This Power MOSFET is the latest development of
STMicroelectronics unique “single feature size”
strip-based process. The resulting transistor
shows extremely high packing density for low onresistance, rugged avalanche characteristics and
less critical alignment steps therefore a
remarkable manufacturing reproducibility.
Figure 6.TransconductanceFigure 7.Static drain-source on resistance
6/12
Page 7
STN4NF06LElectrical characteristics
Figure 8.Gate charge vs. gate-source voltage Figure 9.Capacitance variations
Figure 10. Normalized gate threshold voltage
vs. temperature
Figure 12. Source-drain diode forward
characteristics
Figure 11. Normalized on resistance vs.
temperature
Figure 13. Normalized breakdown voltage vs.
temperature
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Page 8
Test circuitSTN4NF06L
3 Test circuit
Figure 14. Switching times test circuit for
resistive load
Figure 16. Test circuit for inductive load
switching and diode recovery times
Figure 15. Gate charge test circuit
Figure 17. Unclamped Inductive load test
circuit
Figure 18. Unclamped inductive waveformFigure 19. Switching time waveform
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Page 9
STN4NF06LPackage mechanical data
4 Package mechanical data
In order to meet environmental requirements, ST offers these devices in ECOPACK®
packages. These packages have a Lead-free second level interconnect. The category of
second level interconnect is marked on the package and on the inner box label, in
compliance with JEDEC Standard JESD97. The maximum ratings related to soldering
conditions are also marked on the inner box label. ECOPACK is an ST trademark.
ECOPACK specifications are available at: www.st.com
9/12
Page 10
Package mechanical dataSTN4NF06L
SOT-223 MECHANICAL DATA
DIM.
MIN.TYP.MAX.MIN.TYP.MAX.
a2.272.32.3389.490.691.7
b4.574.64.63179.9181.1182.3
c0.20.40.67.915.723.6
d0.630.650.6724.825.626.4
e11.51.61.759.16366.9
e40.3212.6
f2.933.1114.2118.1122.1
g0.670.70.7326.427.628.7
l16.777.3263.8275.6287.4
l23.53.53.7137.8137.8145.7
L6.36.56.7248255.9263.8
mmmils
L
l2
e1
a
b
f
C
l1
B
C
E
g
d
c
e4
P008B
10/12
Page 11
STN4NF06LRevision history
5 Revision history
Table 8.Document revision history
DateRevisionChanges
22-Apr-20081Initial version
11/12
Page 12
STN4NF06L
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