen height for triggering the LED alarm if this value is exceeded or not reached, depending on the setting of the aLOGIC/bLOGIC function. In the RF mode, the threshold can be additionally set from –90 % to –10 %.

– Select the function aTHRSH or bTHRSH.

– Set the required value using the right-hand rotary

knob.

Setting the gates (function groups aGAT and bGAT)

Operation

aSTART/bSTART (Starting points of the gates)

You can fix the starting point of the gates A or B within the adjustment range of 0 ... 9999 mm/250".

– Select the function aSTART or bSTART.

aTHRSH/bTHRSH (Response and measurement threshold of the gates)

Setting the gates (function groups aGAT and bGAT)

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OperationCalibrating the USM 35X

5.7 Calibrating the USM 35X

Calibrating the display range

Before working with the USM 35X, you have to calibrate the instrument: you have to adjust the material velocity and display range and allow for the probe delay depending on the material and dimensions of the test object.

To ensure a safe and proper operation of the USM 35X, it is necessary that the operator be adequately trained in the field of ultrasonic testing technology.

Below you will find some examples of common calibration methods for certain test tasks. In addition, the USM 35X has a semiautomatic calibration function which is described as Case B:

With unknown material

velocity

Choosing the measuring point

The sound path measurement in the calibration process or in the subsequent echo evaluation process depends on the choice of the measuring point which can be set either to flank, to jflank or to peak in the USM 35X. In principle, the peak measurement should be preferred because the measured distances do not depend on the echo height in that case. However, there are application cases in which the flank measurement is either specified, or it must be applied for technical reasons, e.g. in many tests using dual-element (TR) probes.

A Attention:

In any case, the setting of the measuring point must always be identical for the calibration and for the subsequent test application. Otherwise measurement errors might occur.

OperationCalibrating the USM 35X

5.7 Calibrating the USM 35X

Calibrating the display range

Before working with the USM 35X, you have to calibrate the instrument: you have to adjust the material velocity and display range and allow for the probe delay

Choosing the measuring point

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Operation

Calibrating the USM 35X

Calibration with straight- and angle-beam probes

Case A: With known material velocity

Calibration process

– Set the known material velocity in MTLVEL (function

group BASE).

– Couple the probe to the calibration block.

– Set the required display range in RANGE (function

group BASE). The calibration echo must be displayed on the screen.

– Position the gate on one of the calibration echoes

until the sound path of the echo is indicated in the measurement line.

– After this, change the adjustment of the function

P-DELAY (function group BASE) until the correct sound path for the selected calibration echo is indicated in the measurement line.

Example:

You are carrying out the calibration for the calibration range of 100 mm/5" via the function group BASE using the calibration block V1 (thickness 25 mm/1") which is laid flatwise.

– Set RANGE to 100 mm/5".

– Set the known material velocity of 5920 m/s

(233 "/ms) in MTLVEL.

– Set the gate so that it is positioned on the first

calibration echo (from 25 mm/1").

– Read the sound path in the measurement line. If this

value is not equal to 25 mm/1", change the adjustment for the function P-DELAY until it is at 25 mm/1".

This completes the calibration of the USM 35X to the material velocity of 5920 m/s (233 "/ms) with a calibration range of 100 mm/5" for the probe used.

Operation

Calibrating the USM 35X

Calibration with straight- and angle-beam probes

Case A: With known material velocity

Calibration process

– Set the known material velocity in MTLVEL (function

Example:

You are carrying out the calibration for the calibration range of 100 mm/5" via the function group BASE using the calibration block V1 (thickness 25 mm/1") which is laid flatwise.

– Set RANGE to 100 mm/5".

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OperationCalibrating the USM 35X

Case B: With unknown material velocity

Use the semiautomatic calibration function of the USM 35X via the function group CAL for this calibration case.

The distances between 2 calibration echoes must be entered as default data. The USM 35X will then carry out a plausibility check, calculate the material velocity and the probe delay, and automatically set the parameters.

Calibration process

– Set the required display range in RANGE (function

group BASE). The two calibraion echoes selected must be displayed on the screen. Set the range so that the second calibration echo is located on the right edge of the screen.

– Select the function group CAL.

– Enter the distances of the two calibation echoes in

S-REF1 and S-REF2.

– Position the gate (function aSTART) on the first

calibration echo.

– Press to record the first calibration echo.

– The recording of the first calibration echo is con-

firmed by the message “Echo is recorded”, and the function CAL indicates the value 1.

– Move the gate to the second calibration echo.

– Press to record the second calibration echo.

OperationCalibrating the USM 35X

Case B: With unknown material velocity

Use the semiautomatic calibration function of the USM 35X via the function group CAL for this calibration case.

Calibration process

– Set the required display range in RANGE (function

group BASE). The two calibraion echoes selected must be displayed on the screen. Set the range so that the second calibration echo is located on the right edge of the screen.

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Operation Calibrating the USM 35X

The correct calibration is confirmed by the message “Calibration is done”.

The USM 35X will now automatically determine the sound velocity and the probe delay and set the corresponding functions accordingly. The value of the function CAL jumps back to 0.

H Note:

If the instrument is not able to carry out any valid calibration on the basis of the input values and the echoes recorded, a corresponding error message is displayed. In that case, please check the values of your calibration lines and repeat the process of recording the calibration echoes.

Example

– Enter the distances (thicknesses) of the two calibra-

tion lines S-REF1 (20 mm) and S-REF2 (40 mm).

– Position the gate on the first calibration echo.

– Press to record the first calibration echo.

Operation Calibrating the USM 35X

The correct calibration is confirmed by the message “Calibration is done”.

The USM 35X will now automatically determine the sound velocity and the probe delay and set the corresponding functions accordingly. The value of the function CAL jumps back to 0.

Example

– Enter the distances (thicknesses) of the two calibra-

tion lines S-REF1 (20 mm) and S-REF2 (40 mm).

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OperationCalibrating the USM 35X

– Position the gate on the second calibration echo:

– Press .

The second echo is stored, the calibration is carried out, and the CAL function is reset to 0. The valid calibration is briefly confirmed and carried out.

If you select the function group BASE, you can read the material velocity and probe delay.

Calibration with dual-element (TR) probes

Dual-element (TR) probes are especially used for wall thickness measurement. The following peculiarities must be taken into account when using these probes:

Echo flank

Most dual-element (TR) probes have a roof angle (transducer elements with inclined orientation toward the test surface). This causes mode conversions both at beam index (sound entry into the material) and at the reflection from the backwall, which can result in very jagged echoes.

V-path error

Dual-element (TR) probes produce a v-shaped sound path from the pulser via the reflection from the backwall to the receiver element. This so-called “V-path error” affects the measuring accuracy. You should therefore choose two wall thicknesses that cover the expected thickness measurement range for the calibration. In this way, the V-path error can be corrected to the greatest possible extent.

OperationCalibrating the USM 35X

– Position the gate on the second calibration echo:

Calibration with dual-element (TR) probes

Dual-element (TR) probes are especially used for wall thickness measurement. The following peculiarities must be taken into account when using these probes:

Echo flank

Most dual-element (TR) probes have a roof angle

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Operation Calibrating the USM 35X

Higher material velocity

Due to the V-path error, a higher material velocity than that of the test material is given during calibration, especially with small thicknesses. This is typical of dualelement (TR) probes and serves for compensation of the V-path error.

With small wall thicknesses, the above-described effect leads to an echo amplitude drop which has to be especially taken into account with thicknesses less than 2 mm/0.08".

A stepped reference block having different wall thicknesses is required for calibration. The wall thicknesses must be selected so that they cover the expected readings.

Calibration process:

We recommend to use the semiautomatic calibration function for the calibration with T/R probes.

– Set the required test range.

– Increase the probe delay (P-DELAY) until the two

calibration lines are displayed within the range.

– Set the pulser and receiver functions according to

the probe used and the test application.

– Set the function TOF (function group MEAS) to

flank.

– Vary the gain so that the highest echo reaches

approximately the full screen height.

– Set the gate threshold to the required height for

measuring the sound paths at the echo flanks.

– Select the function group CAL.

– Enter the distances of the two calibration echoes in

S-REF1 and S-REF2.

– Position the gate (function aSTART) on the first

calibration echo.

– Press

to record the first calibration echo.

– Couple the probe to the calibration block containing

the second calibration line, and set the height so that it’s about as high as the first calibration echo.

– Move the gate to the second calibration echo.

Operation Calibrating the USM 35X

Higher material velocity

– Set the pulser and receiver functions according to

the probe used and the test application.

– Set the function TOF (function group MEAS) to

flank.

– Vary the gain so that the highest echo reaches

approximately the full screen height.

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OperationCalibrating the USM 35X

– Press to record the second calibration echo.

The correct calibration is confirmed by the message “Calibration is done”. The material velocity and probe delay are set. The value of the CAL function goes back to 0.

– If necessary, check the calibration on one or several

known calibration lines, e.g. using the stepped reference block VW.

H Note:

Always keep in mind that the measured value is determined at the intersection point of gate and echo flank when the function TOF was set to flank. A correct setting of the echo height and gate threshold is therefore decisive for accurate calibration and measurement!

Calibrations or measurements in the peak mode are mostly not possible when using dual-element (TR) probes. As the echoes are often very broad and jagged, a clear echo peak cannot always be found in these cases.

5.8 Measuring

General notes

Please pay attention to the following notes when measuring with the USM 35X.

• Condition for measurements is the correct instrument calibration (sound velocity, probe delay).

• All amplitude measurements are carried out at the highest or the first signal in the gate.

• All distance measurements are carried out at the intersection point of gate and the first echo flank (TOF = flank or jflank), or at the peak of the highest echo (TOF = peak).

• If the echo amplitudes do not succeed 5 % screen height all sound path and amplitude measurements will be suppressed. Thus, rapidly changing random measurements caused by the instrument’s background noise are avoided.

OperationCalibrating the USM 35X

– Press to record the second calibration echo.

The correct calibration is confirmed by the message “Calibration is done”. The material velocity and probe delay are set. The value of the CAL function goes back to 0.

– If necessary, check the calibration on one or several

5.8 Measuring

General notes

Please pay attention to the following notes when measuring with the USM 35X.

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Operation Measuring

The following example shows the dependency of distance measurement on the echo waveform, i.e. on the height of the gate threshold and thus on the selection of the intersection point at the signal.

H Note:

The point of amplitude measurement is marked with a small upward triangle on the corresponding gate bar. The point of distance measurement is marked with a small downward triangle.

Gate threshold at 20 % measured sound path: 24.44 mm

Gate threshold at 80 % measured sound path: 24.91 mm

Operation Measuring

The following example shows the dependency of distance measurement on the echo waveform, i.e. on the height of the gate threshold and thus on the selection of the intersection point at the signal.

H Note:

The point of amplitude measurement is marked with a

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Operation

5.9 Measurement of dB difference (function group REF)

You can evaluate reflector echoes by means of reference echoes. The function group REF makes all functions for the echo comparison between a reflector echo and a reference echo available to you.

– If required, go to the second operating level.

– Select the function group REF.

Measurement of dB difference (function group REF)

H Note:

Depending on the setting in the function EVAMOD (function group CFG2), one of the function groups AWS , DAC, JDAC, or DGS may also be displayed at this point. Please also refer to chapter 5.15

General

configuration

You will find the following function:

REFECHO Storing or deleting the reference echo

REFMOD Activating the measurement of

dB difference

aSTART Positioning the A gate

The functions are described in the order in which you need them during your work.

Operation

5.9 Measurement of dB difference (function group REF)

You can evaluate reflector echoes by means of reference echoes. The function group REF makes all functions for the echo comparison between a reflector echo and a reference echo available to you.

Measurement of dB difference (function group REF)

H Note:

Depending on the setting in the function EVAMOD (function group CFG2), one of the function groups AWS , DAC, JDAC, or DGS may also be displayed at this point. Please also refer to chapter 5.15

General

configuration

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Operation

Recording a reference echo

Before using the measurement of dB difference, you have to first record a reference echo.

A Attention:

When recording a reference echo, an already stored reference echo is overwritten after a corresponding warning.

– Peak the reference echo according to the test

specification.

– Position the A gate over the reference echo using the

function aSTART.

– Select the function REFECHO.

– Turn the right-hand rotary knob upward in order to

store the echo in gate A as a reference echo.

– If necessary, confirm the warning message in order

to overwrite a stored reference echo.

The reference echo is now recorded. An inverted R is shown in the measurement line.

Deleting a reference echo

You can delete stored reference echoes.

– Select the function REFECHO.

– Turn the right-hand rotary knob downward in order to

delete the reference echo.

– If necessary, confirm the warning message in order

to delete the stored reference echo.

Measurement of dB difference (function group REF)

Operation

Recording a reference echo

Before using the measurement of dB difference, you have to first record a reference echo.

A Attention:

When recording a reference echo, an already stored

Measurement of dB difference (function group REF)

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Operation

Echo comparison

You can compare the echo of any reflector of your choice with the reference echo. The displayed result is the dB difference of the two echoes.

H Note:

The dB difference is independent of any possible gain variation.

– Choose Ha dB or Hb dB as measured value.

– Position the A gate over the echo.

– Select the function REFMOD.

– Activate the function by means of the right-hand

rotary knob.

The dB difference between the reference echo and the reflector echo is now displayed as the measured value.

Measurement of dB difference(function group REF)

Operation

Echo comparison

You can compare the echo of any reflector of your choice with the reference echo. The displayed result is the dB difference of the two echoes.

H Note:

Measurement of dB difference(function group REF)

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Operation

5.10 Classification of welds (function group AWS)

You can rate flaws in welds according to the specification AWS D1.1. You will find the corresponding functions in the function group AWS.

– If necessary, change to the second operation level.

– Select the function group AWS.

Classification of welds (function group AWS)

H Note:

Double assignment of the function INDICA/aSTART. Press the corresponding key

repeatedly to toggle

between the functions.

H Note:

Depending on the setting in the function EVAMOD (function group CFG2), one of the function groups REF, DAC, JDAC, or DGS may also be displayed at this point. Please also refer to chapter 5.15

General configu-

ration

Rating of welds according to AWS

The rating of flaws in welds according to the AWS specifications is based on an evaluation of the signal amplitude. In this process, the echo amplitude of the flaw echo is compared with the echo amplitude of a known reference reflector. In addition, the sound attenuation in the workpiece is also taken into consideration. The result is a dB value which is called flaw rating. The flaw rating D is calculated according to the formula:

Operation

5.10 Classification of welds (function group AWS)

You can rate flaws in welds according to the specification AWS D1.1. You will find the corresponding functions in the function group AWS.

Classification of welds (function group AWS)

H Note:

Double assignment of the function INDICA/aSTART. Press the corresponding key

repeatedly to toggle

between the functions.

H Note:

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Operation

D = A – B – C

with:

• A = Indication (in dB)

Absolute instrument gain with which the maximum flaw echo is at 50 % (±5 %) echo height

• B = Reference (in dB)

Absolute instrument gain with which the maximum reference echo (1.5 mm side-drilled hole from the reference block 1) is at 50 % (±5 %) echo height

• C = Attenuation (in dB) This value is calculated according to the formula C = 0.079 dB/mm (s – 25.4 mm). With s = sound path of the flaw echo.

The sound attenuation correction is automatically calculated and displayed by the instrument. For sound paths smaller than or equal to 25.4 mm (1 inch), the value is set to zero.

• D = D 1.1 Rating (in dB)

This is the result of the evaluation according to AWS. The evaluation is carried out in the USM 35X according to the formula indicated above.

Classification of welds (function group AWS)

H Notes:

Make sure that all instrument options for the special test are calibrated before starting with the rating according to AWS.

Pay attention to peaking an echo with an amplitude between 45 % and 55 % screen height. A rating is not possible with other amplitudes.

–

Apply couplant, and couple the probe to the reference block 1. Peak the echo from the 1.5 mm sidedrilled hole.

– Select the function aSTART, and set up the A gate

on the reference echo.

–

Vary the gain so that the reference echo is displayed at 50 % screen height.

–

Choose the function REFRNCE, and confirm the choice in order to save the reference gain.

Operation

D = A – B – C

with:

• A = Indication (in dB)

Absolute instrument gain with which the maximum flaw echo is at 50 % (±5 %) echo height

• B = Reference (in dB)

Classification of welds (function group AWS)

H Notes:

Make sure that all instrument options for the special test are calibrated before starting with the rating according to AWS.

Pay attention to peaking an echo with an amplitude between 45 % and 55 % screen height. A rating is not

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Operation

–

Couple the probe to the test object in order to evaluate a flaw echo.

– Select the function aSTART, and set up the A gate

on the flaw echo.

–

Vary the gain so that the flaw echo is displayed at 50 % screen height.

– Go to the function group AWS.

– Save the current gain using the function INDICA. The

current gain is saved. The USM 35X will automatically determine the values of the AWS variables C and D. You can then evaluate the rating D using the corresponding requirements from AWS.

Classification of welds (function group AWS)

Operation

– Save the current gain using the function INDICA. The

current gain is saved. The USM 35X will automatically determine the values of the AWS variables C and D. You can then evaluate the rating D using the corresponding requirements from AWS.

Classification of welds (function group AWS)

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Operation

5.11 Calculation of flaw position

(function group TRIG)

In the function group TRIG you will find the functions for setting the flaw position calculation when using anglebeam probes.

– If required, go to the first operating level.

– Select the function group TRIG.

Calculation of flaw position (function group TRIG)

H Note:

Double assignment of the function X-VALU/COLOR. Toggle between the two functions by repeatedly pressing the corresponding key

The functions in the group TRIG enable to automatically calculate the (reduced) projection distance and the real depth of the flaw in addition to the sound path S, and to digitally display them in the measurement line.

• Projection distance PD: distance of probe index (sound exit point) from the position of the flaw, projected on the surface

• Reduced projection distance rPD: distance of the probe’s leading face from the position of the flaw, projected on the surface

• Depth d: Distance between flaw position and surface

Operation

5.11 Calculation of flaw position (function group TRIG)

In the function group TRIG you will find the functions for setting the flaw position calculation when using anglebeam probes.

Calculation of flaw position (function group TRIG)

H Note:

Double assignment of the function X-VALU/COLOR. Toggle between the two functions by repeatedly pressing the corresponding key

The functions in the group TRIG enable to automatically calculate the (reduced) projection distance and the real

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Operation

When using angle-beam probes, the instrument can additionally calculate the sound path section or socalled leg L up to the next reflection point. This sound path section or leg can be displayed as the measured value La, Lb, or Lc.

Calculation of flaw position (function group TRIG)

ANGLE (Angle of incidence)

The ANGLE function enables you to adjust the angle of incidence of your probe for the material used. This value is required for the automatic calculation of the flaw position.

Adjustment range: 0° ... 90°

– Select the ANGLE function.

– Use the right-hand rotary knob to select the required

setting.

X-VALUE (X-value of the probe)

The function X-VALUE enables you to set the X-value (distance between the probe’s leading face and probe index/sound exit point) of the probe used. This value is required for the automatic calculation of the reduced projection distance.

Adjustment range: 0 ... 100 mm/0 ... 40"

– Select the function X-VALUE.

– Use the right-hand rotary knob to set the required value.

Operation

Calculation of flaw position (function group TRIG)

ANGLE (Angle of incidence)

The ANGLE function enables you to adjust the angle of incidence of your probe for the material used. This value is required for the automatic calculation of the flaw position.

Adjustment range: 0° ... 90°

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OperationCalculation of flaw position (function group TRIG)

COLOR

To make the orientation easier, the instrument is able to display the different sound path sections or legs in different ways. You can choose between two display modes:

• 1 – The A-scan is shown in another color in every leg.

– Leg 1 in magenta – Leg 2 in blue – Leg 3 in magenta

• 2 – The legs are shown as background shadings.

• off – No legs are displayed.

– Select the function COLOR.

– Use the right-hand rotary knob to set the required

mode.

THICKNE (Material thickness)

Use the THICKNE function to set the material’s wall thickness. This value is required for the automatic calculation of the real depth.

Adjustment range: 1 ... 1000 mm/0.05 ... 400"

– Select the THICKNE function.

– Use the right-hand rotary knob to set the required value.

DIAMET (Outside diameter of the test object)

You will need the DIAMET function for tests on circular curved surfaces, for example when testing longitudinally welded tubes. In order to make the USM 35X carry out the corresponding correction of (reduced) projection distance and depth, you should enter the outside diameter of your test object in this function.

If you plan to carry out the flaw position calculation for plane-parallel (flat) test objects, the DIAMET function should be set to flat.

Adjustment range:

• 10 ... 2000 mm/0.4 ... 800"

• flat

– Select the DIAMET function.

– Use the right-hand rotary knob to set the required

value.

OperationCalculation of flaw position (function group TRIG)

COLOR

To make the orientation easier, the instrument is able to display the different sound path sections or legs in different ways. You can choose between two display modes:

• 1 – The A-scan is shown in another color in every leg.

– Leg 1 in magenta

– Select the THICKNE function.

– Use the right-hand rotary knob to set the required value.

DIAMET (Outside diameter of the test object)

You will need the DIAMET function for tests on circular curved surfaces, for example when testing longitudinal-

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Operation

5.12 Data saving (function group MEM)

You will find all functions for storing, recalling and deleting complete data sets in the function group MEM.

– If required, go to the second operating level.

– Select the function group MEM.

Data saving (function group MEM)

A data set contains all instrument settings as well as the A-scan. This means that whenever you recall a stored data set, your instrument is again set up exactly the same as it was at the moment when the data set was stored. This makes each one of your tests reproducible.

You will find the following functions:

SET-# selecting number of a data set

RECALL recalling a stored data set

STORE storing a data set

DELETE deleting a data set

The functions are described in the order in which you need them during your work.

Operation

5.12 Data saving (function group MEM)

You will find all functions for storing, recalling and deleting complete data sets in the function group MEM.

– If required, go to the second operating level.

Data saving (function group MEM)

You will find the following functions:

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Operation

Storing a data set

You can save your current setup to a data set.

– Select the function SET-#.

– Use the right-hand rotary knob to set the number

where you would want to store the current data set (1 to 200).

– Select the function STORE.

– Use the right-hand rotary knob to set it to on.

The USM 35X stores the current data set. When the storage process is completed, the function STORE is automatically reset to off.

H Note:

The asterisk (*) before a selected data set number indicates that this data set is already occupied. It is not possible to overwrite an occupied data set; select another data set which is still empty, or delete the occupied data set. To avoid loss of data e.g. in case of a software update you should save the data sets to a PC.

All active entries in the information table (TESTINF) are automatically allocated to the data set being stored (see chapter 5.13

Dataset management

Deleting a data set

An occupied data set is marked with an asterisk (*) before the data set number. You can delete these data sets if you no longer need them.

– Select the function SET-#.

– Use the right-hand rotary knob to set the number of

the data set that you want to delete.

– Select the function DELETE.

– Use the right-hand rotary knob to set it to on. The

measurement line will then prompt: Delete data set?

– Confirm by pressing the corresponding key one

more time (all other keys would abort the process).

The data set is now deleted; the asterisk preceding the data set number is no longer there. The function DELETE is automatically reset to off.

Data saving (function group MEM)

Operation

Storing a data set

You can save your current setup to a data set.

– Select the function SET-#.

– Use the right-hand rotary knob to set the number

where you would want to store the current data set (1 to 200).

All active entries in the information table (TESTINF) are automatically allocated to the data set being stored (see chapter 5.13

Dataset management

Deleting a data set

An occupied data set is marked with an asterisk (*) before the data set number. You can delete these data

Data saving (function group MEM)

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Operation

Deleting all data set

You can delete all data sets if you no longer need them.

– Select the function DELETE.

H Note:

Double assignment of the function DELETE/DELALL. Press the corresponding key repeatedly to toggle between the functions.

Data saving (function group MEM)

– Use the right-hand rotary knob to set it to on. The

measurement line will then prompt: Delete all data

sets?

– Confirm by pressing the corresponding key

one

more time (all other keys would abort the process).

All data sets are now deleted. The function DELETE is automatically reset to off.

Recalling a stored data set

You can recall a stored data set; your instrument will then be provided with all the test-relevant technical features that existed at the moment of the setup. A frozen display of the stored A-scan appears.

A Attention:

If a saved data set is loaded, the current instrument setup is lost. If necessary, save the current instrument setup to a new data set before loading a saved data set.

– Select the function SET-#.

Operation

Deleting all data set

You can delete all data sets if you no longer need them.

– Select the function DELETE.

Data saving (function group MEM)

– Use the right-hand rotary knob to set it to on. The

measurement line will then prompt: Delete all data

sets?

– Confirm by pressing the corresponding key

one

more time (all other keys would abort the process).

All data sets are now deleted. The function DELETE is

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Operation

– Use the right-hand rotary knob to set the number of

the data set that you want to recall.

– Select the function RECALL.

– Use the right-hand rotary knob to set it to on. The

measurement line will then prompt: Recall data set?

– Confirm by pressing the corresponding key

one

more time (all other keys would abort the process).

The data set is now loaded and the current setup is overwritten. When the loading process is completed, the function RECALL is automatically reset to off.

H Note:

The gate for surveying the echo can be moved in the recalled A-scan. However, as the evaluation is made in the frozen A-scan, the measurement resolution is only

0.5 % of the adjusted calibration range.

Data saving (function group MEM)

Operation

– Use the right-hand rotary knob to set the number of

the data set that you want to recall.

– Select the function RECALL.

– Use the right-hand rotary knob to set it to on. The

measurement line will then prompt: Recall data set?

– Confirm by pressing the corresponding key

one

Data saving (function group MEM)

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Operation

5.13 Dataset management (function group DATA)

The USM 35X offers comprehensive functions for an easy dataset management.

– If required, go to the second operating level.

– Select the function group DATA.

The functions in the function group DATA enable you to easily manage the data sets stored in the USM 35X.

The following functions are available:

TESTINF You can save a lot of additional informa-

tion for every data set, e.g. data on the test object, on the flaw detected, or comments.

PREVIEW In this dataset preview you will see the

A-scan, the dataset name and the storage date of each data set.

DIR This function enables you to display a list

of all stored data sets, including the corresponding dataset names.

SETTING This is where you will see a list of func-

tions including all settings of the current data set.

Dataset management (function group DATA)

Operation

5.13 Dataset management (function group DATA)

The USM 35X offers comprehensive functions for an easy dataset management.

– If required, go to the second operating level.

The functions in the function group DATA enable you to easily manage the data sets stored in the USM 35X.

The following functions are available:

TESTINF You can save a lot of additional informa-

tion for every data set, e.g. data on the test object, on the flaw detected, or com-

Dataset management (function group DATA)

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Operation

TESTINF (Storing additional information)

For every data set, you can store additional information which will support you in the easy management of the data sets. You have 9 fields at your disposal for this purpose.

You can enter a maximum of 24 alphanumeric characters in the following fields:

DATNAME Dataset name

OBJECT Object description

FLAWIND Flaw indication

OPERAT Name of the person carrying out the test

SURFACE Surface quality

COMMENT Comments

You can enter numerical values in these fields:

FLAWLEN Flaw length

X-POS x-position coordinate

Y-POS y-position coordinate

You can

• save the current settings – together with the edited additional information – at a new and still empty dataset number (analogously to function STORE in the function group MEM),

• subsequently enter and save additional information for an already stored data set,

• overwrite the already saved additional information of a data set.

– Use the right-hand rotary knob to select and acitvate

the function TESTINF. The table will now show the additional information saved for the currently selected data set.

– Use (INFO 3) and to select the field SET-#.

– Use the right-hand rotary knob to view the additional

information for other data sets and to edit this information if required.

Dataset management (function group DATA)

Operation

TESTINF (Storing additional information)

For every data set, you can store additional information which will support you in the easy management of the data sets. You have 9 fields at your disposal for this purpose.

You can enter a maximum of 24 alphanumeric charac-

You can

• save the current settings – together with the edited additional information – at a new and still empty dataset number (analogously to function STORE in the function group MEM),

• subsequently enter and save additional information

Dataset management (function group DATA)

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Operation

H Note:

All stored data are displayed for data sets which are already occupied. An occupied data set is marked with an asterisk (*) before the data set number. If you have selected an empty data set, the field data of the previously displayed data set are automatically transferred. However, the data in the numerical fields FLAWLEN, X-POS and Y-POS are deleted. This means that you only have to edit the variable fields in test applications which include continuous saving of results. All alphanumerical field data are automatically transferred but can also be edited if necessary.

Editing additional information

You can edit all items with additional information.

A Attention:

As long as the field data edited in this table have not been saved, the previous entries remain valid. Please keep this in mind, e.g. before selecting a new dataset number: all changes in the current data set are lost!

– Select the required field.

– Use the left-hand rotary knob to mark the required

character position.

– Use the right-hand rotary knob to select the charac-

ter for this position. You only need the right-hand rotary knob to enter the numerical values in FLAWLEN, X-POS and Y-POS.

H Note:

You cannot edit the field SET-#. The number of the cur- rent data set is displayed here.

Dataset management (function group DATA)

Operation

H Note:

Editing additional information

You can edit all items with additional information.

A Attention:

As long as the field data edited in this table have not been saved, the previous entries remain valid. Please

Dataset management (function group DATA)

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Operation

Storing additional information

A Attention:

If you have edited already existing additional information, all previous additional information is overwritten when the data are stored.

– Select the field STO-INF.

– Use the right-hand rotary knob to set this function

on. The currently displayed data of the fields are now stored. The function STO-INF is automatically reset to off at the end of data storage.

– If necessary, press one of the keys , or to

go back to the A-scan without storing the data.

H Note:

In the case of previously empty data sets, all instrument settings and the current A-scan are stored simultaneously with the edited field data. Only the edited field data are stored for the previously occupied data sets. Previously stored instrument settings and A-scans are kept.

PREVIEW (Dataset preview)

This function enables you to view the A-scans of all stored data sets.

– Select the PREVIEW function.

– Use the right-hand rotary knob to set the function to

on. The A-scan and the name of the first data set are displayed.

Viewing other data sets:

– Select the SET-# function.

– Use the right-hand rotary knob to select the number

of the required data set.

– Select the RECALL function.

– Use the right-hand rotary knob to set the function to

on. The selected data set is displayed.

– If necessary, confirm the message using the corre-

sponding key .

– If necessary, press one of the keys , or to

go back to the currently active A-scan.

Dataset management (function group DATA)

Operation

Storing additional information

A Attention:

If you have edited already existing additional information, all previous additional information is overwritten when the data are stored.

PREVIEW (Dataset preview)

This function enables you to view the A-scans of all stored data sets.

– Select the PREVIEW function.

– Use the right-hand rotary knob to set the function to

on. The A-scan and the name of the first data set are

Dataset management (function group DATA)

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Operation

DIR (Dataset directory)

This function enables you to get an overview of all stored data sets, including their names and numbers.

– Select the DIR function.

– Use the right-hand rotary knob to set the function to

on.

The directory list of the stored data sets is displayed (dataset numbers and names). The display shows 12 data sets at a time. Occupied data sets are marked with an asterisk (*).

– Turn the right-hand rotary knob to have other data

sets displayed. The list always advances by one line each.

– If necessary, press one of the keys , or to

go back to the currently active A-scan.

Dataset management (function group DATA)

SETTING (Function list)

This function provides you with an overview of all set functions of the current data set.

– Select the SETTING function.

– Use the right-hand rotary knob to set the function to

on. The list of the currently set functions is displayed.

– Turn the right-hand rotary knob to have other lines

displayed. The list is advanced by one line each.

– If necessary, press one of the keys , or to

go back to the currently active A-scan.

Operation

DIR (Dataset directory)

This function enables you to get an overview of all stored data sets, including their names and numbers.

– Select the DIR function.

– Use the right-hand rotary knob to set the function to

on.

Dataset management (function group DATA)

SETTING (Function list)

This function provides you with an overview of all set functions of the current data set.

– Select the SETTING function.

– Use the right-hand rotary knob to set the function to

on. The list of the currently set functions is displayed.

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Operation

5.14 Configuring the USM 35X for a test application

Besides the default settings for the instrument operation, you have to configure the USM 35X for calibration and test tasks. You will find the corresponding functions in the function groups MEAS, MSEL and LCD.

In addition, you have to check the current time and date, and set them if required, so that they are correctly stored together with the test results. Please look up the function groups CFG1 and CFG2 for more functions for the general instrument setup (please refer to chapter

5.15

General configuration

– If required, go to the third operating level.

– Select the function group MEAS.

Configuring the USM 35X for a test application

Operation

5.14 Configuring the USM 35X for a test application

– If required, go to the third operating level.

– Select the function group MEAS.

Configuring the USM 35X for a test application

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Operation

TOF (Selecting the measuring point)

The sound path measurement in the calibration process or in the subsequent echo evaluation process depends on the selected measuring point which can be adjusted either to flank, to peak or to jflank in the USM 35X.

The point of amplitude measurement is marked by a small upward triangle on the corresponding gate bar. The point of distance measurement is marked by a small downward triangle.

H Note:

While DAC, TCG or JISDAC is active you can change the TOF mode from peak to flank.

When adjusted to flank or jflank the sound path mea- surement is made at the point of intersection of the monitor gate with the rising flank of the

highest

echo in

the gate.

measured soundpath: 19,44 mm amplitude: 94 %

A Attention:

The highest echo in the gate does not have to be the echo for which the sound path has been measured. This may lead to false echo evaluation!

Configuring the USM 35X for a test application

Operation

TOF (Selecting the measuring point)

The point of amplitude measurement is marked by a

When adjusted to flank or jflank the sound path mea- surement is made at the point of intersection of the monitor gate with the rising flank of the

highest

echo in

the gate.

Configuring the USM 35X for a test application

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Operation

In order to identify the points of measurement and to avoid misinterpretation two indicators were introduced per gate: The first triangle pointing downwards indicates the position of the measured sound path (distance), whereas the triangle pointing upwards marks the position of the measured amplitude.

In TOF mode peak the sound path and amplitude measurement is made at the maximum of the

highest

echo

in the gate.

measured soundpath: 19,65 mm amplitude: 95 %

In TOF mode jflank the sound path measurement is made at the point of intersection of the monitor gate with the rising flank of the

first

echo in the gate. The amplitude is measured at the maximum of the first echo in the gate even if there are further signals with higher amplitudes in the gate.

measured soundpath: 19,44 mm amplitude: 33 %

Configuring the USM 35X for a test application

Operation

In TOF mode peak the sound path and amplitude mea-

In TOF mode jflank the sound path measurement is made at the point of intersection of the monitor gate with the rising flank of the

first

echo in the gate. The amplitude is measured at the maximum of the first echo in the gate even if there are further signals with higher amplitudes in the gate.

Configuring the USM 35X for a test application

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Operation

In principle, the peak measurement should be preferred because the measured distances do not depend on the echo height in that case. However, there are application cases in which the flank measurement is either specified, or it must be applied for technical reasons, e.g. in many tests using dual-element (TR) probes.

A Attention:

In any case, the adjustment of the measuring point for calibration and for the subsequent test use must al- ways be identical. Otherwise measurement errors may occur.

– Select the TOF function.

– Use the right-hand rotary knob to select the required

setting.

S-DISP (Zoomed display of reading)

You can have a selected reading zoomed in the A-scan display. The following readings can be selected for the zoomed display (in the second column the indication of the readings in the measurement line):

Sa Sa Sound path for gate A

Sb Sb Sound path for gate B

Sb-a ba Difference of single measurements for

sound path gate B – gate A

Ha % Ha Echo height gate A in % screen height

Hb % Hb Echo height gate B in % screen height

Ha dB ha Echo height gate A in dB

Hb dB hb Echo height gate B in dB

R-start Rs Range start

R-end Re Range end

La La Number of legs in gate A

Lb Lb Number of legs in gate B

Lc Lc Number of legs in gate C

Only for flaw position calculation:

Da Da Depth for gate A

Configuring the USM 35X for a test application

Operation

S-DISP (Zoomed display of reading)

Sa Sa Sound path for gate A

Configuring the USM 35X for a test application

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Operation

Db Db Depth for gate B

Pa Pa Projection distance for gate A

Pb Pb Projection distance for gate B

Ra Ra Reduced projection distance for gate A

Rb Rb Reduced projection distance for gate B

Only for DGS:

ERS ER Equivalent reflector size

Gt dB Gt DGS test sensitivity

GrdB Gr DGS reference gain (= instrument gain

for the reference echo on 80 % screen height)

Only for DGS and DAC:

Ha %crv Ca Echo height gate A in % referred to curve

Hb %crv Cb Echo height gate B in % referred to curve

DGS-Crv Dc Diameter of the DGS curve

class cl Flaw class according to JIS Z3060-2002

DAC dB db dB-value by which the DAC gain has

been changed related to the reference gain (= instrument gain for the DAC echo on 80 % screen height)

Configuring the USM 35X for a test application

General:

Alarm Al Choice of gates for alarm triggering:

gate A, B or A+B

H Note:

If you use the Data Logger option, values for the C gate as well as a few special values for the Data Logger are added to the existing ones, see chapter

Option Data

Logger

– Select the function S-DISP.

– Use the right-hand rotary knob to select the required

value for the zoomed display.

H Note:

You can likewise configure all readings to be displayed below the A-scan at the four corresponding positions. Please refer to

Configuring the measurement line

Operation

Db Db Depth for gate B

Pa Pa Projection distance for gate A

Pb Pb Projection distance for gate B

Ra Ra Reduced projection distance for gate A

Rb Rb Reduced projection distance for gate B

Only for DGS:

Configuring the USM 35X for a test application

General:

Alarm Al Choice of gates for alarm triggering:

gate A, B or A+B

H Note:

If you use the Data Logger option, values for the C gate as well as a few special values for the Data Logger are

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Operation

MAGNIFY (Gate spreading)

The setting of the MAGNIFY function causes a spreading of the gate over the entire display width. You can choose the gate to be used for the magnify function.

– Select the function MAGNIFY.

– Use the right-hand rotary knob to set the function to

aGATE or bGATE if you want to spread the range of gate A or B over the entire display range.

A-Scan (Setting the A-scan)

This function offers you several options for setting your A-scan.

• stndard Normal A-scan setting. The key effects a static freeze.

• compare (A-scan comparison) You can compare a current echo display with a stored one. The display last stored using – either from the current application or from a stored data set – is displayed in the background as a dotted line.

H Note: Read chapter 5.12 to learn how to load a saved data set. As a restored data set is displayed with a frozen A-scan, press the

key first.

• envelop (echo dynamics) The echo envelope is shown as a dotted line additionally to the A-scan.

• peak b (maximum display) You can use this function to record and document (as well as to save if required) the peaked, maximum echo display. With the B gate active, the A-scan with the highest echo amplitude (recording of maximum display) is shown as a dotted line additionally to the “live” A-scan when peaking an echo display (in B gate). This A-scan becomes the statically frozen A-scan by pressing the

key, and it can then be

evaluated accordingly.

Configuring the USM 35X for a test application

Operation

MAGNIFY (Gate spreading)

The setting of the MAGNIFY function causes a spreading of the gate over the entire display width. You can choose the gate to be used for the magnify function.

– Select the function MAGNIFY.

– Use the right-hand rotary knob to set the function to

H Note: Read chapter 5.12 to learn how to load a saved data set. As a restored data set is displayed with a frozen A-scan, press the

key first.

• envelop (echo dynamics) The echo envelope is shown as a dotted line additionally to the A-scan.

Configuring the USM 35X for a test application

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Operation

• afreeze/bfreeze (automatic freeze) Whenever you select this function, an echo display connected with the A or B gate will automatically switch over to A-scan freeze (automatic freeze). This setting is especially well suited e.g. for high-temperature measurements, for measurements involving difficult coupling conditions, or for spot weld testing.

H Note:

If you are using a Data Logger option, you also have the function cfreeze (for C gate) at your disposal.

– Select the function A-SCAN.

– Use the right-hand rotary knob to choose the required

setting.

– Pay attention to the additional information referring to

the corresponding setting options (see preceeding page).

Configuring the measurement line

The configuration of your measurement line is carried out in the function group MSEL, this means that you can choose the reading for one of the four possible positions of the measurement line for direct measuredvalue display during the test.

– If required, go to the third operating level.

– Select the function group MSEL.

Functions of the function group MSEL:

MEAS-P1 MEAS-P2 MEAS-P3 MEAS-P4

Measured values at positions 1 to 4

Configuring the USM 35X for a test application

Operation

Configuring the measurement line

Configuring the USM 35X for a test application

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Operation

All measured values which have also been described for the zoomed display of the function S-DISP are availabe to you at each position.

H Note:

As an alternative, you can display a scale in the measurement line (ref. function SCALE).

– Select the function MEAS-P1 to MEAS-P4.

– Use the right-hand rotary knob to set the required

measured value for each position in the corresponding function.

Configuring the USM 35X for a test application

Setting the display

In the function group LCD, you will find setting options for the display screen itself and for the echo display.

– If required, go to the third operating level.

– Select the function group LCD.

H Note:

Double assignment of the function FILLED/VGA. Toggle between the two functions by repeatedly pressing the corresponding key .

Operation

All measured values which have also been described for the zoomed display of the function S-DISP are availabe to you at each position.

H Note:

As an alternative, you can display a scale in the measurement line (ref. function SCALE).

Configuring the USM 35X for a test application

Setting the display

In the function group LCD, you will find setting options for the display screen itself and for the echo display.

– If required, go to the third operating level.

– Select the function group LCD.

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Operation

FILLED (Echo display mode)

The function FILLED toggles between the filled and the normal echo display mode. The filled echo display mode improves the echo perceptibility due to the strong contrast, especially in cases where workpieces are scanned more quickly.

H Note:

If the function COLOR is active, the filled area is also displayed in different colors.

– Select the function FILLED.

– Use the right-hand rotary knob to set the function to

on or off.

VGA

You can switch the VGA output on and off.

H Note:

You should only switch the VGA output on if you aim to transfer the display contents to an external instrument. If the VGA output is switched off, the current consumption is reduced and the operating time is extended in battery operation.

– Select the function VGA.

– Use the right-hand rotary knob to set the function to

on or off.

SCHEME

You have a choice between four color schemes. The color scheme determines the color of all displays and that of the background. You cannot vary the colors of gates because they are fixed as follows:

• Gate A – red

• Gate B – green

• Gate C – blue

Configuring the USM 35X for a test application

Operation

FILLED (Echo display mode)

VGA

You can switch the VGA output on and off.

H Note:

You should only switch the VGA output on if you aim to transfer the display contents to an external instrument.

Configuring the USM 35X for a test application

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Operation

H Note:

All color schemes are suitable for indoor use. For outdoor use, we recommend the color schemes 3 and 4.

– Select the function SCHEME.

– Use the right-hand rotary knob to choose the required

color scheme.

LIGHT (LCD backlight)

You can choose between a lighting in the economy mode min. and a brighter lighting max. for the display lighting. The economy mode is the default setting.

H Note:

The economy mode reduces the current consumption and consequently increases the operating time in battery operation.

– Select the function LIGHT.

– Use the right-hand rotary knob to set the required

lighting.

SCALE (Configuring the measurement line)

As an alternative to the measured values, the USM 35X enables to display a scale in the measurement line. The scale gives you an overview of the position of echoes. You have a choice between a dimensionless ten-division scale and a scale showing the real position of the echoes.

The following settings are possible:

• measval Display of measured values

• snd-pth Display of sound path scale

• div. Display of a dimensionless scale

– Select the function SCALE.

– Use the right-hand rotary knob to set the required

display mode.

Configuring the USM 35X for a test application

Operation

H Note:

All color schemes are suitable for indoor use. For outdoor use, we recommend the color schemes 3 and 4.

– Select the function SCHEME.

– Use the right-hand rotary knob to choose the required

color scheme.

SCALE (Configuring the measurement line)

Configuring the USM 35X for a test application

GE Krautkramer USM 35X Operator's Manual

Specifications and Main Features

Frequently Asked Questions

User Manual