Datasheet STP6N60FI Datasheet (SGS Thomson Microelectronics)

Page 1
STP6N60FI
N - CHANNEL ENHANCEMENT MODE
POWER MOS TRANSISTOR
TYPE V
DSS
R
DS(on)
I
D
STP 6N60FI 600 V < 1. 2 3.8 A
TYPICAL R
AVALANCHE RUGGED TECHNOLOGY
100% AVALANCHE TESTED
APPLICATION ORIENTED
DS(on)
=1
o
C
CHARACTERIZATION
APPLICATIONS
HIGH CURRENT, HIGH SPEED SWITCHING
SWITCH MODE POWERSUPPLIES (SMPS)
CHOPPER REGULATORS, CONVERTERS,
MOTOR CONTROL, LIGHTING FOR INDUSTRIAL AND CONSUMER ENVIRONMENT
3
2
1
ISOWATT220
INTERNAL SCHEMATIC DIAGRAM
ABSOLUTE MAXIMUM RATINGS
Symb o l Paramet er Val u e Unit
V
V
V
I
DM
P
V
T
() Pulsewidth limited bysafe operating area
May 1993
Drain - s ource Voltage (VGS= 0) 600 V
DS
Drain- gate Voltage (RGS=20kΩ) 600 V
DGR
Gate-source Voltage ± 20 V
GS
Drain Current (continuous) at Tc=25oC3.8A
I
D
I
Drain Current (continuous) at Tc=100oC2.4A
D
(•) Drain Current (pulsed) 24 A
Total D i ssipation at Tc=25oC40W
tot
Derat ing Factor 0.32 W/ Ins ulation Withs t and Voltage (DC) 2000 V
ISO
St or a ge Tem perature -65 to 150
stg
T
Max. Operating Junctio n Temperatur e 150
j
o
C
o
C
o
C
1/9
Page 2
STP6N60FI
THERMAL DATA
R
thj-case
R
thj-amb
R
thj-amb
T
AVALANCHE CHARACTERISTICS
Symbol Parameter Max Valu e Uni t
I
AR
E
E
I
AR
Thermal Res istance Junction -c as e Max Thermal Resis tance Junction- ambient Max Thermal Res istance Case-sink Typ Maximum Lead Temperature For Soldering Purpose
l
Avalanc h e Cu rr ent , Repet itive or Not-R epetitive (pulse width limited by Tjmax, δ <1%)
Single Pul se Avalanche Ener gy
AS
(starti ng Tj=25oC, ID=IAR,VDD=25V) Repetitive Avalanc he Energ y
AR
(pulse width limited by Tjmax, δ <1%) Avalanc h e Cu rr ent , Repet itive or Not-R epetitive
(Tc= 100oC, puls e width limited by Tjmax, δ <1%)
3.12
62.5
0.5
300
6A
370 mJ
17 mJ
3.7 A
o
C/W
o
C/W
o
C/W
o
C
ELECTRICAL CHARACTERISTICS (T
=25oC unless otherwise specified)
case
OFF
Symbol Parameter Test Condition s Min. Typ. Max. Unit
V
(BR)DSS
Drain - s ource
ID=250µAVGS= 0 600 V
Break d own Volta ge
I
DSS
I
GSS
Zer o Gate Voltage Drain Current (V
GS
Gat e- body Leakage
=0)
=MaxRating
V
DS
V
= Max R ating x 0.8 Tc=125oC
DS
250
1000µAµA
VGS= ± 20 V ± 100 nA
Current (VDS=0)
ON ()
Symbol Parameter Test Condition s Min. Typ. Max. Unit
V
GS(th)
R
DS(on)
I
D(on)
Gate Threshold V oltage VDS=VGSID=250µA234V St at ic Drain-s our ce O n
Resistance On St ate Dra in Current VDS>I
VGS=10V ID=3A VGS=10V ID=3A Tc=100oC
D(on)xRDS(on)max
11.2
2.4
6A
VGS=10V
DYNAMIC
Symbol Parameter Test Condition s Min. Typ. Max. Unit
()Forward
g
fs
Tr ansconductance
C C C
Input Capacitance
iss
Out put Capacitance
oss
Reverse Transfer
rss
Capacitance
VDS>I
D(on)xRDS(on)maxID
=3A 2 4.8 S
VDS=25V f=1MHz VGS= 0 1150
160
75
1500
240 110
Ω Ω
pF pF pF
2/9
Page 3
STP6N60FI
ELECTRICAL CHARACTERISTICS (continued)
SWITCHING ON
Symbol Parameter Test Condition s Min. Typ. Max. Unit
t
d(on)
(di/dt)
Q Q Q
Turn-on Time
t
Rise Time
r
Turn-on C urrent Slope VDD=480V ID=6A
on
Total Gate Charge
g
Gat e- Source Charge
gs
Gate-Drain Charge
gd
SWITCHING OFF
Symbol Parameter Test Condition s Min. Typ. Max. Unit
t
r(Voff)
t
Off -voltage R ise Time
t
Fall Time
f
Cross-over Time
c
SOURCE DRAIN DIODE
VDD=300V ID=3A RG=50 VGS=10V
50
14065175
(see test circuit, figure 3)
240 A/µs RG=50 VGS=10V (see test circuit, figure 5)
VDD= 480 V ID=6A VGS=10V 78
8
41
VDD=480V ID=6A RG=50 Ω VGS=10V (see test circuit, figure 5)
100
27
145
98 nC
125
34
180
ns ns
nC nC
ns ns ns
Symbol Parameter Test Condition s Min. Typ. Max. Unit
I
I
SDM
SD
Source-drain Current
()
Source-drain Current
3.8 24
(pulsed)
V
(∗) For w ar d On Volt age ISD=6A VGS=0 2 V
SD
t
Reverse Recovery
rr
Time
Q
Reverse Recovery
rr
ISD=6A di/dt=100A/µs VDD= 100 V Tj=150oC (see test circuit, figure 5)
750
13.5
Charge
I
RRM
Reverse Recovery
38
Current
() Pulsed:Pulse duration = 300 µs, dutycycle 1.5 % () Pulse widthlimited by safeoperating area
Safe Operating Area Thermal Impedance
A A
ns
µC
A
3/9
Page 4
STP6N60FI
Derating Curve
Transfer Characteristics
Output Characteristics
Transconductance
Static Drain-source On Resistance
4/9
Gate Charge vs Gate-source Voltage
Page 5
STP6N60FI
Capacitance Variations Normalized Gate Threshold Voltage vs
Temperature
Normalized On Resistance vs Temperature Turn-on Current Slope
Cross-over TimeTurn-off Drain-source Voltage Slope
5/9
Page 6
STP6N60FI
Switching SafeOperating Area Accidental Overload Area
Source-drain Diode Forward Characteristics
Fig. 1: Unclamped Inductive Load Test Circuits Fig. 2: Unclamped Inductive Waveforms
6/9
Page 7
STP6N60FI
Fig. 3: Switching Times Test Circuits For
Resistive Load
Fig. 5: Test Circuit For Inductive Load Switching And Diode Recovery Times
Fig. 4: Gate Charge Test Circuit
7/9
Page 8
STP6N60FI
ISOWATT220 MECHANICAL DATA
DIM.
MIN. TYP. MAX. MIN. TYP. MAX.
A 4.4 4.6 0.173 0.181 B 2.5 2.7 0.098 0.106 D 2.5 2.75 0.098 0.108 E 0.4 0.7 0.015 0.027
F 0.75 1 0.030 0.039 F1 1.15 1.7 0.045 0.067 F2 1.15 1.7 0.045 0.067
G 4.95 5.2 0.195 0.204
G1 2.4 2.7 0.094 0.106
H 10 10.4 0.393 0.409 L2 16 0.630 L3 28.6 30.6 1.126 1.204 L4 9.8 10.6 0.385 0.417 L6 15.9 16.4 0.626 0.645 L7 9 9.3 0.354 3.66
Ø 3 3.2 0.118 0.126
mm inch
E
A
D
B
L3
L6
L7
Ø
F1
H
L2
F2
F
123
L4
G1
G
P011G
8/9
Page 9
STP6N60FI
Information furnished isbelieved to be accurateand reliable. However, SGS-THOMSONMicroelectronics assumes no responsability for the consequences of use of suchinformation nor for any infringementof patents orother rights of third parties whichmay results from its use. No license isgrantedby implicationor otherwiseunderany patentor patentrights ofSGS-THOMSON Microelectronics.Specificationsmentioned in this publicationare subjectto change without notice.This publication supersedes and replacesall information previouslysupplied. SGS-THOMSON Microelectronicsproducts are notauthorizedforuse ascriticalcomponentsin lifesupportdevices orsystemswithoutexpress written approvalof SGS-THOMSON Microelectonics.
1994 SGS-THOMSONMicroelectronics - All Rights Reserved
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SGS-THOMSON Microelectronics GROUP OF COMPANIES
9/9
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