Fairchild Semiconductor IRL630A Datasheet

$GYDQF HG 3RZH U 026)(7
IRL630A
FEATURES
Logic-Level Gate Drive
Avalanche Rugged Technology
Rugged Gate Oxide Technology
Lower Input Capacitance
Improved Gate Charge
Extended Safe Operating Area
Lower Leakage Current: 10µA (Max.) @ V
Lower R
: 0.335Ω (Typ.)
DS(ON)
Absolute Maximum Ratings
Characteristic Value UnitsSymbol
Drain-to-Source Voltage Continuous Drain Current (T Continuous Drain Current (T Drain Current-Pulsed Gate-to-Source Volta ge Single Pulsed Avalanche Energy Avalanche Current Repetitive Avalanche Energy Peak Diode Recovery dv/dt Total Power Dissipation (TC=25°C) Linear Derating Factor Operating Juncti on and Storage Temperature Range Maximum Lead Temp. for Soldering Purposes, 1/8
from case for 5-seconds
T
V
DSS
I
D
I
DM
V E
I
AR
E
dv/dt
P
, T
J
T
GS AS
AR
D
STG
L
= 200V
DS
=25°C)
C
=100°C)
C
(1)
(2) (1) (1) (3)
BV R
DSS
DS(on)
= 200 V
ID = 9 A
TO-220
1
2
3
1.Gate 2. Drain 3. Source
200
9
5.7 32
20
±
54
9
6.9
5
69
0.55
- 55 to +150
300
= 0.4
V A A
V
mJ
A
mJ
V/ns
W
W/°C
°C
Thermal Resistance
R
JC
θ
R
θCS
R
θJA
©1999 Fairchild Semiconductor Corpor ation
Characteristic Max. UnitsSymbol Typ.
Junction-to-Case
Case-to-Sink
Junction-to-Ambient
--
0.5
--
1.81
--
62.5
°C/W
Rev. B
1
IRL630A
1&+$11(/
32:(5 026)(7
Electrical Characteristics
CharacteristicSymbol
BV ∆BV/∆T V
R
DSS
GS(th)
I
GSS
I
DSS
DS(on)
g
fs
C
iss
C
oss
C
rss
t
d(on)
t
r
t
d(off)
t
f
Q
Q
gs
Q
gd
Drain-Source Breakdown Voltage Breakdown Voltage Temp. Coeff.
J
Gate Threshold Voltage Gate-Source Leakage , Forwar d Gate-Source Leakage , Revers e
Drain-to-Sou rce Leakage Current
Static Drain-Source On-State Resistance Forward Transconductance Input Capacitance Output Capacitance Reverse Transfer Capacitance Turn-On Delay Time Rise Time Turn-Off Delay Time Fall Time Total Gate Charge
g
Gate-Source Charge Gate-Drain (
Miller ) Charge
(TC=25°C unless otherwise specified)
Max. UnitsTyp.Min. Test Condition
V
200
--
1.0
--
--
--
--
--
--
--
--
--
--
--
--
--
--
--
--
--
0.18
--
--
--
--
--
--
4.5
580
90 44
8 6
30
9
18.6
3.5
8.3
--
--
2.0
100
-100 10
100
0.4
-­755 115
55 25 20 70 30 27
--
--
V
V/°C
V
nA
A
µ
pF
ns
nC
=0V,ID=250µA
GS
I
=250µA
D
VDS=5V,ID=250µA V
=20V
GS
=-20V
V
GS
V
=200V
DS
V
=160V,TC=125°C
DS
=5V,ID=4.5A
V
GS
VDS=40V,ID=4.5A V
=0V,VDS=25V,f =1MHz
GS
See Fig 5
VDD=100V,ID=9A,
=6
R
G
VDS=160V,VGS=5V,
=9A
I
D
See Fig 6 & Fig 12
See Fig 7
See Fig 13
(4)
(4)
(4) (5)
(4) (5)
Source-Drain Diode Ratings and Characteristics
CharacteristicSymbol Max. UnitsTyp.Min. Test Condition
I
I
SM
V
t
Q
Notes;
(1) Repetitive Rating: Pu lse Width Limited by Maximum Junction Temperatu re (2) L=1mH, I (3) I (4) Pulse Test: Pulse Width = 250µs, Duty Cycle ≤ 2%
(5) Essentially Independent of Operating Temper ature
Continuous Source Current
S
Pulsed- S o u rce Curren t Diode Forward Voltage
SD
Reverse Recove ry T ime
rr
Reverse Recovery Ch arge
rr
=9A, VDD=50V, RG=27Ω, Starting TJ =25°C
AS
9A, di/dt ≤ 220A/µs, V
SD
DD
, Starting TJ =25°C
BV
DSS
--
(1)
--
(4)
--
--
--
0.78
--
--
--
158
9
32
1.5
--
--
µ
A V
ns
C
Integral reverse pn-diode in the MOSFET T
=25°C,IS=9A,VGS=0V
J
T
=25°C,IF=9A
J
di
/dt=100A/µs
F
(4)
2
1&+$11(/
32:(5 026)(7
Fig 1. Output Characteristics Fig 2. Transfer Characteristics
V
GS
Top : 7.0 V 6 .0 V
1
5 .5 V
10
5 .0 V 4 .5 V 4 .0 V 3 .5 V Bo ttom : 3 .0 V
0
10
, Drain Current [A]
D
I
-1
10
-1
10
VDS , Drain-Source Voltage [V]
@ Note s :
1. 2 50 µs Puls e Test
2. TC = 25 oC
0
10
IRL630A
1
10
150 oC
0
10
25 oC
, Drain Curre nt [A]
D
I
-1
1
10
10
0246810
- 55 oC
VGS , Gate-Source Voltage [V]
@ Notes :
1. V
2. V
3. 250
= 0 V
GS
= 40 V
DS
s Pulse Test
µ
1.00
0.75
]
, [
DS(on)
R
0.50
0.25
VGS = 5 V
VGS = 10 V
Drain-Sour ce On-Resistance
0.00 0 5 10 15 20 25 30
900
C
720
ID , Drain C urrent [A]
iss
C
= Cgs+ Cgd ( Cds= shorted )
iss
C
= Cds+ C
oss
gd
C
= C
rss
gd
540
C
360
oss
Capacitanc e [pF]
C
180
rss
0
0
10
1
10
VDS , Drain-S ource Voltage [V]
@ Note : TJ = 25 oC
@ Notes :
1. V
= 0 V
GS
2. f = 1 MHz
Fig 4. Source-Drain Diode Forward VoltageFig 3. On-Resistance vs. Drain Curr ent
1
10
0
10
, Reverse Drain Current [A]
150 oC
DR
I
-1
10
0.4 0.6 0.8 1.0 1.2 1.4 1.6 1.8
25 oC
@ Notes :
1. V
GS
2. 250
= 0 V
s Pulse Test
µ
VSD , Source- Drain Voltage [V]
Fig 6. Gate Charge vs. Gate-Source VoltageFig 5. Capacitance vs. Drain-Source Voltage
6
4
2
, Gate-So urce Voltage [V]
GS
V
0
0 4 8 12 16 20
QG , Total G ate Charge [nC]
VDS = 40 V
VDS = 100 V
VDS = 160 V
@ Notes : ID = 9 A
3
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