Datasheet STP8NA50FI, STP8NA50 Datasheet (SGS Thomson Microelectronics)

Page 1
STP8NA50
STP8NA50FI
N - CHANNEL ENHANCEMENT MODE
FAST POWER MOS TRANSISTOR
TYPE V
STP 8NA50 STP 8NA50FI
TYPICAL R
± 30V GATE TO SOURCE VOLTAGE RATING
REPETITIVE AVALANCHE DATA AT 100
LOW INTRINSIC CAPACITANCES
GATE GHARGE MINIMIZED
REDUCED THRESHOLD VOLTAGE SPREAD
DS(on)
DSS
500 V 500 V
= 0.7
R
DS(on)
I
D
<0.85 <0.858A4.5 A
o
C
DESCRIPTION
This series of POWER MOSFETS represents the most advanced high voltage technology. The optimized cell layout coupled with a new proprietary edge termination concur to give the device low R
and gate charge, unequalled
DS(on)
ruggedness and superior switching performance.
APPLICATIONS
HIGH CURRENT, HIGH SPEED SWITCHING
SWITCH MODE POWERSUPPLIES (SMPS)
DC-AC CONVERTERS FOR WELDING
EQUIPMENT AND UNINTERRUPTIBLE POWER SUPPLIES AND MOTOR DRIVE
3
2
1
TO-220 ISOWATT220
INTERNAL SCHEMATIC DIAGRAM
3
2
1
ABSOLUTE MAXIMUM RATINGS
Symb o l Paramet er Val u e Unit
ST P8NA50 ST P8NA50FI
V
V
V
I
DM
P
V
T
() Pulsewidth limited bysafe operating area
November 1996
Drain - s ource Voltage (VGS=0) 500 V
DS
Drain - gat e Voltage (RGS=20kΩ)500V
DGR
Gate-source Voltage ± 30 V
GS
Drain Current (continuous) at Tc=25oC84.5A
I
D
Drain Current (continuous) at Tc=100oC5.3 3A
I
D
(•) Drain Current (pulsed) 32 32 A
Total Di ssipation a t Tc=25oC 125 45 W
tot
Derating F actor 1 0.36 W/ Ins ulation Withs t and Voltage (DC) 2000 V
ISO
St or a ge Tem perature -65 t o 150
stg
Max. Operating Jun ction T emperature 150
T
j
o o
o
C
C C
1/10
Page 2
STP8NA50/FI
THERMAL DATA
TO-220 ISOW ATT 220
R
thj-case
R
thj-amb
R
thc-sink
T
AVALANCHE CHARACTERISTICS
Symbol Parameter Max Value Uni t
I
AR
E
E
I
AR
Thermal Resistance J unction- c ase Max 1 2.78 Thermal Resistance Junc tion-am bie nt Max
Thermal Resistance Cas e-sink Typ Maximum Lead Temperature For So ldering Purpose
l
Avalanc h e Cu rr ent , Repet itive or Not-Rep etitive (pulse width limited by Tjmax, δ <1%)
Single Pul se Avalanche Ener gy
AS
(starti ng T Repetitive Avalanc he Energ y
AR
=25oC, ID=IAR,VDD=50V)
j
(pulse width limited by Tjmax, δ <1%) Avalanc h e Cu rr ent , Repet itive or Not-Rep etitive
(Tc= 100oC, pulse width l imited by Tjmax, δ <1%)
62.5
0.5
300
8A
350 mJ
11 mJ
5.3 A
o
C/W
o
C/W
o
C/W
o
C
ELECTRICAL CHARACTERISTICS (T
=25oC unless otherwisespecified)
case
OFF
Symbol Parameter Test Conditions Min. Typ. M ax. Unit
V
(BR)DSS
Drain - s ource
ID=250µAVGS= 0 500 V
Break d own Volta ge
I
DSS
I
GSS
Zer o G at e V oltage Drain Current (VGS=0)
Gat e- body Leakage Current (V
DS
=0)
VDS=MaxRating VDS= Max Rating x 0.8 Tc=125oC
= ± 30 V ± 10 0 nA
V
GS
25
250
ON (∗)
Symbol Parameter Test Conditions Min. Typ. M ax. Unit
V
GS(th)
R
DS(on)
Gate Threshold Voltage VDS=VGSID=250µA 2.25 3 3.75 V St at ic Drain-s our ce O n
VGS=10V ID=4A 0.7 0.85
Resistance
I
D(on)
On State Drain Current VDS>I
D(on)xRDS(on)max
8A
VGS=10V
DYNAMIC
Symbol Parameter Test Conditions Min. Typ. M ax. Unit
()Forward
g
fs
Tr ansconductance
C C C
Input Capacitance
iss
Out put Capacitance
oss
Reverse Transfer
rss
Capacitance
VDS>I
D(on)xRDS(on)maxID
=4A 4.5 6.5 S
VDS=25V f=1MHz VGS= 0 1200
190
55
1600
250
75
µA µA
pF pF pF
2/10
Page 3
STP8NA50/FI
ELECTRICAL CHARACTERISTICS (continued)
SWITCHING ON
Symbol Parameter Test Conditions Min. Typ. M ax. Unit
t
d(on)
(di/dt)
Q Q Q
Turn-on T ime
t
Rise Time
r
Turn-on Current S lope VDD=400V ID=8A
on
Total Gate Charge
g
Gat e- Source Charge
gs
Gate-Drain Charge
gd
SWITCHING OFF
Symbol Parameter Test Conditions Min. Typ. M ax. Unit
t
r(Voff)
t
Off -voltage Rise Time
t
Fall Time
f
Cross-over Time
c
SOURCE DRAINDIODE
VDD=250V ID=4A RG=4.7 Ω VGS=10V
18 25
(see test circuit, figure 3)
220 A/µs RG=47 Ω VGS=10V (see test circuit, figure 5)
VDD= 400 V ID=8A VGS=10V 55
9
25
VDD=400V ID=8A RG=4.7 Ω VGS=10V (see test circuit, figure 5)
15 15 25
25 35
75 nC
22 22 35
ns ns
nC nC
ns ns ns
Symbol Parameter Test Conditions Min. Typ. M ax. Unit
I
I
SDM
SD
Source-drain C urrent
()
Source-drain C urrent
8
32
(pulsed)
V
(∗) Forward On Voltage ISD=8A VGS=0 1.6 V
SD
t
Reverse Recovery
rr
Time
Q
Reverse Recovery
rr
ISD=8A di/dt=100A/µs VDD= 100 V Tj=150oC (see test circuit, figure 5)
500
6.5
Charge
I
RRM
Reverse Recovery
26
Current
() Pulsed:Pulse duration = 300 µs, dutycycle 1.5 % () Pulse widthlimited by safeoperating area
Safe Operating Areas for TO-220 Safe Operating Areas forISOWATT220
A A
ns
µC
A
3/10
Page 4
STP8NA50/FI
Thermal ImpedeanceFor TO-220
Derating Curve For TO-220
Thermal ImpedanceFor ISOWATT220
Derating Curve For ISOWATT220
Output Characteristics
4/10
Transfer Characteristics
Page 5
Transconductance Static Drain-source On Resistance
Gate Charge vs Gate-source Voltage Capacitance Variations
STP8NA50/FI
Temperature
Normalized On Resistance vs TemperatureNormalized Gate Threshold Voltage vs
5/10
Page 6
STP8NA50/FI
Turn-on Current Slope Turn-off Drain-source Voltage Slope
Cross-over Time Switching Safe Operating Area
Accidental Overload Area Source-drain Diode ForwardCharacteristics
6/10
Page 7
STP8NA50/FI
Fig. 1: Unclamped Inductive Load Test Circuits
Fig. 3: Switching Times Test Circuits For
Resistive Load
Fig. 2: Unclamped Inductive Waveforms
Fig. 4: Gate Charge Test Circuit
Fig. 5: Test Circuit For Inductive Load Switching
And Diode Reverse Recovery Time
7/10
Page 8
STP8NA50/FI
TO-220 MECHANICAL DATA
DIM.
mm inch
MIN. TYP. MAX. MIN. TYP. MAX.
A 4.40 4.60 0.173 0.181 C 1.23 1.32 0.048 0.051 D 2.40 2.72 0.094 0.107
D1 1.27 0.050
E 0.49 0.70 0.019 0.027
F 0.61 0.88 0.024 0.034 F1 1.14 1.70 0.044 0.067 F2 1.14 1.70 0.044 0.067
G 4.95 5.15 0.194 0.203 G1 2.4 2.7 0.094 0.106 H2 10.0 10.40 0.393 0.409
L2 16.4 0.645 L4 13.0 14.0 0.511 0.551 L5 2.65 2.95 0.104 0.116 L6 15.25 15.75 0.600 0.620 L7 6.2 6.6 0.244 0.260 L9 3.5 3.93 0.137 0.154
DIA. 3.75 3.85 0.147 0.151
E
A
L4
D
F2
F1
G1
H2
G
F
C
D1
L2
Dia.
L5
L7
L6
L9
P011C
8/10
Page 9
ISOWATT220 MECHANICAL DATA
STP8NA50/FI
DIM.
MIN. TYP. MAX. MIN. TYP. MAX.
A 4.4 4.6 0.173 0.181 B 2.5 2.7 0.098 0.106
D 2.5 2.75 0.098 0.108
E 0.4 0.7 0.015 0.027
F 0.75 1 0.030 0.039 F1 1.15 1.7 0.045 0.067 F2 1.15 1.7 0.045 0.067
G 4.95 5.2 0.195 0.204
G1 2.4 2.7 0.094 0.106
H 10 10.4 0.393 0.409 L2 16 0.630 L3 28.6 30.6 1.126 1.204 L4 9.8 10.6 0.385 0.417 L6 15.9 16.4 0.626 0.645 L7 9 9.3 0.354 0.366
Ø 3 3.2 0.118 0.126
mm inch
E
A
D
B
L3
L6
L7
Ø
F1
F
G1
H
G
F2
123
L2
L4
P011G
9/10
Page 10
STP8NA50/FI
Information furnished is believed to be accurate and reliable. However, SGS-THOMSON Microelectronics assumes no responsability for the consequences of use of such informationnor for any infringement of patents or other rights of third parties which mayresults fromits use. No licenseis grantedby implication orotherwise underany patent or patentrights ofSGS-THOMSONMicroelectronics. Specifications mentioned in thispublication aresubject to change withoutnotice. Thispublication supersedes and replaces all information previously supplied. SGS-THOMSONMicroelectronics products are notauthorized for use as critical components in lifesupportdevices orsystemswithout express writtenapproval ofSGS-THOMSONMicroelectonics.
1996 SGS-THOMSON Microelectronics -Printedin Italy- All Rights Reserved
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