Interrupt requests are generated at 0.5-second intervals. (A clock timer oscillator is
incorporated.)
Either the main clock (6.29 MHz/12.58 MHz) or real-time clock (32.768 kHz) can be
selected as the input clock.
Selected from fCLK, fCLK/2, fCLK/4, fCLK/8, or fCLK/16 (can be used as a 1-bit output port)
12-bit resolution × 2 channels
UART/IOE (3-wire serial I/O) : 2 channels (incorporating baud rate generator)
APPENDIX A DEVELOPMENT TOOLS ..........................................................................................53
APPENDIX B CONVERSION SOCKET (EV-9200GF-100) PACKAGE DRAWING .....................56
APPENDIX C RELATED DOCUMENTS .........................................................................................58
Data Sheet U11681EJ2V0DS00
5
Page 6
µ
PD78P4908
1. DIFFERENCES BETWEEN µPD78P4908 AND MASK ROM PRODUCTS
The µPD78P4908 is produced by replacing the mask ROM in the µPD784907 or µPD784908 with PROM to which
µ
data can be written. The functions of the
for the PROM specification such as writing and verification, except that the PROM size can be changed to 96 or 128
Kbytes, and except that the internal RAM size can be changed to 3,584 or 4,352 bytes.
Table 1-1 shows the differences between these products.
Table 1-1. Differences Between the
PD78P4908 are the same as those of the µPD784907 or µPD784908 except
µ
PD78P4908 and Mask ROM Products
Product name
Item
Internal program
memory
Internal RAM
Pin connection
Power supply voltage
Electrical
characteristics
µ
µ
PD78P4908
• 128-Kbyte PROM
• 96-Kbyte mask ROM
PD784907
µ
PD784908
• 128-Kbyte mask ROM
• Can be changed to 96
Kbytes by IMS
• 4,352-byte internal RAM
• 3,584-byte internal RAM
• 4,352-byte internal RAM
• Can be changed to 3,584
bytes by IMS
Pin functions related to writing or reading of PROM have been added to the µPD78P4908.
• VDD = 4.5 to 5.5 V• VDD = 4.0 to 5.5 V
(At main clock: fXX = 12.58(At main clock: fXX = 12.58 MHz, internal system clock = fXX:
MHz, internal system clock =fCYK = 79 ns)
fXX: fCYK = 79 ns• VDD = 3.5 to 5.5 V
• VDD = 4.0 to 5.5 V(Other than above: fCYK = 159 ns)
A8-A19: Address bus
AD0-AD7: Address/data bus
ANI0-ANI7: Analog input
ASCK, ASCK2 : Asynchronous serial clock
ASTB: Address strobe
DD: Analog power supply
AV
REF1: Reference voltage
AV
SS: Analog ground
AV
CI: Clock input
CLKOUT: Clock output
HLDAK: Hold acknowledge
HLDRQ: Hold request
INTP0-INTP5 : Interrupt from peripherals
NMI: Non-maskable interrupt
P00-P07: Port 0
P10-P17: Port 1
P20-P27: Port 2
P30-P37: Port 3
P40-P47: Port 4
P50-P57: Port 5
P60-P67: Port 6
P70-P77: Port 7
P90-P97: Port 9
P100-P107: Port 10
PWM0, PWM1 : Pulse width modulation output
RD: Read strobe
REFRQ: Refresh request
REGC: Regulator capacitance
REGOFF: Regulator off
RESET: Reset
RX: IEBus receive data
RxD, RxD2: Receive data
SCK0-SCK3: Serial clock
SI0-SI3: Serial input
SO0-SO3: Serial output
TEST: Test
TO0-TO3: Timer output
TX: IEBus transmit data
TxD, TxD2: Transmit data
DD: Power supply
V
SS: Ground
V
WAIT: Wait
WR: Write strobe
X1, X2: Crystal (main system clock)
XT1, XT2: Crystal (watch)
Function
Timer output
Input of a count clock for timer/counter 2
Serial data input (UART0)
Serial data input (UART2)
Serial data output (UART0)
Serial data output (UART2)
Baud rate clock input (UART0)
Baud rate clock input (UART2)
Serial data input (3-wire serial I/O 0)
Serial data input (3-wire serial I/O 1)
Serial data input (3-wire serial I/O 2)
Serial data input (3-wire serial I/O 3)
Serial data output (3-wire serial I/O 0)
Serial data output (3-wire serial I/O 1)
Serial data output (3-wire serial I/O 2)
Serial data output (3-wire serial I/O 3)
Serial clock I/O (3-wire serial I/O 0)
Serial clock I/O (3-wire serial I/O 1)
Serial clock I/O (3-wire serial I/O 2)
Serial clock I/O (3-wire serial I/O 3)
External interrupt request—
• Input of a count clock for timer/counter 1
• Capture/trigger signal for CR11 or CR12
• Input of a count clock for timer/counter 2
• Capture/trigger signal for CR22
• Input of a count clock for timer/counter 2
• Capture/trigger signal for CR21
• Input of a count clock for timer/counter 0
• Capture/trigger signal for CR02
—
Input of a conversion start trigger for A/D converter
Time multiplexing address/data bus (for connecting external memory)
High-order address bus (for connecting external memory)
High-order address during address expansion (for connecting external memory)
Strobe signal output for reading the contents of external memory
Strobe signal output for writing on external memory
Wait signal insertion
Refresh pulse output to external pseudo static memory
Input of bus hold request
Output of bus hold response
Latch timing output of time multiplexing address (A0-A7) (for connecting
external memory)
Data Sheet U11681EJ2V0DS00
13
Page 14
(2) Non-port pins (2/2)
µ
PD78P4908
Pin
CLKOUT
PWM0
PWM1
RX
TX
REGC
REGOFF
RESET
X1
X2
XT1
XT2
ANI0-ANI7
AV
REF1
AVDD
AVSS
VDD
VSS
TEST
I/O
Output
Output
Output
Input
Output
—
—
Input
Input
—
Input
—
Input
—
Input
Also used as
ASTB
P70-P77
—
—
—
—
—
—
—
—
—
—
—
Function
Clock output
PWM output 0
PWM output 1
Data input (IEBus)
Data output (IEBus)
Capacitor connection for stabilizing the regulator output/Power supply
when the regulator is stopped. Connect to V
Signal for specifying regulator operation. Directly connect to VSS (regulator
selected).
Chip reset
Crystal input for system clock oscillation (A clock pulse can also be input
to the X1 pin.)
Real-time clock connection
Analog voltage inputs for the A/D converter
Application of A/D converter reference voltage
Positive power supply for the A/D converter
Ground for the A/D converter
Positive power supply
Ground
Directly connect to V
SS. (The TEST pin is for the IC test.)
SS via a 1-
µ
F capacitor.
4.2 PINS FOR PROM PROGRAMMING MODE (VPP≥ +5 V or +12.5 V, RESET = L)
4.2.1 Pin Functions
Pin name
V
PP
RESET
A0-A16
D0-D7
CE
OE
PGM
V
DD
VSS
Input
I/O
Input
I/O
—
—
—
PROM programming mode selection
High voltage input during program write or verification
PROM programming mode selection
Address bus
Data bus
PROM enable input/program pulse input
Read strobe input to PROM
Program/program inhibit input during PROM programming mode
Positive power supply
GND
Function
14
Data Sheet U11681EJ2V0DS00
Page 15
4.2.2 Pin Functions
(1) V
PP (Programming power supply): Input
µ
Input pin for setting the
+6.5 V or more and when RESET input goes low, the
When CE is made low for V
PD78P4908 to the PROM programming mode. When the input voltage on this pin is
µ
PD78P4908 enters the PROM programming mode.
PP = +12.5 V and OE = high, program data on D0 to D7 can be written into the internal
PROM cell selected by A0 to A16.
(2) RESET (Reset): Input
µ
Input pin for setting the
the input voltage on the V
PD78P4908 to the PROM programming mode. When input on this pin is low, and when
PP pin goes +5 V or more, the
µ
PD78P4908 enters the PROM programming mode.
(3) A0 to A16 (Address bus): Input
Address bus that selects an internal PROM address (0000H to 1FFFFH)
(4) D0 to D7 (Data bus): I/O
Data bus through which a program is written on or read from internal PROM
µ
PD78P4908
(5) CE (Chip enable): Input
This pin inputs the enable signal from internal PROM. When this signal is active, a program can be written or
read.
(6) OE (Output enable): Input
This pin inputs the read strobe signal to internal PROM. When this signal is made active for CE = low, a onebyte program in the internal PROM cell selected by A0 to A16 can be read onto D0 to D7.
(7) PGM (Program): Input
The input pin for the operation mode control signal of the internal PROM.
Upon activation, writing to the internal PROM is enabled.
Upon inactivation, reading from the internal PROM is enabled.
DD
(8) V
Positive power supply pin
(9) V
SS
Ground potential pin
Data Sheet U11681EJ2V0DS00
15
Page 16
4.3 I/O CIRCUITS FOR PINS AND HANDLING OF UNUSED PINS
Table 4-1 describes the types of I/O circuits for pins and the handling of unused pins.
Figure 4-1 shows the configuration of these various types of I/O circuits.
Table 4-1. Types of I/O Circuits for Pins and Handling of Unused Pins (1/2)
Input state:To be connected to VDD
Output state: To be left open
To be connected to VDD or VSS
To be connected to VDD
Input state: To be connected to VDD
Output state: To be left open
To be connected to VDD
Input state: To be connected to VDD
Output state: To be left open
Input state:To be connected to V
Output state : To be left open
To be left open
DD or VSS
16
Data Sheet U11681EJ2V0DS00
Page 17
µ
PD78P4908
Table 4-1. Types of I/O Circuits for Pins and Handling of Unused Pins (2/2)
Pin
RESET
TEST
XT2
XT1
PWM0, PWM1
RX
TX
AV
REF1
AVSS
AVDD
I/O circuit type
2
1
—
3
1
3
—
I/O
Input
—
Input
Output
Input
Output
—
Caution When the I/O mode of an I/O dual-function pin is unpredictable, connect the pin to V
Recommended connection method for unused pins
—
To be connected to V
To be left open
To be connected to VSS
To be left open
To be connected to VDD or VSS
To be left open
To be connected to VSS
To be connected to VDD
SS directly
DD through
a resistor of 10 to 100 kΩ (particularly when the voltage of the reset input pin becomes higher
than that of the low level input at power-on or when I/O is switched by software).
Remark Since type numbers are consistent in the 78K series, those numbers are not always serial in each product.
(Some circuits are not included.)
Data Sheet U11681EJ2V0DS00
17
Page 18
Figure 4-1. I/O Circuits for Pins
Data
V
DD
P
N
IN/OUT
Output
disable
VDD
P
Pull-up
enable
Input
enable
Data
V
DD
P
N
IN/OUT
Output
disable
VDD
P
Pull-up
enable
µ
PD78P4908
Type 1
VDD
P
IN
N
Type 2
IN
Schmitt trigger input with hysteresis characteristics
Type 3
V
DD
P-ch
DataOUT
N-ch
Type 4
VDD
Data
P
Type 2-A
VDD
P
Pull-up
enable
IN
Schmitt trigger input with hysteresis characteristics
Type 5-A
Type 8-A
Output
disable
Push-pull output which can output high impedance
(both the positive and negative channels are off.)
Type 10-A
Pull-up
enable
Data
P
Open
drain
Output
N
disable
Type 12
Analog output
voltage
P
N
18
OUT
N
VDD
P
Type 20
V
V
DD
Data
IN/OUT
Output
disable
DD
P
IN/OUT
N
Comparator
P
N
OUT
+
–
(Threshold voltage)
VREF
Input
enable
Data Sheet U11681EJ2V0DS00
Page 19
µ
PD78P4908
5. INTERNAL MEMORY SIZE SELECT REGISTER (IMS)
This register enables the software to avoid using part of the internal memory. The IMS can be set to establish
the same memory mapping as used in mask ROM products that have different internal memory (ROM and RAM)
configurations.
The IMS is set using 8-bit memory operation instructions.
PD784907 or µPD784908). But the action is not affected if
Same as the PD784908
Same as the PD784907
Not to be set
the write command to the IMS is executed to the mask ROM product.
Address
0FFFCH
Memory size
µ
µ
Reset valueWR/W
FFH
Data Sheet U11681EJ2V0DS00
19
Page 20
µ
PD78P4908
6. PROM PROGRAMMING
The µPD78P4908 has an on-chip 128-KB PROM device for use as program memory. When programming, set
PP and RESET pins for PROM programming mode. See 2. PIN CONFIGURATION (TOP VIEW) (2) PROM
the V
programming mode with regard to handling of other, unused pins.
6.1 OPERATION MODE
PROM programming mode is selected when +6.5 V is added to the V
low-level input is added to the RESET pin. This mode can be set to operation mode by setting the CE pin, OE pin,
and PGM pin as shown in Table 6-1 below.
In addition, the PROM contents can be read by setting read mode.
Set OE to H to set high impedance for data output and output disable mode.
µ
Consequently, if several
select data output from any of the devices.
(3) Standby mode
Set CE to H to set standby mode.
In this mode, data output is set to high impedance regardless of the OE setting.
(4) Page data latch mode
At the beginning of page write mode, set CE to H, PGM to H, and OE to L to set page data latch mode.
In this mode, 1 page (4 bytes) of data are latched to the internal address/data latch circuit.
(5) Page write mode
After latching the address and data for one page (4 bytes) using page data latch mode, adding a 0.1 ms program
pulse (active, low) to the PGM pin with both CE and OE set to H causes page write to be executed. Later, setting
both CE and OE to L causes program verification to be executed.
If programming is not completed after one program pulse, the write and verify operations may be repeated X times
(where X ≤ 10).
PD78P4908 devices are connected to a data bus, the OE pins can be controlled to
(6) Byte write mode
Adding a 0.1 ms program pulse (active, low) to the PGM pin with setting CE to L and OE to H causes byte write
to be executed. Later, setting OE to L causes program verification to be executed.
If programming is not completed after one program pulse, the write and verify operations may be repeated X times
(where X ≤ 10).
(7) Program verify mode
Set CE to L, PGM to H, and OE to L to set program verify mode. Use verify mode for verification following each
write operation.
(8) Program inhibit mode
µ
Program inhibit mode is used to write to a single device when several
parallel to OE , V
Use the page write mode or byte write mode described above for each write operation. Write operations cannot
be done for devices in which the PGM pin has been set to H.
PP, and D0 to D7 pins.
PD78P4908 devices are connected in
Data Sheet U11681EJ2V0DS00
21
Page 22
6.2 PROM WRITE SEQUENCE
Figure 6-1. Page Program Mode Flowchart
Start
Address = G
DD = +6.5 V, VPP = +12.5 V
V
X = 0
Latch
Address = Address + 1
Latch
Address = Address + 1
µ
PD78P4908
Address = Address + 1
Latch
Address = Address + 1
Latch
X = X + 1
0.1 ms program pulse
Verify 4 bytes
No
Pass
Address = N ?
DD = 4.0 to 5.5 V, VPP = VDD
V
Verify all bytes
Pass
Yes
All pass
Fail
Fail
No
X = 10 ?
Yes
Remark G = Start address
N = Program end address
22
Write end
Data Sheet U11681EJ2V0DS00
Defective
Page 23
Figure 6-2. Page Program Mode Timing
µ
PD78P4908
A2-A16
A0, A1
D0-D7
VPP
VDD
CE
Page data latch
Hi-ZHi-Z
Data inputData output
PP
V
VDD
VDD + 1.5
DD
V
VIH
VIL
Page programProgram verify
PGM
OE
VIH
VIL
VIH
VIL
Data Sheet U11681EJ2V0DS00
23
Page 24
Figure 6-3. Byte Program Mode Flowchart
Start
Address = G
DD = +6.5 V, VPP = +12.5 V
V
= 0
X
µ
PD78P4908
Address = Address + 1
Remark G = Start address
N = Program end address
= X + 1
X
0.1 ms program pulse
Verify
No
Pass
Address = N ?
V
DD = 4.0 to 5.5 V, VPP = VDD
Verify all bytes
Write endDefective
Pass
Yes
All pass
Fail
Fail
X
= 10 ?
No
Yes
24
Data Sheet U11681EJ2V0DS00
Page 25
Figure 6-4. Byte Program Mode Timing
µ
PD78P4908
A0-A16
D0-D7
VPP
VDD
CE
Program
Hi-ZHi-ZHi-Z
V
PP
VDD
VDD + 1.5
V
DD
VIH
VIL
Data inputData output
Program verify
VIH
PGM
VIL
VIH
OE
VIL
Cautions 1. Add V
2. Do not allow V
3. Reliability problems may result if the device is inserted or pulled out while 12.5 V is applied
PP.
at V
DD before VPP, and turn off the VDD after VPP.
PP to exceed 13.5 V including overshoot.
Data Sheet U11681EJ2V0DS00
25
Page 26
6.3 PROM READ SEQUENCE
Follow this sequence to read the PROM contents to an external data bus (D0 to D7).
µ
PD78P4908
(1) Set the RESET pin to low level and add 5 V to the V
PP pin. See 2. PIN CONFIGURATION (TOP VIEW) (2) PROM
programming mode with regard to handling of other, unused pins.
(2) Add 5 V to the V
DD and VPP pins.
(3) Input the data address to be read to pins A0 to A16.
(4) Set read mode.
(5) Output the data to pins D0 to D7.
Figure 6-5 shows the timing of steps (2) to (5) above.
Figure 6-5. PROM Read Timing
A0-A16
CE (input)
OE (input)
Address input
D0-D7
Hi-ZHi-Z
Data output
7. SCREENING ONE-TIME PROM PRODUCTS
NEC cannot execute a complete test of one-time PROM products (µPD78P4908GF-3BA) due to their structure
before shipment. It is recommended that you screen (verify) PROM products after writing necessary data into them
and storing them at 125°C for 24 hours.
26
Data Sheet U11681EJ2V0DS00
Page 27
µ
PD78P4908
8. ELECTRICAL CHARACTERISTICS
ABSOLUTE MAXIMUM RATINGS (TA = 25 °C)
ParameterSymbolConditionsRatingUnit
Supply voltageVDD–0.3 to +7.0V
AVDD–0.3 to VDD + 0.3V
AVSS–0.3 to +0.3V
Input voltageVI1For pins other than VPP, A9–0.3 to VDD + 0.3V
VI2VPP, A9–0.3 to +13.5V
Analog input voltageVANAVSS – 0.3 to AVREF1 + 0.3V
Output voltageVO–0.3 to VDD + 0.3V
Output low currentI OLOne pin10mA
Total for the P00-P07, P30-50mA
P37, P54-P57, P60-P67, and
P100-P107 pins
Total for the P10-P17, P40-50mA
P47, P50-P53, P70-P77,
P90-P97, PWM0, PWM1,
and TX pins
Output high currentIOHOne pin–6mA
Total for the P00-P07, P30-–30mA
P37, P54-P57, P60-P67, and
P100-P107 pins
Total for the P10-P17, P40-–30mA
P47, P50-P53, P70-P77,
P90-P97, PWM0, PWM1,
and TX pins
A/D converter reference inputAVREF1–0.3 to VDD + 0.3V
voltage
Operating ambient temperatureTA–40 to +85°C
Storage temperatureTstg–65 to +150°C
Caution Absolute maximum ratings are rated values beyond which physical damage will be caused to
the product; if the rated value of any of the parameters in the above table is exceeded, even
momentarily, the quality of the product may deteriorate. Always use the product within its rated
values.
Remark Unless otherwise stated, the characteristics of a dual-function pin are the same as those of a port pin.
Data Sheet U11681EJ2V0DS00
27
Page 28
OPERATING CONDITIONS
• Operating ambient temperature (T
A): –40 °C to +85 °C
• Power supply voltage and clock cycle time: See Figure 8-1.
DC CHARACTERISTICS (TA = –40 °C to +85 °C, VDD = AVDD = 4.0 to 5.5 V, VSS = AVSS = 0 V) (2/2)
Parameter
Input leakage current
Output leakage current
V
DD supply current
Pull-up resistor
Note
Symbol
LI1
I
ILI2
ILO
IDD1
IDD2
IDD3
RL
Conditions
0 V ≤ VI≤ VDDFor pins other than
X1 and XT1
X1, XT1
0 V ≤ V
O≤ VDD
Operation modefXX = 12.58 MHz
VDD = 4.5 to 5.5 V
fXX = 6.29 MHz
VDD = 4.0 to 5.5 V
HALT modefXX = 12.58 MHz
VDD = 4.5 to 5.5 V
fCLK = fXX/8
(STBC = B1H)
Peripheral operation
stops.
fXX = 6.29 MHz
VDD = 4.0 to 5.5 V
fCLK = fXX/8
(STBC = 31H)
Peripheral operation
stops.
IDLE modefXX = 12.58 MHz
VDD = 4.5 to 5.5 V
fXX = 6.29 MHz
VDD = 4.0 to 5.5 V
VI = 0 V
MIN.
15
TYP.
20
10
5.2
2.6
2.4
1.8
MAX.
±10
±20
±10
40
20
10.4
5.2
4.8
3.6
80
Unit
µ
µ
µ
mA
mA
mA
mA
mA
mA
kΩ
A
A
A
Note These values are valid when the internal regulator is ON (REGOFF pin = low level). They do not include
DD and AVREF1 currents.
the AV
Data Sheet U11681EJ2V0DS00
31
Page 32
AC CHARACTERISTICS (TA = –40°C to +85°C, VDD = AVDD = 4.0 to 5.5 V, AVSS = VSS = 0 V)
(1) Read/write operation
µ
PD78P4908
Parameter
Address setup time
(to ASTB↓)
ASTB high-level width
Address hold time (to ASTB↓)
Address hold time (to RD↑)
Delay from address to RD↓
Address float time (to RD↓)
Delay from address to data
input
Delay from ASTB↓ to data input
Delay from RD↓ to data input
Delay from ASTB↓ to RD↓
Data hold time (to RD↑)
Delay from RD↑ to address
active
Delay from RD↑ to ASTB↑
RD low-level width
Delay from address↓ to WR↓
Address hold time (to WR↑)
Delay from ASTB↓ to data
output
Delay from WR↓ to data output
Delay from ASTB↓ to WR↓
Data setup time (to WR↑)
Data hold time (to WR↑)
Delay from WR↑ to ASTB↑
WR low-level width
a:1 during address wait, otherwise, 0
n:Number of wait states (n ≥ 0)
CYK (system clock cycle time) VDD = 5.0 V T = 79 ns (MIN.)
Data Sheet U11681EJ2V0DS00
33
Page 34
(3) Bus hold timing
µ
PD78P4908
Parameter
Delay from HLDRQ↑ to float
Delay from HLDRQ↑ to HLDAK↑
Delay from float to HLDAK↑
Delay from HLDRQ↓ to HLDAK↓
Delay from HLDRQ↓ to active
Remark T: t
CYK (system clock cycle time) VDD = 5.0 V T = 79 ns (MIN.)
a:1 during address wait, otherwise, 0
n:Number of wait states (n ≥ 0)
(4) Refresh timing
Parameter
Random read/write cycle time
REFRQ low-level pulse width
Delay from ASTB↓ to REFRQ
Delay from RD↑ to REFRQ
Delay from WR↑ to REFRQ
Delay from REFRQ↑ to ASTB
REFRQ high-level pulse width
Symbol
tFHQC
tDHQHHAH
tDCFHA
tDHQLHAL
tDHAC
Symbol
tRC
tWRFQL
tDSTRFQ
tDRRFQ
tDWRFQ
tDRFQST
tWRFQH
Conditions
VDD = 5.0 V(2 + 4 + a + n)T + 50
VDD = 5.0 V(3 + 4 + a + n)T + 30
V
Program memory write mode
Program memory read mode
Program memory write mode
Program memory read mode
Program memory write mode
Program memory read mode
Program memory write mode
Program memory read mode
Note 2
MIN.
2.2
–0.3
2.4
6.25
4.5
12.2
TYP.
6.5
5.0
12.5
VPP = VDDP
10
10
5
1.0
MAX.
VDDP + 0.3
+0.8
±10
0.45
±10
6.75
5.5
12.8
40
40
50
100
Unit
V
V
µ
V
V
µ
V
V
V
V
mA
mA
mA
µ
A
A
A
Notes 1. Symbols for the corresponding
2. The V
DDP represents the VDD pin as viewed in the programming mode.
Parameter
Address setup time
CE set time
Input data setup time
Address hold time
Input data hold time
Output data hold time
VPP setup time
VDDP setup time
Initial program pulse width
OE set time
Valid data delay time from OE
OE pulse width in the data latch
PGM setup time
CE hold time
OE hold time
Symbol
tVDS
tPGMS
Note 1
tAS
tCES
tDS
tAH
tAHL
tAHV
tDH
tDF
tVPS
Note 2
tPW
tOES
tOE
tLW
tCEH
tOEH
ConditionsUnit
MIN.
2
2
2
2
2
0
2
0
2
2
0.095
2
1
2
2
2
TYP.
0.1
1
MAX.
130
0.105
2
µ
µ
µ
µ
µ
µ
µ
ns
µ
µ
ms
µ
ns
µ
µ
µ
µ
s
s
s
s
s
s
s
s
s
s
s
s
s
s
Notes 1. These symbols (except t
µ
2. For
PD27C1001A, read tVDS as tVCS.
VDS) correspond to those of the corresponding
µ
PD27C1001A.
Data Sheet U11681EJ2V0DS00
47
Page 48
PROM Write Mode (Byte Program Mode)
µ
PD78P4908
Parameter
Address setup time
CE set time
Input data setup time
Address hold time
Input data hold time
Output data hold time
VPP setup time
VDDP setup time
Initial program pulse width
OE set time
Valid data delay time from OE
Notes 1. These symbols (except t
µ
2. For
PD27C1001A, read tVDS as tVCS.
PROM Read Mode
Parameter
Data output time from address
Delay from CE ↓ to data output
Delay from OE ↓ to data output
Data hold time to OE↑ or CE↑
Data hold time to address
Note 2
Note 1
Symbol
tAS
tCES
tDS
tAH
tDH
tDF
tVPS
Note 2
tVDS
tPW
tOES
tOE
VDS) correspond to those of the corresponding
Note 1
Symbol
tACC
tCE
tOE
tDF
tOH
ConditionsMAX.
Conditions
CE = OE = VIL
OE = VIL
CE = VIL
CE = VIL or OE = VIL
CE = OE = VIL
MIN.
2
2
2
2
2
0
2
2
0.095
2
MIN.
0
0
TYP.
0.1
1
µ
PD27C1001A.
TYP.
1
1
130
0.105
2
MAX.
200
2
2
60
Unit
µ
µ
µ
µ
µ
ns
µ
µ
ms
µ
ns
Unit
ns
µ
µ
ns
ns
s
s
s
s
s
s
s
s
s
s
Notes 1. These symbols correspond to those of the corresponding
DF is the time measured from when either OE or CE reaches VIH, whichever is faster.
2. t
µ
PD27C1001A.
48
Data Sheet U11681EJ2V0DS00
Page 49
PROM Write Mode Timing (Page Program Mode)
Page data latchPage programProgram verify
A2-A16
µ
PD78P4908
VPP
VDDP
CE
PGM
OE
A0, A1
D0-D7
V
VDDP
VDDP + 1.5
VDDP
VIH
VIL
VIH
VIL
VIH
VIL
tAStAHL
tDStDH
Hi-ZHi-ZHi-Z
tVPSData input
PP
tVDS
tLW
tPGMS
tPW
tCEH
tCES
tOE
tAHV
tDF
Data
output
tAH
tOEH
tOES
Data Sheet U11681EJ2V0DS00
49
Page 50
PROM Write Mode Timing (Byte Program Mode)
ProgramProgram verify
A0-A16
µ
PD78P4908
D0-D7
V
VPP
VDDP
VDDP + 1.5
VDDP
VDDP
CE
PGM
OE
Cautions 1. V
2. V
3. Plugging in or out the board with the V
reliability.
tAS
Hi-ZHi-ZHi-Z
tDS
PP
Data input
tDS
tVPS
tVDS
VIH
VIL
tCES
tPW
VIH
VIL
tOEStOE
VIH
VIL
DDP must be applied before VPP, and must be cut after VPP.
PP including overshoot must not exceed 13.5 V.
PP pin supplied with 12.5 V may adversely affect its
tDF
Data output
tAHtDH
PROM Read Mode Timing
A0-A16
CE
OE
D0-D7
Notes 1. For reading within t
DF is the time measured from when either OE or CE reaches VIH, whichever is faster.
2. t
50
Valid address
tCE
Note 2
Note 1
tACC
Hi-ZHi-Z
ACC, the delay of the OE input from falling edge of CE must be within tACC-tOE.
Note 1
tOE
Data output
Data Sheet U11681EJ2V0DS00
tOH
tDF
Page 51
9. PACKAGE DRAWING
100PIN PLASTIC QFP (14x20)
µ
PD78P4908
A
B
80
81
100
1
51
30
50
31
F
G
H
M
I
J
P
N
NOTE
Each lead centerline is located within 0.15 mm (0.006 inch) of
its true position (T.P.) at maximum material condition.
Remark The shape and material of the ES version are the same
as those of the corresponding mass-produced product.
CD
K
M
L
detail of lead end
S
Q
ITEM MILLIMETERSINCHES
A23.6±0.40.929±0.016
B20.0±0.20.795
C14.0±0.20.551
D17.6±0.40.693±0.016
F0.80.031
G0.60.024
H0.30±0.100.012
I0.150.006
J0.65 (T.P.)0.026 (T.P.)
K1.8±0.20.071
L0.8±0.20.031
M0.150.006
N0.100.004
P2.7±0.10.106
Q0.1±0.10.004±0.004
R5°±5°5°±5°
S3.0 MAX.0.119 MAX.
R
+0.10
–0.05
P100GF-65-3BA1-3
+0.009
–0.008
+0.009
–0.008
+0.004
–0.005
+0.008
–0.009
+0.009
–0.008
+0.004
–0.003
+0.005
–0.004
Data Sheet U11681EJ2V0DS00
51
Page 52
µ
PD78P4908
10. RECOMMENDED SOLDERING CONDITIONS
The conditions listed below shall be met when soldering the µPD78P4908.
For details of the recommended soldering conditions, refer to our document Semiconductor Device Mounting
Technology Manual(C10535E).
Please consult with our sales offices in case any other soldering process is used, or in case soldering is done under
different conditions.
Table 10-1. Soldering Conditions for Surface-Mount Devices
µ
PD78P4908GF-3BA: 100-pin plastic QFP (14 × 20 mm)
Soldering process
Infrared ray reflow
VPS
Wave soldering
Partial heating method
Soldering conditions
Peak package's surface temperature: 235°C
Reflow time: 30 seconds or less (210°C or more)
Maximum allowable number of reflow processes: 2
Exposure limit: 7 days
afterward)
Peak package's surface temperature: 215°C
Reflow time: 40 seconds or less (200°C or more)
Maximum allowable number of reflow processes: 2
Exposure limit: 7 days
afterward)
Solder temperature: 260°C or less
Flow time: 10 seconds or less
Number of flow processes: 1
Preheating temperature: 120°C MAX. (measured on the package
surface)
Exposure limit: 7 days
afterward)
Terminal temperature: 300°C or less
Heat time: 3 seconds or less (for one side of a device)
Note
(20 hours of pre-baking is required at 125°C
Note
(20 hours of pre-baking is required at 125°C
Note
(20 hours of pre-baking is required at 125°C
Symbol
IR35-207-2
VP15-207-2
WS60-207-1
–
Note Maximum number of days during which the product can be stored at a temperature of 25°C and a relative
humidity of 65% or less after dry-pack package is opened.
Caution Do not apply two or more different soldering methods to one chip (except for partial heating
method for terminal sections).
52
Data Sheet U11681EJ2V0DS00
Page 53
APPENDIX A DEVELOPMENT TOOLS
The following development tools are available for system development using the µPD78P4908.
See also (5) Notes on using development tools.
(1) Language processing software
RA78K4Assembler package for all 78K/IV series models
CC78K4C compiler package for all 78K/IV series models
DF784908Device file for µPD784908 subseries models
CC78K4-LC compiler library source file for all 78K/IV series models
(2) PROM write tools
PG-1500PROM programmer
PA-78P4908GFProgrammer adapter, connects to PG-1500
PG-1500 controllerControl program for PG-1500
(3) Debugging tools
µ
PD78P4908
• When using the in-circuit emulator IE-78K4-NS
IE-78K4-NSIn-circuit emulator for all 78K/IV series models
IE-70000-MC-PS-BPower supply unit for IE-78K4-NS
IE-70000-98-IF-CInterface adapter when the PC-9800 series computer (other than a notebook)
is used as the host machine (C bus compatible)
IE-70000-CD-IF-APC card and interface cable when a notebook is used as the host machine
(PCMCIA socket compatible)
IE-70000-PC-IF-CInterface adapter when the IBM PC/ATTM compatible is used as the host
machine (ISA compatible)
IE-7000-PCI-IFAdapter when a computer with a PCI bus as the host machine
IE-784908-NS-EM1
NP-100GF
EV-9200GF-100Socket for mounting on target system board made for 100-pin plastic QFP
ID78K4-NSIntegrated debugger for IE-78K4-NS
SM78K4System simulator for all 78K/IV series models
DF784908Device file for µPD784908 subseries models
Note
Note
Emulation board for evaluating µPD784908 subseries models
Emulation probe for 100-pin plastic QFP (GF-3BA type)
(GF-3BA type). Used in LCC mode.
Note Under development
Data Sheet U11681EJ2V0DS00
53
Page 54
µ
PD78P4908
• When using the in-circuit emulator IE-784000-R
IE-784000-RIn-circuit emulator for all 78K/IV series models
IE-70000-98-IF-CInterface adapter when the PC-9800 series computer (other than a notebook)
is used as the host machine (C bus compatible)
IE-70000-PC-IF-CInterface adapter when the IBM PC/AT compatible is used as the host
machine (ISA bus compatible)
IE-7000-PCI-IFAdapter when a computer with a PCI bus as the host machine
IE-78000-R-SV3Interface adapter and cable when the EWS is used as the host machine
IE-784908-NS-EM1Emulation board for evaluating µPD784908 subseries models
IE-784908-R-EM1
IE-784000-R-EMEmulation board for all 78K/IV series models
IE-78K4-R-EX2Conversion board for emulation probes required to use the IE-784908-NS-
EM1 on the IE-784000-R. The board is not needed when the conventional
product IE-784908-R-EM1 is used.
EP-78064-GF-REmulation probe for 100-pin plastic QFP (GF-3BA type)
EV-9200GF-100Socket for mounting on target system board made for 100-pin plastic QFP
(GF-3BA type)
ID78K4Integrated debugger for IE-784000-R
SM78K4System simulator for all 78K/IV series models
DF784908Device file for µPD784908 subseries models
(4) Real-time OS
RX78K/IVReal-time OS for 78K/IV series models
MX78K4OS for 78K/IV series models
54
Data Sheet U11681EJ2V0DS00
Page 55
µ
PD78P4908
(5) Notes when using development tools
• The ID78K4-NS, ID78K4, and SM78K4 can be used in combination with the DF784908.
• The CC78K4 and RX78K/IV can be used in combination with the RA78K4 and DF784908.
• The NP-100GF is a product from Naito Densei Machida Mfg. Co., Ltd. (044-822-3813). Consult the NEC sales
representative for purchasing.
• The host machines and operating systems corresponding to each software are shown below.
PC-9800 series [WindowsTM]HP9000 series 700TM [HP-UXTM]
IBM PC/AT compatibles [Windows]SPARCstationTM [SunOSTM, SolarisTM]
Note
Note
Note
Note
Note
–
Note Software under MS-DOS
Data Sheet U11681EJ2V0DS00
55
Page 56
µ
PD78P4908
APPENDIX B CONVERSION SOCKET (EV-9200GF-100) PACKAGE DRAWING
Connect the µPD78P4908GF-3BA (100-pin plastic QFP (14 × 20 mm)) to the circuit board in combination with the
EV-9200GF-100.
Figure B-1. Package Drawings of EV-9200GF-100 (Reference)
E
D
C
No.1 pin index
EV-9200GF-100
1
A
B
F
G
H
I
ITEMMILLIMETERSINCHES
A
B
C
D
E
F
G
H
I
J
K
L
M
N
O
P
Q
R
S
24.6
21
15
18.6
4-C 2
0.8
12.0
22.6
25.3
6.0
16.6
19.3
8.2
8.0
2.5
2.0
0.35
φ
2.3
φ
1.5
M
NO
P
EV-9200GF-100-G0
R
J
Q
0.969
0.827
0.591
0.732
4-C 0.079
0.031
0.472
0.89
0.996
0.236
0.654
076
0.323
0.315
0.098
0.079
0.014
φ
0.091
φ
0.059
S
L
K
56
Data Sheet U11681EJ2V0DS00
Page 57
µ
PD78P4908
Figure B-2. Recommended Pattern to Mount EV-9200GF-100 on a Substrate (Reference)
G
J
K
F
E
D
H
L
I
C
B
A
EV-9200GF-100-P1E
ITEMMILLIMETERSINCHES
+0.001
–0.002
+0.001
–0.002
1.035
0.85
0.614
0.799
0.472
0.236
0.014
φ
0.093
φ
0.091
φ
0.062
+0.003
–0.002
+0.003
–0.002
+0.001
–0.001
+0.001
–0.002
+0.001
–0.002
A
B
C
D
E
F
G
H
I
J
K
L
Caution
26.3
21.6
0.65±0.02 × 29=18.85±0.05
0.65±0.02 × 19=12.35±0.05
15.6
20.3
12±0.05
6±0.05
0.35±0.02
φ
2.36±0.03
φ
2.3
φ
1.57±0.03
Dimensions of mount pad for EV-9200 and that for target
0.026 × 1.142=0.742
0.026 × 0.748=0.486
device (QFP) may be different in some parts. For the
recommended mount pad dimensions for QFP, refer to
"SEMICONDUCTOR DEVICE MOUNTING
TECHNOLOGY MANUAL" (C10535E).
PD784908 Subseries Special Function RegistersU11589J—
78K/IV Series User's Manual – InstructionU10905JU10905E
78K/IV Series Instruction TableU10594J—
78K/IV Series Instruction SetU10595J—
78K/IV Series Application Note Software BasicU10095JU10095E
Document No.
JapaneseEnglish
Documents Related to Development Tools (User's Manual)
Document name
RA78K4 Assembler PackageOperationU11334JU11334E
LanguageU11162JU11162E
RA78K Series Structured Assembler PreprocessorU11743JU11743E
CC78K4 C CompilerOperationU11572JU11572E
LanguageU11571JU11571E
PG-1500 PROM ProgrammerU11940JU11940E
PG-1500 Controller PC-9800 Series (MS-DOSTM) BaseEEU-704EEU-1291
PG-1500 Controller IBM PC Series (PC DOSTM) BaseEEU-5008U10540E
IE-78K4-NSU13356JU13356E
IE-784000-RU12903JU12903E
IE-784908-R-EM1U11876J—
IE-784908-NS-EM1U13743JOn preparation
EP-78064EEU-934EEU-1469
SM78K4 System Simulator Windows BaseReferenceU10093JU10093E
SM78K Series System Simulator
ID78K4-NS Integrated Debugger PC BaseReferenceU12796JU12796E
ID78K4 Integrated Debugger Windows BaseReferenceU10440JU10440E
ID78K4 Integrated Debugger HP-UX, SunOS, NEWS-OS Base ReferenceU11960JU11960E
External Part User Open
Interface Specifications
Document No.
JapaneseEnglish
U10092JU10092E
Caution The above documents may be revised without notice. Use the latest versions when you design
application systems.
58
Data Sheet U11681EJ2V0DS00
Page 59
Documents Related to Software to Be Incorporated into the Product (User's Manual)
µ
PD78P4908
Document name
78K/IV Series Real-Time OSFundamentalU10603JU10603E
InstallationU10604JU10604E
DebuggerU10364J—
OS for 78K/IV Series MX78K4FundamentalU11779J—
Document No.
JapaneseEnglish
Other Documents
Document name
NEC IC Package Manual (CD-ROM)–C13388E
Semiconductor Device Mounting Technology ManualC10535JC10535E
Quality Grades on NEC Semiconductor DeviceC11531JC11531E
NEC Semiconductor Device Reliability/Quality Control SystemC10983JC10983E
Guide to Prevent Damage for Semiconductor Devices by Electrostatic Discharge (ESD)
Guide to Quality Assurance for Semiconductor Devices—MEI-1202
Guide for Products Related to Microcomputer: Other CompaniesU11416J—
Document No.
JapaneseEnglish
C11892JC11892E
Caution The above documents may be revised without notice. Use the latest versions when you design
application systems.
Data Sheet U11681EJ2V0DS00
59
Page 60
[MEMO]
µ
PD78P4908
60
Data Sheet U11681EJ2V0DS00
Page 61
[MEMO]
µ
PD78P4908
Data Sheet U11681EJ2V0DS00
61
Page 62
NOTES FOR CMOS DEVICES
1PRECAUTION AGAINST ESD FOR SEMICONDUCTORS
Note: Strong electric field, when exposed to a MOS device, can cause destruction of
the gate oxide and ultimately degrade the device operation. Steps must be taken
to stop generation of static electricity as much as possible, and quickly dissipate
it once, when it has occurred. Environmental control must be adequate. When
it is dry, humidifier should be used. It is recommended to avoid using insulators
that easily build static electricity. Semiconductor devices must be stored and
transported in an anti-static container, static shielding bag or conductive
material. All test and measurement tools including work bench and floor should
be grounded. The operator should be grounded using wrist strap. Semiconductor devices must not be touched with bare hands. Similar precautions need to
be taken for PW boards with semiconductor devices on it.
µ
PD78P4908
2HANDLING OF UNUSED INPUT PINS FOR CMOS
Note: No connection for CMOS device inputs can be cause of malfunction. If no
connection is provided to the input pins, it is possible that an internal input level
may be generated due to noise, etc., hence causing malfunction. CMOS device
behave differently than Bipolar or NMOS devices. Input levels of CMOS devices
must be fixed high or low by using a pull-up or pull-down circuitry. Each unused
pin should be connected to VDD or GND with a resistor, if it is considered to have
a possibility of being an output pin. All handling related to the unused pins must
be judged device by device and related specifications governing the devices.
3STATUS BEFORE INITIALIZATION OF MOS DEVICES
Note: Power-on does not necessarily define initial status of MOS device. Production
process of MOS does not define the initial operation status of the device.
Immediately after the power source is turned ON, the devices with reset function
have not yet been initialized. Hence, power-on does not guarantee out-pin
levels, I/O settings or contents of registers. Device is not initialized until the
reset signal is received. Reset operation must be executed immediately after
power-on for devices having reset function.
62
Data Sheet U11681EJ2V0DS00
Page 63
µ
PD78P4908
Regional Information
Some information contained in this document may vary from country to country. Before using any NEC
product in your application, please contact the NEC office in your country to obtain a list of authorized
representatives and distributors. They will verify:
• Device availability
• Ordering information
• Product release schedule
• Availability of related technical literature
• Development environment specifications (for example, specifications for third-party tools and
components, host computers, power plugs, AC supply voltages, and so forth)
• Network requirements
In addition, trademarks, registered trademarks, export restrictions, and other legal issues may also vary
from country to country.
Electron Devices Division
Rodovia Presidente Dutra, Km 214
07210-902-Guarulhos-SP Brasil
Tel: 55-11-6465-6810
Fax: 55-11-6465-6829
J99.1
Data Sheet U11681EJ2V0DS00
63
Page 64
µ
PD78P4908
IEBus is a trademark of NEC Corporation.
MS-DOS and Windows are either registered trademarks or trademarks of Microsoft Corporation in the United
States and/or other countries.
PC/AT and PC DOS are trademarks of IBM Corporation.
HP9000 series 700 and HP-UX are trademarks of Hewlett-Packard Company.
SPARCstation is a trademark of SPARC International, Inc.
Solaris and SunOS are trademarks of Sun Microsystems, Inc.
NEWS and NEWS-OS are trademarks of SONY Corporation.
Some related documents may be preliminary versions. Note that, however, what documents are preliminary is not indicated
in this document.
The export of this product from Japan is regulated by the Japanese government. To export this product may be prohibited
without governmental license, the need for which must be judged by the customer. The export or re-export of this product
from a country other than Japan may also be prohibited without a license from that country. Please call an NEC sales
representative.
The application circuits and their parameters are for reference only and are not intended for use in actual design-ins.
No part of this document may be copied or reproduced in any form or by any means without the prior written
consent of NEC Corporation. NEC Corporation assumes no responsibility for any errors which may appear in this
document.
NEC Corporation does not assume any liability for infringement of patents, copyrights or other intellectual
property rights of third parties by or arising from use of a device described herein or any other liability arising
from use of such device. No license, either express, implied or otherwise, is granted under any patents,
copyrights or other intellectual property rights of NEC Corporation or others.
While NEC Corporation has been making continuous effort to enhance the reliability of its semiconductor devices,
the possibility of defects cannot be eliminated entirely. To minimize risks of damage or injury to persons or
property arising from a defect in an NEC semiconductor device, customers must incorporate sufficient safety
measures in its design, such as redundancy, fire-containment, and anti-failure features.
NEC devices are classified into the following three quality grades:
"Standard", "Special", and "Specific". The Specific quality grade applies only to devices developed based on
a customer designated "quality assurance program" for a specific application. The recommended applications
of a device depend on its quality grade, as indicated below. Customers must check the quality grade of each
device before using it in a particular application.
Standard: Computers, office equipment, communications equipment, test and measurement equipment,
audio and visual equipment, home electronic appliances, machine tools, personal electronic
equipment and industrial robots
Special: Transportation equipment (automobiles, trains, ships, etc.), traffic control systems, anti-disaster
systems, anti-crime systems, safety equipment and medical equipment (not specifically designed
for life support)
Specific: Aircrafts, aerospace equipment, submersible repeaters, nuclear reactor control systems, life
support systems or medical equipment for life support, etc.
The quality grade of NEC devices is "Standard" unless otherwise specified in NEC's Data Sheets or Data Books.
If customers intend to use NEC devices for applications other than those specified for Standard quality grade,
they should contact an NEC sales representative in advance.
Anti-radioactive design is not implemented in this product.
M4 96. 5
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