Fairchild Semiconductor ISL9N302AP3 Datasheet

±
θ
θ
ISL9N302AP3
January 2002
N-Channel Logic Level PWM Optimized UltraFET® Trench Power MOSFETs
General Description
This device employs a new advanced trench MOSFET
Features
• Fast switching technology and features low gate charge while maintaining low on-resistance.
Optimized for switching applications, this device improves the overall efficiency of DC/DC converters and allows operation to higher switching frequencies.
Applications
• DC/DC converters
SOURCE
DRAIN
GATE
DRAIN
(FLANGE)
•r
•r
•Q
•Q
•C
= 0.0019 (Typ), V
DS(ON)
= 0.0027 (Typ), V
DS(ON)
(Typ) = 110nC, V
g
(Typ) = 31nC
gd
(Typ) = 11000pF
ISS
= 10V
GS
= 4.5V
GS
= 5V
GS
D
G
S
TO-220AB
MOSFET Maximum Ratings
T
= 25°C unless otherwise noted
A
Symbol Parameter Ratings Units
V
DSS
V
GS
Drain to Source Voltage 30 V
Gate to Source Voltage
Drain Current
I
D
Continuous (T
Continuous (T
= 25
C
= 100
C
o
C, V
= 10V)
GS
o
C, V
= 4.5V) 75 A
GS
Pulsed Figure 4 A
P
D
T
, T
J
STG
Power dissipation Derate above 25
o
C
Operating and Storage Temperature -55 to 175
20 V
75 A
345
2.3
W/
W
o
C
o
C
Thermal Characteristics
R
JC
R
JA
Thermal Resistance Junction to Case TO-220 0.43
Thermal Resistance Junction to Ambient TO-220 62
Package Marking and Ordering Information
Device Marking Device Package Reel Size Tape Width Quantity
N302AP ISL9N302AP3 TO-220AB Tube N/A 50
©2002 Fairchild Semiconductor Corporation
o
C/W
o
C/W
Rev. B January 2002
µ
±
µ
T
Electrical Characteristics
= 25°C unless otherwise noted
A
Symbol Parameter Test Conditions Min Typ Max Units
Off Characteristics
B
I
DSS
I
GSS
VDSS
Drain to Source Breakdown Voltage I
Zero Gate Voltage Drain Current
Gate to Source Leakage Current V
= 250 µ A, V
D
V
= 25V - - 1
DS
V
= 0V T
GS
= ± 20V - -
GS
= 0V 30 - - V
GS
o
= 150
C
- - 250
100 nA
On Characteristics
V
GS(TH)
r
DS(ON)
Gate to Source Threshold Voltage V
Drain to Source On Resistance
= V
GS
I
= 75A, V
D
I
= 75A, V
D
, I
= 250 µ A1-3V
DS
D
= 10V - 0.0019 0.0025
GS
= 4.5V - 0.0027 0.0033
GS
Dynamic Characteristics
C
C
C
Q
Q
Q
Q
Q
ISS
OSS
RSS
g(TOT)
g(5)
g(TH)
gs
gd
Input Capacitance
Output Capacitance - 2000 - pF
Reverse Transfer Capacitance - 900 - pF
Total Gate Charge at 10V V
Total Gate Charge at 5V V
Threshold Gate Charge V
Gate to Source Gate Charge - 25 - nC
V
= 15V, V
DS
f = 1MHz
= 0V to 10V
GS
= 0V to 5V - 110 165 nC
GS
= 0V to 1V - 12 18 nC
GS
GS
= 0V,
V
DD
I
D
I
g
= 15V
= 75A
= 1.0mA
- 11000 - pF
200 300 nC
Gate to Drain “Miller” Charge - 31 - nC
ISL9N302AP3
A
(V
(V
= 4.5V)
GS
= 10V)
GS
Switching Characteristics
t
ON
t
d(ON)
t
r
t
d(OFF)
t
f
t
OFF
Turn-On Time
Turn-On Delay Time - 29 - ns
Rise Time - 120 - ns
Turn-Off Delay Time - 45 - ns
Fall Time - 34 - ns
Turn-Off Time - - 119 ns
Switching Characteristics
t
ON
t
d(ON)
t
r
t
d(OFF)
t
f
t
OFF
Turn-On Time
Turn-On Delay Time - 16 - ns
Rise Time - 120 - ns
Turn-Off Delay Time - 70 - ns
Fall Time - 30 - ns
Turn-Off Time - - 150 ns
Unclamped Inductive Switching
t
AV
Avalanche Time I
Drain-Source Diode Characteristics
V
SD
t
rr
Q
RR
Source to Drain Diode Voltage
Reverse Recovery Time I
Reverse Recovered Charge I
- - 224 ns
V
DD
V
GS
= 15V, I = 4.5V, R
= 28A
D
GS
= 1.5
- - 204 ns
V
= 15V, I
DD
V
= 10V, R
GS
= 7.2A, L = 3.0mH 480 - -
D
I
= 75A - - 1.25 V
SD
I
= 40A - - 1.0 V
SD
= 75A, dI
SD
= 75A, dI
SD
= 28A
D
= 1.5
GS
/dt = 100A/ µ s- - 42 ns
SD
/dt = 100A/ µ s- - 34 nC
SD
s
©2002 Fairchild Semiconductor Corporation Rev. B January 2002
ISL9N302AP3
Typical Characteristic
1.2
1.0
0.8
0.6
0.4
0.2
POWER DISSIPATION MULTIPLIER
0
0 25 50 75 100 175
TC, CASE TEMPERATURE (oC)
125
Figure 1. Normalized Power Dissipation vs
Ambient Temperature
2
DUTY CYCLE - DESCENDING ORDER
0.5
1
0.2
0.1
0.05
0.02
0.01
0.1
, NORMALIZED
θJC
Z
THERMAL IMPEDANCE
0.01
-5
10
-4
10
SINGLE PULSE
10
80
60
40
, DRAIN CURRENT (A)
20
D
I
150
0
25 50 75 100 125 150 175
Figure 2. Maximum Continuous Drain Current vs
-3
t, RECTANGULAR PULSE DURATION (s)
-2
10
VGS = 10V
TC, CASE TEMPERATURE (oC)
Case Temperature
P
DM
NOTES: DUTY FACTOR: D = t1/t
PEAK TJ = PDM x Z
-1
10
θJC
10
0
x R
2
θJC
VGS = 4.5V
t
1
t
2
+ T
C
1
10
Figure 3. Normalized Maximum Transient Thermal Impedance
5000
1000
VGS = 10V
VGS = 5V
, PEAK CURRENT (A)
DM
I
100
50
-5
10
TRANSCONDUCTANCE MAY LIMIT CURRENT IN THIS REGION
-4
10
-3
10
t, PULSE WIDTH (s)
-2
10
10
TC = 25oC
FOR TEMPERATURES ABOVE 25 CURRENT AS FOLLOWS:
I = I
-1
o
C DERATE PEAK
25
0
10
175 - T
150
C
1
10
Figure 4. Peak Current Capability
©2002 Fairchild Semiconductor Corporation Rev. B January 2002
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