The third generation of MESH O VERLAY™ Power
MOSFETs for very high voltage exhibits unsurpassed on-resistance per unit area while integrating
back-to-back Zener diodes between gate and
source. Such arrangement gives extra ESD capability with higher ruggedness performance as requested by a large variety of single-switch applications.
APPLICATIONS
n
SINGLE-ENDED SMPS IN MONITORS,
COMPUTER AND INDUSTRIAL APPLICATION
n
WELDING EQUIPMENT
ABSOLUTE MAXIMUM RATINGS
SymbolParameterValueUnit
V
DS
V
DGR
V
GS
I
D
I
D
I
(1)
DM
P
TOT
I
GS
V
ESD(G-S)
dv/dt(
V
ISO
T
stg
T
j
(•)Pu l se width limited by safe operating area
Drain-source Voltage (VGS = 0)
Drain-gate Voltage (RGS = 20 kΩ)
800V
800V
Gate- source Voltage±25V
Drain Current (continuous) at TC = 25°C
Drain Current (continuous) at TC = 100°C
9.4A
5.9A
Drain Current (pulsed)38A
Total Dissipation at TC = 25°C
VDD = 100V, Tj = 150°C
(see test circuit, Figure 5)
35ns
72.2101nC
32ns
1.6V
730ns
GATE-SOURCE ZENER DIODE
SymbolParameterTest ConditionsMin.Typ.Max.Unit
BV
GSO
Gate-Source Breakdown
Igs=± 1mA (Open Drain)25V
Voltage
αTVoltage Thermal CoefficientT=25°C Note(3)1.3
I
RzDynamic Resistance
Note: 1. Pulsed: Pu l se duration = 300 µs, duty c ycle 1.5 %.
2. Pulse width li mited by safe operating area.
3. ∆V
= αT (25°-T ) BV
BV
GSO
(25°)
= 50 mA, VGS = 0
GS
90Ω
10
-4
/°C
PROTECTION FEATURES OF GATE-TO-SOURCE ZENER DIODES
The built-in back-to-back Zener diodes have specif ically been designed to enhanc e not only t he dev ice’s
ESD capability, but also to make them safely absorb possible voltage transients that may occasionally be
applied from gate to source. In this respect the 25V Zener voltage is appropriate to achieve an efficient
and cost-effective intervention to protect the device’s integrity. These integrated Zener diodes thus avoid
the usage of external components.
3/8
Page 4
STW9NC80Z
Safe Operating Area For TO-247Thermal Impedance For TO-247
Output Characteristics
Transfer Characteristics
Static Drain-source On ResistanceTransconductanc e
4/8
Page 5
Gate Charge vs Gate-source VoltageCapacitance Variations
Normalized On Resistance vs Temperatur eNormalized Gate Threshold Volta ge vs Temp.
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