Datasheet STP8NS25FP, STP8NS25 Datasheet (SGS Thomson Microelectronics)

Page 1
1/9April 2001
STP8NS25
STP8NS25FP
N-CHANNEL 250V - 0.38- 8A TO-220/TO-220FP
MESH OVERLAY™ MOSFET
TYPICAL R
DS
EXTREMELY HIGH dv /d t C APABILITY
100% AVALANCHE TESTED
DESCRIPTION
Using the latest high voltage MESH OVERLAY™ process, STMicroelectronics has designed an ad­vanced family of power MOSFETs with outstanding performance. The new patented STrip layout cou­pled with the Company’s proprietary edge termina­tion structure, makes it suitable in coverters for lighting applications.
APPLICATIONS
HIGH CURRENT, HIGH SPEED SWITCHING
SWITH MODE POWER SUPPLI ES ( SMPS)
DC-DC CONVERTERS FOR TELECOM,
INDUSTRIAL, AND LIGHTING EQUIPMENT
ABSOLUTE MAXIMUM RATINGS
(•)Pu l se width limited by safe operating area
TYPE V
DSS
R
DS(on)
I
D
STP8NS25 STP8NS25F P
250 V 250 V
< 0.45
< 0.45
8 A 8 A
Symbol Parameter Value Unit
STP8NS25 STP8NS25FP
V
DS
Drain-source Voltage (VGS = 0)
250 V
V
DGR
Drain-gate Voltage (RGS = 20 kΩ)
250 V
V
GS
Gate- source Voltage ± 20 V
I
D
Drain Current (continuos) at TC = 25°C
8 8(*) A
I
D
Drain Current (continuos) at TC = 100°C
5 5(*) A
I
DM
()
Drain Current (pulsed) 32 32(*) A
P
TOT
Total Dissipation at TC = 25°C
80 30 W
Derating Factor 0.64 0.24 W/°C
dv/dt (1) Peak Diode Recovery voltage slope 5 V/ns
V
ISO
Insulation Withstand Voltage (DC) - 2000 V
T
stg
Storage Temperature –65 to 150 °C
T
j
Max. Operating Junction Temperature 150 °C
(1) I
SD
8A, di/dt≤300 A/µs, V
DD
V
(BR)DSS
, Tj≤T
jMAX
(*)Limit ed only by max i mum tempe rat ure allowed
INTERNAL SCHEMATIC DIAGRAM
TO-220
1
2
3
1
2
3
TO-220FP
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STP8NS25/STP8NS25FP
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THERMA L D ATA
ELECTRICAL CHARACTERISTICS (TCASE = 25 °C UNLESS OTHERWISE SPECIFIED)
OFF
ON
(1)
DYNAMIC
TO-220 TO-220FP
Rthj-case Thermal Resistance Junction-case Max 1.56 4.11 °C/W
Rthj-amb Thermal Resistance Junction-ambient Max 62.5 °C/W
Rthc-sink Thermal Resistance Case-sink Typ 0.5 °C/W
T
l
Maximum Lead Temperature For Soldering Purpose 300 °C
Symbol Parameter Test Conditions Min. Typ. Max. Unit
V
(BR)DSS
Drain-source Breakdown Voltage
ID = 250 µA, VGS = 0 250 V
I
DSS
Zero Gate Voltage Drain Current (V
GS
= 0)
V
DS
= Max Rating
A
V
DS
= Max Rating, TC = 125 °C
10 µA
I
GSS
Gate-body Leakage Current (V
DS
= 0)
V
GS
= ±20V ±100 nA
Symbol Parameter Test Conditions Min. Typ. Max. Unit
V
GS(th)
Gate Threshold Voltage
V
DS
= VGS, ID = 250µA
234V
R
DS(on)
Static Drain-source On Resistance
VGS = 10V, ID = 4 A
0.38 0.45
I
D(on)
On State Drain Current VDS > I
D(on)
x R
DS(on)max,
V
GS
=10V
8A
Symbol Parameter Test Conditions Min. Typ. Max. Unit
g
fs
(1) Forward Transconductance VDS > I
D(on)
x R
DS(on)max,
I
D
=4A
78 S
C
iss
Input Capacitance
V
DS
= 25V, f = 1 MHz, VGS = 0
770 pF
C
oss
Output Capacitance 118 pF
C
rss
Reverse Transfer Capacitance
48 pF
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3/9
STP8NS25/STP8NS25FP
Safe Operating Area for TO-220
ELECTRICAL CHARACTERISTICS (CONTINUED)
SWITCHING ON
SWITCHING OFF
SOURCE DRAIN DIODE
Note: 1. Pulsed: Pu l se duration = 300 µs, duty cycle 1.5 %.
2. Pulse width li mited by safe operating ar ea.
Symbol Parameter Test Conditions Min. Typ. Max. Unit
t
d(on)
Turn-on Delay Time
V
DD
= 125 V, ID = 4 A RG= 4.7Ω VGS = 10 V (see test circuit, Figure 3)
13 ns
t
r
Rise Time 18 ns
Q
g
Total Gate Charge
V
DD
= 200V, ID = 8 A, VGS = 10V
37 51.8 nC
Q
gs
Gate-Source Charge 5.2 nC
Q
gd
Gate-Drain Charge 14.8 nC
Symbol Parameter Test Conditions Min. Typ. Max. Unit
t
d(Voff)
t
f
Turn-off- Delay Time Fall Time
VDD = 125V, ID = 4 A, RG=4.7Ω, V
GS
= 10V
(see test circuit, Figure 3)
51 16
ns ns
t
r(Voff)
t
f
t
c
Off-voltage Rise Time Fall Time Cross-over Time
V
clamp
= 200V, ID = 8 A,
R
G
=4.7Ω, V
GS
= 10V
(see test circuit, Figure 5)
12.5
12.5 28
ns ns ns
Symbol Parameter Test Conditions Min. Typ. Max. Unit
I
SD
Source-drain Current 8 A
I
SDM
(2)
Source-drain Current (pulsed) 32 A
VSD (1)
Forward On Voltage
ISD = 8 A, VGS = 0
1.7 V
t
rr
Reverse Recovery Time
I
SD
= 8 A, di/dt = 100A/µs VDD = 30V, Tj = 150°C (see test circuit, Figure 5)
198 ns
Q
rr
Reverse Recovery Charge 1.1
µ
C
I
RRM
Reverse Recovery Current 11.3 A
Safe Operating Area for TO-220FP
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STP8NS25/STP8NS25FP
4/9
Thermal Impedence for TO-220F P
Static Drain-source On ResistanceTransconductance
Output Characteristics Transfer Characteristics
Therma l Impedence f or TO-2 20
Page 5
5/9
STP8NS25/STP8NS25FP
Source-drain Diode Forward Characteristics
Normalized On Resistance vs TemperatureNormalized Gate Thereshold Voltage vs Temp.
Gate Charge vs Gate-source Voltage Capacitance Variations
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STP8NS25/STP8NS25FP
6/9
Fig. 5: Test Circuit For Inductive Load Switching And Diode Recovery Times
Fig. 4: Gate Charge test Circuit
Fig. 2: Unclamped Inductive WaveformFig. 1: Unclamped Inductive Load Test Circuit
Fig. 3: Switching Times Test Circuit For
Resistive Load
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7/9
STP8NS25/STP8NS25FP
DIM.
mm inch
MIN. TYP. MAX. MIN. TYP. MAX.
A 4.40 4.60 0.173 0.181 C 1.23 1.32 0.048 0.051 D 2.40 2.72 0.094 0.107
D1 1.27 0.050
E 0.49 0.70 0.019 0.027
F 0.61 0.88 0.024 0.034 F1 1.14 1.70 0.044 0.067 F2 1.14 1.70 0.044 0.067
G 4.95 5.15 0.194 0.203 G1 2.4 2.7 0.094 0.106 H2 10.0 10.40 0.393 0.409 L2 16.4 0.645 L4 13.0 14.0 0.511 0.551 L5 2.65 2.95 0.104 0.116 L6 15.25 15.75 0.600 0.620 L7 6.2 6.6 0.244 0.260 L9 3.5 3.93 0.137 0.154
DIA. 3.75 3.85 0.147 0.151
L6
A
C
D
E
D1
F
G
L7
L2
Dia.
F1
L5
L4
H2
L9
F2
G1
TO-220 MECHANICAL DATA
P011C
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STP8NS25/STP8NS25FP
8/9
DIM.
mm inch
MIN. TYP. MAX. MIN. TYP. MAX.
A 4.4 4.6 0.173 0.181
B 2.5 2.7 0.098 0.106
D 2.5 2.75 0.098 0.108
E 0.45 0.7 0.017 0.027
F 0.75 1 0.030 0.039 F1 1.15 1.7 0.045 0.067 F2 1.15 1.7 0.045 0.067
G 4.95 5.2 0.195 0.204 G1 2.4 2.7 0.094 0.106
H 10 10.4 0.393 0.409 L2 16 0.630 L3 28.6 30.6 1.126 1.204 L4 9.8 10.6 0.385 0.417 L6 15.9 16.4 0.626 0.645 L7 9 9.3 0.354 0.366
Ø 3 3.2 0.118 0.126
L2
A
B
D
E
H
G
L6
¯
F
L3
G1
123
F2
F1
L7
L4
TO-220FP MECHANICAL DATA
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9/9
STP8NS25/STP8NS25FP
Information furnished is believed to be accurate and reliable. However, STMicroelectronics assumes no responsibility for the consequences of use of such informa tion n or for an y infring ement of patent s or other rig hts of third part ies which may resu lt from its use . No l i cen se i s granted by implication or otherwise under any patent or patent rights of STMicroelectronics. Specification mentioned in this publication are subject to change without notice. This publication supersedes and replaces all information previously supplied. STMicroelectronics products are not authorized for use as critical compo nents in life support devices or systems without express written approval of STMicroelectronics.
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© 2001 STMicroelectronics – Printed in Italy – All Rights Reserved
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