This product utilizes the 5
rules of ST’s proprietary STripFET™ technology.
The lowest available R
package, makes this device suitable for the most
demanding DC-DC converter applications, where
high power density is to be achieved.
th
DS(on)*Qg
DS(on)
max
thj-pcb
DS(on)
I
D
(1)
generation of design
, in this chip scale
STL70N4LLF5
STripFET™ V Power MOSFET
Preliminary Data
PowerFLAT™ ( 6x5 )
Figure 1.Internal schematic diagram
Table 1.Device summary
Order codeMarkingPackagePackaging
STL70N4LLF570N4LLF5PowerFLAT™ (6x5)Tape and reel
December 2008 Rev 11/10
This is preliminary information on a new product now in development or undergoing evaluation. Details are subject to
change without notice.
Not-repetitive avalanche current,
(pulse width limited by Tj Max)
Single pulse avalanche energy
(starting TJ = 25 °C, ID = I
AV
, V
DD
= 24 V)
TBDA
TBDmJ
3/10
Page 4
Electrical characteristicsSTL70N4LLF5
2 Electrical characteristics
(T
= 25 °C unless otherwise specified)
CASE
Table 5.On/off states
SymbolParameterTest conditionsMin.Typ.Max.Unit
V
(BR)DSS
I
DSS
I
GSS
V
GS(th)
R
DS(on)
Drain-source breakdown
voltage
Zero gate voltage drain
current (VGS = 0)
Gate body leakage current
= 0)
(V
DS
Gate threshold voltage
Static drain-source on
resistance
= 250 µA, VGS= 0
I
D
V
= Max rating,
DS
V
= Max rating @125 °C
DS
= ±22 V
V
GS
= VGS, ID = 250 µA
V
DS
= 10 V, ID= 9 A
V
GS
= 4.5 V, ID= 9 A
V
GS
40V
1
10
±100nA
1V
0.0055
TBD
0.0065
0.009ΩΩ
Table 6.Dynamic
SymbolParameterTest conditionsMin.Typ.Max.Unit
C
C
C
Q
Q
Q
R
Input capacitance
iss
Output capacitance
oss
Reverse transfer
rss
capacitance
g
Total gate charge
Gate-source charge
gs
Gate-drain charge
gd
Gate input resistance
G
= 25 V, f=1 MHz,
V
DS
=0
V
GS
=15 V, ID = 18 A
V
DD
= 4.5 V
V
GS
(see Figure 3)
f=1 MHz Gate DC Bias = 0
Test signal level = 20 mV
open drain
1800
270
40
13
TBD
TBD
TBDΩ
µA
µA
pF
pF
pF
nC
nC
nC
4/10
Page 5
STL70N4LLF5Electrical characteristics
Table 7.Switching times
SymbolParameterTest conditionsMin.Typ.Max.Unit
t
d(on)
t
d(off)
Turn-on delay time
t
Rise time
r
Turn-off delay time
Fall time
t
f
=15 V, ID= 9A,
V
DD
=4.7 Ω, VGS=10 V
R
G
(see Figure 2)
TBD
TBD
TBD
TBD
ns
ns
ns
ns
Table 8.Source drain diode
SymbolParameterTest conditionsMinTyp.MaxUnit
I
SD
I
SDM
V
SD
t
Q
I
RRM
1. Pulse width limited by safe operating area
2. Pulsed: pulse duration=300µs, duty cycle 1.5%
Source-drain current18A
(1)
Source-drain current (pulsed)72A
(2)
Forward on voltage
rr
Reverse recovery time
Reverse recovery charge
rr
Reverse recovery current
= 18A, VGS=0
I
SD
= 18A,
I
SD
di/dt = 100 A/µs,
= 25 V
V
DD
TBD
TBD
TBD
1.1V
ns
nC
A
5/10
Page 6
Test circuitsSTL70N4LLF5
3 Test circuits
Figure 2.Switching times test circuit for
resistive load
Figure 4.Test circuit for inductive load
switching and diode recovery times
Figure 3.Gate charge test circuit
Figure 5.Unclamped inductive load test
circuit
Figure 6.Unclamped inductive waveformFigure 7.Switching time waveform
6/10
Page 7
STL70N4LLF5Package mechanical data
4 Package mechanical data
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packages. These packages have a lead-free second level interconnect . The category of
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