Fairchild Semiconductor HUF75309T3ST Datasheet

Data Sheet December 2001
HUF75309T3ST
3A, 55V, 0.070 Ohm, N-Channel UltraFET Power MOSFET
This N-Channel po wer MOSFET is manufactured using the innovative UltraFET® process. This advanced
process technology achieves the lowest possible on-resistance per silicon area, resulting in outstanding performance. This device is capable of withstanding high energy in the avalanche mode and the diode exhibits very low reverse recovery time and stored charge. It was designed for use in applications where power efficiency is important, such as switching regulators, switching converters, motor drivers, relay drivers, low­voltage bus switches, and power management in portab le and battery operated products.
Formerly developmental type TA75309.
Ordering Information
PART NUMBER PACKAGE BRAND
HUF75309T3ST SOT-223 5309
NOTE: HUF75309T3ST is available only in tape and reel.
Features
•3A, 55V
• Ultra Low On-Resistance, r
DS(ON)
= 0.070
• Diode Exhibits Both High Speed and Soft Recovery
• Temperature Compensating PSPICE
®
Model
• Thermal Impedance SPICE Model
• Peak Cu rrent vs Pulse Width Curve
• UIS Rating Curve
• Related Literature
- TB334, “Guidelines f or Solde ring Surface Mount Components to PC Boards”
Symbol
D
G
S
Packaging
SOT-223
DRAIN (FLANGE)
GATE DRAIN
SOURCE
Product reliability information can be found at http://www.fairchildsemi.com/products/discrete/reliability/index.html
All Fairchild semiconductor products are manufactured, assembled and tested under ISO9000 and QS9000 quality systems certification.
For severe environments, see our Automotive HUFA series.
©2001 Fairchild Semiconductor Corpo ration HUF75309T3ST Rev. B
HUF75309T3ST
Absolute Maximum Ratings
TA = 25oC, Unless Otherwise Specified
HUF75309T3ST UNITS
Drain to Source Voltage (Note 1). . . . . . . . . . . . . . . . . . . . . . . V
Drain to Gate Voltage (R
= 20k) (Note 1) . . . . . . . . . . . . . V
GS
Gate to Source Voltage . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . V
DSS
DGR
GS
55 V 55 V
±20V V
Drain Current
Continuous (Note 2) (Figure 2). . . . . . . . . . . . . . . . . . . . . . . . . . I
Pulsed Drain Current . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . I
Pulsed Avalanche Rating. . . . . . . . . . . . . . . . . . . . . . . . . . . . . . E
Power Dissipation (Note 2) . . . . . . . . . . . . . . . . . . . . . . . . . . . . . P
D
DM
AS
D
Derate Above 25oC . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .
Operating and Storage Temperature . . . . . . . . . . . . . . . . . .T
Maximum Temperature for Soldering
Leads at 0.063in (1.6mm) from Case for 10s. . . . . . . . . . . . . . . T
Package Body for 10s, See Techbrief 334. . . . . . . . . . . . . . . T
CAUTION: Stresses above those listed in “A bsolute Maximu m Rating s” may cause per manent d amage to t he device. This is a str ess on ly rating and operation o f the device at these or any other conditions above those indicated in the operational sections of this specification is not implied.
, T
J
STG
L
pkg
3
Figure 5
Figures 6, 14, 15
1.1
9.09
-55 to 150
300 260
A
W
mW/oC
o
C
o
C
o
C
NOTE:
1. T
= 25oC to 125oC.
J
Electrical Specifications
TA = 25oC, Unless Otherwise Specified
PARAMETER SYMBOL TEST CONDITIONS MIN TYP MAX UNITS
Drain to Source Breakdown Voltage BV Gate to Source Threshold Voltage V
GS(TH)VGS
Zero Gate Voltage Drain Current I
Gate to Source Leakage Current I Drain to Source On Resistance r
DS(ON)ID
Turn-On Time t Turn-On Delay Time t
d(ON)
Rise Time t Turn-Off Delay Time t
d(OFF)
Fall Time t Turn-Off Time t Total Gate Charge Q
g(TOT)VGS
Gate Charge at 10V Q Threshold Gate Charge Q
Gate to Source Gate Charge Q Gate to Drain “Miller” Charge Q Input Capacitance C Output Capacitance C Reverse Transfer Capacitance C Thermal Resistance Junction to Ambient R
DSSID
DSS
GSS
ON
r
f
OFF
g(10)
g(TH)
gs
gd
ISS
OSS
RSS
θJA
= 250µA, VGS = 0V (Figure 11) 55 - - V
= VDS, ID = 250µA (Figure 10) 2 - 4 V VDS = 50V, VGS = 0V - - 1 µA V
= 45V, VGS = 0V, TA = 150oC - - 250 µA
DS
VGS = ±20V - - 100 nA
= 3A, VGS = 10V (Figure 9) - 0.057 0.070
VDD = 30V, ID 3A, RL = 10Ω, V
GS
= 10V, R
GS
= 28
- - 45 ns
-8-ns
-20-ns
-12-ns
-28-ns
- - 65 ns
= 0V to 20V VDD = 30V, ID 3A,
R
= 10
VGS = 0V to 10V - 10.7 13 nC VGS = 0V to 2V - 0.71 0.85 nC
L
I
= 1.0mA
g(REF)
(Figure 13)
-1923nC
-1.40- nC
-4.80- nC
VDS = 25V, VGS = 0V, f = 1MHz (Figure 12)
- 352 - pF
- 146 - pF
-30-pF Pad Area = 0.164 in2 (See note 2) - - 110 Pad Area = 0.068 in Pad Area = 0.026 in
2
(See TB377) - - 126
2
(See TB377) - - 143
o o o
C/W C/W C/W
Source to Drain Diode Specifications
PARAMETER SYMBOL TEST CONDITIONS MIN TYP MAX UNITS
Source to Drain Diode Voltage V Reverse Recovery Time t Reverse Recovered Charge Q
NOTE:
o
2. 110
C/W measured using FR-4 board with 0.164 in2 footprint for 1000 seconds.
©2001 Fairchild Semiconductor Corpo ration HUF75309T3ST Rev. B
SD rr RR
ISD = 3A - - 1.25 V ISD = 3A, dISD/dt = 100A/µs--41ns ISD = 3A, dISD/dt = 100A/µs--59nC
Typical Performance Curves
0
0
0
HUF75309T3ST
1.2
1.0
0.8
0.6
0.4
0.2
POWER DISSIPATION MULTIPLIER
0
0255075100 15
125
TA, AMBIENT TEMPERATURE (oC)
FIGURE 1. NORMALIZED POWER DISSIPATION vs AMBIENT
TEMPERATURE
DUTY CYCLE - DESCENDING ORDER
1
0.5
0.2
0.1
0.05
0.02
0.01
0.1
4
R
= 110oC/W
θJA
3
2
, DRAIN CURRENT (A)
D
1
I
0
25 50 75 100 125 15
TA, AMBIENT TEMPERATURE (oC)
FIGURE 2. MAXIMUM CONTINUOUS DRAIN CURRENT vs
AMBIENT TEMPERATURE
, NORMALIZED
JA
0.01
θ
Z
THERMAL IMPEDANCE
SINGLE PULSE
0.001
-5
10
-4
10
-3
10
-2
10
t, RECTANGULAR PULSE DURATION (s)
FIGURE 3. NORMALIZED MAXIMUM TRANSIENT THERMAL IMPEDANCE
100
10
1
, DRAIN CURRENT (A)
D
I
OPERATION IN THIS AREA MAY BE
0.1
LIMITED BY r
DS(ON)
V
DSS(MAX
110100
VDS, DRAIN TO SOURCE VOLTAGE (V)
TJ = MAX RATED
= 25oC
T
A
R
θJA
100µs
1ms
) = 55V
= 110oC/W
10ms
20
P
DM
t
1
t NOTES: DUTY FACTOR: D = t PEAK TJ = PDM x Z
-1
10
50
10
0
TA = 25oC R
= 110oC/W
θJA
1
10
θ
FOR TEMPERATURES ABOVE 25 CURRENT AS FOLLOWS:
I = I
25
2
1/t2
x R
JA
10
+ T
JA
θ
2
o
C DERATE PEAK
150 - T
125
A
3
10
A
10
, PEAK CURRENT (A)
DM
I
1
-3
10
-2
10
-1
10
0
10
1
10
2
10
3
10
t, PULSE WIDTH (s)
FIGURE 4. FORWARD BIAS SAFE OPERAT ING AREA F IGURE 5. PEAK CURRENT CAPABILITY
©2001 Fairchild Semiconductor Corpo ration HUF75309T3ST Rev. B
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