CHARACTERISTICS
16CHARACTERISTICS OF DIGITAL INPUTS
AND OUTPUTS
17PACKAGE OUTLINE
18SOLDERING
18.1Introduction
18.2Reflow soldering
18.3Wave soldering
18.4Repairing soldered joints
19DEFINITIONS
20LIFE SUPPORT APPLICATIONS
21PURCHASE OF PHILIPS I2C COMPONENTS
1996 Nov 192
Page 3
Philips SemiconductorsProduct specification
Multi-mode QAM demodulatorTDA8046
1FEATURES
• Different modulation schemes: 4, 16, 32,
64 and 256-QAM
• Digital demodulator and square root raised cosine
Nyquist filter with roll-off of 15% or 20%
• High performance adaptive equalizer (no training
sequence needed)
• Digital detectors for generation of required control
voltages for carrier recovery, clock recovery and AGC
• Input format: Straight binary or 2’s complement
(up to 9 bits, TTL compatible)
• Output format: 8-bit wide bus (CMOS compatible)
2
C-bus interface to initialize and monitor the
• I
demodulator. When no I2C-bus usage; 64-QAM,
20% roll-off factor in default mode
• 5 V peripheral and analog supply voltage
• 3.3 V core supply voltage
• Boundary scan test.
• Digital-to-analog converters and operational amplifiers
allowing high flexibility for selection of the (PLL) loop
2APPLICATION
time constants
• High maximum symbol rate (r
) of 7 Msymbols/s
s
Demodulation for digital cable TV and cable modem.
3QUICK REFERENCE DATA
SYMBOLPARAMETERCONDITIONSMIN.TYP.MAX.UNIT
V
DDD(core)
V
DDD
V
DDA
I
DDD(core)
I
DDD
I
DDA
r
s
core supply voltage3.003.303.60V
digital peripheral supply voltage4.755.005.25V
analog supply voltage4.755.005.25V
core supply currentV
digital peripheral supply currentV
analog supply currentV
symbol rate−−7Msym/s
ILimplementation lossnote 2−0.7−dB
αNyquist roll-off (programmable)−15 or 20−%
SNR
lock
signal-to-noise ratio for locking a
21−−dB
64-QAM constellation
signal-to-noise ratio for locking a
27−−dB
256-QAM constellation
Notes
1. The supply currents are specified for the maximum symbol frequency.
2. The implementation loss (IL) of the demodulator is defined as the distance between the measured and theoretical
BER curve as function of signal-to-noise ratio at a BER = 10
This performance depends on the chosen loop parameters (see
−6
for a back-to-back measurement at the IF frequency.
DIN01Idigital input bit 0 (LSB)
DIN12Idigital input bit 1
DIN23Idigital input bit 2
DIN34Idigital input bit 3
DIN45Idigital input bit 4
V
DDD1
V
SSD1
DIN58Idigital input bit 5
DIN69Idigital input bit 6
DIN710Idigital input bit 7
DIN811Idigital input bit 8 (MSB)
V
SSD2
V
DDD2
V
SSD3
CLKADC15Oclock output to ADC (4 × r
V
DDD3
V
SSD4
CLKSDV18Oclock symbol data valid output
CLKT19Ifor test purpose only
DO720Oparallel data output (bit 7)
DO621Oparallel data output (bit 6)
DO522Oparallel data output (bit 5)
DO423Oparallel data output (bit 4)
V
SSD5
V
DDD4
V
SSD6
DO327Oparallel data output (bit 3)
DO228Oparallel data output (bit 2)
DO129Oparallel data output (bit 1)
DO030Oparallel data output (bit 0)
V
SSD7
CLKOUT32Ioutput formatter clock output
V
DDD5
V
SSD8
SCL35Iserial clock input (I
SDA36I/Oserial data input/output (I
A037Ihardware address input (I
V
DDD6
TEST339Itest input 3 (normally connected to ground)
TEST240Itest input 2 (normally connected to ground)
6supplydigital peripheral supply voltage 1 (+5 V)
7supplydigital ground 1; for input peripheral and core
12supplydigital ground 2; for core and clock buffers
13supplydigital supply voltage 2; for core and clock buffers (+3.3 V)
14supplydigital peripheral ground 3
)
s
16supplydigital peripheral supply voltage 3 (+5 V)
17supplydigital ground 4; for core
24supplydigital peripheral ground 5
25supplydigital peripheral supply voltage 4 (+5 V)
26supplydigital ground 6; for core
38supplydigital peripheral supply voltage 6 (+5 V)
1996 Nov 195
Page 6
Philips SemiconductorsProduct specification
Multi-mode QAM demodulatorTDA8046
SYMBOLPINI/ODESCRIPTION
TEST141Itest input 1 input (normally connected to ground)
TRST42Ioptional asynchronous reset input
TCK43Idedicated test clock input
TMS44Iinput control signal
V
DDD7
V
SSD9
TDO47Oserial test data output
TDI48Iserial test data input
PRESET49Iset device into default mode input
V
SSD10
V
DDD8
I
BIAS
V
AGCTC
V
AGC
V
CARTC
V
CARREC
V
CLKTC
V
CLKREC
V
SSA
V
DDA
V
SSD11
CLK62Iclock input (4 × r
V
DDD9
V
SSD12
45supplydigital supply voltage 7; for core (+3.3 V)
46supplydigital ground 9; for core
50supplydigital ground 10; for the digital section of the analog block
51supplydigital supply voltage 8; for the digital section of the analog block (+5 V)
52Iinput bias current for DACs
53Oinverted operational amplifier input voltage for loop filtering
54Oanalog output voltage for AGC
55Oinverted operational amplifier input voltage for carrier recovery loop
filtering
56Oanalog output voltage for carrier recovery
57Oinverted operational amplifier input voltage for clock recovery loop
filtering
58Oanalog output voltage for clock recovery
59supplyanalog ground
60supplyanalog supply voltage (+5 V)
61supplydigital ground 11; for clock
)
s
63supplydigital supply voltage 9; for clock
64supplydigital peripheral ground 12
Figure 3 shows the application of the TDA8046
multi-mode QAM demodulator. The frequency of the IF
signal (IF
) is down converted to a frequency that
QAM
equals the symbol rate (rs) by a mixer which is driven from
a local oscillator with a frequency of f
CAR=fIF+rs
.
After low pass filtering this baseband signal is applied to an
external 8 or 9-bit ADC.
For 256-QAM, a 9-bit ADC is preferred, for the other
modes an 8-bit ADC is sufficient.
The multi-mode QAM demodulator has digital detectors for
AGC, carrier recovery and clock recovery. The on-chip
DACs translate the detector values to analog control
handbook, full pagewidth
IF
RF
signal
SAWTUNER
QAM
currents which are then integrated by a loop filter.
To perform this loop filtering, an operational amplifier is
integrated after each DAC.
The carrier recovery consists of a two-loop system.
The outer loop is shown in Fig.3, and controls both phase
and frequency at a low speed. The inner loop controls the
carrier phase at a high speed (wide loop bandwidth).
The AGC also consists of two loops; the outer loop is the
coarse AGC and one inner loop is the fine AGC.
The recovered symbols are converted into bits according
to a demapping scheme and represented at the output in
an 8-bit parallel output format. The QAM demodulator can
2
be initialized and monitored by the I
8 or 9 bits
f
clk
f
CAR
= fIF + r
LPFADC
s
C-bus interface.
clock recovery
carrier recovery
AGC
TDA8046
2
I
C-BUS
Fig.3 Application with multi-mode QAM demodulator.
DO7 to DO0
CLKOUT
CLKSDV
MGG167
1996 Nov 198
Page 9
Philips SemiconductorsProduct specification
Multi-mode QAM demodulatorTDA8046
7.1Functional description of the individual blocks
The functional block diagram of the multi-mode QAM
demodulator is illustrated in Fig.1. This section describes
the individual blocks in the demodulator. After adaptation
for the used input format (2’s complement or binary), the
input signal is demodulated in the I and Q baseband
signals which are applied to the inputs of the half-Nyquist
filter (equals square root raised cosine). To avoid
overloading of the ADC, an AGC detector is placed after
the adaptation for the input format. The control value for
the clock recovery is generated after half Nyquist filtering.
The echoes created in the cable network are reduced
significantly in the equalizer.
The equalizer produces a ‘clean’ constellation diagram
from which the information for the carrier recovery is
derived. This constellation is also applied to the output
formatter which demaps the transmitted symbols in
corresponding bits. The carrier recovery and lock
detection functions are based on the equalizer output.
The output of the equalizer is applied to an output
formatter, which translates the symbol bits to a FEC input
format. The digital outputs of the clock recovery, AGC, and
carrier recovery section are converted into currents which
are integrated by the loop filters.
To make these loop filters active, operational amplifiers
are integrated on the chip.
The TDA8046 can handle five different digital modulation
schemes; 4, 16, 32, 64 and 256-QAM. These schemes
2
are selectable via the I
7.1.1Q
UADRATURE DEMODULATOR AND HALF NYQUIST
FILTER
C-bus interface.
Quadrature demodulation is accomplished after selection
of the appropriate input format via the I2C-bus.
The in-phase and quadrature components are both
applied to a half Nyquist filter. In default mode, this filter
gives a 20% roll-off half Nyquist shaping. The basic
schematic of the quadrature demodulator followed by the
half Nyquist filter is shown in Fig.4. The signs of the
multiplication factors in the Q-branch can be inverted
(I2C-bus bit INVD).
When using an 8-bit ADC the LSB of the 9-bit input word
should be connected to the positive supply (V
DDD
).
This ensures a symmetrical 2’s complement
representation which can be multiplied by −1 in a correct
(2’s complement) way. The overall transfer function of the
square root raised cosine filters is shown in Figs 5 and 6.
For characteristics see Chapter 10.
handbook, full pagewidth
9
COMPLEMENT
BINARY OR
TWO's
I2C-BUS
+1, 0, −1, 0
0, −1, 0, +1
I2C-BUS
DIN8
to
DIN0
Fig.4 Schematic diagram of the quadrature demodulator and half Nyquist filter.
1996 Nov 199
9
I
9
Q
2
I
C-BUS
HALF NYQUIST
FILTER
HALF NYQUIST
FILTER
2
C-BUS
I
MGG168
Page 10
Philips SemiconductorsProduct specification
Multi-mode QAM demodulatorTDA8046
handbook, full pagewidth
5
0
−5
relative
gain
(dB)
−15
−25
−35
−45
−55
010.250.50.751.751.51.25
relative frequency
Fig.5 Half Nyquist receiver filter transfer function (20% roll-off).
MBG987
f )
(
2
r
s
handbook, full pagewidth
0
relative
gain
(dB)
−10
−20
−30
−40
−50
00.511.50.250.751.251.75
Fig.6 Half Nyquist receiver filter transfer function (15% roll-off).
relative frequency
MGG169
f )
(
2
r
s
1996 Nov 1910
Page 11
Philips SemiconductorsProduct specification
Multi-mode QAM demodulatorTDA8046
7.1.2EQUALIZER
This function is realized with a T spaced 12 or 14 taps
(selected via the I2C-bus) adaptive filter with a feedback
part. The equaliser is based on a Decision Feedback
Equalizer (DFE) structure with Least Mean Square (LMS)
coefficient updating algorithm. No training sequence is
required. The block schematic of the total equalizer is
shown in Fig.8. The main tap of the equalizer is adjustable
for fine AGC function (6 dB AGC range). The settings of
the equalizer taps can be read via the I2C-bus. If the
2
equalizer diverges, an alarm bit is set (I
C-bus bit ALEQ)
and an automatic reset of the taps can be performed
(I2C-bus bit EAR).
To improve acquisition time, the convergence steps of the
FFE/DFE parts of the equalizer are programmable via the
I2C-bus. When the system locks, the steps are
automatically modified for optimum performances.
Besides reading the equalizer tap values, the main tap of
the equalizer can also be programmed. After setting the
main tap, the other coefficients can be set to zero.
The equalizer settings can also be frozen via the I2C-bus.
The equalizer has been proven to work correctly under bad
channel conditions as indicated in Table 1. It is guaranteed
that all loops (including equalizer) converge at a SNR of
21 dB for a 64-QAM modulation format and 27 dB for a
256-QAM modulation format.
Table 1 Channel echo profile
DELAYAMPLITUDEPHASE
3
⁄8× T
1
1
2 × T
5
4
7
6
⁄8× T
⁄8× T
⁄8× T
sym
sym
sym
sym
sym
0.08130°
0.2060°
0.05310°
0.10200°
0.03200°
Figure 7 represents the QAM spectrum seen by the
equalizer. It corresponds (in the frequency domain) to the
multiplication of a full nyquist spectrum by the impulse
response of the channel specified in Table 1.
handbook, full pagewidth
1
relative
gain
(dB)
−1
−3
−5
−7
−9
−11
−0.50.5
−0.3750.375−0.1250.125−0.250.250
Fig.7 QAM spectrum with echo profile as seen by the equalizer.
relative frequency
MGD636
f )
(
r
s
1996 Nov 1911
Page 12
Philips SemiconductorsProduct specification
Multi-mode QAM demodulatorTDA8046
handbook, full pagewidth
input
FEED
FORWARD
EQUALIZER
TAPS CALCULATION
−
Fig.8 DFE equalizer structure.
7.1.3LOCK DETECTOR
The lock detector indicates whether all algorithms in the
demodulator are converged or not. For a symbol error rate
(at the input of the demodulator) smaller than 2 × 10−2, the
detector will give the indication ‘LOCK’ (I2C-bus bit
LK = 1). For larger symbol error rates, the detector will
generate the ‘UNLOCK’ signal (I2C-bus bit LK = 0).
It should ne noted that this ‘UNLOCK’ signal is generated
before any other part of the demodulator loses lock.
The lock detector is part of the carrier recovery loop, see
Fig.9. The Lock Detector Threshold (LDT) can be changed
2
with the help of the I
C-bus. The estimation algorithm used
in the lock detector also provides information about the
SER ratio which can be read out via the I2C-bus interface.
For characteristics see Chapter 11.
7.1.4C
ARRIER RECOVERY
The carrier recovery detector consists of a
Phase-Frequency Detector (PFD) and Phase Detector
(PD). Depending on the mode of operation, the carrier
recovery is switched either between the phase frequency
(no lock) or the phase detector (lock). The carrier recovery
consists of the following two loops:
DECISION
FEEDBACK
EQUALIZER
TAPS CALCULATION
decision
+
MGG170
output
1. The outer loop; this loop controls the phase and
frequency of the incoming QAM signal at the IF
frequency in such a way that the constellation is
optimally positioned for detection.
2. The inner loop; the bandwidth of this loop can be large
and can therefore reduce the influence of large
bandwidth phase noise.
A fully digital carrier recovery function is also possible and
can be selected via the I
2
C-bus. Should this configuration
be used, then the external components of the loop filter will
not have to be implemented.
Four different maximum DAC output currents can be
selected via the I2C-bus. The output currents of the DAC
are defined in such a way that a VCO with a behaviour as
shown in Fig.9 can be connected directly to the output of
the integrated operational amplifier. Should the VCO slope
be negative then the sign of the current can be inverted by
the I2C-bus. Figure 10 defines the DAC output currents.
For characteristics see Chapter 12.
1996 Nov 1912
Page 13
Philips SemiconductorsProduct specification
Multi-mode QAM demodulatorTDA8046
handbook, full pagewidth
IF
QAM
VCO
LPF
ADC
external
DAC
I
CAR
V
I2C-BUS
DEMODULATION
AND
FILTERING
I2C-BUS
ref
DIGITAL
INNER LOOP
r
EQUALIZER
I
s
ref1
lock
LOCK
PHASE
FREQUENCY
DETECTOR
PHASE
DETECTOR
lock
Fig.9 Schematic diagram of the carrier recovery.
I2C-BUS
I2C-BUS
0
2
I
C-BUS
MGG171
1996 Nov 1913
Page 14
Philips SemiconductorsProduct specification
Multi-mode QAM demodulatorTDA8046
handbook, full pagewidth
CARI = 1
I
= positive output current.
pos
I
= negative output current.
neg
I
–()
posIneg
I
=
------------------------------ -
O
∆ I
-------------------------------- -
O
2
I
+()
posIneg
–()
I
posIneg
I
CAR
DAC output
current
f
VCO
CARI = 0
1
/
I
CAR
2
V
CARREC
MGG180
−1/
−I
I
2
CAR
digital input
CAR
100×=
Fig.10 Definition of the DAC currents and the expected frequency behaviour of the VCO.
1996 Nov 1914
Page 15
Philips SemiconductorsProduct specification
Multi-mode QAM demodulatorTDA8046
7.1.5CLOCK RECOVERY
The clock recovery function uses the unequalized I and Q
signals, i.e. the half Nyquist filter outputs (see Fig.4).
The clock recovery section generates a control value each
symbol period. As this algorithm is based on the energy
maximization, both main and mid symbols are required at
the input. Consequently, the input data rate is twice the
symbol rate. The schematic diagram of this detector is
illustrated in Fig.11.
handbook, full pagewidth
I
Q
external
CLOCK
RECOVERY
DETECTOR
DAC
rsI
The clock generator generates the required internal clocks
from the VCXO clock signal at 4 × r
. The input stage
s
amplifier of this generator enables the designer to supply
a low amplitude oscillator signal to the TDA8046. The DAC
output current range (I
) can be varied via the I2C-bus.
CLK
The sign of the output current can also be inverted to
adjust for the correct sign of the VCXO slope.
For characteristics see Chapter 13.
to
VCXO
ref3
I
CLK
V
ref
4r
s
2r
s
r
s
2
4
Fig.11 Schematic diagram of the clock recovery.
from
VCXO
MGG172
1996 Nov 1915
Page 16
Philips SemiconductorsProduct specification
Multi-mode QAM demodulatorTDA8046
handbook, full pagewidth
CLKI = 1
I
= positive output current; I
pos
I
= negative output current; −I
neg
I
–()
oCLK
posIneg
=
------------------------------ -
I
posIneg
-------------------------------- I
2
posIneg
I
oCLK
∆ I
CLK
+()
100×=
–()
CLK
I
CLK
DAC output
current
f
VCXO
CLKI = 0
1
/
I
CLK
2
digital input
1
−
/
I
CLK
2
−I
CLK
V
CLKREC
MGG181
.
.
Fig.12 The definition of the DAC currents and the expected frequency behaviour of the VCXO for clock recovery.
1996 Nov 1916
Page 17
Philips SemiconductorsProduct specification
Multi-mode QAM demodulatorTDA8046
2
C-bus data on address 08 is a factor 16 smaller than
7.1.6AGC
The AGC estimates the mean power based on the digital
input signal and relates this to a peak value for a given
constellation. To avoid overloading of the ADC, this
estimation of the peak signals is used to control the AGC
loop. The implemented AGC covers a range of ±20 dB in
gain variance. A schematic diagram of the AGC is
illustrated in Fig.13.
If the SAW filter does not have sufficient adjacent channel
attenuation, the AGC threshold can be varied to avoid
clipping of the ADC. To do this, the threshold is made
2
programmable via the I
C-bus (byte ATH). Table 2 shows
that for each mode, a new ATH value (on address 08)
must be set with the help of the I2C-bus.
Table 2 AGC threshold values
MODEATH (AGC THRESHOLD)I
256, 64, 16 and 4-QAM20407F
32-QAM14425A
The I
the used AGC threshold ATH.
The DAC output current range can be varied via the
I2C-bus interface (bits AGCA and AGCB) and the sign of
the current can be inverted (bit AGCI). The definition of the
DAC currents and the expected frequency behaviour of
the AGC is illustrated in Fig.14.
For characteristics see Chapter 14.
2
C-BUS DATA FOR ADDRESS 08
handbook, full pagewidth
2
C-BUS
I
DIN8
DIN0
I
BIAS
external
to
AGC
DETECTOR
I2C-BUS
BIAS
GENERATOR
I
r
s
ref2
DAC
I
ref2
I
AGC
to AGC
amplifier
V
ref
ADC
I2C-BUS
MGG173
Fig.13 AGC schematic diagram.
1996 Nov 1917
Page 18
Philips SemiconductorsProduct specification
Multi-mode QAM demodulatorTDA8046
handbook, full pagewidth
AGCI = 1
I
= positive output current; I
pos
I
= negative output current; −I
neg
I
–()
oAGC
posIneg
=
------------------------------ -
I
posIneg
-------------------------------- I
posIneg
2
I
oAGC
∆ I
CLK
+()
100×=
–()
1
CLK
DAC output
I
AGC
current
gain
AGCI = 0
/
I
AGC
14
digital input
1
−
/
I
ACG
14
−I
AGC
V
AGC
MGG182
.
.
Fig.14 Definition of the DAC currents and the expected frequency behaviour of the AGC.
1996 Nov 1918
Page 19
Philips SemiconductorsProduct specification
Multi-mode QAM demodulatorTDA8046
7.1.7OFFSET CONTROL
To compensate offsets in the I and Q branch, due to
spurious signals at the symbol frequency at the ADC input,
an offset compensation loop is included. This loop forces
the constellation to be symmetrically distributed over its
four quadrants. This function can be switched off by
I2C-bus bit OFFS.
7.1.8L
OOP AMPLIFIERS
Analog switches are integrated to discharge the loop filter
capacitors or for test purposes on application boards (a
reference voltage equal to the half of the positive supply
voltage V
is available at the output of the amplifier
DDA
when the switches are closed). The I2C-bus bit ANAS
controls the three switches simultaneously. A schematic
diagram of the loop amplifier and analog switch is
illustrated in Fig.15.
For characteristics see Chapter 15.
andbook, halfpage
external
7.1.9OUTPUT FORMATTER
The output formatter transforms the detected symbols into
bits in accordance with the selected mapping. The
TDA8046 has four possible mapping formats which can be
selected via the I2C-bus interface. The demapping
procedure and the corresponding bits are defined in
Fig.16. After demapping the bits are allocated to the
output. This output allocation corresponds to one of the
selected demapping schemes.
By using the I2C-bus, it is possible to obtain the following
output formats:
• 8 bits parallel
• semi-serial
• I and Q 8 bits multiplexed.
The implemented demapping formats and output bit
allocation are illustrated in Figs 17 to 30.
7.1.10B
OUNDARY SCAN
The TDA8046H offers the possibility of boundary scan
test. The IEEE Standard Test Access Port and Boundary
Scan Architecture allows board manufacturers to test
board interconnections by using the boundary scan
functions.
I2C-BUS
DAC
V
ref
MGG174
Fig.15 Loop amplifier and analog switch.
Complete information on boundary scan test is available in
“Application note AN96048”
.
1996 Nov 1919
Page 20
Philips SemiconductorsProduct specification
Multi-mode QAM demodulatorTDA8046
handbook, full pagewidth
8
I
Q
I2C-BUS
8
DEMAPPING
SCHEMES
1 to 4
MUX
Fig.16 Schematic diagram of the output formatter.
7.1.10.1Demapping scheme 1; differential decoding
handbook, full pagewidth
Q
010100011100001100000100
A quadrant
PARALLEL
AND
SEMI-SERIAL
b5 b4
DO7 to DO0
CLKSCV
DO1 to DO0
CLKSCV
CLKOUT
DO7 to DO0
CLKSCV
CLKOUT
MGG175
b3 b2 b1 b0
100100101100111100110100
010101011101001101000101
010111011111001111000111
010110011110001110000110
010010011010001010000010
010011011011001011000011
010001011001001001000001
010000011000001000000000
Bit allocation for 256-QAM: b5, b4, b3, b2, b1 = b0 = 0; b7 and b6 differentially decoded (see Table 3).
Fig.17 Demapping scheme 1; bit allocation: 256-QAM.
1996 Nov 1920
100101101101111101110101
100111101111111111110111
100110101110111110110110
100010101010111010110010
100011101011111011110011
100001101001111001110001
100000101000111000110000
MGG193
I
Page 21
Philips SemiconductorsProduct specification
Multi-mode QAM demodulatorTDA8046
b5
handbook, full pagewidth
B quadrant
Q
A quadrant
b4 b3 b2
1 0 0 01 0 0 11 0 1 11 0 1 0
1 1 0 01 1 0 11 1 1 11 1 1 0
0 1 0 00 1 0 10 1 1 10 1 1 0
0 0 0 00 0 0 10 0 1 10 0 1 0
0 0 0 00 1 0 01 1 0 01 0 0 0
0 0 0 10 1 0 11 1 0 11 0 0 1
0 0 1 10 1 1 11 1 1 11 0 1 1
0 0 1 00 1 1 01 1 1 01 0 1 0
D quadrantC quadrant
Bit allocation for 4-QAM: b5 = b4 = b3 = b2 = b1 = b0 = 0; b7 and b6 differentially decoded (see Table 3).
Bit allocation for 64-QAM: b5, b4, b3 and b2; b0 = b1 = 0; b7 and b6 differentially decoded (see Table 3).
Fig.18 Demapping scheme 1; bit allocation: 4-QAM and 64-QAM.
1 0 1 01 1 1 00 1 1 00 0 1 0
1 0 1 11 1 1 10 1 1 10 0 1 1
1 0 0 11 1 0 10 1 0 10 0 0 1
1 0 0 01 1 0 00 1 0 00 0 0 0
0 0 1 00 0 1 10 0 0 10 0 0 0
0 1 1 00 1 1 10 1 0 10 1 0 0
1 1 1 01 1 1 11 1 0 11 1 0 0
1 0 1 01 0 1 11 0 0 11 0 0 0
I
MGG183
Q
handbook, full pagewidth
Bit allocation for 16-QAM: b5 and b4; b3 = b2 = b1 = b0 = 0; b7 and b6 differentially decoded (see Table 3).
Bit allocation for 32-QAM: not implemented.
B quadrant
1 01 1
0 00 1
0 01 0
0 11 1
A quadrant
D quadrantC quadrant
b5
1 10 1
1 00 0
0 10 0
1 11 0
Fig.19 Demapping scheme 1; bit allocation: 16-QAM and 32-QAM.
1996 Nov 1921
b4
I
MGG184
Page 22
Philips SemiconductorsProduct specification
Multi-mode QAM demodulatorTDA8046
7.1.10.2Demapping scheme 2; direct translation
handbook, full pagewidth
0 1 0 0
0 0 1 1
0 0 1 0
0 0 0 1
0 0 0 0
Bit allocation for 256-QAM: b7, b6, b5, b4, b3, b2, b1, b0.
C-bus read parameter; ADC carrier recovery; 4-bit value
PARAMETERBITSDESCRIPTION
ADC carrier
recovery
CR03CR02CR01CR00
b3b2b1b0carrier recovery: V
CARREC
= 0.25 +1⁄16V
(8b3 + 4b2 + 2b1 + b0) V
2
Table 17 I
C-bus read parameter; ADC clock recovery; 4-bit value
PARAMETERBITSDESCRIPTION
ADC clock
recovery
CL03CL02CL01CL00
b3b2b1b0clock recovery: V
CLKREC
= 0.25 +1⁄16V
DDD
(8b3 + 4b2 + 2b1 + b0) V
2
Table 18 I
C-bus read parameter; ADC AGC; 4-bit value
PARAMETERBITSDESCRIPTION
ADC AGCAG03AG02AG01AG00
Table 19 I
b3b2b1b0AGC: V
2
C-bus read parameter; 8-bit value
= 0.25 +1⁄16V
AGC
(8b3 + 4b2 + 2b1 + b0) V
DDD
PARAMETERBITSDESCRIPTION
SER
(1)
LE7LE6LE5LE4LE3LE2LE1LE0
b7b6b5b4b3b2b1b0SER = f (b7 to b0)
DDD
Note
1. The bits LE7 to LE0 give the number of symbols falling inside the lock detector active areas. The count is made during
an observation period (256 to 2048 symbols).
To obtain more details about the SER estimation, refer to
2
Table 20 I
C-bus read parameter; 12-bit value
“Application Note AN96048”
.
PARAMETERBITSDESCRIPTION
IF_FREQ_SHIFT
(1)
FS11 to FS0frequency shift = f (FS11 to FS0)
Note
1. The bits FS11 to FS0 indicate the remaining frequency shift of the QAM spectrum (IF spectrum). This data is useful
2
if the TDA8046H does not use the outer loop of carrier recovery (bit ‘OUTE’ of the I
To obtain more details about the frequency shift calculation, refer to the
“Application Note AN96048”
C-bus table set to 0).
.
1996 Nov 1935
Page 36
Philips SemiconductorsProduct specification
Multi-mode QAM demodulatorTDA8046
8LIMITING VALUES
In accordance with the Absolute Maximum Rating System (IEC 134).
SYMBOLPARAMETERCONDITIONSMIN.MAX.UNIT
V
DDD
V
max
P
tot
T
stg
T
amb
9THERMAL CHARACTERISTICS
SYMBOLPARAMETERCONDITIONSVALUEUNIT
R
th j-a
10 DEMODULATOR AND HALF NYQUIST FILTER CHARACTERISTICS
digital supply voltage−0.36.0V
maximum voltage on all pins0V
total power dissipationT
(k) represent the coefficient resulting from the convolution of
conv
the transmission and reception filters (K indicates the Kth coefficient).
The power ISI specified in Table 1 has been calculated on a filter resulting from the convolution of the TDA8046 filters
and a truncated half-Nyquist filter with 57 T/4 taps for the 15% roll-off filter and 41 T/4 taps for the 20% roll-of filter
(see “
Application note AN96048”
- Appendix B).
1996 Nov 1936
Page 37
Philips SemiconductorsProduct specification
Multi-mode QAM demodulatorTDA8046
11 LOCK DETECTOR CHARACTERISTICS
SYMBOLPARAMETERCONDITIONSMIN.TYP.MAX.UNIT
SNR
lock
signal-to-noise ratio to lock the
demodulator
12 CARRIER RECOVERY CHARACTERISTICS
SYMBOLPARAMETERCONDITIONSMIN.TYP.MAX.UNIT
Carrier recovery detector
ARRIER RECOVERY: BIAS CURRENT FOR DACS SET TO 37.5 µA
C
K
d
∆f
CAR
f
n(inner)
f
n(outer)
I
zero
I
CAR
detector constantSNR = 21 dB for
frequency range±0.017rs−−MHz
loop bandwidth of inner looprs= 5 Msym/s10−−kHz
loop bandwidth of outer loop−− 0.3f
zero current of DAC−100−+100nA
maximum DAC output current
(programmable)
f
DAC
DAC sampling rate−r
CARRIER RECOVERY DAC OUTPUT CURRENTS DURING LOCK
I
oCARlock
∆I
oCARlock
mean output current−
matching of output currents−2.5−+2.5%
CARRIER RECOVERY DAC OUTPUT CURRENTS DURING UNLOCK
I
LOW level input voltage−−0.8V
High level input voltage2.0−−V
set-up time15−−ns
hold time0−−ns
load capacitance−−10pF
V
V
1996 Nov 1939
Page 40
Philips SemiconductorsProduct specification
Multi-mode QAM demodulatorTDA8046
SYMBOLPARAMETERCONDITIONSMIN.TYP.MAX.UNIT
Digital outputs: DO1 to DO0 with respect to CLKOUT for semi-serial mode
V
OL
V
OH
t
od
t
oHD
C
L
LOW level output voltage0−0.1V
HIGH level output voltage0.9V
DDD
output delay time−−7ns
output hold time−−10ns
load capacitanceadditional2−30pF
Digital outputs: DO7 to DO0 with respect to CLKSDV for 8-bit parallel mode
V
V
t
od
t
oHD
C
OL
OH
L
LOW level output voltage0−0.1V
HIGH level output voltage0.9V
DDD
output delay time−−22ns
output hold time−−22ns
load capacitanceadditional2−30pF
Digital outputs: DO7 to DO0 with respect to CLKOUT for I/Q multiplexed mode
V
V
t
od
t
oHD
OL
OH
LOW level output voltage0−0.1V
HIGH level output voltage0.9V
DDD
output delay time−−22ns
output hold time−−22ns
Loop amplifier
V
o
G
v
G
B
R
L
output voltage level0.1V
DDA
DC voltage gain (open loop)−60−dB
gain bandwidth product1−−MHz
load resistance5−−KΩ
−V
−V
−V
DDD
DDD
DDD
−0.9V
DDD
DDD
DDD
DDA
V
V
V
V
V
V
1996 Nov 1940
Page 41
Philips SemiconductorsProduct specification
Multi-mode QAM demodulatorTDA8046
handbook, full pagewidth
BER
no convergence
measured
−4
10
theory
MBG989
implementation
loss
SNR (dB)
Fig.31 Definition of the Implementation Loss.
handbook, full pagewidth
CLKADC
DIN 0 to
DIN 8
t
t
r
90%90%
10%10%
t
w
SU; DAT
t
HD; DAT
Fig.32 CMOS input data timing diagram.
1996 Nov 1941
t
t
f
CLK
V
V
V
V
MGG176
OH
OL
IH
IL
Page 42
Philips SemiconductorsProduct specification
Multi-mode QAM demodulatorTDA8046
handbook, full pagewidth
CLKOUT
DO1 to DO0
CLKSDV
T
sym
t
oHD
t
od
Fig.33 CMOS semi-serial mode timing diagram.
V
OH
V
OL
V
OH
slot 3slot 2slot 1slot 0
V
OL
V
OH
V
MGG179
OL
handbook, full pagewidth
CLKSDV
DATA
OUTPUT
t
oHD
Fig.34 CMOS 8-bit symbol in parallel mode timing diagram
1996 Nov 1942
T
sym
V
OH
V
OL
V
OH
V
t
od
OL
MGG177
Page 43
Philips SemiconductorsProduct specification
Multi-mode QAM demodulatorTDA8046
handbook, full pagewidth
DO7 to DO0
CLKOUT
CLKSDV
T
sym
t
oHD
t
od
IQ
Fig.35 CMOS I and Q multiplexed timing diagram.
V
OH
V
OL
V
OH
V
OL
V
OH
V
OL
MGG178
1996 Nov 1943
Page 44
Philips SemiconductorsProduct specification
Multi-mode QAM demodulatorTDA8046
17 PACKAGE OUTLINE
QFP64: plastic quad flat package; 64 leads (lead length 1.95 mm); body 14 x 20 x 2.8 mm
c
y
X
5133
52
pin 1 index
64
1
32
Z
e
w M
b
p
20
19
A
E
A
H
E
E
2
A
A
1
detail X
Q
L
p
L
SOT319-2
(A )
3
θ
w M
b
e
p
Z
D
D
H
D
0510 mm
scale
DIMENSIONS (mm are the original dimensions)
mm
A
max.
3.20
0.25
0.05
2.90
2.65
0.25
UNITA1A2A3b
cE
p
0.50
0.25
0.35
0.14
(1)
(1)(1)(1)
D
20.1
19.9
eH
14.1
13.9
24.2
1
23.6
Note
1. Plastic or metal protrusions of 0.25 mm maximum per side are not included.
OUTLINE
VERSION
IEC JEDEC EIAJ
REFERENCES
SOT319-2
1996 Nov 1944
v M
A
B
v M
B
H
D
LLpQZywv θ
E
18.2
17.6
1.0
0.6
1.4
1.2
0.20.10.21.95
EUROPEAN
PROJECTION
Z
D
1.2
1.2
0.8
0.8
ISSUE DATE
E
o
7
o
0
92-11-17
95-02-04
Page 45
Philips SemiconductorsProduct specification
Multi-mode QAM demodulatorTDA8046
18 SOLDERING
18.1Introduction
There is no soldering method that is ideal for all IC
packages. Wave soldering is often preferred when
through-hole and surface mounted components are mixed
on one printed-circuit board. However, wave soldering is
not always suitable for surface mounted ICs, or for
printed-circuits with high population densities. In these
situations reflow soldering is often used.
This text gives a very brief insight to a complex technology.
A more in-depth account of soldering ICs can be found in
our
“IC Package Databook”
18.2Reflow soldering
Reflow soldering techniques are suitable for all QFP
packages.
The choice of heating method may be influenced by larger
plastic QFP packages (44 leads, or more). If infrared or
vapour phase heating is used and the large packages are
not absolutely dry (less than 0.1% moisture content by
weight), vaporization of the small amount of moisture in
them can cause cracking of the plastic body. For more
information, refer to the Drypack chapter in our
Reference Handbook”
Reflow soldering requires solder paste (a suspension of
fine solder particles, flux and binding agent) to be applied
to the printed-circuit board by screen printing, stencilling or
pressure-syringe dispensing before package placement.
Several techniques exist for reflowing; for example,
thermal conduction by heated belt. Dwell times vary
between 50 and 300 seconds depending on heating
method. Typical reflow temperatures range from
215 to 250 °C.
Preheating is necessary to dry the paste and evaporate
the binding agent. Preheating duration: 45 minutes at
45 °C.
(order code 9398 652 90011).
“Quality
(order code 9397 750 00192).
18.3Wave soldering
Wave soldering is not recommended for QFP packages.
This is because of the likelihood of solder bridging due to
closely-spaced leads and the possibility of incomplete
solder penetration in multi-lead devices.
If wave soldering cannot be avoided, the following
conditions must be observed:
• A double-wave (a turbulent wave with high upward
pressure followed by a smooth laminar wave)
soldering technique should be used.
• The footprint must be at an angle of 45° to the board
direction and must incorporate solder thieves
downstream and at the side corners.
Even with these conditions, do not consider wave
soldering the following packages: QFP52 (SOT379-1),
QFP100 (SOT317-1), QFP100 (SOT317-2),
QFP100 (SOT382-1) or QFP160 (SOT322-1).
During placement and before soldering, the package must
be fixed with a droplet of adhesive. The adhesive can be
applied by screen printing, pin transfer or syringe
dispensing. The package can be soldered after the
adhesive is cured.
Maximum permissible solder temperature is 260 °C, and
maximum duration of package immersion in solder is
10 seconds, if cooled to less than 150 °C within
6 seconds. Typical dwell time is 4 seconds at 250 °C.
A mildly-activated flux will eliminate the need for removal
of corrosive residues in most applications.
18.4Repairing soldered joints
Fix the component by first soldering two diagonallyopposite end leads. Use only a low voltage soldering iron
(less than 24 V) applied to the flat part of the lead. Contact
time must be limited to 10 seconds at up to 300 °C. When
using a dedicated tool, all other leads can be soldered in
one operation within 2 to 5 seconds between
270 and 320 °C.
1996 Nov 1945
Page 46
Philips SemiconductorsProduct specification
Multi-mode QAM demodulatorTDA8046
19 DEFINITIONS
Data sheet status
Objective specificationThis data sheet contains target or goal specifications for product development.
Preliminary specificationThis data sheet contains preliminary data; supplementary data may be published later.
Product specificationThis data sheet contains final product specifications.
Limiting values
Limiting values given are in accordance with the Absolute Maximum Rating System (IEC 134). Stress above one or
more of the limiting values may cause permanent damage to the device. These are stress ratings only and operation
of the device at these or at any other conditions above those given in the Characteristics sections of the specification
is not implied. Exposure to limiting values for extended periods may affect device reliability.
Application information
Where application information is given, it is advisory and does not form part of the specification.
20 LIFE SUPPORT APPLICATIONS
These products are not designed for use in life support appliances, devices, or systems where malfunction of these
products can reasonably be expected to result in personal injury. Philips customers using or selling these products for
use in such applications do so at their own risk and agree to fully indemnify Philips for any damages resulting from such
improper use or sale.
21 PURCHASE OF PHILIPS I
Purchase of Philips I
components in the I2C system provided the system conforms to the I2C specification defined by
Philips. This specification can be ordered using the code 9398 393 40011.
2
C COMPONENTS
2
C components conveys a license under the Philips’ I2C patent to use the
1996 Nov 1946
Page 47
Philips SemiconductorsProduct specification
Multi-mode QAM demodulatorTDA8046
NOTES
1996 Nov 1947
Page 48
Philips Semiconductors – a worldwide company
Argentina: see South America
Australia: 34 Waterloo Road, NORTH RYDE, NSW 2113,
United States: 811 East Arques Avenue, SUNNYVALE, CA 94088-3409,
Tel. +1 800 234 7381
Uruguay: see South America
Vietnam: see Singapore
Yugoslavia: PHILIPS, Trg N. Pasica 5/v, 11000 BEOGRAD,
Tel. +381 11 625 344, Fax.+381 11 635 777
For all other countries apply to: Philips Semiconductors, Marketing & Sales Communications,
Building BE-p, P.O. Box 218, 5600 MD EINDHOVEN, The Netherlands, Fax. +31 40 27 24825
The information presented in this document does not form part of any quotation or contract, is believed to be accurate and reliable and may be changed
without notice. No liability will be accepted by the publisher for any consequence of its use. Publication thereof does not convey nor imply any license
under patent- or other industrial or intellectual property rights.
Internet: http://www.semiconductors.philips.com
Printed in The Netherlands537021/1200/02/pp48 Date of release: 1996 Nov 19Document order number: 9397 750 01499
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