The VNQ810P-E is a quad HSD formed by
assembling two VND810P-E chips in the same
SO-28 package. The VNQ810P-E is a monolithic
device made by using STMicroelectronics
VIPower™ M0-3 technology, intended for driving
any kind of load with one side connected to
ground. Active V
device against low energy spikes (see ISO7637
transient compatibility table).
Active current limitation combined with thermal
shutdown and automatic restart protects the
device against overload. The device detects
open-load condition both in on and off-state.
Output shorted to V
Device automatically turns off in case of ground
pin disconnection.
Table 2.Suggested connections for unused and not connected pins
14
28
15
V
OUTPUT1
OUTPUT1
OUTPUT1
OUTPUT2
OUTPUT2
OUTPUT2
OUTPUT3
OUTPUT3
OUTPUT3
OUTPUT4
OUTPUT4
OUTPUT4
V
CC
CC
1,2
3,4
Connection / pinStatusN.C.OutputInput
FloatingXXXX
To groundX
Through 10 KΩ
resistor
6/28Doc ID 17387 Rev 1
Page 7
VNQ810P-EElectrical specifications
2 Electrical specifications
2.1 Absolute maximum ratings
Stressing the device above the rating listed in the Ta bl e 5 may cause permanent damage to
the device. These are stress ratings only and operation of the device at these or any other
conditions above those indicated in the operating sections of this specification is not implied.
Exposure to absolute maximum rating conditions for extended periods may affect device
reliability. Refer also to the STMicroelectronics SURE program and other relevant quality
document.
Table 3.Absolute maximum ratings
SymbolParameterValueUnit
V
-V
-I
I
OUT
-I
I
STAT
V
E
P
T
CC
CC
GND
OUT
I
IN
ESD
MAX
tot
T
j
stg
DC supply voltage41V
Reverse DC supply voltage-0.3V
DC reverse ground pin current-200mΑ
DC output currentInternally limitedA
Reverse DC output current -6A
DC input current+/-10mA
DC Status current+/-10mA
Electrostatic discharge (human body model: R = 1.5 KΩ;
C=100pF)
pins. Horizontal mounting and no artificial air flow.
CC
pins. Horizontal mounting and no artificial air flow.
CC
(1)
(1)
44
31
(2)
(2)
°C/W
°C/W
Doc ID 17387 Rev 17/28
Page 8
Electrical specificationsVNQ810P-E
2.3 Electrical characteristics
Values specified in this section are for 8 V < V
CC
otherwise stated.
Figure 3.Current and voltage conventions
I
S3,4
V
INPUT1
STATUS1
INPUT2
STATUS2
INPUT3
STATUS3
INPUT4
STATUS4
GND
CC3,4
3,4
V
CC3,4
V
IN1
V
STAT1
V
IN2
V
STAT2
V
IN3
V
STAT3
V
1. VFn = V
Table 5.Power output
CCn
- V
during reverse battery condition.
OUTn
I
IN1
I
STAT1
I
IN2
I
STAT2
I
IN3
I
STAT3
I
IN4
I
STAT4
IN4
V
STAT4
< 36 V; -40 °C < Tj < 150 °C, unless
I
S1,2
I
GND3,4
V
CC1,2
OUTPUT1
OUTPUT2
OUTPUT3
OUTPUT4
GND
1,2
I
GND1,2
I
OUT1
I
OUT2
I
OUT3
I
OUT4
V
OUT4
V
V
OUT3
(1)
F1
V
OUT1
V
OUT2
V
CC1,2
SymbolParameterTest conditionsMin. Typ. Max. Unit
(1)
V
CC
V
USD
V
OV
R
I
L(off1)
I
L(off2)
I
L(off3)
I
L(off4)
1. Per island.
Operating supply voltage5.51336V
(1)
Undervoltage shutdown345.5V
(1)
Overvoltage shutdown36V
= 1 A; Tj = 25 °C
I
On-state resistance
ON
Supply current
I
S
Off-state output currentV
Off-state output currentV
Off-state output current
Off-state output current
OUT
= 1 A; V
I
OUT
Off-state; V
V
= V
IN
OUT
Off-state; V
= V
V
IN
OUT
On-state; V
=0A
I
OUT
= V
IN
OUT
= 0V; V
IN
V
= V
IN
OUT
Tj=125°C
= V
V
IN
OUT
=25°C
T
j
> 8 V
CC
= 13 V;
CC
= 0 V
= 13 V;
CC
= 0 V; Tj = 25 °C
= 13 V; V
CC
IN
= 5 V;
1240µA
1225µA
= 0 V 050µA
= 3.5 V -750µA
OUT
= 0V; V
= 0V; V
CC
CC
= 13 V;
= 13 V;
160
320mΩmΩ
57mA
5µA
3µA
8/28Doc ID 17387 Rev 1
Page 9
VNQ810P-EElectrical specifications
Table 6.Protections
(1)
SymbolParameterTest conditionsMin.Typ.Max.Unit
T
T
t
V
demag
1. To ensure long term reliability under heavy overload or short circuit conditions, protection and related
Tabl e 7.VCC - output diode
Shutdown temperature150175200°C
TSD
T
Reset temperature135°C
R
Thermal hysteresis715°C
hyst
Status delay in overload
SDL
conditions
Current limitation
I
lim
Turn-off output clamp voltage I
diagnostic signals must be used together with a proper software strategy. If the device is subjected to
abnormal conditions, this software must limit the duration and number of activation cycles.
> T
T
j
TSD
V
= 13 V3.557.5A
CC
5.5 V < V
= 1A; L = 6mHVCC-41VCC-48 VCC-55V
OUT
< 36 V7.5A
CC
20µs
SymbolParameterTest conditionsMin.Typ. Max.Unit
V
Table 8.Status pin
Forward on voltage-I
F
= 0.5 A; Tj = 150 °C--0.6V
OUT
SymbolParameterTest conditionsMin.Typ. Max.Unit
V
I
LSTAT
C
V
Table 9.Switching (V
Status low output voltageI
STAT
STAT
Status leakage currentNormal operation; V
Status pin Input capacitance Normal operation; V
STAT
I
Status clamp voltage
SCL
CC
= 13V)
STAT
I
STAT
= 1.6mA0.5V
= 5 V10µA
STAT
= 5 V100pF
STAT
= 1 mA66.88V
= - 1 mA-0.7V
SymbolParameterTest conditionsMin.Typ.Max. Unit
= 13 Ω from VIN rising edge
R
t
d(on)
t
d(off)
dV
/dt
OUT
dV
/dt
OUT
Turn-on delay time
Turn-off delay time
Turn-on voltage slope
(on)
Turn-off voltage slope
(off)
L
to V
R
edge to V
R
to V
R
to V
= 1.3 V
OUT
= 13 Ω from VIN falling
L
= 13 Ω from V
L
OUT
= 13 Ω from V
L
OUT
= 11.7 V
OUT
= 10.4 V
= 1.3 V
OUT
OUT
= 1.3 V
= 11.7 V
-30 -µs
-30 -µs
See
-
-
Figure 10
See
Figure 12
-V/µs
-V/µs
Doc ID 17387 Rev 19/28
Page 10
Electrical specificationsVNQ810P-E
Table 10.Open-load detection
SymbolParameterTest conditionsMin. Typ. Max. Unit
I
t
DOL(on)
V
t
DOL(off)
Table 11.Logic inputs
Open-load on-state detection thresholdV
OL
Open-load on-state detection delayI
Open-load off-state voltage detection
OL
threshold
= 5 V 204080mA
IN
= 0 A 200µs
OUT
= 0 V1.52.53.5V
V
IN
Open-load detection delay at turn-off1000µs
SymbolParameterTest conditionsMin.Typ.Max.Unit
V
V
V
I
V
I
I(hyst)
Input low level1.25V
IL
Low level input currentV
IL
Input high level3.25V
IH
High level input currentV
IH
= 1.25 V1µA
IN
= 3.25 V10µA
IN
Input hysteresis voltage0.5V
I
= 1 mA 66.88V
Input clamp voltage
ICL
IN
= -1 mA- 0.7V
I
IN
Figure 4.Status timings
OPEN LOAD STATUS TIMING (with external pull-up)
V
> V
OUT
V
INn
I
< I
OUT
OL
OL
OVER TEMP STATUS TIMING
V
INn
Tj > T
TSD
V
STATn
t
DOL(off)
t
DOL(on)
10/28Doc ID 17387 Rev 1
V
STATn
t
SDL
t
SDL
Page 11
VNQ810P-EElectrical specifications
Figure 5.Switching time Waveforms
Table 12.Truth table
ConditionsInputOutputSense
Normal operation
Current limitation
Overtemperature
Undervoltage
Overvoltage
Output voltage > V
Output current < I
OL
OL
L
H
L
H
H
L
H
L
H
L
H
L
H
L
H
L
H
L
X
X
L
L
L
L
L
L
H
H
L
H
(T
(T
< T
j
> T
j
H
H
H
TSD
TSD
H
L
X
X
H
H
L
H
H
L
) H
) L
Doc ID 17387 Rev 111/28
Page 12
Electrical specificationsVNQ810P-E
Table 13.Electrical transient requirements on VCC pin (part 1/3)
ISO T/R
Test levels
7637/1
Test pulse
IIIIIIIVDelays and impedance
1- 25V- 50V- 75V- 100V2ms, 10Ω
2+ 25V+ 50V+ 75V+ 100V0.2ms, 10Ω
3a- 25V- 50V- 100V- 150V0.1µs, 50Ω
3b+ 25V+ 50V+ 75V+ 100V0.1µs, 50Ω
4- 4V- 5V- 6V- 7V100ms, 0.01Ω
5+ 26.5V+ 46.5V+ 66.5V+ 86.5V400ms, 2Ω
Table 14.Electrical transient requirements on VCC pin (part 2/3)
ISO T/R
Test levels results
7637/1
Test pulse
IIIIIIIV
1C C C C
2C C C C
3aCCCC
3bCCCC
4C C C C
5C E E E
Table 15.Electrical transient requirements on VCC pin (part 3/3)
ClassContents
C
E
All functions of the device are performed as designed after exposure to
disturbance.
One or more functions of the device is not performed as designed after exposure
and cannot be returned to proper operation without replacing the device.
12/28Doc ID 17387 Rev 1
Page 13
VNQ810P-EElectrical specifications
Figure 6.Waveforms
Normal operation
INPUT
n
OUTPUT VOLTAGE
STATUS
V
INPUT
n
CC
n
OUTPUT VOLTAGE
STATUS
V
INPUT
n
CC
n
OUTPUT VOLTAGE
STATUS
n
n
n
n
V
USD
VCC<V
OV
Undervoltage
V
USDhyst
undefined
Overvoltage
V
> V
CC
OV
INPUT
n
OUTPUT VOLTAGE
STATUS
INPUT
n
n
OUTPUT VOLTAGE
STATUS
T
INPUT
n
j
n
OUTPUT VOLTAGE
STATUS
n
Open-load with external pull-up
V
> V
n
V
OL
OUT
OL
Open-load without external pull-up
n
T
TSD
T
R
n
Overtemperature
Doc ID 17387 Rev 113/28
Page 14
Electrical specificationsVNQ810P-E
2.4 Electrical characteristics curves
Figure 7.Off-state output currentFigure 8.High level input current
IL(off1) (uA)
1.44
1.28
1.12
0.96
0.64
0.48
0.32
0.16
Figure 9.Input clamp voltageFigure 10. Status leakage current
1.6
Off state
Vcc=36V
Vin=Vout=0V
0.8
0
-50 -250255075 100 125 150 175
Tc (ºC)
Vicl (V)
8
7.8
7.6
7.4
7.2
7
6.8
6.6
6.4
6.2
6
Iin=1mA
-50 -250255075100 125 150 175
Tc (°C)
Iih (uA)
5
4.5
3.5
2.5
1.5
0.5
Vin=3.25V
4
3
2
1
0
-50 -250255075100 125 150 175
Tc (°C)
Ilstat (uA)
0.05
0.04
Vstat=5V
0.03
0.02
0.01
0
-50 -250255075 100 125 150 175
Tc (°C)
Figure 11. Status low output voltageFigure 12. Status clamp voltage
Vstat (V)
0.8
0.7
Istat=1.6mA
0.6
0.5
0.4
0.3
0.2
0.1
0
-50 -250255075100 125 150 175
Tc (°C)
Vscl (V)
8
7.8
7.6
7.4
7.2
6.8
6.6
6.4
6.2
Istat=1mA
7
6
-50 -250255075100 125 150 175
Tc (°C)
14/28Doc ID 17387 Rev 1
Page 15
VNQ810P-EElectrical specifications
Figure 13. Overvoltage shutdown Figure 14. I
Vov (V)
50
48
46
44
42
40
38
36
34
32
30
-50 -250255075 100 125 150 175
Tc (°C)
Figure 15. Turn-on voltage slopeFigure 16. Turn-off voltage slope
dVout/dt(on) (V/ms)
1000
900
800
700
600
500
400
300
200
100
Vcc=13V
Rl=13Ohm
0
-50 -250255075 100 125 150 175
Ilim (A)
10
9
8
7
6
5
4
3
2
1
0
-50 -250255075100 125 150 175
dVout/dt(off) (V/ms)
500
450
400
350
300
250
200
150
100
50
0
-50 -250255075100 125 150 175
Tc (ºC)
Figure 17. On-state resistance vs T
case
Figure 18. On-state resistance vs V
vs T
LIM
Vcc=13V
Rl=13Ohm
case
Tc (°C)
Tc (°C)
CC
Ron (mOhm)
400
350
300
250
200
150
100
50
0
-50 -250255075 100 125 150 175
Iout=0.5A
Vcc=8V; 13V & 36V
Tc (°C)
Ron (mOhm)
300
275
250
225
200
175
150
125
100
75
50
5 10152025303540
Iout=0.5A
Tc= 150°C
Tc= 25°C
Tc= - 40°C
Vcc (V)
Doc ID 17387 Rev 115/28
Page 16
Electrical specificationsVNQ810P-E
Figure 19. Input high levelFigure 20. Input low level
Vih (V)
3.6
3.4
3.2
3
2.8
2.6
2.4
2.2
2
-50 -250255075 100 125 150 175
Tc (°C)
Figure 21. Open-load on-state detection
threshold
Iol (mA)
60
55
50
45
40
35
30
25
20
15
10
Vcc=13V
Vin=5V
-50 -250255075 100 125 150 175
Vil (V)
2.6
2.4
2.2
2
1.8
1.6
1.4
1.2
1
-50 -250255075 100 125 150 175
Tc (°C)
Figure 22. Open-load off-state voltage
detection threshold
Vol (V)
5
4.5
4
3.5
3
2.5
2
1.5
1
0.5
0
Vin=0V
-50 -250255075 100 125 150 175
Tc (°C)
Tc (°C)
Figure 23. Input hysteresis voltage
Vhyst (V)
1.5
1.4
1.3
1.2
1.1
1
0.9
0.8
0.7
0.6
0.5
-50 -250255075 100 125 150 175
Tc (°C)
16/28Doc ID 17387 Rev 1
Page 17
VNQ810P-EApplication information
3 Application information
Figure 24. Application schematic
+5V
+5V
μ
R
C
+5V
V
R
prot
R
prot
prot
R
prot
STATUS1
INPUT1
STATUS2
INPUT2
CC1,2
V
CC3,4
OUTPUT1
D
ld
GND3,4
D
OUTPUT2
OUTPUT3
OUTPUT4
GND
R
prot
R
prot
R
prot
R
prot
+5V
+5V
STATUS3
INPUT3
STATUS4
INPUT4
GND1,2
V
GND
R
GND
Note:Channels 3 and 4 have the same internal circuit as channel 1 and 2.
3.1 GND protection network against reverse battery
This section provides two solutions for implementing a ground protection network against
reverse battery.
3.1.1 Solution 1: a resistor in the ground line (R
It can be used with any type of load.
The following show how to dimension the R
Equation 1
R
≤ 600mV / 2 (I
GND
S(on)max
)
Doc ID 17387 Rev 117/28
GND
resistor:
GND
only)
Page 18
Application informationVNQ810P-E
Equation 2
R
GND
where - I
≥ ( - VCC) / ( - I
is the DC reverse ground pin current and can be found in the absolute
GND
GND
)
maximum rating section of the device datasheet.
Power dissipation in R
P
= ( - VCC)2/ R
D
GND
GND
This resistor can be shared amongst several different HSDs. Please note that the value of
this resistor should be calculated with Equation 1 where I
maximum on-state currents of the different devices.
Please note that, if the microprocessor ground is not shared by the device ground, then the
R
produces a shift (I
GND
S(on)max
values. This shift varies depending on how many devices are ON in the case of several high
side drivers sharing the same R
If the calculated power dissipation requires the use of a large resistor, or several devices
have to share the same resistor, then ST suggests using solution 2 below.
3.1.2 Solution 2: a diode (D
A resistor (R
inductive load. This small signal diode can be safely shared amongst several different HSD.
Also in this case, the presence of the ground network produces a shift ( 600mV) in the
input threshold and the status output values if the microprocessor ground is not common
with the device ground. This shift not varies if more than one HSD shares the same
diode/resistor network. Series resistor in INPUT and STATUS lines are also required to
prevent that, during battery voltage transient, the current exceeds the Absolute Maximum
Rating. Safest configuration for unused INPUT and STATUS pin is to leave them
unconnected.
= 1kΩ) should be inserted in parallel to D
GND
(when V
GND
< 0 during reverse battery situations) is:
CC
* R
GND
) in the input thresholds and the status output
GND
.
) in the ground line
S(on)max
becomes the sum of the
if the device is driving an
GND
≈
3.2 Load dump protection
Dld is necessary (voltage transient suppressor) if the load dump peak voltage exceeds the
V
maximum DC rating. The same applies if the device is subject to transients on the VCC
CC
line that are greater than those shown in the ISO T/R 7637/1 table.
3.3 MCU I/O protection
If a ground protection network is used and negative transients are present on the VCC line,
the control pins are pulled negative. ST suggests to insert a resistor (R
the microcontroller I/O pins from latching up.
The value of these resistors is a compromise between the leakage current of microcontroller
and the current required by the HSD I/Os (Input levels compatibility) with the latch-up limit of
microcontroller I/Os:
- V
CCpeak
18/28Doc ID 17387 Rev 1
/ I
latchup
≤ R
prot
≤ (V
OHμC
- V
IH
- V
GND
) / I
IHmax
) in line to prevent
prot
Page 19
VNQ810P-EApplication information
Example
For the following conditions:
V
CCpeak
I
latchup
V
OHμC
5kΩ ≤ R
= - 100 V
≥ 20 mA
≥ 4.5 V
≤ 65 kΩ.
prot
Recommended values are:
R
= 10 kΩ
prot
3.4 Open-load detection in off-state
Off-state open-load detection requires an external pull-up resistor (RPU) connected between
output pin and a positive supply voltage (V
microprocessor.
The external resistor has to be selected according to the following requirements:
1.No false open-load indication when load is connected: in this case we have to avoid
V
to be higher than V
OUT
V
= (V
OUT
PU
/ (RL + RPU))RL < V
; this results in the following condition
Olmin
Olmin.
2. No misdetection when load is disconnected: in this case the V
V
Because I
up resistor R
; this results in the following condition R
OLmax
may significantly increase if V
s(OFF)
should be connected to a supply that is switched OFF when the module is in
PU
standby.
) like the +5V line used to supply the
PU
has to be higher than
PU
- V
OUT
OLmax
) / I
L(off2)
< (V
PU
is pulled high (up to several mA), the pull-
out
.
The values of V
OLmin
, V
OLmax
and I
are available in Section 2.3: Electrical
L(off2)
characteristics.
Figure 25. Open-load detection in off-state
V
CC
INPUT
STATUS
DRIVER
+
LOGIC
+
-
VOL
GROUND
V batt.VPU
I
L(off2)
OUT
R
PU
R
R
L
Doc ID 17387 Rev 119/28
Page 20
Application informationVNQ810P-E
3.5 Maximum demagnetization energy (V
Figure 26. SO-28 (double island) maximum turn-off current versus load inductance
LMAX (A)
I
10
A
B
C
1
0.010.1110100
L(mH)
= 13.5V)
CC
A = single pulse at T
Jstart
B= repetitive pulse at T
C= repetitive pulse at T
VIN, I
L
Demagnetization
Note:Values are generated with R
In case of repetitive pulses, T
must not exceed the temperature specified above for curves B and C.
= 150 ºC
= 100 ºC
Jstart
= 125 ºC
Jstart
Demagnetization
= 0Ω.
L
(at beginning of each demagnetization) of every pulse
jstart
Demagnetization
t
20/28Doc ID 17387 Rev 1
Page 21
VNQ810P-EPackage and PCB thermal data
4 Package and PCB thermal data
4.1 SO-28 thermal data
Figure 27. SO-28 double island PC board
Note:Layout condition of R
thickness = 2 mm, Cu thickness = 35 µm, Copper areas: 0.5 cm
Table 16.Thermal calculation according to the PCB heatsink area
Chip 1 Chip 2T
ONOFFR
OFFONR
ONONR
ONON
R
= thermal resistance junction to ambient with one chip ON
thA
R
= thermal resistance junction to ambient with both chips ON and P
thB
R
= mutual thermal resistance
thC
(R
+ T
thA
thC
thB
thA
amb
and Zth measurements (PCB FR4 area = 58 mm x 58 mm, PCB
th
x P
x P
x (P
x P
dchip1
dchip2
dchip1
dchip1
jchip1
+ T
+ T
+ P
) + R
amb
amb
dchip2
thC
x P
) + T
dchip2
R
thC
R
thA
ambRthB
(R
+ T
thA
x P
x P
x (P
amb
x P
dchip1
dchip2
dchip1
dchip2
T
jchip2
+ T
+ T
+ P
) + R
2
, 3 cm2, 6 cm2).
amb
amb
) + T
dchip2
thC
x P
dchip1
ambPdchip1
dchip1
P
dchip1
= P
dchip2
Note
= P
≠ P
dchip2
dchip2
Doc ID 17387 Rev 121/28
Page 22
Package and PCB thermal dataVNQ810P-E
Figure 28. R
vs PCB copper area in open box free air condition
thj-amb
RTHj_am b
(°C/W)
70
60
50
40
30
20
10
01234567
PCB Cu heatsink area (cm^2)/island
Figure 29. SO-28 thermal impedance junction ambient single pulse
Zth(°C/W)
100
R
thA
R
thB
R
thC
0,5 cm ^2/island
3 cm ^2/island
6 cm ^2/island
10
1
0.1
0.01
0.00010.0010.010.11101001000
time(s)
Equation 3
Z
THδRTH
where
: pulse calculation formula
δ Z
THtp
1 δ–()+⋅=
δtpT⁄=
One channel ON
Two channels
ON on same chip
22/28Doc ID 17387 Rev 1
Page 23
VNQ810P-EPackage and PCB thermal data
Figure 30. Thermal fitting model of a quad channel HSD in SO-28
Tj_1
Pd1
Tj_2
Pd2
Tj_3
Pd3
Tj_4
Pd4
C1
C13C14
R13
C7
C15C16
R15
R14
R16
C8
R8
C3C4
R3R1R6R5R2
R17
C9
R9R7
R4
R18
C10
R10
T_amb
C5C6C2
C11C12
R12R11
Table 17.Thermal parameters
Area / island (cm2)0.56
R1 = R7 = R13 = R15 (°C/W)0.35
R2 = R8 = R14 = R16 (°C/W)1.8
R3 = R9 (°C/W)4.5
R4 = R10 (°C/W)11
R5 = R11 (°C/W)15
R6 = R12 (°C/W)3013
C1 = C7 = C13 = C15 (W.s/°C)0.0001
C2 = C8 = C14 = C16 (W.s/°C)7E-04
C3 = C9 (W.s/°C)6E-03
C4 = C10 (W.s/°C)0.2
C5 = C11 (W.s/°C)1.5
C6 = C12 (W.s/°C)58
R17 = R18 (°C/W)150
Doc ID 17387 Rev 123/28
Page 24
Package and packing informationVNQ810P-E
5 Package and packing information
5.1 ECOPACK® packages
In order to meet environmental requirements, ST offers these devices in different grades of
ECOPACK
specifications, grade definitions and product status are available at: www.st.com
ECOPACK
®
packages, depending on their level of environmental compliance. ECOPACK®
®
is an ST trademark.
5.2 SO-28 package information
Figure 31. SO-28 package dimensions
.
24/28Doc ID 17387 Rev 1
Page 25
VNQ810P-EPackage and packing information
Table 18.SO-28 mechanical data
Millimeters
Symbol
Min.Typ.Max.
A2.65
a10.100.30
b0.350.49
b10.230.32
C0.50
c145° (typ.)
D17.718.1
E10.0010.65
e1.27
e316.51
F7.407.60
L0.401.27
S8° (max.)
Doc ID 17387 Rev 125/28
Page 26
Package and packing informationVNQ810P-E
5.3 SO-28 packing information
Figure 32. SO-28 tube shipment (no suffix)
Base Q.ty28
Bulk Q.ty700
Tube length (± 0.5)532
A3.5
C
B
A
Figure 33. SO-28 tape and reel shipment (suffix “TR”)
B13.8
C (± 0.1)0.6
All dimensions are in mm.
Reel dimensions
Base Q.ty1000
Bulk Q.ty1000
A (max)330
B (min)1.5
C (± 0.2)13
F20.2
G (+ 2 / -0)16.4
N (min)60
T (max)22.4
Tape dimensions
According to Electronic Industries Association
(EIA) Standard 481 rev. A, Feb. 1986
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