Fairchild FCP11N60F, FCPF11N60F service manual

FCP11N60F/FCPF11N60F 600V N-Channel MOSFET
FCP11N60F
/FCPF11N60F
600V N-Channel MOSFET
• 650V @TJ = 150°C
•Typ. R
• Fast Recovery Type ( t
• Ultra Low Gate Charge (typ. Q
• Low Effective Output Capacitance (typ. C
• 100% avalanche tested
RoHS Compliant
DS(on)
G
= 0.32
D
S
= 120ns)
rr
TO-220
= 40nC)
g
eff.=95pF)
oss
GSD
December 2008
SuperFET
Description
SuperFETTM is, Fairchild’s proprietary, new generation of high
age MOSFET family that is utilizing an advanced charge
volt balance mechanism for outstanding low on-resistance and lower gate charge performance.
This advanced technology has been tailored to minimize conduction loss, provide superior switching performance, and withstand extreme dv/dt rate and higher avalanche energy. Consequently, SuperFET is very suitable for various AC/DC power conversion in switching mode operation for system miniaturization and higher efficiency.
D
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S
TO-220F
!
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G
TM
Absolute Maximum Ratings
Symbol Parameter FCP11N60F FCPF11N60F Units
I
D
I
DM
V
GSS
E
AS
I
AR
E
AR
dv/dt Peak Diode Recovery dv/dt P
D
, T
T
J
STG
T
L
* Drain current limited by maximum junction termperature.
Drain Current - Continuous (TC = 25°C) 11 11 * A
- Continuous (T Drain Current - Pulsed Gate-Source Voltage ± 30 V Single Pulsed Avalanche Energy Avalanche Current Repetitive Avalanche Energy
Power Dissipation (TC = 25°C) 125 36 * W
- Derate above 25°C 1.0 0.29 * W/°C Operating and Storage Temperature Range -55 to +150 °C Maximum lead temperature for soldering purposes,
1/8" from case for 5 seconds
= 100°C) 7 7 * A
C
(Note 1)
(Note 2) (Note 1) (Note 1) (Note 3)
33 33 * A
340 mJ
11 A
12.5 mJ
4.5 V/ns
300 °C
Thermal Characteristics
Symbol Parameter FCP11N60F FCPF11N60F Units
R
θJC
R
θCS
R
θJA
Thermal Resistance, Junction-to-Case 1.0 3.5 °C/W Thermal Resistance, Case-to-Sink 0.5 -- °C/W Thermal Resistance, Junction-to-Ambient 62.5 62.5 °C/W
©2008 Fairchild Semiconductor Corporation
FCP11N60F/FCPF11N60F Rev. A1
1
www.fairchildsemi.com
Package Marking and Ordering Information
Device Marking Device Package Reel Size Tape Width Quantity
FCP11N60F FCP11N60F TO-220 -- -- 50
FCPF11N60F FCPF11N60F TO-220F -- -- 50
FCP11N60F/FCPF11N60F 600V N-Channel MOSFET
Electrical Characteristics
TC = 25°C unless otherwise noted
Symbol Parameter Test Conditions Min. Typ. Max. Units
Off Characteristics
BV
DSS
BVT
J
BV
DS
I
DSS
I
GSSF
I
GSSR
On Characteristics
V
GS(th)
R
DS(on)
g
FS
Dynamic Characteristics
C
iss
C
oss
C
rss
C
oss
C
oss
Switching Characteristics
t
d(on)
t
r
t
d(off)
t
f
Q
g
Q
gs
Q
gd
Drain-Source Diode Characteristics and Maximum Ratings
I
S
I
SM
V
SD
t
rr
Q
rr
Notes:
1. Repetitive Rating : Pulse width limited by maximum junction temperature = 5.5A, VDD = 50V, RG = 25 Ω, Starting TJ = 25°C
2. I
AS
3. I
11A, di/dt ≤ 200A/µs, VDD BV
SD
4. Pulse Test : Pulse width 300µs, Duty cycle 2%
5. Essentially independent of operating temperature
Drain-Source Breakdown Voltage VGS = 0 V, ID = 250 µA, TJ = 25°C 600 -- -- V
V
= 0 V, ID = 250 µA, TJ = 150°C -- 650 -- V
GS
/
Breakdown Voltage Temperature
DSS
Coefficient Drain-Source Avalanche Breakdown
ID = 250 µA, Referenced to 25°C -- 0.6 -- V/°C
VGS = 0 V, ID = 11 A -- 700 -- V
Voltage Zero Gate Voltage Drain Current VDS = 600 V, VGS = 0 V -- -- 10 µA
V
= 480 V, TC = 125°C -- -- 100 µA
DS
Gate-Body Leakage Current, Forward VGS = 30 V, VDS = 0 V - - -- 100 nA Gate-Body Leakage Current, Reverse VGS = -30 V, VDS = 0 V -- -- -100 nA
Gate Threshold Voltage VDS = VGS, ID = 250 µA3.0--5.0V Static Drain-Source
VGS = 10 V, ID = 5.5 A -- 0.32 0.38
On-Resistance Forward Transconductance VDS = 40 V, ID = 5.5 A
Input Capacitance VDS = 25 V, VGS = 0 V, Output Capacitance -- 671 870 pF
f = 1.0 MHz
(Note 4)
-- 9.7 -- S
-- 1148 1490 pF
Reverse Transfer Capacitance -- 63 82 pF Output Capacitance VDS = 480 V, VGS = 0 V,
-- 35 -- pF
f = 1.0 MHz
eff. Effective Output Capacitance VDS = 0V to 480 V, VGS = 0 V -- 95 -- pF
Turn-On Delay Time VDD = 300 V, ID = 11 A,
R
= 25
Turn-On Rise Time -- 98 205 ns
G
-- 34 80 ns
Turn-Off Delay Time -- 119 250 ns Turn-Off Fall Time -- 56 120 ns Total Gate Charge VDS = 480 V, ID = 11 A,
V
= 10 V
Gate-Source Charge -- 7.2 -- nC
GS
(Note 4, 5)
(Note 4, 5)
-- 40 52 nC
Gate-Drain Charge -- 21 -- nC
Maximum Continuous Drain-Source Diode Forward Current -- -- 11 A Maximum Pulsed Drain-Source Diode Forward Current -- -- 33 A Drain-Source Diode Forward Voltage VGS = 0 V, IS = 11 A -- -- 1.4 V Reverse Recovery Time VGS = 0 V, IS = 11 A,
dI
/ dt = 100 A/µs
Reverse Recovery Charge -- 0.8 -- µC
Starting TJ = 25°C
DSS,
F
(Note 4)
-- 120 -- ns
FCP11N60F/FCPF11N60F Rev. A1
2
www.fairchildsemi.com
Typical Performance Characterist ics
Figure 1. On-Region Characteristics Figure 2. Transfer Characteristics
2
10
V
GS
Top : 15.0 V
10.0 V
8.0 V
7.0 V
6.5 V
1
10
6.0 V Botto m : 5.5 V
0
10
, Drain Current [A]
D
I
-1
10
-1
10
VDS, Drain-Source Voltage [V]
Figure 3. On-Resistance Variation vs. Figure 4. Body Diode Forward Voltage
Drain Current and Gate Voltage Variation vs. Source Current
1
10
150oC
0
10
, Drain Current [A]
D
* Notes :
µ
s Pulse Test
1. 250 = 25oC
2. T
C
0
10
1
10
I
-1
10
246810
25oC
-55oC
* Note
1. V
2. 250
= 40V
DS
µ
s Pulse Test
VGS , Ga te -Sourc e Volta g e [V]
and Temperatue
FCP11N60F/FCPF11N60F 600V N-Channel MOSFET
25 oC
* Notes :
= 0V
1. V
GS
µ
s Pulse Test
2. 250
1.0
0.8
],
0.6
[
DS(ON)
R
0.4
0.2
Drain-Source On-Resistance
0.0 0 5 10 15 20 25 30 35 40
VGS = 10V
ID, Drain Cu rre n t [A]
VGS = 20V
* Note : TJ = 25oC
1
10
0
10
, Reverse Drain Current [A]
DR
I
-1
10
0.2 0.4 0.6 0.8 1.0 1.2 1.4 1.6
150 oC
VSD , Source-Drain Voltage [V]
Figure 5. Capacitance Characteristics Figure 6. Gate Charge Characteristics
6000
5000
4000
C
3000
2000
Capacitance [pF]
1000
0
-1
10
oss
C
iss
C
rss
0
10
C
= Cgs + Cgd (Cds = shorted)
iss
C
= Cds + C
oss
gd
C
= C
rss
gd
* Notes :
1. V
2. f = 1 MHz
1
10
= 0 V
GS
VDS, Drain-Source Voltage [V]
12
10
8
6
4
, Gate-Source Voltage [V]
2
GS
V
0
0 5 10 15 20 25 30 35 40 45
QG, Total Gate C h arg e [n C ]
VDS = 100V
VDS = 250V
VDS = 400V
* Note : ID = 11A
FCP11N60F/FCPF11N60F Rev. A1
3
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