Objective specification
Supersedes data of 1995 Feb 07
File under Integrated Circuits, IC02
1996 Oct 08
Page 2
Philips SemiconductorsObjective specification
Quadrature demodulatorTDA8040T
FEATURES
• +5 V supply voltage
• Bandgap internal reference voltage
• Low crosstalk between I (in-phase) and Q (quadrature)
channel outputs
• High operating input sensitivity
• High Carrier-to-Noise Ratio (CNR) of the VCO.
It has been designed to operate in conjunction with the
TDA8041H to provide a complete QPSK demodulator.
The design of this circuit has been optimized to provide the
best quadrature accuracy necessary for digital receiver
applications and particularly for digital television.
The TDA8040T includes two matched mixers, an
RF amplifier, a symmetrical Voltage Controlled Oscillator
(VCO), a frequency divider and two matched amplifiers.
Two external filters are required for the baseband filtering.
The VCO requires an external LC tank circuit with two
varicap diodes. This oscillator operates at twice the
IF carrier frequency and can be used in a carrier recovery
AFC loop.
GENERAL DESCRIPTION
The TDA8040T is a monolitic bipolar IC dedicated for
quadrature demodulation.
QUICK REFERENCE DATA
SYMBOLPARAMETERCONDITIONSMIN.TYP.MAX.UNIT
V
CC
I
CC(tot)
V
i(RF)
f
i(RF)
V
olQ(p-p)
supply voltage4.55.05.5V
total supply currentVCC= 5 V707990mA
operating input voltage level646770dBµV
RF input signal frequency10.7−150MHz
I and Q output voltage
−0.5−V
(peak-to-peak value)
Eφ
(IQ)
phase error between the
−−3deg
I and Q channels
E
G(IQ)
gain error between the
−−1dB
I and Q channels
E
G(tilt)
α
ct(IQ)
gain tilt error in the I and Q channels−−1dB
crosstalk between the
30−−dB
I and Q channels
IM3intermodulation distortion in the
40−−dB
I and Q channels
ORDERING INFORMATION
PACKAGE
TYPE NUMBER
NAMEDESCRIPTIONVERSION
TDA8040TSO16plastic small outline package; 16 leads; body width 3.9 mmSOT109-1
1996 Oct 082
Page 3
Philips SemiconductorsObjective specification
Quadrature demodulatorTDA8040T
BLOCK DIAGRAM
handbook, full pagewidth
V
CC(A)
GND(D)
RF A
RF B
V
CC(D)
GND(A)
1
2
I
Q
AMP
3
4
AMP
5
6
7
AMP
89
TDA8040T
VOLTAGE
REFERENCE
0
2
÷
90
AMP
VCO
AMP
16
15
14
13
12
11
10
MGE511
I
in
I
out
V
CC(V)
VCOB
VCOA
GND(V)
Q
out
Q
in
Fig.1 Block diagram.
1996 Oct 083
Page 4
Philips SemiconductorsObjective specification
Quadrature demodulatorTDA8040T
PINNING
SYMBOLPINDESCRIPTION
V
CC(A)
I2I channel buffer output
GND(D)3demodulator ground
RF A4RF input A
RF B5RF input B
V
CC(D)
Q7Q channel buffer output
GND(A)8I and Q amplifiers ground
Q
in
Q
out
GND(V)11VCO ground
VCOA12VCO tank circuit A
VCOB13VCO tank circuit B
V
CC(V)
I
out
I
in
1supply voltage for I and Q amplifiers
6supply voltage for demodulator
9Q channel amplifier input
10Q channel amplifier output
14supply voltage for VCO
15I channel amplifier output
16I channel amplifier input
handbook, halfpage
V
GND(D)
V
GND(A)
CC(A)
RF A
RF B
CC(D)
I
Q
1
2
3
4
TDA8040T
5
6
7
8
MGE510
Fig.2 Pin configuration.
16
15
14
13
12
11
10
9
I
in
I
out
V
CC(V)
VCOB
VCOA
GND(V)
Q
out
Q
in
FUNCTIONAL DESCRIPTION
The QPSK modulated RF signal is applied at the input of a
high gain RF amplifier. The amplified signal is then mixed
in a pair of mixers with two LO signals, which are
90 degrees out of phase, to produce the in-phase (I) and
quadrature (Q) signals. These two signals are separately
buffered to drive the external low-pass filters used for the
baseband filtering. The I and Q signals are then amplified
by two matched amplifiers designed to avoid crosstalk
between channels.
The VCO operates at twice the carrier frequency. Its output
signal is applied to a frequency divider (divide-by-2) to
produce the two LO signals which are 90 degrees out of
phase. The VCO is powered from the internal voltage
stabilizer to ensure good shift performance.
1996 Oct 084
Page 5
Philips SemiconductorsObjective specification
Quadrature demodulatorTDA8040T
LIMITING VALUES
In accordance with the Absolute Maximum Rating System (IEC 134).
SYMBOLPARAMETERCONDITIONSMIN.MAX.UNIT
V
CC(A)
V
CC(D)
V
CC(V)
V
n(max)
I
max
t
sc(max)
Z
L(IQ)
Z
LA(IQ)
V
VCO(p-p)
P
tot
T
stg
T
j
T
amb
supply voltage for I and Q amplifiers−0.3+6.0V
supply voltage for demodulator−0.3+6.0V
supply voltage for VCO−0.3+6.0V
maximum voltage on all pins−0.3V
CC
V
maximum sink or source current−10mA
maximum short-circuit time on outputs−10s
AC load impedance for
fi= 15 MHz35−Ω
I and Q channels
AC load impedance for
fi= 15 MHz300−Ω
I and Q output amplifiers
voltage drive level for external oscillator
−0.6V
signal (peak-to-peak value)
total power dissipationT
Inputs and outputs are protected against electrostatic discharge in normal handling. However, to be totally safe, it is
desirable to take normal precautions appropriate to handling MOS devices.
THERMAL CHARACTERISTICS
SYMBOLPARAMETERVALUEUNIT
R
th j-a
thermal resistance from junction to ambient in free air110K/W
1996 Oct 085
Page 6
Philips SemiconductorsObjective specification
Quadrature demodulatorTDA8040T
CHARACTERISTICS
V
CC(A)=VCC(D)=VCC(V)
measured in application circuit of Fig.10; unless otherwise specified.
SYMBOLPARAMETERCONDITIONSMIN.TYP.MAX.UNIT
Supplies
V
CC(A)
supply voltage for I and Q channel
amplifier
V
CC(D)
V
CC(V)
I
CC(A)
supply voltage for demodulator4.755.05.25V
supply voltage for VCO4.755.05.25V
supply current for I and Q channel
amplifier
I
CC(D)
I
CC(V)
supply current for demodulatornote 1−16−mA
supply current for VCOnote 1−34−mA
QPSK demodulator
f
i(RF)min
f
i(RF)max
R
i(RF)
X
i(RF)
V
i(RF)
R
o(IQ)
V
olQ(p-p)
minimum input IF frequency−−10.7MHz
maximum input IF frequency150−−MHz
resistive input impedance−50−Ω
reactive input impedance−5−Ω
operating input voltage646770dBµV
output resistance for I and Q channels455055Ω
output voltage for I and Q channels
(peak-to-peak value)
G
E
E
E
ch(IQ)
φ(IQ)
G(IQ)
G(tilt)
I and Q channel gainnote 32122.524dB
phase error between I and Q channelsnote 4−−3deg
gain error between I and Q channelsnote 4−−0.5dB
gain tilt error between I and Q channelsnote 5−−0.8dB
NFdouble sideband noise figureZ
IM3intermodulation distortion in the
I and Q channels
=5V; f
= 70 MHz; f
i(RF)
= 140 MHz; V
i(VCO)
=67dBµV; T
i(RF)
amb
=25°C;
4.755.05.25V
note 1−29−mA
note 2−85−mV
source
=50Ω;
−1720dB
note 6
note 745−−dB
1996 Oct 086
Page 7
Philips SemiconductorsObjective specification
Quadrature demodulatorTDA8040T
SYMBOLPARAMETERCONDITIONSMIN.TYP.MAX.UNIT
Voltage controlled oscillator (VCO)
f
iVCO(min)
f
iVCO(max)
∆ffrequency deviation−6−MHz
∆f
drift
∆f
shift
CNR
osc
V
osc(p-p)
R
source(osc)
minimum input oscillator frequency−−21.4MHz
maximum input oscillator frequency300−−MHz
frequency driftnote 8−−100kHz
frequency shift∆VCC=5%−−100kHz
oscillator carrier-to-noise ratioat 10 kHz;
−85−dBc/Hz
note 9
at 100 kHz;
−105−dBc/Hz
note 9
required voltage drive level for external
100−−mV
oscillator injection (peak-to-peak value)
source resistance for external oscillator
−−50Ω
generator
I and Q amplifiers
V
ilQ(p-p)
I and Q channel input voltage
note 10−0.1−V
(peak-to-peak value)
V
olQ(p-p)
I and Q channel output voltage
(peak-to-peak value)
note 10−0.5−V
at 1 dB gain
1.0−−V
compression;
note 10
IM3intermodulation distortion in the
note 1140−−dB
I and Q channels
B
α
V
IQ
ct(IQ)
O(IQ)
bandwidth of I and Q amplifiersat 0.5 dB25−−MHz
crosstalk between the I and Q channelsnote 1230−−dB
DC output voltage level for the
−2.45−V
I and Q amplifier
Z
Z
I(IQ)
O(IQ)
input impedance of the I and Q channels−10−kΩ
output impedance of the I and Q channels−50−Ω
Notes to the characteristics
1. Typical supply currents are defined for VCC=5V.
2. The I and Q channel output voltages are measured with the following conditions:
a) f
i(RF)
=1⁄2f
+ 500 kHz (70.5 MHz)
i(VCO)
b) the higher frequencies (140.5 MHz) are filtered out.
V
3. The I and Q channels gain is defined by.
G
IQ
IQ rms()
=
------------------------V
iRF rms()
The gains are measured with the conditions defined in note 2.
1996 Oct 087
Page 8
Philips SemiconductorsObjective specification
Quadrature demodulatorTDA8040T
4. The phase and gain error between the I and Q channel outputs is measured as follows:
a) the oscillator is tuned at f
b) a sine wave signal f
i(RF)
c) the higher frequencies (140.5 MHz) are filtered out.
Under these conditions, in each I and Q channel, a sine wave with a frequency of 500 kHz will be present.
These sine waves should be 90 degrees out of phase.
The phase error is defined as the phase quadrature imbalance between the I and Q channels.
The gain error is defined as the gain difference between the I and Q channels.
5. The tilt is defined as the difference between the maximum and the minimum channel gain measured in a frequency
band of 25 MHz around f
i(RF)
6. The specified noise figure is the maximum value obtained from I and Q channel noise measurement. The noise meter
is tuned to 10.7 MHz.
7. The specified intermodulation distortion is the minimum value obtained from intermodulation measurements in the
I and Q channels. Intermodulation is measured with two sine wave signals at f
an amplitude of 67 dBµV for each tone. The difference in level between the converted carriers (9 MHz and 11 MHz)
and the intermodulation products after frequency conversion (7 MHz and 13 MHz) is defined as IM3 (see Fig.3).
8. The temperature for the VCO frequency drift is defined for ∆T
Fig.10 with the following component values for the tank circuit:
a) L1: 22 nH (TOKO NE545BNA5 - 100082)
b) C1: 15 pF NP0
c) C2: 33 pF N220 (220 ppm/°C)
d) C3 and C4: 1 nF
e) C5: 3.3 µF
f) D1 and D2: BB133
g) R1 and R2: 100 kΩ
h) R3: 1 kΩ.
9. The phase noise is measured at the oscillator frequency (140 MHz). Due to the frequency divider, the phase noise
at the input of the mixers is 6 dB better (111 dBc/Hz at 100 kHz).
10. Output amplifiers are measured separately with an external DC bias applied at pins 9 and 16. The gain is measured
for an output signal of 500 mV (p-p) at fi= 500 kHz.
11. The specified intermodulation distortion is the minimum value obtained from intermodulation measurements in the
I and Q output amplifier. Intermodulation is measured with two sine wave signals at fi= 9 MHz and fi= 11 MHz at an
output level of 500 mV (p-p) for each tone.
12. The crosstalk between the I and Q amplifiers is defined as the ratio between the wanted output signal and the
disturbing signal from the other channel. To measure the crosstalk of the I and Q amplifiers, a sine wave
15 MHz, 0.1 V (p-p) is applied at the I input and a sine wave 15.5 MHz, 0.1 V (p-p) is applied at the Q input. For each
output, the difference in level is measured between the 15 MHz and the 15.5 MHz component. This difference is the
value of the crosstalk between the I and Q amplifiers.
= 140 MHz
i(VCO)
=1⁄2f
+ 500 kHz (70.5 MHz) is applied at the IF input
i(VCO)
. The specified tilt is the maximum tilt value found in one of the I or Q channels.
= 79 MHz and f
i(RF)
=25°C. It is measured in the application circuit of
amb
= 81 MHz with
i(RF)
1996 Oct 088
Page 9
Philips SemiconductorsObjective specification
Quadrature demodulatorTDA8040T
handbook, halfpage
IM3
75
9111315
Fig.3 IM3 definition.
MGE512
f
(MHz)
i
handbook, halfpage
13
C1
C2
12
C3
L1
C4
Fig.4 Tank circuit.
1996 Oct 089
R2
R1
D2
D1
MGE513
C5
R3
V
varicap
Page 10
Philips SemiconductorsObjective specification
Quadrature demodulatorTDA8040T
INPUT PIN CONFIGURATION
handbook, halfpage
V
CC(A)
GND(A)
Fig.5 Input circuitry V
handbook, halfpage
1
9,16
8
12
to GND(A).
CC(A)
MGE514
handbook, halfpage
Fig.6 Input circuitry V
handbook, halfpage
13
V
CC(A)
V
CC(A)
GND(A)
1
2,7
1
10,15
8
to GND(A).
CC(A)
MBE259
11
GND(V)
Fig.7 Input circuitry V
MGE515
to GND(V).
CC(V)
handbook, halfpage
14
V
CC(V)
45
3
GND(V)
Fig.9 Input circuitry V
to GND(V).
CC(V)
8
GND(A)
Fig.8 Input circuitry V
MBE262
to GND(A).
CC(A)
MBE261
1996 Oct 0810
Page 11
Philips SemiconductorsObjective specification
Quadrature demodulatorTDA8040T
APPLICATION INFORMATION
handbook, full pagewidth
+5 V
RF
in
+5 V
V
CC(A)
GND(D)
RF A
RF B
V
CC(D)
GND(A)
LOW-PASS
FILTER
I
1
AMP
I
2
AMP
3
4
AMP
5
6
Q
7
AMP
89
TDA8040T
LOW-PASS
FILTER
VOLTAGE
REFERENCE
0
2
÷
90
VCO
AMP
16
15
14
13
12
11
10
in
I
out
V
CC(V)
VCOB
VCOA
GND(V)
Q
out
Q
in
MGE516
+5 V
V
varicap
Fig.10 Application circuit.
1996 Oct 0811
Page 12
Philips SemiconductorsObjective specification
Quadrature demodulatorTDA8040T
PACKAGE OUTLINE
SO16: plastic small outline package; 16 leads; body width 3.9 mm
D
c
y
Z
16
pin 1 index
1
e
9
8
w M
b
p
SOT109-1
E
H
E
A
2
A
1
L
detail X
A
X
v M
A
Q
(A )
L
p
A
3
θ
02.55 mm
scale
DIMENSIONS (inch dimensions are derived from the original mm dimensions)
mm
OUTLINE
VERSION
SOT109-1
A
max.
1.75
0.069
A1A2A
0.25
1.45
0.10
1.25
0.010
0.057
0.004
0.049
3
0.25
0.01
IEC JEDEC EIAJ
076E07S MS-012AC
b
p
0.49
0.36
0.019
0.014
0.25
0.19
0.0100
0.0075
UNIT
inches
Note
1. Plastic or metal protrusions of 0.15 mm maximum per side are not included.
(1)E(1)(1)
cD
10.0
4.0
3.8
0.16
0.15
1.27
0.050
9.8
0.39
0.38
REFERENCES
1996 Oct 0812
eHELLpQZywv θ
1.05
0.041
1.0
0.4
0.039
0.016
0.7
0.25
0.6
0.028
0.010.004
0.020
EUROPEAN
PROJECTION
0.250.1
0.01
0.7
0.3
0.028
0.012
ISSUE DATE
95-01-23
97-05-22
o
8
o
0
6.2
5.8
0.244
0.228
Page 13
Philips SemiconductorsObjective specification
Quadrature demodulatorTDA8040T
SOLDERING
Introduction
There is no soldering method that is ideal for all IC
packages. Wave soldering is often preferred when
through-hole and surface mounted components are mixed
on one printed-circuit board. However, wave soldering is
not always suitable for surface mounted ICs, or for
printed-circuits with high population densities. In these
situations reflow soldering is often used.
This text gives a very brief insight to a complex technology.
A more in-depth account of soldering ICs can be found in
our
“IC Package Databook”
Reflow soldering
Reflow soldering techniques are suitable for all SO
packages.
Reflow soldering requires solder paste (a suspension of
fine solder particles, flux and binding agent) to be applied
to the printed-circuit board by screen printing, stencilling or
pressure-syringe dispensing before package placement.
Several techniques exist for reflowing; for example,
thermal conduction by heated belt. Dwell times vary
between 50 and 300 seconds depending on heating
method. Typical reflow temperatures range from
215 to 250 °C.
Preheating is necessary to dry the paste and evaporate
the binding agent. Preheating duration: 45 minutes at
45 °C.
(order code 9398 652 90011).
Wave soldering
Wave soldering techniques can be used for all SO
packages if the following conditions are observed:
• A double-wave (a turbulent wave with high upward
pressure followed by a smooth laminar wave) soldering
technique should be used.
• The longitudinal axis of the package footprint must be
parallel to the solder flow.
• The package footprint must incorporate solder thieves at
the downstream end.
During placement and before soldering, the package must
be fixed with a droplet of adhesive. The adhesive can be
applied by screen printing, pin transfer or syringe
dispensing. The package can be soldered after the
adhesive is cured.
Maximum permissible solder temperature is 260 °C, and
maximum duration of package immersion in solder is
10 seconds, if cooled to less than 150 °C within
6 seconds. Typical dwell time is 4 seconds at 250 °C.
A mildly-activated flux will eliminate the need for removal
of corrosive residues in most applications.
Repairing soldered joints
Fix the component by first soldering two diagonallyopposite end leads. Use only a low voltage soldering iron
(less than 24 V) applied to the flat part of the lead. Contact
time must be limited to 10 seconds at up to 300 °C. When
using a dedicated tool, all other leads can be soldered in
one operation within 2 to 5 seconds between
270 and 320 °C.
1996 Oct 0813
Page 14
Philips SemiconductorsObjective specification
Quadrature demodulatorTDA8040T
DEFINITIONS
Data sheet status
Objective specificationThis data sheet contains target or goal specifications for product development.
Preliminary specificationThis data sheet contains preliminary data; supplementary data may be published later.
Product specificationThis data sheet contains final product specifications.
Limiting values
Limiting values given are in accordance with the Absolute Maximum Rating System (IEC 134). Stress above one or
more of the limiting values may cause permanent damage to the device. These are stress ratings only and operation
of the device at these or at any other conditions above those given in the Characteristics sections of the specification
is not implied. Exposure to limiting values for extended periods may affect device reliability.
Application information
Where application information is given, it is advisory and does not form part of the specification.
LIFE SUPPORT APPLICATIONS
These products are not designed for use in life support appliances, devices, or systems where malfunction of these
products can reasonably be expected to result in personal injury. Philips customers using or selling these products for
use in such applications do so at their own risk and agree to fully indemnify Philips for any damages resulting from such
improper use or sale.
1996 Oct 0814
Page 15
Philips SemiconductorsObjective specification
Quadrature demodulatorTDA8040T
NOTES
1996 Oct 0815
Page 16
Philips Semiconductors – a worldwide company
Argentina: see South America
Australia: 34 Waterloo Road, NORTH RYDE, NSW 2113,
United States: 811 East Arques Avenue, SUNNYVALE, CA 94088-3409,
Tel. +1 800 234 7381
Uruguay: see South America
Vietnam: see Singapore
Yugoslavia: PHILIPS, Trg N. Pasica 5/v, 11000 BEOGRAD,
Tel. +381 11 625 344, Fax.+38111 635777
For all other countries apply to: Philips Semiconductors, Marketing & Sales Communications,
Building BE-p, P.O. Box 218, 5600 MD EINDHOVEN, The Netherlands, Fax. +31 4027 24825
The information presented in this document does not form part of any quotation or contract, is believed to be accurate and reliable and may be changed
without notice. No liability will be accepted by the publisher for any consequence of its use. Publication thereof does not convey nor imply any license
under patent- or other industrial or intellectual property rights.
Internet: http://www.semiconductors.philips.com
Printed in The Netherlands537021/50/02/pp16 Date of release: 1996 Oct 08Document order number: 9397 75001345
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