Terminals T and R correspond to the
alternative line designators of A and B
T(A)R(B)
MDXXBG
SD4XAA
●
description
Low Differential Capacitance . . . 39 pF max.
These devices are designed to limit overvoltages on the telephone line. Overvoltages are normally caused by
a.c. power system or lightning flash disturbances whic h ar e ind uc ed or co ndu cte d on to the telephone li ne. A
single device provides 2-point protection and is typically u sed for the protec tion of 2 -wire tel ecommunicatio n
equipment (e.g. between the Ri ng and Tip wires for telephones a nd modems ). Combinati ons of devices ca n
be used for multi-point protection (e.g. 3-point protection between Ring, Tip and Ground).
The protector consists of a symmetrical voltage-triggered bidirectional thyristor. Overvoltages are initially
clipped by breakdown clamping until the voltage rises to the breakover level, which causes the device to
crowbar into a low-voltage on state. This low-voltage on state causes the current resulting from the
overvoltage to be safely diverted through the device. The high crowbar holding cu rrent prevents d.c. latchup
as the diverted current subsides.
This TISP4xxxH4BJ range consists of six voltage variants to meet various maxi mum system voltage levels
(135 V to 270 V). They are guaranteed to voltage li mit and withs tand the li sted inter nat ional li ghtning sur ges
in both polar ities. These high (H) current p rotection d evices are in a plastic package SMBJ (JEDEC DO214AA with J-bend l eads) and supplied i n embossed carrier reel pack. For alternative voltage and holdin g
current values, consult the factory. For lower rated impulse curren ts in the SMB package, the 50 A 10/1000
TISP4xxxM3BJ series is available.
PRODUCT INFORMATION
Information is current as of publication date. Produc ts conform to specifications in accordance
with the terms of Power Innovations standard warranty. Production processing does not
necessarily include testing of all parameters.
Non-repetitive peak on-state pulse current (see Notes 2, 3 and 4)
2/10 µs (GR-1089-CORE, 2/10 µs voltage wave shape)500
8/20 µs (IEC 61000-4-5, 1.2/50 µs voltage, 8/20 current combination wave generator)300
10/160 µs (FCC Part 68, 10/160 µs voltage wave shape)250
5/200 µs (VDE 0433, 10/700 µs voltage wave shape)220
0.2/310 µs (I3124, 0.5/700 µs voltage wave shape)200
5/310 µs (ITU-T K20/21, 10/700 µs voltage wave shape)200
5/310 µs (FTZ R12, 10/700 µs voltage wave shape)200
10/560 µs (FCC Part 68, 10/560 µs voltage wave shape)160
10/1000 µs (GR-1089-CORE, 10/1000 µs voltage wave shape)100
Non-repetitive peak on-state current (see Notes 2, 3 and 5)
20 ms (50 Hz) full sine wave
16.7 ms (60 Hz) full sine wave
1000 s 50 Hz/60 Hz a.c.
Initial rate of rise of on-state current, Exponential current ramp, Maximum ramp value < 200 Adi
Junction temperatureT
Storage temperature rangeT
= 25°C (unless otherwise noted)
A
RATINGSYMBOLVALUEUNIT
‘4165
‘4180
‘4200
‘4265
‘4300
‘4360
V
DRM
I
TSP
I
TSM
/dt400A/µs
T
J
stg
±135
±145
±155
±200
±230
±270
55
60
2.1
-40 to +150°C
-65 to +150°C
V
A
A
NOTES: 1. See Applications Information and Figure 10 for voltage values at lower temperatures.
2. Initially the TISP4xxxH4BJ must be in thermal equilibrium with T
3. The surge may be repeated after the TISP4xxxH4BJ returns to its initial conditions.
4. See Applications Information and Figure 11 for current ratings at other temperatures.
5. EIA/JESD51-2 environment and EIA/JESD51-3 PCB with standard footprint dimensions connected with 5 A rated printed wiring
track widths. See Figure 8 for the current ratings at other durations. Derate current v alues at -0.61%/°C for ambient temperatures
above 25 °C
These devices are two terminal overvoltage prote ctors. They may be used either singly to limit the voltage
between two conductors (Figure 12) or in multiples to limit the voltage at several points in a circuit (Figure 13).
Th1
Figure 12. TWO POINT PROTECTIONFigure 13. MULTI-POINT PROTECTION
In Figure 12, protector Th1 limits the maximum voltage between the two conductors to ±V
configuration is nor mall y used to protect ci rcuits withou t a ground reference, such as modems. In Figure 1 3,
protectors Th2 and Th3 lim it the maximum voltage be tween each cond uctor and ground to the ±V
individual protector. Protector Th1 limits the maximum voltage between the two conductors to its ±V
value. If the equipment being protected has all its vulnerable components connected between the conductors
and ground, then protector Th1 is not required.
impulse testing
To verify the wit hstand capabil ity and safety of the equipment , standards require that the equipm ent is test ed
with various impulse wave forms. The table below shows some common values.
PEAK VOLTAGE
STANDARD
GR-1089-CORE
FCC Part 68
(March 1998)
I312415000.5/70037.50.2/3102000
ITU-T K20/K21
† FCC Part 68 terminology for the waveforms produced by the ITU-T recommendation K21 10/700 impulse generator
If the impulse generator current exceeds the protectors current rating then a series resistance can be used to
reduce the curren t to the prot ectors rat ed value and so prevent possible failure. The required value of se rie s
resistance for a given waveform is given by the following calculations. First, the minimum total circuit
impedance is found by dividing the impulse generators peak voltage by the protectors rated current. The
impulse generators fictive impedance (generators pea k voltage divided by peak shor t circuit current) is then
subtracted from the m inimum total circ uit impe dance to give the requi red value of s eri es res istance. In so me
cases the equipme nt will require verifi cation over a temperature range. By usin g the rated waveform values
from Figure 11, the appropriate series resistor value can be calculated for ambient temperatures in the range
of -40 °C to 85 °C.
The protector can withstan d currents applied for times not exceeding thos e shown in Figure 8 . Currents tha t
exceed these times must be terminated or reduced to avoid protector failure. Fuses, PTC (Positive
Temperature Coefficient) resistors and fusible resistors are overcurrent protection devices which can be used
to reduce the current fl ow. Protective fuses may range from a few hundred milliamperes to o ne ampere. In
some cases it may be necessa ry to add some extra seri es resistance to prevent the fuse opening dur ing
impulse testing. The current versus time cha racteristic of the overcurrent protector must be below the line
shown in Figure 8. In some ca ses there may be a further time limit imposed by the test standard ( e.g. UL
1459 wiring simulator failure).
capacitance
The protector characteristic off-state capacitance values are given for d.c. bias voltage, VD, values of 0, -1 V,
-2 V and - 50 V. Where possible values are also given for -100 V. Values for other voltages may be calculate d
by multiplying the V
essentially independent of frequency. Above 10 MHz the effective capacitance is strongly dependent on
connection inducta nce. In many applications, such as Figur e 15 and Figure 17, the typic al conductor bias
voltages will be about -2 V a nd -5 0 V. Figure 7 shows the di fferential (lin e u nbalance) capacitanc e c aus ed by
biasing one protector at -2 V and the other at -50 V.
= 0 ca pacit ance value by the factor given in Figure 6. Up to 10 MHz the capac itance is
D
normal system voltage levels
The protector should not clip or limit the voltages that occur in normal system operation. For unusual
conditions, such as r inging without the line connected , some degree of clipping is per missible. Under this
condition about 10 V of clipping is normally possible without activating the ring trip circuit.
Figure 10 allows the calculation of the protector V
value should not be less than the maximum nor mal system voltages. The TISP4265H4BJ, with a V
200 V, can be used for the protection of ring generators producing 100 V rms of ring on a battery voltage of
-58 V (Th2 and Th3 in Figure 17). The peak ring voltage will be 58 + 1.414*100 = 199.4 V. Howe v er, this is the
open circuit voltage and the connec tion of the line and its equipment will reduce the pe ak voltage. In the
extreme case of an unconnected line, clipping the peak voltage to 190 V should not activate the ring trip. This
level of clipping would occur at the temperature when the V
value. Figure 10 shows that this condition will occur at an ambient temperature of -22 °C. In this example, the
TISP4265H4BJ will allow normal equipment operation provided that the minimum expected ambient
temperature does not fall below -22 °C.
value at temperatures below 25 °C. The calculated
DRM
has reduced to 190/2 00 = 0.95 of its 25 °C
DRM
JESD51 thermal measurement method
To standardise thermal measurements, the EIA (Electronic Industries Alliance) has created the JESD51
standard. Part 2 of the standard (JESD51-2, 1995) describes the test environment. This is a 0.0283 m
cube which contains the test PCB (Printed Ci rcuit Board) horizontally mou nted at the centre. Part 3 of the
standard (JESD51-3, 199 6) defines two test PCB s for surface mount components; one for packages smaller
than 27 mm on a side and the o ther for packages up to 48 mm. The SMBJ me asureme nts used th e small er
76.2 mm x 114.3 mm (3.0 “ x 4.5 “) PCB. The JESD51-3 PCBs are d esigned to have low effective thermal
conductivity (high th er mal resi stance) and represen t a worse case con dition . The PCBs us ed in the ma jority
of applications will a chieve lower values of thermal resis tance and s o can dis sipate higher power levels than
indicated by the JESD51 values.
SMBJ (DO-214AA)
plastic surface mount diode package
This surface mount package consist s of a circ uit moun ted on a lea d frame and en caps ulated within a pl astic
compound. The compound will withstand soldering temperature with no deformation, and circuit performance
characteristics will remain stable when operated in high humidity conditions. Leads require no additional
cleaning or processing when used in soldered assembly.
Devices are shipped in on e of the carriers be low. Unless a specific method of shipment is s pecified by the
customer, devices will be shipped in the most practical carrier. For production quantities the carr ier will be
embossed tape reel pack. Evaluation quantities may be shipped in bulk pack or embossed tape.
NOTES: A. The clearance between the component and the cavity must be within 0,05 mm MIN. to 0,65 mm MAX. so that the
component cannot rotate more than 20° within the determined cavity.
B. Taped devices are supplied on a reel of the following dimensions:-
R e el di am et e r: 330 ±3,0 mm
Reel hub diameter 75 mm MIN.
Reel axial hole: 13,0 ±0,5 mm
Power Innovations Limited (PI) re se rves the r ig ht t o make chan g es t o it s pr od uc ts o r t o di sc ont inu e any s em ic o nduc t or p r o duct
or service without notice, and advises its customers to verify, before placing orders, that the information being relied on is
current.
PI warrants performance of its semiconductor products to the specifications applicable at the time of sale in accordance with
PI's standard w arr anty. Testing and other quality cont rol tec hn iqu es are uti li z ed to the exten t PI deems necessary to support this
warranty. Specific testing of all parameters of each device is not necessarily performed, except those mandated by government
requirements.
PI assumes no liability for applications assistance, customer product design, software performance, or infringement of patents
or services described herein. Nor is any license, either express or implied, granted under any patent right, copyright, design
right, or other intellectual property right of PI covering or relating to any combination, machine, or process in which such
semiconductor products or services might be or are used.
PI SEMICONDUCTOR PRODUCTS ARE NOT DESIGNED, INTENDED, AUTHORISED, OR WARRANTED TO BE SUITABLE
FOR USE IN LIFE-SUPPORT APPLICATIONS, DEVICES OR SYSTEMS.