Fairchild 74ABT16245 service manual

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74ABT16245 16-Bit Transceiver with 3-STATE Outputs
74ABT16245 16-Bit Transceiver with 3-STATE Outputs
April 1992 Revised May 2005
General Description
The ABT16245 c ontains si xteen non- inverti ng bidirecti onal buffers with 3-STATE outputs and is intended for bus ori­ented applications. The device is byte controlled. Each byte has separate control inputs which can be shorted together for full 16-b it ope rat ion. T he T/ R the direct i o n of d ata flow throug h t he d ev ic e . Th e OE disable both the A and B ports by placing them in a high impedance state.
inputs determine
inputs
Features
Bidirectional non-inverting buffers
Separate control logic for each byte
16-bit version of the ABT245
A and B output sink capability of 64 mA, source
capability of 32 mA
Guaranteed output skew
Guaranteed multiple output switching specifications
Output switching specified for both 50 pF and
250 pF loads
Guaranteed simultaneous switching noise level and
dynamic threshold performance
Guaranteed latchup protection
High impedance glitch free bus loading during entire
power up and power down cycle
Non-destructive hot insertion capability
Ordering Code:
Order Number Package Number Package Description
74ABT16245CSSC MS48A 48-Lead Small Shrink Outline Package (SSOP), JEDEC MO-118, 0.300" Wide 74ABT16245CMTD MTD48 48-Lead Thin Shrink Small Outline Package (TSSOP), JEDEC MO-153, 6.1mm Wide
Device also availab le in Tape and Reel. Specify by appending suffix let te r “X” to the ordering code .
Logic Symbol
Connection Diagram
Pin Descriptions
Pin Names Description
OE
n
T/R
n
A
0–A15
B
0–B15
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Output Enable Input (Active LOW) Transmit/Receive Input
Side A Inputs/Outputs Side B Inputs/Outputs
Truth Tables
Inputs Outputs
OE
74ABT16245
T/R
1
1
L L Bus B0–B7 Data to Bus A0–A L H Bus A0–A7 Data to Bus B0–B H X HIGH-Z State on A0–A7, B0–B
Inputs Outputs
OE
T/R
2
2
L L Bus B8–B15 Data to Bus A8–A L H Bus A8–A15 Data to Bus B8–B H X HIGH-Z State on A8–A15, B8–B
H HIGH Voltage Level
LOW Volt age Level
L
Immaterial
X Z
High Impedance
Functional Description
The ABT16245 co ntains si xteen n on-i nverting bidire ction al buffers with 3-STATE outputs. The device is byte controlled with each byte funct ioning identically, but independent of the other. The control pins can be shorted together to obtain full 16-bit operation.
Logic Diagrams
7 7
7
15 15
15
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Absolute Maximum Ratings(Note 1) Recommended Operating
Storage Temperature Ambient Temperature under Bias Junction Temperature under Bias
Pin Potential to Ground Pin
V
CC
Input Voltage (Note 2) Input Current (Note 2)
65q
C to 150qC
55q
C to 125qC
55q
C to 150qC
0.5V to 7.0V
0.5V to 7.0V
30 mA to 5.0 mA
Voltage Applied to Any Output
in the Disabled or
Power-Off State in the HIGH State
0.5V to 5.5V
0.5V to V Current Applied to Output in LOW State (Max) twice the rated I DC Latchup Source Current
OL
500 mA
Over Voltage Latchup (I/O) 10V
Conditions
Free Air Ambient Temperature Supply Voltage Minimum Input Edge Rate (
Data Input 50 mV/ns Enable Input 20 mV/ns
CC
Note 1: Absolute maximum ratings are values beyond which the device may be damaged or have its useful life impaired. Functional operation
(mA)
under these conditions is not implied. Note 2: Either voltage limit or current limit is sufficient t o protect inputs.
'V/'
t)
DC Electrical Characteristics
Symbol Parameter Min Typ Max Units
V
Input HIGH Voltage 2.0 V Recognized HIGH Signal
IH
V
Input LOW Voltage 0.8 V Recognized LOW Signal
IL
V
Input Clamp Diode Voltage
CD
V
Output HIGH Voltage 2.5 V Min IOH 3 mA (An, Bn)
OH
V
Output LOW Voltage 0.55 V Min IOL 64 mA (An, Bn)
OL
2.0 V Min IOH 32 mA (An, Bn)
1.2 V Min IIN 18 mA (OEn, T/Rn)
V
CC
40q
C to 85qC
4.5V to 5.5V
Conditions
74ABT16245
I
Input HIGH Current 1
IH
I
Input HIGH Current Breakdown Test 7
BVI
I
Input HIGH Current Breakdown Test (I/O) 100
BVIT
I
Input LOW Current
IL
V
Input Leakage T est 4.75 V 0.0 IID 1.9 PA (OEn, T/Rn)
ID
I
I
Output Leakage Current 10
IH
OZH
IIL I
Output Leakage Current
OZL
Output Short-Circuit Current
I
OS
I
Output HIGH Leakage Current 50
CEX
I
Bus Drainage Test 100
ZZ
I
Power Supply Current 100
CCH
I
Power Supply Current 60 mA Max All Outputs LOW
CCL
I
Power Supply Current 100
CCZ
I
Additional ICC/Input Outputs Enabled 2.5 mA VI VCC 2.1V
CCT
I
Dynamic I
CCD
Note 3: Guaranteed, but not tested.
CC
(Note 3) 0.1 MHz OEn GND, T/Rn GND or V
Outputs 3-STATE 2.5 mA Max OEn, T/ Rn VI VCC 2.1V Outputs 3-STATE 50
No Load mA/ Max Outputs OPEN
100
P
1V
10
275 mA Max V
AMaxVIN 2.7V (OEn, T/Rn) (Note 3)
P
AMaxVIN 7.0V (OEn, T/Rn)
P
AMaxVIN 5.5V (An, Bn)
1
P
AMaxVIN 0.5V (OEn, T/Rn) (Note 3)
1V
P
A0 5.5V V
P
A0 5.5V V
P
AMaxV
P
A0.0V
P
A Max All Outputs HIGH
P
AMaxOEn VCC, T/Rn GND or V
P
A Data Input VI VCC 2.1V
VCC (OEn, T/Rn)
IN
0.0V (OEn, T/Rn)
IN
All Other Pins Grounded
2.7V (An, Bn); OE 2.0V
OUT
0.5V (An, Bn); OE 2.0V
OUT
0.0V (An, Bn)
OUT
VCC (An, Bn)
OUT
5.50V (An, Bn);
OUT
All Others GND
All others at VCC or GND
All others at VCC or GND
One Bit Toggling, 50% Duty Cycle
CC
CC
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