Improved Direct Replacement for
UCN4810A and TL4810A
description
The TL4810B and TL4810BI are monolithic
BIDFET† integrated circuits designed to drive a
dot matrix or segmented vacuum fluorescent
display (VFD). These devices feature a serial data
output to cascade additional devices for large
display arrays.
A 10-bit data word is serially loaded into the shift
register on the positive-going transitions of the
clock. Parallel data is transferred to the output
buffers through a 10-bit D-type latch while LA TCH
ENABLE is high and is latched when LATCH
ENABLE is low. When BLANKING is high, all
outputs are low.
Outputs are totem-pole structures formed by npn
emitter-follower and double-diffused MOS
(DMOS) transistors with output voltage ratings of
70 V and 40-mA source-current capability. All
inputs are compatible with CMOS and TTL levels,
but each requires the addition of a pullup resistor
to V
The TL4810B is characterized for operation from
0°C to 70°C. The TL4810BI is characterized for
operation from –40°C to 85°C.
when driven by TTL logic.
CC1
Q8
Q7
Q6
CLOCK
GND
VCC1
LATCH ENABLE (STROBE)
Q5
Q4
Q8
Q7
Q6
CLOCK
GND
NC
V
CC1
LATCH ENABLE (STROBE)
Q5
Q4
NC–No internal connection
N PACKAGE
(TOP VIEW)
18
1
17
2
16
3
15
4
14
5
13
6
12
7
11
8
10
9
DW PACKAGE
(TOP VIEW)
20
1
19
2
18
3
17
4
16
5
15
6
14
7
13
8
12
9
11
10
Q9
Q10
SERIAL DATA OUT
V
CC2
DATA IN
BLANKING
Q1
Q2
Q3
Q9
Q10
NC
SERIAL DATA OUT
V
CC2
DATA IN
BLANKING
Q1
Q2
Q3
†BIDFET – Bipolar, double-diffused, N-channel and P-channel MOS transistors on same chip. This is a patented process.
PRODUCTION DATA information is current as of publication date.
Products conform to specifications per the terms of Texas Instruments
standard warranty. Production processing does not necessarily include
testing of all parameters.
POST OFFICE BOX 655303 • DALLAS, TEXAS 75265
Copyright 1993, Texas Instruments Incorporated
1
Page 2
TL4810B, TL4810BI
SHIFT REGISTERS
LATCHES
OUTPUTS
VACUUM FLUORESCENT DISPLAY DRIVERS
SLDS006C – DECEMBER 1984 – REVISED MA Y 1993
logic symbol
LATCH
ENABLE
BLANKING
CLOCK
DATA IN
†
This symbol is in accordance with ANSI/IEEE Std 91-1984
and IEC Publication 617-12.
Pin numbers shown are for the N package.
†
7
C2
13
4
14
EN3
SRG10
C1/→
1D2D3
CMOS/VAC
FLUOR DISP
2D3
2D3
2D3
2D3
2D3
2D3
2D3
2D3
2D3
12
11
10
9
8
3
2
1
18
17
16
Q1
Q2
Q3
Q4
Q5
Q6
Q7
Q8
Q9
Q10
SERIAL
DATA OUT
logic diagram (positive logic)
BLANKING
LATCH
ENABLE
DATA IN
CLOCK
Shift
Registers
1D
C1
1D
C1
1D
C1
1D
C1
R1
R2
R9
R10
Latches
C2
2D
C2
2D
C2
2D
C2
2D
LC1
LC2
LC9
LC10
Q1
Q2
6 Stages
(Q3 thru Q8)
Not Shown
Q9
Q10
SERIAL
DATA OUT
FUNCTION TABLE
CONTROL INPUTS
FUNCTION
Load
Latch
Blank
H = high level, L = low level, X = irrelevant, ↑ = low-to-high-level transition.
‡
Register R10 takes on the state of R9, R9 takes on the state of R8...R2 takes on the state of R1, and R1 takes on the state of the data input.
§
New data enter the latches while LATCH ENABLE is high. These data are stored while LATCH ENABLE is low .
CLOCK
No↑
LATCH
ENABLE
↑
X
X
X
X
X
X
L
H
X
X
BLANKING
X
X
X
X
H
L
R1 THRU R10
Load and shift
No change
As determined above
As determined above
‡
LC1 THRU LC10
‡
Determined by
LATCH ENABLE
Stored data
New data
Determined by
LATCH ENABLE
SERIAL
R10Determined by BLANKING
§
R10Determined by BLANKING
R10
§
Q1 THRU Q10
All L
LC1 thru LC10, respectively
2
POST OFFICE BOX 655303 • DALLAS, TEXAS 75265
Page 3
typical operating sequence
CLOCK
TL4810B, TL4810BI
VACUUM FLUORESCENT DISPLAY DRIVERS
SLDS006C – DECEMBER 1984 – REVISED MA Y 1993
DATA IN
SR
Contents
LATCH
ENABLE
Latch
Contents
BLANKING
Q Outputs
Previously Stored DataNew Data Valid
ValidIrrelevant
Invalid
schematics of inputs and outputs
EQUIVALENT OF EACH INPUTTYPICAL OF ALL OUTPUTS
V
CC1
Valid
Valid
V
(serial outputs)
CC1
V
(Q outputs)
CC2
Input
GND
Output
100
kΩ
GND
POST OFFICE BOX 655303 • DALLAS, TEXAS 75265
3
Page 4
TL4810B, TL4810BI
PARAMETER
UNIT
High-level input voltage, V
V
VACUUM FLUORESCENT DISPLAY DRIVERS
SLDS006C – DECEMBER 1984 – REVISED MA Y 1993
absolute maximum ratings over operating free-air temperature range (unless otherwise noted)
Lead temperature 1,6 mm (1/16 inch) from case for 10 seconds 260°C. . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .
NOTE 1: Voltage values are with respect to GND.
DISSIPATION RATING TABLE
PACKAGE
DW1125 mW9.0 mW/°C720 mW585 mW
N1150 mW9.2 mW/°C736 mW598 mW
TA ≤ 25°C
POWER RATING
DERATING FACTOR
ABOVE TA = 25°C
TA = 70°C
POWER RATING
TA = 85°C
POWER RATING
recommended operating conditions
TL4810BTL4810BI
MINMAXMINMAX
Supply voltage, V
Supply voltage, V
Low-level input voltage, V
Continuous high-level output current, I
Operating free-air temperature, T
†
The algebraic convention, in which the less positive (more negative) limit is designated as minimum, is used in this data sheet for logic voltages
only.
CC1
CC2
V
= 5 V3.55.33.55.3
p
IH
IL
CC1
V
= 15 V13.515.313.515.3
CC1
OH
A
4.75 15.754.75 15.75V
560560V
†
–0.3
0.8 –0.3
–25–25mA
070–4085°C
†
0.8V
4
POST OFFICE BOX 655303 • DALLAS, TEXAS 75265
Page 5
PARAMETER
TEST CONDITIONS
†
UNIT
High level
Low level
I
mA
,
I
Supply current from V
A
,
UNIT
tpdPropagation delay time, LATCH ENABLE to Q outputs
s
TL4810B, TL4810BI
VACUUM FLUORESCENT DISPLAY DRIVERS
SLDS006C – DECEMBER 1984 – REVISED MA Y 1993
electrical characteristics over recommended operating free-air temperature range,
= 5 V to 15 V, V
V
CC1
V
OH
V
OL
OL
I
O(off)
I
H
CC1
I
CC2
†
For conditions shown as MIN or MAX, use the appropriate value specified under recommended operating conditions.
‡
All typical values are at TA = 25°C, except for IO.
output
voltage
output
voltage
Low-level Q output current
(pulldown current)
Off-state output current
High-level input currentVI = V
pp
Supply current from V
Q outputsIOH = –25 mA57.55857.558
SERIAL
DATA OUT
Q outputsIOL = 1 µA,BLANKING at V
SERIAL
DATA OUT
= 60 V, GND = 0 (unless otherwise noted)
CC2
TL4810BTL4810BI
MIN TYP‡MAXMIN TYP‡MAX
V
= 5 V,IOH = –100 µA44.544.5
CC1
V
= 15 V,IOH = –100 µA1414.71414.7
CC1
CC1
V
= 5 V,IOL = 100 µA0.050.10.050.1
CC1
V
= 15 V,IOL = 100 µA0.020.10.020.1
CC1
VO = 60 V,
TA = MIN to 70°C
VO = 60 V,
TA = 85°C
VO = 0,
TA = MAX
CC1
All inputs at 0 V,
One Q output high
CC1
All inputs at 0 V,
All outputs low
All outputs low0.510.51
All outputs high,
CC2
All outputs high,TA = –40°C5
BLANKING at V
BLANKING at V
BLANKING at V
V
= 5 V10501050
CC1
V
= 15 V1010010100
CC1
V
= 5 V10501050
CC1
V
= 15 V1010010100
CC1
TA = 0°C to MAX2.742.74
CC1
CC1
CC1
,
,
,
0.510.51
2.53.72.53.7
–1–15–1–15µA
30503050µA
2
V
V
µ
mA
timing requirements over recommended operating free-air temperature range
V
= 5 VV
CC1
MINMAXMINMAX
t
w(CKH)
t
w(LEH)
t
su(D)
t
h(D)
t
d(CKH-LEH)
Pulse duration, CLOCK high25050ns
Pulse duration, LATCH ENABLE high25050ns
Setup time, DA TA IN before CLOCK↑
Hold time, DATA IN after CLOCK↑
Delay time, CLOCK↑ to LATCH ENABLE high
IOL = 1 µA
N = Number of Outputs High
All Other Outputs Low
40
25
TA – Free-Air Temperature – °C
vs
Figure 4
N = 1 to 4
N = 5
N = 6
N = 7
N = 8
N = 9
N = 10
95857565554535
100
6
POST OFFICE BOX 655303 • DALLAS, TEXAS 75265
Page 7
IMPORTANT NOTICE
T exas Instruments and its subsidiaries (TI) reserve the right to make changes to their products or to discontinue
any product or service without notice, and advise customers to obtain the latest version of relevant information
to verify, before placing orders, that information being relied on is current and complete. All products are sold
subject to the terms and conditions of sale supplied at the time of order acknowledgement, including those
pertaining to warranty, patent infringement, and limitation of liability.
TI warrants performance of its semiconductor products to the specifications applicable at the time of sale in
accordance with TI’s standard warranty. Testing and other quality control techniques are utilized to the extent
TI deems necessary to support this warranty . Specific testing of all parameters of each device is not necessarily
performed, except those mandated by government requirements.
CERTAIN APPLICA TIONS USING SEMICONDUCT OR PRODUCTS MAY INVOLVE POTENTIAL RISKS OF
DEATH, PERSONAL INJURY, OR SEVERE PROPERTY OR ENVIRONMENTAL DAMAGE (“CRITICAL
APPLICATIONS”). TI SEMICONDUCTOR PRODUCTS ARE NOT DESIGNED, AUTHORIZED, OR
WARRANTED TO BE SUITABLE FOR USE IN LIFE-SUPPORT DEVICES OR SYSTEMS OR OTHER
CRITICAL APPLICA TIONS. INCLUSION OF TI PRODUCTS IN SUCH APPLICATIONS IS UNDERST OOD TO
BE FULLY AT THE CUSTOMER’S RISK.
In order to minimize risks associated with the customer’s applications, adequate design and operating
safeguards must be provided by the customer to minimize inherent or procedural hazards.
TI assumes no liability for applications assistance or customer product design. TI does not warrant or represent
that any license, either express or implied, is granted under any patent right, copyright, mask work right, or other
intellectual property right of TI covering or relating to any combination, machine, or process in which such
semiconductor products or services might be or are used. TI’s publication of information regarding any third
party’s products or services does not constitute TI’s approval, warranty or endorsement thereof.
Copyright 1998, Texas Instruments Incorporated
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