Datasheet STP6NA80FI, STP6NA80 Datasheet (SGS Thomson Microelectronics)

Page 1
STP6NA80
STP6NA80FI
N - CHANNEL ENHANCEMENT MODE
FAST POWER MOS TRANSISTOR
TYPE V
STP 6NA80 STP 6NA80FI
TYPICAL R
± 30V GATE TO SOURCE VOLTAGE RATING
REPETITIVE AVALANCHE DATA AT 100
LOW INTRINSIC CAPACITANCES
GATE GHARGE MINIMIZED
REDUCED THRESHOLD VOLTAGE SPREAD
DS(on)
DSS
800 V 800 V
= 1.68
R
DS(on)
<1.9 <1.9
I
D
5.7 A
3.4 A
o
C
DESCRIPTION
This series of POWER MOSFETS represents the most advanced high voltage technology. The optimized cell layout coupled with a new proprietary edge termination concur to give the device low R
and gate charge, unequalled
DS(on)
ruggedness and superior switching performance.
APPLICATIONS
HIGH CURRENT, HIGH SPEED SWITCHING
SWITCH MODE POWERSUPPLIES (SMPS)
DC-AC CONVERTERS FOR WELDING
EQUIPMENT AND UNINTERRUPTIBLE POWER SUPPLIES AND MOTOR DRIVE
3
2
1
TO-220 ISOWATT220
INTERNAL SCHEMATIC DIAGRAM
3
2
1
ABSOLUTE MAXIMUM RATINGS
Symb o l Paramet er Val u e Unit
ST P6NA80 ST P6NA80FI
V
V
V
I
DM
P
V
T
() Pulsewidth limited bysafe operating area
November 1996
Drain - s ource Voltage (VGS=0) 800 V
DS
Drain - gat e Voltage (RGS=20kΩ)800V
DGR
Gate-source Voltage ± 30 V
GS
Drain Current (continuous) at Tc=25oC5.73.4A
I
D
Drain Current (continuous) at Tc=100oC3.6 2.1A
I
D
(•) Drain Current (pulsed) 23 23 A
Total Di ssipation at Tc=25oC 125 45 W
tot
Derating F actor 1 0.36 W/ Ins ulation Withs t and Voltage (DC) 2000 V
ISO
St or a ge Tem perature -65 to 150
stg
Max. Operating Junction Temperature 150
T
j
o o
o
C
C C
1/10
Page 2
STP6NA80/FI
THERMAL DATA
TO-220 ISOW ATT 220
R
thj-case
R
thj-amb
R
thc-sink
T
AVALANCHE CHARACTERISTICS
Symbol Parameter Max Value Uni t
I
AR
E
E
I
AR
Thermal Resistance J unction- c ase Max 1 2.78 Thermal Resistance Junc tion-am bie nt Max
Thermal Resistance Cas e-sink Typ Maximum Lead T emperature For Soldering Purpose
l
Avalanc h e Cu rr ent , Repet itive or Not-R ep et itive (pulse width limited by Tjmax, δ <1%)
Single Pul se Avalanche Ener gy
AS
(starti ng T Repetitive Avalanc he Energ y
AR
=25oC, ID=IAR,VDD=50V)
j
(pulse width limited by Tjmax, δ <1%) Avalanc h e Cu rr ent , Repet itive or Not-R ep et itive
(Tc= 100oC, pulse width limited by Tjmax, δ <1%)
62.5
0.5
300
5.7 A
165 mJ
6.5 mJ
3.6 A
o
C/W
o
C/W
o
C/W
o
C
ELECTRICAL CHARACTERISTICS (T
=25oC unless otherwise specified)
case
OFF
Symbol Parameter Test Conditions Min. Typ. Max. Unit
V
(BR)DSS
Drain - s ource
ID=250µAVGS= 0 800 V
Break d own Volta ge
I
DSS
I
GSS
Zer o Gate Volt age Drain Current (VGS=0)
Gat e- body Leak age Current (V
DS
=0)
VDS=MaxRating VDS= Max Rating x 0 .8 Tc=125oC
= ± 30 V ± 100 nA
V
GS
25
250
ON ()
Symbol Parameter Test Conditions Min. Typ. Max. Unit
V
GS(th)
R
DS(on)
Gate Threshold Voltage VDS=VGSID=250µA 2.25 3 3.75 V St at ic Drain-s our ce O n
VGS=10V ID=3A 1.68 1.9
Resistance
I
D(on)
On State Drain Current VDS>I
D(on)xRDS(on)max
6A
VGS=10V
DYNAMIC
Symbol Parameter Test Conditions Min. Typ. Max. Unit
()Forward
g
fs
Tr ansconductance
C C C
Input Capacitance
iss
Out put Capacitance
oss
Reverse Transfer
rss
Capacitance
VDS>I
D(on)xRDS(on)maxID
=3A 4 6.1 S
VDS=25V f=1MHz VGS= 0 1330
160
40
1750
210
55
µA µA
pF pF pF
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Page 3
STP6NA80/FI
ELECTRICAL CHARACTERISTICS (continued)
SWITCHING ON
Symbol Parameter Test Conditions Min. Typ. Max. Unit
t
d(on)
(di/dt)
Q Q Q
Turn-on T im e
t
Rise Time
r
Turn-on C urrent S lope VDD=640V ID=6A
on
Total Gate Charge
g
Gat e- Source Charge
gs
Gate-Drain Charge
gd
SWITCHING OFF
Symbol Parameter Test Conditions Min. Typ. Max. Unit
t
r(Voff)
t
Off -voltage R ise Time
t
Fall Time
f
Cross-over Time
c
SOURCE DRAIN DIODE
VDD=400V ID=3A RG=47 Ω VGS=10V
35 95
(see test circuit, figure 3)
170 A/µs RG=47 Ω VGS=10V (see test circuit, figure 5)
VDD= 640 V ID=6A VGS=10V 58
8
27
VDD=640V ID=6A RG=47 Ω VGS=10V (see test circuit, figure 5)
90 25
125
45
125
78 nC
120
35
165
ns ns
nC nC
ns ns ns
Symbol Parameter Test Conditions Min. Typ. Max. Unit
I
I
SDM
SD
Source-drain Current
()
Source-drain Current
5.7 23
(pulsed)
V
(∗) Forward On Voltage ISD=6A VGS=0 1.6 V
SD
t
Reverse Recovery
rr
Time
Q
Reverse Recovery
rr
ISD=6A di/dt=100A/µs VDD= 100 V Tj=150oC (see test circuit, figure 5)
850
15
Charge
I
RRM
Reverse Recovery
35
Current
() Pulsed:Pulse duration = 300 µs, dutycycle 1.5 % () Pulse widthlimited by safeoperating area
Safe Operating Areas for TO-220 Safe Operating Areas for ISOWATT220
A A
ns
µC
A
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Page 4
STP6NA80/FI
Thermal ImpedeanceFor TO-220
Derating Curve For TO-220
Thermal Impedance For ISOWATT220
Derating Curve For ISOWATT220
Output Characteristics
4/10
Transfer Characteristics
Page 5
Transconductance Static Drain-source On Resistance
Gate Charge vs Gate-sourceVoltage Capacitance Variations
STP6NA80/FI
Temperature
Normalized On Resistance vs TemperatureNormalized Gate Threshold Voltage vs
5/10
Page 6
STP6NA80/FI
Turn-on Current Slope Turn-off Drain-source Voltage Slope
Cross-over Time Switching Safe Operating Area
Accidental Overload Area Source-drain Diode ForwardCharacteristics
6/10
Page 7
STP6NA80/FI
Fig. 1: Unclamped Inductive Load Test Circuits
Fig. 3: Switching Times Test Circuits For
Resistive Load
Fig. 2: Unclamped Inductive Waveforms
Fig. 4: Gate Charge Test Circuit
Fig. 5: Test Circuit For Inductive Load Switching
And Diode Reverse Recovery Time
7/10
Page 8
STP6NA80/FI
TO-220 MECHANICAL DATA
DIM.
mm inch
MIN. TYP. MAX. MIN. TYP. MAX.
A 4.40 4.60 0.173 0.181 C 1.23 1.32 0.048 0.051 D 2.40 2.72 0.094 0.107
D1 1.27 0.050
E 0.49 0.70 0.019 0.027
F 0.61 0.88 0.024 0.034 F1 1.14 1.70 0.044 0.067 F2 1.14 1.70 0.044 0.067
G 4.95 5.15 0.194 0.203 G1 2.4 2.7 0.094 0.106 H2 10.0 10.40 0.393 0.409
L2 16.4 0.645 L4 13.0 14.0 0.511 0.551 L5 2.65 2.95 0.104 0.116 L6 15.25 15.75 0.600 0.620 L7 6.2 6.6 0.244 0.260 L9 3.5 3.93 0.137 0.154
DIA. 3.75 3.85 0.147 0.151
E
A
L4
D
F2
F1
G1
H2
G
F
C
D1
L2
Dia.
L5
L7
L6
L9
P011C
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Page 9
ISOWATT220 MECHANICAL DATA
STP6NA80/FI
DIM.
MIN. TYP. MAX. MIN. TYP. MAX.
A 4.4 4.6 0.173 0.181 B 2.5 2.7 0.098 0.106
D 2.5 2.75 0.098 0.108
E 0.4 0.7 0.015 0.027
F 0.75 1 0.030 0.039 F1 1.15 1.7 0.045 0.067 F2 1.15 1.7 0.045 0.067
G 4.95 5.2 0.195 0.204
G1 2.4 2.7 0.094 0.106
H 10 10.4 0.393 0.409 L2 16 0.630 L3 28.6 30.6 1.126 1.204 L4 9.8 10.6 0.385 0.417 L6 15.9 16.4 0.626 0.645 L7 9 9.3 0.354 0.366
Ø 3 3.2 0.118 0.126
mm inch
E
A
D
B
L3
L6
L7
Ø
F1
F
G1
H
G
F2
123
L2
L4
P011G
9/10
Page 10
STP6NA80/FI
Information furnished is believed to be accurate and reliable. However, SGS-THOMSONMicroelectronics assumes no responsability for the consequences of use of such information nor for any infringement of patents or other rights of third partieswhich may results from its use. No licenseis granted by implication orotherwise under any patentor patent rights of SGS-THOMSONMicroelectronics. Specificationsmentioned in thispublication are subject to change withoutnotice. Thispublication supersedes andreplacesall informationpreviously supplied. SGS-THOMSONMicroelectronics products are notauthorizedfor use ascriticalcomponents in lifesupportdevices or systems without express writtenapproval ofSGS-THOMSONMicroelectonics.
1996 SGS-THOMSON Microelectronics -Printed in Italy- AllRightsReserved
Australia- Brazil -Canada -China - France- Germany - HongKong- Italy- Japan- Korea- Malaysia - Malta- Morocco- TheNetherlands -
Singapore - Spain - Sweden- Switzerland-Taiwan - Thailand- UnitedKingdom - U.S.A
SGS-THOMSONMicroelectronics GROUPOF COMPANIES
.
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