power limitation
– Very low stand-by current
– 3.0V CMOS compatible input
– Optimized electromagnetic emission
– Very low electromagnetic susceptibility
– In compliance with the 2002/95/EC
european directive
■ Diagnostic functions
– Proportional load current sense
– High current sense precision for wide range
currents
– Current sense disable
– Thermal shutdown indication
– Very low current sense leakage
■ Protection
– Undervoltage shut-down
– Overvoltage clamp
– Load current limitation
– Self limiting of fast thermal transients
– Protection against loss of ground and loss
■ All types of resistive, inductive and capacitive
loads
Description
The VN5016AJ-E is a monolithic device made
using STMicroelectronics VIPower M0-5
technology. It is intended for driving resistive or
inductive loads with one side connected to
ground. Active V
device against low energy spikes (see ISO7637
transient compatibility table). This device
integrates an analog current sense which delivers
a current proportional to the load current
(according to a known ratio) when CS_DIS is
driven low or left open.
When CS_DIS is driven high, the CURRENT
SENSE pin is in a high impedance condition.
Output current limitation protects the device in
overload condition. In case of long overload
duration, the device limits the dissipated power to
safe level up to thermal shut-down intervention.
Thermal shut-down with automatic restart allows
the device to recover normal operation as soon as
fault condition disappears.
/dt)onTurn-On voltage slopeRL= 2.6Ω (see Figure 8)See Figure 20V/ µs
/dt)
Turn-Off voltage slopeRL= 2.6Ω (see Figure 8)See Figure 22V/ µs
off
Switching energy losses
ON
during t
won
Switching energy losses
during t
woff
RL= 2.6Ω (see Figure 8)1.1mJ
RL= 2.6Ω (see Figure 8)0.8mJ
9/32
Page 10
Electrical specificationsVN5016AJ-E
Table 8.Logic input
SymbolParameterTest conditionsMin. Typ. Max. Unit
V
I
IL
V
I
IH
V
I(hyst)
V
ICL
V
CSDL
I
CSDL
V
CSDH
I
CSDH
V
CSD(hyst)
V
CSCL
Table 9.Protections and diagnostics
Input low level voltage0.9V
IL
Low level input currentVIN=0.9V1µA
Input high level voltage2.1V
IH
High level input currentVIN=2.1V10µA
Input hysteresis voltage0.25V
Input clamp voltage
CS_DIS low level voltage0.9V
Low level CS_DIS
current
CS_DIS high level
voltage
High level CS_DIS
current
CS_DIS hysteresis
voltage
CS_DIS clamp voltage
(1)
IIN=1mA
=-1mA
I
IN
=0.9V1µA
V
CSD
5.5
-0.7
2.1V
V
=2.1V10µA
CSD
0.25V
I
CSD
I
CSD
=1mA
=-1mA
5.5
-0.7
7V
V
7V
V
SymbolParameterTest conditionsMin.Typ.Max.Unit
V
=13V
I
limH
I
limL
T
TSD
T
T
RS
T
HYST
V
DEMAG
V
ON
(1) To ensure long term reliability under heavy overload or short circuit conditions, protection and related
diagnostic signals must be used together with a proper software strategy. If the device is subjected to
abnormal conditions, this software must limit the duration and number of activation cycles.
DC short circuit current
Short circuit current
during thermal cycling
Shutdown temperature150175200°C
Reset temperature
R
Thermal reset of
STATUS
Thermal hysteresis
TSD -TR
)
(T
Turn-Off output voltage
clamp
Output voltage drop
limitation
CC
5V<V
V
I
OUT
I
OUT
T
<36V
CC
=13V TR<Tj<T
CC
=2A; VIN=0; L=6mH
=0.3A;
= -40°C...+150°C
j
(see Figure 9)
TSD
466591
91
24A
T
+1 TRS +5°C
R
S
135°C
7°C
VCC-41
VCC-46
VCC-52
25mV
A
A
V
10/32
Page 11
VN5016AJ-EElectrical specifications
Table 10.Current sense (8V<VCC<16V)
SymbolParameterTest conditionsMin. Typ. Max. Unit
I
=0.25A;
OUT
K
K
dK
1/K1
K
dK
2/K2
K
dK
3/K3
I
SENSE0
I
0
OUT/ISENSE
I
1
OUT/ISENSE
(1)
Current sense ratio drift
I
2
OUT/ISENSE
(1)
Current sense ratio drift
I
3
OUT/ISENSE
(1)
Current sense ratio drift
Analog sense leakage
current
V
T
I
V
Tj= -40°C...150°C
I
V
T
I
V
T
I
V
T
I
V
T
I
V
T
I
V
Tj= -40°C...150°C
I
V
T
I
V
T
I
V
T
V
T
=0.5V;V
SENSE
= -40°C...150°C
j
=4A; V
OUT
CSD
OUT
CSD
= 25°C...150°C
j
OUT
CSD
=-40 °C to 150 °C
J
OUT
CSD
=-40°C...150°C
j
OUT
CSD
=25°C...150°C
j
OUT
CSD
=-40 °C to 150 °C
J
OUT
CSD
OUT
CSD
= 25°C...150°C
j
OUT
CSD
=-40 °C to 150 °C
J
OUT
CSD
=-40°C...150°C
j
CSD
=-40°C...150°C
j
SENSE
=0V;
=4A; V
SENSE
=0V;
=4A; V
SENSE
=0V;
=10A; V
SENSE
=0V;
=10A; V
SENSE
=0V;
=10A; V
SENSE
=0V;
=25A; V
SENSE
=0V;
=25A; V
SENSE
=0V;
=25A; V
SENSE
=0V;
=0A; V
SENSE
=5V; VIN=0V;
=0V; VIN=5V;
CSD
=0.5V;
=0.5V;
= 0.5V;
=4V;
=4V;
= 4V;
=4V;
=4V;
= 4V;
=0V;
=0V;
2760 5010 7240
3510
4560
5690
3770
4560
5350
-8+8%
4180
4570
5060
4250
4570
4890
-4+4%
4360
4500
4700
4380
4500
4620
-3+3%
0
0
1
2
µA
µA
I
OL
Openload ON state
current detection
threshold
=2A; V
I
OUT
=5V; VIN=5V;
V
CSD
=-40°C...150°C
T
j
VIN = 5V, I
=0V;
SENSE
0
= 5 µA1045mA
SENSE
1
11/32
µA
Page 12
Electrical specificationsVN5016AJ-E
Table 10.Current sense (8V<VCC<16V) (continued)
SymbolParameterTest conditionsMin. Typ. Max. Unit
V
SENSE
Max analog sense
output voltage
I
OUT
=15A; V
Analog sense output
V
SENSEH
voltage in
overtemperature
V
CC
=13V; R
condition
Analog sense output
I
SENSEH
current in
overtemperature
V
CC
=13V; V
condition
Delay response time
t
DSENSE1H
from falling edge of
CS_DIS pin
Delay response time
t
DSENSE1L
from rising edge of
CS_DIS pin
Delay response time
t
DSENSE2H
from rising edge of
INPUT pin
Delay response time
∆
t
DSENSE2H
between rising edge of
output current and rising
edge of current sense
Delay response time
t
DSENSE2L
from falling edge of
INPUT pin
(1) Parameter guaranteed by design; it is not tested.
V
SENSE
I
SENSE
(see Figure 4)
V
SENSE
I
SENSE
(see Figure 4)
V
SENSE
I
SENSE
(see Figure 4)
V
SENSE
I
SENSE
I
OUT
I
OUTMAX
V
SENSE
I
SENSE
(see Figure 4)
=0V; 5V
CSD
=3.9KΩ9V
SENSE
=5V8mA
SENSE
<4V, 1.5A<Iout<25A
= 90% of I
SENSE max
<4V, 1.5A<Iout<25A
= 10% of I
SENSE max
<4V, 1.5A<Iout<25A
= 90% of I
SENSE max
<4V,
= 90% of I
= 90% of I
SENSEMAX,
OUTMAX
=15A (see Figure 5)
<4V, 1.5A<Iout<25A
=10% of I
SENSE max
50100µs
520µs
270400µs
280µs
100250µs
12/32
Page 13
VN5016AJ-EElectrical specifications
Figure 4.Current sense delay characteristics
INPUT
CS_DIS
LOAD CURRENT
SENSE CURRENT
t
DSENSE2H
t
DSENSE1L
t
DSENSE1H
t
DSENSE2L
Figure 5.Delay response time between rising edge of ouput current and rising
edge of current sense (CS enabled)
V
IN
∆
t
DSENSE2H
I
OUT
I
SENSE
90% I
OUTMAX
90% I
I
OUTMAX
I
SENSEMAX
SENSEMAX
t
t
t
13/32
Page 14
Electrical specificationsVN5016AJ-E
Figure 6.I
I
out
OUT/ISENSE
/ I
sense
6000
5500
5000
max Tj = 25 °C to 150 °C
4500
min Tj = 25 °C to 150 °C
4000
min Tj = -40 °C to 150 °C
3500
3000
4812162024
Vs. I
max Tj = -40 °C to 150 °C
(see Ta bl e 1 0 for details)
OUT
I
OUT
typical value
(A)
Figure 7.Maximum current sense ratio drift vs load current
dk/k(%)
15
10
5
0
-5
-10
-15
47101316192225
I
(A)
OUT
Note:Parameter guaranteed by design; it is not tested.
14/32
Page 15
VN5016AJ-EElectrical specifications
Figure 8.Switching characteristics
V
OUT
t
Won
t
Woff
80%
dV
/dt
OUT
INPUT
(on)
t
d(on)
t
r
10%
Figure 9.Output voltage drop limitation
Vcc-V
out
Tj=150oC
t
d(off)
90%
t
f
T
j
=25oC
=-40oC
T
j
dV
OUT
/dt
(off)
t
t
V
on
I
Von/R
on(T)
out
15/32
Page 16
Electrical specificationsVN5016AJ-E
Table 11.Truth table
ConditionsInputOutputSense (V
Normal operation
CSD
L
H
L
H
0
Nominal
=0V)
(1)
Overtemperature
Undervoltage
Short circuit to GND
(Rsc ≤ 10 mΩ)
Short circuit to V
CC
L
H
L
H
L
H
H
L
H
L
L
V
SENSEH
L
L
L
L
L
0 if T
V
SENSEH
H
H
< Nominal
Negative output voltage clampLL0
(1) If the V
and external circuit.
is high, the SENSE output is at a high impedance, its potential depends on leakage currents
CSD
0
0
0
0
< T
j
TSD
if Tj > T
0
TSD
16/32
Page 17
VN5016AJ-EElectrical specifications
Table 12.Electrical transient requirements
ISO 7637-2:
Test levels
2004(E)
Test pulse
IIIIV
1-75V-100V5000 pulses0.5 s5 s2 ms, 10 Ω
2a+37V+50V5000 pulses0.2 s5 s50 µs, 2 Ω
3a-100V-150V1h90 ms100 ms0.1 µs, 50 Ω
3b+75V+100V1h90 ms100 ms0.1 µs, 50 Ω
4-6V-7V1 pulse100 ms, 0.01Ω
5b
(2)
+65V+87V1 pulse400 ms, 2 Ω
(1)
Number of
pulses or
test times
Burst cycle/pulse
repetition time
Delays and
Impedance
ISO 7637-2:
Test level results
(1)
2004(E)
Tes t puls e
IIIIV
1CC
2aCC
3aCC
3bCC
4CC
(2)
5b
(1) The above test levels must be considered referred to VCC = 13.5V except for pulse 5b.
(2) Valid in case of external load dump clamp: 40V maximum referred to ground.
CC
ClassContents
CAll functions of the device are performed as designed after exposure to disturbance.
E
One or more functions of the device are not performed as designed after exposure to
disturbance and cannot be returned to proper operation without replacing the device.
17/32
Page 18
Electrical specificationsVN5016AJ-E
Figure 10. Waveforms
NORMAL OPERATION
INPUT
CS_DIS
LOAD CURRENT
SENSE CURRENT
UNDERVOLTAGE
V
V
CC
INPUT
CS_DIS
LOAD CURRENT
SENSE CURRENT
V
USD
USDhyst
INPUT
CS_DIS
LOAD VOLTAGE
LOAD CURRENT
SENSE CURRENT
T
j
INPUT
CS_DIS
LOAD CURRENT
SENSE CURRENT
T
R
T
T
TSD
RS
current
limitation
<Nominal
OVERLOAD OPERATION
power
limitation
SHORT TO V
CC
<Nominal
thermal cycling
SHORTED LOADNORMAL LOAD
I
LIMH
I
LIML
V
SENSEH
18/32
Page 19
VN5016AJ-EElectrical specifications
C)
2.4 Electrical characteristics curves
Figure 11. Off state output currentFigure 12. High level input current
Figure 15. Input high levelFigure 16. Input hysteresis voltage
Vih (V)
4
3.5
3
2.5
2
1.5
1
0.5
0
-50 -250255075 100 125 150 175
Tc (°C )
Vhyst (V)
1
0.9
0.8
0.7
0.6
0.5
0.4
0.3
0.2
0.1
0
-50 -250255075 100 125 150 175
Tc (°C )
19/32
Page 20
Electrical specificationsVN5016AJ-E
Figure 17. On state resistance vs. T
Ron (mOhm)
50
45
40
35
30
25
20
15
10
5
0
Io u t=5 A
Vcc=13V
-50 -250255075 100 125 150 175
Tc (°C )
case
Figure 18. On state resistance vs. V
Ron (mOhm)
40
35
30
25
20
15
10
5
0
0510152025303540
Vcc (V)
Tc= 150°C
Tc= 125°C
Tc= 25°C
Tc= -40°Cv
Figure 19. Undervoltage shutdownFigure 20. Turn - On voltage slope
Vusd (V)
16
14
12
10
8
6
4
2
0
-50 -250255075 100 125 150 175
Figure 21. I
LIMH
vs. T
Tc (°C )
case
dV out/dt(on ) (V /ms )
1000
900
800
700
600
500
400
300
200
100
Vcc=13V
RI=2.6Ohm
0
-50 -250255075 100 125 150 175
Tc (°C )
Figure 22. Turn - Off voltage slope
CC
Ili mh (A )
80
75
Vcc=13V
70
65
60
55
50
45
40
-50 -250255075 100 125 150 175
Tc (°C )
20/32
(dVout/dt)off (V/ms)
1000
900
800
700
600
500
400
300
200
100
Vc c=13V
Rl=2.6Ohm
0
-50 -250255075 100 125 150 175
Tc (°C)
Page 21
VN5016AJ-EElectrical specifications
Figure 23. CS_DIS high level voltageFigure 24. CS_DIS clamp voltage
Vcsdh (V)
4
3.5
3
2.5
2
1.5
1
0.5
0
-50 -250255075 100 125 150 175
Tc (°C )
Figure 25. CS_DIS low level voltage
Vcsdl (V)
4
3.5
3
2.5
2
1.5
Vcsdcl (V)
8
7.5
6.5
5.5
4.5
Ic s d =1m A
7
6
5
4
-50 -250255075 100 125 150 175
Tc (°C )
1
0.5
0
-50 -250255075 100 125 150 175
Tc (°C )
21/32
Page 22
Application InformationVN5016AJ-E
3 Application Information
Figure 26. Application schematic
+5V
V
CC
R
prot
CS_DIS
D
ld
µC
R
prot
R
prot
R
SENSE
C
ext
INPUT
CURRENT SENSE
OUTPUT
GND
R
V
GND
GND
D
GND
3.1 GND protection network against reverse battery
3.1.1 Solution 1 : resistor in the ground line (R
This can be used with any type of load.
The following is an indication on how to dimension the R
1.R
2. R
where -I
maximum rating section of the device datasheet.
≤ 600mV / (I
GND
≥ (−VCC) / (-I
GND
is the DC reverse ground pin current and can be found in the absolute
GND
S(on)max
GND
).
)
GND
only)
GND
resistor.
Power Dissipation in R
P
= (-VCC)2/R
D
GND
(when VCC<0: during reverse battery situations) is:
GND
This resistor can be shared amongst several different HSDs. Please note that the value of
this resistor should be calculated with formula (1) where I
maximum on-state currents of the different devices.
Please note that if the microprocessor ground is not shared by the device ground then the
R
will produce a shift (I
GND
S(on)max
* R
GND
values. This shift will vary depending on how many devices are ON in the case of several
high side drivers sharing the same R
22/32
GND
S(on)max
becomes the sum of the
) in the input thresholds and the status output
.
Page 23
VN5016AJ-EApplication Information
If the calculated power dissipation leads to a large resistor or several devices have to share
the same resistor then ST suggests to utilize Solution 2 (see below).
3.1.2 Solution 2 : diode (D
A resistor (R
=1kΩ) should be inserted in parallel to D
GND
) in the ground line
GND
inductive load.
This small signal diode can be safely shared amongst several different HSDs. Also in this
case, the presence of the ground network will produce a shift (≈ 600mV) in the input
threshold and in the status output values if the microprocessor ground is not common to the
device ground. This shift will not vary if more than one HSD shares the same diode/resistor
network.
3.2 Load dump protection
Dld is necessary (Voltage Transient Suppressor) if the load dump peak voltage exceeds the
V
max DC rating. The same applies if the device is subject to transients on the VCC line
CC
that are greater than the ones shown in the ISO 7637-2: 2004(E) table.
3.3 MCU I/Os protection
If a ground protection network is used and negative transient are present on the VCC line,
the control pins will be pulled negative. ST suggests to insert a resistor (R
prevent the
The value of these resistors is a compromise between the leakage current of
current required by the HSD I/Os (Input levels compatibility) with the latch-up limit of
I/Os.
µC I/Os pins to latch-up.
if the device drives an
GND
prot
) in line to
µC and the
µC
-V
CCpeak/Ilatchup
≤ R
prot
≤ (V
Calculation example:
For V
5kΩ ≤ R
CCpeak
prot
≤ 180kΩ.
= - 100V and I
Recommended values: R
OHµC-VIH-VGND
≥ 20mA; V
latchup
=10kΩ, C
prot
) / I
IHmax
≥ 4.5V
OHµC
=10nF.
EXT
23/32
Page 24
Application InformationVN5016AJ-E
3.4 Maximum demagnetization energy (V
Figure 27. Maximum turn Off current versus load inductance
100
A
B
C
10
I (A)
1
0,1110100L (mH)
= 13.5V)
CC
A: T
B: T
C: T
VIN, I
= 150°C single pulse
jstart
= 100°C repetitive pulse
jstart
= 125°C repetitive pulse
jstart
L
Demagnetization
Note:Values are generated with R
In case of repetitive pulses, T
must not exceed the temperature specified above for curves B and C.
Demagnetization
=0 Ω.
L
(at beginning of each demagnetization) of every pulse
jstart
Demagnetization
t
24/32
Page 25
VN5016AJ-EPackage and PCB thermal data
4 Package and PCB thermal data
4.1 PowerSSO-12™ thermal data
Figure 28. PowerSSO-12™ PC board
Note:Layout condition of R
area= 77mm x 86mm,PCB thickness=1.6mm, Cu thickness=70µm (front and back side),
Copper areas: from minimum pad lay-out to 8cm
Figure 29. R
RTHj_amb(°C/W)
thj-amb
65
60
55
50
45
40
35
30
0246810
and Zth measurements (PCB: Double layer, Thermal Vias, FR4
th
2
).
vs. PCB copper area in open box free air condition
PCB Cu heatsink area (cm^2)
25/32
Page 26
Package and PCB thermal dataVN5016AJ-E
Figure 30. PowerSSO-12™ thermal impedance junction ambient single pulse
100
ZTH (°C/W)
10
1
0,1
0,00010,0010,010,11101001000
Time (s)
Equation 1: pulse calculation formula
Z
THδ
where δ = t
R
TH
/T
P
δ Z
THtp
1 δ–()+⋅=
2 cm
Footprint
8 cm
2
2
Figure 31. Thermal fitting model of a single channel HSD in PowerSSO-12™
(a )The fitting model is a semplified thermal tool and is valid for transient evolutions where the embedded
protections (power limitation or thermal cycling during thermal shutdown) are not triggered.
(a)
26/32
Page 27
VN5016AJ-EPackage and PCB thermal data
Table 13.Thermal parameter
Area/island (cm2)Footprint28
R1 (°C/W)0.1
R2 (°C/W)0.2
R3 (°C/W)4
R4 (°C/W)887
R5 (°C/W)221510
R6 (°C/W)262015
C1 (W.s/°C)0.0001
C2 (W.s/°C)0.002
C3 (W.s/°C)0.05
C4 (W.s/°C)0.20.10.1
C5 (W.s/°C)0.270.81
C6 (W.s/°C)369
27/32
Page 28
Package informationVN5016AJ-E
5 Package information
5.1 ECOPACK® packages
In order to meet environmental requirements, ST offers these devices in ECOPACK®
packages. These packages have a Lead-free second-level interconnect. The category of
Second-Level Interconnect is marked on the package and on the inner box label, in
compliance with JEDEC Standard JESD97. The maximum ratings related to soldering
conditions are also marked on the inner box label.
ECOPACK is an ST trademark. ECOPACK specifications are available at: www.st.com.
5.2 PowerSSO-12™package information
Figure 32. PowerSSO-12™ package dimensions
28/32
Page 29
VN5016AJ-EPackage information
Table 14.PowerSSO-12™ mechanical data
Symbol
Min.Typ.Max.
A1.2501.620
A10.0000.100
A21.1001.650
B0.2300.410
C0.1900.250
D4.8005.000
E3.8004.000
e0.800
H5.8006.200
h0.2500.500
L0.4001.270
Millimeters
k0°8°
X1.9002.500
Y3.6004.200
ddd0.100
29/32
Page 30
Package informationVN5016AJ-E
5.3 PowerSSO-12™ packing information
Figure 33. PowerSSO-12™ tube shipment (no suffix)
B
C
Base Q.ty100
Bulk Q.ty2000
Tube length (± 0.5)532
A
A1.85
B6.75
C (± 0.1)0.6
All dimensions are in mm.
Figure 34. PowerSSO-12™ tape and reel shipment (suffix “TR”)
REEL DIMENSIONS
Base Q.ty2500
Bulk Q.ty2500
A (max)330
B (min)1.5
C (± 0.2)13
F20.2
G (+ 2 / -0)12.4
N (min)60
T (max)18.4
TAPE DIMENSIONS
According to Electronic Industries Association
(EIA) Standard 481 rev. A, Feb. 1986
R3 value changed from 7 to 4 °C/W.
R4 values changed from 10 /10 /10 to 8 /8 /7 °C/W.
Corrected typing error in Table 10: Current sense (8V<V
changed I
test condition from VIN = 0V to VIN = 5V.
OL
<16V) :
CC
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