Fairchild FDT3N40 service manual

FDT3N40
400V N-Channel MOSFET
FDT3N40 400V N-Channel MOSFET
November 2009
TM
UniFET
• 2A, 400V, R
• Low gate charge ( typical 4.5 nC)
•Low C
•Fast switching
• 100% avalanche tested
• Improved dv/dt capability
( typical 3.7 pF)
rss
= 3.4 @VGS = 10 V
DS(on)
D
G
S
SOT-223
FDT Series
Description
These N-Channel enhancement mode power field effect transistors are produced using Fairchild’s proprietary, planar stripe, DMOS technology.
This advanced technology has been especially tailored to minimize on-state resistance, provide superior switching performance, and withstand high energy pulse in the avalanche and commutation mode. These devices are well suited for high efficient switched mode power supplies and active power factor correction.
Absolute Maximum Ratings
Symbol Parameter FDT3N40 Unit
V
DSS
I
D
I
DM
V
GSS
E
AS
I
AR
E
AR
dv/dt Peak Diode Recovery dv/dt P
D
T
J, TSTG
T
L
* Drain current limited by maximum junction temperature
Drain-Source Voltage 400 V Drain Current - Continuous (TC = 25C)
- Continuous (T Drain Current - Pulsed Gate-Source voltage 30 V Single Pulsed Avalanche Energy Avalanche Current (Note 1) 2A Repetitive Avalanche Energy (Note 1) 0.2 mJ
Power Dissipation (TC = 25C)
- Derate above 25C Operating and Storage Temperature Range -55 to +150 C Maximum Lead Temperature for Soldering Purpose,
1/8” from Case for 5 Seconds
= 100C)
C
(Note 1)
(Note 2)
(Note 3) 4.5 V/ns
*
2.0
*
1.2
*
8.0
46 mJ
2
0.02
300 C
Thermal Characteristics
A A
A
W
W/C
Symbol Parameter Typ Max Unit
*
R
JA
* Surface Mounted on JESD51-3 Board, T<0.1sec.
©2009 Fairchild Semiconductor Corporation 1 www.fairchildsemi.com
FDT3N40 Rev. A
Thermal Resistance, Case-to-Sink Typ. -- 60 C/W
Package Marking and Ordering Information
Device Marking Device Package Reel Size Tape Width Quantity
FDT3N40 FDT3N40TF SOT-223 330mm 12mm 4000
FDT3N40 400V N-Channel MOSFET
Electrical Characteristics T
= 25°C unless otherwise noted
C
Symbol Parameter Conditions Min. Typ. Max Units
Off Characteristics
BV
DSS
BV / T
I
DSS
I
GSSF
I
GSSR
On Characteristics
V
GS(th)
R
DS(on)
g
FS
Dynamic Characteristics
C
iss
C
oss
C
rss
Switching Characteristics
t
d(on)
t
r
t
d(off)
t
f
Q
g
Q
gs
Q
gd
Drain-Source Diode Characteristics and Maximum Ratings
I
S
I
SM
V
SD
t
rr
Q
rr
Drain-Source Breakdown Voltage VGS = 0V, ID = 250A 400 -- -- V Breakdown Voltage Temperature
DSS
Coefficient
J
Zero Gate Voltage Drain Current VDS = 400V, VGS = 0V
I
= 250A, Referenced to 25C--0.4--V/C
D
V
= 320V, TC = 125C
DS
--
--
--
--
1
10
AA
Gate-Body Leakage Current, Forward VGS = 30V, VDS = 0V -- -- 100 nA Gate-Body Leakage Current, Reverse VGS = -30V, VDS = 0V -- -- -100 nA
Gate Threshold Voltage VDS = VGS, ID = 250A3.0--5.0V Static Drain-Source
On-Resistance Forward Transconductance VDS = 40V, ID = 1A
Input Capacitance VDS = 25V, VGS = 0V, Output Capacitance -- 30 40 pF
V
= 10V, ID = 1A -- 2.8 3.4
GS
(Note 4)
-- 2 -- S
-- 173 225 pF
f = 1.0MHz
Reverse Transfer Capacitance -- 3.7 6 pF
Turn-On Delay Time VDD = 200V, ID = 2A
R
= 25
Turn-On Rise Time -- 30 70 ns
G
-- 10 30 ns
Turn-Off Delay Time -- 10 30 ns Turn-Off Fall Time -- 25 60 ns Total Gate Charge VDS = 320V, ID = 2A
V
= 10V
Gate-Source Charge -- 1.2 -- nC
GS
Gate-Drain Charge -- 2 -- nC
(Note 4, 5)
-- 4.5 6 nC
(Note 4, 5)
Maximum Continuous Drain-Source Diode Forward Current -- -- 2 A Maximum Pulsed Drain-Source Diode Forward Current -- -- 8 A Drain-Source Diode Forward Voltage VGS = 0V, IS = 2A -- -- 1.4 V Reverse Recovery Time VGS = 0V, IS = 2A
dI
/dt =100A/s (Note 4)
Reverse Recovery Charge -- 0.75 -- C
F
-- 210 -- ns
NOTES:
1. Repetitive Rating: Pulse width limited by maximum junction temperature
2. L = 10mH, IAS = 2A, VDD = 50V, RG = 25, Starting TJ = 25C
3. ISD 2A, di/dt 200A/s, VDD BV
4. Pulse Test: Pulse width 300s, Duty Cycle 2%
5. Essentially Independent of Operating Temperature Typical Characteristics
, Starting TJ = 25C
DSS
FDT3N40 Rev. A
2 www.fairchildsemi.com
Typical Performance Characteristics
45678910
10
0
10
1
150oC
25oC
-55oC
* Notes :
1. V
DS
= 40V
2. 250
s Pulse Test
I
D
, Drain Current [A]
V
, Gate-Source Voltage [V]
10
-1
10
0
10
1
10
-2
10
-1
10
0
10
1
V
GS
Top : 15.0 V
10.0 V
8.0 V
7.0 V
6.5 V
6.0 V Bottom : 5.5 V
* Notes :
1. 250
s Pulse Test
2. T
C
= 25oC
I
D
, Drain Current [A]
V
, Drain-Source Voltage [V]
0123456
1
2
3
4
5
6
7
8
9
10
11
12
13
14
15
VGS = 20V
VGS = 10V
* Note : TJ = 25oC
R
DS(ON)
[], Drain-Source On-Resistance
ID, Drain Current [A]
0.2 0.4 0.6 0.8 1.0 1.2 1.4 1.6 1.8 2.0
10
-1
10
0
10
1
150oC
* Notes :
1. V
GS
= 0V
2. 250
s Pulse Test
25oC
I
DR
, Reverse Drain Current [A]
VSD, Source-Drain voltage [V]
10
-1
10
0
10
1
0
50
100
150
200
250
300
350
C
iss
= Cgs + Cgd (Cds = shorted)
C
oss
= Cds + C
gd
C
rss
= C
gd
* Note :
1. V
GS
= 0 V
2. f = 1 MHz
C
rss
C
oss
C
iss
Capacitances [pF]
VDS, Drain-Source Voltage [V]
012345
0
2
4
6
8
10
12
VDS = 200V
VDS = 80V
VDS = 320V
* Note : ID = 2A
V
GS
, Gate-Source Voltage [V]
QG, Total Gate Charge [nC]
Figure 1. On-Region Characteristics Figure 2. Transfer Characteristics
Figure 3. On-Resistance Variation vs. Figure 4. Body Diode Forward Voltage
Drain Current and Gate Voltage Variation vs. Source Current
and Temperatue
FDT3N40 400V N-Channel MOSFET
Figure 5. Capacitance Characteristics Figure 6. Gate Charge Characteristics
FDT3N40 Rev. A
3 www.fairchildsemi.com
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