The SuperMESH™ series is obtained through an
extreme optimization of ST’s well established
strip-based PowerMESH™ layout. In addition to
pushing on-resistance significantly down, special
care is taken to ensure a very good dv/dt
capability for the most demanding applications.
Such series complements ST full range of high
voltage Power MOSFETs.
Source-drain current
Source-drain current (pulsed)
(1)
Forward on voltage ISD= 4.7 A, VGS=0-1.6V
Reverse recovery time
rr
Reverse recovery charge
rr
Reverse recovery current
Reverse recovery time
rr
Reverse recovery charge
rr
Reverse recovery current
= 4.7 A, VDD= 60 V
I
SD
di/dt = 100 A/µs,
(see Figure 16)
ISD= 4.7 A,VDD= 60 V
di/dt=100 A/µs,
Tj=150 °C(see
Figure 16)
-
760
-
5
14
880
-
7
160
4.7
18.8mAA
ns
µC
A
ns
µC
A
Table 9.Gate-source Zener diode
SymbolParameterTest conditionsMinTyp.MaxUnit
BV
Gate-source breakdown voltage Igs ± 1mA, (open drain)30V
GSO
The built-in-back Zener diodes have specifically been designed to enhance not only the
device’s ESD capability, but also to make them safely absorb possible voltage transients that
may occasionally be applied from gate to source. In this respect the Zener voltage is
appropriate to achieve an efficient and cost-effective intervention to protect the device’s
integrity. These integrated Zener diodes thus avoid the usage of external components.
Doc ID 13530 Rev 25/12
Page 6
Electrical characteristicsSTP5N120
2.1 Electrical characteristics (curves)
Figure 2.Safe operating area Figure 3.Thermal impedance
vs temperatureFigure 7.Static drain-source on resistance
VDSS
AM03241v1
RDS(on)
(norm)
1.10
1.05
1.00
0.95
0.90
0.85
0.80
-100
-50
0
50
100
150
T
J
(°C)
6/12Doc ID 13530 Rev 2
(Ω)
3.0
2.9
2.8
2.7
2.6
2.5
2.4
2.3
1.0
ID=2.3A
GS=10V
V
2.0
3.0
4.0
AM03235v1
I
D(A)
Page 7
STP5N120Electrical characteristics
Figure 8.Gate charge vs gate-source voltage Figure 9.Capacitance variations
VGS
(V)
12
10
DS
V
VDD=480V
D=4.7A
I
8
6
4
2
VGS
AM03236v1
1000
800
600
400
200
C
(pF)
1000
100
10
AM03237v1
Ciss
Coss
Crss
0
0
10
20
30
40
50
60
Q
0
g(nC)
Figure 10. Normalized gate threshold voltage
VGS(th)
(norm)
vs temperature
1.20
1.00
0.80
0.60
0.40
-100
-50
AM03238v1
T
50
0
100
150
J(°C)
Figure 12. Source-drain diode forward
characteristics
V
SD
(V)
0.9
0.8
0.7
0.6
0.5
0.4
0
1
TJ=-50°C
2
3
TJ=25°C
4
T
5
J
=150°C
6
AM03240v1
I
SD
(A)
1
0.1
1
10
100
1000
V
DS(V)
Figure 11. Normalized on resistance vs
temperature
150
AM03239v1
T
J
R
DS(on)
(norm)
2.5
2.0
1.5
1.0
0.5
0
-100
-50
50
0
100
Figure 13. Maximum avalanche energy vs
temperature
120
AM03242v1
140
EAS
(mJ)
400
350
300
250
200
150
100
50
ID=4.7 A
V
DD=50 V
0
0
20
40
60
80
100
(°C)
T
J(°C)
Doc ID 13530 Rev 27/12
Page 8
Test circuitsSTP5N120
3 Test circuits
Figure 14. Switching times test circuit for
resistive load
Figure 16. Test circuit for inductive load
switching and diode recovery times
Figure 15. Gate charge test circuit
Figure 17. Unclamped inductive load test
circuit
Figure 18. Unclamped inductive waveformFigure 19. Switching time waveform
8/12Doc ID 13530 Rev 2
Page 9
STP5N120Package mechanical data
4 Package mechanical data
In order to meet environmental requirements, ST offers these devices in different grades of
ECOPACK® packages, depending on their level of environmental compliance. ECOPACK®
specifications, grade definitions and product status are available at: www.st.com.
ECOPACK® is an ST trademark.
Doc ID 13530 Rev 29/12
Page 10
Package mechanical dataSTP5N120
TO-220 type A mechanical data
Dim
MinTypMax
mm
A4.404.60
b0.610.88
b11.141.70
c0.480.70
D15.2515.75
D11.27
E1010.40
e2.402.70
e14.955.15
F1.231.32
H16.206.60
J12.402.72
L1314
L13.503.93
L2016.40
L3028.90∅P3.753.85
Q2.652.95
10/12Doc ID 13530 Rev 2
0015988_Rev_S
Page 11
STP5N120Revision history
5 Revision history
Table 10.Revision history
DateRevisionChanges
21-May-20071First release
02-Nov-20092
Document status promoted from preliminary data to datasheet.
Updated mechanical data.
Doc ID 13530 Rev 211/12
Page 12
STP5N120
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