Fairchild Semiconductor HGTP12N60B3D Datasheet

HGTG12N60B3D, HGTP12N60B3D,
HGT1S12N60B3DS
Data Sheet December 2001
27A, 600V, UFS Series N-Channel IGBTs with Anti-Parallel Hyperfast Diode
This family of MOS gated high voltage switching devices combine the best features of MOSFETs and bipolar transistors . These devices ha ve the high inpu t impe dance of a MOSFET and the low on-s tate con duction lo ss of a bi polar transistor. The much lower on-state voltage drop varies only moderately bet ween 2 5
o
C and 150oC. The IGBT used is the dev elo pm ent type TA49171. The diode used in anti-parall el with the IGBT is the development type TA49188.
The IGBT is ideal for many high voltage switchi ng applications operating at moderate freq ue ncies where low conduction losses are ess ential, such as: AC and DC motor controls, power supplies and drivers for solenoids, relays and contactors.
Formerly developmental type TA49173.
Ordering Information
PART NUMBER PACKAGE BRAND
HGTP12N60B3D TO-220AB 12N60B3D HGTG12N60B3D TO-247 12N60B3D HGT1S12N60B3DS TO-263AB 12N60B3D
NOTE: When ordering, use the entire part number. Add the suffix 9A to obtain the TO-263AB variant in tape and reel, e.g. HGT1S12N60B3DS9A.
Symbol
Features
• 27A, 600V, TC = 25oC
• 600V Switching SOA Capability
• Typical Fall Time. . . . . . . . . . . . . . . . 112ns at T
• Short Circuit Rating
• Low Conduction Loss
• Hyperfast Anti-Parallel Diode
• Related Literature
- TB334 “Guidelines f or Solde ring Surface Mount Components to PC Boards
Packaging
JEDEC TO-220AB (ALTERNATE VERSION)
COLLECTOR (FLANGE)
E
C
G
JEDEC TO-263AB
G
E
COLLECTOR (FLANGE)
= 150oC
J
C
G
E
Fairchild CORPORATION IGBT PRODUCT IS COVE RED BY ONE OR MORE OF THE FOLLOWING U.S. PATENTS
4,364,073 4,417,385 4,430,792 4,443,931 4,466,176 4,516,143 4,532,534 4,587,713 4,598,461 4,605,948 4,620,211 4,631,564 4,639,754 4,639,762 4,641,162 4,644,637 4,682,195 4,684,413 4,694,313 4,717,679 4,743,952 4,783,690 4,794,432 4,801,986 4,803,533 4,809,045 4,809,047 4,810,665 4,823,176 4,837,606 4,860,080 4,883,767 4,888,627 4,890,143 4,901,127 4,904,609 4,933,740 4,963,951 4,969,027
©2001 Fairchild Semiconductor Corpo ration HGTG12N60B3D, HGTP12N60B3D, HGT1S12N60B3DS Rev. B
JEDEC STYLE TO-247
E
C
COLLECTOR (BOTTOM SIDE METAL)
G
HGTG12N60B3D, HGTP12N60B3D, HGT1S12N60B3DS
Absolute Maximum Ratings
TC = 25oC, Unless Otherwise Specified
HGTG12N60B3D, HGTP12N60B3D,
HGT1S12N60B3DS UNITS
Collector to Emitter Voltage . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . BV
Collector Current Continuous. . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . I
= 110oC . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . I
At T
C
Collector Current Pulsed (Note 1) . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . I
Gate to Emitter Voltage Continuous. . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . V
Gate to Emitter Voltage Pulsed . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . V
Switching Safe Operating Area at T
= 150oC (Figure 2) . . . . . . . . . . . . . . . . . . . . . . . SSOA 96A at 600V
J
Maximum Power Dissipation . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . P
CES
C25
C110
CM
GES
GEM
D
Linear Derating Factor . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 0.83 W/
Reverse Voltage Avalanche Energy. . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . E
Operating and Storage Temperature . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . T
ARV
, T
J
STG
Maximum Temperature for Soldering
Leads at 0.063in (1.6mm) from Case for 10s. . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . T
Package Body for 10s, see Tech Brief 334. . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .T
Short Circuit Withstand Time (Not e 2) at V Short Circuit Withstand Time (Not e 2) at V
CAUTION: Stresses above those listed in “A bsolute Maximu m Rating s” may cause per manent d amage to t he device. This is a str ess on ly rating and operation o f the device at these or any other conditions above those indicated in the operational sections of this specification is not implied.
= 12V. . . . . . . . . . . . . . . . . . . . . . . . . . . . . .t
GE
= 10V. . . . . . . . . . . . . . . . . . . . . . . . . . . . . .t
GE
L
pkg
SC SC
600 V
27 A 12 A
110 A
±20 V ±30 V
104 W
100 mJ
-55 to 150
300 260
5 µs
10 µs
o
C
o
C
o
C
o
C
NOTES:
1. Pulse width limited by maximum junction temperature.
2. V
= 360V, TJ = 125oC, RG = 25Ω.
CE(PK)
Electrical Specifications
TC = 25oC, Unless Otherwise Specified
PARAMETER SYMBOL TEST CONDITIONS MIN TYP MAX UNITS
Collector to Emitter Breakdown Voltage BV Collector to Emitter Leakage Current I
Collector to Emitter Saturation Voltage V
Gate to Emitter Threshold Voltage V Gate to Emitter Leakage Current I
CES
CES
CE(SAT)IC
GE(TH)
GES
Switching SOA SSOA T
Gate to Emitter Plateau Voltage V On-State Gate Charge Q
Current Turn-On Delay Time t Current Rise Time t Current Turn-Off Delay Time t Current Fall Time t Turn-On Energy E Turn-Off Energy (Note 3) E Current Turn-On Delay Time t Current Rise Time t Current Turn-Off Delay Time t Current Fall Time t Turn-On Energy E Turn-Off Energy (Note 3) E
GEP
g(ON)
d(ON)I
rI
d(OFF)I
fI
ON
OFF
d(ON)I
rI
d(OFF)I
fI
ON
OFF
IC = 250µA, VGE = 0V 600 - - V VCE = BV
V
= I
GE
C110
= 15V
CES
,
IC = 250µA, VCE = V
TC = 25oC - - 250 µA T
= 150oC--2.0mA
C
T
= 25oC-1.62.1V
C
= 150oC-1.72.5V
T
C
GE
4.5 4.9 6.0 V
VGE = ±20V - - ±250 nA
= 150oC, RG = 25Ω, VGE = 15V
J
L = 100µH, V IC = I
C110
IC = I
C110
= 0.5 BV
V
CE
= 600V
CE
, VCE = 0.5 BV ,
VGE = 15V - 51 60 nC
CES
V
CES
= 20V - 68 78 nC
GE
IGBT and Diode at TJ = 25oC
= I
I
CE
C110
VCE = 0.8 BV
CES
VGE = 15V
= 25
R
G
L = 1mH Test Circuit (Figure 19)
96 - - A
-7.3- V
-26- ns
-23- ns
- 150 - ns
-62- ns
- 304 350 µJ
- 250 350 µJ
IGBT and Diode at TJ = 150oC
= I
I
CE
C110
VCE = 0.8 BV
CES
VGE = 15V
= 25
R
G
L = 1mH Test Circuit (Figure 19)
-22- ns
-23- ns
- 280 295 ns
- 112 175 ns
- 500 525 µJ
- 660 800 µJ
©2001 Fairchild Semiconductor Corpo ration HGTG12N60B3D, HGTP12N60B3D, HGT1S12N60B3DS Rev. B
HGTG12N60B3D, HGTP12N60B3D, HGT1S12N60B3DS
Electrical Specifications
TC = 25oC, Unless Otherwise Specified (Continued)
PARAMETER SYMBOL TEST CONDITIONS MIN TYP MAX UNITS
Diode Forward Voltage V Diode Reverse Recovery Time t
Thermal Resistance Junction To Case R
EC
rr
θJC
IEC = 12A - 1.7 2.1 V IEC = 12A, dIEC/dt = 200A/µs - 32 40 ns
= 1.0A, dIEC/dt = 200A/µs - 23 30 ns
I
EC
IGBT - - 1.2 Diode - - 1.9
NOTE:
3. Turn-Off Energy Loss (E at the point where the collector current equals zero (I
) is defined as the integral of the instantaneous power loss starting at the trailing edge of the input pulse and ending
OFF
= 0A). All devices were tested per JEDEC Standard No. 24-1 Method for Measurement
CE
of Power Device Tur n-Off Switching L oss. This test method produces the true total Turn-Off Energy Loss.
Typical Performance Curves
30
25
20
15
10
, DC COLLECTOR CURRENT (A)
5
CE
I
0
25 75 100 125 150
50
TC, CASE TEMPERATURE (oC)
Unless Otherwise Specified
= 15V
V
GE
100
TJ = 150oC, RG = 25Ω, V
90 80 70 60 50 40 30 20 10
, COLLECTOR TO EMITTER CURRENT (A)
0
CE
0
I
VCE, COLLECTOR TO EMITTER VOLTAGE (V)
= 15V, L = 100µH
GE
300 400200100 500 600
o o
C/W C/W
700
FIGURE 1. DC COLLECTOR CURRENT vs CASE
FIGURE 2. MINIMUM SWITCHING SAFE OPERATING AREA
TEMPERATURE
300
TJ = 150oC, RG = 25, L = 1mH, V
100
10
f
= 0.05 / (t
MAX1
= (PD - PC) / (EON + E
f
MAX2
P
= CONDUCTION DISSIPATION
, OPERATING FREQUENCY (kHz)
f
C
(DUTY FACTOR = 50%) R
MAX
= 1.2oC/W, SEE NOTES
θJC
1
2
3
I
, COLLECTOR TO EMITTER CURRENT (A)
CE
d(OFF)I
+ t
d(ON)I
OFF
= 480V
CE
)
)
T
C
75 75
110 110oC
V
GE
o
15V
C
o
10V
C
o
15V
C
10V
FIGURE 3. OPERATING FREQUENCY vs COLLECT OR TO
3010 20
16
14 90
12
10
8
6
4
, SHORT CIRCUIT WITHSTAND TIME (µs)
2
SC
t
VCE = 360V, RG = 25, TJ = 125oC
I
SC
t
SC
10 11 12 13 14 15
VGE, GATE TO EMITTER VOLTAGE (V)
FIGURE 4. SHORT CIRCUIT WITHSTAND TIME
100
80
70
60
50
40
30
EMITTER CURRENT
©2001 Fairchild Semiconductor Corpo ration HGTG12N60B3D, HGTP12N60B3D, HGT1S12N60B3DS Rev. B
, PEAK SHORT CIRCUIT CURRENT (A)
SC
I
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