Quad channel high side driver with analog current sense
Features
ParametersSymbolValue
Max supply voltageV
Operating voltage rangeV
Max on-state resistance (per ch.)R
Current limitation (typ)I
Off-state supply currentI
1. Typical value with all loads connected.
■ General features:
– Inrush current active management by
power limitation
– Very low standby current
– 3.0V CMOS compatible input
– Optimized electromagnetic emission
– Very low electromagnetic susceptibility
– In compliance with the 2002/95/EC
European directive
■ Diagnostic functions:
– Proportional load current sense
– High current sense precision for wide
current range
– Current sense disable
– Thermal shutdown indication
– Very low current sense leakage
■ Protection:
– Undervoltage shutdown
– Overvoltage clamp
– Load current limitation
– Self limiting of fast thermal transients
–Protection against loss of ground and loss of V
– Thermal shutdown
■ All types of resistive, inductive and capacitive
loads.
■ Suitable as LED driver.
Description
The VNQ5050AK-E is a monolithic device made
using STMicroelectronics VIPower M0-5
technology. It is intended for driving resistive or
inductive loads with one side connected to
ground. Active V
device against low energy spikes (see ISO7637
transient compatibility table).
This device integrates an analog current sense
which delivers a current proportional to the load
current (according to a known ratio) when
CS_DIS is driven low or left open. When CS_DIS
is driven high, the CURRENT SENSE pin is in a
high impedance condition.
Output current limitation protects the device in
overload condition. In case of long overload
duration, the device limits the dissipated power to
a safe level up to thermal shutdown intervention.
Thermal shutdown with automatic restart allows
the device to recover normal operation as soon as
the fault condition disappears.
Ground connection. Must be reverse battery protected by an external
diode/resistor network
Voltage controlled input pin with hysteresis, CMOS compatible. Controls
output switch state
UNDERVOLTAGE
DRIVER 1
I
OUT1
1
LIM
PwCLAMP 1
I
LIM
V
DSLIM
OVERTEMP. 1
K 1
OUTPUT1
CURRENT
SENSE1
V
1
1
INPUT2
CURRENT
SENSE2
INPUT3
CURRENT
SENSE3
INPUT4
CURRENT
SENSE4
Control & Protection
Equivalent to
channel1
Control & Protection
Equivalent to
channel1
Control & Protection
Equivalent to
channel1
CC
V
CC
V
CC
OUTPUT2
CURRENT
SENSE2
OUTPUT3
CURRENT
SENSE3
OUTPUT4
CURRENT
SENSE4
CURRENT SENSE
Analog current sense pin, delivers a current proportional to the load current
n
CS_DISActive high CMOS compatible pin, to disable the current sense pin
Doc ID 13329 Rev 95/31
Page 6
Block diagram and pin configurationVNQ5050AK-E
Figure 2.Configuration diagram (top view)
V
CC
GND
INPUT1
CURRENT SENSE1
INPUT2
CURRENT SENSE2
INPUT3
CURRENT SENSE3
INPUT4
CURRENT SENSE4
CS_DIS.
V
CC
OUTPUT1
OUTPUT1
OUTPUT1
OUTPUT2
OUTPUT2
OUTPUT2
OUTPUT3
OUTPUT3
OUTPUT3
OUTPUT4
OUTPUT4
OUTPUT4
TA B = V
Table 3.Suggested connections for unused and not connected pins
CC
Connection/pinCurrent senseN.C.OutputInputCS_DIS
FloatingN.R.
To ground
1. Not recommended.
(1)
Through 1 kΩ
resistor
XXXX
XN.R.
Through 10 kΩ
resistor
Through 10 kΩ
resistor
6/31 Doc ID 13329 Rev 9
Page 7
VNQ5050AK-EElectrical specifications
2 Electrical specifications
Figure 3.Current and voltage conventions
I
S
V
CC
I
CSD
V
CSD
I
INn
V
INn
CS_DIS
INPUTn
GND
OUTPUTn
CURRENT
S
ENSEn
I
GND
I
SENSEn
V
SENSEn
V
Fn
I
OUTn
V
OUTn
V
CC
Note:V
Fn
= V
- VCC during reverse battery condition.
OUTn
2.1 Absolute maximum ratings
Stress values that exceed those listed in the “Absolute maximum ratings” table can cause
permanent damage to the device. These are stress ratings only, and operation of the device
at these, or any other conditions greater than those, indicated in the operating sections of
this specification is not implied. Exposure to absolute maximum rating conditions for
extended periods may affect device reliability. Refer also to the STMicroelectronics sure
program and other relevant quality documents.
Table 4.Absolute maximum ratings
SymbolParameterValueUnit
- I
- I
V
-V
I
OUT
DC supply voltage 41V
CC
Reverse DC supply voltage0.3V
CC
DC reverse ground pin current200mA
GND
DC output currentInternally limitedA
Reverse DC output current 20A
OUT
DC input current -1 to 10mA
I
IN
I
CSD
-I
CSENSE
V
CSENSE
E
DC current sense disable input current -1 to 10mA
DC reverse CS pin current 200mA
Current sense maximum voltage
Maximum switching energy (single pulse)
MAX
(L=3 mH; R
=0 Ω; V
L
=13.5 V; T
bat
jstart
=150 ºC; I
OUT
= I
limL
(Typ.))
V
-41
CC
+V
CC
104mJ
V
V
Doc ID 13329 Rev 97/31
Page 8
Electrical specificationsVNQ5050AK-E
Table 4.Absolute maximum ratings (continued)
SymbolParameterValueUnit
Electrostatic discharge
(human body model: R=1.5KΩ; C=100pF)
4000
2000
4000
5000
5000
V
V
V
V
V
V
V
ESD
ESD
T
– Input
– Current sense
–CS_DIS
– Output
–V
CC
Charge device model (CDM-AEC-Q100-011)750V
Junction operating temperature-40 to 150°C
T
j
Storage temperature-55 to 150 °C
stg
2.2 Thermal data
Table 5.Thermal data
SymbolParameterMax valueUnit
R
thj-case
R
thj-amb
Thermal resistance junction-case (With one channel ON)2.8°C/W
Values specified in this section are for 8 V<VCC<36V, -40°C<Tj<150 °C, unless otherwise
stated.
Table 6.Power section
SymbolParameterTest conditionsMin. Typ. Max.Unit
V
V
V
USDhyst
R
V
clamp
I
L(off)
1. PowerMOS leakage included.
2. For each channel.
Operating supply voltage4.51336V
CC
Undervoltage shutdown-3.54.5V
USD
Undervoltage shutdown
hysteresis
On-state resistance
ON
Clamp voltageIS=20 mA414652V
I
Supply current
S
Off-state output current
Output - VCC diode
V
F
voltage
(2)
I
=2 A; Tj=25 °C
OUT
=2 A; Tj=150 °C
I
OUT
I
=2 A; VCC=5 V; Tj=25 °C
OUT
Off-State; VCC=13 V; Tj=25 °C;
VIN=V
OUT=VSENSE=VCSD
On-State; V
I
OUT
VIN=V
Tj=25 °C
(2)
V
=0 A
OUT
IN=VOUT
=13 V; VIN=5 V;
CC
=0 V; VCC=13 V;
=0 V; VCC=13 V;
Tj=125 °C
-I
=2 A; Tj=150 °C--0.7V
OUT
=0 V
-0.5 - V
mΩ
--50100
(1)
2
5
8
000.013
mΩ
65
mΩ
(1)
14µAmA
µA
5
Table 7.Switching (VCC=13V)
SymbolParameterTest conditionsMin.Typ.Max.Unit
t
d(on)
t
d(off)
(dV
OUT
(dV
OUT
W
ON
W
OFF
Turn-on delay time RL= 6.5 Ω (see Figure 6)-20- µs
Turn-off delay time RL= 6.5 Ω (see Figure 6)-45- µs
/dt)onTurn-on voltage slope RL= 6.5 Ω-
/dt)
Turn-off voltage slope RL= 6.5 Ω-
off
Switching energy
losses during t
won
Switching energy
losses during
t
woff
RL= 6.5 Ω (see Figure 6)-0.15-mJ
RL= 6.5 Ω (see Figure 6)-0.3- mJ
See
Figure 19
See
Figure 21
-V/µs
-V/µs
Doc ID 13329 Rev 99/31
Page 10
Electrical specificationsVNQ5050AK-E
Table 8.Current sense (8V<VCC<16V)
SymbolParameterTest conditionsMin.Typ. Max.Unit
I
= 0.05 A;
OUT
dK
dK
K
K
1/K1
K
2/K2
I
0
1
2
OUT/ISENSE
I
OUT/ISENSE
(1)
Current sense ratio drift
I
OUT/ISENSE
(1)
Current sense ratio drift
V
T
I
V
T
= 0.5 V; V
SENSE
= -40°C...150°C
j
= 1 A;
OUT
= 0.5 V; V
SENSE
= -40°C...150°C
j
CSD
CSD
Tj= 25 °C...150 °C
I
= 1 A; V
OUT
V
= 0 V;
CSD
= -40 °C to 150 °C
T
J
I
= 2 A;
OUT
V
T
T
I
V
= 4 V; V
SENSE
= -40°C...150°C
j
= 25 °C...150 °C
j
= 2 A; V
OUT
= 0 V;
CSD
SENSE
CSD
SENSE
= 0.5 V;
= 4 V;
TJ= -40 °C to 150 °C
=0 V;
=0 V;
= 0 V;
1340 2420 3460
1370
1860
2510
1510
1860
2210
-10-10%
1590
1760
2140
1600
1760
1930
-8-8%
I
= 4 A;
OUT
dK
K
3
3/K3
I
OUT/ISENSE
(1)
Current sense ratio drift
V
T
T
I
V
= 4 V; V
SENSE
= -40°C...150°C
j
= 25 °C...150 °C
j
= 4 A; V
OUT
CSD
SENSE
= 0 V;
CSD
= 0 V;
= 4 V;
1650
1740
1950
1650
1740
1830
-5-5%
-
TJ= -40 °C to 150 °C
I
I
SENSE0
Analog sense leakage
current
= 0 A; V
OUT
V
= 5 V; VIN= 0 V;
CSD
= -40°C...150°C
T
j
= 0 V; VIN= 5 V;
V
CSD
= -40°C...150°C
T
j
= 2 A; V
I
OUT
= 5 V; VIN= 5 V;
V
CSD
= -40°C...150°C
T
j
SENSE
SENSE
= 0 V;
= 0 V;
0
-
1
µA
0
-
2
µA
0
-
1
µA
Openload ON state
I
OL
current detection
VIN = 5 V, I
= 5 µA4-20mA
SENSE
threshold
V
SENSE
Max analog sense
output voltage
I
OUT
= 4 A; V
= 0 V 5--V
CSD
Analog sense output
V
SENSEH
voltage in over
V
CC
= 13 V; R
= 10 KΩ-9-V
SENSE
temperature condition
10/31 Doc ID 13329 Rev 9
Page 11
VNQ5050AK-EElectrical specifications
Table 8.Current sense (8V<VCC<16V) (continued)
SymbolParameterTest conditionsMin.Typ. Max.Unit
Analog sense output
I
SENSEH
t
DSENSE1H
t
DSENSE1L
current in over
temperature condition
Delay response time
from falling edge of
CS_DIS pin
Delay response time
from rising edge of
CS_DIS pin
= 13 V; V
V
CC
V
I
<4 V, 0.5 A<Iout<4 A
SENSE
= 90 % of I
SENSE
(see Figure 4)
V
I
<4 V, 0.5 A<Iout<4 A
SENSE
=10 % of I
SENSE
(see Figure 4)
= 5 V-8-mA
SENSE
SENSE max
SENSE max
-50100µs
-520µs
Delay response time
t
DSENSE2H
from rising edge of
INPUT pin
Delay response time
between rising edge of
Δ
t
DSENSE2H
output current and
rising edge of current
sense
Delay response time
t
DSENSE2L
from falling edge of
INPUT pin
1. Parameter guaranteed by design; it is not tested.
Table 9.Protection
(1)
V
I
(see Figure 4)
V
I
I
I
V
I
(see Figure 4)
<4 V, 0.5 A<Iout<4 A
SENSE
=90 % of I
SENSE
<4 V,
SENSE
=90 % of I
SENSE
=90 % of I
OUT
OUTMAX
=2 A (see Figure 5)
<4 V, 0.5 A<Iout<4 A
SENSE
=10 % of I
SENSE
SENSE max
SENSEMAX,
OUTMAX
SENSE max
-80250µs
--65µs
-100250µs
SymbolParameterTest conditionsMin.Typ.Max.Unit
I
limH
DC short circuit
current
=13 V
V
CC
5V<V
CC
<36 V
13.51926.5
26.5
Short circuit current
I
limL
during thermal
V
=13 V; TR<Tj<T
CC
TSD
-7-A
cycling
T
TSD
Shutdown
temperature
150175200°C
A
A
T
Reset temperatureTRS + 1 TRS + 5-°C
R
T
T
V
DEMAG
V
1. To ensure long term reliability under heavy overload or short circuit conditions, protection and related
Thermal reset of
RS
STATUS
Thermal hysteresis
HYST
(T
Turn-off output
voltage clamp
Output voltage drop
ON
limitation
diagnostic signals must be used together with a proper software strategy. If the device is subjected to
abnormal conditions, this software must limit the duration and number of activation cycles.
TSD-TR
)
=2 A; VIN=0; L=6 mHVCC-41VCC-46VCC-52V
I
OUT
I
=0.1 A; Tj=-40 °C...150 °C
OUT
(see Figure 9)
135--°C
-7-°C
-25-mV
Doc ID 13329 Rev 911/31
Page 12
Electrical specificationsVNQ5050AK-E
Table 10.Logic input
SymbolParameterTest conditionsMin.Typ.Max.Unit
V
I
V
I
V
I(hyst)
V
ICL
V
CSDL
I
CSDL
V
CSDH
I
CSDH
V
CSD(hyst)
V
CSCL
Input low level voltage--0.9V
IL
Low level input currentVIN= 0.9 V1--µA
IL
Input high level voltage2.1--V
IH
High level input currentVIN= 2.1 V--10µA
IH
Input hysteresis voltage0.25--V
I
= 1 mA
Input clamp voltage
IN
= -1 mA
I
IN
CS_DIS low level voltage--0.9V
Low level CS_DIS currentV
=0.9 V1--µA
CSD
CS_DIS high level voltage2.1--V
High level CS_DIS currentV
=2.1 V--10µA
CSD
CS_DIS hysteresis voltage0.25--V
I
= 1 mA
CS_DIS clamp voltage
CSD
I
CSD
= -1 mA
Figure 4.Current sense delay characteristics
INPUT
CS_DIS
5.5
5.5
-0.7
-0.7
7V
V
7V
V
LOAD CURRENT
SENSE CURRENT
t
DSENSE2H
t
DSENSE1L
t
DSENSE1H
t
DSENSE2L
12/31 Doc ID 13329 Rev 9
Page 13
VNQ5050AK-EElectrical specifications
Figure 5.Delay response time between rising edge of output current and rising
edge of current sense (CS enabled)
V
IN
Δ
t
DSENSE2H
t
I
OUT
90% I
OUTMAX
I
OUTMAX
t
I
SENSE
Figure 6.Switching characteristics
V
OUT
t
Won
80%
dV
/dt
OUT
(on)
t
r
INPUT
t
d(on)
90% I
10%
I
SENSEMAX
SENSEMAX
t
d(off)
t
Woff
90%
t
f
dV
OUT
/dt
t
(off)
t
t
Doc ID 13329 Rev 913/31
Page 14
Electrical specificationsVNQ5050AK-E
Figure 7.I
I
/ I
out
sense
2600
2400
2200
2000
1800
1600
1400
1200
1000
min Tj = 25 °C to 150 °C
11,522,533,544,55
OUT/ISENSE
vs I
max Tj = -40 °C to 150 °C
min Tj = -40 °C to 150 °C
OUT
max Tj = 25 °C to 150 °C
I
OUT
typical value
(A)
Figure 8.Maximum current sense ratio drift vs load current
dk/k(%)
15
10
5
0
-5
-10
-15
11,522,533,54
Note:Parameter guaranteed by design; it is not tested.
I
OUT
(A)
14/31 Doc ID 13329 Rev 9
Page 15
VNQ5050AK-EElectrical specifications
Table 11.Truth table
ConditionsInputOutputSense (V
Normal operation
CSD
L
H
L
H
0
Nominal
=0 V)
(1)
Over temperature
Undervoltage
Short circuit to GND
(Rsc≤ 10 mΩ)
Short circuit to V
CC
L
H
L
H
L
H
H
L
H
L
L
V
SENSEH
L
L
L
L
L
0 if T
V
SENSEH
H
H
< Nominal
Negative output voltage clampLL0
1. If the V
and external circuit.
is high, the SENSE output is at a high impedance, its potential depends on leakage currents
Figure 14. Input high levelFigure 15. Input hysteresis voltage
Vih (V)
4
3.5
3
2.5
2
1.5
1
0.5
0
-50 -250255075 100 125 150 175
Tc ( °C )
Doc ID 13329 Rev 917/31
Vhyst (V)
1
0.9
0.8
0.7
0.6
0.5
0.4
0.3
0.2
0.1
0
-50-250255075100 125 150 175
Tc ( °C )
Page 18
Electrical specificationsVNQ5050AK-E
Figure 16. On-state resistance vs T
Ron (mOhm)
100
90
80
70
60
50
40
30
20
10
0
-50 -250255075 100 125 150 175
Iout=2A
Vcc=13V
Tc (°C)
case
Figure 17. On-state resistance vs V
Ron (mOhm)
100
90
80
70
60
50
40
30
20
10
0
0510152025303540
Vcc (V)
Tc= 150 °C
Tc= 12 5°C
Tc= 25° C
Tc= -4 0°C
Figure 18. Undervoltage shutdownFigure 19. Turn-on voltage slope
Vusd (V)
16
14
12
10
8
6
4
2
0
-50 -250255075 100 125 150 175
Tc (°C)
(dVout/dt)on (V/ms)
1000
900
800
700
600
500
400
300
200
100
0
-50 -250255075 100 125 150 175
Vcc=13V
Rl=6.5Ohm
Tc ( °C )
CC
Figure 20. I
LIMH
vs T
case
Ilimh (A)
25
22.5
20
17.5
15
12.5
10
7.5
5
-50 -250255075 100 125 150 175
Vcc=13V
Tc ( °C )
18/31 Doc ID 13329 Rev 9
Figure 21. Turn-off voltage slope
(dVout/dt)off (V/ms)
1000
900
800
700
600
500
400
300
200
100
0
-50 -250255075 100 125 150 175
Vcc=13V
Rl=6.5Ohm
Tc (°C)
Page 19
VNQ5050AK-EElectrical specifications
Figure 22. CS_DIS high level voltageFigure 23. CS_DIS clamp voltage
Vcsdh (V)
4
3.5
3
2.5
2
1.5
1
0.5
0
-50 -250255075 100 125 150 175
Tc (°C)
Figure 24. CS_DIS low level voltage
Vcsdl (V)
4
3.5
3
2.5
2
1.5
1
0.5
0
-50 -250255075 100 1 25 150 175
Tc ( °C )
Vcsdcl (V)
8
7.5
7
Icsd=1mA
6.5
6
5.5
5
4.5
4
-50 -250255075 100 125 150 175
Tc (° C)
Doc ID 13329 Rev 919/31
Page 20
Application informationVNQ5050AK-E
3 Application information
Figure 25. Application schematic
+5V
V
CC
R
prot
μ
C
R
prot
CS_DIS
IINPUT
OUTPUT
D
ld
R
prot
C
ext
CURRENT SENSE
R
SENSE
GND
R
GND
GND
D
GND
V
Note:Channel 2, 3, 4 have the same internal circuit as channel 1.
3.1 GND protection network against reverse battery
3.1.1 Solution 1: resistor in the ground line (R
This can be used with any type of load.
The following is an indication on how to dimension the R
1.R
2. R
where -I
maximum rating section of the device datasheet.
≤ 600 mV / (I
GND
≥ (−VCC) / (-I
GND
is the DC reverse ground pin current and can be found in the absolute
GND
S(on)max
GND
).
)
GND
only)
resistor.
GND
Power Dissipation in R
P
= (-VCC)2/R
D
GND
(when VCC<0: during reverse battery situations) is:
GND
This resistor can be shared amongst several different HSDs. Please note that the value of
this resistor should be calculated with formula (1) where I
maximum on-state currents of the different devices.
Please note that if the microprocessor ground is not shared by the device ground then the
R
will produce a shift (I
GND
S(on)max
values. This shift will vary depending on how many devices are ON in the case of several
* R
high side drivers sharing the same R
If the calculated power dissipation leads to a large resistor or several devices have to share
the same resistor then ST suggests to utilize Solution 2 (see below).
20/31 Doc ID 13329 Rev 9
S(on)max
) in the input thresholds and the status output
GND
.
GND
becomes the sum of the
Page 21
VNQ5050AK-EApplication information
3.1.2 Solution 2: a diode (D
A resistor (R
= 1 kΩ) should be inserted in parallel to D
GND
) in the ground line.
GND
inductive load.
This small signal diode can be safely shared amongst several different HSDs. Also in this
case, the presence of the ground network will produce a shift (≈600mV) in the input
threshold and in the status output values if the microprocessor ground is not common to the
device ground. This shift will not vary if more than one HSD shares the same diode/resistor
network.
3.2 Load dump protection
Dld is necessary (Voltage Transient Suppressor) if the load dump peak voltage exceeds the
V
max DC rating. The same applies if the device is subject to transients on the VCC line
CC
that are greater than the ones shown in the ISO T/R 7637/1 table.
3.3 Microcontroller I/Os protection
If a ground protection network is used and negative transients are present on the VCC line,
the control pins will be pulled negative. ST suggests to insert a resistor (R
prevent the µC I/Os pins to latch-up.
The value of these resistors is a compromise between the leakage current of µC and the
current required by the HSD I/Os (Input levels compatibility) with the latch-up limit of µC
I/Os.
if the device drives an
GND
prot
) in line to
-V
CCpeak/Ilatchup
≤ R
prot
≤ (V
OHμC-VIH-VGND
) / I
IHmax
Calculation example:
For V
5kΩ ≤ R
Recommended values: R
CCpeak
prot
= - 100 V and I
≤ 180 kΩ.
latchup
= 10 kΩ, C
prot
≥ 20 mA; V
EXT
OHμC
= 10 nF.
≥ 4.5 V
Doc ID 13329 Rev 921/31
Page 22
Application informationVNQ5050AK-E
Figure 26. Waveforms
NORMAL OPERATION
INPUT
CS_DIS
LOAD CURRENT
SENSE CURRENT
UNDERVOLTAGE
V
V
CC
INPUT
CS_DIS
LOAD CURRENT
SENSE CURRENT
V
USD
USDhyst
INPUT
CS_DIS
LOAD VOLTAGE
LOAD CURRENT
SENSE CURRENT
T
j
INPUT
CS_DIS
LOAD CURRENT
SENSE CURRENT
T
R
T
T
TSD
RS
current
limitation
<Nominal
power
limitation
SHORT TO V
CC
<Nominal
OVERLOAD OPERATION
thermal cycling
SHORTED LOADNORMAL LOAD
I
LIMH
I
LIML
V
SENSEH
22/31 Doc ID 13329 Rev 9
Page 23
VNQ5050AK-EApplication information
3.4 Maximum demagnetization energy (VCC=13.5V)
Figure 27. Maximum turn-off current versus inductance (for each channel)
100
A
B
10
I (A)
1
0,1110100L (mH)
C
A: T
B: T
C: T
VIN, I
= 150°C single pulse
jstart
= 100°C repetitive pulse
jstart
= 125°C repetitive pulse
jstart
L
Note:Values are generated with R
In case of repetitive pulses, T
must not exceed the temperature specified above for curves A and B.
DemagnetizationDemagnetizationDemagnetization
=0Ω.
L
(at beginning of each demagnetization) of every pulse
jstart
t
Doc ID 13329 Rev 923/31
Page 24
Package and PC board thermal dataVNQ5050AK-E
4 Package and PC board thermal data
4.1 PowerSSO-24 thermal data
Figure 28. PowerSSO-24 PC board
Note:Layout condition of R
area= 77 mm x 86 mm, PCB thickness=1.6mm, Cu thickness=70 µm (front and back side),
Copper areas: from minimum pad lay-out to 8 cm
Figure 29.
RTHj_amb(°C/W)
R
thj-amb
55
50
45
40
35
30
0246810
and Zth measurements (PCB: Double layer, Thermal Vias, FR4
th
2
).
vs PCB copper area in open box free air condition (one channel on)
PCB Cu heatsink area (cm^2)
24/31 Doc ID 13329 Rev 9
Page 25
VNQ5050AK-EPackage and PC board thermal data
Figure 30.
PowerSSO-24 thermal impedance junction ambient single pulse (one channel on)
ZTH (°C/W)
1000
100
10
1
0.1
0.00010.0010.010.11101001000
Time (s)
Footprint
2
2 cm
8 cm
2
Figure 31. Thermal fitting model of a double channel HSD in PowerSSO-24
(a)
a. The fitting model is a semplified thermal tool and is valid for transient evolutions where the embedded
protections (power limitation or thermal cycling during thermal shutdown) are not triggered.
Doc ID 13329 Rev 925/31
Page 26
Package and PC board thermal dataVNQ5050AK-E
Equation 1: pulse calculation formula
Z
THδ
R
TH
δZ
THtp
1 δ–()+⋅=
where δ = tP/T
Table 15.Thermal parameters
Area/island (cm2)Footprint28
R1=R7=R9=R11 (°C/W)0.4--
R2=R8=R10=R12 (°C/W)2--
R3 (°C/W)6--
R4 (°C/W)7.7--
R5 (°C/W)998
R6 (°C/W)281710
C1=C7=C9=C11 (W.s/°C)0.001--
C2=C8=C10=C12 (W.s/°C)0.0022--
C3 (W.s/°C)0.025--
C4 (W.s/°C)0.75--
C5 (W.s/°C)149
C6 (W.s/°C)2.2517
26/31 Doc ID 13329 Rev 9
Page 27
VNQ5050AK-EPackage and packing information
5 Package and packing information
5.1 ECOPACK® packages
In order to meet environmental requirements, ST offers these devices in different grades of
ECOPACK® packages, depending on their level of environmental compliance. ECOPACK®
specifications, grade definitions and product status are available at: www.st.com
ECOPACK® is an ST trademark.
5.2 PowerSSO-24™ mechanical data
Table 16.PowerSSO-24™ mechanical data
Symbol
Min.Typ.Max.
A- -2.45
A22.15-2.35
Millimeters
.
a10-0.10
b0.33-0.51
c0.23-0.32
D10.10-10.50
E7.4 - 7.6
e-0.8-
e3-8.8-
G- -0.1
G1--0.06
H10.1-10.5
h--0.4
k0°-8°
L0.55-0.85
N- -10º
X4.1 - 4.7
Y6.5 - 7.1
Doc ID 13329 Rev 927/31
Page 28
Package and packing informationVNQ5050AK-E
Figure 32. PowerSSO-24™ package dimensions
28/31 Doc ID 13329 Rev 9
Page 29
VNQ5050AK-EPackage and packing information
5.3 Packing information
Figure 33. PowerSSO-24 tube shipment (no suffix)
Base Q.ty49
Bulk Q.ty1225
C
B
A
Figure 34. PowerSSO-24 tape and reel shipment (suffix “TR”)
Tube length (± 0.5)532
A3.5
B13.8
C (± 0.1)0.6
All dimensions are in mm.
Reel dimensions
Base Q.ty1000
Bulk Q.ty1000
A (max)330
B (min)1.5
C (± 0.2)13
F20.2
G (+ 2 / -0)24.4
N (min)100
T (max)30.4
Tape dimensions
According to Electronic Industries Association
(EIA) Standard 481 rev. A, Feb 1986
Reformatted and restructured.
Added contents, lists of tables and list of figures.
9-Mar-20073
22-Aug-20074
01-Oct-20075
Added Section 3.4: Maximum demagnetization energy
(VCC = 13.5V).
Added ECOPACK® packages information.
Added new disclaimer.
Figure 14: Input high level and Figure 15: Input hysteresis voltage
corrected.
Table 4: Absolute maximum ratings: changed E
value from 51 to
MAX
104 mJ.
Table 8: Current sense (8V<V
dk3/k3, Δt
DSENSE2H
.
<16V): added dk1/k1, dk2/k2,
CC
Added Figure 5: Delay response time between rising edge of output
current and rising edge of current sense (CS enabled).
Updated Figure 7: I
OUT/ISENSE
vs I
OUT
.
Added Figure 8: Maximum current sense ratio drift vs load current.
Table 12: Electrical transient requirements (part 1/3): added notes.
Figure 31: Thermal fitting model of a double channel HSD in
PowerSSO-24, added note.
CC
<16V):
CC
<16V):
04-Dec-20076
12-Feb-20087
14-May-20098
Updated Table 8: Current sense (8V<V
– changed t
– added I
OL
DSENSE2H
parameter.
max value from 300 µs to 250µs.
Corrected typing error in Table 8: Current sense (8V<V
changed I
test condition from VIN = 0V to VIN = 5V.
OL
Table 16: PowerSSO-24™ mechanical data:
– Updated a1 (max) from 0.075 to 0.10.
Table 16: PowerSSO-24™ mechanical data:
– Updated A (min) from 2.15 to - and A (max) from 2.47 to 2.45
29-May-20099
– Updated A2 (max) from 2.40 to 2.35
– Updated k (min) from - to 0°, k (typ) from 5° to - and
k (max) from - to 8°
30/31 Doc ID 13329 Rev 9
Page 31
VNQ5050AK-E
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