Fairchild Semiconductor ISL9N303AS3ST, ISL9N303AS3, ISL9N303AP3 Datasheet

PWM Optimized
ISL9N303AP3 / ISL9N303AS3ST / ISL9N303AS3
N-Channel Logic Level UltraFET® Trench MOSFETs 30V, 75A, 3.2m
ISL9N303AP3 / ISL9N303AS3ST / ISL9N303AS3
September 2002
General Description
Features
• Fast switching technology and features low gate charge while maintaining low on-resistance.
Optimized for switching applications, this device improves the overall efficiency of DC/DC converters and allows operation to higher switching frequencies.
Applications
• DC/DC converters
DRAIN
(FLANGE)
TO-220AB
MOSFET Maximum Ratings T
GATE
SOURCE
DRAIN
GATE
SOURCE
TO-263AB
= 25°C unless otherwise noted
C
•r
•r
•Q
•Q
•C
DRAIN
(FLANGE)
= 0.0026Ω (Typ), VGS = 10V
DS(ON)
= 0.004Ω (Typ), VGS = 4.5V
DS(ON)
(Typ) = 61nC, VGS = 5V
g
(Typ) = 17nC
gd
(Typ) = 7000pF
ISS
SOURCE
DRAIN
(FLANGE)
TO-262AB
DRAIN
GATE
D
G
S
Symbol Parameter Ratings Units
V
DSS
V
GS
Drain to Source Voltage 30 V Gate to Source Voltage ±20 V Drain Current Continuous (T
I
D
Continuous (T Continuous (T
= 25oC, VGS = 10V)
C
= 100oC, VGS = 4.5V) 75 A
C
= 25oC, VGS = 10V, R
C
= 43oC/W) 25 A
θJA
75 A
Pulsed Figure 4
P
D
, T
T
J
STG
Power dissipation Derate above
Operating and Storage Temperature -55 to 175
215
1.43
W/
W
o
C
o
C
Thermal Characteristics
R
θJC
R
θJA
R
θJA
Thermal Resistance Junction to Case TO-220, TO-262, TO-263 0.7 Thermal Resistance Junction to Ambient TO-220, TO-262, TO-263 62 Thermal Resistance Junction to Ambient TO-263, 1in2 copper pad area 43
Package Marking and Ordering Information
Device Marking Device Package Reel Size Tape Width Quantity
N303AS ISL9N303AS3ST TO-263AB 330mm 24mm 800 units N303AP ISL9N303AP3 TO-220AB Tube N/A 50 units N303AS ISL9N303AS3 TO-262AA Tube N/A 50 units
©2002 Fairchild Semiconductor Corporation
ISL9N303AP3 / ISL9N303AS3ST / ISL9N303AS3, Rev. C1
o
C/W
o
C/W
o
C/W
ISL9N303AP3 / ISL9N303AS3ST / ISL9N303AS3
Electrical Characteristics T
= 25°C unless otherwise noted
C
Symbol Parameter Test Conditions Min Typ Max Units
Off Characteristics
B I
DSS
I
GSS
VDSS
Drain to Source Breakdown Voltage ID = 250µA, VGS = 0V 30 - - V
V
= 25V - - 1
Zero Gate Voltage Drain Current
DS
= 0V TC = 150
V
GS
o
- - 250
Gate to Source Leakage Current VGS = ±20V - - ±100 nA
On Characteristics
V
GS(TH)
r
DS(ON)
Gate to Source Threshold Voltage VGS = VDS, ID = 250µA1-3V
I
= 75A, VGS = 10V - 0.0026 0.0032
Drain to Source On Resistance
D
= 75A, VGS = 4.5V - 0.004 0.005
I
D
Dynamic Characteristics
C C C Q Q Q Q Q
ISS OSS RSS
g(TOT) g(5) g(TH) gs gd
Input Capacitance Output Capacitance - 1350 - pF Reverse Transfer Capacitance - 570 - pF Total Gate Charge at 10V VGS = 0V to 10V Total Gate Charge at 5V VGS = 0V to 5V - 61 92 nC Threshold Gate Charge VGS = 0V to 1V - 6.5 9.8 nC Gate to Source Gate Charge - 14 - nC Gate to Drain “Miller” Charge - 17 - nC
Switching Characteristics
t
ON
t
d(ON)
t
r
t
d(OFF)
t
f
t
OFF
Turn-On Time Turn-On Delay Time - 22 - ns Rise Time - 80 - ns Turn-Off Delay Time - 35 - ns Fall Time - 25 - ns Turn-Off Time - - 90 ns
(VGS = 4.5V)
= 15V, VGS = 0V,
V
DS
f = 1MHz
V
= 15V, ID = 24A
DD
V
= 4.5V, RG = 2.4
GS
V
DD
I
= 75A
D
= 1.0mA
I
g
= 15V
- 7000 - pF
115 172 nC
- - 155 ns
µA
Switching Characteristics (V
t
ON
t
d(ON)
t
r
t
d(OFF)
t
f
t
OFF
Turn-On Time Turn-On Delay Time - 12 - ns Rise Time - 69 - ns Turn-Off Delay Time - 51 - ns Fall Time - 21 - ns Turn-Off Time - - 107 ns
GS
Unclamped Inductive Switching
t
AV
Avalanche Time ID = 4.1A L = 3.0 mH 275 - - µs
Drain-Source Diode Characteristics
V
SD
t
rr
Q
RR
©2002 Fairchild Semiconductor Corporation
Source to Drain Diode Voltage Reverse Recovery Time ISD = 75A, dISD/dt = 100A/µs- - 31 ns
Reverse Recovered Charge ISD = 75A, dISD/dt = 100A/µs- - 20 nC
= 10V)
- - 123 ns
= 15V, ID = 24A
V
DD
= 10V, RG = 2.4
V
GS
I
= 75A - - 1.25 V
SD
= 35A - - 1.0 V
I
SD
ISL9N303AP3 / ISL9N303AS3ST / ISL9N303AS3, Rev. C1
Typical Characteristics
ISL9N303AP3 / ISL9N303AS3ST / ISL9N303AS3
1.2
1
0.8
0.6
0.4
0.2
POWER DISSIPATION MULTIPLIER
0
0 25 50 75 100 175
125
150
TC, CASE TEMPERATURE (oC)
Figure 1. Normalized Power Dissipation vs
Ambient Temperature
2
DUTY CYCLE - DESCENDING ORDER
0.5
1
0.2
0.1
0.05
0.02
0.01
0.1
, NORMALIZED
θJC
Z
THERMAL IMPEDANCE
SINGLE PULSE
0.01
-5
10
-4
10
-3
10
t, RECTANGULAR PULSE DURATION (s)
80
V
= 10V
GS
60
V
= 4.5V
GS
40
, DRAIN CURRENT (A)
D
20
I
0
25 50 75 100 125 150 175
TC, CASE TEMPERATURE (oC)
Figure 2. Maximum Contin uous Drain Current vs
Case Temperature
P
DM
t
1
t
0
x R
2
2
+ T
θJC
C
1
10
NOTES: DUTY FACTOR: D = t1/t
PEAK TJ = PDM x Z
-2
10
-1
10
θJC
10
3000
1000
VGS = 10V
, PEAK CURRENT (A)
DM
I
©2002 Fairchild Semiconductor Corporation
TRANSCONDUCTANCE MAY LIMIT CURRENT IN THIS REGION
100
50
-5
10
Figure 3. Normalized Maximum Transient Thermal Impedance
TC = 25oC FOR TEMPERATURES ABOVE 25oC DERATE PEAK CURRENT AS FOLLOWS:
I = I
VGS = 5V
-4
10
-3
10
-2
10
-1
10
t, PULSE WIDTH (s)
Figure 4. Peak Current Capability
ISL9N303AP3 / ISL9N303AS3ST / ISL9N303AS3, Rev. C1
175 - T
25
10
C
150
-0
1
10
Typical Characteristics
ISL9N303AP3 / ISL9N303AS3ST / ISL9N303AS3
150
PULSE DURATION = 80µs DUTY CYCLE = 0.5% MAX
= 15V
V
120
DD
90
60
, DRAIN CURRENT (A)
D
I
TJ = 25oC
30
0
1.522.533.5 VGS, GATE TO SOURCE VOLTAGE (V)
TJ = 175oC
TJ = -55oC
150
120
90
60
, DRAIN CURRENT (A)
D
I
30
0
0 0.2 0.4 0.6 0.8 1
VGS = 10V
VGS = 4.5V
PULSE DURATION = 80µs DUTY CYCLE = 0.5% MAX
VDS, DRAIN TO SOURCE VOLTAGE (V)
Figure 5. Transfer Ch aracteri stics Figure 6. Saturation Character istics
10
8
ID = 75A
6
, DRAIN TO SOURCE
ID = 24A
ON RESISTANCE (mΩ)
4
DS(ON)
r
2
246810
VGS, GATE TO SOURCE VOLTAGE (V)
PULSE DURATION = 80µs DUTY CYCLE = 0.5% MAX
2
PULSE DURATION = 80µs DUTY CYCLE = 0.5% MAX
1.5
ON RESISTANCE
1
NORMALIZED DRAIN TO SOURCE
0.5
-80 -40 0 40 80 120 160 200 TJ, JUNCTION TEMPERATURE (oC)
VGS = 3.5V
VGS = 3V
TC = 25oC
VGS = 10V, ID =75A
Figure 7. Drain to Source On Resis tanc e vs Ga te
Voltage and Drain Current
1.4
1.2
1
0.8
0.6
NORMALIZED GATE
THRESHOLD VOLTAGE
0.4
0.2
-80 -40 0 40 80 120 160 200 TJ, JUNCTION TEMPERATURE (oC)
VGS = VDS, ID = 250µA
Figure 9. Normalized Gate Thres hold Volta ge v s
Junction Temperature
©2002 Fairchild Semiconductor Corporation
Figure 8. Normalized Drain to Source On
Resistance vs Junction Temperature
1.2 ID = 250µA
1.1
1.0
BREAKDOWN VOLTAGE
NORMALIZED DRAIN TO SOURCE
0.9
-80 -40 0 40 80 120 160 200 , JUNCTION TEMPERATURE (oC)
T
J
Figure 10. Normalized Drain to Source
Breakdown Voltage vs Junction Temperature
ISL9N303AP3 / ISL9N303AS3ST / ISL9N303AS3, Rev. C1
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