Datasheet TDA8768H-5-C1, TDA8768H-4-C1, TDA8768AH-7-C1, TDA8768AH-5-C1, TDA8768AH-4-C1 Datasheet (Philips)

Page 1
DATA SH EET
Preliminary specification Supersedes data of 1998 Feb 25 File under Integrated Circuits, IC02
1998 Aug 26
INTEGRATED CIRCUITS
TDA8768
Page 2
1998 Aug 26 2
Philips Semiconductors Preliminary specification
12-bit high-speed Analog-to-Digital Converter (ADC)
TDA8768
FEATURES
12-bit resolution
Sampling rate up to 55 MHz
•−3 dB bandwidth of 190 MHz
5 V power supplies
Binary or twos-complement CMOS outputs
In-range CMOS-compatible output
TLL-CMOS compatible static digital inputs
3 to 5 V CMOS-compatible digital outputs
Differential clock input; Positive Emitter Coupled Logic
(PECL)-compatible
Power dissipation 325 mW (typical)
Low analog input capacitance (typical 2 pF), no buffer
amplifier required
Integrated sample-and-hold amplifier
Differential analog input
External amplitude range control
Voltage controlled regulator included.
APPLICATIONS
High-speed analog-to-digital conversion for – Video signal digitizing – High Definition TV (HDTV) – Imaging (camera scanner) – Medical imaging – Telecommunication – Base-station receiver.
GENERAL DESCRIPTION
The TDA8768 is a bipolar 12-bit Analog-to-Digital Converter (ADC) optimized for telecommunications and professional imaging. It converts the analog input signal into 12-bit binary coded digital words at a maximum sampling rate of 55 MHz. All static digital inputs (SH,
CE and OTC) are TTL and CMOS compatible and all outputs are CMOS compatible. A sine wave clock input signal can also be used.
QUICK REFERENCE DATA
ORDERING INFORMATION
SYMBOL PARAMETER CONDITIONS MIN. TYP. MAX. UNIT
V
CCA
analog supply voltage 4.75 5.0 5.25 V
V
CCD
digital supply voltage 4.75 5.0 5.25 V
V
CCO
output supply voltage 3.0 3.3 5.25 V
I
CCA
analog supply current 33 tbf mA
I
CCD
digital supply current 30 tbf mA
I
CCO
output supply current f
CLK
= 4 MHz; fi= 400 kHz 3.2 tbf mA
INL integral non-linearity f
CLK
= 4 MHz; fi= 400 kHz −±2.0 ±4.5 LSB
DNL differential non-linearity f
CLK
= 4 MHz; fi= 400 kHz −±0.6 ±1.0 LSB
f
CLK(max)
maximum clock frequency
TDA8768H/4 40 −−MHz TDA8768H/5 55 −−MHz
P
tot
total power dissipation 325 tbf mW
TYPE
NUMBER
PACKAGE
SAMPLING
FREQUENCY (MHz)
NAME DESCRIPTION VERSION
TDA8768H/4
QFP44
plastic quad flat package; 44 leads (lead length 1.3 mm); body 10 × 10 × 1.75 mm
SOT307-2
40
TDA8768H/5 55
Page 3
1998 Aug 26 3
Philips Semiconductors Preliminary specification
12-bit high-speed Analog-to-Digital Converter (ADC)
TDA8768
BLOCK DIAGRAM
Fig.1 Block diagram.
V
I
handbook, full pagewidth
MGR470
D11
MSB
data outputs
19
21
D1022 D923 D824 D725 D626 D527 D4 D3
28 29
43 42
39
11
1, 5 to 8, 12 to 14, 16
V
ref
SH
n.c.
D230 D131 D0
LSB
32
V
CCO
33
IR
34
20
18
CMOS
OUTPUTS
LATCHES
ANALOG-TO-DIGITAL
CONVERTER
CLOCK DRIVER
15
V
CCD2
37
V
CCD1
41
V
CCA4
3
V
CCA3
9
V
CCA2
2
V
CCA1
36
CLK
35
CLK
CMOS
OUTPUT
OGND
OVERFLOW/
UNDERFLOW
LATCH
CEOTC
AMP
sample-
and-hold
TDA8768
17
DGND2
38
DGND1
40
AGND4
4
AGND3
10
AGND2
44
AGND1
V
I
Page 4
1998 Aug 26 4
Philips Semiconductors Preliminary specification
12-bit high-speed Analog-to-Digital Converter (ADC)
TDA8768
PINNING
SYMBOL PIN DESCRIPTION
n.c. 1 not connected V
CCA1
2 analog supply voltage 1 (+5 V)
V
CCA3
3 analog supply voltage 3 (+5 V) AGND3 4 analog ground 3 n.c. 5 not connected n.c. 6 not connected n.c. 7 not connected n.c. 8 not connected V
CCA2
9 analog supply voltage 2 (+5 V) AGND2 10 analog ground 2 V
ref
11 reference voltage input n.c. 12 not connected n.c. 13 not connected n.c. 14 not connected V
CCD2
15 digital supply voltage 2 (+5 V) n.c. 16 not connected DGND2 17 digital ground 2 OTC 18 control input twos complement
output; active HIGH
CE 19 chip enable input
(CMOS level; active LOW) IR 20 in-range output D11 21 data output; bit 11 (MSB) D10 22 data output; bit 10
D9 23 data output; bit 9 D8 24 data output; bit 8 D7 25 data output; bit 7 D6 26 data output; bit 6 D5 27 data output; bit 5 D4 28 data output; bit 4 D3 29 data output; bit 3 D2 30 data output; bit 2 D1 31 data output; bit 1 D0 32 data output; bit 0 (LSB) V
CCO
33 output supply voltage (3 to 5.25 V) OGND 34 output ground CLK 35 complementary clock input; active
LOW CLK 36 clock input V
CCD1
37 digital supply voltage 1 (+5 V) DGND1 38 digital ground 1 SH 39 sample-and-hold enable input
(CMOS level; active HIGH) AGND4 40 analog ground 4 V
CCA4
41 analog supply voltage 4 (+5 V)
V
I
42 positive analog input voltage
V
I
43 negative analog input voltage
AGND1 44 analog ground 1
SYMBOL PIN DESCRIPTION
Page 5
1998 Aug 26 5
Philips Semiconductors Preliminary specification
12-bit high-speed Analog-to-Digital Converter (ADC)
TDA8768
Fig.2 Pin configuration.
handbook, full pagewidth
TDA8768H
MGR469
1 2 3 4 5 6 7 8
9 10 11
33 32 31 30 29 28 27 26 25 24 23
12
13
14
15
16
17
18
19
20
21
22
44
43
42
41
40
39
38
37
36
35
34
n.c.
n.c. n.c.
n.c. n.c.
V
CCA1
V
CCA3
V
CCA2
V
ref
AGND3
AGND2
n.c.
n.c.
n.c.
n.c.
IR
D11
D10
DGND2
V
CCD2
CE
OTC
D9
D8
D7
D6
D5
D4
D3
D2
D1
D0
OGND
DGND1
AGND4
AGND1
V
CCD1
V
CCA4
CLK
V
CCO
CLK
SH
VIV
I
Page 6
1998 Aug 26 6
Philips Semiconductors Preliminary specification
12-bit high-speed Analog-to-Digital Converter (ADC)
TDA8768
LIMITING VALUES
In accordance with the Absolute Maximum Rating System (IEC 134).
Note
1. The supply voltages V
CCA
, V
CCD
and V
CCO
may have any value between 0.3 V and +7.0 V provided that the supply
voltage differences VCC are respected.
HANDLING
Inputs and outputs are protected against electrostatic discharges in normal handling. However, to be totally safe, it is desirable to take normal precautions appropriate to handling integrated circuits.
THERMAL CHARACTERISTICS
SYMBOL PARAMETER CONDITIONS MIN. MAX. UNIT
V
CCA
analog supply voltage note 1 0.3 +7.0 V
V
CCD
digital supply voltage note 1 0.3 +7.0 V
V
CCO
output supply voltage note 1 0.3 +7.0 V
V
CC
supply voltage difference
V
CCA
V
CCD
1.0 +1.0 V
V
CCD
V
CCO
1.0 +4.0 V
V
CCA
V
CCO
1.0 +4.0 V
V
I
input voltage at pins 42 and 43 referenced to AGND 0.3 V
CCA
V
V
i(p-p)
input voltage at pins 35 and 36 for differential clock drive (peak-to-peak value)
V
CCD
V
I
O
output current 10 mA
T
stg
storage temperature 55 +150 °C
T
amb
operating ambient temperature 10 +85 °C
T
j
junction temperature 150 °C
SYMBOL PARAMETER CONDITION VALUE UNIT
R
th(j-a)
thermal resistance from junction to ambient in free air 75 K/W
Page 7
1998 Aug 26 7
Philips Semiconductors Preliminary specification
12-bit high-speed Analog-to-Digital Converter (ADC)
TDA8768
CHARACTERISTICS
V
CCA=V2
to V44, V9to V10, V3to V4 and V41to V40= 4.75 to 5.25 V; V
CCD=V37
to V38and V15to V17= 4.75 to 5.25 V;
V
CCO=V33
to V34= 3.0 to 5.25 V; AGND and DGND shorted together; T
amb
= 0 to 70 °C; typical values measured at
V
CCA=VCCD
= 5 V and V
CCO
= 3.3 V, T
amb
=25°C, V
I(p-p)
V
I(p-p)
= 2.0 V and CL= 10 pF; unless otherwise specified.
SYMBOL PARAMETER CONDITIONS MIN. TYP. MAX. UNIT
Supply
V
CCA
analog supply voltage 4.75 5.0 5.25 V
V
CCD
digital supply voltage 4.75 5.0 5.25 V
V
CCO
output supply voltage 3.0 3.3 5.25 V
I
CCA
analog supply current 33 45 mA
I
CCD
digital supply current 30 37 mA
I
CCO
output supply current f
CLK
= 4 MHz; fi= 400 kHz 3.2 tbf mA
f
CLK
= 40 MHz; fi= 4.43 MHz 11 tbf mA
Inputs
CLK
AND CLK (REFERENCED TO DGND)
V
IL
LOW-level input voltage V
CCD
= 5 V; note 1 3.19 3.52 V
V
IH
HIGH-level input voltage V
CCD
= 5 V; note 1 3.83 4.12 V
I
IL
LOW-level input current V
CLK
or V
CLK
= 3.19 V 10 −− µA
I
IH
HIGH-level input current V
CLK
or V
CLK
= 3.83 V −−10 µA
Z
i
input impedance f
CLK
= 40 MHz 2 −− k
C
i
input capacitance f
CLK
= 40 MHz −−2pF
V
CLK(p-p)
differential AC input voltage (peak-to-peak value) for switching (V
CLK
V
CLK
)
DC voltage level = 2.5 V 0.5 2.0 V
OTC, SH AND CE (REFERENCED TO DGND); see Tables 1 and 2 V
IL
LOW-level input voltage 0 0.8 V
V
IH
HIGH-level input voltage 2.0 V
CCD
V
I
IL
LOW-level input current VIL= 0.8 V 20 −− µA
I
IH
HIGH-level input current VIH= 2.0 V −−+20 µA
V
I
AND V
I
(REFERENCED TO AGND); V
REF
=V
CCA
1.825 V; see Table 1
I
IL
LOW-level input current 10 −µA
I
IH
HIGH-level input current 10 −µA
R
i
input resistance fi= 4.43 MHz 100 −− k
C
i
input capacitance fi= 4.43 MHz −−2pF
V
I(CM)
common mode input voltage VI= VI; output code 2047
V
CCA
= 5 V tbf 3.6 tbf V
V
CCA
= 4.75 V tbf 3.35 tbf V
V
CCA
= 5.25 V tbf 3.85 tbf V
Page 8
1998 Aug 26 8
Philips Semiconductors Preliminary specification
12-bit high-speed Analog-to-Digital Converter (ADC)
TDA8768
Voltage controlled regulator input V
ref
(referenced to AGND); note 2
V
ref(FS)
full-scale fixed voltage V
CCA
=5V 3.175 V
I
ref
input current 0.5 10 µA
V
I(p-p)
V
I(p-p)
input voltage amplitude (peak-to-peak value)
V
ref=VCCA
1.825 V 2.0 V
Outputs (referenced to OGND)
D
IGITAL OUTPUTS D11 TO D0 AND IR (REFERENCED TO OGND)
V
OL
LOW-level output voltage IOL= 2 mA 0 0.5 V
V
OH
HIGH-level output voltage IOH= 0.4 mA V
CCO
0.5 V
CCO
V
I
o
output current in 3-state output level between 0.5 V
and V
CCO
20 +20 µA
Switching characteristics
C
LOCK FREQUENCY f
CLK
; see Fig.3
f
CLK(min)
minimum clock frequency SH = HIGH −−2 MHz
f
CLK(max)
maximum clock frequency
TDA8768H/4 40 −− MHz TDA8768H/5 55 −− MHz
t
CLKH
clock pulse width HIGH 8.5 −− ns
t
CLKL
clock pulse width LOW 8.5 −− ns
Analog signal processing; 50% clock duty factor; V
I
VI= 2.0 V; V
ref=VCCA
1.825 V; see Table 1
L
INEARITY
INL integral non-linearity f
CLK
= 4 MHz; fi= 400 kHz −±2.0 ±4.5 LSB
DNL differential non-linearity f
CLK
= 4 MHz; fi= 400 kHz;
no missing code
−±0.6 ±1.0 LSB
E
offset
offset error V
CCA=VCCD=VCCO
=5V;
T
amb
=25°C; VI= VI;
output code = 2047
tbf 11 tbf mV
E
G(FS)
gain error amplitude (full scale); spread from device to device
V
CCA=VCCD=VCCO
=5V;
T
amb
=25°C;
V
I(p-p)
V
I(p-p)
= 2.0 V
5 +5 %
BANDWIDTH (f
CLK
= 55 MHz); note 3 B analog bandwidth 3 dB; full scale input tbf 190 MHz H
ARMONICS (f
CLK
= 40 MHz) h
fund(FS)
fundamental harmonics (full scale)
fi= 4.43 MHz −−0dB
h
tot(FS)
harmonics (full scale); all components
fi= 4.43 MHz
second harmonic −−75 dB third harmonic −−70 dB
THD total harmonic distortion f
i
= 4.43 MHz; note 4 −−66 dB
SYMBOL PARAMETER CONDITIONS MIN. TYP. MAX. UNIT
Page 9
1998 Aug 26 9
Philips Semiconductors Preliminary specification
12-bit high-speed Analog-to-Digital Converter (ADC)
TDA8768
THERMAL NOISE N
th(rms)
thermal noise (RMS value) grounded input;
f
CLK
= 40 MHz
0.25 tbf LSB
SPURIOUS FREE DYNAMIC RANGE DR
sf
spurious free dynamic range fi= 4.43 MHz tbf 69 dB
f
i
= 10 MHz tbf tbf dB
f
i
= 20 MHz tbf tbf dB SIGNAL-TO-NOISE RATIO; note 5 S/N signal-to-noise ratio without harmonics;
f
CLK
= 40 MHz; fi= 4.43 MHz
67 dB
EFFECTIVE NUMBER OF BITS; note 5 N
bit
effective number of bits TDA8768H/4 (f
CLK
= 40 MHz)
fi= 4.43 MHz 10.3 bits f
i
=10MHz tbf bits
f
i
=15MHz tbf bits
effective number of bits TDA8768H/5 (f
CLK
= 55 MHz)
fi= 4.43 MHz 9.9 bits f
i
=10MHz tbf bits
f
i
=15MHz tbf bits
f
i
=20MHz tbf bits INTERMODULATION; note 6 TTIR two-tone intermodulation
rejection
f
CLK
= 40 MHz tbf 66 dB
d
3
third order intermodulation distortion
f
CLK
= 40 MHz tbf 67 dB
BIT ERROR RATE BER bit error rate f
CLK
= 40 MHz; fi= 4.43 MHz; VI= ±16 LSB at code 2047
10
15
tbf times/
sample
Timing (C
L
= 10 pF); see Fig.3 and note 7
t
d(s)
sampling delay time −−2ns
t
h
output hold time 4 −− ns
t
d
output delay time V
CCO
= 5.25 V 10 15 ns
V
CCO
= 3.0 V 13 18 ns 3-state output delay times; see Fig.4 t
dZH
enable HIGH 14 18 ns
t
dZL
enable LOW 16 20 ns
t
dHZ
disable HIGH 16 20 ns
t
dLZ
disable LOW 14 18 ns
SYMBOL PARAMETER CONDITIONS MIN. TYP. MAX. UNIT
Page 10
1998 Aug 26 10
Philips Semiconductors Preliminary specification
12-bit high-speed Analog-to-Digital Converter (ADC)
TDA8768
Notes
1. The circuit has two clock inputs: CLK and CLK. There are four modes of operation: a) PECL mode 1: (DC level varies 1 : 1 with V
CCD
) CLK and CLK inputs are at differential PECL levels.
b) PECL mode 2: (DC level varies 1 : 1 with V
CCD
) CLK input is at PECL level and sampling is taken on the falling edge of the clock input signal. A DC level of 3.65 V has to be applied on CLK decoupled to GND via a 100 nF capacitor.
c) PECL mode 3: (DC level varies 1 : 1 with V
CCD
) CLK input is at PECL level and sampling is taken on the rising edge of the clock input signal. A DC level of 3.65 V has to be applied on CLK decoupled to GND via a 100 nF capacitor.
d) AC driving mode 4: when driving the CLK input directly and with any AC signal of minimum 0.5 V (peak-to-peak
value) and with a DC level of 2.5 V, the sampling takes place at the falling edge of the clock signal. When driving the CLK input with the same signal, sampling takes place at the rising edge of the clock signal. It is recommended to decouple the CLK or CLK input to DGND via a 100 nF capacitor.
2. It is possible with an external reference connected to pin V
ref
to adjust the ADC input range. This voltage has to be
referenced to V
CCA
. For V
CCA
1.825 V, the differential input voltage amplitude is 2 V (peak-to-peak value).
3. The 3 dB analog bandwidth is determined by the 3 dB reduction in the reconstructed output, the input being a full-scale sine wave.
4. THD (total harmonic distortion) is obtained with the addition of the first five harmonics:
where F is the fundamental harmonic referenced at 0 dB for a full-scale sine wave input.
5. Effective number of bits are obtained via a Fast Fourier Transform (FFT). The calculation takes into account all harmonics and noise up to half of the clock frequency (Nyquist frequency). Conversion to SNR: SNR = N
bit
× 6.02 + 1.76 dB.
6. Intermodulation measured relative to either tone with analog input frequencies of 4.43 and 4.53 MHz. The two input signals have the same amplitude and the total amplitude of both signals provides full-scale to the converter (6dB below full-scale for each input signal). d3 is the ratio of the RMS value of either input tone to the RMS value of the worst case third order intermodulation product.
7. Output data acquisition: the output data is available after the maximum delay of td.
THD 20 log
F
(2nd)2(3rd)2(4th)2(5th)2(6th)
2
++++
---------------------------------------------------------------------------------------------------------------=
Page 11
1998 Aug 26 11
Philips Semiconductors Preliminary specification
12-bit high-speed Analog-to-Digital Converter (ADC)
TDA8768
Table 1 Output coding with differential inputs (typical values to AGND); V
I(p-p)
V
I(p-p)
= 2.0 V; V
ref=VCCA
1.825 V
Table 2 Mode selection
Note
1. X = don’t care.
Table 3 Sample-and-hold selection
CODE V
I(p-p)
V
I(p-p)
IR
BINARY OUTPUTS
TWOS COMPLEMENT
OUTPUTS
D11 TO D0 D11 TO D0
Underflow <3.1 >4.1 0 0 0 0 0 0 0 0 0 0 0 0 0 1 0 0 0 0 0 0 0 0 0 0 0
0 3.1 4.1 1 0 0 0 0 0 0 0 0 0 0 0 0 1 0 0 0 0 0 0 0 0 0 00 1 −−1 0 0 0 0 0 0 0 0 0 0 0 1 1 0 0 0 0 0 0 0 0 0 0 1
↓−−↓
2047 3.6 3.6 1 0 1 1 1 1 1 1 1 1 1 1 1 1 1 1 1 1 1 1 1 1 1 1 1
↓−−↓
4094 −−1 1 1 1 1 1 1 1 1 1 1 1 0 0 1 1 1 1 1 1 1 1 1 1 0 4095 4.1 3.1 1 1 1 1 1 1 1 1 1 1 1 1 1 0 1 1 1 1 1 1 1 1 1 1 1
Overflow >4.1 <3.1 0 1 1 1 1 1 1 1 1 1 1 1 1 0 1 1 1 1 1 1 1 1 1 1 1
OTC
CE D0 TO D11 AND IR
0 0 binary; active 1 0 twos complement; active
X
(1)
1 high impedance
SH SAMPLE-AND-HOLD
1 active 0 inactive; tracking mode
Page 12
1998 Aug 26 12
Philips Semiconductors Preliminary specification
12-bit high-speed Analog-to-Digital Converter (ADC)
TDA8768
Fig.3 Timing diagram.
handbook, full pagewidth
sample N + 1
sample N
CLK
MGR472
sample N + 2
V
I
DATA D0 to D11
t
h
t
d
t
ds
t
CLKH
t
CLKL
HIGH
LOW
50 %
HIGH
LOW
50 %
DATA
N + 1
DATA
N
DATA N 1
DATA
N 2
Fig.4 Timing diagram and test conditions of 3-state output delay time.
fCE= 100kHz.
handbook, full pagewidth
MBG856
50 %
50 %
HIGH
LOW
t
dZH
t
dHZ
50 %
HIGH
LOW
t
dZL
t
dLZ
10 %
90 %
output data
0 V
V
CCD
output data
3.3 k
15 pF
S1
V
CCD
TDA8768
CE
CE
TEST
dLZ
t
dZL
t
dHZ
t
dZH
S1
CCD
V
CCD
V
DGND DGND
t
Page 13
1998 Aug 26 13
Philips Semiconductors Preliminary specification
12-bit high-speed Analog-to-Digital Converter (ADC)
TDA8768
APPLICATION INFORMATION
Fig.5 Application diagram.
The analog, digital and output supplies should be separated and decoupled. (1) Single-ended clock signals can be applied if required. (2) R1 and R2 must be determined in order to obtain a middle voltage of 3.6 V; see common mode input voltage.
In addition, to ensure a sufficient analog input stability, the minimum current into these resistors must be approximately 1 mA.
(3) V
ref
must be decoupled to V
CCA
.
handbook, full pagewidth
MGR471
1 2
3 4 5 6 7 8 9 10 11
12
n.c.
n.c.
n.c. n.c.
13 14 15 16 17 18 19 20 21 22
IR
D11
(MSB)
D10
TDA8768
44 43 42 41 40 39 38 37 36 35 34
33 32 31 30 29 28
26 25 24 23
27
D2
D1
D0 (LSB)
5 V
D3 D4 D5 D6 D7 D8 D9
100 nF
5 V
100
nF
100
nF
100
nF
output format select
chip select input
5 V
100
nF
V
ref
(3)
5 V
n.c.
n.c.
n.c.
n.c.
n.c.
CLK
CLK
100 nF
100 nF
5 V5 V SH
mode
(2)
(1)
V
I
V
I
100 100
R1
V
CCA
R2
4.7 µF
10 nF
220 nF
input
1 : 1
Page 14
1998 Aug 26 14
Philips Semiconductors Preliminary specification
12-bit high-speed Analog-to-Digital Converter (ADC)
TDA8768
Fig.6 Application diagram for differential clock input (PECL-compatible) using a TTL to PECL translator.
If the clock lines are more than 1 inch long they must be matched. In fact, the 27 resistor will be changed by the series connection of R1 and R2, with R1 = Z
o
placed close to pins CLK and CLK.
(1) 50 matched line (Zo, L).
handbook, full pagewidth
MGL474
TDA8768
TRANSLATOR
PECL
CLK
CLK
35
36
D
(1)
270
270
100 nF
100 nF
Z0 = 50
Z0 = 50
R1
500
R1 500
R2 220
R2
220
TTL
input
Fig.7 Application diagram for differential clock input (PECL-compatible) using a TTL to PECL translator
and Thevenin parallel terminations.
The value of R1 and R2 must be chosen in order to meet the following relations:
and
(1) 50 matched line (Z
o
, L).
3V
V
CCD
R2×
R1 R2+
---------------------------- -
= Z0
R1 R2× R1 R2+
----------------------
=
handbook, full pagewidth
MGL473
TDA8768
TRANSLATOR
PECL
CLK
CLK
35
36
D
V
CCD
(1)
R2
120
R2 120
100 nF
R1 82
R1
82
TTL
input
Page 15
1998 Aug 26 15
Philips Semiconductors Preliminary specification
12-bit high-speed Analog-to-Digital Converter (ADC)
TDA8768
PACKAGE OUTLINE
UNIT A1A2A3bpcE
(1)
eH
E
LL
p
Zywv θ
REFERENCES
OUTLINE
VERSION
EUROPEAN
PROJECTION
ISSUE DATE
IEC JEDEC EIAJ
mm
0.25
0.05
1.85
1.65
0.25
0.40
0.20
0.25
0.14
10.1
9.9
0.8 1.3
12.9
12.3
1.2
0.8
10
0
o
o
0.15 0.10.15
DIMENSIONS (mm are the original dimensions)
Note
1. Plastic or metal protrusions of 0.25 mm maximum per side are not included.
0.95
0.55
SOT307-2
95-02-04 97-08-01
D
(1) (1)(1)
10.1
9.9
H
D
12.9
12.3
E
Z
1.2
0.8
D
e
E
B
11
c
E
H
D
Z
D
A
Z
E
e
v M
A
X
1
44
34
33 23
22
12
y
θ
A
1
A
L
p
detail X
L
(A )
3
A
2
pin 1 index
D
H
v M
B
b
p
b
p
w M
w M
0 2.5 5 mm
scale
QFP44: plastic quad flat package; 44 leads (lead length 1.3 mm); body 10 x 10 x 1.75 mm
SOT307-2
A
max.
2.10
Page 16
1998 Aug 26 16
Philips Semiconductors Preliminary specification
12-bit high-speed Analog-to-Digital Converter (ADC)
TDA8768
SOLDERING Introduction
There is no soldering method that is ideal for all IC packages. Wave soldering is often preferred when through-hole and surface mounted components are mixed on one printed-circuit board. However, wave soldering is not always suitable for surface mounted ICs, or for printed-circuits with high population densities. In these situations reflow soldering is often used.
This text gives a very brief insight to a complex technology. A more in-depth account of soldering ICs can be found in our
“Data Handbook IC26; Integrated Circuit Packages”
(order code 9398 652 90011).
Reflow soldering
Reflow soldering techniques are suitable for all QFP packages.
The choice of heating method may be influenced by larger plastic QFP packages (44 leads, or more). If infrared or vapour phase heating is used and the large packages are not absolutely dry (less than 0.1% moisture content by weight), vaporization of the small amount of moisture in them can cause cracking of the plastic body. For details, refer to the Drypack information in the
“Data Handbook IC26; Integrated Circuit Packages; Section: Packing Methods”
.
Reflow soldering requires solder paste (a suspension of fine solder particles, flux and binding agent) to be applied to the printed-circuit board by screen printing, stencilling or pressure-syringe dispensing before package placement.
Several methods exist for reflowing; for example, infrared/convection heating in a conveyor type oven. Throughput times (preheating, soldering and cooling) vary between 50 and 300 seconds depending on heating method. Typical reflow peak temperatures range from 215 to 250 °C.
Wave soldering
Wave soldering is not recommended for QFP packages. This is because of the likelihood of solder bridging due to closely-spaced leads and the possibility of incomplete solder penetration in multi-lead devices.
CAUTION
Wave soldering is NOT applicable for all QFP packages with a pitch (e) equal or less than 0.5 mm.
If wave soldering cannot be avoided, for QFP packages with a pitch (e) larger than 0.5 mm, the following conditions must be observed:
A double-wave (a turbulent wave with high upward
pressure followed by a smooth laminar wave) soldering technique should be used.
The footprint must be at an angle of 45° to the board
direction and must incorporate solder thieves downstream and at the side corners.
During placement and before soldering, the package must be fixed with a droplet of adhesive. The adhesive can be applied by screen printing, pin transfer or syringe dispensing. The package can be soldered after the adhesive is cured.
Maximum permissible solder temperature is 260 °C, and maximum duration of package immersion in solder is 10 seconds, if cooled to less than 150 °C within 6 seconds. Typical dwell time is 4 seconds at 250 °C.
A mildly-activated flux will eliminate the need for removal of corrosive residues in most applications.
Repairing soldered joints
Fix the component by first soldering two diagonally­opposite end leads. Use only a low voltage soldering iron (less than 24 V) applied to the flat part of the lead. Contact time must be limited to 10 seconds at up to 300 °C. When using a dedicated tool, all other leads can be soldered in one operation within 2 to 5 seconds between 270 and 320 °C.
Page 17
1998 Aug 26 17
Philips Semiconductors Preliminary specification
12-bit high-speed Analog-to-Digital Converter (ADC)
TDA8768
DEFINITIONS
LIFE SUPPORT APPLICATIONS
These products are not designed for use in life support appliances, devices, or systems where malfunction of these products can reasonably be expected to result in personal injury. Philips customers using or selling these products for use in such applications do so at their own risk and agree to fully indemnify Philips for any damages resulting from such improper use or sale.
Data sheet status
Objective specification This data sheet contains target or goal specifications for product development. Preliminary specification This data sheet contains preliminary data; supplementary data may be published later. Product specification This data sheet contains final product specifications.
Limiting values
Limiting values given are in accordance with the Absolute Maximum Rating System (IEC 134). Stress above one or more of the limiting values may cause permanent damage to the device. These are stress ratings only and operation of the device at these or at any other conditions above those given in the Characteristics sections of the specification is not implied. Exposure to limiting values for extended periods may affect device reliability.
Application information
Where application information is given, it is advisory and does not form part of the specification.
Page 18
1998 Aug 26 18
Philips Semiconductors Preliminary specification
12-bit high-speed Analog-to-Digital Converter (ADC)
TDA8768
NOTES
Page 19
1998 Aug 26 19
Philips Semiconductors Preliminary specification
12-bit high-speed Analog-to-Digital Converter (ADC)
TDA8768
NOTES
Page 20
Internet: http://www.semiconductors.philips.com
Philips Semiconductors – a worldwide company
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Printed in The Netherlands 545104/750/02/pp20 Date of release: 1998 Aug 26 Document order number: 9397 750 03378
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