Diodes DMN4800LSS User Manual

DMN4800LSS
N-CHANNEL ENHANCEMENT MODE MOSFET
Product Summary
V
R
(BR)DSS
30V
max
DS(ON)
14m @ V
20m @ VGS = 4.5V
= 10V
GS
I
TA = +25°C
Description
This MOSFET has been designed to minimize the on-state resistance
) and yet maintain superior switching performance, making it
(R
DS(ON)
ideal for high efficiency power management applications.
Applications
Backlighting
Power Management Functions
DC-DC Converters
SO-8
Top View
max
D
8.6A
7.1A
S
S
G
Features
Low On-Resistance
Low Input Capacitance
Fast Switching Speed
Low Input/Output Leakage
Totally Lead-Free & Fully RoHS Compliant (Notes 1 & 2)
Halogen and Antimony Free. “Green” Device (Note 3) Qualified to AEC-Q101 Standards for High Reliability
Mechanical Data
Case: SO-8
Case Material: Molded Plastic, “Green” Molding Compound.
Moisture Sensitivity: Level 1 per J-STD-020
Terminals Connections: See Diagram
Terminals: Finish - Matte Tin annealed over Copper lead frame.
Weight: 0.072g (approximate)
Top View
Internal Schematic
UL Flammability Classification Rating 94V-0
Solderable per MIL-STD-202, Method 208
DS
D
D
G
D
Equivalent circuit
D
S
Ordering Information (Note 4)
Part Number Case Packaging
DMN4800LSS-13 SO-8 2500/Tape & Reel
Notes: 1. No purposely added lead. Fully EU Directive 2002/95/EC (RoHS) & 2011/65/EU (RoHS 2) compliant.
2. See http://www.diodes.com/quality/lead_free.html for more information about Diodes Incorporated’s definitions of Halogen- and Antimony-free, "Green" and Lead-free.
3. Halogen- and Antimony-free "Green” products are defined as those which contain <900ppm bromine, <900ppm chlorine (<1500ppm total Br + Cl) and <1000ppm antimony compounds.
4. For packaging details, go to our website at http://www.diodes.com/products/packages.html.
Marking Information
DMN4800LSS
Document number: DS31736 Rev. 7 - 2
8 5
N4800LS
WW
YY
1 4
Chengdu A/T Site Shanghai A/T Site
8 5
N4800LS
YY
WW
1 4
= Manufacturer’s Marking N4800LS = Product Type Marking Code YYWW = Date Code Marking YY or YY = Year (ex: 13 = 2013) WW = Week (01 - 53) YY = Date Code Marking for SAT (Shanghai Assembly/ Test site) YY = Date Code Marking for CAT (Chengdu Assembly/ Test site)
1 of 6
www.diodes.com
October 2013
© Diodes Incorporated
)
g
g
g
)
r
)
Maximum Ratings (@T
Drain-Source Voltage Gate-Source Voltage
Continuous Drain Current (Note 6) VGS = 10V
Maximum Body Diode Forward Current (Note 6) Pulsed Drain Current (Note 7)
Thermal Characteristics
Total Power Dissipation (Note 5)
Thermal Resistance, Junction to Ambient (Note 5)
Total Power Dissipation (Note 6)
Thermal Resistance, Junction to Ambient (Note 6)
Thermal Resistance, Junction to Case (Note 6) Operating and Storage Temperature Range
Characteristic Symbol Value Units
DMN4800LSS
= +25°C, unless otherwise specified.)
A
Characteristic Symbol Value Units
V
DSS
V
GSS
= +25°C
Steady
State
t<10s
= +25°C
T
A
TA = +70°C Steady state t<10s 46
= +25°C
T
A
TA = +70°C Steady state t<10s 40
T
A
T
= +70°C
A
= +25°C
T
A
= +70°C
T
A
P
R
P
R
R
T
J, TSTG
I
D
I
D
I
S
I
DM
D
JA
D
JA
JC
1.46
0.9 86
1.7
1.0 75
15
-55 to +150 °C
30 V
25
8.6
6.3
11.8
9.0
V
A
A
2.4 A 50 A
W
°C/W
W
°C/W
Electrical Characteristics (@T
= +25°C, unless otherwise specified.)
A
Characteristic Symbol Min Typ Max Unit Test Condition
OFF CHARACTERISTICS (Note 8)
Drain-Source Breakdown Voltage Zero Gate Voltage Drain Current Gate-Source Leakage
BV
I
DSS
I
GSS
DSS
30
   
1 μA
100
ON CHARACTERISTICS (Note 8)
Gate Threshold Voltage
Static Drain-Source On-Resistance
Forward Transconductance Diode Forward Voltage (Note 8)
V
GS(th
R
DS (ON)
V
g
fs
SD
0.8 1.2 1.6 V
11
14
8
0.72 0.94 V
14 20
DYNAMIC CHARACTERISTICS (Note 9)
Input Capacitance Output Capacitance Reverse Transfer Capacitance Gate Resistance Total Gate Charge Gate-Source Charge Gate-Drain Charge Turn-On Delay Time Rise Time Turn-Off Delay Time Fall Time
Notes: 5. Device mounted on FR-4 substrate PC board, 2oz copper, with minimum recommended pad layout.
6. Device mounted on FR-4 substrate PC board, 2oz copper, with 1inch square copper pad layout
7. Repetitive rating, pulse width limited by junction temperature.
8. Short duration pulse test used to minimize self-heating effect.
9. Guaranteed by design. Not subject to product testing.
t
t
C C C
R
Q Q Q
d(on
d(off
iss
oss
rss
t
t
G
f
  



s

d




798 128 122
1.37
8.7
1.7
2.4
5.03
4.50
26.33
8.55
  








V
V
= 0V, ID = 250μA
GS
V
= 30V, VGS = 0V
nA
m
DS
VGS = 20V, VDS = 0V
V
= VGS, ID = 250μA
DS
= 10V, ID = 9A
V
GS
V
= 4.5V, ID = 7A
GS
S
V
= 10V, ID = 9A
DS
VGS = 0V, IS = 1A
pF pF pF
nC
ns
= 10V, VGS = 0V
V
DS
f = 1.0MHz
VDS = 0V, VGS = 0V, f = 1.0MHz
= 5V, VDS = 15V, ID = 9A
V
GS
= 15V, V
V
DD
R
= 15RG = 6.0ID = 1A
L
GEN
= 10V,
DMN4800LSS
Document number: DS31736 Rev. 7 - 2
2 of 6
www.diodes.com
October 2013
© Diodes Incorporated
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