Datasheet WM2623ID, WM2623CD Datasheet (Wolfson)

Page 1

WM2623

Low Power 8-bit Serial Input DAC

Production Data, October 2000, Rev 1.0

FEATURES

• 8-bit voltage output DAC
• Single supply from 2.7V to 5.5V
• Very low power consumption (3V supply):
- 900µW, slow mode
- 2.1mW, fast mode
- 3µW, standby mode
• DNL ±0.2 LSB, INL ±0.5 LSB (max)
• Monotonic over Temperature
• DSP compatible serial interface
• Programmable settling time of 3µs or 9µs typical
• High impedance reference input buffer

APPLICATIONS

• Digital Servo Control Loops
• Industri al P rocess Control
• Battery powered instruments and controls
• M achine and motion control devices
• Digital offset and gain adjustment

ORDERING INFORMATION

DEVICE TEMP. RANGE PACKAGE
WM2623CD 0° to 70°C 8-pin SOIC
WM2623ID -40° to 85°C 8-pi n SOIC

DESCRIPTION

The WM2623 is an 8-bit volt age output, res istor s tring digi tal-to­analogue converter. It can operate with supply voltages between 2.7V and 5.5V and can be powered down under software control. Power down reduces current cons umption to less than 1 µA.
The device has been designed for glueless interface t o industry standard microprocessors and DSPs, including the TMS320 family. The W M2623 is programmed with a 16-bit serial word including 4 control bits and 8 data bits.
Excellent performance is delivered with a typical DNL of
0.2LSBs. Monotonicity is guaranteed over the operating temperature range. The settling time of the DAC is programmable to allow for optimis ation of speed versus power dissipation. The output stage is buffered by a rail-to-rail amplifier with a gain of two, which features a Class A B output stage.
The reference voltage input features a high impedance buffer which eliminates the need to keep the reference source impedance low.
The WM2623 is available in an 8-pin SOIC package. Commercial (0° to 70°C) and Industrial (-40° to 85°C) temperature range variants are availabl e.

BLOCK DIAGRAM TYPICAL PERFORMANCE

VDD
(8)
REFERENC E
8-BIT
DAC
LATCH
2-BIT
CONTROL
LATCH
INPUT BUFFER
X1
POWERDOWN/
SPEED
CONTROL
DAC OUTPUT BUFFER
X2
WM2623
REF(6)
DIN (1)
SCLK (2)
CSB (3)
FS (4)
16-BIT SHIFT
REGISTER
AND
CONTROL
LOGIC
POWER-ON
RESET
(5)
GND
data
WOLFSON MICROELECTRONICS LTD
Lutton Court, Bernard Terrace, Edi nburgh, EH8 9NX, UK Tel: +44 (0) 131 667 9386 Fax: +44 (0) 131 667 5176 Email: [email protected] http://www.wolfson.co.uk
(7) OUT
0.1
AVDD = DVDD = 5V, V
0.08
0.06
0.04
0.02
0
DNL (LSBs)
-0.02
-0.04
-0.06
-0.08
-0.1 0 32 64 96 128 160 192 224 256
= 2.048V, Speed = Fast Mode, Load = 10kOhm/100pF
REF
DIGITAL CODE
Production Data Datasheets contain final
specifications current on publication date.
Supply of products conforms to Wolfson Microelectronics’ Term s and Conditions.
2000 Wolfson Microelectronics Ltd.
Page 2

WM2623 Production Data PIN CONFIGURATION

DIN
SCLK
NCS
FS
1 2 3 4
VDD
8
OUT
7
REF
6
GND
5

PIN DESCRIPTION

PIN NO NAME TYPE DESCRIPTION
1 2 3 4 5 6 7 8
DIN Digital input Serial data input
SCLK Digital input Serial clock input
NCS Digital input Chip select. This pin is active low.
FS Digital input Frame synchronisation for serial input dat a GND Supply Ground REF Analogue input Voltage reference input OUT Analogue output DAC analogue output VDD Supply Positi ve power supply

ABSOLUTE MAXIMUM RATINGS

Absolute Maximum Ratings are s tres s rat ings only. P erm anent damage to the device may be caus ed by cont inuous ly operati ng at or beyond these limits. Device functional operating lim its and guaranteed performance s pecifications are gi ven under Electrical Characteristics at the test conditions specified.
ESD Sensitive Device. Thi s device i s m anufactured on a CMOS process . It i s t herefore generi cally suscept ible to damage from excessi ve stati c voltages . Proper ES D precautions mus t be tak en during handling and st orage of this device.
CONDITION MIN MAX
Supply voltage, VDD to GND Digital input voltage Reference input voltage Operating temperature range, T
A
WM2623CD WM2623ID
Storage temperature Lead temperature 1.6mm (1/16 inch) from package body f o r 10 seconds
-0.3V VDD + 0.3V
-0.3V VDD + 0.3V 0°C
-40°C
-65°C 150°C
7V
70°C 85°C
260°C

RECOMMENDED OPERATING CONDITIONS

PARAMETER SYMBOL TEST CONDITIONS MIN TYP MAX UNIT
Supply voltage High-level digital input voltage
Low-level digital input voltage Reference voltage to REF pin Load resistance Load capacitance
Serial clock frequency
Operating free-air temperature
Note:
Reference input voltages greater than VDD/2 will cause clipping for large DAC codes.
WOLFSON MICROELECTRONICS LTD PD Rev 1.0 October 2000
VDD 2.7 5.5 V
V V
V
R C
f
SCLK
T
IH IL
REF
L L
A
VDD = 2.7V to 5.5V 2 V VDD = 2.7V to 5.5V 0.8 V
See Note
AGND VDD - 1.5 V
210 kΩ
100 pF
20 MHz
WM2623CD 0 70 °C
WM2623ID -40 85 °C
2
Page 3
Production Data WM2623

ELECTRICAL CHARACTERISTICS

Test Conditions:
R
= 10kΩ, CL = 100pF. VDD = 5V ±10%, V
L
air temperature range (unless not ed otherwise).
PARAMETER SYMBOL TEST CONDITIONS MIN TYP MAX UNIT Static DAC Specifications
Resolution Integral non-linearity Differential non-linearity Zero code error Gain error D.C. power supply rejection ratio Zero code error temperature coeffi cient Gain error temperature coefficient
DAC Output Specifications
Output voltage range Output load regulation
Power Supplies
Active supply current
Power down supply current
Dynamic DAC Specifications
Slew rate
Settling time
Glitch energy Signal to noise ratio Signal to noise and distort i on rat i o Total harmonic distort i on Spurious free dynamic range
Reference
Reference input resistanc e Reference input capacitanc e Reference feedthrough
Reference input bandwidth
= 2.048V and VDD = 3V ±10%, V
REF
= 1.024V over recommended operati ng free-
REF
8bits
INL See Note 1 ±0.3 ±0.5 LSB DNL See Note 2 ±0.07 ±0.2 LSB ZCE See Note 3 ±10 mV
GE See Note 4 ±0.6 % FSR
PSRR See Note 5
í
See Note 6 10 ppm/°C See Note 6 10 ppm/°C
0 VDD - 0.1 V
2kΩ to 10kΩ load
0.1 0.25 % FS
See Note 7 No load, DAC value = 128, all digital inputs 0V or VDD
I
DD
VDD = 5V, V
REF
= 2.048V
0.4 0.6 mA
Slow Mode
VDD = 5V, V
REF
= 2.048V
0.9 1.35 mA
Fast Mode
VDD = 3V, V
= 1.024V,
REF
0.3 0.45 mA
Slow Mode
VDD = 3V, V
= 1.024V,
REF
0.7 1.1 mA
Fast Mode (See Note 8)
1 µA
SR DAC output 10%-90%
Slow Fast
0.9
3.6
See Note 9
t
s
DAC output 10%-90%
Slow Fast
9 3
20
5.5
See Note 10
DAC Code 127 to 128 10 nV-s
SNR 57 dB
SNRD 49 dB
THD
SPFDR
R
REFIN
C
REFIN
= 400kSPS,
f
s
f
= 1.1kHz,
OUT
BW = 20kHz See Note 11
V
= 1VPP at 1kHz
REF
í
60 dB
10 MΩ
5pF
-75 dB
+ 1.024V dc, DAC code 0
V
= 0.2VPP + 1.024V dc
REF
DAC code 128
Slow Fast
0.525
1.3
dB
V/µs V/µs
µs µs
dB
MHz MHz
WOLFSON MICROELECTRONICS LTD PD Rev 1.0 October 2000
3
Page 4
WM2623 Production Data
Test Conditions:
R
= 10kΩ, CL = 100pF. VDD = 5V ±10%, V
L
air temperature range (unless not ed otherwise).
PARAMETER SYMBOL TEST CONDITIONS MIN TYP MAX UNIT Digital Inputs
High level input current Low level input current Input capacitance
Notes:
1. Integral non-linearity (INL) is the maximum deviation of the output from the line between zero and full scale (excluding t he effects of zero code and f ul l scale errors).
2. Differential non-linearity (DNL) is the difference between the measured and ideal 1LSB amplit ude change of any adjac ent t wo codes. A guarantee of monotonicity means the output voltage al ways changes in the same direc tion (or remains cons tant) as the digital input code.
3. Zero code error is the voltage output when the DAC input code i s zero.
4. Gain error is the deviation from the ideal full scale output excluding the effects of zero code error.
5. Power supply rejection ratio is measured by varying VDD from 4.5V to 5. 5V and measuring the proportion of this signal imposed on the zero code error and the gain error.
6. Zero code error and Gain error temperature coefficients are norm al i sed to full scale voltage.
7. Output load regulation is the difference between the output voltage at full scale with a 10kΩ load and 2kΩ load. It is expressed as a percentage of the full s cale output voltage with a 10kΩ load.
8. I
is measured while continuous ly writing code 128 to the DAC. For VIH < VDD - 0.7V and VIL > 0.7V supply current will
DD
increase.
9. Slew rate results are for the lower value of the rising and falling edge slew rates
10. Settling time is the tim e taken for the signal to settle t o within 0.5LSB of the final measured value for bot h rising and falling edges. Limits are ens ured by design and characterisation, but are not production tested.
11. SNR, SNRD, THD and SPFDR are measured on a synthesised sinewave at frequency f frequency fs
.
= 2.048V and VDD = 3V ±10%, V
REF
I
IH
I
IL
C
I
Input voltage = VDD 1 µA
Input voltage = 0V
= 1.024V over recommended operati ng free-
REF
í
3pF
generated with a sampling
OUT
µA
WOLFSON MICROELECTRONICS LTD PD Rev 1.0 October 2000
4
Page 5
Production Data WM2623

SERIAL INTERFACE

t
WLtWH
SCLK
DIN
123451516
t
SUDtHD
D0D1D12D13D14D15
t
SUCSFS
NCS
t
WHFS
t
SUFSCLK
FS
Figure 1 Timing Diagram
Test Conditions:
R
= 10kΩ, CL = 100pF. VDD = 5V ±10%, V
L
= 2.048V and VDD = 3V ±10%, V
REF
= 1.024V over recommended operati ng
REF
free-air temperature range (unless noted otherwise).
SYMBOL TEST CONDITIONS MIN TYP MAX UNIT
t
SUCSFS
t
SUFS
t
SUC16FS
Setup time NCS low before falli ng FS edge. Setup time FS low before firs t falling SCLK edge. Setup time, 16th falling SCLK edge after FS low on
which data bit D0 is sampled bef ore ri sing edge of FS.
10 ns
8ns
10 ns
Setup time, 16th rising SCLK edge (first af t e r dat a bi t
t
SUC16CS
D0 sampled) before NCS rising edge. If FS is used instead of the 16
th
rising edge to update the DAC, this
10 ns setup time is between the FS ri sing edge and the NCS rising edge.
t
WH
t
WL
t
SUD
t
HD
t
WHFS
Pulse duration, SCLK high. Pulse duration, SCLK low. Setup time, data ready before SCLK falling edge. Hold time, data held valid after SCLK falling edge. Pulse duration, FS high.
25 ns
25 ns
8ns 5ns
20 ns
t
SUC16CS
t
SUC16FS
WOLFSON MICROELECTRONICS LTD PD Rev 1.0 October 2000
5
Page 6

WM2623 Production Data TYPICAL PERFORMANCE GRAPHS

0.12
AVDD = DVDD = 5V, VREF = 2.048V, Speed = Fast Mode, Load = 10kOhm/100pF
0.08
0.04
0
INL (LSBs)
-0.04
-0.08
-0.12 0 32 64 96 128 160 192 224 256
Figure 2 Integral Non-Linearity
DIGITAL CODE
0.4
VDD = 3V, V
0.35
0.3
0.25
0.2
0.15
OUTPUT VOLTAGE - V
0.1
0.05
0
012345678910
= 1V, Input Code = 0
REF
ISINK - mA
Slow Fast
0.4
VDD = 5V, V
0.35
0.3
0.25
0.2
0.15
OUTPUT VOLTAGE - V
0.1
0.05
0
012345678910
= 2V, Input Code = 0
REF
ISINK - mA
Figure 3 Sink Current VDD = 3V Figure 4 Sink Current VDD = 5V
OUTPUT VOLTAGE - V
2.055
2.045
2.035
2.06
2.05
2.04
VDD = 3V, V
= 1V, Input Code = 4095
REF
OUTPUT VOLTAGE - V
4.095
4.09
4.085
4.08
4.075
4.1
VDD = 5V, V
= 2V, Input Code = 4095
REF
Slow Fast
2.03
2.025 012345678910
ISOURCE - mA
Slow Fast
4.07
4.065 012345678910
ISOURCE - mA
Slow Fast
Figure 5 Source Current VDD = 3V Figure 6 Source Current VDD = 5V
WOLFSON MICROELECTRONICS LTD PD Rev 1.0 October 2000
6
Page 7
Production Data WM2623

DEVICE DESCRIPTION

GENERAL FUNCTION

The WM2623 is an 8-bit, vol tage output DAC operating from a s ingle supply. The device uses a resistor string network buffered with an op amp to convert 8-bit di gital data to analogue voltage levels (see Block Diagram ). The output voltage is determ ined by the reference input volt age and the input code according to t he f ol l owing relat i onship:
2
V
out
INPUT OUTPUT
1111 1111
::
1000 0001
1000 0000
0111 1111
::
0000 0001
0000 0000 0V
Table 1 Binary Code Table (0V to 2V
CODE
V
()
REFIN=
256
2
255
2
()
REFV
256
129
2
()
REFV
256
128
()
256
127
2
()
REFV
256
2
()
REFV
256
Output), Gain = 2
REF7
REFREF VV =
1
POWER ON RESET
An internal power-on-reset circuit resets the DAC register to all 0s on power-up.
BUFFER AMPLIFIER
The output buffer has a near rail-to-rail output with s hort circuit protect ion and can reliably drive a 2kΩ load with a 100pF load capacitance.
EXTERNAL REFERENCE
The reference voltage input is buffered which makes the DAC input resistance independent of code. The REF pin has an input resis tanc e of 10MΩ and an input capacitance of typic ally 5pF. The reference voltage determines the DAC full-scale output.

SERIAL INTERFACE

Before writing any data to the W M2623, the device must firs t be enabled by setting CSB to low. Then, a falling edge of FS starts shif ting t he data bit-per-bit (s tart ing with the MSB) into the internal register on the falling edges of SCLK. After 16 bit s have been transferred, t he next rising edge on SCLK or FS causes the content of the shift regist er to be moved to the DAC latc h which updates the voltage output to the new level.
The serial interface of the devi ce can be used in two basic modes:
• four wire (with chip select)
• three wire (without c hi p select)
Using the chip select pin CSB (four wire mode), it is possible to have more than one device connected to the serial port of the data source (DSP or microc ontroller). I f there is no need to have more than one device on the serial bus, CSB can be tied low.
WOLFSON MICROELECTRONICS LTD PD Rev 1.0 October 2000
7
Page 8
WM2623 Production Data
SERIAL CLOCK AND UPDATE RATE
Figure 1 shows the device timing. The maximum serial cloc k rate is:
f
Since a data word contains 16 bits, the sample rate is limited to
f
However, the DAC settling time to 8 bits accurac y limits the response tim e of the analogue output for large input step transit i ons.
SCLK
s
max
max
=
=
16
1
tt
+
WLWH
minmin
1
()
tt
+
WLWH
minmin

SOFTWARE CONFIGURATION OPTIONS

Table 2 shows the compositi on of a 16 bit data word. D11-D4 contains the 8-bit data word, and D14-D13 hold the programmable options. Bits D15, D12, and D3 through D0 should be set to ZERO.
D15 D14 D13 D12 D11 D10 D9 D8 D7 D6 D5 D4 D3 D2 D1 D0
0 SPD PWR 0 New DAC value (8 bits) 0 0 0 0
Table 2 Register Map
PROGRAMMABLE SETTLING TIME
SPD (Bit 14) allows for software control of the converter s peed. A ONE selects the fast mode, where typical settling tim e to within ±0.5LSB of the final value i s 3µs. a ZERO puts the device into the slow mode, where typical settl i ng time is 9µs.
PROGRAMMABLE POWER DOWN
The power down function is controlled by PWR (Bit 13). A ZERO configures the devi ce as active, or fully powered up, a ONE configures the devic e into power down mode. When the power down function is released the device reverts to the DAC code set prior to power down.
MHz
20
=
MHz
25.1
=
WOLFSON MICROELECTRONICS LTD PD Rev 1.0 October 2000
8
Page 9
Production Data WM2623

APPLICATIONS INFORMATION

LINEARITY, OFFSET, AND GAIN ERROR

Amplifiers operating from a single supply can have positive or negative voltage offsets. With a positive offset, t he output voltage changes on the first code transition. However, if the offset is negative, the output voltage may not change with the firs t c ode, depending on t he m agnit ude of t he offset voltage. This is because with t he most negative supply rail being ground, any attempt to drive the output amplifier below ground will clamp the output at 0 V. The output voltage then remains at zero until the input code is suf ficiently high to overcome the negative offset voltage, resulting in the transfer f unction shown in Figure 7. <file negative_offset.emf, below>
Output
Voltage
0 V
Negative
Offset
Figure 7 Effect of Negative Offset
This offset error, not t he linearity error, produces t he breakpoint. The t ransfer funct ion would fol low the dotted line if the output buf fer could drive below the ground rail.
DAC linearity is measured between zero-input code (all input bits at 0) and full-scale code (all inputs at 1), disregarding off set and ful l sc ale errors . However, due t o t he breakpoint in the trans fer function, single supply operati on does not all ow for adjustm ent when the offs et is negat ive. In s uch cases, the linearity is theref ore measured between full-scal e and the lowest code that produces a positive (non-zero) output voltage.
DAC code

POWER SUPPLY DECOUPLING AND GROUNDING

Printed circuit boards with s eparate analogue and digital ground planes deliver the best s ystem performance. The two ground planes should be connected together at the low im pedance power supply source. Ground currents should be managed so as to minim ise voltage drops across the ground planes.
A 0.1µF decoupling capacitor should be connected between the posit ive supply and ground pins of the DAC, with short leads as c lose as possible to the device. Use of ferrite beads may further isolate the system analogue supply from the digit al supply.
WOLFSON MICROELECTRONICS LTD PD Rev 1.0 October 2000
9
Page 10

WM2623 Production Data PACKAGE DIMENSIONS

D: 8 PIN SOIC 3.9mm Wide Body
e
D
A1
A
B
58
41
E H
-C-
h x 45
α
DM009.B
L
o
Symbols
0.10 (0.004)
Dimensions
(mm)
SEATING PLANE
Dimensions
(Inches)
MINMAXMINMAX A A
1
B C D e E h H L
α
1.35 1.75 0.0532 0.0688
0.10 0.25 0.0040 0.0098
0.33 0.51 0.0130 0.0200
0.19 0.25 0.0075 0.0098
4.80 5.00 0.1890 0.1968
1.27 BSC 0.050 BSC
3.80 4.00 0.1497 0.1574
0.25 0.50 0.0099 0.0196
5.80 6.20 0.2284 0.2440
0.40 1.27 0.0160 0.0500
o
0
o
8
o
0
o
8
REF: JEDEC.95, MS-012
NOTES: A. ALL LINEAR DIMENSIONS ARE IN MILLIMETERS (INCHES). B. THIS DRAWING IS SUBJECT TO CHANGE WITHOUT NOTICE. C. BODY DIMENSIONS DO NOT INCLUDE MOLD FLASH OR PROTRUSION, NOT TO EXCEED 0.25MM (0.010IN). D. MEETS JEDEC.95 MS-012, VARIATION = AA. REFER TO THIS SPECIFICATION FOR FURTHER DETAILS.
C
WOLFSON MICROELECTRONICS LTD PD Rev 1.0 October 2000
10
Loading...