Objective specification
Supersedes data of 1998 Apr 15
File under Integrated Circuits, IC02
1999 Sep 16
Page 2
Philips SemiconductorsObjective specification
Dual 8-bit, 100 Msps A/D converter with
TDA8798
DPGA
FEATURES
• Dual 8-bit Analog-to-Digital Converter (ADC)
• Sampling rate up to 100 million samples per
second (Msps)
• Dual 34 dBV 6-bit Digitally Programmable Gain
Amplifier (DPGA) with optional power-off
• Optional external equalization filter with capacitive
coupling between DPGA and ADC
• Serial Interface (SI) for DPGA gain control using either
parallel load mode or count-up/count-down mode
• 3.3 V TTL/CMOS compatible I/O
• Differential or single-ended TTL/CMOS clock interface
• AC or DC coupling for DPGA inputs.
QUICK REFERENCE DATA
SYMBOLPARAMETERCONDITIONSMIN.TYP.MAX.UNIT
V
V
V
I
DDA
DDA
DDD
DDO
analog supply voltage3.153.33.45V
digital supply voltage3.03.33.6V
output stage supply voltage2.73.33.6V
analog supply currentwith DPGAEN LOW−106−mA
with DPGAEN HIGH−tbf−mA
I
DDD
I
DDO
digital supply current−30−mA
output stage supply current−3−mA
INLDC integral non-linearityfrom IC analog input to digital
output; ramp input;
f
CLK
DNLDC differential non-linearityfrom IC analog input to digital
output; ramp input;
f
CLK
V
n(o)(rms)
output referred noise (RMS value)DPGA at G
noise bandwidth = 15 MHz
B
(−3dB)(ADC)
B
(−3dB)(DPGA)
f
(sample)(max)
P
tot
ADC −3 dB analogue bandwidthat V
DPGA −3 dB bandwidthat V
maximum sampling rate100−−Msps
total power dissipationwith DPGAEN LOW−460500mW
with DPGAEN HIGH−tbftbfmW
APPLICATIONS
• High-dynamic range acquisition front-ends
• Digital data storage read channels.
GENERAL DESCRIPTION
The TDA8798 is a dual 8-bit ADC with DPGA.
The 100 Mspsmaximumsamplingrateand34 dBVDPGA
gain range optimizes the ADC for high dynamic range
applications.
A733channel 1 output bit 7 (MSB)
A634channel 1 output bit 6
A535channel 1 output bit 5
A436channel 1 output bit 4
A337channel 1 output bit 3
A238channel 1 output bit 2
A139channel 1 output bit 1
A040channel 1 output bit 0 (LSB)
B041channel 2 output bit 0 (LSB)
B142channel 2 output bit 1
B243channel 2 output bit 2
B344channel 2 output bit 3
B445channel 2 output bit 4
B546channel 2 output bit 5
B647channel 2 output bit 6
B748channel 2 output bit 7 (MSB)
V
SSO2
V
DDO2
OE51digital output enable (active LOW)
SR52digital output bit slew-rate control
DPGAEN53DPGA enable (active LOW)
TEST54test input (to be grounded)
TE55track-and-hold enable (active LOW)
V
DDD2
V
SSD2
19buffer1 common mode reference output
20ADC1 analog supply voltage 3
21ADC1 analog ground 3
24digital ground 1
25digital supply voltage 1
31output stage supply voltage 1
32output stage ground 1
49output stage ground 2
50output stage supply voltage 2
56digital supply voltage 2
57digital ground 2
TDA8798
1999 Sep 165
Page 6
Philips SemiconductorsObjective specification
Dual 8-bit, 100 Msps A/D converter with
DPGA
SYMBOLPINDESCRIPTION
CLK258ADC2 non-inverting clock input
CLK2N59ADC2 inverting clock input
V
The TDA8798 comprises two independent fully differential
signalchainseachhavingaDPGAandahigh-speed ADC.
A serial interface allows the gain of each DPGA to be
controlledindependently. To improve signal conditions, an
AC-coupled external filter can be connected between a
DPGAandADC.TheTDA8798canbeused as a dual 8-bit
ADC without DPGA functionality, using less power.
Digitally Programmable Gain Amplifier (DPGA)
The gain of the differential DPGA is programmable from
0 to 34 dBV in 63 equal steps by a 6-bit word output in
parallel from a gain control register in the SI. For all gain
settings, the DPGA signal bandwidth exceeds 30 MHz.
The settling time between gain changes can be adjusted
by an external decoupling capacitor connected to
DPGAC1 (pin 14) and/or DPGAC2 (pin 3). The analog
input signals can be either AC or DC coupled. When used
only as a dual 8-bit ADC, both DPGAs can be disabled to
reduce power consumption.
Analog-to-Digital Converter (ADC)
The 8-bit ADC converts the differential analog input signal
into a binary output format at a maximum conversion rate
of 100 Msps. All digital input and output signals are
TTL/CMOS compatible.
The ADC clock signal can be from either a differential or a
single-ended source; when single-ended, the unused
clockinputpinshouldbe decoupled externally. The analog
input to the ADC is AC coupled.
TDA8798
Serial Interface (SI)
The SI allows the gain of each DPGA to be controlled
independently using either a parallel load mode or a
count-up/count-down mode. The gain control mode is
selected by the state of SMODE. The operation of DPGA
gain control is shown in Timing diagram, (see Fig.4).
Parallel load mode
This mode loads gain control data serially into a decoder
in the SI. Each of the six bits are loaded on the rising edge
ofSCLK.After the load has completed, SEN goes inactive,
loading the data in parallel to a gain control register in the
SI, changing the gain of the DPGA.
Count-up/count-down mode
Count-up/count-down mode is selected when SMODE is
in the opposite state to parallel load mode. This mode
either increments or decrements the SI gain control
register in one-bit steps when SEN and SCLK are both
active; the state of SDATA determines the count direction
(up or down). This allows the gain of the DPGA to be
changed asynchronously and intermittently.
ADC digital outputs
Digital noise on the internal supply lines increases when
the V
between channels. This effect can be reduced by making
SR (pin 52) HIGH, changing the slew-rate of the ADC
digital outputs.
voltage increases, affecting the crosstalk
DDO
Whenused only as a dualADC, the ADC can beexternally
biased by regulator output V
V
(pin 62) using series resistors of, for example, 50 Ω,
oref2
(pin 19) and/or
oref1
connected to the ADCbuffer inputs providing a lower input
impedance. This requires V
oref1
and/or V
oref2
to be
decoupled to ground by a 10 nF capacitor.
V
(pin 13) and/or V
ref1
(pin 4) provide a voltage
ref2
corresponding to the bias of the ADC which can be used
as a reference output to an external control circuit.
Alternatively, an external control voltage can be applied to
these pins to adjust the full-scale range of the ADC.
1999 Sep 167
Page 8
Philips SemiconductorsObjective specification
Dual 8-bit, 100 Msps A/D converter with
DPGA
Table 1 Serial interface truth table; see notes 1 and 2
SMODESCLKSEN1SEN2SDATAACTION
011UWAIT
X,
011DiSISR: SISR ← Di
0011SISR: SISR ← 1
0010SISR: SISR ← 0
0101SISR: SISR ← 1
0100SISR: SISR ← 0
0001SISR: SISR ← 1
0000SISR: SISR ← 0
1UWAIT
X,X,X,
TDA8798
GCR1: GCR1 + 1
GCR1: GCR1 − 1
GCR2: GCR2 + 1
GCR2: GCR2 − 1
GCR1: GCR1 + 1
GCR2: GCR2 + 1
GCR1: GCR1 − 1
GCR2: GCR2 − 1
1DiSISR: SISR ← Di
X,X,
1UGCR1: SISR
X,X,
1UGCR2: SISR
X,X,
1UGCR1: SISR
X,
Notes
1. ‘← Di’: shifting LSB and loading new LSB with value Di.
2. In count-up/count-down mode, thegain control register cannotbe incremented above themaximum gain value of 63,
or decremented below the minimum gain value of 0.
1999 Sep 168
GCR2: SISR
Page 9
Philips SemiconductorsObjective specification
Dual 8-bit, 100 Msps A/D converter with
DPGA
Table 2 Abbreviations
SYMBOLDESCRIPTION
GCR1DPGA1 gain control register value
GCR2DPGA2 gain control register value
SISRSerial interface shift register value
Xcan be either logic state 0 or logic
state 1
rising edge
falling edge
Ucan be either undefined logic stateX
rising edge or falling edge
DiData input
Table 3
TE truth table
TEADC TRACK-AND-HOLD
0track-and-hold enabled
1track enabled
Table 4 SR truth table
SRADC DIGITAL OUTPUT SLEW RATE
0maximum
1minimum
Table 5 DPGAEN truth table
DPGAENDPGA FUNCTIONALITY
0enabled
1disabled
Table 6 Gain Control
GAIN CONTROL
REGISTER VALUE
GAIN (dBV)
0000000.00
0000010.54
0000101.08
......
......
......
11111033.46
11111134.00
TDA8798
LIMITING VALUES
In accordance with the Absolute Maximum Rating System (IEC 134).
SYMBOLPARAMETERCONDITIONSMIN.MAX.UNIT
V
V
V
∆V
V
DDA
DDD
DDO
DDX
i(VIN)
analog supply voltage−0.3+7.0V
digital supply voltage−0.3+7.0V
output stage supply voltage−0.3+7.0V
supply voltage differences between
Inputs and outputs are protected against electrostatic discharges in normal handling. However, to be totally safe, it is
desirable to take normal precautions appropriate to handling integrated circuits.
THERMAL CHARACTERISTICS
SYMBOLPARAMETERCONDITIONSVALUEUNIT
R
th(j-a)
CHARACTERISTICS
V
DDA=V5
to 3.6 V; V
V
= −0.25 to +0.25 V; V
DDD
values measured at V
SYMBOLPARAMETERCONDITIONSMIN.TYP.MAX.UNIT
Supplies
V
DDA
V
DDD
V
DDO
I
DDA
I
DDD
I
DDO
Digital programmable gain amplifiers
thermal resistance from junction to ambientin free air68K/W
(or V12 or V20 or V61) to V8 (or V9 or V21 or V60) = 3.15 to 3.45 V; V
DDO=V31
(or V50) to V32 (or V49) = 2.7 to 3.6 V; V
to V
DDD
DDA=VDDD=VDDO
= −0.25 to +0.90 V; V
DDO
= 3.3 V and T
amb
, V
SSD
to V
and V
= −0.25 to +0.75 V; T
DDO
SSA
DDA
=25°C; unless otherwise specified.
DDD=V25
SSO
(or V56) to V24 (or V57) = 3.0
shorted together; V
=0to70°C; typical
amb
DDA
analog supply voltage3.153.33.45V
digital supply voltage3.03.33.6V
output stage supply voltage2.73.33.6V
analog supply currentDPGAEN LOW−106−mA
DPGAEN HIGH−tbf−mA
digital supply current−30−mA
output stage supply currentf
= 100 MHz;
CLK
−3−mA
ramp input
to
ANALOG INPUTS (VIN1, VIN1N, VIN2 AND VIN2N)
V
i(dif)(max)(p-p)
V
i(cm)(DPGA)
I
i(DPGA)
R
i(DPGA)
C
i(DPGA)
maximum differential input
voltage (peak-to-peak value)
common mode input voltagetbf2.8tbfV
input currentat V
input resistance1−−kΩ
input capacitance−− 5pF
at G
at G
(min)
(max)
i(cm)(DPGA)
ANALOG OUTPUTS (DPGA1, DPGA1N, DPGA2 AND DPGA2N)
V
o(dif)(max)(p-p)
V
o(cm)(DPGA)
R
o(DPGA)
C
o(DPGA)
maximum differential output
voltage (peak-to-peak value)
at G
at G
(min)
(max)
common mode output voltage−3.1−V
output resistanceat V
o(cm)(DPGA)
output capacitance−− 5pF
1999 Sep 1610
−0.5−V
−10−mV
−tbf−µA
−0.5−V
−0.5−V
−115160Ω
Page 11
Philips SemiconductorsObjective specification
Dual 8-bit, 100 Msps A/D converter with
TDA8798
DPGA
SYMBOLPARAMETERCONDITIONSMIN.TYP.MAX.UNIT
BANDWIDTH AND SETTLING
B
(−3dB)(DPGA)
t
st
t
d(g)
GAIN
G
(min)
G
(max)
G
step
G
step(L)
G
(m)(c-c)
∆G/∆Tamplifier gain stability as a
∆G/∆V
DD
AIN SWITCHING;T
G
t
st(G-G)
t
PD
REJECTION
PSRRpower supply rejection ratioDC to 15 MHz
CMRRcommon mode rejection ratio40−−dB
ARMONICS;T
H
HD2second harmonic distortionf
HD3third harmonic distortionf
DPGA −3 dB bandwidthat V
i(dif)(max)
settling timefull-scale transition
30tbf−MHz
40−−ns
10% to 90%
group delayfi up to 15 MHz
at G
at G
(min)
(max)
−tbf−ps
−tbf−ps
minimum gain settingtbf0tbfdBV
maximum gain settingtbf34tbfdBV
gain step size−0.54−dBV
gain step size linearity (actual
−0.75−+0.75 dBV
gain step/average − 1)
channel-to-channel gain
matching
function of temperature
amplifier gain stability as a
SEN to SCLK hold time5−−ns
SDATA to SCLK set-up time5−−ns
SMODE to SCLK hold time5−−ns
SMODE to SEN hold time5−−ns
delay SEN rising edge to
change gain control register
value
t
d(SCLK-Q)
delay SCLK rising edge to
change gain control register
value
OREF1
AND V
at V
OREF2
o(cm)(ref)
o(cm)(ref)
)
− 0.42 V −V
DDA
−400−Ω
− 0.2 V−170−µA
DDD
−− 5ns
−− 5ns
V
Note
1. Single-ended clock signal sources are allowed. The unused clock input is internally biased at the logical threshold
(1.65 V for nominal supply conditions), and should be correctly decoupled.
1999 Sep 1614
Page 15
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1999 Sep 1615
handbook, full pagewidth
parallel load modecount-up/count-down mode
Dual 8-bit, 100 Msps A/D converter with
DPGA
Philips SemiconductorsObjective specification
SMODE
SEN
SCLK
SDATA
SI GAIN
CONTROL
REGISTER
DPGA
OUTPUTS
t
su(SEN-SCLK)
t
su(SDATA-SCLK)
t
h(SMODE-SEN)
t
h(SMODE-SCLK)
t
W(SCLKH)
D5
(MSB)(LSB)
D4D3D2D1D0
t
W(SCLKL)
t
su(SEN-SCLK)
t
h(SEN-SCLK)
t
su(SEN-SCLK)
up = 1
down = 0
t
d(SEN-Q)
D5 D4 D3 D2 D1 D0 REG +/−1REG +/−1
t
st(G-G)
t
PD
down = 0
t
d(SCLK-Q)
up = 1
50%
50%
50%
10%
90%
MGM865
Fig.4 Timing diagram of serial interface.
TDA8798
Page 16
Philips SemiconductorsObjective specification
Dual 8-bit, 100 Msps A/D converter with
DPGA
W(CLKH)
sample N
t
d(s)(D)
t
W(CLKL)
sample N + 1sample N + 2
DATA
N − 1
t
d(Q)
handbook, full pagewidth
CLK
V
i
DATA
A0 to A7
B0 to B7
t
DATA
N − 2
t
h(Q)
DATA
N
DATA
N + 1
TDA8798
HIGH
50 %
LOW
HIGH
50 %
LOW
MGM866
handbook, full pagewidth
output
output
V
DDO
OE
data
data
0 V
tdLZ
logic LOW
high impedance
10%
TDA8798
OE
Fig.5 Timing diagram for the ADC.
tdHZ
t
dZL
A0 to A7
B0 to B7
logic HIGH
50%
3.3 kΩ
10 pF
90%
high impedance
S1
V
DDO
50%
t
dZH
50%
TESTS1
t
dLZ
t
dZL
t
dHZ
t
dZH
V
DDO
V
DDO
GND
GND
MGM868
Fig.6 Timing diagram and test conditions of 3-state output delay time.
1999 Sep 1616
Page 17
Philips SemiconductorsObjective specification
Dual 8-bit, 100 Msps A/D converter with
DPGA
TEST AND APPLICATION INFORMATION
handbook, full pagewidth
100 nF
V
SSA
V
SSA
3.3 V
V
IN2N
V
IN2
V
IN1
V
IN1N
3.3 V
V
SSA
V
SSA
(2)
68 pF
100 nF
100 nF
100 nF
100 nF
68 pF
100 nF
100 nF
(3)
(1)
(4)
(4)
(4)
(4)
(1)
(3)
100 nF
(2)
DPGA2N
DPGA2
DPGAC2
V
ref2
V
DDA2
VIN2N
VIN2
V
SSA2
V
SSA1
VIN1
VIN1N
V
DDA1
V
ref1
DPGAC1
DPGA1
DPGA1N
BUF2
64
1
2
3
4
5
6
7
8
9
10
11
12
13
14
15
16
BUF2N
V
63
oref2
62
3.3 V
DDA4
V
100 nF
V
SSA
V
61
(1)
SSA4
60
V
SSA
V
100 nF
CLK2N
59
SSD
CLK2
3.3 V
100 nF
V
SSD
CLK2
SSD2
DDD2
V
V
58
57
56
TDA8798HL
TE
TDA8798
3.3 V
(1)
V
SSD
V
SSD
TEST
54
DPGAEN
DPGAEN
53
TE
55
SR
SR
52
OE
OE
V
51
100 nF
V
DDO2
50
SSO
SSO2
V
(1)
V
SSO
49
B7
48
47
46
45
44
43
42
41
40
39
38
37
36
35
34
33
B6
B5
B4
B3
B2
B1
B0
A0
A1
A2
A3
A4
A5
A6
A7
B7
B6
B5
B4
B3
B2
B1
B0
A0
A1
A2
A3
A4
A5
A6
A7
20
21
22
23
24
25
26
27
28
29
30
31
DDO1
V
3.3 V3.3 V3.3 V
SSO1
V
V
SSO
100 nF
32
(1)
V
SSO
MGM867
100 nF
(2)
100 nF
(2)
17
BUF1
18
V
BUF1N
19
oref1
DDA3
V
SSA3
V
V
SSA
100 nF
CLK1N
(1)
CLK1
CLK1
100 nF
V
SSD
V
SSA
V
SSD1
V
SSD
DDD1
V
SMODE
100 nF
SEN2
SEN2
SMODE
(1)
SDATA
V
SSD
SCLK
SDATA
SCLK
SEN1
SEN1
Analog and digital supplies must be separate and decoupled.
(1) Supply decoupling capacitor must be placed as close as possible to the chip’s pin. Value may need changing depending on the external filter
characteristics.
(2) Capacitor may be replaced when an external filter is used with AC coupling.
(3) Capacitor value may be changed to adjust settling time between DPGA gain changes.
(4) Capacitor value may need changing depending on the high-pass cut-off frequency of the external filter.
Fig.7 Application diagram.
1999 Sep 1617
Page 18
Philips SemiconductorsObjective specification
Dual 8-bit, 100 Msps A/D converter with
DPGA
INTERNAL PIN CONFIGURATIONS
handbook, halfpage
handbook, halfpage
V
DDA3
V
DDA1
VIN1
VIN1N
V
SSA1
1 kΩ
Fig.8 DPGA1 analog input.
0.5 V
MGM869
handbook, halfpage
handbook, halfpage
V
V
V
DDA4
DDA2
VIN2
VIN2N
SSA2
1 kΩ
Fig.9 DPGA2 analog input.
TDA8798
0.5 V
MGM870
V
oref1
BUF1
BUF1N
V
SSA3
Fig.10 ADC1 buffer input and V
handbook, halfpage
V
DDD1
CLK1
CLK1N
20
kΩ
20
kΩ
oref1
1.4 V
0.42 V
MGM871
output.
V
oref2
BUF2
BUF2N
V
SSA4
Fig.11 ADC2 buffer input and V
handbook, halfpage
V
DDD2
CLK2
CLK2N
20
kΩ
20
kΩ
oref2
1.4 V
0.42 V
MGM872
output.
V
SSD1
MGM873
Fig.12 ADC1 clock buffer input.
1999 Sep 1618
V
SSD2
MGM874
Fig.13 ADC2 clock buffer input.
Page 19
Philips SemiconductorsObjective specification
Dual 8-bit, 100 Msps A/D converter with
DPGA
handbook, halfpage
100 Ω
MGM875
Fig.14 DPGA1 buffer output.
V
DDA3
V
DDA1
DPGA1
DPGA1N
V
SSA1
handbook, halfpage
TDA8798
100 Ω
MGM876
Fig.15 DPGA2 buffer output.
V
DDA4
V
DDA2
DPGA2
DPGA2N
V
SSA2
handbook, halfpage
handbook, halfpage
V
DDD1
SMODE
SEN1
SEN2
SDATA
SCLK
V
SSD1
MGM877
Fig.16 Serial Interface inputs.
V
DDO2
OE
SR
handbook, halfpage
handbook, halfpage
V
DDD2
TE
DPGAEN
V
SSD2
MGM878
Fig.17 TE and DPGAEN inputs.
V
OE
A0N
DDO1
A0
V
SSO2
MGM879
Fig.18 OE and SR inputs.
1999 Sep 1619
V
SSO1
MGM880
Fig.19 ADC1 A0 to A7 outputs.
Page 20
Philips SemiconductorsObjective specification
Dual 8-bit, 100 Msps A/D converter with
DPGA
handbook, halfpage
OE
B0N
MGM881
Fig.20 ADC2 B0 to B7 outputs.Fig.21 V
V
DDO2
B0
V
SSO2
1.24 V
ref1
FCE268
output.
TDA8798
V
DDA3
V
ref1
V
SSA3
1.24 V
Fig.22 V
ref2
FCE269
output.
V
DDA4
V
ref2
V
SSA4
1999 Sep 1620
Page 21
Philips SemiconductorsObjective specification
Dual 8-bit, 100 Msps A/D converter with
DPGA
PACKAGE OUTLINE
LQFP64: plastic low profile quad flat package; 64 leads; body 10 x 10 x 1.4 mm
c
y
X
A
4833
49
Z
32
E
TDA8798
SOT314-2
e
w M
b
p
e
pin 1 index
1.45
1.35
b
0.25
17
16
Z
w M
p
D
H
D
p
0.27
0.18
0.17
0.12
D
(1)
(1)(1)(1)
cE
D
10.1
10.1
9.9
9.9
v M
B
v M
B
02.55 mm
scale
eH
H
12.15
0.5
11.85
64
1
DIMENSIONS (mm are the original dimensions)
mm
A
A1A2A3b
max.
0.20
1.60
0.05
UNIT
Note
1. Plastic or metal protrusions of 0.25 mm maximum per side are not included.
D
A
E
H
12.15
11.85
E
LL
E
A
A
0.75
0.45
2
p
(A )
A
1
L
detail X
Z
D
0.120.11.00.2
1.45
1.05
3
L
p
Zywvθ
E
1.45
1.05
o
7
o
0
θ
OUTLINE
VERSION
SOT314-2
IEC JEDEC EIAJ
REFERENCES
1999 Sep 1621
EUROPEAN
PROJECTION
ISSUE DATE
95-12-19
97-08-01
Page 22
Philips SemiconductorsObjective specification
Dual 8-bit, 100 Msps A/D converter with
DPGA
SOLDERING
Introduction to soldering surface mount packages
Thistextgivesavery brief insight to a complex technology.
A more in-depth account of soldering ICs can be found in
our
“Data Handbook IC26; Integrated Circuit Packages”
(document order number 9398 652 90011).
There is no soldering method that is ideal for all surface
mount IC packages. Wavesoldering is not always suitable
for surface mount ICs, or for printed-circuit boards with
high population densities. In these situations reflow
soldering is often used.
Reflow soldering
Reflow soldering requires solder paste (a suspension of
fine solder particles, flux and binding agent) to be applied
tothe printed-circuit board by screen printing,stencillingor
pressure-syringe dispensing before package placement.
Several methods exist for reflowing; for example,
infrared/convection heating in a conveyor type oven.
Throughput times (preheating, soldering and cooling) vary
between 100 and 200 seconds depending on heating
method.
Typical reflow peak temperatures range from
215 to 250 °C. The top-surface temperature of the
packages should preferable be kept below 230 °C.
Wave soldering
Conventional single wave soldering is not recommended
forsurfacemountdevices(SMDs)orprinted-circuit boards
with a high component density, as solder bridging and
non-wetting can present major problems.
TDA8798
• For packages with leads on two sides and a pitch (e):
– larger than or equal to 1.27 mm, the footprint
longitudinal axis is preferred to be parallel to the
transport direction of the printed-circuit board;
– smaller than 1.27 mm, the footprint longitudinal axis
must be parallel to the transport direction of the
printed-circuit board.
The footprint must incorporate solder thieves at the
downstream end.
• Forpackageswithleadsonfoursides,the footprint must
be placed at a 45° angle to the transport direction of the
printed-circuit board. The footprint must incorporate
solder thieves downstream and at the side corners.
During placement and before soldering, the package must
be fixed with a droplet of adhesive. The adhesive can be
applied by screen printing, pin transfer or syringe
dispensing. The package can be soldered after the
adhesive is cured.
Typical dwell time is 4 seconds at 250 °C.
A mildly-activated flux will eliminate the need for removal
of corrosive residues in most applications.
Manual soldering
Fix the component by first soldering two
diagonally-opposite end leads. Use a low voltage (24 V or
less) soldering iron applied to the flat part of the lead.
Contact time must be limited to 10 seconds at up to
300 °C.
When using a dedicated tool, all other leads can be
soldered in one operation within 2 to 5 seconds between
270 and 320 °C.
To overcome these problems the double-wave soldering
method was specifically developed.
If wave soldering is used the following conditions must be
observed for optimal results:
• Use a double-wave soldering method comprising a
turbulent wave with high upward pressure followed by a
smooth laminar wave.
1999 Sep 1622
Page 23
Philips SemiconductorsObjective specification
Dual 8-bit, 100 Msps A/D converter with
TDA8798
DPGA
Suitability of surface mount IC packages for wave and reflow soldering methods
PACKAGE
BGA, SQFPnot suitablesuitable
HLQFP, HSQFP, HSOP, HTSSOP, SMS not suitable
1. All surface mount (SMD) packages are moisture sensitive. Depending upon the moisture content, the maximum
2. These packages are not suitable for wave soldering as a solder joint between the printed-circuit board and heatsink
3. If wave soldering is considered, then the package must be placed at a 45° angle to the solder wave direction.
4. Wave soldering is only suitable for LQFP, TQFP and QFP packages with a pitch (e) equal to or larger than 0.8 mm;
5. Wave soldering is only suitable for SSOP and TSSOP packages with a pitch (e) equal to or larger than 0.65 mm; it is
, SO, SOJsuitablesuitable
temperature (with respect to time) and body size of the package, there is a risk that internal or external package
cracks may occur due to vaporization of the moisture in them (the so called popcorn effect). For details, refer to the
Drypack information in the
(at bottom version) can not be achieved, and as solder may stick to the heatsink (on top version).
The package footprint must incorporate solder thieves downstream and at the side corners.
it is definitely not suitable for packages with a pitch (e) equal to or smaller than 0.65 mm.
definitely not suitable for packages with a pitch (e) equal to or smaller than 0.5 mm.
Objective specificationThis data sheet contains target or goal specifications for product development.
Preliminary specificationThis data sheet contains preliminary data; supplementary data may be published later.
Product specificationThis data sheet contains final product specifications.
Limiting values
Limiting values given are in accordance with the Absolute Maximum Rating System (IEC 134). Stress above one or
more of the limiting values may cause permanent damage to the device. These are stress ratings only and operation
of the device at these or at any other conditions above those given in the Characteristics sections of the specification
is not implied. Exposure to limiting values for extended periods may affect device reliability.
Application information
Where application information is given, it is advisory and does not form part of the specification.
LIFE SUPPORT APPLICATIONS
These products are not designed for use in life support appliances, devices, or systems where malfunction of these
products can reasonably be expected to result in personal injury. Philips customers using or selling these products for
use in such applications do so at their own risk and agree to fully indemnify Philips for any damages resulting from such
improper use or sale.
1999 Sep 1623
Page 24
Philips Semiconductors – a w orldwide compan y
Argentina: see South America
Australia: 3 Figtree Drive, HOMEBUSH, NSW 2140,
United States: 811 East Arques Avenue, SUNNYVALE, CA 94088-3409,
Tel. +1 800 234 7381, Fax. +1 800 943 0087
Uruguay: see South America
Vietnam: see Singapore
Yugoslavia: PHILIPS, Trg N. Pasica 5/v, 11000 BEOGRAD,
Tel. +381 11 62 5344, Fax.+381 11 63 5777
For all other countries apply to: Philips Semiconductors,
International Marketing & Sales Communications, Building BE-p, P.O. Box 218,
5600 MD EINDHOVEN, The Netherlands, Fax. +31 40 27 24825
The information presented in this document does not form part of any quotation or contract, is believed to be accurate and reliable and may be changed
without notice. No liability will be accepted by the publisher for any consequence of its use. Publication thereof does not convey nor imply any license
under patent- or other industrial or intellectual property rights.
1999
Internet: http://www.semiconductors.philips.com
68
Printed in The Netherlands545004/25/02/pp24 Date of release: 1999 Sep 16Document order number: 9397 750 05466
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