The device is made using the SuperMESH3TM
Power MOSFET technology that is obtained via
improvements applied to STMicroelectronics’
SuperMESH3
optimized vertical structure. The resulting product
has an extremely low on resistance, superior
dynamic performance and high avalanche
capability, making it especially suitable for the
most demanding applications.
Figure 6.Gate charge vs gate-source voltage Figure 7.Static drain-source on resistance
6/13Doc ID 17697 Rev 2
Page 7
STN3N40K3Electrical characteristics
C
100
10
1
0.1
10
V
DS
(V)
(pF)
1
100
Ciss
Coss
Crss
AM08998v1
E
oss
0.3
0.2
0.1
0
0
100
V
DS
(V)
(µJ)
400
0.4
200
300
0.5
0.6
0.7
0.8
AM08999v1
V
GS(th)
1.00
0.90
0.80
0.70
-75
T
J
(°C)
(norm)
-25
1.10
75
25
125
I
D
=50µA
AM09000v1
R
DS(on)
2.0
1.5
1.0
0.5
-75
T
J
(°C)
(norm)
-25
75
25
125
2.5
0
V
GS
=10V
I
D
=0.6A
AM09001v1
V
SD
0
0.8
I
SD
(A)
(V)
0.4
1.2
1.6
0.4
0.5
0.6
0.7
0.8
0.9
1.0
TJ=-50°C
TJ=150°C
TJ=25°C
AM09003v1
BV
DSS
-75
T
J
(°C)
(norm)
-25
75
25
125
0.90
0.95
1.00
1.05
1.10
I
D
=1mA
AM09002v1
Figure 8.Capacitance variationsFigure 9.Output capacitance stored energy
Figure 10. Normalized gate threshold voltage
vs. temperature
Figure 12. Source-drain diode forward
characteristics
Figure 11. Normalized on resistance vs.
temperature
Figure 13. Normalized B
vs. temperature
VDSS
Doc ID 17697 Rev 27/13
Page 8
Electrical characteristicsSTN3N40K3
E
AS
0
40
T
J
(°C)
(mJ)
20
100
60
80
0
5
10
15
20
120
140
25
30
35
40
45
50
ID=0.6 A
V
DD
=50 V
AM09004v1
Figure 14. Maximum avalanche energy vs.
starting Tj
8/13Doc ID 17697 Rev 2
Page 9
STN3N40K3Test circuits
AM01468v1
VGS
PW
VD
RG
RL
D.U.T.
2200
μF
3.3μF
V
DD
AM01469v1
VDD
47kΩ
1kΩ
47kΩ
2.7kΩ
1kΩ
12V
V
i=20V=VGMAX
2200
μF
PW
IG=CONST
100Ω
100nF
D.U.T.
V
G
AM01470v1
A
D
D.U. T.
S
B
G
25
Ω
A
A
B
B
R
G
G
FAST
DIODE
D
S
L=100μH
μF
3.3
1000
μF
V
DD
AM01471v1
Vi
Pw
VD
ID
D.U. T.
L
2200
μF
3.3μF
VDD
AM01472v1
V(BR)DSS
VDD
VDD
VD
IDM
ID
AM01473v1
VDS
ton
tdon
tdoff
toff
tf
tr
90%
10%
10%
0
0
90%
90%
10%
V
GS
3 Test circuits
Figure 15. Switching times test circuit for
resistive load
Figure 17. Test circuit for inductive load
switching and diode recovery times
Figure 16. Gate charge test circuit
Figure 18. Unclamped inductive load test
circuit
Figure 19. Unclamped inductive waveformFigure 20. Switching time waveform
Doc ID 17697 Rev 29/13
Page 10
Package mechanical dataSTN3N40K3
4 Package mechanical data
In order to meet environmental requirements, ST offers these devices in different grades of
ECOPACK
specifications, grade definitions and product status are available at: www.st.com. ECOPACK
is an ST trademark.
®
packages, depending on their level of environmental compliance. ECOPACK®
10/13Doc ID 17697 Rev 2
Page 11
STN3N40K3Package mechanical data
Table 8.SOT-223 mechanical data
mm
Dim.
Min.Typ.Max.
a2.272.32.33
b4.574.64.63
c0.20.40.6
d0.630.650.67
e11.51.61.7
e40.32
f2.933.1
g0.670.70.73
l16.777.3
l23.53.53.7
L6.36.56.7
Figure 21. SOT-223 mechanical data drawing
L
e1
a
b
f
C
l1
B
C
E
g
d
l2
c
e4
P008B
Doc ID 17697 Rev 211/13
Page 12
Revision historySTN3N40K3
5 Revision history
Table 9.Document revision history
DateRevisionChanges
29-Jun-20101First release.
08-Apr-20112Document status promoted from preliminary data to datasheet.
12/13Doc ID 17697 Rev 2
Page 13
STN3N40K3
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