1.5A High-side Power Distribution Switch with Enable and Flag AP2815
Advance Datasheet
General Description
The AP2815 is an integrated high-side power switch
that consists of N-Channel MOSFET, charge pump,
over current & temperature and other related protection
circuits. The switch’s low R
to meet the USB voltage drop requirements. The IC
integrates soft-start to limit inrush current,
over-current protection, load short protection with
fold-back, and thermal shutdown to avoid switch
failure during hot plug-in. Under voltage lockout
(UVLO) function is used to ensure the device
remains off unless there is a valid input voltage
present. A FLAG output is available to indicate fault
conditions to the local USB controller.
The AP2815 is available in standard packages of
SOIC-8 and MSOP-8.
1.5A High-side Power Distribution Switch with Enable and Flag AP2815
Ordering Information
AP2815 -
Circuit Type
Condition
A: Active High with Auto Discharge
B: Active High without Auto Discharge
C: Active Low with Auto Discharge
D: Active Low without Auto Discharge
Product Package
SOIC-8
AP2815A
MSOP-8
SOIC-8
AP2815B
MSOP-8
SOIC-8
AP2815C
MSOP-8
SOIC-8
AP2815D
MSOP-8
BCD Semiconductor's Pb-free products, as designated with "G1" suffix in the part number, are RoHS compliant
1.5A High-side Power Distribution Switch with Enable and Flag AP2815
Absolute Maximum Ratings (Note 1)
Parameter Symbol Value Unit
Power Supply Voltage VIN 6.0 V
Operating Junction Temperature
Range
Storage Temperature Range T
150 ºC
T
J
-65 to 150 ºC
STG
Lead Temperature (Soldering, 10sec) T
Thermal Resistance
(Junction to Ambient)
ESD (Machine Model)
ESD (Human Body Model) 2000 V
260 ºC
LEAD
θ
JA
SOIC-8 135
MSOP-8 150
200 V
ºC/W
Note 1: Stresses greater than those listed under “Absolute Maximum Ratings” may cause permanent damage to
the device. These are stress ratings only, and functional operation of the device at these or any other conditions
beyond those indicated under “Recommended Operating Conditions” is not implied. Exposure to “Absolute
Maximum Ratings” for extended periods may affect device reliability.