• Reed-Solomon (RS) decoder:
– (204, 188 and T = 8) Reed Solomon code
2
– Automatic (I
C-bus configurable) synchronization of
bytes, transport packets and frames
– Internal convolutional de-interleaving (I = 12; using
internal memory)
– De-randomizer based on Pseudo Random Binary
Sequence (PRBS)
– External indication of RS decoder sync lock
– External indication of uncorrectable errors (transport
error indicator is set)
– Indication of the number of lost blocks
– Indication of the number of corrected blocks/bytes.
• I2C-bus interface:
–I2C-bus interface initializes and monitors the
demodulator and Forward Error Correction (FEC)
decoder with standby mode; when no I2C-bus is
used, default mode is defined
– 4-bit I/O expander for flexible access to and from the
I2C-bus
–I2C-bus configurable interrupt pin
– Standby mode for reduced power consumption.
• Package: QFP100
• Boundary scan test.
APPLICATIONS
• Demodulation and FEC for digital satellite TV.
1998 Feb 132
Page 3
Philips SemiconductorsProduct specification
Satellite Demodulator and Decoder (SDD)TDA8043
GENERAL DESCRIPTION
This document specifies a DVB compliant demodulator
and forward error correction decoder IC for reception of
QPSK and BPSK modulated signals for satellite
applications.
The TDA8043 can handle variable symbol rates without
adapting the analog filters within the tuner. Typical
applications for this device are:
• Single Carrier Per Channel (SCPC): two or more
QPSK or BPSK modulated signals in a single satellite
channel (transponder)
• Multi-Carrier Per Channel (MCPC): one QPSK or
BPSK modulated signal in a single satellite channel
(transponder)
• Simul-cast: QPSK or BPSK modulated signal together
with a Frequency Modulated (FM) signal in a single
satellite channel.
The SDD requires the analog in-phase (I) and quadrature
(Q) components as an input and provides 8-bit wide
MPEG2 transport packet data at the output. The outputs of
the SDD can be directly connected to a descrambler
(SAA7206) or a demultiplexer (SAA7205).
For evaluation purposes, the output can also be used to
monitor internal data, for example I/Q after demodulation.
The SDD requires a single clock frequency which is
independent of the received symbol rate, providing the
clock frequency is slightly higher than twice the highest
symbol frequency.
All loops to recover the data from the received symbols are
internal. No external loop components are required. Loop
parameters for the clock, carrier recovery and AGC can be
controlled via the I
The Forward Error Correction (FEC) unit has a built-in
state machine to achieve lock without knowing the system
parameters (depuncturing rate, spectral inversion, etc.).
Once lock is achieved, all necessary parameters can be
read via the I2C-bus. By programming these parameters in
advance lock can be achieved more quickly.
The SDD can be controlled and monitored via the I2C-bus.
An I2C-bus default mode is specified which makes it
possible to use the device by software control. A 4-bit
bidirectional I/O expander and an interrupt line are
available. By sending an interrupt signal, the SDD can
inform the microcontroller of its internal status (lock).
αnyquist roll-off (selectable)−35 or 50−%
ILimplementation lossnote 3−0.3−dB
S/Nsignal-to-noise ratio for locking
P
tot
T
stg
T
amb
T
j
analog supply voltage3.03.33.6V
digital supply voltage3.03.33.6V
total supply currentV
= 3.3 V; note 1 −390−mA
DDD
clock frequency−−65MHz
symbol ratenote 20.5−32Msymbols/s
QPSK mode; note 12−−dB
the SDD
total power dissipationT
=70°C; note 1−12851650mW
amb
IC storage temperature−55−+150°C
operating ambient temperature0−70°C
operating junction temperatureT
=70°C−−125°C
amb
Notes
3
1. These values are specified for a symbol rate of 27.5 Msymbols/s, a puncturing rate of
⁄4 and a clock frequency of
65 MHz.
2. A range from 3 to 32 Msymbols/s can be achieved with one SAW filter. By using an internal clock divider and
reducing the external SAW filter bandwidth, symbol rates down to 0.5 Msymbols/s can be achieved by using a
65 MHz crystal clock.
3. This data was measured in a laboratory environment at a symbol rate of 27.5 Msymbols/s, a clock frequency of
65 MHz, a signal-to-noise ratio of 4.5 dB and including a tuner.
PINNING
SYMBOLPINI/ODESCRIPTION
I21Idigital I-input bit 2 (ADC bypass); note 1
I32Idigital I-input bit 3 (ADC bypass); note 1
V
SSD1
3−digital ground 1
n.c.4−not connected
n.c.5−not connected
I46Idigital I-input bit 4 (ADC bypass); note 1
I57Idigital I-input bit 5 (ADC bypass); note 1
I68Idigital I-input bit 6 (ADC bypass: MSB); note 1
Q09Idigital Q-input bit 0 (ADC bypass: LSB); note 1
V
DDD1
10−digital supply voltage 1
Q111Idigital Q-input bit 1 (ADC bypass); note 1
Q212Idigital Q-input bit 2 (ADC bypass); note 1
Q313Idigital Q-input bit 3 (ADC bypass); note 1
Q414Idigital Q-input bit 4 (ADC bypass); note 1
V
SSD2
15−digital ground 2
Q516Idigital Q-input bit 5 (ADC bypass); note 1
Q617Idigital Q-input bit 6 (ADC bypass: MSB); note 1
1998 Feb 134
Page 5
Philips SemiconductorsProduct specification
Satellite Demodulator and Decoder (SDD)TDA8043
SYMBOLPINI/ODESCRIPTION
V
SSD3
V
DDD2
PRESET20Iset device into default mode
P321I/Oquasi-bidirectional I/O port (bit 3)
P222I/Oquasi-bidirectional I/O port (bit 2)
P123I/Oquasi-bidirectional I/O port (bit 1)
P024I/Oquasi-bidirectional I/O port (bit 0)
V
DDD3
n.c.26−not connected
n.c.27−not connected
PDOCLK28Ooutput clock for transport stream bytes
PDO029Oparallel data output (bit 0)
PDO130Oparallel data output (bit 1)
PDO231Oparallel data output (bit 2)
V
SSD4
PDO333Oparallel data output (bit 3)
PDO434Oparallel data output (bit 4)
PDO535Oparallel data output (bit 5)
n.c.36−not connected
n.c.37−not connected
PDO638Oparallel data output (bit 6)
n.c.39−not connected
V
DDD4
V
DDD5
V
SSD5
V
DDD6
V
DDD7
PDO745Oparallel data output (bit 7)
n.c.46−not connected
n.c.47−not connected
PDOERR48Otransport error indicator
PDOVAL49Odata valid indicator
PDOSYNC50Otransport packet synchronization signal
V
SSD6
SCL52Iserial clock of I
SDA53I/Oserial data of I
INT54Ointerrupt output (active LOW); note 1
A055II
RSLOCK56OReed-Solomon lock indicator
VLOCK57OViterbi lock indicator
DLOCK58Odemodulator lock indicator
V
DDD8
V
DDD9
TEST61Itest pin (normally connected to ground); note 1
18−digital ground 3
19−digital supply voltage 2
25−digital supply voltage 3
32−digital ground 4
40−digital supply voltage 4
41−digital supply voltage 5
42−digital ground 5
43−digital supply voltage 6
44−digital supply voltage 7
51−digital ground 6
2
C-bus; note 1
2
C-bus; note 1
2
C hardware address; note 1
59−digital supply voltage 8
60−digital supply voltage 9
1998 Feb 135
Page 6
Philips SemiconductorsProduct specification
Satellite Demodulator and Decoder (SDD)TDA8043
SYMBOLPINI/ODESCRIPTION
TRST62IBST optional asynchronous reset (normally connected to ground); note 1
TCK63IBST dedicated test clock (normally connected to ground); note 1
n.c.64−not connected
n.c.65−not connected
V
DDD10
V
SSD7
V
SSD8
TMS69IBST input control signal (normally connected to ground); note 1
TDO70OBST serial test data out
TDI71IBST serial test data in (normally connected to ground); note 1
V
DDD11
V
SSD9
V
SSD(AD)
V
DDD(AD)
V
ref(B)
V
SSA1
QA78Ianalog input Q
V
ref(Q)
IA80Ianalog input I
V
SSA2
V
ref(I)
V
DDA
V
DDXTAL
XTALI85Icrystal oscillator input
XTALO86Ocrystal oscillator output
V
SSXTAL
V
DDD12
V
DDD13
V
SSD10
n.c.91−not connected
n.c.92−not connected
n.c.93−not connected
V
If possible, connect ‘n.c.’ pins to ground to
ease power dissipation.
TRST, TCK, TMS, and TDI pins can be
connected to ground if they are not used.
Fig.4 Application diagram.
1998 Feb 1310
Page 11
Philips SemiconductorsProduct specification
Satellite Demodulator and Decoder (SDD)TDA8043
PACKAGE OUTLINE
QFP100: plastic quad flat package; 100 leads (lead length 1.95 mm); body 14 x 20 x 2.8 mm
c
y
X
E
e
w M
p
A
A
H
E
E
2
A
A
1
8051
81
pin 1 index
100
1
50
Z
b
31
30
detail X
L
p
L
SOT317-2
(A )
3
θ
w M
b
e
p
Z
D
D
H
D
0510 mm
scale
DIMENSIONS (mm are the original dimensions)
mm
A
max.
3.20
0.25
0.05
2.90
2.65
0.25
UNITA1A2A3b
cE
p
0.40
0.25
0.25
0.14
(1)
(1)(1)(1)
D
20.1
19.9
eH
14.1
13.9
0.65
24.2
23.6
Note
1. Plastic or metal protrusions of 0.25 mm maximum per side are not included.
OUTLINE
VERSION
IEC JEDEC EIAJ
REFERENCES
SOT317-2
1998 Feb 1311
v M
A
B
v M
B
E
18.2
17.6
LL
p
1.0
0.6
0.150.10.21.95
H
D
EUROPEAN
PROJECTION
Z
D
0.8
0.4
Zywvθ
E
o
1.0
7
o
0.6
0
ISSUE DATE
95-02-04
97-08-01
Page 12
Philips SemiconductorsProduct specification
Satellite Demodulator and Decoder (SDD)TDA8043
SOLDERING
Introduction
There is no soldering method that is ideal for all IC
packages. Wave soldering is often preferred when
through-hole and surface mounted components are mixed
on one printed-circuit board. However, wave soldering is
not always suitable for surface mounted ICs, or for
printed-circuits with high population densities. In these
situations reflow soldering is often used.
This text gives a very brief insight to a complex technology.
A more in-depth account of soldering ICs can be found in
our
“IC Package Databook”
Reflow soldering
Reflow soldering techniques are suitable for all QFP
packages.
The choice of heating method may be influenced by larger
plastic QFP packages (44 leads, or more). If infrared or
vapour phase heating is used and the large packages are
not absolutely dry (less than 0.1% moisture content by
weight), vaporization of the small amount of moisture in
them can cause cracking of the plastic body. For more
information, refer to the Drypack chapter in our
Reference Handbook”
Reflow soldering requires solder paste (a suspension of
fine solder particles, flux and binding agent) to be applied
to the printed-circuit board by screen printing, stencilling or
pressure-syringe dispensing before package placement.
Several methods exist for reflowing; for example,
infrared/convection heating in a conveyor type oven.
Throughput times (preheating, soldering and cooling) vary
between 50 and 300 seconds depending on heating
method. Typical reflow peak temperatures range from
215 to 250 °C.
(order code 9398 652 90011).
“Quality
(order code 9397 750 00192).
If wave soldering cannot be avoided, for QFP
packages with a pitch (e) larger than 0.5 mm, the
following conditions must be observed:
• A double-wave (a turbulent wave with high upward
pressure followed by a smooth laminar wave)
soldering technique should be used.
• The footprint must be at an angle of 45° to the board
direction and must incorporate solder thieves
downstream and at the side corners.
During placement and before soldering, the package must
be fixed with a droplet of adhesive. The adhesive can be
applied by screen printing, pin transfer or syringe
dispensing. The package can be soldered after the
adhesive is cured.
Maximum permissible solder temperature is 260 °C, and
maximum duration of package immersion in solder is
10 seconds, if cooled to less than 150 °C within
6 seconds. Typical dwell time is 4 seconds at 250 °C.
A mildly-activated flux will eliminate the need for removal
of corrosive residues in most applications.
Repairing soldered joints
Fix the component by first soldering two diagonallyopposite end leads. Use only a low voltage soldering iron
(less than 24 V) applied to the flat part of the lead. Contact
time must be limited to 10 seconds at up to 300 °C. When
using a dedicated tool, all other leads can be soldered in
one operation within 2 to 5 seconds between
270 and 320 °C.
Wave soldering
Wave soldering is not recommended for QFP packages.
This is because of the likelihood of solder bridging due to
closely-spaced leads and the possibility of incomplete
solder penetration in multi-lead devices.
CAUTION
Wave soldering is NOT applicable for all QFP
packages with a pitch (e) equal or less than 0.5 mm.
1998 Feb 1312
Page 13
Philips SemiconductorsProduct specification
Satellite Demodulator and Decoder (SDD)TDA8043
DEFINITIONS
Data sheet status
Objective specificationThis data sheet contains target or goal specifications for product development.
Preliminary specificationThis data sheet contains preliminary data; supplementary data may be published later.
Product specificationThis data sheet contains final product specifications.
Limiting values
Limiting values given are in accordance with the Absolute Maximum Rating System (IEC 134). Stress above one or
more of the limiting values may cause permanent damage to the device. These are stress ratings only and operation
of the device at these or at any other conditions above those given in the Characteristics sections of the specification
is not implied. Exposure to limiting values for extended periods may affect device reliability.
Application information
Where application information is given, it is advisory and does not form part of the specification.
LIFE SUPPORT APPLICATIONS
These products are not designed for use in life support appliances, devices, or systems where malfunction of these
products can reasonably be expected to result in personal injury. Philips customers using or selling these products for
use in such applications do so at their own risk and agree to fully indemnify Philips for any damages resulting from such
improper use or sale.
PURCHASE OF PHILIPS I
2
C COMPONENTS
Purchase of Philips I
components in the I2C system provided the system conforms to the I2C specification defined by
Philips. This specification can be ordered using the code 9398 393 40011.
2
C components conveys a license under the Philips’ I2C patent to use the
1998 Feb 1313
Page 14
Philips SemiconductorsProduct specification
Satellite Demodulator and Decoder (SDD)TDA8043
NOTES
1998 Feb 1314
Page 15
Philips SemiconductorsProduct specification
Satellite Demodulator and Decoder (SDD)TDA8043
NOTES
1998 Feb 1315
Page 16
Philips Semiconductors – a worldwide company
Argentina: see South America
Australia: 34 Waterloo Road, NORTH RYDE, NSW 2113,
United States: 811 East Arques Avenue, SUNNYVALE, CA 94088-3409,
Tel. +1 800 234 7381
Uruguay: see South America
Vietnam: see Singapore
Yugoslavia: PHILIPS, Trg N. Pasica 5/v, 11000 BEOGRAD,
Tel. +381 11 625 344, Fax.+381 11 635 777
For all other countries apply to: Philips Semiconductors,
International Marketing & Sales Communications, Building BE-p, P.O. Box 218,
5600 MD EINDHOVEN, The Netherlands, Fax. +31 40 27 24825
The information presented in this document does not form part of any quotation or contract, is believed to be accurate and reliable and may be changed
without notice. No liability will be accepted by the publisher for any consequence of its use. Publication thereof does not convey nor imply any license
under patent- or other industrial or intellectual property rights.
Internet: http://www.semiconductors.philips.com
Printed in The Netherlands545104/1200/03/pp16 Date of release: 1998Feb 13Document order number: 9397 750 03267
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