power limitation
– Very low stand-by current
– 3.0V CMOS compatible input
– Optimized electromagnetic emission
– Very low electromagnetic susceptibility
– In compliance with the 2002/95/EC
European directive
■ Diagnostic functions
– Proportional load current sense
– High current sense precision for wide range
currents
– Current sense disable
– Thermal shutdown indication
– Very low current sense leakage
■ Protection
– Undervoltage shut-down
– Overvoltage clamp
– Load current limitation
– Self limiting of fast thermal transients
– Protection against loss of ground and loss
of V
CC
– Thermal shut down
Table 1.Device summary
Package
PowerSSO-12VN5050AJ-EVN5050AJTR-E
Application
■ All types of resistive, inductive and capacitive
loads
■ Suitable as LED driver
Description
The VN5050AJ-E is a monolithic device made
using STMicroelectronics VIPower technology. It
is intended for driving resistive or inductive loads
with one side connected to ground. Active V
voltage clamp protects the device against low
energy spikes (see ISO7637 transient
compatibility table).
This device integrates an analog current sense
which delivers a current proportional to the load
current (according to a known ratio) when
CS_DIS is driven low or left open.
When CS_DIS is driven high, the CURRENT
SENSE pin is in a high impedance condition.
Output current limitation protects the device in
overload condition. In case of long overload
duration, the device limits the dissipated power to
safe level up to thermal shut-down intervention.
Thermal shut-down with automatic restart allows
the device to recover normal operation as soon as
fault condition disappears.
Ground connection. Must be reverse battery protected by an external
diode/resistor network.
Voltage controlled input pin with hysteresis, CMOS compatible. Controls output
switch state.
Pwr
LIM
OVERTEMP.
I
OUT
PwCLAMP
I
LIM
V
DSLIM
K
OUTPUT
CURRENT
SENSE
CURRENT SENSE Analog current sense pin, delivers a current proportional to the load current.
CS_DISActive high CMOS compatible pin, to disable the current sense pin.
5/31
Page 6
Block diagram and pin descriptionVN5050AJ-E
Figure 2.Configuration diagram (top view)
TA B = V
N.C.
GND
INPUT
CURRENT SENSE
CS_DIS
N.C.
Note:The above pin configuration reflects the changes notified with PCN-APG-BOD/07/2886. The
new pinout is backaward compatible with existing PCB layouts where pins #1 and #6 are
connected to Vcc and/or pins #7 and 12 are connected to OUTPUT. For new PCB designs,
these pins should be left unconnected.
Table 3.Suggested connections for unused and N.C. pins
Stressing the device above the rating listed in the “Absolute maximum ratings” table may
cause permanent damage to the device. These are stress ratings only and operation of the
device at these or any other conditions above those indicated in the Operating sections of
this specification is not implied. Exposure to the conditions in table below for extended
periods may affect device reliability. Refer also to the STMicroelectronics SURE Program
and other relevant quality document.
Table 4.Absolute maximum ratings
SymbolParameterValueUnit
V
-V
- I
I
OUT
- I
I
CSD
-I
CSENSE
V
CSENSE
E
DC supply voltage 41V
CC
Reverse DC supply voltage0.3V
CC
DC reverse ground pin current200mA
GND
DC output current
Reverse DC output current 30A
OUT
DC input current -1 to 10mA
I
IN
DC current sense disable input current -1 to 10mA
DC reverse CS pin current 200mA
Current sense maximum voltage
Maximum switching energy (single pulse)
MAX
(L= 3mH; R
=0Ω; V
L
=13.5V; T
bat
jstart
=150ºC; I
OUT
= I
limL
(Typ.) )
Internally
limited
V
-41
CC
+V
CC
104mJ
A
V
V
7/31
Page 8
Electrical specificationsVN5050AJ-E
Table 4.Absolute maximum ratings (continued)
SymbolParameterValueUnit
Electrostatic discharge (Human Body Model: R=1.5kΩ; C=100pF)
- INPUT
V
- CURRENT SENSE
ESD
- CS_DIS
- OUTPUT
- V
CC
V
T
Charge device model (CDM-AEC-Q100-011)750V
ESD
Junction operating temperature-40 to 150°C
T
j
Storage temperature-55 to 150 °C
stg
4000
2000
4000
5000
5000
V
V
V
V
V
2.2 Thermal data
Table 5.Thermal data
SymbolParameterMax valueUnit
R
R
thj-case
thj-amb
Thermal resistance junction-case (MAX) 2.7°C/W
Thermal resistance junction-ambient (MAX) See Figure 29. °C/W
8/31
Page 9
VN5050AJ-EElectrical specifications
2.3 Electrical characteristics
Values specified in this section are for 8V < VCC < 36V; -40°C < Tj < 150°C, unless
otherwise specified.
Table 6.Power section
SymbolParameterTest conditionsMin. Typ. Max. Unit
V
V
V
USDhyst
R
V
clamp
Operating supply
CC
voltage
Undervoltage
USD
shutdown
Undervoltage
shutdown hysteresis
I
= 2A; Tj=25°C
OUT
On state resistance
ON
I
= 2A; Tj=150°C
OUT
= 2A; VCC=5V; Tj=25°C
I
OUT
Clamp voltageIS= 20mA414652V
Off State; V
I
S
Supply current
VIN=V
OUT=VSENSE=VCSD
On State; V
I
L(off)
1. PowerMOS leakage included.
Table 7.Switching (VCC=13V, Tj=25°C)
Off state output current
Output - VCC diode
V
F
voltage
VIN=V
VIN=V
-I
OUT
=0V; VCC=13V; Tj=25°C
OUT
=0V; VCC=13V; Tj=125°C
OUT
= 2A; Tj= 150°C0.7V
=13V; Tj=25°C;
CC
=13V; VIN=5V; I
CC
=0V
OUT
4.51336V
3.54.5V
0.5V
(1)
2
=0A
1.5
000.013
50
100
65
(1)
5
3µAmA
5
mΩ
mΩ
mΩ
µA
SymbolParameterTest conditionsMin.Typ.Max. Unit
(dV
(dV
t
d(on)
t
d(off)
OUT
OUT
W
W
ON
OFF
Turn-on delay time RL= 6.5Ω (see Figure 7.)20µs
Turn-off delay time RL= 6.5Ω (see Figure 7.)40µs
/dt)onTurn-on voltage slopeRL= 6.5Ω
/dt)
Turn-off voltage slopeRL= 6.5Ω
off
Switching energy losses
during
tw
on
Switching energy losses
during tw
off
RL= 6.5Ω (see Figure 7.)0.20mJ
RL= 6.5Ω (see Figure 7.)0.3mJ
See
Figure 20
See
Figure 22
9/31
V/ µs
V/ µs
Page 10
Electrical specificationsVN5050AJ-E
Table 8.Logic input
SymbolParameterTest conditionsMin.Typ.Max.Unit
V
I
V
I
V
I(hyst)
V
V
CSDL
I
CSDL
V
CSDH
I
CSDH
V
CSD(hyst)
V
CSCL
Table 9.Protection and diagnostics
Input low level voltage0.9V
IL
Low level input currentVIN= 0.9V1µA
IL
Input high level voltage2.1V
IH
High level input currentVIN= 2.1V10µA
IH
Input hysteresis voltage0.25V
Input clamp voltage
ICL
I
= 1mA
IN
= -1mA
I
IN
5.5
-0.7
CS_DIS low level voltage0.9V
Low level CS_DIS currentV
= 0.9V1µA
CSD
CS_DIS high level voltage2.1V
High level CS_DIS current V
= 2.1V10µA
CSD
CS_DIS hysteresis voltage0.25V
CS_DIS clamp voltage
I
CSD
I
CSD
= 1mA
= -1mA
(1)
5.5
-0.7
7V
7V
SymbolParameterTest conditionsMin.Typ.Max.Unit
I
limH
I
limL
DC Short circuit
current
Short circuit current
during thermal cycling
= 13V
V
CC
5V<V
CC
V
=13V TR<Tj<T
CC
<36V
TSD
1216.523
23
7A
V
V
A
A
T
T
T
HYST
V
DEMAG
V
1. To ensure long term reliability under heavy overload or short circuit conditions, protection and related
diagnostic signals must be used together with a proper software strategy. If the device operates under
abnormal conditions this software must limit the duration and number of activation cycles.
Analog sense
output voltage in
overtemperature
condition
Analog sense
output current in
overtemperature
condition
I
OUT
V
V
CC
CC
=2A; V
=13V; R
=13V, V
=0V 5V
CSD
=10KΩ9V
SENSE
=5V8mA
SENSE
11/31
Page 12
Electrical specificationsVN5050AJ-E
Table 10.Current sense (8V<VCC<16V) (continued)
SymbolParameterTest conditionsMin. Typ. Max. Unit
<4V, 0.5A<Iout<4A
Delay response
t
DSENSE1H
time from falling
edge of CS_DIS pin
Delay response
t
DSENSE1L
time from rising
edge of CS_DIS pin
Delay response
t
DSENSE2H
time from rising
edge of INPUT pin
Delay response
time between rising
∆
t
DSENSE2H
edge of output
current and rising
edge of current
sense
Delay response
t
DSENSE2L
time from falling
edge of INPUT pin
1. Parameter guaranteed by design; it is not tested.
V
SENSE
=90% of I
I
SENSE
(see Figure 4.)
<4V, 0.5A<Iout<4A
V
SENSE
I
=10% of I
SENSE
(see Figure 4.)
<4V, 0.5A<Iout<4A
V
SENSE
=90% of I
I
SENSE
(see Figure 4.)
V
I
SENSE
I
OUT
I
OUTMAX
V
I
SENSE
<4V,
SENSE
= 90% of I
= 90% of I
=2A (see Figure 6)
<4V, 0.5A<Iout<4A
SENSE
=10% of I
(see Figure 4.)
SENSEmax
SENSEmax
SENSE max
SENSEMAX,
OUTMAX
SENSE max
50100µs
520µs
80250µs
65µs
100250µs
Figure 4.Current sense delay characteristics
INPUT
CS_DIS
LOAD CURRENT
SENSE CURRENT
t
DSENSE2H
t
DSENSE1L
Figure 5.Output voltage drop limitation
Vcc-V
out
Tj=150oC
V
on
T
=25oC
j
t
DSENSE1H
=-40oC
T
j
t
DSENSE2L
V
on/Ron(T)
12/31
I
out
Page 13
VN5050AJ-EElectrical specifications
Figure 6.Delay response time between rising edge of ouput current and rising
edge of current sense (CS enabled)
V
IN
∆
t
DSENSE2H
t
I
OUT
90% I
OUTMAX
I
OUTMAX
t
I
SENSE
Figure 7.Switching characteristics
V
OUT
dV
OUT
INPUT
/dt
(on)
t
d(on)
t
Won
80%
t
r
90% I
10%
I
SENSEMAX
SENSEMAX
t
d(off)
t
Woff
90%
t
t
dV
/dt
OUT
(off)
f
t
t
13/31
Page 14
Electrical specificationsVN5050AJ-E
Figure 8.I
I
/ I
out
sense
2800
2600
2400
2200
2000
18 0 0
16 0 0
14 0 0
12 0 0
11,522,533,544,55
OUT/ISENSE
max Tj = -40 °C to 150 °C
max Tj = 25 °C to 150 °C
min Tj = 25 °C to 150 °C
min Tj = -40 °C to 150 °C
Vs. I
(see Table 10. for details)
OUT
I
(A)
OUT
typical value
Figure 9.Maximum current sense ratio drift vs load current
dk/k(%)
15
10
5
0
-5
-10
-15
1234
I
(A)
OUT
Note:Parameter guaranteed by design; it is not tested.
14/31
Page 15
VN5050AJ-EElectrical specifications
Table 11.Truth table
ConditionsInputOutputSense (V
Normal operation
L
H
L
H
CSD
0
Nominal
=0V)
(1)
Overtemperature
Undervoltage
Short circuit to GND
(Rsc ≤ 10 mΩ)
Short circuit to V
CC
Negative output voltage
clamp
1. If the V
and external circuit.
is high, the SENSE output is at a high impedance, its potential depends on leakage currents
CSD
L
H
L
H
L
H
H
L
H
L
L
L
L
L
L
L
V
SENSEH
H
H
0
V
SENSEH
0
0
0
0 if T
< T
j
if Tj > T
0
< Nominal
TSD
TSD
LL 0
15/31
Page 16
Electrical specificationsVN5050AJ-E
Table 12.Electrical transient requirements
ISO 7637-2:
Test levels
2004(E)
Tes t puls e
IIIIV
1-75V-100V5000 pulses0.5 s5 s2 ms, 10 Ω
2a+37V+50V5000 pulses0.2 s5 s50 µs, 2 Ω
3a-100V-150V1h90 ms100 ms0.1 µs, 50 Ω
3b+75V+100V1h90 ms100 ms0.1 µs, 50 Ω
4-6V-7V1 pulse
5b
(2)
+65V+87V1 pulse400 ms, 2 Ω
Number of
pulses or
test times
Burst cycle/pulse
repetition time
Delays and
Impedance
100 ms, 0.01
Ω
ISO 7637-2:
Test level results
(1)
2004(E)
Tes t puls e
IIIIV
1CC
2aCC
3aCC
3bCC
4CC
(2)
5b
1. The above test levels must be considered referred to VCC = 13.5V except for pulse 5b.
2. Valid in case of external load dump clamp: 40V maximum referred to ground.
CC
ClassContents
CAll functions of the device are performed as designed after exposure to disturbance.
E
One or more functions of the device are not performed as designed after exposure to
disturbance and cannot be returned to proper operation without replacing the device.
16/31
Page 17
VN5050AJ-EElectrical specifications
Figure 10. Waveforms
NORMAL OPERATION
INPUT
CS_DIS
LOAD CURRENT
SENSE CURRENT
UNDERVOLTAGE
V
V
CC
INPUT
CS_DIS
LOAD CURRENT
SENSE CURRENT
V
USD
USDhyst
INPUT
CS_DIS
LOAD VOLTAGE
LOAD CURRENT
SENSE CURRENT
T
j
INPUT
CS_DIS
LOAD CURRENT
SENSE CURRENT
T
R
T
T
TSD
RS
current
limitation
<Nominal
power
limitation
SHORT TO V
CC
<Nominal
OVERLOAD OPERATION
thermal cycling
SHORTED LOADNORMAL LOAD
I
LIMH
I
LIML
V
SENSEH
17/31
Page 18
Electrical specificationsVN5050AJ-E
2.4 Electrical characteristics curves
Figure 11. Off state output currentFigure 12. High level input current
Figure 15. Input high levelFigure 16. Input hysteresis voltage
18/31
Page 19
VN5050AJ-EElectrical specifications
Figure 17. On state resistance vs. T
case
Figure 18. On state resistance vs. V
Figure 19. Undervoltage shutdownFigure 20. Turn-On voltage slope
CC
Figure 21. I
LIMH
Vs. T
case
TBD
Figure 22. Turn-Off voltage slope
19/31
Page 20
Electrical specificationsVN5050AJ-E
Figure 23. CS_DIS high level voltageFigure 24. CS_DIS clamp voltage
Figure 25. CS_DIS low level voltage
20/31
Page 21
VN5050AJ-EApplication information
3 Application information
Figure 26. Application schematic
+5V
V
CC
R
prot
µ
C
.
R
prot
R
prot
R
SENSE
C
ext
CS_DIS
INPUT
CURRENT SENSE
V
GND
GND
R
GND
D
GND
OUTPUT
D
ld
3.1 GND protection network against reverse battery
This section provides two solutions for implementing a ground protection network against
reverse battery.
3.1.1 Solution 1: resistor in the ground line (R
This can be used with any type of load.
The following show how to dimension the R
1.R
2. R
where -I
≤ 600mV / (I
GND
≥ (−VCC) / (-I
GND
is the DC reverse ground pin current and can be found in the absolute
GND
S(on)max
GND
)
)
maximum rating section of the device datasheet.
Power dissipation in R
P
= (-VCC)2/ R
D
(when VCC<0 during reverse battery situations) is:
GND
GND
This resistor can be shared amongst several different HSDs. Please note that the value of
this resistor should be calculated with formula (1) where I
maximum on-state currents of the different devices.
Please note that, if the microprocessor ground is not shared by the device ground, then the
R
will produce a shift (I
GND
S(on)max
* R
GND
values. This shift will vary depending on how many devices are ON in the case of several
high side drivers sharing the same R
GND
.
resistor:
GND
) in the input thresholds and the status output
GND
only)
S(on)max
becomes the sum of the
21/31
Page 22
Application informationVN5050AJ-E
If the calculated power dissipation requires the use of a large resistor, or several devices
have to share the same resistor, then ST suggests using solution 2 below.
3.1.2 Solution 2: diode (D
Note that a resistor (R
GND
) in the ground line
GND
=1kΩ) should be inserted in parallel to D
an inductive load.
This small signal diode can be safely shared amongst several different HSDs. Also in this
case, the presence of the ground network will produce a shift (j600mV) in the input
threshold and in the status output values if the microprocessor ground is not common to the
device ground. This shift will not vary if more than one HSD shares the same diode/resistor
network.
3.2 Load dump protection
Dld is necessary (voltage transient suppressor) if the load dump peak voltage exceeds the
V
maximum DC rating. The same applies if the device is subject to transients on the VCC
CC
line that are greater than those shown in the ISO T/R 7637/1 table.
3.3 MCU I/O protection
If a ground protection network is used and negative transients are present on the VCC line,
the control pins will be pulled negative. ST suggests to insert a resistor (R
prevent the
The value of these resistors is a compromise between the leakage current of
current required by the HSD I/Os (Input levels compatibility) with the latch-up limit of
I/Os:
-V
µC I/O pins from latching up.
≤ R
CCpeak/Ilatchup
prot
≤ (V
OHµC-VIH-VGND
) / I
IHmax
if the device drives
GND
) in line to
prot
µC and the
µC
Equation 1:
For the following conditions:
V
I
latchup
V
5kΩ ≤ R
CCpeak
OHµC
= - 100V
≥ 20mA
≥ 4.5V
≤ 180kΩ.
prot
Recommended values are:
R
=10kΩ, C
prot
22/31
EXT
=10nF
Page 23
VN5050AJ-EApplication information
3.4 Maximum demagnetization energy (VCC = 13.5V)
Figure 27. Maximum turn Off current versus inductance
100
A
A
B
B
C
10
I (A)
1
0,1110100L (mH)
C
VIN, I
A: T
B: T
C: T
L
= 150°C single pulse
jstart
= 100°C repetitive pulse
jstart
= 125°C repetitive pulse
jstart
DemagnetizationDemagnetizationDemagnetization
Note:Values are generated with R
demagnetization) of every pulse must not exceed the temperature specified above for
curves A and B.
=0 Ω. In case of repetitive pulses, T
L
(at beginning of each
jstart
t
23/31
Page 24
Package and PCB thermal dataVN5050AJ-E
4 Package and PCB thermal data
4.1 PowerSSO-12™ thermal data
Figure 28. PowerSSO-12™ PC Board
Note:Layout condition of R
area= 77mm x 86mm,PCB thickness=1.6mm, Cu thickness=70 µm (front and back side),
Copper areas: from minimum pad lay-out to 8cm
Figure 29. R
RTHj_amb(°C/W)
thj-amb
65
60
55
50
45
40
35
0246810
and Zth measurements (PCB: Double layer, Thermal Vias, FR4
th
2
).
Vs. PCB copper area in open box free air condition
PCB Cu heatsink area (cm^2)
24/31
Page 25
VN5050AJ-EPackage and PCB thermal data
Figure 30. PowerSSO-12™ thermal impedance junction ambient single pulse
ZTH (°C/W)
100
10
1
0,1
0,0010,010,11101001000
Time (s)
Equation 2: pulse calculation formula
Z
THδ
where δ = t
R
TH
P
/T
δ Z
THtp
1 δ–()+⋅=
Footprint
2 cm
8 cm
2
2
Figure 31. Thermal fitting model of a single channel HSD in PowerSSO-12™
a. The fitting model is a semplified thermal tool and is valid for transient evolutions where the embedded
protections (power limitation or thermal cycling during thermal shutdown) are not triggered.
(a)
25/31
Page 26
Package and PCB thermal dataVN5050AJ-E
Table 13.Thermal parameter
Area/island (cm2)Footprint28
R1 (°C/W)0.7
R2 (°C/W)2.8
R3 (°C/W)3
R4 (°C/W)887
R5 (°C/W)221510
R6 (°C/W)262015
C1 (W.s/°C)0.001
C2 (W.s/°C)0.0025
C3 (W.s/°C)0.0166
C4 (W.s/°C)0.20.10.1
C5 (W.s/°C)0.270.81
C6 (W.s/°C)369
26/31
Page 27
VN5050AJ-EPackage information
5 Package information
5.1 ECOPACK® packages
In order to meet environmental requirements, ST offers these devices in ECOPACK®
packages. These packages have a Lead-free second-level interconnect. The category of
Second-Level Interconnect is marked on the package and on the inner box label, in
compliance with JEDEC Standard JESD97.
The maximum ratings related to soldering conditions are also marked on the inner box label.
ECOPACK is an ST trademark. ECOPACK specifications are available at: www.st.com.
5.2 Package mechanical data
Figure 32. PowerSSO-12™ package dimensions
27/31
Page 28
Package informationVN5050AJ-E
Table 14.PowerSSO-12™ mechanical data
Symbol
Min.Typ.Max.
A1.2501.620
A10.0000.100
A21.1001.650
B0.2300.410
C0.1900.250
D4.8005.000
E3.8004.000
e0.800
H5.8006.200
h0.2500.500
L0.4001.270
Millimeters
k0°8°
X2.2002.800
Y2.9003.500
ddd0.100
28/31
Page 29
VN5050AJ-EPackage information
5.3 Packing information
Figure 33. PowerSSO-12™ tube shipment (no suffix)
B
C
Base Q.ty100
Bulk Q.ty2000
Tube length (± 0.5)532
A
A1.85
B6.75
C (± 0.1)0.6
All dimensions are in mm.
Figure 34. PowerSSO-12™ tape and reel shipment (suffix “TR”)
REEL DIMENSIONS
Base Q.ty2500
Bulk Q.ty2500
A (max)330
B (min)1.5
C (± 0.2)13
F20.2
G (+ 2 / -0)12.4
N (min)60
T (max)18.4
TAPE DIMENSIONS
According to Electronic Industries Association
(EIA) Standard 481 rev. A, Feb. 1986
R1 value changed from 0.6 to 0.7 °C/W.
R3 value changed from 6.5 to 3 °C/W
R4 values changed from 10 /10 /9 to 8 /8 /7 °C/W.
C3 value changed from 0.022 to 0.0166 W.s/°C
Corrected typing error in Table 10: Current sense (8V<V
changed I
test condition from VIN = 0V to VIN = 5V.
OL
<16V) :
CC
30/31
Page 31
VN5050AJ-E
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