October 2005
BSS138
N-Channel Logic Level Enhancement Mode Field Effect Transistor
General Description
These N-Channel enhancement mode field effect
transistors are produced using Fairchild’s proprietary,
high cell density, DMOS technology. These products
have been designed to minimize on-state resistance
while provide rugged, reliable, and fast switching
performance.These products are particularly suited for
low voltage, low current applications such as small
servo motor control, power MOSFET gate drivers, and
other switching applications.
Features
• 0.22 A, 50 V. R
• High density cell design for extremely low R
• Rugged and Reliable
• Compact industry standard SOT-23 surface mount
package
= 3.5Ω @ VGS = 10 V
DS(ON)
R
= 6.0Ω @ VGS = 4.5 V
DS(ON)
DS(ON)
BSS138
D
D
S
G
SOT-23
Absolute Maximum Ratings T
G
o
=25
C unless otherwise noted
A
Symbol Parameter Ratings Units
V
Drain-Source Voltage 50 V
DSS
V
Gate-Source Voltage
GSS
ID Drain Current – Continuous
– Pulsed 0.88
PD
TJ, T
TL
STG
Maximum Power Dissipation
Derate Above 25°C
Operating and Storage Junction Temperature Range
Maximum Lead Temperature for Soldering
Purposes, 1/16” from Case for 10 Seconds
(Note 1)
0.22 A
(Note 1)
0.36
±20
2.8
−55 to +150 °C
300
Thermal Characteristics
R
θJA
Thermal Resistance, Junction-to-Ambient
(Note 1)
350
S
V
W
mW/°C
°C
°C/W
Package Marking and Ordering Information
Device Marking Device Reel Size Tape width Quantity
SS BSS138 7’’ 8mm 3000 units
2005 Fairchild Semiconductor Corporation
BSS138 Rev C(W)
BSS138
Electrical Characteristics T
= 25°C unless otherwise noted
A
Symbol Parameter Test Conditions Min Typ Max Units
Off Characteristics
BV
Drain–Source Breakdown Voltage
DSS
∆BV
DSS
∆T
J
I
Zero Gate Voltage Drain Current VDS = 50 V, VGS = 0 V 0.5
DSS
Breakdown Voltage Temperature
Coefficient
V
I
Gate–Body Leakage.
GSS
On Characteristics
V
Gate Threshold Voltage VDS = VGS, ID = 1 mA 0.8 1.3 1.5 V
GS(th)
∆V
GS(th)
∆TJ
R
DS(on)
Gate Threshold Voltage
Temperature Coefficient
Static Drain–Source
(Note 2)
On–Resistance
I
On–State Drain Current VGS = 10 V, VDS = 5 V 0.2 A
D(on)
= 0 V, ID = 250 µA
V
GS
= 250 µA,Referenced to 25°C
I
D
= 50 V, VGS = 0 V TJ = 125°C
V
DS
= 30 V, VGS = 0 V 100 nA
DS
= ±20 V, VDS = 0 V
V
GS
= 1 mA,Referenced to 25°C
I
D
= 10 V, ID = 0.22 A
V
GS
= 4.5 V, ID = 0.22 A
V
GS
= 10 V, ID = 0.22 A, TJ = 125°C
V
GS
gFS Forward Transconductance VDS = 10V, ID = 0.22 A 0. 12 0.5 S
50 V
72
mV/°C
µA
5
–2
0.7
1.0
1.1
±100
3.5
6.0
5.8
µA
nA
mV/°C
Ω
Dynamic Characteristics
C
Input Capacitance 27 pF
iss
C
Output Capacitance 13 pF
oss
C
Reverse Transfer Capacitance
rss
RG Gate Resistance VGS = 15 mV, f = 1.0 MHz 9
Switching Characteristics
t
Turn–On Delay Time 2.5 5 ns
d(on)
(Note 2)
tr Turn–On Rise Time 9 18 ns
t
Turn–Off Delay Time 20 36 ns
d(off)
tf Turn–Off Fall Time
Qg Total Gate Charge 1.7 2.4 nC
Qgs Gate–Source Charge 0.1 nC
Qgd Gate–Drain Charge
= 25 V, V
V
DS
GS
f = 1.0 MHz
V
= 30 V, ID = 0.29 A,
DD
= 10 V, R
V
GS
V
= 25 V, ID = 0.22 A,
DS
V
= 10 V
GS
GEN
= 0 V,
6 pF
Ω
= 6 Ω
7 14 ns
0.4 nC
Drain–Source Diode Characteristics and Maximum Ratings
IS Maximum Continuous Drain–Source Diode Forward Current 0.22 A
VSD Drain–Source Diode Forward
VGS = 0 V, IS = 0.44 A
(Note 2)
0.8 1.4 V
Voltage
Notes:
1. R
is the sum of the junction-to-case and case-to-ambient thermal resistance where the case thermal reference is defined as the solder mounting surface of
θJA
the drain pins. R
is guaranteed by design while R
θJC
a) 350°C/W when mounted on a
minimum pad..
is determined by the user's board design.
θCA
Scale 1 : 1 on letter size paper
2. Pulse Test: Pulse Width ≤ 300 µs, Duty Cycle ≤ 2.0%
BSS138 Rev C(W)