VERY LOW FORWARD VOLTAGE DROP FO R
LESS POWER DISSIPATION
OPTIMIZED CONDUCTION/REVERSE LOSSES
TRADE-OFF WHICH MEANS THE HIGHEST
YIELD IN THE APPLICATIONS
SURFACE MOUNT MINIATURE PA CKAG E
DESCRIPTION
Single Schottky rectifier suited to Switched Mode
Power Supplies and high frequency DC to DC converters, freewheel diode and integrated circuit
latch up protection.
Packaged in SMA and SMB, this device is especially intended for use in parallel with MOSFETs in
synchronous rectification.
= 0.51A
Surge non repetitive forward currenttp = 10 ms Sinusoidal75A
Repetitive peak reverse currenttp = 2 µs F = 1kHz square1A
Non repetitive peak reverse currenttp = 100 µs square1A
Storage temperature range- 65 to + 150
°
°
dV/dtCritical rate of rise of reverse voltage10000V/µs
dPtot
* :
August 1999 - Ed: 4A
dTj
<
1
Rth(j−a
thermal runaway condition for a diode on its own heatsink
)
C
C
1/5
Page 2
STPS1L30A/U
THERMAL RESISTANCES
SymbolParameterValueUnit
R
th (j-l)
Junction to lead SMA30
SMB25
STATIC ELECTRICAL CHARACTERISTICS
SymbolParametersTests ConditionsMin.Typ.Max.Unit
*Reverse leakage CurrentTj = 25°CV
I
R
= V
R
RRM
200
Tj = 100°C615mA
*Forward Voltage dropTj = 25°CI
V
F
= 1 A0.395V
F
Tj = 125°C0.260.3
Tj = 25°CI
= 2 A0.445
F
Tj = 125°C0.3250.375
Pulse test :* tp = 380 µs, δ < 2%
To evaluate the maximum conduction losses use the following equation :
P = 0.225 x I
F(AV)
+ 0.075 I
F2(RMS )
°
C/W
µ
A
Fig. 1:
Average forward power dissipation versus
average forward current.
PF(av)(W)
0.50
δ = 0.2
0.45
0.40
δ = 0.05
δ = 0.1
δ = 0.5
0.35
0.30
0.25
δ = 1
0.20
0.15
T
0.10
0.05
0.00
0.00.20.40.60.81.01.2
Fig. 3-1:
Non repetitive surge peak forward cur-
IF(av) (A)
δ
=tp/T
tp
rent versus overload duration (maximum values)
(SMA).
IM(A)
10
8
6
4
I
M
2
0
1E-31E-21E-11E+0
t
δ
=0.5
t(s)
Ta=25°C
Ta=50°C
Ta=100°C
Fig. 2:
Average forward current versus ambient
temperature (δ=0.5).
IF(av)(A)
1.2
Rth(j-a)=Rth(j-l)
1.0
0.8
0.6
0.4
T
0.2
tp
=tp/T
δ
0.0
0255075100125150
Fig. 3-2:
Non repetitive surge peak forward cur-
Rth(j-a)=120°C/W
Rth(j-a)=100°C/W
Tamb(°C)
rent versus overload duration (maximum values)
(SMB).
IM(A)
10
8
6
4
I
M
2
0
1E-31E-21E-11E+0
t
δ
=0.5
t(s)
Ta=25°C
Ta=50°C
Ta=100°C
2/5
Page 3
STPS1L30A/U
Fig. 4-1:
Relative variation of thermal impedance
junction to ambient versus pulse duration (epoxy
printed circuit board, e(Cu)=35µm, recommended
pad layout) (SMB).
Zth(j-a)/Rth(j-a)
1.0
0.8
0.6
0.4
0.2
T
0.0
1E-21E-11E+01E+11E+25E+2
Fig. 5:
Reverse leakage current versus reverse
tp(s)
δ
=tp/T
tp
voltage applied (typical values).
IR(mA)
1E+2
1E+1
1E+0
Tj=150°C
Tj=125°C
Tj=100°C
Fig. 4-2:
Relative var iation of therma l impeda nce
junction to ambient versus pulse duration (epoxy
printed circuit board, e(Cu)=35µm, recommended
pad layout) (SMA).
Zth(j-a)/Rth(j-a)
1.0
0.8
0.6
0.4
0.2
T
tp
0.0
1E-21E-11E+01E+11E+25E+2
Fig. 6:
Junction capacitance versus reverse
tp(s)
δ
=tp/T
voltag e applied ( typical values).
C(pF)
500
F=1MHz
Tj=25°C
100
1E-1
1E-2
1E-3
051015202530
Fig. 7-1:
Forward voltage drop versus forward cur-
Tj=25°C
VR(V)
rent (typical values, high level).
IFM(A)
10.00
Tj=100°C
1.00
Tj=150°C
0.10
0.00.10.20.30.40.50.60.7
Tj=25°C
VFM(V)
10
125102030
Fig. 7-2:
Forward voltage drop versus forward c urrent (maximum values, low lev el).
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