See Table 2-1, Table 2-2 and Table 2-3 for pin information.
3-lead TO-92
(Top view)
3-lead SOT-89 (243AA)
(Top view)
N-Channel Enhancement-Mode Vertical DMOS FET
Features
• Low Threshold (2V Maximum)
• High Input Impedance and High Gain
• Free from Secondary Breakdown
• Low CISS and Fast Switching Speeds
Applications
• Logic-level Interfaces (Ideal for TTL and CMOS)
• Solid State Relays
• Battery-operated Systems
• Photo-voltaic Drives
• Analog Switches
• General Purpose Line Drivers
• Telecommunication Switches
General Description
The TN5325 is a low-threshold, Enhancement-mode
(normally-off) transistor that utilizes a vertical DMOS
structure and a well-proven silicon gate manufacturing
process. This combination produces a device with the
power handling capabilities of bipolar transistors and
the high input impedance and positive temperature
coefficient inherent in MOS devices. Characteristic of
all MOS structures, this device is free from thermal
runaway and thermally induced secondary breakdown.
Microchip’s vertical DMOS FETs are ideally suited to a
e range of switching and amplifying applications
wid
where very low threshold voltage, high breakdown
voltage, high input impedance, low input capacitance
and fast switching speeds are desired.
Drain-to-source Voltage ....................................................................................................................................... BV
Drain-to-gate Voltage .......................................................................................................................................... BV
Gate-to-source Voltage ......................................................................................................................................... ±20V
Operating Ambient Temperature, TA ................................................................................................... –55°C to +150°C
Storage Temperature, T
..................................................................................................................... –55°C to +150°C
S
†Notice: Stresses above those listed under “Absolute Maximum Ratings” may cause permanent damage to the
device. This is a stress rating only, and functional operation of the device at those or any other conditions above those
indicated in the operational sections of this specification is not intended. Exposure to maximum rating conditions for
extended periods may affect device reliability.
DSX
DGX
DC ELECTRICAL CHARACTERISTICS
1
Electrical Specifications: Unless otherwise specified, for all specifications TA = TJ = +25°C.
ParameterSym.Min. Typ. Max.UnitConditions
Drain-to-source Breakdown VoltageBV
Gate Threshold VoltageV
Change in V
with Temperature∆V
GS(th)
Gate Body LeakageI
Zero-gate Voltage Drain CurrentI
On-state Drain CurrentI
Static Drain-to-source On-state
ance
Resist
Change in R
with Temperature∆
DS(ON)
R
RDS(ON)
DSS
GS(th)
GS(th)
GSS
DSS
D(ON)
DS(ON)
250——VVGS = 0V, ID = 100 µA
0.6—2VVGS = VDS, ID = 1 mA
——–4.5 mV/°C VGS = VDS, ID = 1 mA (Note 2)
——100nAVGS = ± 20V, VDS = 0V
——1
——10V
——1mA
0.6——
1.2——V
——8
——7V
VGS = 0V, VDS = 100V
µA
A
Ω
= 0V, VDS = Maximum Rating
GS
= 0.8 Maximum Rating,
V
DS
= 0V, TA = 125°C (Note 2)
V
GS
VGS = 4.5V, VDS = 25V
= 10V, VDS = 25V
GS
VGS = 4.5V, ID = 150 mA
= 10V, ID = 1A
GS
——1%/°CVGS = 4.5V, ID = 150 mA (Note 2)
Note 1: All DC parameters are 100% tested at 25°C unless otherwise stated. Pulse test: 300 µs pulse, 2% duty
cycle.
pecification is obtained by characterization and is not 100% tested.
2: S
DS20005709A-page 2 2017 Microchip Technology Inc.
Page 3
TN5325
AC ELECTRICAL CHARACTERISTICS
2
Electrical Specifications: Unless otherwise specified, for all specifications TA = TJ = +25°C.
ParameterSym.Min. Typ. Max.UnitConditions
Forward TransconductanceG
Input CapacitanceC
Common Source Output CapacitanceC
Reverse Transfer CapacitanceC
Turn-on Delay Timet
d(ON)
Rise Timet
Turn-off Delay Timet
d(OFF)
Fall Timet
FS
ISS
OSS
RSS
150——mmho VDS = 25V, ID = 200 mA
——110
——60
——23
pF
V
= 0V,
GS
= 25V,
V
DS
f = 1 MHz
——20
V
= 25V,
r
f
——15
——25
——25
ns
DD
= 150 mA,
I
D
R
= 25Ω
GEN
DIODE PARAMETER
Diode Forward Voltage DropV
Reverse Recovery Timet
Note 1: All DC p
arameters are 100% tested at 25°C unless otherwise stated. Pulse test: 300 µs pulse, 2% duty
SD
rr
——1.8VVGS = 0V, ISD = 200 mA (Note 1)
—300—nsVGS = 0V, ISD = 200 mA (Note 2)
cycle.
pecification is obtained by characterization and is not 100% tested.
Legend: XX...X Product Code or Customer-specific information
YYear code (last digit of calendar year)
YYYear code (last 2 digits of calendar year)
WWWeek code (week of January 1 is week ‘01’)
NNNAlphanumeric traceability codePb-free JEDEC
®
designator for Matte Tin (Sn)
*This package is Pb-free. The Pb-free JEDEC designator ()
can be found on the outer packaging for this package.
Note:In the event the full Microchip part number cannot be marked on one line, it will
be carried over to the next line, thus limiting the number of available
characters for product code or customer-specific information. Package may or
not include the corporate logo.
3
e
3
e
XXXNNN
N3C232
3-lead SOT-23
Example
3-lead TO-92
YWWNNN
XXXXXX
XXXX
e3
Example
725698
TN5325
N3
e3
3-lead SOT-89 Example
XXXXYWW
NNN
TN3C714
478
4.0
PACKAGING INFORMATION
4.1Package Marking Information
DS20005709A-page 6 2017 Microchip Technology Inc.
JEDEC Registration TO-236, Variation AB, Issue H, Jan. 1999.
† This dimension differs from the JEDEC drawing.
Drawings not to scale.
View B
View A - A
Side View
Top View
View B
Gauge
Plane
Seating
Plane
0.25
L1
L
E1
E
D
3
1
2
e
e1
b
A
A
Seating
Plane
A
A2
A1
TN5325
Note: For the most current package drawings, see the Microchip Packaging Specification at www.microchip.com/packaging.Note: For the most current package drawings, see the Microchip Packaging Specification at www.microchip.com/packaging.
Note: For the most current package drawings, see the Microchip Packaging Specification at www.microchip.com/packaging.
DS20005709A-page 8 2017 Microchip Technology Inc.
Page 9
3-Lead TO-243AA (SOT-89) Package Outline (N8)
SymbolAbb1CDD1EE1ee1HL
Dimensions
(mm)
MIN
1.400.440.360.354.401.622.292.00
†
1.50
BSC
3.00
BSC
3.940.73
†
NOM----------
MAX1.600.560.480.444.601.832.602.294.251.20
JEDEC Registration TO-243, Variation AA, Issue C, July 1986.
† This dimension differs from the JEDEC drawing
Drawings not to scale.
b
b1
D
D1
E
H
E1
C
A
12 3
e
e1
Top View
Side View
L
TN5325
Note: For the most current package drawings, see the Microchip Packaging Specification at www.microchip.com/packaging.Note: For the most current package drawings, see the Microchip Packaging Specification at www.microchip.com/packaging.
Environmental: G= Lead (Pb)-free/RoHS-compliant Package
Media Types: (blank)= 3000/Reel for a K1 Package
= 1000/Bag for an N3 Package
= 2000/Reel for an N8 Package
P002= 2000/Reel for an N3 Package
XX
Package
-
X - X
Environmental
Media Type
Options
PRODUCT IDENTIFICATION SYSTEM
To order or obtain information, e.g., on pricing or delivery, contact your local Microchip representative or sales office.
DS20005709A-page 12 2017 Microchip Technology Inc.
Page 13
Note the following details of the code protection feature on Microchip devices:
YSTEM
CERTIFIEDBYDNV
== ISO/TS16949==
•Microchip products meet the specification contained in their particular Microchip Data Sheet.
•Microchip believes that its family of products is one of the most secure families of its kind on the market today, when used in the
intended manner and under normal conditions.
•There are dishonest and possibly illegal methods used to breach the code protection feature. All of these methods, to our
knowledge, require using the Microchip products in a manner outside the operating specifications contained in Microchip’s Data
Sheets. Most likely, the person doing so is engaged in theft of intellectual property.
•Microchip is willing to work with the customer who is concerned about the integrity of their code.
•Neither Microchip nor any other semiconductor manufacturer can guarantee the security of their code. Code protection does not
mean that we are guaranteeing the product as “unbreakable.”
Code protection is constantly evolving. We at Microchip are committed to continuously improving the code protection features of our
products. Attempts to break Microchip’s code protection feature may be a violation of the Digital Millennium Copyright Act. If such acts
allow unauthorized access to your software or other copyrighted work, you may have a right to sue for relief under that Act.
Information contained in this publication regarding device
applications and the like is provided only for your convenience
and may be superseded by updates. It is your responsibility to
ensure that your application meets with your specifications.
MICROCHIP MAKES NO REPRESENTATIONS OR
WARRANTIES OF ANY KIND WHETHER EXPRESS OR
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OTHERWISE, RELATED TO THE INFORMATION,
INCLUDING BUT NOT LIMITED TO ITS CONDITION,
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FITNESS FOR PURPOSE. Microchip disclaims all liability
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Microchip received ISO/TS-16949:2009 certification for its worldwide
headquarters, design and wafer fabrication facilities in Chandler and
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are for its PIC
devices, Serial EEPROMs, microperipherals, nonvolatile memory and
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and manufacture of development systems is ISO 9001:2000 certified.
®
MCUs and dsPIC® DSCs, KEELOQ
®
code hopping
QUALITYMANAGEMENTS
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AVR logo, AVR Freaks, BeaconThings, BitCloud, CryptoMemory,
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