Fairchild Semiconductor HGTP14N36G3VL, HGT1S14N36G3VLS Datasheet

December 2001
HGTP14N36G3VL,
HGT1S14N36G3VL,
HGT1S14N36G3VLS
14A, 360V N-Channel,
Logic Level, Voltage Clamping IGBTs
Features
• Logic Level Gate Drive
• Internal Voltage Clamp
• ESD Gate Protection
•T
= 175oC
J
• Ignition Energy Capable
Description
This N-Channel IGBT is a MOS gated, logic level device which is intended to be used as an ig niti on coil driver in auto­motive ignition circuits. Unique features include an active voltage clamp between the collector and the gate which pro­vides Self Clamped Inductive Switching (SCIS) capability in ignition c ircuits. Internal diodes provide ESD pr otection for the logic level gate. Both a series resistor and a shunt resister are provi ded in the gate circuit.
PACKAGING AVAILABILITY
PART NUMBER PACKAGE BRAND
HGTP14N36G3VL TO-220AB 14N36GVL HGT1S14N36G3VL TO-262AA 14N36GVL HGT1S14N36G3VLS TO-263AB 14N36GVL
NOTE: When ordering, use the entire part number. Add the suffix 9A to obtain the TO-263AB variant in the tape and reel, i.e., HGT1S14N36G3VLS9A.
The development type number for this device is TA49021.
Packages
JEDEC TO-220AB
COLLECTOR (FLANGE)
JEDEC TO-262AA
COLLECTOR (FLANGE)
JEDEC TO-263AB
GATE
EMITTER
N-CHANNEL ENHANCEMENT MODE
GATE
EMITTER
COLLECTOR
GATE
EMITTER
COLLECTOR
GATE
COLLECTOR
(FLANGE)
COLLECTOR
R
1
R
2
EMITTER
Absolute Maximum Ratings
Collector-Emitter Bkdn Voltage at 10mA . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . BV
Emitter-Collector Bkdn Voltage at 10mA . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . BV
Collector Current Continuous at V
Gate-Emitter Voltage (Note) . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . V
Inductive Switching Current at L = 2.3mH, T
at L = 2.3mH, T Collector to Emitter Avalanche Energy at L = 2.3mH, T Power Dissipation Total at T Power Dissipation Derating T
Operating and Storage Junction Temperature Range . . . . . . . . . . . . . . . . . . . . . T
Maximum Lead Temperature for Soldering . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . T
Electrostatic Voltage at 100pF, 1500Ω. . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . ESD 6 KV
NOTE: May be exceeded if I
©2001 Fairchild Semiconductor Corpo ration HGTP14N36G3VL, HGT1S14N36G3VL, HGT1S14N36G3VLS Rev. B
at VGE = 5V, TC = +100oC. . . . . . . . . . . . . . . . . . . . . . I
= +25oC . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . P
C
C
GEM
TC = +25oC, Unless Otherwise Specified
HGTP14N36G3VL,
HGT1S14N36G3VL,
HGT1S14N36G3VLS UNITS
CER
= 5V, TC = +25oC. . . . . . . . . . . . . . . . . . . . . . . I
GE
= +25oC . . . . . . . . . . . . . . . . . . . . . . . I
C
= + 175oC . . . . . . . . . . . . . . . . . . . . . .I
C
> +25oC. . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 0.67 W/oC
is limited to 10mA.
= +25oC. . . . . . . . . . . . . . . E
C
ECS
C25
C100
GEM SCIS SCIS
AS
D
, T
J
STG
L
390 V
24 V 18 A 14 A
±10 V
17 A
12 A 332 mJ 100 W
-40 to +175 260
o
C
o
C
Specifications HGTP14N36G3VL, HGT1S14N36G3 VL, HGT1S14N36 G3 VLS
Electrical Specifications
TC = +25oC, Unless Otherwise Specified
PARAMETERS SYMBOL TEST CONDITIONS
Collector-Emitter Breakdown Voltage BV
Gate-Emitter Plateau Voltage V
Gate Charge Q
Collector-Emitter Clamp Breakdown Voltage
Emitter-Collector Breakdown Voltage BV
Collector-Emitter Leakage Current I
Collector-Emitter Saturation Voltage V
CER
GEP
G(ON)IC
BV
CE(CL)IC
ECS
CER
CE(SAT)IC
LIMITS
UNITSMIN TYP MAX
IC = 10mA, V
= 0V
GE
= 1k
R
GE
IC = 7A, V
= 12V
CE
= 7A,
V
= 12V
CE
= 7A
R
= 1000
G
= +175oC 320 355 400 V
T
C
T
= +25oC 330 360 390 V
C
= -40oC 320 350 385 V
T
C
= +25oC-2.7-V
T
C
= +25oC-24-nC
T
C
T
= +175oC 350 380 410 V
C
IC = 10mA TC = +25oC2428-V
VCE = 250V
= 1k
R
GE
= 7A
V
= 4.5V
GE
T
= +25oC-- 25µA
C
T
= +175oC - - 250 µA
C
= +25oC - 1. 25 1.45 V
T
C
T
= +175oC - 1.15 1.6 V
C
Gate-Emitter Threshold Voltage V
GE(TH)IC
Gate Series Resistance R
Gate-Emitter Resistance R
Gate-Emitter Leakage Current I
Gate-Emitter Breakdown Voltage BV
Current Turn-Off Time-Inductive Load t
D(OFF)I
t
F(OFF)I
Inductive Use Test I
Thermal Resistance R
GES
GES
SCIS
θJC
= 14A
I
C
= 5V
V
GE
= 1mA
= V
V
CE
GE
1
2
T
= +25oC-1.62.2V
C
= +175oC-1.72.9V
T
C
TC = +25oC 1.3 1.8 2.2 V
TC = +25oC-75-
TC = +25oC 102030k
VGE = ±10V ±330 ±500 ±1000 µA
I
= ±2mA ±12 ±14 - V
GES
+
IC = 7A, RL = 28 R
= 25, L = 550µH,
G
= 300V, VGE = 5V,
V
CL
T
= +175oC
C
L = 2.3mH, V
= 5V,
G
= +175oC12--A
T
C
T
= +25oC17--A
C
-7-µs
--1.5oC/W
©2001 Fairchild Semiconductor Corpo ration HGTP14N36G3VL, HGT1S14N36G3VL, HGT1S14N36G3VLS Rev. B
HGTP14N36G3VL, HGT1S14N36G3VL, HGT1S14N36G3VLS
Typical Performance Curves
PULSE DURATIO N = 250µs, DUTY CYCLE <0.5%, V
25
CE
= 10V
PULSE DURATION = 250µs, DUTY CYCLE <0.5%, T
40
10V
20
30
15
20
10
o
+25
+175oC
5
, COLLECTOR-EMITTER CURRENT (A)
CE
I
0
C
-40oC
2 1345
10
, COLLECTOR-EMITTER CURRENT (A)
CE
I
0
0246810
VGE, GATE-TO-EMITTER VOLTAGE (V)
, COLLECTOR-TO-EMITTER VOLTAGE (V)
V
CE
FIGURE 1. TRANSFER CHARACTERISTICS FIGURE 2. SATURATION CHARACTERISTICS
35
30
25
20
15
TC = +175oC
V
V
V
GE
GE
GE
= 5.0V
= 4.5V
= 4.0V
35
VGE = 4.5V
30
25
20
15
3.5V
-40oC
5.0V
4.5V
4.0V
3.0V
2.5V
= +25oC
C
o
+25
+175oC
C
10
5
, COLLECTOR EMITTER CURRENT (A)
CE
I
0
V
, SATURATION VOLTAGE (V)
CE(SAT)
4
53210
FIGURE 3. COLLECTO R-EMI TTER CU RRENT AS A FUNC TION
OF SATURATION VOLTAGE
1.35
1.25
1.15
, SATURATION VOLTAGE (V)
CE(SAT)
V
1.05
-25 +25 +75 +125 +175 TJ, JUNCTION TEMPERATURE (oC)
ICE = 7A
VGE = 4.0V
VGE = 4.5V
VGE = 5.0V
10
5
, COLLECTOR EMITTER CURRENT (A)
CE
I
0
01234 5
V
, SATURATION VOLTAGE (V)
CE(SAT)
FIGURE 4. COLLECTOR-EMITTER CURRENT AS A FUNCTION
OF SATURATION VOLTAGE
2.25 ICE = 14A
VGE = 4.0V
2.00
1.75
, SATURATION VOLTAGE (V)
CE(SAT)
V
1.50
-25 +25 +75 TJ, JUNCTION TEMPERATURE (oC)
VGE = 4.5V
VGE = 5.0V
+125
+175
FIGURE 5. SATURATION VOLTAGE AS A FUNCTION OF
JUNCTION TEMPERATURE
©2001 Fairchild Semiconductor Corpo ration HGTP14N36G3VL, HGT1S14N36G3VL, HGT1S14N36G3VLS Rev. B
FIGURE 6. SATURATION VOLTAGE AS A FUNCTION OF
JUNCTION TEMPERATURE
Loading...
+ 5 hidden pages