Using the latest high voltage technology based on
a patented strip layout, STMicroelectronics has
designed an advanced family of IGBTs, the
PowerMESH
™
IGBTs, with outstanding
performances.
Applications
■ LIGHT DIMMER
■ HID
■ WELDING
■ MOTOR CONTROL
■ STATIC RELAYS
2
TO-247
Internal schematic diagram
Order codes
Sales TypeMarkingPackagePackagin g
STGW35NB60SDGW35NB60SDTO-247TUBE
November 20051/13
Rev 1
www.st.com
13
Page 2
1 Electrical ratingsSTGW35NB60SD
1 Electrical ratings
Table 1.Absolute maximum ratings
SymbolParameterValueUnit
V
CES
I
Note 4
C
Note 4
I
C
I
Note 1
CM
V
GE
I
f
P
TOT
T
T
stg
T
L
Table 2.Thermal resistance
Collector-Emitter Voltage (VGS = 0)
600V
Collector Current (continuous) at 25°C 70A
Collector Current (continuous) at 100°C 35A
Collector Current (pulsed)250A
Gate-Emitter Voltage± 20V
Diode RMS Forward Current at TC = 25°C
Total Dis sipation at TC = 25°C
Operating Junction Temperature
j
30A
200W
– 55 to 150°C
Storage Temperature
Maximum Lead Temperature for Soldering
Purpose (1.6mm from case, for 10sec.)
300°C
Min.Typ.Max.Unit
Rthj-caseThermal Resist ance Junction- case (IGBT)----0.625°C/W
Rthj-caseThermal Resist ance Junction- case (DIODE)----1.5°C/W
Rthj-ambThermal Resist ance Junction- am bient ----50°C/W
2/13
Page 3
STGW35NB60SD2 Electrical characteristics
2 Electrical characteristics
(T
= 25 °C unless otherwise specified)
CASE
Table 3.Static
SymbolParameterT est ConditionsMin.T yp.Max.Unit
V
BR(CES)
V
CE(SAT)
V
GE(th)
I
CES
I
GES
g
Collectro-Emitter Breakdown
Voltage
Colle ct o r-Emitte r S at u ra tion
Voltage
Gate Threshold Voltage
Collector-Emitter Leakage
Current (V
GE
= 0)
Gate-Emitter Leak age
Current (V
fs
Forward Transconductance
CE
= 0)
I
= 1mA, VGE = 0
C
V
= 15V, IC= 20A, Tj= 25°C
GE
= 15V, IC= 20A, Tj= 125°C
V
GE
= VGE, IC= 250µA
V
CE
= Max Rating,Tc=25°C
V
CE
= Max Rating, Tc=125°C
V
CE
= ± 20V , VCE = 0
V
GE
V
= 10V, IC= 18A
CE
600V
1.25
1.7V
1.2
2.55V
10
100
± 10 0nA
20S
Table 4.Dynamic
SymbolParameterTest ConditionsMin.Typ.Max.Unit
C
ies
C
oes
C
res
Input Capacitance
Output Capacitance
Reverse Transfer Capacitance
= 25V, f = 1 MHz, VGE = 0
V
CE
1820
167
27
V
µA
µA
pF
pF
pF
Q
g
Total Gate Charge
Q
ge
Q
gc
I
CL
Gate-Emitter Charge
Gate-Collecto r Char ge
Turn-Off SOA Minimum
Current
= 480V, IC = 20A,
V
CE
V
= 15V,
GE
(see Figure 17)
V
= 480V , Tj = 125°C
clamp
R
= 100Ω
G
83
115nC
10
27
80A
nC
nC
3/13
Page 4
2 Electric al characteristicsSTGW35NB60SD
Table 5.Switch in g on/off (ind uc tive load)
SymbolParameterT est ConditionsMin.T yp.Max.Unit
t
d(on)
t
(di/dt)
t
d(on)
t
(di/dt)
t
r(Voff
t
d(off
t
t
r(Voff
t
d(off
t
Turn-on Delay Time
r
Current Rise Ti me
Turn-on Curr ent Slope
on
Turn-on Delay Time
r
f
f
Current Rise Ti me
Turn-on Curr ent Slope
on
)
Off Voltage Rise Time
)
Turn-off De la y Tim e
Cur r e n t Fa ll Time
)
Off Voltage Rise Time
)
Turn-off De la y Tim e
Cur r e n t Fa ll Time
= 480V, IC = 20A
V
CC
= 100Ω, VGE= 15V, Tj= 25°C
R
G
(see Figure 3)
= 480V, IC = 20A
V
CC
= 100Ω, VGE= 15V, Tj= 125°C
R
G
(see Figure 3)
V
= 480V, IC = 20A,
cc
R
= 100Ω , VGE = 5V,TJ=25°C
GE
(see Figure 18)
= 480V, IC = 20A,
V
cc
=100Ω,VGE =15V, Tj=125°C
R
GE
(see Figure 18)
92
70
340
80
73
320
0.78
1.1
0.79
1.1
2.4
1.2
Table 6.Switching en ergy (inductive load)
SymbolParame terTest ConditionsMin.Typ.Max.Unit
Note 2
Eon
E
off
Eon
E
off
Note 3
E
ts
Note 2
Note 3
E
ts
Turn-on Switching Losses
Turn-off Switching Losses
Total Switchin g Los s es
Turn-on Switching Losses
Turn-off Switching Losses
Total Switchin g Los s es
= 480V, IC = 20A
V
CC
=100Ω, VGE= 15V, Tj= 25°C
R
G
(see Figure 18)
= 480V, IC = 20A
V
CC
=100Ω, VGE= 15V, Tj= 125°C
R
G
(see Figure 18)
0.84
7.4
8.24
0.86
11.5
12.4
ns
ns
A/µs
ns
ns
A/µs
µs
µs
µs
µs
µs
µs
mJ
mJ
mJ
mJ
mJ
mJ
4/13
Page 5
STGW35NB60SD2 Electrical characteristics
Table 7.Collector-emitter diode
SymbolParameterTest ConditionsMin.Typ.Max.Unit
V
t
rr
t
a
Q
rr
I
rrm
S
t
rr
t
a
Q
rr
I
rrm
S
(1)Pu ls e w id th lim ited by ma x. junc t i on tem peratur e
(2) Eon is the tun-on losses when a typical diode i s used in the test circuit in figure 2 Eon include diode recovery energy. If the
IGBT is offered in a packag e with a co-pak diode, the co-pack diode is used as external diode. IGBTs & Diode are at the
same temperature (25°C and 125°C)
(3) Turn-off losses include also the tail of the collector current
(4) Calculated according to the iterative formula:
ICTC()
Forward O n -Voltage
f
Reverse Recovery Time
Reverse Recovery Charge
Reverse Recovery Current
Softness fact or of the diode
Reverse Recovery Time
Reverse Recovery Charge
Reverse Recovery Current
Softness fact or of the diode
T
–
--------------------------------------------------------------------------------------------------=
R
Figure 3.TransconductanceFigure 4.Normalized Collector-Emitter On
Voltage vs Temperature
Figure 5.Collector-Emitter on Volt age vs
Collector Current
6/13
Figure 6.Gate Threshold vs Temperature
Page 7
STGW35NB60SD2 Electrical characteristics
Figure 7.Normalized Breakdown Voltag e vs
Temperature
Figure 9.Capacitance VariationsFigure 10. Switching Losses vs Gate Charge
Figure 8.Gate Charge vs Gate-Emitter
Voltage
Figure 11. Switching Losses vs TemperatureFigure 12. Switching Losses vs Collector
Current
7/13
Page 8
2 Electric al characteristicsSTGW35NB60SD
Figure 13. Thermal ImpedanceFigure 14. Turn-Off SOA
Figure 15. Emitter-Collector Diode
Characteristics
8/13
Page 9
STGW35NB60SD3 Test Circuits
3 Test Circuits
Figure 16. Test Circuit for Inductive Load
Switching
Figure 18. Switching WaveformFigure 19. Diode Recovery Time Waveform
Figure 17. Gate Charge Test Circuit
9/13
Page 10
4 Package mechani cal dataSTGW35NB60SD
4 Package m echanical data
In order to meet environmental requirements, ST offers these devices in ECOPACK®
packages. These packages have a Lead-free second level interconnect . The category of
second level interconnect is marked on the package and on the inner box label, in compliance
with JEDEC Standard JESD97. The maximum ratings related to soldering conditions are also
marked on the inner box label. ECOPACK is an ST trademark. ECOPACK specifications are
available at: www.st.com
nformation furnished is believed to be accurate and reliable. However, STMicroelectronics assumes no responsibility for the consequence
f use of such information nor for any infringement of patents or other rights of third parties which may result from its use. No license is grante
y implic ation or o th erwise under any patent or patent rights of STM i croelectr onics. Sp ecifications menti oned in thi s publicati on are subje
o change without notice. This publication supersedes and replaces all information previously supplied. STMicroelectronics products are n
uthoriz ed for use as critical components in li fe support devic es or system s without express writt en approval of STMicro el ectronics.
The ST logo is a registered t rademark of S T M i croelectr oni cs.
All other nam es are the pro p erty of their respectiv e owners