Datasheet VNQ810P-E Datasheet (ST)

Page 1
Features
Type R
VNQ810P-E 160mΩ
1. Per each channel.
DS(on)
(1)
I
OUT
3.5A
(1)
V
CC
36V
VNQ810P-E
Quad channel high-side driver
■ ECOPACK
■ Automotive Grade: compliance with AEC
®
guidelines
■ Very low standby current
■ CMOS compatible input
■ On-state open-load detection
■ Off-state open-load detection
■ Thermal shutdown protection and diagnosis
■ Undervoltage shutdown
■ Overvoltage clamp
■ Output stuck to V
■ Load current limitation
■ Reverse battery protection
■ Electrostatic discharge protection
detection
CC
SO-28 (double island)
Description
The VNQ810P-E is a quad HSD formed by assembling two VND810P-E chips in the same SO-28 package. The VNQ810P-E is a monolithic device made by using STMicroelectronics VIPower™ M0-3 technology, intended for driving any kind of load with one side connected to ground. Active V device against low energy spikes (see ISO7637 transient compatibility table).
Active current limitation combined with thermal shutdown and automatic restart protects the device against overload. The device detects open-load condition both in on and off-state. Output shorted to V Device automatically turns off in case of ground pin disconnection.
pin voltage clamp protects the
CC
is detected in the off-state.
CC

Table 1. Device summary

Order codes
Package
Tube Tape and reel
SO-28 (double island) VNQ810P-E VNQ810PTR-E
April 2010 Doc ID 17387 Rev 1 1/28
www.st.com
1
Page 2
Contents VNQ810P-E
Contents
1 Block diagram and pin description . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 5
2 Electrical specifications . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 7
2.1 Absolute maximum ratings . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 7
2.2 Thermal data . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 7
2.3 Electrical characteristics . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 8
2.4 Electrical characteristics curves . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 14
3 Application information . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 17
3.1 GND protection network against reverse battery . . . . . . . . . . . . . . . . . . . 17
3.1.1 Solution 1: a resistor in the ground line (RGND only) . . . . . . . . . . . . . . 17
3.1.2 Solution 2: a diode (D
3.2 Load dump protection . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 18
) in the ground line . . . . . . . . . . . . . . . . . . . . 18
GND
3.3 MCU I/O protection . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 18
3.4 Open-load detection in off-state . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 19
3.5 Maximum demagnetization energy (V
= 13.5V) . . . . . . . . . . . . . . . . . . 20
CC
4 Package and PCB thermal data . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 21
4.1 SO-28 thermal data . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 21
5 Package and packing information . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 24
5.1 ECOPACK® packages . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 24
5.2 SO-28 package information . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 24
5.3 SO-28 packing information . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 26
6 Revision history . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 27
2/28 Doc ID 17387 Rev 1
Page 3
VNQ810P-E List of tables
List of tables
Table 1. Device summary . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 1
Table 2. Suggested connections for unused and not connected pins . . . . . . . . . . . . . . . . . . . . . . . . 6
Table 3. Absolute maximum ratings . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 7
Table 4. Thermal data (per island) . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 7
Table 5. Power output. . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 8
Table 7. V
Table 8. Status pin . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 9
Table 9. Switching (V
Table 6. Protections . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 9
Table 10. Open-load detection . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 10
Table 11. Logic inputs. . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 10
Table 12. Truth table. . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 11
Table 13. Electrical transient requirements on V Table 14. Electrical transient requirements on V Table 15. Electrical transient requirements on V
Table 16. Thermal calculation according to the PCB heatsink area . . . . . . . . . . . . . . . . . . . . . . . . . . 21
Table 17. Thermal parameters . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 23
Table 18. SO-28 mechanical data . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 25
Table 19. Document revision history . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 27
- output diode . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 9
CC
= 13V) . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 9
CC
pin (part 1/3). . . . . . . . . . . . . . . . . . . . . . . . . . . . 12
CC
pin (part 2/3). . . . . . . . . . . . . . . . . . . . . . . . . . . . 12
CC
pin (part 3/3). . . . . . . . . . . . . . . . . . . . . . . . . . . . 12
CC
Doc ID 17387 Rev 1 3/28
Page 4
List of figures VNQ810P-E
List of figures
Figure 1. Block diagram . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 5
Figure 2. Configuration diagram (top view) . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 6
Figure 3. Current and voltage conventions . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 8
Figure 4. Status timings . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 10
Figure 5. Switching time Waveforms . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 11
Figure 6. Waveforms . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 13
Figure 7. Off-state output current . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 14
Figure 8. High level input current . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 14
Figure 9. Input clamp voltage. . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 14
Figure 10. Status leakage current . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 14
Figure 11. Status low output voltage . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 14
Figure 12. Status clamp voltage . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 14
Figure 13. Overvoltage shutdown . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 15
Figure 14. I
Figure 15. Turn-on voltage slope . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 15
Figure 16. Turn-off voltage slope . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 15
Figure 17. On-state resistance vs T Figure 18. On-state resistance vs V
Figure 19. Input high level . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 16
Figure 20. Input low level . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 16
Figure 21. Open-load on-state detection threshold . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 16
Figure 22. Open-load off-state voltage detection threshold . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 16
Figure 23. Input hysteresis voltage . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 16
Figure 24. Application schematic . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 17
Figure 25. Open-load detection in off-state . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 19
Figure 26. SO-28 (double island) maximum turn-off current versus load inductance . . . . . . . . . . . . . 20
Figure 27. SO-28 double island PC board . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 21
Figure 28. Rthj-amb vs PCB copper area in open box free air condition . . . . . . . . . . . . . . . . . . . . . . 22
Figure 29. SO-28 thermal impedance junction ambient single pulse . . . . . . . . . . . . . . . . . . . . . . . . . 22
Figure 30. Thermal fitting model of a quad channel HSD in SO-28. . . . . . . . . . . . . . . . . . . . . . . . . . . 23
Figure 31. SO-28 package dimensions . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 24
Figure 32. SO-28 tube shipment (no suffix) . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 26
Figure 33. SO-28 tape and reel shipment (suffix “TR”) . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 26
LIM
vs T
. . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 15
case
. . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 15
case
. . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 15
CC
4/28 Doc ID 17387 Rev 1
Page 5
VNQ810P-E Block diagram and pin description

1 Block diagram and pin description

Figure 1. Block diagram

V
CC1,2
V
cc
CLAMP
OVERVOLTAGE
UNDERVOLTAGE
GND1,2
INPUT1
STAT US1
INPUT2
STAT US2
GND3,4
INPUT3
STAT US3
INPUT4
STAT US4
OVERTEMP. 1
OVERTEMP. 2
V
cc
CLAMP
OVERTEMP. 3
OVERTEMP. 4
LOGIC
LOGIC
CLAMP 1
DRIVER 1
CURRENT LIMITER 1
OPENLOAD ON 1
OPENLOAD OFF 1
OVERVOLTAGE
UNDERVOLTAGE
CLAMP 3
DRIVER 3
CURRENT LIMITER 3
OPENLOAD ON 3
OPENLOAD OFF 3
CLAMP 2
DRIVER 2
CURRENT LIMITER 2
OPENLOAD ON 2
OPENLOAD OFF 2
CLAMP 4
DRIVER 4
CURRENT LIMITER 4
OPENLOAD ON 4
OPENLOAD OFF 4
OUTPUT1
OUTPUT2
V
CC3,4
OUTPUT3
OUTPUT4
Doc ID 17387 Rev 1 5/28
Page 6
Block diagram and pin description VNQ810P-E

Figure 2. Configuration diagram (top view)

VCC1,2
1
GND 1,2
INPUT1
STATUS1
STATUS2
INPUT2
1,2
V
CC
3,4
V
CC
GND 3,4
INPUT3
STATUS3
STATUS4
INPUT4
V
3,4
CC

Table 2. Suggested connections for unused and not connected pins

14
28
15
V
OUTPUT1
OUTPUT1
OUTPUT1
OUTPUT2
OUTPUT2
OUTPUT2
OUTPUT3
OUTPUT3
OUTPUT3
OUTPUT4
OUTPUT4
OUTPUT4
V
CC
CC
1,2
3,4
Connection / pin Status N.C. Output Input
Floating X X X X
To ground X
Through 10 KΩ
resistor
6/28 Doc ID 17387 Rev 1
Page 7
VNQ810P-E Electrical specifications

2 Electrical specifications

2.1 Absolute maximum ratings

Stressing the device above the rating listed in the Ta bl e 5 may cause permanent damage to the device. These are stress ratings only and operation of the device at these or any other conditions above those indicated in the operating sections of this specification is not implied. Exposure to absolute maximum rating conditions for extended periods may affect device reliability. Refer also to the STMicroelectronics SURE program and other relevant quality document.

Table 3. Absolute maximum ratings

Symbol Parameter Value Unit
V
-V
-I
I
OUT
-I
I
STAT
V
E
P
T
CC
CC
GND
OUT
I
IN
ESD
MAX
tot
T
j
stg
DC supply voltage 41 V
Reverse DC supply voltage -0.3 V
DC reverse ground pin current -200 mΑ
DC output current Internally limited A
Reverse DC output current -6 A
DC input current +/-10 mA
DC Status current +/-10 mA
Electrostatic discharge (human body model: R = 1.5 KΩ; C=100pF)
- INPUT
- STATUS
- OUTPUT
- V
CC
Maximum switching energy (L = 2.5 mH; R
= 0 Ω; V
L
= 13.5 V; T
bat
Power dissipation (per island) at T
= 150 °C; IL = 9 A)
jstart
= 25°C 6.25 W
lead
4000 4000 5000 5000
23 mJ
V V V V
Junction operating temperature Internally limited °C
Storage temperature - 55 to 150 °C

2.2 Thermal data

Table 4. Thermal data (per island)

Symbol Parameter Value Unit
R
thj-lead
R
thj-amb
R
thj-amb
1. When mounted on a standard single-sided FR-4 board with 0.5 cm2 of Cu (at least 35 µm thick) connected to all V
2. When mounted on a standard single-sided FR-4 board with 6 cm2 of Cu (at least 35 µm thick) connected to all V
Thermal resistance junction-lead 20 °C/W
Thermal resistance junction-ambient (one chip ON) 60
Thermal resistance junction-ambient (two chips ON) 46
pins. Horizontal mounting and no artificial air flow.
CC
pins. Horizontal mounting and no artificial air flow.
CC
(1)
(1)
44
31
(2)
(2)
°C/W
°C/W
Doc ID 17387 Rev 1 7/28
Page 8
Electrical specifications VNQ810P-E

2.3 Electrical characteristics

Values specified in this section are for 8 V < V
CC
otherwise stated.

Figure 3. Current and voltage conventions

I
S3,4
V
INPUT1
STATUS1
INPUT2
STATUS2
INPUT3
STATUS3
INPUT4
STATUS4
GND
CC3,4
3,4
V
CC3,4
V
IN1
V
STAT1
V
IN2
V
STAT2
V
IN3
V
STAT3
V
1. VFn = V

Table 5. Power output

CCn
- V
during reverse battery condition.
OUTn
I
IN1
I
STAT1
I
IN2
I
STAT2
I
IN3
I
STAT3
I
IN4
I
STAT4
IN4
V
STAT4
< 36 V; -40 °C < Tj < 150 °C, unless
I
S1,2
I
GND3,4
V
CC1,2
OUTPUT1
OUTPUT2
OUTPUT3
OUTPUT4
GND
1,2
I
GND1,2
I
OUT1
I
OUT2
I
OUT3
I
OUT4
V
OUT4
V
V
OUT3
(1)
F1
V
OUT1
V
OUT2
V
CC1,2
Symbol Parameter Test conditions Min. Typ. Max. Unit
(1)
V
CC
V
USD
V
OV
R
I
L(off1)
I
L(off2)
I
L(off3)
I
L(off4)
1. Per island.
Operating supply voltage 5.5 13 36 V
(1)
Undervoltage shutdown 3 4 5.5 V
(1)
Overvoltage shutdown 36 V
= 1 A; Tj = 25 °C
I
On-state resistance
ON
Supply current
I
S
Off-state output current V
Off-state output current V
Off-state output current
Off-state output current
OUT
= 1 A; V
I
OUT
Off-state; V V
= V
IN
OUT
Off-state; V
= V
V
IN
OUT
On-state; V
=0A
I
OUT
= V
IN
OUT
= 0V; V
IN
V
= V
IN
OUT
Tj=125°C
= V
V
IN
OUT
=25°C
T
j
> 8 V
CC
= 13 V;
CC
= 0 V
= 13 V;
CC
= 0 V; Tj = 25 °C
= 13 V; V
CC
IN
= 5 V;
12 40 µA
12 25 µA
= 0 V 0 50 µA
= 3.5 V -75 0 µA
OUT
= 0V; V
= 0V; V
CC
CC
= 13 V;
= 13 V;
160 320mΩmΩ
57mA
5µA
3µA
8/28 Doc ID 17387 Rev 1
Page 9
VNQ810P-E Electrical specifications

Table 6. Protections

(1)
Symbol Parameter Test conditions Min. Typ. Max. Unit
T
T
t
V
demag
1. To ensure long term reliability under heavy overload or short circuit conditions, protection and related

Tabl e 7. VCC - output diode

Shutdown temperature 150 175 200 °C
TSD
T
Reset temperature 135 °C
R
Thermal hysteresis 7 15 °C
hyst
Status delay in overload
SDL
conditions
Current limitation
I
lim
Turn-off output clamp voltage I
diagnostic signals must be used together with a proper software strategy. If the device is subjected to abnormal conditions, this software must limit the duration and number of activation cycles.
> T
T
j
TSD
V
= 13 V 3.5 5 7.5 A
CC
5.5 V < V
= 1A; L = 6mH VCC-41 VCC-48 VCC-55 V
OUT
< 36 V 7.5 A
CC
20 µs
Symbol Parameter Test conditions Min. Typ. Max. Unit
V

Table 8. Status pin

Forward on voltage -I
F
= 0.5 A; Tj = 150 °C - - 0.6 V
OUT
Symbol Parameter Test conditions Min. Typ. Max. Unit
V
I
LSTAT
C
V
Table 9. Switching (V
Status low output voltage I
STAT
STAT
Status leakage current Normal operation; V
Status pin Input capacitance Normal operation; V
STAT
I
Status clamp voltage
SCL
CC
= 13V)
STAT
I
STAT
= 1.6mA 0.5 V
= 5 V 10 µA
STAT
= 5 V 100 pF
STAT
= 1 mA 6 6.8 8 V
= - 1 mA -0.7 V
Symbol Parameter Test conditions Min. Typ. Max. Unit
= 13 Ω from VIN rising edge
R
t
d(on)
t
d(off)
dV
/dt
OUT
dV
/dt
OUT
Turn-on delay time
Turn-off delay time
Turn-on voltage slope
(on)
Turn-off voltage slope
(off)
L
to V
R edge to V
R to V
R to V
= 1.3 V
OUT
= 13 Ω from VIN falling
L
= 13 Ω from V
L
OUT
= 13 Ω from V
L
OUT
= 11.7 V
OUT
= 10.4 V
= 1.3 V
OUT
OUT
= 1.3 V
= 11.7 V
-30 -µs
-30 -µs
See
-
-
Figure 10
See
Figure 12
-V/µs
-V/µs
Doc ID 17387 Rev 1 9/28
Page 10
Electrical specifications VNQ810P-E

Table 10. Open-load detection

Symbol Parameter Test conditions Min. Typ. Max. Unit
I
t
DOL(on)
V
t
DOL(off)

Table 11. Logic inputs

Open-load on-state detection threshold V
OL
Open-load on-state detection delay I
Open-load off-state voltage detection
OL
threshold
= 5 V 20 40 80 mA
IN
= 0 A 200 µs
OUT
= 0 V 1.5 2.5 3.5 V
V
IN
Open-load detection delay at turn-off 1000 µs
Symbol Parameter Test conditions Min. Typ. Max. Unit
V
V
V
I
V
I
I(hyst)
Input low level 1.25 V
IL
Low level input current V
IL
Input high level 3.25 V
IH
High level input current V
IH
= 1.25 V 1 µA
IN
= 3.25 V 10 µA
IN
Input hysteresis voltage 0.5 V
I
= 1 mA 6 6.8 8 V
Input clamp voltage
ICL
IN
= -1 mA - 0.7 V
I
IN

Figure 4. Status timings

OPEN LOAD STATUS TIMING (with external pull-up)
V
> V
OUT
V
INn
I
< I
OUT
OL
OL
OVER TEMP STATUS TIMING
V
INn
Tj > T
TSD
V
STATn
t
DOL(off)
t
DOL(on)
10/28 Doc ID 17387 Rev 1
V
STATn
t
SDL
t
SDL
Page 11
VNQ810P-E Electrical specifications

Figure 5. Switching time Waveforms

Table 12. Truth table

Conditions Input Output Sense
Normal operation
Current limitation
Overtemperature
Undervoltage
Overvoltage
Output voltage > V
Output current < I
OL
OL
L
H
L H H
L H
L H
L H
L H
L H
L H
L X X
L L
L L
L L
H H
L H
(T
(T
< T
j
> T
j
H H
H
TSD
TSD
H
L
X X
H H
L
H
H
L
) H
) L
Doc ID 17387 Rev 1 11/28
Page 12
Electrical specifications VNQ810P-E

Table 13. Electrical transient requirements on VCC pin (part 1/3)

ISO T/R
Test levels
7637/1
Test pulse
I II III IV Delays and impedance
1 - 25V - 50V - 75V - 100V 2ms, 10Ω
2 + 25V + 50V + 75V + 100V 0.2ms, 10Ω
3a - 25V - 50V - 100V - 150V 0.1µs, 50Ω
3b + 25V + 50V + 75V + 100V 0.1µs, 50Ω
4 - 4V - 5V - 6V - 7V 100ms, 0.01Ω
5 + 26.5V + 46.5V + 66.5V + 86.5V 400ms, 2Ω

Table 14. Electrical transient requirements on VCC pin (part 2/3)

ISO T/R
Test levels results
7637/1
Test pulse
IIIIIIIV
1C C C C
2C C C C
3a C C C C
3b C C C C
4C C C C
5C E E E

Table 15. Electrical transient requirements on VCC pin (part 3/3)

Class Contents
C
E
All functions of the device are performed as designed after exposure to disturbance.
One or more functions of the device is not performed as designed after exposure and cannot be returned to proper operation without replacing the device.
12/28 Doc ID 17387 Rev 1
Page 13
VNQ810P-E Electrical specifications

Figure 6. Waveforms

Normal operation
INPUT
n
OUTPUT VOLTAGE
STATUS
V
INPUT
n
CC
n
OUTPUT VOLTAGE
STATUS
V
INPUT
n
CC
n
OUTPUT VOLTAGE
STATUS
n
n
n
n
V
USD
VCC<V
OV
Undervoltage
V
USDhyst
undefined
Overvoltage
V
> V
CC
OV
INPUT
n
OUTPUT VOLTAGE
STATUS
INPUT
n
n
OUTPUT VOLTAGE
STATUS
T
INPUT
n
j
n
OUTPUT VOLTAGE
STATUS
n
Open-load with external pull-up
V
> V
n
V
OL
OUT
OL
Open-load without external pull-up
n
T
TSD
T
R
n
Overtemperature
Doc ID 17387 Rev 1 13/28
Page 14
Electrical specifications VNQ810P-E

2.4 Electrical characteristics curves

Figure 7. Off-state output current Figure 8. High level input current
IL(off1) (uA)
1.44
1.28
1.12
0.96
0.64
0.48
0.32
0.16

Figure 9. Input clamp voltage Figure 10. Status leakage current

1.6
Off state Vcc=36V
Vin=Vout=0V
0.8
0
-50 -25 0 25 50 75 100 125 150 175
Tc (ºC)
Vicl (V)
8
7.8
7.6
7.4
7.2
7
6.8
6.6
6.4
6.2
6
Iin=1mA
-50 -25 0 25 50 75 100 125 150 175
Tc (°C)
Iih (uA)
5
4.5
3.5
2.5
1.5
0.5
Vin=3.25V
4
3
2
1
0
-50 -25 0 25 50 75 100 125 150 175
Tc (°C)
Ilstat (uA)
0.05
0.04
Vstat=5V
0.03
0.02
0.01
0
-50 -25 0 25 50 75 100 125 150 175
Tc (°C)

Figure 11. Status low output voltage Figure 12. Status clamp voltage

Vstat (V)
0.8
0.7
Istat=1.6mA
0.6
0.5
0.4
0.3
0.2
0.1
0
-50 -25 0 25 50 75 100 125 150 175
Tc (°C)
Vscl (V)
8
7.8
7.6
7.4
7.2
6.8
6.6
6.4
6.2
Istat=1mA
7
6
-50 -25 0 25 50 75 100 125 150 175
Tc (°C)
14/28 Doc ID 17387 Rev 1
Page 15
VNQ810P-E Electrical specifications

Figure 13. Overvoltage shutdown Figure 14. I

Vov (V)
50
48
46
44
42
40
38
36
34
32
30
-50 -25 0 25 50 75 100 125 150 175
Tc (°C)

Figure 15. Turn-on voltage slope Figure 16. Turn-off voltage slope

dVout/dt(on) (V/ms)
1000
900
800
700
600
500
400
300
200
100
Vcc=13V
Rl=13Ohm
0
-50 -25 0 25 50 75 100 125 150 175
Ilim (A)
10
9
8
7
6
5
4
3
2
1
0
-50 -25 0 25 50 75 100 125 150 175
dVout/dt(off) (V/ms)
500
450
400
350
300
250
200
150
100
50
0
-50 -25 0 25 50 75 100 125 150 175
Tc (ºC)
Figure 17. On-state resistance vs T
case
Figure 18. On-state resistance vs V
vs T
LIM
Vcc=13V
Rl=13Ohm
case
Tc (°C)
Tc (°C)
CC
Ron (mOhm)
400
350
300
250
200
150
100
50
0
-50 -25 0 25 50 75 100 125 150 175
Iout=0.5A
Vcc=8V; 13V & 36V
Tc (°C)
Ron (mOhm)
300
275
250
225
200
175
150
125
100
75
50
5 10152025303540
Iout=0.5A
Tc= 150°C
Tc= 25°C
Tc= - 40°C
Vcc (V)
Doc ID 17387 Rev 1 15/28
Page 16
Electrical specifications VNQ810P-E

Figure 19. Input high level Figure 20. Input low level

Vih (V)
3.6
3.4
3.2
3
2.8
2.6
2.4
2.2
2
-50 -25 0 25 50 75 100 125 150 175
Tc (°C)
Figure 21. Open-load on-state detection
threshold
Iol (mA)
60
55
50
45
40
35
30
25
20
15
10
Vcc=13V
Vin=5V
-50 -25 0 25 50 75 100 125 150 175
Vil (V)
2.6
2.4
2.2
2
1.8
1.6
1.4
1.2
1
-50 -25 0 25 50 75 100 125 150 175
Tc (°C)
Figure 22. Open-load off-state voltage
detection threshold
Vol (V)
5
4.5
4
3.5
3
2.5
2
1.5
1
0.5
0
Vin=0V
-50 -25 0 25 50 75 100 125 150 175
Tc (°C)
Tc (°C)

Figure 23. Input hysteresis voltage

Vhyst (V)
1.5
1.4
1.3
1.2
1.1
1
0.9
0.8
0.7
0.6
0.5
-50 -25 0 25 50 75 100 125 150 175
Tc (°C)
16/28 Doc ID 17387 Rev 1
Page 17
VNQ810P-E Application information

3 Application information

Figure 24. Application schematic

+5V
+5V
μ
R
C
+5V
V
R
prot
R
prot
prot
R
prot
STATUS1
INPUT1
STATUS2
INPUT2
CC1,2
V
CC3,4
OUTPUT1
D
ld
GND3,4
D
OUTPUT2
OUTPUT3
OUTPUT4
GND
R
prot
R
prot
R
prot
R
prot
+5V
+5V
STATUS3
INPUT3
STATUS4
INPUT4
GND1,2
V
GND
R
GND
Note: Channels 3 and 4 have the same internal circuit as channel 1 and 2.

3.1 GND protection network against reverse battery

This section provides two solutions for implementing a ground protection network against reverse battery.
3.1.1 Solution 1: a resistor in the ground line (R
It can be used with any type of load.
The following show how to dimension the R
Equation 1
R
≤ 600mV / 2 (I
GND
S(on)max
)
Doc ID 17387 Rev 1 17/28
GND
resistor:
GND
only)
Page 18
Application information VNQ810P-E
Equation 2
R
GND
where - I
≥ ( - VCC) / ( - I
is the DC reverse ground pin current and can be found in the absolute
GND
GND
)
maximum rating section of the device datasheet.
Power dissipation in R
P
= ( - VCC)2/ R
D
GND
GND
This resistor can be shared amongst several different HSDs. Please note that the value of this resistor should be calculated with Equation 1 where I maximum on-state currents of the different devices.
Please note that, if the microprocessor ground is not shared by the device ground, then the R
produces a shift (I
GND
S(on)max
values. This shift varies depending on how many devices are ON in the case of several high side drivers sharing the same R
If the calculated power dissipation requires the use of a large resistor, or several devices have to share the same resistor, then ST suggests using solution 2 below.
3.1.2 Solution 2: a diode (D
A resistor (R inductive load. This small signal diode can be safely shared amongst several different HSD. Also in this case, the presence of the ground network produces a shift ( 600mV) in the input threshold and the status output values if the microprocessor ground is not common with the device ground. This shift not varies if more than one HSD shares the same diode/resistor network. Series resistor in INPUT and STATUS lines are also required to prevent that, during battery voltage transient, the current exceeds the Absolute Maximum Rating. Safest configuration for unused INPUT and STATUS pin is to leave them unconnected.
= 1kΩ) should be inserted in parallel to D
GND
(when V
GND
< 0 during reverse battery situations) is:
CC
* R
GND
) in the input thresholds and the status output
GND
.
) in the ground line
S(on)max
becomes the sum of the
if the device is driving an
GND
≈

3.2 Load dump protection

Dld is necessary (voltage transient suppressor) if the load dump peak voltage exceeds the V
maximum DC rating. The same applies if the device is subject to transients on the VCC
CC
line that are greater than those shown in the ISO T/R 7637/1 table.

3.3 MCU I/O protection

If a ground protection network is used and negative transients are present on the VCC line, the control pins are pulled negative. ST suggests to insert a resistor (R the microcontroller I/O pins from latching up.
The value of these resistors is a compromise between the leakage current of microcontroller and the current required by the HSD I/Os (Input levels compatibility) with the latch-up limit of microcontroller I/Os:
- V
CCpeak
18/28 Doc ID 17387 Rev 1
/ I
latchup
≤ R
prot
≤ (V
OHμC
- V
IH
- V
GND
) / I
IHmax
) in line to prevent
prot
Page 19
VNQ810P-E Application information
Example
For the following conditions:
V
CCpeak
I
latchup
V
OHμC
5kΩ ≤ R
= - 100 V
≥ 20 mA
≥ 4.5 V
≤ 65 kΩ.
prot
Recommended values are:
R
= 10 kΩ
prot

3.4 Open-load detection in off-state

Off-state open-load detection requires an external pull-up resistor (RPU) connected between output pin and a positive supply voltage (V microprocessor.
The external resistor has to be selected according to the following requirements:
1. No false open-load indication when load is connected: in this case we have to avoid V
to be higher than V
OUT
V
= (V
OUT
PU
/ (RL + RPU))RL < V
; this results in the following condition
Olmin
Olmin.
2. No misdetection when load is disconnected: in this case the V V
Because I up resistor R
; this results in the following condition R
OLmax
may significantly increase if V
s(OFF)
should be connected to a supply that is switched OFF when the module is in
PU
standby.
) like the +5V line used to supply the
PU
has to be higher than
PU
- V
OUT
OLmax
) / I
L(off2)
< (V
PU
is pulled high (up to several mA), the pull-
out
.
The values of V
OLmin
, V
OLmax
and I
are available in Section 2.3: Electrical
L(off2)
characteristics.

Figure 25. Open-load detection in off-state

V
CC
INPUT
STATUS
DRIVER
+
LOGIC
+
-
VOL
GROUND
V batt. VPU
I
L(off2)
OUT
R
PU
R
R
L
Doc ID 17387 Rev 1 19/28
Page 20
Application information VNQ810P-E
3.5 Maximum demagnetization energy (V

Figure 26. SO-28 (double island) maximum turn-off current versus load inductance

LMAX (A)
I
10
A
B
C
1
0.01 0.1 1 10 100 L(mH)
= 13.5V)
CC
A = single pulse at T
Jstart
B= repetitive pulse at T
C= repetitive pulse at T
VIN, I
L
Demagnetization
Note: Values are generated with R
In case of repetitive pulses, T must not exceed the temperature specified above for curves B and C.
= 150 ºC
= 100 ºC
Jstart
= 125 ºC
Jstart
Demagnetization
= 0Ω.
L
(at beginning of each demagnetization) of every pulse
jstart
Demagnetization
t
20/28 Doc ID 17387 Rev 1
Page 21
VNQ810P-E Package and PCB thermal data

4 Package and PCB thermal data

4.1 SO-28 thermal data

Figure 27. SO-28 double island PC board

Note: Layout condition of R
thickness = 2 mm, Cu thickness = 35 µm, Copper areas: 0.5 cm

Table 16. Thermal calculation according to the PCB heatsink area

Chip 1 Chip 2 T
ON OFF R
OFF ON R
ON ON R
ON ON
R
= thermal resistance junction to ambient with one chip ON
thA
R
= thermal resistance junction to ambient with both chips ON and P
thB
R
= mutual thermal resistance
thC
(R + T
thA
thC
thB
thA
amb
and Zth measurements (PCB FR4 area = 58 mm x 58 mm, PCB
th
x P
x P
x (P
x P
dchip1
dchip2
dchip1
dchip1
jchip1
+ T
+ T
+ P
) + R
amb
amb
dchip2
thC
x P
) + T
dchip2
R
thC
R
thA
ambRthB
(R + T
thA
x P
x P
x (P
amb
x P
dchip1
dchip2
dchip1
dchip2
T
jchip2
+ T
+ T
+ P
) + R
2
, 3 cm2, 6 cm2).
amb
amb
) + T
dchip2
thC
x P
dchip1
ambPdchip1
dchip1
P
dchip1
= P
dchip2
Note
= P
≠ P
dchip2
dchip2
Doc ID 17387 Rev 1 21/28
Page 22
Package and PCB thermal data VNQ810P-E
Figure 28. R
vs PCB copper area in open box free air condition
thj-amb
RTHj_am b
(°C/W)
70
60
50
40
30
20
10
01234567
PCB Cu heatsink area (cm^2)/island

Figure 29. SO-28 thermal impedance junction ambient single pulse

Zth(°C/W)
100
R
thA
R
thB
R
thC
0,5 cm ^2/island
3 cm ^2/island
6 cm ^2/island
10
1
0.1
0.01
0.0001 0.001 0.01 0.1 1 10 100 1000
time(s)
Equation 3
Z
THδRTH
where
: pulse calculation formula
δ Z
THtp
1 δ–()+⋅=
δ tpT⁄=
One channel ON
Two channels ON on same chip
22/28 Doc ID 17387 Rev 1
Page 23
VNQ810P-E Package and PCB thermal data

Figure 30. Thermal fitting model of a quad channel HSD in SO-28

Tj_1
Pd1
Tj_2
Pd2
Tj_3
Pd3
Tj_4
Pd4
C1
C13 C14
R13
C7
C15 C16
R15
R14
R16
C8
R8
C3 C4
R3R1 R6R5R2
R17
C9
R9R7
R4
R18
C10
R10
T_amb
C5 C6C2
C11 C12
R12R11

Table 17. Thermal parameters

Area / island (cm2)0.56
R1 = R7 = R13 = R15 (°C/W) 0.35
R2 = R8 = R14 = R16 (°C/W) 1.8
R3 = R9 (°C/W) 4.5
R4 = R10 (°C/W) 11
R5 = R11 (°C/W) 15
R6 = R12 (°C/W) 30 13
C1 = C7 = C13 = C15 (W.s/°C) 0.0001
C2 = C8 = C14 = C16 (W.s/°C) 7E-04
C3 = C9 (W.s/°C) 6E-03
C4 = C10 (W.s/°C) 0.2
C5 = C11 (W.s/°C) 1.5
C6 = C12 (W.s/°C) 5 8
R17 = R18 (°C/W) 150
Doc ID 17387 Rev 1 23/28
Page 24
Package and packing information VNQ810P-E

5 Package and packing information

5.1 ECOPACK® packages

In order to meet environmental requirements, ST offers these devices in different grades of ECOPACK specifications, grade definitions and product status are available at: www.st.com
ECOPACK
®
packages, depending on their level of environmental compliance. ECOPACK®
®
is an ST trademark.

5.2 SO-28 package information

Figure 31. SO-28 package dimensions

.
24/28 Doc ID 17387 Rev 1
Page 25
VNQ810P-E Package and packing information

Table 18. SO-28 mechanical data

Millimeters
Symbol
Min. Typ. Max.
A 2.65
a1 0.10 0.30
b 0.35 0.49
b1 0.23 0.32
C0.50
c1 45° (typ.)
D 17.7 18.1
E 10.00 10.65
e1.27
e3 16.51
F 7.40 7.60
L 0.40 1.27
S 8° (max.)
Doc ID 17387 Rev 1 25/28
Page 26
Package and packing information VNQ810P-E

5.3 SO-28 packing information

Figure 32. SO-28 tube shipment (no suffix)

Base Q.ty 28 Bulk Q.ty 700 Tube length (± 0.5) 532 A 3.5
C
B
A

Figure 33. SO-28 tape and reel shipment (suffix “TR”)

B 13.8 C (± 0.1) 0.6
All dimensions are in mm.
Reel dimensions
Base Q.ty 1000 Bulk Q.ty 1000 A (max) 330 B (min) 1.5 C (± 0.2) 13 F 20.2 G (+ 2 / -0) 16.4 N (min) 60 T (max) 22.4
Tape dimensions
According to Electronic Industries Association (EIA) Standard 481 rev. A, Feb. 1986
Tape width W 16 Tape Hole Spacing P0 (± 0.1) 4 Component Spacing P 12 Hole Diameter D (± 0.1/-0) 1.5 Hole Diameter D1 (min) 1.5 Hole Position F (± 0.05) 7.5 Compartment Depth K (max) 6.5 Hole Spacing P1 (± 0.1) 2
All dimensions are in mm.
Top
cover
tape
End
26/28 Doc ID 17387 Rev 1
500mm min
Empty components pock ets saled with cover tape.
User direction of feed
Start
No componentsNo components Components
500mm min
Page 27
VNQ810P-E Revision history

6 Revision history

Table 19. Document revision history

Date Revision Changes
27-Apr-2010 1 Initial release.
Doc ID 17387 Rev 1 27/28
Page 28
VNQ810P-E
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