Datasheet STP3N100FI, STP3N100 Datasheet (SGS Thomson Microelectronics)

Page 1
STP3N100
STP3N100FI
N - CHANNEL ENHANCEMENT MODE
POWER MOS TRANSISTOR
TYPE V
STP 3N100 STP 3N100FI
AVALANCHE RUGGED TECHNOLOGY
100% AVALANCHE TESTED
REPETITIVE AVALANCHE DATA AT 100
LOW INPUT CAPACITANCE
LOW GATE CHARGE
APPLICATION ORIENTED
DSS
1000 V 1000 V
R
DS(on)
<5 <5
I
D
3.5 A 2A
o
CHARACTERIZATION
APPLICATIONS
HIGH CURRENT, HIGH SPEED SWITCHING
SWITCH MODE POWER SUPPLIES (SMPS)
CONSUMER AND INDUSTRIAL LIGHTING
DC-AC INVERTERS FOR WELDING
EQUIPMENT AND UNINTERRUPTIBLE POWER SUPPLY (UPS)
3
2
1
TO-220 ISOWATT220
INTERNAL SCHEMATIC DIAGRAM
3
2
1
ABSOLUTE MAXIMUM RATINGS
Symb o l Paramet er Val u e Unit
STP 3N100 STP3 N100FI
V
V
V
I
DM
P
V
T
() Pulsewidth limitedby safe operatingarea
December 1996
Drain - s ource Voltage (VGS= 0) 1000 V
DS
Drain- gate Voltage (RGS=20kΩ) 1000 V
DGR
Gate-source Voltage ± 20 V
GS
Drain Current (continuous) at Tc=25oC3.52A
I
D
Drain Current (continuous) at Tc=100oC21.2A
I
D
(•) Drain Current (pulsed) 14 14 A
Total Di ssipation a t Tc=25oC 100 40 W
tot
Derat ing Factor 0.8 0.32 W/ Ins ulation Withs t and Voltage (DC) 2000 V
ISO
St or a ge Tem perature -65 t o 150
stg
Max. Operating Jun ction T emperat ure 150
T
j
o o
o
C
C C
1/10
Page 2
STP3N100/FI
THERMAL DATA
TO-220 ISOW ATT 220
R
thj-case
R
thj-amb
R
thc-sink
T
AVALANCHE CHARACTERISTICS
Symbol Parameter Max Value Uni t
I
AR
E
E
I
AR
Thermal Resistance Junction - cas e M ax 1.25 3.12 Thermal Resistance Junction- ambient Max
Thermal Resistance Case-sink Typ Maximum Lead Temperature For Sol dering Purpose
l
Avalanc he Current (repetitive o r not-repetitive, Tj=25oC)
Single Pul se A v alanche Energy
AS
(starti ng T Repetitive Avalanc he Energ y
AR
=25oC, ID=IAR,VDD=25V)
j
(pulse width limited by Tjmax, δ <1%) Avalanc he Current
(repetitive o r not-repetitive, Tj=100oC)
62.5
0.5
300
3.5 A
130 mJ
6mJ
2A
o
C/W
o
C/W
o
C/W
o
C
ELECTRICAL CHARACTERISTICS (T
=25oC unless otherwise specified)
case
OFF
Symbol Parameter Test Condition s Min. Typ. Max. Unit
V
(BR)DSS
Drain - s ource
ID=250µAVGS= 0 1000 V
Break d own Volta ge
I
DSS
I
GSS
Zer o G at e Voltage Drain Current (VGS=0)
Gat e- body Leakage Current (V
DS
=0)
VDS=MaxRating VDS= Max Rating x 0.8 Tc=125oC
= ± 20 V ± 100 nA
V
GS
25
250
ON ()
Symbol Parameter Test Condition s Min. Typ. Max. Unit
V
GS(th)
R
DS(on)
I
D(on)
Gate Threshold Voltage VDS=VGSID=250µA234V St at ic Drain-s our ce O n
Resistance On State Drain Current VDS>I
VGS=10V ID=1.5A 5
D(on)xRDS(on)max
3.5 A
VGS=10V
DYNAMIC
Symbol Parameter Test Condition s Min. Typ. Max. Unit
C C C
g
Forward
fs
Tr ansconductance Input Capacitance
iss
Out put Capacitance
oss
Reverse Transfer
rss
Capacitance
VDS>I
D(on)xRDS(on)maxID
=1.5A 1 1.8 S
VDS=25V f=1MHz VGS=0 750
80 25
950 110
40
µA µA
pF pF pF
2/10
Page 3
STP3N100/FI
ELECTRICAL CHARACTERISTICS (continued)
SWITCHING ON
Symbol Parameter Test Condition s Min. Typ. Max. Unit
t
d(on)
(di/dt)
Q Q Q
Turn-on T ime
t
Rise Time
r
Turn-on Current S lope VDD=600V ID=3.5A
on
Total Gate Charge
g
Gat e- Source Charge
gs
Gate-Drain Charge
gd
SWITCHING OFF
Symbol Parameter Test Condition s Mi n. Ty p. Max. Unit
t
r(Voff)
t
Off -voltage Rise Time
t
Fall Time
f
Cross-over Time
c
SOURCE DRAIN DIODE
VDD=400V ID=1.8A RG=50 Ω VGS=10V
70 70
(see test circuit, figure 3)
100 A/µs RG=50 Ω VGS=10V (see test circuit, figure 5)
VDD= 400 V ID=3.5A VGS=10V 48
7
24
VDD=600V ID=3.5A RG=50 Ω VGS=10V (see test circuit, figure 5)
90 60
130
90 90
60 nC
115
75
165
ns ns
nC nC
ns ns ns
Symbol Parameter Test Condition s Mi n. Ty p. Max. Unit
I
I
SDM
SD
Source-drain C urrent
()
Source-drain C urrent
3.5 14
(pulsed)
V
t
Q
For ward On Voltage ISD=3.5A VGS=0 2 V
SD
Reverse Recovery
rr
Time Reverse Recovery
rr
ISD= 3.5 A di/dt = 100 A/µs VDD= 100 V Tj=150oC (see test circuit, figure 5)
900
10
Charge
I
RRM
Reverse Recovery
23
Current
() Pulsed: Pulse duration = 300µs, duty cycle 1.5% () Pulse widthlimited by safe operating area
Safe Operating Areas For TO-220 Safe Operating Areas For ISOWATT220
A A
ns
µC
A
3/10
Page 4
STP3N100/FI
Thermal Impedeance For TO-220
Derating Curve For TO-220
Thermal Impedance For ISOWATT220
Derating Curve For ISOWATT220
Output Characteristics
4/10
Transfer Characteristics
Page 5
Transconductance Static Drain-source OnResistance
Gate Charge vs Gate-source Voltage Capacitance Variations
STP3N100/FI
Temperature
Normalized On Resistancevs TemperatureNormalized Gate Threshold Voltage vs
5/10
Page 6
STP3N100/FI
Turn-on Current Slope Turn-off Drain-source Voltage Slope
Cross-over Time Switching Safe Operating Area
Accidental Overload Area Source-drain Diode Forward Characteristics
6/10
Page 7
STP3N100/FI
Fig. 1: Unclamped Inductive Load Test Circuits
Fig. 3: Switching Times Test Circuits For
Resistive Load
Fig. 2: Unclamped Inductive Waveforms
Fig. 4: Gate Charge Test Circuit
Fig. 5: Test Circuit For Inductive Load Switching
And Diode Reverse Recovery Time
7/10
Page 8
STP3N100/FI
TO-220 MECHANICAL DATA
DIM.
mm inch
MIN. TYP. MAX. MIN. TYP. MAX.
A 4.40 4.60 0.173 0.181 C 1.23 1.32 0.048 0.051 D 2.40 2.72 0.094 0.107
D1 1.27 0.050
E 0.49 0.70 0.019 0.027
F 0.61 0.88 0.024 0.034 F1 1.14 1.70 0.044 0.067 F2 1.14 1.70 0.044 0.067
G 4.95 5.15 0.194 0.203 G1 2.4 2.7 0.094 0.106 H2 10.0 10.40 0.393 0.409
L2 16.4 0.645 L4 13.0 14.0 0.511 0.551 L5 2.65 2.95 0.104 0.116 L6 15.25 15.75 0.600 0.620 L7 6.2 6.6 0.244 0.260 L9 3.5 3.93 0.137 0.154
DIA. 3.75 3.85 0.147 0.151
E
A
L4
D
F2
F1
G1
H2
G
F
C
D1
L2
Dia.
L5
L7
L6
L9
P011C
8/10
Page 9
ISOWATT220 MECHANICAL DATA
STP3N100/FI
DIM.
MIN. TYP. MAX. MIN. TYP. MAX.
A 4.4 4.6 0.173 0.181 B 2.5 2.7 0.098 0.106
D 2.5 2.75 0.098 0.108
E 0.4 0.7 0.015 0.027
F 0.75 1 0.030 0.039 F1 1.15 1.7 0.045 0.067 F2 1.15 1.7 0.045 0.067
G 4.95 5.2 0.195 0.204
G1 2.4 2.7 0.094 0.106
H 10 10.4 0.393 0.409 L2 16 0.630 L3 28.6 30.6 1.126 1.204 L4 9.8 10.6 0.385 0.417 L6 15.9 16.4 0.626 0.645 L7 9 9.3 0.354 0.366
Ø 3 3.2 0.118 0.126
mm inch
E
A
D
B
L3
L6
L7
Ø
F1
F
G1
H
G
F2
123
L2
L4
P011G
9/10
Page 10
STP3N100/FI
Information furnished is believed to be accurate and reliable. However, SGS-THOMSON Microelectronics assumes no responsability for the consequences of use of such informationnor for any infringement of patents or other rights of third partieswhich may results from its use. No licenseis grantedby implication or otherwise under any patent or patent rights of SGS-THOMSON Microelectronics. Specifications mentioned in this publication are subject to changewithout notice. Thispublicationsupersedes andreplacesall information previously supplied. SGS-THOMSONMicroelectronicsproducts are not authorized for use as criticalcomponents in lifesupport devices or systems without express writtenapproval of SGS-THOMSONMicroelectonics.
1996 SGS-THOMSONMicroelectronics - Printedin Italy- All Rights Reserved
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10/10
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