Dual Notebook Power Supply N-Channel PowerTrench® SyncFET™
General Description
The FDS6982AS is designed to replace two single SO8 MOSFETs and Schottky diode in synchronous
DC:DC power supplies that provide various peripheral
voltages for notebook computers and other battery
powered electronic devices. FDS6982AS contains two
unique 30V, N-channel, logic level, PowerTrench
MOSFETs designed to maximize power conversion
efficiency. The high-side switch (Q1) is designed with
specific emphasis on reducing switching losses while
the low-side switch (Q2) is optimized to reduce
conduction losses. Q2 also includes an integrated
Schottky diode using ON Semiconductor’s
monolithic SyncFET technology.
Applications
• Notebook
Features
•Q2: Optimized to minimize conduction losses
•Low gate charge (21nC typical)
•Q1: Optimized for low switching losses
•Low gate charge (11nC typical)
Includes SyncFET Schottky body diode
8.6A, 30V R
6.3A, 30V R
max= 13.5mΩ@ VGS = 10V
DS(on)
R
max= 16.5mΩ@ VGS = 4.5V
DS(on)
max= 28.0mΩ@ V
DS(on)
R
max= 35.0mΩ@ V
DS(on)
= 10V
GS
= 4.5V
GS
FDS6982AS
D1
D1
D2
D2
G1
S2
S1
G2
SO-8
Absolute Maximum Ratings T
= 25°C unless otherwise noted
A
5
Q1
6
7
Q2
8
4
3
2
1
SymbolParameterQ2 Q1 Units
V
DSS
V
GSS
ID Drain Current - Continuous (Note 1a)8.66.3A
PD Power Dissipation for Dual Operation 2 W
TJ, T
STG
Drain-Source Voltage3030V
Gate-Source Voltage
- Pulsed3020
Power Dissipation for Single Operation (Note 1a)1.6
(Note 1b)
(Note 1c)
Operating and Storage Junction Temperature Range –55 to +150
SymbolParameterTest Conditions TypeMinTyp Max Units
Off Characteristics
BV
Drain-Source Breakdown
DSS
Voltage
∆BVDSS
∆T
I
DSS
Breakdown Voltage
Temperature Coefficient
J
Zero Gate Voltage Drain
Current
I
Gate-Body Leakage
GSS
VGS = 0 V, ID = 1 mA
= 0 V, ID = 250 uA
V
GS
I
= 1 mA, Referenced to 25°C
D
= 250 µA, Referenced to 25°C
I
D
Q1
Q2
Q1
VDS = 24 V, VGS = 0 V Q2
Q1
V
= ±20 V, VDS = 0 V
GS
Q2
Q1
30
30
28
24
500
±100
V
mV/°C
µA
1
nA
Q2
On Characteristics (Note 2)
V
Gate Threshold Voltage VDS = VGS, ID = 1 mA
GS(th)
∆VGS(th)
∆TJ
R
DS(on)
Gate Threshold Voltage
Temperature Coefficient
Static Drain-Source
On-Resistance
I
On-State Drain Current VGS = 10 V, VDS = 5 V Q2
D(on)
V
= VGS, ID = 250 µA
DS
ID = 1 mA, Referenced to 25°C
I
= 250 uA, Referenced to 25°C
D
VGS = 10 V, ID = 8.6 A
= 10 V, ID = 8.6 A, TJ = 125°C
V
GS
V
= 4.5 V, ID = 7.5 A
GS
V
= 10 V, ID = 6.3 A
GS
= 10 V, ID = 6.3 A, TJ = 125°C
V
GS
= 4.5 V, ID = 5.6 A
V
GS
gFS Forward Transconductance VDS = 5 V, ID = 8.6 A
= 5 V, ID = 6.3 A
V
DS
Q2
Q1 1 1
1.4
1.9 3 3
Q2–3.1
Q1–4.3
Q2 11
Q120
16
13
26
25
13.5
20.0
16.5
28
33
35
30
Q1
Q2
Q1
20
32
19
S
V
mV/°C
mΩ
A
Dynamic Characteristics
C
Input Capacitance Q2
iss
C
Output Capacitance Q2
oss
C
Reverse Transfer Capacitance
rss
RG Gate Resistance VGS = 15mV, f = 1.0 MHz Q2
V
= 10 V, VGS = 0 V,
DS
f = 1.0 MHz
Q1
Q1
Q2
Q1
Q1
1250
610
410
180
130
85
1.4
2.2
pF
pF
pF
Ω
Switching Characteristics (Note 2)
t
Turn-On Delay Time Q2
d(on)
t
t
t
t
t
t
t
r
d(off)
f
d(on)
r
d(off)
f
Turn-On Rise TimeQ2
Turn-Off Delay Time Q2
Turn-Off Fall Time
Turn-On Delay Time Q2
Turn-On Rise TimeQ2
Turn-Off Delay Time Q2
Turn-Off Fall Time
= 15 V, ID = 1 A,
V
DD
= 10V, R
V
GS
V
= 15 V, ID = 1 A,
DD
= 4.5V, R
V
GS
GEN
GEN
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= 6 Ω
= 6 Ω
2
Q1
Q1
Q1
Q2
Q1
Q1
Q1
Q1
Q2
Q1
9
6 7 12
10
18
20
ns
ns
14
27
24
44
39
ns
11 3 20 6 ns
12
13
19
10 5 20
12
14
15
22
22
23
25
34
27
ns
ns
ns
ns
10
Page 3
FDS6982AS
Electrical Characteristics (continued)T
= 25°C unless otherwise noted
A
Symbol Parameter Test Conditions Type MinTyp Max Units
Switching Characteristics (Note 2)
Q
Qg
Qgs
Qgd
g
(TOT)
Total Gate Charge at Vgs=10V
Total Gate Charge at Vgs=5V
Gate–Source Charge
Gate–Drain Charge
Q2:
V
= 15 V, ID = 11.5A
DS
Q1:
V
= 15 V, ID = 6.3A
DS
Q2
Q1
Q2
Q1
Q2
Q1
Q2
Q1
21
11
30
15
12 6 16 9 nC
3.1
nC
1.8
3.6
nC
2.4
Drain–Source Diode Characteristics and Maximum Ratings
IS Maximum Continuous Drain-Source Diode Forward Current Q2
Q1
T
rr
Reverse Recovery Time 19
Qrr Reverse Recovery Charge
T
rr
Reverse Recovery Time 20
Qrr Reverse Recovery Charge
VSD Drain-Source Diode Forward
Voltage
I
= 11.5 A,
F
d
= 300 A/µs(Note 3)
iF/dt
I
= 6.3 A,
F
d
= 100 A/µs(Note 3)
iF/dt
VGS = 0 V, IS = 3 A(Note 2)
VGS = 0 V, IS = 6 A(Note 2)
VGS = 0 V, IS = 1.3 A(Note 2)
Notes:
1. R
is the sum of the junction-to-case and case-to-ambient thermal resistance where the case thermal reference is defined as the solder mounting surface of
Figure 20. Maximum Safe Operating Area. Figure 21. Single Pulse Maximum
Power Dissipation.
1
D = 0.5
0.2
0.1
0.01
0.1
0.05
0.02
0.01
SINGLE PULSE
r(t), NORMALIZED EFFECTIVE
TRANSIENT THERMAL RESISTANCE
0.001
R
(t) = r(t) * R
JA
θ
R
= 135°C/W
JA
θ
P(pk)
t
1
t
2
T
- TA = P * R
J
Duty Cycle, D = t
JA
θ
(t)
JA
θ
/ t
1
0.00010.0010.010.11101001000
, TIME (sec)
t
1
Figure 22. Transient Thermal Response Curve.
Thermal characterization performed using the conditions described in Note 1c.
Transient thermal response will change depending on the circuit board design.
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7
2
Page 8
Typical Characteristics (continued)
SyncFET Schottky Body Diode
Characteristics
FDS6982AS
ON Semiconductor’s SyncFET process embeds a
Schottky diode in parallel with PowerTrench
MOSFET. This diode exhibits similar
characteristics to a discrete external Schottky diode
in parallel with a MOSFET. Figure 23 shows the
reverse recovery characteristic of the
FDS6982AS.
Current: 1.6A/DIV
Time: 10nS/DIV
Figure 23. FDS6982AS SyncFET body
diode reverse recovery characteristic.
For comparison purposes, Figure 24 shows the reverse
recovery characteristics of the body diode of an
equivalent size MOSFET produced without SyncFET
(FDS6982).
Schottky barrier diodes exhibit significant leakage at
high temperature and high reverse voltage. This will
increase the power in the device.
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