These dual P-Channel logic level enhancement mode
MOSFET are produced using Fairchild Semiconductor’s
advanced PowerTrench process that has been
especially tailored to minimize on-state resistance. This
device has been designed especially for low voltage
applications as a replacement for bipolar digital
transistors and small signal MOSFETS.
Applications
• Battery management
Features
• –0.5 A, –20 V. R
R
• Very low level gate drive requirements allowing direct
operation in 3V circuits (V
• Compact industry standard SC70-6 surface mount
package
= 780 mΩ @ VGS = –4.5 V
DS(ON)
= 1200 mΩ @ VGS = –2.5 V
DS(ON)
< 1.5V).
GS(th)
S
G
D
S
G
1 or 4
2 or 5
6 or 3
5 or 2
D
G
D
Pin 1
G
S
SC70-6
The pinouts are symmetrical; pin 1 and pin 4 are interchangeable.
Absolute Maximum Ratings
TA=25oC unless otherwise noted
3 or 6
D
4 or 1
S
Symbol Parameter Ratings Units
V
Drain-Source Voltage –20 V
DSS
V
Gate-Source Voltage ±12 V
GSS
ID Drain Current – Continuous
– Pulsed –1.8
PD Power Dissipation for Single Operation
TJ, T
Operating and Storage Junction Temperature Range –55 to +150
Symbol Parameter Test Conditions Min Typ Max Units
Off Characteristics
BV
Drain–Source Breakdown
DSS
Voltage
∆BV
DSS
∆T
J
I
Zero Gate Voltage Drain Current VDS = –16 V, VGS = 0 V –1
DSS
I
Gate–Body Leakage
GSS
On Characteristics
V
GS(th)
∆V
GS(th)
∆TJ
R
DS(on)
Breakdown Voltage Temperature
Coefficient
(Note 2)
Gate Threshold Voltage
Gate Threshold Voltage
Temperature Coefficient
Static Drain–Source
On–Resistance
I
On–State Drain Current VGS = –4.5 V, VDS = –5 V –1.8 A
D(on)
V
= 0 V, ID = –250 µA
GS
= –250 µA, Referenced to 25°C
I
D
V
= ±12 V, VDS = 0 V
GS
V
= VGS, ID = –250 µA
DS
= –250 µA, Referenced to 25°C
I
D
VGS = –4.5 V, ID = –0.5 A
V
= –2.5 V, ID = –0.4 A
GS
= –4.5 V, ID = –0.5 A, TJ=125°C
V
GS
–20 V
–10
mV/°C
µA
±100
nA
–0.65 –1.2 –1.5 V
2
580
980
1200
780
780
mV/°C
mΩ
gFS Forward Transconductance VDS = –5 V, ID = –0.5 A 1.1 S
Dynamic Characteristics
C
Input Capacitance 83 pF
iss
C
Output Capacitance 20 pF
oss
C
Reverse Transfer Capacitance
rss
RG Gate Resistance
Switching Characteristics
t
Turn–On Delay Time 6 12 ns
d(on)
(Note 2)
tr Turn–On Rise Time 12 22 ns
t
Turn–Off Delay Time 6 13 ns
d(off)
tf Turn–Off Fall Time
Qg Total Gate Charge 0.86 1.2 nC
Qgs Gate–Source Charge 0.22 nC
Qgd Gate–Drain Charge
= –10 V, V
V
DS
GS
f = 1.0 MHz
V
= 15 mV, f = 1.0 MHz
GS
V
= –10 V, ID = 1 A,
DD
= –4.5 V, R
V
GS
V
= –10 V, ID = –0.6 A,
DS
= –4.5 V
V
GS
GEN
= 0 V,
= 6 Ω
11 pF
12.1
Ω
1 3 ns
0.25 nC
Drain–Source Diode Characteristics and Maximum Ratings
IS Maximum Continuous Drain–Source Diode Forward Current –0.25 A
VSD Drain–Source Diode Forward
Voltage
trr Reverse Recovery Time
Qrr Reverse Recovery Charge
Notes:
1. R
is the sum of the junction-to-case and case-to-ambient thermal resistance where the case thermal reference is defined as the solder mounting surface of
Figure 9. Maximum Safe Operating Area. Figure 10. Single Pulse Maximum
Power Dissipation.
= 415oC/W
θJA
T
= 25oC
A
f = 1MHz
V
= 0 V
GS
1
D = 0.5
0.2
0.1
0.01
r(t), NORMALIZED EFFECTIVE
TRANSIENT THERMAL RESISTANCE
0.001
0.1
0.05
0.02
0.01
SINGLE PULSE
0.00010.0010.010.1110100
t
, TIME (sec)
1
R
(t) = r(t) * R
θJA
R
= 415 °C/W
θJA
P(pk)
t
1
t
2
T
- TA = P * R
J
Duty Cycle, D = t
θJA
(t)
θJA
/ t
1
2
Figure 11. Transient Thermal Response Curve.
Thermal characterization performed using the conditions described in Note 1.
Transient thermal response will change depending on the circuit board design.
FDG6318P Rev C (W)
TRADEMARKS
The following are registered and unregistered trademarks Fairchild Semiconductor owns or is authorized to use and is
not intended to be an exhaustive list of all such trademarks.
FAIRCHILD SEMICONDUCTOR RESERVES THE RIGHT TO MAKE CHANGES WITHOUT FURTHER
NOTICE TO ANY PRODUCTS HEREIN TO IMPROVE RELIABILITY, FUNCTION OR DESIGN. FAIRCHILD
DOES NOT ASSUME ANY LIABILITY ARISING OUT OF THE APPLICATION OR USE OF ANY PRODUCT
OR CIRCUIT DESCRIBED HEREIN; NEITHER DOES IT CONVEY ANY LICENSE UNDER ITS PATENT
RIGHTS, NOR THE RIGHTS OF OTHERS.
LIFE SUPPORT POLICY
FAIRCHILDS PRODUCTS ARE NOT AUTHORIZED FOR USE AS CRITICAL COMPONENTS IN LIFE SUPPORT
DEVICES OR SYSTEMS WITHOUT THE EXPRESS WRITTEN APPROVAL OF FAIRCHILD SEMICONDUCTOR CORPORATION.
As used herein:
1. Life support devices or systems are devices or
systems which, (a) are intended for surgical implant into
the body, or (b) support or sustain life, or (c) whose
failure to perform when properly used in accordance
with instructions for use provided in the labeling, can be
reasonably expected to result in significant injury to the
user.
PRODUCT STATUS DEFINITIONS
Definition of Terms
Datasheet IdentificationProduct StatusDefinition
Advance Information
Preliminary
No Identification Needed
Formative or
In Design
First Production
Full Production
2. A critical component is any component of a life
support device or system whose failure to perform can
be reasonably expected to cause the failure of the life
support device or system, or to affect its safety or
effectiveness.
This datasheet contains the design specifications for
product development. Specifications may change in
any manner without notice.
This datasheet contains preliminary data, and
supplementary data will be published at a later date.
Fairchild Semiconductor reserves the right to make
changes at any time without notice in order to improve
design.
This datasheet contains final specifications. Fairchild
Semiconductor reserves the right to make changes at
any time without notice in order to improve design.
Obsolete
Not In Production
This datasheet contains specifications on a product
that has been discontinued by Fairchild semiconductor.
The datasheet is printed for reference information only.
Rev. I2
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