S29GL064A, S29GL032A, and S29GL016A
64 Megabit, 32 Megabit, and 16 Megabit
3.0-Volt only Page Mode Flash Memory
Featuring 200 nm MirrorBit Process Technology
Data Sheet
Notice to Readers: The Advance Information status indicates that this
document contains information on one or more products under development
at Spansion LLC. The information is intended to help you evaluate this product.
Do not design in this product without contacting the factory. Spansion LLC
reserves the right to change or discontinue work on this proposed product
without notice.
ADVANCE
INFORMATION
Publication Number S29GL-A_00 Revision A Amendment 3 Issue Date April 22, 2005
Page 2
Advance Information
Notice On Data Sheet Designations
Spansion LLC issues data sheets with Advance Information or Preliminary designations to advise
readers of product information or intended specifications throughout the product life cycle, in
cluding development, qualification, initial production, and full produc tion. In all cases, however,
readers are encouraged to verify that they have the latest information before finalizing their design. The following descriptions of Spansion data sheet designations are presented here to highlight their presence and definitions.
Advance Informatio n
The Advance Information designation indicates that Spansion LLC is developing one or more specific products, but has not committed any design to produc tion. Information p resented in a document with this designation is likely to change, and in some cases , development on the prod uct
may discontinue. Spansion LLC therefore places the following conditions upon Advance Informa
tion content:
“This document contains information on one or more products under development at Spansion LLC. The
information is inten ded to help you evaluate this produ ct. Do not de sign in this pro duct withou t contacting the factor y. Spansion LLC reserves the right to chan ge or discontinue wo rk on this proposed
product wi t h o u t notice.”
Preliminary
The Preliminary designation indicates that the product development has progressed such that a
commitment to production has taken place. This designation covers several aspects of the product life cycle, including product qualification, initial production, and the subsequent phases in the
manufacturing process that occur before full production is achieved. Changes to the technical
specifications presented in a P reliminar y documen t shoul d be e xpected wh ile keepin g these as
pects of production under consideration. Spansion places the following conditions upon Preliminary content:
“This document states the c urrent techni cal spe cific ations rega rding t he Sp ansio n produc t(s ) descr ibe d
herein. The Preliminary status of this document indicates that product qualification has been completed,
and that initial production has begun. Due to the phases of the manufacturing process that require
maintaining efficiency and quality, this document may be revised by subsequent versions or modifications due to changes in techni c a l spec if ications.”
-
-
-
Combination
Some data sheets will contain a combination of products with different designations (Advance Information, Preliminary, or Full Production). This type of document will distinguish these products
and their designations wherever necessary, typically on the first page, the ordering information
page, and pages with DC Characteristics table and A C Erase and Program table (in the table
notes). The disclaimer on the first page refers the reader to the notice on this page.
Full Production (No Designation on Document)
When a product has been in product ion for a period of time suc h that no changes or only nomi nal
changes are expected, th e Preliminary des ignation is removed from the data sheet. Nominal
changes may include those affecting the number of ordering part numbers available, such as the
addition or deletion of a speed option, temperature range, package type, or VIO range . C h an g es
may also include those needed to clarify a description or to correct a typographical error or incor
rect specification. Spansion LLC applies the following conditions to documents in this category:
“This document states the c urrent techni cal spe cific ations rega rding t he Sp ansio n produc t(s ) descr ibe d
herein. Spansion LLC deem s the pro du cts to have been in suffi cient prod uc tion volume such tha t subsequent versions of this document are not expected to change. However, typographical or specification
corrections, or modifications to th e val id combinations of fered may occur.”
Questions regarding these document designations may be directed to your local AMD or Fujitsu
sales office.
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iiS29GL-A MirrorBit™ Flash FamilyS29GL-A_00_A3 April 22, 2005
Page 3
S29GL-A MirrorBit™ Flash Family
S29GL064A, S29GL032A, and S29GL016A
64 Megabit, 32 Megabit, and 16 Megabit
3.0-Volt only Page Mode Flash Memory
Featuring 200 nm MirrorBit Process Technology
Data Sheet
Distinctive Characteristics
Architectural Advantages
Single power supply operation
— 3 volt read, erase, and program operations
Manufactured on 200 nm MirrorBit process
technology
Secure d Silicon Sector region
— 128-word/256-byte sector for permanent, secure
identification through an 8-word/16-byte random
Electronic Serial Number, accessible through a
command sequence
— May be programmed and locked at the factory or by
sectors before an erase operation is completed
— Data# polling & toggle bits provide status
— CFI (Common Flash Interface) compliant: allows host
system to identify and accommodate multiple flash
devices
— Unlock Bypass Program command reduces overall
multiple-word programming time
Hardware features
— Sector Group Protection: hardware-level method of
preventing write operations within a sector group
— Temporary Sector Unprotect : VID-level method of
charging code in lock ed sectors
— WP#/ACC input accelerates programming time
(when high voltage is ap plied) for gr eater throughput
during system production. Protects first or last sector
regardless of sector protection settings on uniform
sector models
— Hardware r eset input (RES ET#) resets device
— Ready/Busy# output (RY/BY#) detects pro gram or
erase cycle completion
Publication Number S29GL-A_00 Revision A Amendment 3 Issue Date April 22, 2005
This document contains information on one or more products under development at Spansion LLC. The information is intended to help you evaluate this product. Do not
design in this product without contacting the factory. Spansion LLC reserves the right to change or disco ntinue work on this proposed product without notice.
Page 4
General Description
The S29GL-A family of devices are 3.0 V single power Flash memory manufactured using 200 nm MirrorBit technology. The S29GL064A is a 64-Mb device
organized as 4,194,304 words or 8,388,608 bytes. T he S29GL032A is a 32-Mb
device organized as 2,097,152 words or 4,194,304 bytes. The S29Gl016A is a
16 Mb device organized as 1,048,576 words or 2,097,152 bytes. Depending on
the model number, the devices have an 8-bit wide data bus only, 16-bit wide
data bus only, or a 16-bit wide data bus that can also function as an 8-bit wide
data bus by using the BYTE# input. The d evices can be programmed either in
the host system or in standard EPROM programmers.
Access times as fast as 90 ns are available. Note that each access time has a
specific operating voltage range (V
and the
and Ordering Informat ion–S29GL064A. Package offerings include 48-pin TSOP,
56-pin TSOP, 48-ball fine-pitch BGA and 64-ball Fortified BGA, depending on
model number . Each device has separate chip enable (CE#), write enable (WE#)
and output enable (OE#) controls.
Each device requires only a single 3.0 volt power supply for both read and
write functions. In addition to a V
(ACC) feature provides shorter programming times through increased current
on the WP#/ACC input. This feature is intended t o facilitate factory throughput
during system production, but may also be used in the field if desired.
The device is entirely command set compatible with the JEDEC single-power-supply Flash standard. Commands are written to the device using standard
microprocessor write timing. Write cycles also internally latch addresses and
data needed for the programming and erase operations.
The sector erase architecture allows me mory sec tor s to be e ra sed and rep rogrammed without affecting the data contents of other sectors. The device is fully
erased when shipped from the factory.
Device programming and erasure are initiated through command sequences.
Once a program or erase operation begins, the host system need only poll the
DQ7 (Data# Polling) or DQ6 (toggle) status bits or monitor the Ready/Busy# (RY/BY#) output to determine whether the operation is complete. To facilitate
programming, an Unlock Bypass mode reduces command sequence overhead
by requiring only two write cycles to program data instead of four.
Hardware data protection measures include a low VCC detector that automat-
ically inhib its write operations du ring power transitions. The hardware sector
protection feature disables both program and erase operations in any combina
tion of sectors of memory. This can be achieved in-system or via programming
equipment.
The Erase Suspend/Er ase Resume feature a llows the host system t o pause
an erase operation in a given sector to read or program any other sector and
then complete the erase operation. The Program Suspend/Program R esume
feature enables the host system to pause a program operation in a giv e n sector
to read any other sector and then complete the program operation.
The hardware RESET# pin terminates any operation in progress and resets the
device, after whic h it i s then read y for a new ope rat ion. The RESET# pin ma y be
tied to the system reset circuitry. A system reset would thus also reset the de
-
-
2S29GL-A MirrorBit™ Flash FamilyS29GL-A_00_A3 April 22, 2005
Page 5
Advance Information
vice, enabling the host system to read boot-up firmware from the Flash memory
device.
The device reduces power consumption in the standby mode when it detect s
specific voltage levels on CE# and RESET#, or when addresses are stable for a
specified period of time.
The Write Protect (WP#) feature protects the first or last sector by asserting
a logic low on the WP#/ACC pin or WP# pin, depending on model number. The
protected sector is still protected even during accelerated programming.
The Secured Silicon Sector provides a 12 8-word/256-byte area for code or
data that can be permanently protected. Once this sector is protected, no further
changes within the sector can occur.
Spansion MirrorBit flash technology combines years of Flash me mory manufacturing experi ence to produce the high est levels of quality, reliability and cost
effectiveness. The device electrically erases all bits within a sector simulta
neously via hot-hole assisted erase. The data is programmed using hot electron
injection.
-
April 22, 2005 S29GL-A_00_A3S29GL-A MirrorBit™ Flash Family3
Table 9. S29GL032A (Model R4) Bottom Boot Sector Addresses . 24
Table 10 . S 2 9 GL 064A (M o d els R1, R2, R 8 , R 9 ) S ector Add r es se s 25
Table 11. S29GL064A (Model R3) Top Boot Sector
April 22, 2005 S29GL-A_00_A3S29GL-A MirrorBit™ Flash Family5
Page 8
Product Selector Guide
S29GL064A, S29GL032A, S29GL016A
Advance Information
Part Number
Speed Option
Max. Access Time (ns)901001109010011090100
Max. CE# Access Time (ns)901001109010011090100
Max. Page Access Time (ns)2530302530302530
Max. OE# Access Ti me (ns)2530302530302530
S29GL064AS29GL032AS29GL016A
9010119010119010
6S29GL-A MirrorBit™ Flash FamilyS29GL-A_00_A3 April 22, 2005
Page 9
Block Diagram
A
Advance Information
V
CC
V
SS
RESET#
WE#
WP#/ACC
BYTE#
CE#
OE#
RY/BY#
State
Control
Command
Register
VCC Detector
PGM Voltage
Generator
Timer
Sector Switches
Erase Voltage
Generator
STB
Chip Enable
Output Enable
Logic
Y-Decoder
X-Decoder
DQ15–DQ0 (A-1)
Input/Output
Buffers
STB
Y-Gating
Cell Matrix
Data
Latch
Max
Note:
**A
**A
**A
**–A0
MAX
GL032A = A20.
MAX
GL016A = A19.
MAX
Address Latch
GL064A = A21.
April 22, 2005 S29GL-A_00_A3S29GL-A MirrorBit™ Flash Family7
1. Pin 9 is A21, Pin 13 is ACC, Pin 14 is WP#, Pin 15 is A19, and Pin 47 is VIO on S29GL064A (models R6, R7).
2. Pin 13 is NC on S29GL032A, and S29GL016A.
3. Pin 10 is NC on S29GL016A.
NC
NC
A15
A14
A13
A12
A11
A10
A9
A8
A19
A20
WE#
RESET#
A21
WP#/ACC
RY/BY#
A18
A17
A7
A6
A5
A4
A3
A2
A1
NC
NC
1
2
3
4
5
6
7
8
9
10
11
56-Pin Standard TSOP
12
13
14
1
15
16
17
18
19
20
21
22
23
24
25
26
27
28
56
NC
55
NC
54
A16
53
BYTE#
52
V
DQ15/A-1
51
DQ7
50
DQ14
49
DQ6
48
DQ13
47
DQ5
46
DQ12
45
DQ4
44
V
43
DQ11
42
DQ3
41
DQ10
40
DQ2
39
DQ9
38
DQ1
37
DQ8
36
DQ0
35
34
OE#
33
V
CE#
32
A0
31
NC
30
V
29
SS
CC
SS
IO
Notes:
1. Pin 15 is NC on S29GL032A.
8S29GL-A MirrorBit™ Flash FamilyS29GL-A_00_A3 April 22, 2005
Page 11
Advance Information
64-ball Fortified BGA
Top View, Balls Facing Down
A8C8
A7C7D7E7F7G7H7
A6C6D6E6F6G6H6
A5C5D5E5F5G5H5
A4C4D4E4F4G4H4
A3C3D3E3F3G3H3
A2C2D2E2F2G2H2
A1C1D1E1F1G1H1
B8D8E8F8G8H8
1
NCNCNC
B7
B6
B5
RESET#WE#
B4
A18WP#/ACCRY/BY#
B3
B2
B1
V
IO
3
4
SS
A16A15A14A12A13
NCNCNCNCNC
NCV
1
V
IO
NC
2
DQ15/A-1VSSBYTE#
DQ13DQ6DQ14DQ7A11A10A8A9
V
CCDQ4DQ12DQ5A19A21
DQ11DQ3DQ10DQ2A20
DQ9DQ1DQ8DQ0A5A6A17A7
OE#
NC
NC
V
NC
SSCE#A0A1A2A4A3
Notes:
1. Ball D8 and Ball F1 are NC on S29GL064A (models R3, R4).
2. Ball F7 is NC on S29GL064A (model R5).
3. Ball C5 is NC on S29GL032A and S29GL016A.
4. Ball D4 is NC on S29GL016A.
Special Package Handling Instructions
Special handling is required for Flash Memory products in moulded packages
(TSOP and BGA). The package and/or data integrity may be compromised if the
package body is exposed to temperatures above 150°C for prolonged periods of
time.
April 22, 2005 S29GL-A_00_A3S29GL-A MirrorBit™ Flash Family9
Page 12
Advance Information
48-ball Fine-pitch BGA
Top View, Balls Facing Down
A6B6C6D6E6F6G6H6
1
A16A15A14A12A13
A5B5C5D5E5F5G5H5
A4B4C4D4E4F4G4H4
RESET#WE#
A3B3C3D3E3F3G3H3
A2B2C2D2E2F2G2H2
2
A18WP#/ACCRY/BY#
3
DQ15/A-1VSSBYTE#
DQ13DQ6DQ14DQ7A11A10A8A9
V
CCDQ4DQ12DQ5A19A21
DQ11DQ3DQ10DQ2A20
DQ9DQ1DQ8DQ0A5A6A17A7
A1B1C1D1E1F1G1H1
Notes:
1. Ball F6 is VIO on S29GL064A (model R5).
2. Ball C4 is NC on S29GL032A and S29GL016A.
3. Ball D3 is NC on S29GL016A.
Special Package Handling Instructions
Special handling is required for Flash Memory products in molded packages
(TSOP and BGA). The package and/or data integrity may be compromised if the
package body is exposed to temperatures above 150°C for prolonged periods o f
time.
OE#
V
SSCE#A0A1A2A4A3
10S29GL-A MirrorBit™ Flash FamilyS29GL-A_00_A3 April 22, 2005
Page 13
Pin Descriptions
A21–A0=22 Address inputs
A20–A0=21 Address inputs
A19–A0=20 Address inputs
DQ7–DQ0=8 Data inputs/outputs
DQ14–DQ0=15 Data inputs/outputs
DQ15/A-1=DQ15 (Data input/output, word mode), A-1 (LSB
CE#=Chip Enab le input
OE#=Output Enable input
WE#=Write Enable input
WP#/ACC=Hardware Write Pro tect input/Programming
ACC=Acceleration input
WP#=Hardware Write Protect inp ut
RESET#=Hardware Reset Pin inpu t
RY/BY#=Ready/Busy output
BYTE#=Selects 8-bit or 16-bit mode
VCC =3.0 volt-only singl e p ower supply
V
SS
NC=Pin Not Connected Internal ly
V
IO
Advance Information
Address input, byte mode)
Acceleration input
(see Product Selector Guide for speed options and
voltage supply
=Device Ground
=Output Buffer Power
tolerances)
Logic Symbols
Logic Symbol–S29GL064A (Models R1, R2, R8, R9)
22
A21–A0
CE#
OE#
WE#
WP#/ACC
RESET#
BYTE#
V
IO
16 or 8
DQ15–DQ0
(A-1)
RY/BY#
April 22, 2005 S29GL-A_00_A3S29GL-A MirrorBit™ Flash Family11
Page 14
Advance Information
Logic Symbol–S29GL064A (Models R3, R4)
22
A21–A0
CE#
OE#
WE#
WP#/ACC
RESET#
DQ15–DQ0
(A-1)
16 or 8
BYTE#
RY/BY#
Logic Symbol–S29GL064A (Model R5)
22
A21–A0
CE#
OE#
WE#
ACC
RESET#
V
IO
DQ15–DQ0
RY/BY#
Logic Symbol–S29GL064A (Models R6, R7)
22
A21–A0
CE#
DQ15–DQ0
16
16
OE#
WE#
WP#
ACC
RESET#
RESET#
V
IO
12S29GL-A MirrorBit™ Flash FamilyS29GL-A_00_A3 April 22, 2005
Page 15
Advance Information
Logic Symbol–S29GL032A (Models R1, R2)
21
A20–A0
CE#
OE#
WE#
WP#/ACC
RESET#
BYTE#
V
IO
DQ15–DQ0
(A-1)
RY/BY#
Logic Symbol–S29GL032A (Models R3, R4)
21
A20–A0
CE#
DQ15–DQ0
(A-1)
16 or 8
16 or 8
OE#
WE#
WP#/ACC
RESET#
RY/BY#
BYTE#
Logic Symbol–S29GL016A (Models R1, R2)
20
A19–A0
CE#
OE#
WE#
WP#/ACC
RESET#
BYTE#
DQ15–DQ0
(A-1)
RY/BY#
16 or 8
April 22, 2005 S29GL-A_00_A3S29GL-A MirrorBit™ Flash Family13
Page 16
Advance Information
Ordering Information–S29GL016A
S29GL016A Standard Products
Standard products are available in several packages and operating ranges. The
order number (Valid Combination) is formed by a combination of the following:
S29GL016A10TAIR10
PACKING TYPE
0= Tray
2= 7-inch Tape and Reel
3 = 13-inch Tape and Reel
Additional Ordering Options
R1= x8/x16, VCC=3.0-3.6V , T op boot sector device, top two address sectors
R2= x8/x16, VCC=3.0-3.6V, Bottom boot sector device, bottom two
TEMPERATURE RANGE
I = Industrial (–40°C to +85°C)
E= Engineering Samples (ava ilab le pr ior to Produc tio n Release only)
PACKAGE MATERIAL SET
A= Standard
F= Pb-Free
PACKAGE TYPE
T= Thin Small Outline Package (TSOP) Standard Pinout
B= Fine-pitch Ball-Grid Array Package
F= Fortified Ball-Grid Array Package
SPEED OPTION
See Product Selector Guide and Valid Combinations
DEVICE NUMBER/DESCRIPTION
S29GL016A
3.0 Volt-only, 16 Megabit Page-Mode Flash Memory Manufactured on 200 nm MirrorBit™
Process Technology.
1. Type 0 is standard. Specify others as required: TSOP’s can be packed in Types 0 and 3; BGA’s can be packed in Types 0, 2, or 3.
2. TSOP package marking omits packing type designator from orde ring part number.
3. BGA package marking omit s leading S29 and packing type designator from orde ring part number.
Valid Combinations
Valid C ombinatio ns li st c onfi gurations planned to be supp ort ed i n v olume for t his
device. Consult your loc al sales offi ce to confirm av ailabili ty of specific valid com binations and to check on newly released combinations.
Package Description
(Notes)Device
14S29GL-A MirrorBit™ Flash FamilyS29GL-A_00_A3 April 22, 2005
Page 17
Advance Information
Ordering Information–S29GL032A
S29GL032A Standard Products
Standard products are available in several packages and operating ranges. The
order number (Valid Combination) is formed by a combination of the following:
S29GL032A90TAIR10
PACKING TYPE
0= Tray
2= 7-inch Tape and Reel
3 = 13-inch Tape and Reel
1. Type 0 is standard. Specify others as required: TSOPs can be packed in Types 0 and 3; BGAs can be packed in Type s 0, 2, or 3.
2. TSOP package marking omits packing type designator from the ordering part number.
3. BGA package marking omits lead ing “S29” and packi ng type designator from the ordering part n um ber.
Valid Combinations
Valid Combinations list configurations planned to be supported in volume for this
device. Consult your local sales office to confirm availability of specific valid com
-
binations and to check on newly released combinations.
April 22, 2005 S29GL-A_00_A3S29GL-A MirrorBit™ Flash Family15
Page 18
Advance Information
Ordering Information–S29GL064A
S29GL064A Standard Products
Standard products are available in several packages and operating ranges. The
order number (Valid Combination) is formed by a combination of the following:
S29GL064A90TAIR12
PACKING TYPE
0 = Tray
2 = 7” Tape and Reel
3 = 13” Tape and Reel
=3.0-3. 6V, Uniform sec tor device , lowest address se ctor
CC
IL
IL
TSO48 only
IL,
IL
TSO48 only
IL,
IL
IL
IL
PACKAGE TYP E
T= Thin Small Outline Package ( TSO P) Stan dar d Pinout
B= Fine-pitch Ball-Grid Array P a ckag e
F= Fortified Ball-Grid Array Package
SPEED OPTION
See Product Selector Guide and Valid Combinations
DEVICE NUMBER/DESCRIPTION
S29GL064A, 64 Megabit Page-Mode Flash Memory Manufactured using 200 nm MirrorBit
Process Technology, 3.0 Volt- only R e ad , Progr am, and Er as e
TM
16S29GL-A MirrorBit™ Flash FamilyS29GL-A_00_A3 April 22, 2005
Page 19
Advance Information
Ta b le 3. S29GL064A Valid Combinations
S29GL064A Valid Com binations
Device Number Speed Option
S29GL064A90, 10, 11
Package, Material &
Temperature Range
TAI, TFI
BAI, BFIR3, R4, R5
FAI, FFIR1, R2, R3, R4, R5
Model NumberPacking Type
R3, R4, R6, R7, R8, R9
R1, R2
0, 2, 3
(Note 1)
Notes:
1. Type 0 is standard. Specify others as required: TSOPs can be packed in Types 0 and 3; BGAs can be packed in Types 0, 2, or 3.
2. TSOP package marking omits packing type designator from orde ring part number.
3. BGA package marking omit s leading S29 and packing type designator from orde ring part number.
Valid Combinations
Valid Combinations list configurations planned to be supported in volume for this
device. Consult your local sales office to confirm availability of specific valid com
binations and to check on newly released combinations.
April 22, 2005 S29GL-A_00_A3S29GL-A MirrorBit™ Flash Family17
Page 20
Device Bus Operations
This section describes the requirements and use of the device bus operations,
which are initiated through the internal command register. The command regis
ter itself does not occupy any addressable m emory location. The register is a
latch used to store the commands, along with the address and data informati on
needed to execute the command. The contents of the register serve as inputs to
the internal state machine. The state machine outputs dictate the function of the
device.
require, and the resulting output. The following subsections describe each of
these operations in further detail.
Table 4 lists the device bus operations, the inputs and control levels they
Legend: L = Logic Low = VIL, H = Logic High = VIH, VID = 11.5–12.5V, VHH = 11.5–12.5V, X = Don’t Care, SA = Sector
Address, AIN = Address In, DIN = Data In, D
Notes:
1. Addresses are Amax:A0 in word mode; Amax:A-1 in byte mode. Sector addresses are Amax:A15 in both modes.
2. The sector protect and sector un pr otect fun cti ons may als o be implement ed vi a pr og rammin g equi pment . See the
“Sector Group Protection and Unprotection” section.
3. If WP# = VIL, the first or last sector remains prote cted (for unif orm sector devic es), and the two o uter boot sect ors
are protected (for boot sector devices). If WP# = VIH, the first or last sector, or the two ou ter boot sectors are
protected or unprotected as determined by the method described in Sector Group Protection and Unprotection
XXXV
OUT
ID
= Data Out
HXA
SA, A6 =L,
A3=L, A2=L,
A1=H, A0=L
SA, A6=H,
A3=L, A2=L,
A1=H, A0=L
IN
(Note 4)XX
(Note 4)XX
(Note 4) (Note 4)High-Z
on page 31. All sectors are unprotected when shipped from the factory (The Secured Silicon Sector may be factory
protected depending on version ordered.)
4. DIN or D
as required by co mmand se quenc e, data po lli ng, or se ctor pr otect algori thm (s ee Fi gure 7, on p age 57).
OUT
18S29GL-A MirrorBit™ Flash FamilyS29GL-A_00_A3 April 22, 2005
Page 21
Advance Information
Word/Byte Configuration
The BYTE# pin controls whether the device data I/O pins operate in the byte or
word configuration. If the BYTE# pin is set at logic 1, the devic e is in word con
figuration, DQ0–DQ15 are active and controlled by CE# and OE#.
If the BYTE# pin is set at logic 0, the device is in byte configuration, and only
data I/O pins DQ0–DQ7 are active and controlled by CE# and OE#. The data I/
O pins DQ8–DQ14 are tri-stated, and the DQ15 pin is used as an input for the
LSB (A-1) address function.
Requirements for Reading Array Data
To read array data from the outputs, the system must drive the CE# and OE#
pins to V
control and gates array data to the output pins. WE# should remain at V
The internal state machine is set for reading array data upon device power-up,
or after a hardware reset. This ensures that no spurious alteration of the mem
ory content occurs during the power transition. No command is nece ssary in this
mode to obtain array data. Standard microprocessor read c ycles that assert valid
addresses on the device address inputs produce valid data on the device data
outputs. The device remains enabled for read access until the command register
contents are altered.
. CE# is the power control and selects the device. OE# is the output
IL
IH
-
.
-
See R eading Array Data on page 43 for more information. Refer to the AC R eadOnly Operations table for timing specifications and the timing diagram. Refer to
the DC Characteristics table for the active current specificat ion on reading arr ay
data.
Page Mode Read
The device is capable of fast page mode read and is compatible with the page
mode Mask ROM read operation. This mode provides faster read access speed
for random locations within a pa ge. The page size of the devi ce is 4 words/8
bytes. The appropriate page is selected by the higher address bits A(max)–A2.
Address bits A1–A0 in word mode (A1–A-1 in byte mode) determine the specific
word within a page. This is an asynchronous operat ion; the microprocessor sup
plies the specific word location.
The random or initial page access is equal to t
read accesses (as long as the locations specified by the microprocessor falls
within that page) is equivalent to t
for a subsequent access, the access time is t
are obtained by keeping the read-page addresses constant and changing the
intra-read page addresses.
. When CE# is deasserted and reasserted
PACC
ACC
or tCE. Fas t page mo de acces ses
ACC
Writing Commands/Command Sequences
To write a command or command sequence (which includes programming data
to the device and erasing sectors of memory), the system must drive WE# and
CE# to V
The device features an Unlock Bypass mode to facilitate faster programming.
Once the device enters the Unlock Bypass mode, only two write cycles are re
quired to program a word, instead of four. The Wo rd P rog ram C om man d
Sequence on pa ge 44 contains details on programming data to the device using
both standard and Unlock Bypass command sequences.
, and OE# to VIH.
IL
-
or tCE and subsequent page
-
April 22, 2005 S29GL-A_00_A3S29GL-A MirrorBit™ Flash Family19
Page 22
Advance Information
An erase operation can erase one sector, multiple sectors, or the entire device.
Tables
Refer to the DC Characteristics table for the active current specification for the
write mode. The AC Characteristics section contains timing specification tables
and timing diagrams for write operations.
7 – 25 indicate the address space that each sector occupies.
Write Buffer
Write Buffer Programming allows the system write to a maximum o f 16 words/
32 bytes in one programming operation. This results in faster effective progr am
ming time than the standard programming algorithms. See Write Buffer on
page 20 for more information.
-
Accelerated Program Operation
The device offers accelerated program operations through the ACC funct ion. This
is one of two functions provided by the WP#/ACC or ACC pin, depending on
model number. This function is primarily intended to allow faster manufacturing
throughput at the factory.
If the system asserts VHH on this pin, the device automatically enters the aforementioned Unlock Bypass mode, temporarily unprotects any protected sector
groups, and uses the higher voltage on the p in to reduce the time required for
program operations. The system would use a two-cycle program command se
quence as required by the Unlock Bypass mode. Removing VHH from the WP#/
ACC or ACC pin, depending on model number, returns the device to norm al op
eration. Note that the WP#/ACC or ACC pin must not be at VHH for operati ons
other than accelerated programming, or device dam age may result. WP# con
tains an internal pullup; when unconnected, WP# is at VIH.
-
-
-
Autoselect Functions
If the system writes the autoselect com mand sequence, the device enters the
autoselect mode. The system can then read autoselect codes from the internal
register (which is separate from the memory array) on DQ7–DQ0. Standard read
cycle timings apply in this mode. Refer to
toselect Command Sequence on page 44 for more information.
Standby Mode
When the system is not reading or writing to the device, it can place the device
in the standby mode. In this mode, current consumption is greatly reduced, and
the outputs are placed in the high impedance state, independent of the OE#
input.
The device enters the CMOS standby mode when the CE# and RESET# pins are
both held at V
.) If CE# and RESET# are held at VIH, but not within VIO ± 0.3 V, the device
V
IH
is in the standby mode, but the standby current is greater. The device requires
standard access time (t
standby modes, before it is ready to read data.
If the device is deselected during erasure or programming, the device draws active current until the operation is completed.
Refer to the DC Characteris tics on page 64 for the standby current specificat ion.
Autoselect Mode on page 30 and Au-
± 0.3 V. (Note that this is a more restricted voltage range than
IO
) for read access when the device is in either of these
CE
20S29GL-A MirrorBit™ Flash FamilyS29GL-A_00_A3 April 22, 2005
Page 23
Advance Information
Automatic Sleep Mode
The automatic sleep mode minimizes Flash device energy consumption. The device automatically enables this mode when addresses remain stable for t
ns. The automatic sleep mode is independent of the CE#, WE#, and OE# con-
30
trol signals. Standard address access timings provide new da t a w hen ad d res s es
are changed. While in sleep mode, output data is latched and always available
to the system. Refer to the
sleep mode current specification.
DC Characteristics on page 64 for the automatic
RESET#: Hardware Reset Pin
The RESET# pin provides a hardware method of resetting the device to reading
array data. When the RESET# pin is driven low for at least a period of t
device immediately terminates any operation in progress, tristates all output
pins, and ignores all read/write commands for the duration of the RESET# pulse.
The device also resets the internal sta te ma chine to reading ar r ay data . The op
eration that was interrupt ed should be reinitiate d once the device is re ady to
accept another command sequence, to ensure data integrity.
Current is reduced for the duration of the RESE T# p ulse . Whe n R E SET# is held
±0.3 V, the device draws CMOS standby current (I
at V
SS
but not withi n VSS±0.3 V, the standby current is greater.
at V
IL
The RESET# pin may be tied to the system reset circuitry . A system reset would
thus also reset the Flash memory, enabling the system to read the boot-up firm
ware from the Flash memo ry.
). If RESET# is held
CC5
ACC
, the
RP
+
-
-
Refer to the AC Characteristics tables for RES E T# parameters an d to Figure 15,
on page 69 for the timing diagram.
Output Disable Mode
When the OE# input is at VIH, output from the device is disabled. The output
pins are placed in the high impedance state.
April 22, 2005 S29GL-A_00_A3S29GL-A MirrorBit™ Flash Family21
Page 24
Advance Information
Ta b le 5. S29GL016A (Model R1) Top Boot Sector Addresses
The autoselect mode provides manufacturer and device identifi cation, and sector
group protection verification, t hrough identi fie r codes outp ut on DQ7–DQ0. This
mode is primarily intended for programming equip me nt to autom atically ma tc h
a device to be p rogrammed with its cor responding programming a lgorithm.
However, the autoselect codes can also be accessed in-system through the com
mand register.
When using programming equipment, the autoselect mode requires VID on address pin A9. Address pins A6, A3, A2, A1, and A0 must be as shown in Table 15
on page 31. In addition, when verifying sector prot ection, the sector address
must appear on the appropriate highest ord er address bits (see Ta b l e 7 -Table
25). Table 15 on page 31 shows the remaining address bits that are don’t care.
When all necessary bits are set as required, the prog ramming equipment may
then read the corresponding identifier code on DQ7–DQ0.
T o access the autoselect codes in-system, the host system can issue the autoselect command via the command register, as shown in Table 30 on page 54 and
30S29GL-A MirrorBit™ Flash FamilyS29GL-A_00_A3 April 22, 2005
-
Page 33
Advance Information
Table 31 on page 55. This method does not require VID. Refer to the Autoselect
Command Sequence section for more information.
Ta b le 15 . Autoselect Codes, (High Voltage Method)
For S29GL064A and S29GL032A:
99h (factory locked), 19h (not factory locked)
For S29GL016A:
94h (factory locked), 14h (not factory locked)
For S29GL064A and S29GL032A:
89h (factory locked), 09h (not factory locked)
For S29GL016A:
84h (factory locked), 04h (not factory locked)
Legend: L = Logic Low = VIL, H = Logic High = VIH, SA = Sector Address, X = Don’t care.
Sector Group Protection and Unprotection
The hardware sector group protection feature disables b oth program and erase
operations in any sector group (see Tables
unprotection feature re-enables both program and erase operations in previously
protected sector groups. Sector group protection/unprotection can be imple
mented via two methods.
Sector protection/unprotection requires VID on the RESET# pin only, and can be
implemented either in-system or via programming equipment.
36 shows the algorithms and Figure 24, on page 80 shows the timing diagram.
This method uses standard microprocessor bus cycle timing. For sector group
unprotect, all unprotected sector groups must first be protected prior to the first
sector group unprotect write cycle.
14 – 25). The hardware sector group
-
Figure 2, on page
The device is shipped with all sector groups unprotected. Spansion of fers the option of programming and protecting sector groups at its factory prior to shipping
the device through Spansion Programming Service. Contact a Spansion repre
-
sentative for details.
It is possible to determine whether a sector group is protected or unprotected.
Autoselect Mode on page 30 for details.
See
April 22, 2005 S29GL-A_00_A3S29GL-A MirrorBit™ Flash Family31
Page 34
Advance Information
Ta b le 16 . S29GL016A (Model R1) Sector Group Protection/Unprotection Addresses
34S29GL-A MirrorBit™ Flash FamilyS29GL-A_00_A3 April 22, 2005
Page 37
Advance Information
Temporary Sector Group Unprotect
This feature allows temporary unp rotection of previously protected se ctor
groups to change data in-system. The Sector Group Unprotect mode is activated
by setting the RESET# pin to V
groups can be programmed or erased by selecting the sector group addresses.
Once V
groups are protected
is removed from the RESET# pin, all the previously protected sector
ID
again. Figure 1 shows the alg orithm, and Figure 22, on
page 76 shows the timing diagrams, for this feature.
. During this mode, formerly protected sector
ID
STAR T
RESET# = V
(Note 1)
ID
Perform Erase or
Program Operations
RESET# = V
IH
Temporary Sector
Group Unprotect Completed
(Note 2)
Notes:
1. All protected sector groups unprotected (If WP# = VIL, the highest or lowest address sector remains protected for
uniform sector devices; the top or bottom two address sectors remains protected for boot sector devices).
2. All previously protected sector groups are protected once again.
Figure 1. Temporary Sector Group Unprotect Operation
April 22, 2005 S29GL-A_00_A3S29GL-A MirrorBit™ Flash Family35
Page 38
Advance Information
Temporary Sector
Group Unprotect
Mode
Increment
PLSCNT
START
PLSCNT = 1
RESET# = V
Wait 1 µs
No
First Write
Cycle = 60h?
Set up sector
group address
Sector Group Protect:
Write 60h to sector
group address with
A6–A0 = 0xx0010
Wait 150 µs
Verify Sector Group
Protect: Write 40h
to sector group
address with
A6–A0 = 0xx0010
Yes
START
Protect all sector
groups: The indicated
ID
Reset
PLSCNT = 1
portion of the sector
group protect algorithm
must be performed for all
unprotected sector
groups prior to issuing
the first sector group
unprotect address
PLSCNT = 1
RESET# = V
Wait 1 µs
First Write
Cycle = 60h?
All sector
No
protected?
Set up first sector
group address
Sector Group
Unprotect:
Write 60h to sector
group address with
A6–A0 = 1xx0010
Wait 15 ms
groups
Yes
Yes
ID
Temporary Sector
No
Group Unprotect
Mode
No
PLSCNT
= 25?
Yes
Device failed
Sector Group
Protect
Algorithm
Read from
sector group address
with A6–A0
= 0xx0010
No
Data = 01h?
Yes
Protect
another
sector group?
No
Remove V
from RESET#
Write reset
command
Sector Group
Protect complete
Verify Sector Group
Unprotect: Write
40h to sector group
Increment
PLSCNT
No
Yes
ID
PLSCNT
= 1000?
Yes
Device failed
Sector Group
address with
A6–A0 = 1xx0010
Read from
sector group
address with
A6–A0 = 1xx0010
No
Data = 00h?
Last sector
Remove V
from RESET#
group
verified?
Yes
Yes
Set up
next sector group
address
No
ID
Unprotect
Algorithm
Write reset
command
Sector Group
Unprotect complete
Figure 2. In-System Sector Group Protect/Unprotect Algorithms
36S29GL-A MirrorBit™ Flash FamilyS29GL-A_00_A3 April 22, 2005
Page 39
Advance Information
Secured Silicon Sector Flash Memory Region
The Secured Silicon Sector feature provides a Flash memory region that enables
permanent part identification through an Electronic Serial Number (ESN). The
Secured Silicon Sector is 256 bytes in length, and uses a Secured Silicon Sector
Indicator Bit (DQ7) to indicate whether or n ot the Secured Silicon Sector is
locked when shipped from the factory. This bit is permanently set at the factory
and cannot be changed, which prevents cloning of a factory locked part. This en
sures the security of the ESN once the product is shipped to the field.
The factory offers the device with the Secured Silicon Sector either customer
lockable (standard shipping option) or factory locked (contact a Spansion sales
representative for ordering information). The customer-lockable version is
shipped with the Secured Silicon Sector unprotected, allowing customers to pro
gram the sector after receiving the device. The customer-lockable version also
contains the Secured Silicon Sector Indicator Bit permanently se t to a 0. The fac
tory-locked version is always protected when shipped from the factory, and has
the Secured Silicon Sector Indicator Bit perman ently set to a 1. Thus, the Se
cured Silicon Sector Indicator Bit prevents customer-lockable devices from being
used to replace devices that are factory locked. Note that the ACC function and
unlock bypass modes are not available when the Secured Silicon Sector is
enabled.
-
-
-
-
The Secured Silicon sector address space in this device is allocated as follows:
Secured Silicon Sector Address Range
Standard Factory
x16x8
000000h–000007h000000h-00000FhESN
000008h–00007Fh000010h-0000FFhUnavailable
Locked
The system accesses the Secured Silicon Sector through a command sequence
Write Protect (WP#) on page 38). After the system writ es the Enter Se-
(see
cured Silicon Sector command sequence, it may read the Secured Silicon Sector
by using the addresses normally occupied by the first sector (SA0). This mode
of operation continues until the system issues the Exit Secure d Silicon Sector
command sequence, or until power is removed from the device. On power-up,
or following a hardware reset, the device rev erts to sending commands to sector
SA0.
Customer Lockable: S ecu red Sil ic on Se ctor NOT Pr ogra mm ed or
Protected At the Factory
Unless otherwise specified, the device is shipped such that the customer may
program and protect the 256-byte Secured Silicon sector.
The system may program the Secured Silicon Sector using the write-buffer, accelerated and/or unlock bypass methods, in addition to the standard
programming command se qu ence. See
Command Definitions on page 43.
ExpressFlash Factory
Locked
ESN or det ermined by
customer
Determined by
customer
Customer Lockable
Determined by
customer
Programming and protecting the Secured Silicon Sector must be used with caution since, once protected, there is no procedure available for unprotecting the
Secured Silicon Sector area and none of the bits in the Secured Silicon Sector
memory space can be modified in any way.
The Secured Silicon Sector area can be protected using one of the following
procedures:
April 22, 2005 S29GL-A_00_A3S29GL-A MirrorBit™ Flash Family37
Page 40
Advance Information
Write the three-cycle Enter Secured Silicon Sector Region command se-
quence, and then follow the in-system sector protect algorithm as shown in
Figure 2, on page 36, except that RESET# may be at either VIH or VID. This
allows in-system protection of the Secured Silicon Sector without raising an y
device pin to a high voltage. Note that this method is only applicable to the
Secured Silicon Sector.
Write the three-cycle Enter Secured Silicon Sector Region command se-
quence, and then use the alternate method of sector protection described in
the
Sector Group Protection and Unprotection on page 31 section.
Once the Secured Silicon Sector is programmed, locked and verified, the system
must write the Exit Secured Silicon Sector Region command sequence to return
to reading and writing within the remainder of the array.
Factory Lock ed : Secured Silicon Sec t or Pr o g r ammed and
Protected At the Factory
In devices with an ESN, the Secured Silicon Sector is protected when the device
is shipped from the factory . The Secured Silicon Sec tor c annot be modi fied i n an y
way. An ESN Factory Locked device has an 16-byte random ESN at addresses
000000h–000007h. Please contact your sales representative for details on o r
dering ESN Factory Locked devices.
Custome rs may o p t to hav e th ei r co de p r ogram m ed b y the fa cto ry th ro ug h th e
Spansion programming service (Customer Factory L ocked). The devices are then
shipped from the factory with the Secured Silicon Sector permanently locked.
Contact your sales representative for details on using th e Spansion program
ming service.
-
-
Write Protect (WP#)
The Write Protect function provides a hardw are method of protecti ng the first or
last sector group without using V
vided by the WP#/ACC input.
If the system asserts VIL on the WP#/ACC pin, the device disables program and
erase functions in the first or last sector group independently of whether those
sector groups were protected or unprotected. Note that if WP#/ACC is at V
when the device is in the standby mode, the maximum input load current is increased. See the table in DC Characteristics on page 64.
If the system asserts V
whether the first or last sector was previously set to be protected or un
protected using the method described in Sector Group Protection and
Unprotection on page 31. Note that WP# contains an internal pullup;
when unconnected, WP# is at VIH.
Hardware Data Protection
The command sequence requirement of unlock cycles for programming or erasing provides data protection against inadvertent writes (refer to Table 30 on
page 54 and Table 31 on page 55 for command definitions). In addition, the fol-
lowing hardware data protection measures prevent accidental erasure or
programming, which might otherwise be caused by spurious system level signals
during V
power-up and power-down transitions, or from system noise.
CC
. Write Protect is one of two functions pro-
ID
on the WP#/ACC pin, the device reverts to
IH
IL
-
Low VCC Write Inhibit
When VCC is less than V
protects data during V
, the device does not accept any write cycles. This
LKO
power-up and power-down. The command register and
CC
38S29GL-A MirrorBit™ Flash FamilyS29GL-A_00_A3 April 22, 2005
Page 41
Advance Information
all internal program/er ase circuits are disabled, and the devic e resets to the read
mode. Subsequent writes are ignored until V
must provide the proper signals to the control pins to prevent unintentional
writes when V
is greater than V
CC
LKO
.
is greater than V
CC
Write Pulse Glitch Protection
Noise pulses of less than 3 ns (typical) on OE#, CE# or WE# do not initiate a
write cycle.
Logical Inhibit
Write cycles are inhibited by holding any one of OE# = VIL, CE# = VIH or WE#
. To initiate a write cycle, CE# and WE# must be a logical zero w h ile OE#
= V
IH
is a logical one.
Power-Up Write Inhibit
If WE# = CE# = VIL and OE# = VIH during power up, the device does not accept
commands on the rising edge of WE#. The internal state machine is automati
cally reset to the read mode on power-up.
Common Flash Memory Interface (CFI)
. The system
LKO
-
The Common Flash Interface (CFI) specification outlines device and host system
software interrogation handshake, which allows specific vendor-specified soft
ware algorithms to be used for entire families of devices. Software support can
then be device-independent, JEDEC ID-independent, and forward- and back
ward-compatible for the specif ied flash device families. Flash vendors can
standardize their existing interfaces for long-term compatibility.
This device enters the CFI Query mo de when the system writ es the CFI Query
command, 98h, to address 55h, any time the device is ready to read array data.
The system can read CFI information at the addresses given in Tables
terminate reading CFI data, the system must write the reset command.
The system can also write the CFI query command when the device is in the autoselect mode. The device enters the CFI query mode, and the system can read
CFI data at the addresses given in Tables
reset command to return the device to reading array data.
For further information, please refer to the CFI Specification and CFI Publication
100. Alternatively, contact your sales representative for copies of these
documents.
26–29. The system must write the
26–29. T o
-
-
April 22, 2005 S29GL-A_00_A3S29GL-A MirrorBit™ Flash Family39
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Advance Information
Ta b le 26 . CFI Query Identification String
Addresses
(x16)
10h
11h
12h
13h
14h
15h
16h
17h
18h
19h
1Ah
Addresses
(x16)
Addresses
(x8)
20h
22h
24h
26h
28h
2Ah
2Ch
2Eh
30h
32h
34h
Addresses
(x8)DataDescription
1Bh36h0027h
1Ch38h0036h
DataDescription
0051h
0052h
Query Unique ASCII string “QRY”
0059h
0002h
0000h
0040h
0000h
0000h
0000h
0000h
0000h
Primary OEM Command Set
Address for Prim ary Extended Table
Alternate OEM Command S et (00h = none e xists)
Address for Alternate OEM Extended Table (00h = none exists)
Table 27. System Interface String
VCC Min. (write/erase)
D7–D4: volt , D3–D0: 100 milli volt
Max. (write/erase)
V
CC
D7–D4: volt , D3–D0: 100 milli volt
1Dh3Ah0000hV
1Eh3Ch0000hV
Min. voltage (00h = no VPP pin present)
PP
Max. voltage (00h = no VPP pin present)
PP
1Fh3Eh0007hReserved for fu ture use
N
20h40h0007hTy pical timeou t for Min. siz e buffer writ e 2
21h42h000AhTypical timeout per individual block er a s e 2
22h44h0000hT ypical timeout for fu ll c hi p erase 2
N
µs (00h = not supported)
N
ms
ms (00h = not supported)
23h46h0001hReserved for future use
N
24h48h0005hMax. timeout for buffer write 2
25h4Ah0004hMax. timeout per individual block erase 2
26h4Ch0000hMax. timeout for full chip erase 2
Note:
CFI data related to VCC and time-outs may differ from actual VCC and time-outs of the product. Please consult the Ordering
Information tables to obtain the VCC range for particular part numbers. Please consult the Erase and Programming Performance table
for typical timeout specifications.
times typical
N
times typical
N
times typical (00h = not supported)
40S29GL-A MirrorBit™ Flash FamilyS29GL-A_00_A3 April 22, 2005
Sector Protect/Unprotect scheme
0004h = Standard Mode (Refer to T ext)
Simultaneo us Operation
00 = Not Supported , X = Number of Sectors in Bank
4Bh96h0000h
4Ch98h0001h
4Dh9Ah00B5h
4Eh9Ch00C5h
4Fh9Eh00xxh
50hA0h0001h
Burst Mode Type
00 = Not Supporte d, 01 = Supported
Page Mode Type
00 = Not Supported, 01 = 4 Word Page, 02 = 8 Word Page
ACC (Acceleration) Sup ply Minimum
00h = Not Supported, D7-D4: Volt, D3-D0: 100 mV
ACC (Acceleration) Supp ly Maximum
00h = Not Supported, D7-D4: Volt, D3-D0: 100 mV
Top/Bottom Boot Sector Flag
02h = Bottom B oot Device, 03h = Top Boot Device, 04h = Uniform
sectors bottom WP# protect, 05h = Uniform sect ors t op WP# protect
Program Suspend
00h = Not Supported, 01h = S up ported
42S29GL-A MirrorBit™ Flash FamilyS29GL-A_00_A3 April 22, 2005
Page 45
Advance Information
Command Definitions
Writing specific address and data commands or sequences into the command
register initiates device operations.
page 55 define the v alid register command sequences. Writing incorrect address
and data values or writing them in the improper sequence may place the device
in an unknown state. A reset command is then required to return the device to
reading array da ta.
All addresses are latched on the falling edge of WE# or CE#, whichever happens
later. All data is latched on the rising edge of WE# or CE#, whichever happe ns
first. Refer to the AC Characteristics section for timing diagrams.
Reading Array Data
The device is automatically set to reading array data after device power-up. No
commands are required to retrieve data. The device is ready to read array data
after completing an Embedded Program or Embedded Erase algorithm.
After the device accepts an Erase Suspend command, the device enters the
erase-suspend-read mode, after which the system can read data from any nonerase-suspended sector. After completing a programming operation in the Erase
Suspend mode, the system may once again read array data with the same ex
ception. See Erase Suspend/Erase Resume Commands on page 52 for more
information.
Table 30 on page 54 and Table 31 on
-
The system must issue the reset command to return the device to the read (or
erase-suspend-read) mode if DQ5 goes high during an active program or erase
operation, or if the device is in the autoselect mode. See the next section, Reset
Command, for more information.
See also Requirements for Reading Array Data in the Device Bus Operations section for more information. The Read-Only Operations–AC Characteristics on
page 66 pro vide the read parameters, and Figure 13, on page 67 shows t he tim-
ing diagram.
Reset Command
Writing the reset command resets the device to the read or erase-suspend-read
mode. Address bits are don’t cares for this command.
The reset command may be written between the sequence cycles in an erase
command sequence before erasing begins. This resets the device to the read
mode. Once erasure begins, however, the device ignores reset commands until
the operation is complete.
The reset command may be written between the sequence cycles in a program
command sequence before programming begins. This resets the device to the
read mode. If the program comm and seq uence is written while the device is in
the Erase Suspend mode, writing the reset command returns the device to the
erase-suspend-read mode. Once programming begins, however, the device ig
nores reset commands until the operation is complete.
-
The reset command may be written between the sequence cycles in an autoselect command sequence. Once in the autoselect mode, the re set command must
be written to return to the read mode. If the device entered the autoselect mode
while in the Erase Suspend mode, writing the reset command returns the device
to the erase-suspend-read mode.
April 22, 2005 S29GL-A_00_A3S29GL-A MirrorBit™ Flash Family43
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Advance Information
If DQ5 goes high during a program or erase operation, writing the reset command returns the device to the read m ode (or erase-suspend-read mode if the
device was in Erase Suspend).
Note that if DQ1 goes high during a Write Buff er Programming operation, the
system must write the Write-to-Buffe r-Abort Reset command sequence to reset
the device for the next operation.
Autoselect Command Sequence
The autoselect command sequence allows the host system to read several identifier codes at specific addresses:
Note: The device ID is read over three cycles. SA = Sector Address
A7:A0
(x16)
The autoselect command sequence is initiated by first writing two unlock cycles.
This is followed by a third write cycle that contains the autoselect command. The
device then enters the autoselect mode. The system may read at any address
any number of times without initiating another autoselect command sequence:
The system must write the reset command to return to the read mode (or erasesuspend-read mode if the device was previously in Erase Suspend).
The Secured Silicon Sector region provides a secured data area containing an
8-word/16-byte random Electronic Serial Number (ESN). The system can access
the Secured Silicon Sector region by issuing the three-cycle Enter Secured Sili
con Sector command sequence. The device continues to access the Secured
Silicon Sector region until the system issues the four-cycle Exit Secured Silicon
Sector command sequence. The Exit Secured Silicon Sector command sequence
returns the device to normal op eration.
page 55 show the address and data requirements for both command sequences.
See also Secured Silicon Sector Flash Memo ry Region on page 37 fo r further information. Note that the ACC function and unlock bypass modes are not available
when the Secured Silicon Sector is enabled.
Table 30 on pa ge 54 and Table 31 on
A6:A-1
(x8)
-
Word Program Command Sequence
Programming is a four-bus-cycle operation. The program command sequence is
initiated by writing two unlock write cycles, followed by the program set-up com
mand. The program address and data are written next, which in turn initiate the
Embedded Program algorithm. The system is not required to provide further
controls or timings. The device automatically provides inte rnally generated pro
gram pulses and verifies the programmed cell margin. Table 30 on page 54 and
Table 31 on page 55 show the address and data requirements for the word pro-
gram command sequence, respectively.
44S29GL-A MirrorBit™ Flash FamilyS29GL-A_00_A3 April 22, 2005
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Advance Information
When the Embedded Program algori thm is complete, the device then re turns to
the read mode and addresses are no longer latched. The system can determine
the status of the program operation by using DQ7 or DQ6. Refer to the Write Op
eration Status section for information on these s tatus bits. Any commands
written to the device during the Embedded Program Algorithm are ignored. Note
that the Secured Silicon Sector, autoselect, and CFI functions are unavaila ble
when a program operation is in progress. Note that a hardware reset immedi
ately terminates the program operation. The pro gram command sequence
should be reinitiated once the device returns to the read mode, to ensure data
integrity.
Programming is allowed in any sequence of address locations and across sector
boundaries. Programming to the same word address multiple times without in
tervening erases (incremental bit programming) requires a modified
programming method. For such application requirements, please contact your
local Spansion representative. Word programming is supported for backward
compatibility with existing Flash driver software and for occasional writing of in
dividual words. Use of write buffer programming (see below ) is strongly
recommended for general programming use when more than a few words are to
be programmed. The effective word programming time using write buffer pro
gramming is approximately four times shorter than the single word
programmi n g time.
Any bit in a word cannot be programmed from 0 back to a 1. Attempting
to do so may cause the device to set DQ5=1, or cause DQ7 and DQ6 status bits
to indicate the operation was succe ssful. However, a succeeding read shows that
the data is still 0. Only erase operations can convert a 0 to a 1.
-
-
-
-
-
Unlock Bypass Command Sequence
The unlock bypass feature allows the system to pr ogram words to the device
faster than using the standard program command sequence. The unlock bypass
command sequence is initiated by first writing two unlock cycles. This is followed
by a third write cycle containing the unlock bypass command, 20h. The device
then enters the unlock bypass mode. A two-cycle unlock bypass mode command
sequence is all that is required to program in this mode. The first cycle in this
sequence contains the unlock bypass program comma nd , A0h; the second cy cle
contains the program address and data. Additional data is programmed in the
same manner. This mode dispenses with the initial two unlock cycles required in
the standard program command sequence, resulting in faster total programming
Table 30 on page 54 and Table 31 on page 55 show the requirem ents for
time.
the command sequence.
During the unlock bypass mode, only the Unlock Bypass Program and Unlock Bypass Reset commands are valid. To exit the unlock bypass mode, the system
must issue the two-cycle unlock bypass reset command sequence. The first cy cle
must contain the data 90h. The second cycle must contain the data 00h. The de
vice then returns to the read mode.
-
Write Buffer Programming
Write Buffer Programming allows the system write to a maximum o f 16 words/
32 bytes in one programming operation. This results in faster effective progr am
ming time than the standard programming algorithms. The Write Buffer
Programming command sequence is initiated by first writing two unlock cycles.
This is followed by a third write cycle containing the Write Buffer Load command
written at the Sector Add ress in which programming occurs. T he fourth cycle
-
April 22, 2005 S29GL-A_00_A3S29GL-A MirrorBit™ Flash Family45
Page 48
Advance Information
writes the sector address and the number of word locations, minus one, to be
programmed. For example, if the system programs six unique address locations,
then 05h should be written to the device. This tells the device how many write
buffer addresses are loaded with data and therefore when to expect the Program
Buffer to Flash command. The number of locations to program cannot exceed
the size of the write buffer or the operation aborts.
The fifth cycle writes the first address location and data to be programmed. The
write-buffer-page is selected by address bits A
data pairs must fall within the selected-write-buffer-page. The system then
writes the remaining address/data p airs into t he writ e buffer. Write buffer loca
tions may be loaded in any order.
The write-buffer-page address must be the same for all address/data pairs
loaded into the write buffer. (This means Write Buffer Programming cannot be
performed across multiple write-buffer pages.) This also means that Write Buffer
Programming cannot b e performed across m ultiple sectors. If the system at
tempts to load programming data outside of the selected write-buffer page, the
operation abor ts .
Note that if a Write Buffer address location is loaded multiple times, the address/
data pair counter is decremented for every data load operation. The host system
must therefore account for loading a write-buffer location more than once. The
counter decrements for each data load operation, not for each unique writebuffer-address location. Note also that if a n address location is loaded more than
once into the buffer, the final data loaded for that address is programmed.
Once the specified number of write buffer locations are loaded, the system must
then write the Program Buffer to Flash command at the sector address. Any
other address and data combination aborts the Write Buffer Programming oper
ation. The device then begins programming. Data polling should be used while
monitoring the last address location loaded into the write buffer. DQ7, DQ6,
DQ5, and DQ1 should be monitored to determine the device status during Write
Buffer Programming.
MAX–A4
. All subsequent address/
-
-
-
The write-buffer programming operation can be suspended using the standard
program suspend/resume commands. Upon successful completion of the Write
Buffer Programming operation, the device is ready to execute the next
command.
The Write Buffer Programming Sequence can be aborted in the following ways:
Load a value tha t is g reater t han the page buffer size d uring th e Num ber of
Locations to Program step.
Write to an address in a sector different than the one specified during the
Write-Buffer-Load command.
Write an Address/Data pair to a different write-buffer-page than the one se-
lected by the Starting Address during the write buffer data loading stage of
the operation.
Write data other than the Confirm Command after the specified number of
data load cycles.
The abort condition is indicated by DQ1 = 1, DQ7 = DA TA# (for the last address
location loaded), DQ6 = toggle, and DQ5= 0. A Write-to-Buffer-Abort Reset
command sequence must be written to reset the device for the next operation.
Note that the Secured Silicon Sector, autoselect, and CFI functions are unavailable when a program operation is in progress.This flash device is capable of
handling multiple write buffer programming operations on the same write buffer
46S29GL-A MirrorBit™ Flash FamilyS29GL-A_00_A3 April 22, 2005
Page 49
Advance Information
address range without intervening erases. For applications requiring incremental
bit programming, a modified programming method is required; please contact
your local Spansion representative. Any bit in a write buffer address range cannot be programmed from 0 back to a 1. Attempting to do so may cause
the device to set DQ5=1, of cause the DQ7 and DQ6 status bits to indicate the
operation was successful. However, a succeeding read shows that the data is still
0. Only erase operations can convert a 0 to a 1.
Accelerated Program
The device offers accelerated program operations through the WP#/ACC or ACC
pin depending on the pa rticular product. When the system asserts V
WP#/ACC or ACC pin. The device uses the higher voltage on the WP#/ACC or
ACC pin to accelerate the operation. Note that the WP#/ACC pin must not be at
for operations other than accelerated programming, or device damage may
V
HH
result. WP# contains an internal pullup; when unconnected, WP# is at V
Figure 3, on page 48 illustrates the algorithm for the program operation. Refer
to the Erase and Program Operations–AC Characterist ics on page 66 for par am-
eters, and Figure 14, on page 68 for timing diagrams.
on the
HH
IH
.
April 22, 2005 S29GL-A_00_A3S29GL-A MirrorBit™ Flash Family47
Page 50
Advance Information
Write “Write to Buffer”
command and
Sector Address
Ye s
(Note 1)
Write number of addresses
to program minus 1(WC)
and Sector Address
Write first address/data
WC = 0 ?
No
Abort Write to
Buffer Operation?
No
Write next address/data pair
WC = WC - 1
Write program buffer to
flash sector address
Read DQ7 - DQ0 at
Last Loaded Address
DQ7 = Data?
Ye s
Ye s
Part of “Write to Buffer”
Command Sequence
Write to a different
sector address
Write to buffer ABORTED.
Must write “Write-to-buffer
Abort Reset” command
sequence to return
to read mode.
No
Ye s
(Note 2)
(Note 3)
No
Read DQ7 - DQ0 with
address = Last Loaded
No
DQ5 = 1?DQ1 = 1?
Ye s
Address
DQ7 = Data?
No
FAIL or ABORTPASS
Ye s
Notes:
1. When Sector Address is specified, any address in the selected sector is accep table. However, when loading W r ite-Buffer address locations
with data, all addresses must fall within the selected Write-Buffer Page.
2. DQ7 may change simultaneously with DQ5. Therefore, DQ7 should be verified.
3. If this flowchart location was reached because DQ5= 1, then the device FAILED. If this flowchart location was reached because DQ1= 1,
then the Write to Buffer operation was ABORTED. In either case, the proper reset command must be written before the device can begin
another op e r a tion. If DQ 1 = 1, write the Write-Buffer-Pr o g ramming-Abort-Reset command. if DQ5= 1, write the Reset comm a nd.
4. See Table 30 on page 54 and Table 31 on page 55 for command sequences required for write buffer programming.
Figure 3. Write Buffer Programming Operation
48S29GL-A MirrorBit™ Flash FamilyS29GL-A_00_A3 April 22, 2005
Page 51
Advance Information
START
Write Program
Command Sequence
Data Poll
Embedded
Program
algorithm
in progress
from System
Verify Data?
No
Yes
Increment Address
Note:
See Table 30 on page 54 and Table 31 on page 55 for program command sequence
No
Last Address?
Yes
Programming
Completed
Figure 4. Program Operation
Program Suspend/Program Resume Command Sequence
The Program Suspend command allows the system to interrupt a programming
operation or a Write to Buffer programming operation so that data can be read
from any non-suspended sector. When the Program Suspend comm and is writ
ten during a programming process, the device halts the program operation
within 15 µs maximum (5µs typical) and updates the status bits. Addresses are
not required when writing the Program Suspend command.
After the programming operation is suspended, the system can read array data
from any non-suspended sector. The Program Suspend command may also be
issued during a programming operation while an erase is suspended. In this
case, data may be read from any addresses not in Erase Suspend or Program
Suspend. If a read is needed from t he Secured Silicon Sector area (One-time
Program a rea), t hen user must us e the pr oper co mmand seq uences t o enter and
exit this region. Note that the Secured Silicon Sector, autoselect, and CFI func
tions are unavailable when a program operation is in progress.
.
-
-
The system may also write the autoselect command sequence when the device
is in the Program Suspend mode. The system can read as many autoselect codes
as required. When the de vice exits the autoselect m ode, the device revert s to
the Program Suspend mode, and is ready for another valid operation. See
Au-
toselect Command Sequence on page 44 for more information.
After the Program Resume command is written, the device reverts to programming. The system can determine the status of the program operation using the
April 22, 2005 S29GL-A_00_A3S29GL-A MirrorBit™ Flash Family49
Page 52
Advance Information
r
DQ7 or DQ6 status bits, just as in the standard program operation. See Write
Operation Status on page 56 for more information.
The system must write the Program Resume command (address bits are don’t
care) to exit the Program Suspend mode and continue the programming opera
tion. Further writes of the Resume command are ignored. Another Program
Suspend command can be written after the device resumes programming.
Program Operation
or Write-to-Buffer
Sequence in Progress
-
Write address/data
XXXh/B0h
Wait 15 µs
Read data as
required
No
Done
reading?
Yes
Write address/data
XXXh/30h
Device reverts to
operation prior to
Program Suspend
Figure 5. Program Suspend/Program Resume
Chip Erase Command Sequence
Chip erase is a six bus cycle operation. The chip erase command sequence is initiated by writing two unlock cycles, followed by a set-up command. Two
additional unlock write cycles are then followed by the chip erase command,
which in turn invokes the Embedded Erase algorithm. The device does not re
quire the system to preprog ram prior to erase. The Emb edded Erase algorithm
automatically preprograms and verifies the entire memory for an all zero data
pattern prior to electrical erase. The system is not required t o provide any co n
trols or timings during these operations. Table 30 on page 54 and Table 31 on
page 55 show the address and data requirements for the chip erase command
sequence.
When the Embedded Erase algorithm is complete, the device returns to the read
mode and addresses are no longer latched. The system can determine the status
of the erase operation by using DQ7, DQ6, or DQ2. Refer to
tus on page 56 for information on these status bits.
Write Program Suspend
Command Sequence
Command is also valid for
Erase-suspended-program
operations
Autoselect and SecSi Sector
read operations are also allowed
Data cannot be read from erase- o
program-suspended sectors
Write Program Resume
Command Sequence
-
-
Write O perati on Sta -
Any commands written during the ch ip erase operation are ignored. However,
note that a hardware reset immediately terminates the erase operation. If this
50S29GL-A MirrorBit™ Flash FamilyS29GL-A_00_A3 April 22, 2005
Page 53
Advance Information
occurs, the chip erase command sequence should be reinitiated once the device
returns to reading array data, to ensure data integrity.
Figure 6, on page 52 illustrates the algorithm for the erase operation. Refer to
Table 38 on page 70 for parameters, and Figure 18, on page 74 for timing
diagrams.
Sector Erase Command Sequence
Sector erase is a six bus cycle operation. The sector erase command sequence
is initiated by writing two unlock cycles, followed by a set-up command. Two ad
ditional unlock cycles are written, and are then followed by th e address of the
sector to be erased, and the sector erase command.
Table 31 on page 55 shows the address and data requirements for the sector
erase command sequence.
The device does not require the system to preprogram prior to erase. The Em-
bedded Erase algorithm automatically programs and verifies the entire memory
for an all zero data pattern prior to electrical erase. The system is no t required
to provide any controls or timings during these operations.
After the command sequence is written, a sector eras e time-out of 50 µs occurs.
During the time-out period, additional sector addresses and sector erase com
mands may be written. Loading the sector erase buffer may be done in any
sequence, and the number of sectors may be from one sector to all sectors. The
time between these additional cycles must be less than 50 µs, otherwise erasure
may begin. Any sector erase address and command following the exceeded
time-out may or may not be accepted. It is recommended that processor inter
rupts be disabled during this tim e to ensure all commands are accepted. The
interrupts can be re-enabled after the last Sector Erase command is written. Any
command other than Sector Erase or Erase Suspend during the time-out
period resets the device to the read mode. Note that the Secured Silicon
Sector, autosel ect, and CFI functions are unavail able wh en an e rase op
eration is in progress. The system must rewrite the command sequence and
any addition al addresses and co m m a n ds .
The system can monitor DQ3 to determine if the sector erase timer has timed
out (See the section on DQ3: Sector Erase Timer.). The time-out begins from the
rising edge of the final WE# pulse in the command sequence.
-
Table 30 on page 54 and
-
-
-
When the Embedded Erase algorithm is complete, the device returns to reading
array data and addresses are no longer latched. The system can determine the
status of the erase operation by reading DQ7, DQ6, or DQ2 in the erasing sector .
Refer to the Write Operation Status section for information on these status bits.
Once the sector erase operation begins, only the Erase Suspend command is
valid. All other commands are ignored. However, note that a hardware reset
immediately terminates the erase operation. If that occurs, the sector erase
command sequence should be reinitiated once the device returns to reading
array data, to ensure data integrity.
Figure 6, on page 52 illustrates the algorithm for the erase operation. Refer to
Table 38 on page 70 for parameters, and Figure 18, on page 74 for timing
diagrams.
April 22, 2005 S29GL-A_00_A3S29GL-A MirrorBit™ Flash Family51
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Advance Information
START
Write Erase
Command Sequence
(Notes 1, 2)
Data Poll to Erasing
Bank from System
No
Data = FFh?
Erasure Completed
Yes
Embedded
Erase
algorithm
in progress
Notes:
1.See Table 30 and Table 31 for program command sequence.
2.See the section on DQ3 for information on the sector erase timer.
Figure 6. Erase Operation
Erase Suspend/Erase Resume Commands
The Erase Suspend command, B0h, allows the syst em to interrupt a sector er ase
operation and then read data from, or program data to, any sector not selected
for erasure. This command is valid only during the sector erase operation, in
cluding the 50 µs time-out period during the sector erase command sequence.
The Erase Suspend command is ignored if written during the chip erase opera
tion or Embedded Program algorithm.
When the Erase Suspend command is written during the sector erase operation,
the device requires a typical of 5 µs
operation. However, when the Erase Suspend command is written during the
sector erase time-out, the device immediately terminates the time-out period
and suspends the erase operation.
After the erase operation is suspended, the device enters the erase-suspend-read mode. The system can read data from or program data to any sector
not selected for erasure. (The device erase suspends all sectors selected for e ra
sure.) Reading at any address within erase-suspended sectors produces status
information on DQ7–DQ0. The system can use DQ7, or DQ6 and DQ2 together,
to determine if a sector is actively erasing or is erase-suspended. Refer to
Operation Status on page 56 for information on these status bits.
(maximum of 20 µs) to suspend the erase
-
-
-
Write
52S29GL-A MirrorBit™ Flash FamilyS29GL-A_00_A3 April 22, 2005
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Advance Information
After an erase-suspended program operation is complete, the device returns to
the erase-suspend-read mode. The system can determine the status of the pro
gram operation using the DQ7 or DQ6 status bits, just as in the standard word
program operation. Refer
information.
In the erase-suspend-read mode, the system can also issue the autoselect com mand sequence. Refer to the Autoselect Mode on page 30 and Autoselect
Command Sequence on page 44 sections for details.
To resume the sector erase operation, the syst e m must write the Erase Resume
command. Further writes of the Resume command are ignored. Another Erase
Suspend command can be written after the chip resumes erasing.
Note:During an erase operation, this flash device performs multiple internal operations which are in-
visible to the system. When a n erase operation is suspended, any of the internal operat io ns that were
not fully completed must be restarted. As such, if this flash device is continually issued suspend/resume
commands in rapid succession, erase progress is impeded as a function of the number of suspends. The
result is a longer cumulative erase time than without suspends. Note that the additional suspends do not
affect device reliability or future performance. In most systems rapid erase/suspend activity occurs only
briefly. In such cases, erase performance is not sig nificantly impacted.
to Write Operation Status on page 56 for more
-
April 22, 2005 S29GL-A_00_A3S29GL-A MirrorBit™ Flash Family53
Page 56
Advance Information
Command Definitions
Ta b le 30 . Command Definitions (x16 Mode, BYTE# = VIH)
Enter Secured Silicon Sect or Region3555AA2AA5555588
Exit Secured Silicon Sect o r Re g ion4555AA2AA5555590XXX00
Program4555AA2AA55555A0PAPD
Write to Buff er (Note 12)3555AA2AA55SA25SAWCPAPDWBLPD
Progra m Buffe r to Flash1SA29
Write to Buffer Abort Reset (Note 13)3555AA2AA55555F0
Unlock Bypass3555AA2AA5555520
Unlock Bypass Program (Note 14)2XXXA0PAPD
Unlock Bypass Reset (Note 15)2XXX90XXX00
Chip Erase6555AA2AA5555580555AA2AA5555510
Sector Erase6555AA2AA5555580555AA2AA55SA30
Program/Erase Suspend (Note 16)1XXXB0
Program/Erase Resume (Note 17)1XXX30
CFI Query (Note 18)15598
FirstSecond Third Fourth Fifth Sixth
Cycles
4555AA2AA5555590 (SA)X0200/01
Bus Cycles (Notes 2–5)
Legend:
X = Don’t care
RA = Read Address of memory location to be read.
RD = Read Data read from location RA during read operation.
PA = Program Address. Addresses latch on falling edge of WE# or
CE# pulse, whichever happens later.
PD = Program Data for location PA. Da ta latch es on ri sin g edge of
WE# or CE# pulse, whichever happens first.
SA = Sector Address of sector to be verified (in autoselect mode) or
erased. Address bits A21–A15 uniquely select any sector.
WBL = Write Buffer Location. Address must be within same write
buffer page a s PA .
WC = Word Count. Number of write buffer locations to load minus 1.
Notes:
1. See Table 4 on page 18 for description of bus operations.
2. All values are in hexad ecimal.
3. Shaded cells indicate read cycles. All others are write cycles.
4. During unlock and command cycles, when lower address bits are 555 or 2AA as shown in table, address bits above A11 and data bits
above DQ7 are don’t care.
5. No unlock or command cycles required when device is in read mode.
6. Reset command is required to return to read mode (or to erase-suspend-read mode if previously in Erase Suspend) when device is in
autoselect mode, or if DQ5 goes high while device i s p r oviding sta t us informatio n.
7. Fourth cycle of the autoselect command sequence is a read cycle. Data bits DQ15–DQ8 are don’t care. Except for RD, PD and WC.
SeeAutoselect Command Sequence on page 44 for more information.
8. For S29GL064A and S29GL032A, Device ID must be read in three cycles.
9. For S29GL016A, Device ID must be read in one cycle.
10. Refer to Table 15 on page 31 for data indicating Secured Silicon Sector factory protect status.
11. Data is 00h for an unprotected sector group and 01h for a protected sector group.
12. Total number of cycles in command sequence is determined by number of words written to write buffer. Maximum number of cycles in
command sequence is 21, including Program Buffer to Flash command.
13. Command sequence resets device for next command after aborted write-to-buffer operation.
14. Unlock Bypas s command is required prior to Unlock Bypass Program co mmand.
15. Unlock Bypass Reset command is required to return to read mode when device is in unlock bypass mode.
16. System may read and program in non-erasing sectors, or enter autoselect mode, when in Erase Suspend mode. Erase Suspend command
is valid only d uring a sector erase operation.
17. Erase Resume command is valid only during Erase Suspend mode.
18. Command is valid when device is ready to read array data or when device is in autoselect mode.
19. Refer to Table 15 on page 31, for individual Device IDs per device density and model number.
54S29GL-A MirrorBit™ Flash FamilyS29GL-A_00_A3 April 22, 2005
Page 57
Advance Information
Ta b le 31 . Command Definitions (x8 Mode, BYTE# = VIL)
Enter Secured Silicon Sect or Region3AAAAA55555AAA88
Exit Secured Silicon Sect o r Re g ion4AAAAA55555AAA90XXX00
Write to Buff er (Note 13)3AAAAA55555SA25SABCPAPDWBLPD
Progra m Buffe r to Flash1SA29
Write to Buffer Abort Reset (Note 14)3AAAAA55555AAAF0
Chip Erase6AAAAA55555AAA80AAAAA55555AAA10
Sector Erase6AAAAA55555AAA80AAAAA55555SA30
Program/Erase Suspend (Note 15)1XXXB0
Program/Erase Resume (Note 16)1XXX30
CFI Query (Note 17)1AA98
FirstSecond Third Fourth Fifth Sixth
Cycles
Addr Data Addr Data Addr DataAddrDataAddrDataAddrData
4AAAAA55555AAA90X06(Note 10)
4AAAAA55555AAA90 (SA)X0400/01
Bus Cycles (Notes 2–5)
Legend:
X = Don’t care
RA = Read Address of memory location to be read.
RD = Read Data read from location RA during read operation.
PA = Program Address. Addresses latch on falling edge of WE# or
CE# pulse, whichever happens later.
PD = Program Data for location PA. Da ta latch es on ri sin g edge of
WE# or CE# pulse, whichever happens first.
SA = Sector Address of sector to be verified (in autoselect mode) or
erased. Address bits A21–A15 uniquely select any sector.
WBL = Write Buffer Location. Address must be within same write
buffer page a s PA .
BC = Byte Count. Number of write buffer locations to load minus 1.
Notes:
1. See Table 4 on page 18 for description of bus operations.
2. All values are in hexad ecimal.
3. Shaded cells indicate read cycles. All others are write cycles.
4. During unlock and command cycles, when lower address bits are 555 or AAA as shown in table, address bits above A11 are don’t care.
5. Unless otherwise noted, address bits A21–A11 are don’t cares.
6. No unlock or command cycles required when device is in read mode.
7. Reset command is required to return to read mode (or to erase-suspend-read mode if previously in Erase Suspend) when device is in
autoselect mode, or if DQ5 goes high while device i s p r oviding sta t us informatio n.
8. Fourth cycle of autoselect command sequen ce is a read cycle. Data bits DQ15–DQ8 are don’t car e. See Au tos ele ct C omma nd Seque nce on
page 44e or more information.
9. For S29GL064A and S29GL032A Device ID must be read in three cycles.
10. For S29GL016A, Device ID must be read in one cycle.
11. Refer to Table 15 on page 31, for data indicating Secured Silicon Sector facto ry protect status.
12. Data is 00h for an unprotected sector group and 01h for a protected sector group.
13. Total number of cycles in command sequence is determined by number of bytes written to write buffer. Maximum number of cycles in
command sequence is 37, including Program Buffer to Flash command.
14. Command sequence resets device for next command after aborted write-to-buffer operation.
15. System may read and program in non-erasing sectors, or enter autoselect mode, when in Erase Suspend mode. Erase Suspend command
is valid only d uring a sector erase operation.
16. Erase Resume command is valid only during Erase Suspend mode.
17. Command is valid when device is ready to read array data or when device is in autoselect mode.
18. Refer to Table 15 on page 31, for individual Device IDs per device density and model number.
April 22, 2005 S29GL-A_00_A3S29GL-A MirrorBit™ Flash Family55
Page 58
Write Operation Status
The device provides several bits to determine the status of a program or erase
operation: DQ2, DQ3, DQ5, DQ6, and DQ7.
ing subsections describe the function of these bits. DQ7 and DQ6 each offer a
method for determining whether a program or erase operation is complete or in
progress. The device also provides a hardware-based output signal, RY/BY#, to
determine whether an Embedded Program or Erase operation is in progress or is
completed.
DQ7: Data# Polling
The Data# Polling bit, DQ7, indicates t o the host system whether an Embedded
Program or Erase algorithm is in progress or completed, or whether the device
is in Erase Suspend. Data# Polling is valid after the rising edge of the final WE#
pulse in th e command sequence.
During the Embedded Program algorithm, the de vice outputs on DQ7 the complement of the datum pro grammed to DQ7. This DQ7 status a lso applies to
programmi n g du ri ng E r as e Su sp e nd. Wh en th e Emb edd ed Pr ogram algorithm is
complete, the device outputs the datum programmed to DQ7. The system must
provide the program address to read valid status information on DQ7. If a pro
gram address falls within a protected sector, Data# Polling on DQ7 is active for
approximately 1 µs, then the device returns to the read mode.
During the Embedded Erase algorithm, Data# Polling produces a 0 on DQ7.
When the Embedded Erase algorithm is complete, or if the device enters the
Erase Suspend mode, Data# Polling produces a 1 on DQ7. The system must pro
vide an address within any of the sectors selected for erasure to read valid status
information on DQ7.
Advance Information
Table 32 on page 61 and the follow-
-
-
After an erase command sequence is written, if all sectors selected for erasing
are protected, Data# Polling on DQ7 is active for approximately 100 µs, then the
device returns to the read mode. If not all selected sectors are protected, the
Embedded Erase algorithm erases the unprotected sectors, and ignores the se
lected sectors that are protected. However, if the system reads DQ7 at an
address within a protected sector, the status may not be valid.
Just prior to the completion of an Embedded Program or Erase operation, DQ7
may change asynchronously with DQ0–DQ6 while Output Enable (OE#) is as
serted low. That is, the device may change from providing status information to
valid data on DQ7. Depending on when the system samples the DQ7 output, it
may read the status or valid data. Even if the device completed the program or
erase operation and DQ7 has valid data, the data outputs on DQ0–DQ6 may be
still invalid. Valid data on DQ0–DQ7 appears on successive read cycles.
Table 32 on page 61 shows the outputs for Data# Polling on DQ7. Figure 7, o n
page 57 shows the Data# Polling algorithm. Figure 19, on page 74 shows the
Data# Polling timing diagram.
-
-
56S29GL-A MirrorBit™ Flash FamilyS29GL-A_00_A3 April 22, 2005
Page 59
Advance Information
START
Read DQ15–DQ0
Addr = VA
DQ7 = Data?
No
No
Notes:
1. VA = Valid address for programming. During a sector erase operation, a valid address is any sector address within the sector being erased.
During chip erase, a valid address is any non-protected sector address.
2. DQ7 should be rechecked even if DQ5 = 1 because DQ7 may chan g e simultaneously with DQ5.
DQ5 = 1?
Yes
Read DQ15–DQ0
Addr = VA
DQ7 = Data?
No
FAIL
Yes
Yes
PASS
Figure 7. Data# Polling Algorithm
RY/ BY# : Re ad y/ Bus y#
The RY/BY# is a dedicated, open-drain output pin which indicates whether an
Embedded Algorithm is in progress or complete. The RY/BY# status is valid after
the rising edge of the final WE# pulse in the command sequence. Since RY/BY#
is an open-drain output, several RY/BY# pins can be tied together in parallel with
a pull-up resistor to V
If the output is low (Busy), the device is actively erasing or progra mming. (This
includes programming in the Erase Suspend mode.) If the output is high
(Ready), the device is in the read mode, the standby mode, or in the erase-sus
pend-read mode. Table 32 on page 61 shows the outputs for RY/BY#.
April 22, 2005 S29GL-A_00_A3S29GL-A MirrorBit™ Flash Family57
CC
.
-
Page 60
DQ6: Toggle Bit I
T oggle Bit I on DQ6 indicates whether an Embedded Program or Erase algorithm
is in progress or complete , or whether the device entered the Erase Suspend
mode. Toggle Bit I may be read at any address, and is valid after the rising edge
of the final WE# pulse in the command sequence (prior to the program or erase
operation), and during the sector erase time-out.
During an Embedded Program or Erase algorithm operation, successive read cycles to any address cause DQ6 to toggle. The system may use either OE# or CE#
to control the read cycles. When the operation is complete, DQ6 stops toggling.
After an erase command sequence is written, if all sectors selected for erasing
are protected, DQ6 toggles for approximately 100 µs, then returns to reading
array data. If not all selected sectors are protected, the Embedded Erase algo
rithm erases the unprotected sectors, and ignores the selected sectors that are
protected.
The system can use DQ6 and DQ2 together to determine whether a sector is actively erasing or is erase-suspended. When the device is actively erasing (that
is, the Embedded Erase algorithm is in progress), DQ6 toggles. When the device
enters the Erase Suspend mode, DQ6 stops toggling. However , the system must
also use DQ2 to determine which sectors are erasing or erase-suspended. Alter
natively, the system can use DQ7 (see the subsection onDQ7: Data# Polling on
page 56).
Advance Information
-
-
If a program address falls within a protecte d sector, DQ6 toggles for a pproximately 1 µs after the program command sequence is written, then returns to
reading array da ta.
DQ6 also toggles during the erase-suspend-program mode, and stops toggling
once the Embedded Program algorithm is complete.
Table 32 on page 61 shows the outputs for Toggle Bit I on DQ6. Figure 8, on page
59 shows the toggle bit algorithm. Figure 20, on page 75 shows the toggle bit
timing diagr ams. Figure 21, on page 75 shows the dif fer ences b etw een DQ2 and
DQ6 in graphical form. See also the subsection on DQ2: Toggle Bit II on page 60.
58S29GL-A MirrorBit™ Flash FamilyS29GL-A_00_A3 April 22, 2005
Page 61
Advance Information
START
Read DQ7–DQ0
Read DQ7–DQ0
Toggle Bit
= Toggle?
Yes
No
Note:The system should recheck t he to ggle bit even if DQ5 = 1 because the toggle bit may
stop toggling as DQ5 changes to 1. See the subsections on DQ6 and DQ2 for more information.
DQ5 = 1?
Yes
Read DQ7–DQ0
Twice
Toggle Bit
= Toggle?
Yes
Program/Erase
Operation Not
Complete, Write
Reset Command
No
No
Program/Erase
Operation Complete
Figure 8. Toggle Bit Algorithm
April 22, 2005 S29GL-A_00_A3S29GL-A MirrorBit™ Flash Family59
Page 62
Advance Information
DQ2: Toggle Bit II
The “Toggle Bit II” on DQ2, when used with DQ6, indicates whether a particular
sector is actively erasing (that is, the Embedded Erase algorithm is in progress),
or whether that sector is erase-suspended. Toggle Bit II is valid after the rising
edge of the final WE# pulse in the command sequence.
DQ2 toggles when the system reads at addresses within those sectors that were
selected for erasure. (The system may use either OE# or CE# to control the read
cycles.) But DQ2 cannot distinguish whether the sector is actively erasing or is
erase-suspended. DQ6, by comparison, indicates whether the device is actively
erasing, or is in Erase Suspend, but cannot distinguish which sectors are selected
for erasure. Thus, both status bits a re required for sector and mode information.
Refer t o
Figure 8, on page 59 shows the toggle bit algorithm in flowchart form, and the
section “DQ2: T oggle Bit II” explains the algorithm. See also the RY/BY#: Ready/
Busy# subsection.
Figure 21, on page 75 shows the differences between DQ2 and DQ6 in graphical
form.
Table 32 on page 61 to compare outp u ts fo r D Q 2 and DQ6.
Figure 20, on page 75 shows the toggle bit timing diagram.
Reading Toggle Bits DQ6/DQ2
Refer to Figure 8, on pa ge 59 for the following discussion. Whenever the system
initially begins reading toggle bit status, it must read DQ7–DQ0 at least twice in
a row to determine whether a toggle bit is toggling. Typically, the system would
note and store the value of the toggle bit after the first read. After the second
read, the system would compare the new value of the toggle bit with the first. If
the toggle bit is not toggling, the device completed the program or erase oper
ation. The system can read arra y data on DQ7–DQ0 on the following re ad cycle .
-
However, if after the initial two read cycles, the sys tem determines tha t the tog gle bit is still toggling, the system also should note whether the value of DQ5 is
high (see the section on DQ5). If it is, the system should then determine again
whether the toggle bit is toggling, since the toggle bit may have stopped toggling
just as DQ5 went high. If the toggle bit is no longer toggling, the device success
fully completed the program or erase operation. If it is still toggling, the device
did not completed the operation succe ssfully, and the system must write the
reset command to return to reading array data.
The remaining scenario is that the system initially determines that the toggle bit
is toggling and DQ5 has not gone high. The system may continue to monitor t he
toggle bit and DQ5 through successive read cycles, determining the status as de
scribed in the previous paragraph. Alternatively, it may choose to perform other
system tasks. In this case, the system must start at the beginning of the algo
rithm when it returns to determine the status of the operation (top of Figure 8,
on page 59).
DQ5: Exceeded Timing Limits
DQ5 indicates whether the program, erase, or write-to-buffer time exc e eded a
specified internal pulse count limit. Under these conditions DQ5 produces a 1.
indicating that the program or erase cycle was not successfully completed.
The device may output a 1 on DQ5 if the system tries to program a 1 to a locati on
that was previously programmed to 0. Only an erase operation can change a 0 back to a 1. Under this condition, the device halts the operation, and when
the timing limit is exceeded, DQ5 produces a 1.
-
-
-
60S29GL-A MirrorBit™ Flash FamilyS29GL-A_00_A3 April 22, 2005
Page 63
Advance Information
In all these cases, the system must write the reset command to return the device
to the reading the array (or to erase-suspend-read if the device was previously
in the erase-suspend-program mode).
DQ3: Sector Erase Timer
After writing a sector erase command sequence, the system may read DQ3 to
determine whether or not erasure began. (The sector erase timer does not apply
to the chip erase command.) If additional sectors are selected for erasure, the
entire time-out also applies after each additional sector erase command. When
the time-out period is complete, DQ3 switches from a 0 to a 1. If the t ime be
tween additional sector erase commands from the system can be assumed to be
less than 50 µs, the s ystem need not monitor DQ 3. See also the Sect or Erase
Command Sequence section.
After the sector erase command is written, the system should read the status of
DQ7 (Data# Polling) or DQ6 (T oggle Bit I) to ensure that the device accepted the
command sequence, and then read DQ3. If DQ3 is 1, the Embedded Erase algo
rithm has begun; all further commands (except Erase Suspend) are ignored until
the erase operation is complete. If DQ3 is 0, the device accepts additional sector
erase commands. To ensure the command is accepted, the system software
should check the status of DQ3 prior to and following each subsequent sector
erase command. If DQ3 is high on the second status check, the last command
might not have been accepted.
-
-
Table 32 on page 61 shows the status of DQ3 relative to the other status bits.
DQ1: Write-to-Buffer Abort
DQ1 indicates whether a Write-to-Buffe r operation was aborted. Un der these
conditions DQ1 produces a 1. The system must issue the Write-to-Buff er-AbortReset command sequence to return the device to reading array data. See
Buffer on page 20 for more details.
Ta b le 32 . Write Operation Status
Status
Standard Mode
Program Suspend Mode
Erase Suspend Mode
Write-toBuffer
Notes:
1. DQ5 switches to 1 when an Embedded Pr ogram, E mbedde d Eras e, or Wr ite-t o-Bu ffer op eratio n exc eeded the maxi mum timi ng l imits. Refer
to the section on DQ5 for more information.
2. DQ7 and DQ2 require a valid address when reading status information. Refer to the appropriate subsection for further details.
3. The Data# Polling algorithm sho uld be used to monitor the last loaded w rite-buffer address location.
4. DQ1 switches to 1 when the device aborts the write-to-buffer operation.
Embedded Program AlgorithmDQ7#Toggle0N/ANo toggle00
Embedded Erase Algorithm0Toggle01ToggleN/A0
1. Minimum DC voltage on in put o r I/O s is –0.5 V . Duri ng vo ltage t ransi tions, in puts
or I/Os may overshoot V
page 62. Maximum DC voltage on input or I/Os is VCC + 0.5 V. During voltage
transitions, input or I/O pins may overshoot to VCC + 2.0 V for periods up to 20
ns. See Figure 10, on page 62.
2. Minimum DC inpu t vo l tage on pins A9, O E#, ACC, and RESET# is –0. 5 V. Dur i n g
voltage transitions, A9, OE#, ACC, and RESET# may overshoot V
periods of up to 20 ns. See Figure 9, on page 62. Maximum DC input voltage on
pin A9, OE#, ACC, and RESET# is +12.5 V which may overshoot to +14.0V for
periods up to 20 ns.
3. No more than one output may be shorted to ground at a time. Duration of the short
circuit should not be greater than one second.
4. Stresses above those listed under Absolute Maximum Ratings may cause
permanent damage to the device. This is a stress rating only; functional operation
of the device at these or any other conditions above those indicated in the
operational sections of this data sheet is not implied. Exposure of the device to
absolute maximum rating conditions for extended periods may affect device
reliability.
SS
to –2.0 V for periods of up to 20 ns. See Figure 9, on
to –2.0 V for
SS
20 ns
20 ns
+0.8 V
–0.5 V
–2.0 V
20 ns
Figure 9. Maximum Negative Overshoot Waveform
20 ns
V
CC
+2.0 V
V
CC
+0.5 V
2.0 V
20 ns
20 ns
Figure 10. Maximum Positive Overshoot Wavefo rm
62S29GL-A MirrorBit™ Flash FamilyS29GL-A_00_A3 April 22, 2005
Input Low Voltage 1 (Note 6)–0.50.8V
Input High Voltage 1 (Note 6)0.7 V
Voltage for ACC Program
Acceleration
Voltage for Autoselect and Temporary
Sector Unprotect
Output Low Voltage (Note 6)IOL = 4.0 mA, VCC = V
Output High Voltage
VCC = 2.7 –3.6 V11.512.012.5V
VCC = 2.7 –3.6 V11.512.012.5V
0.45V
CC min
IOH = –2.0 mA, VCC = V
IOH = –100 µA, VCC = V
0.85 V
CC min
VCC–0.4V
CC min
CC
CC
VCC + 0.5V
Low VCC Lock-Out Voltage (Note 7)2.32.5V
µA
V
Notes:
1. On the WP#/ACC pin only, the maximum input load current when WP# = VIL is ± 5.0 µA.
2. The ICC current listed is typically less than 3.5 mA/MHz, with O E# at VIH.
3. Maximum ICC specificat ions are tested with VCC = VCCmax.
4. ICC active while Embedded Erase or Embedded Program is in progress.
5. Automatic sleep mode enable s the low power mode when addresse s remain stable for t
6. VCC voltage re q uirements.
+ 30 ns.
ACC
7. Not 100% tested.
64S29GL-A MirrorBit™ Flash FamilyS29GL-A_00_A3 April 22, 2005
Page 67
Test Conditions
Output Load1 TTL gate
Output Load Capacitance, C
(including jig capacitance)
Input Rise and Fall T im e s5ns
Input Pulse Le vels0.0 or V
Input timing measuremen t re fere nce levels (S e e N ote )0.5 V
Output timing measurement reference levels0.5 V
Advance Information
Device
Under
Test
C
L
Note: Diodes are IN3064 or equivalent.
6.2 k
Ω
Figure 11. Te s t S e t up
Table 33. Test Specifications
Test ConditionAll Speeds Unit
L
3.3 V
2.7 k
Ω
30pF
CC
CC
CC
V
V
V
Key to Switching Waveforms
WaveformInputsOutputs
Don’t Care, Any C ha n ge PermittedChanging, State Unknown
Does Not ApplyCenter Line is High Impedance State (High Z)
V
CC
0.0 V
0.5 V
CC
Figure 12. Input Waveforms and Measurement Levels
Steady
Changing from H to L
Changing from L t o H
0.5 V
CC
OutputMeasurement LevelInput
April 22, 2005 S29GL-A_00_A3S29GL-A MirrorBit™ Flash Family65
Page 68
Advance Information
AC Characteristics
Ta b l e 3 4 . Read-Only Operations-S29GL064A Only
Parameter
JEDECStd.901011
t
AVAV
t
AVQV
t
ELQV
t
GLQV
t
EHQZ
t
GHQZ
t
AXQX
t
Read Cycle Time (Note 1)Min90100110ns
RC
t
Address to Output Delay
ACC
t
Chip Enable to Output Delay
CE
t
Page Access TimeMax253030ns
PACC
t
Output Enable to Output Delay Max253030ns
OE
t
Chip Enable to Output High Z (Note 1) Max16ns
DF
t
Output Enable to Output High Z (Note 1) Max16ns
DF
Output Hold Time From Addresses, CE# or OE#, Whichever
t
OH
Occurs First
Output Enable Hold Time
t
OEH
(Note 1)
DescriptionTest Setup
CE#, OE# = V
OE# = V
Max90100110ns
IL
Max90100110ns
IL
Min0ns
ReadMin0ns
Toggle and
Data# Polling
Min10ns
Notes:
1. Not 100% tested.
2. See Figure 11, on page 65 and Table 33 on page 65 for test specifications
Ta b l e 3 5 . Read-Only Operations-S29GL032A Only
Speed Options
Unit
Parameter
JEDECStd.901011
t
AVAVtRC
t
AVQVtACC
t
ELQVtCE
t
GLQVtOE
t
EHQZtDF
t
GHQZtDF
t
AXQXtOH
Read Cycle Time (Note 1)Min90100110ns
Address to Output Delay
Chip Enable to Output Delay
t
Page Access TimeMax253030ns
PACC
Output Enable to Output Delay Max253030ns
Chip Enable to Output High Z (Note 1) Max16ns
Output Enable to Output High Z (Note 1) Max16ns
Output Hold Time From Addresses, CE# or OE#,
Whichever Occurs First
DescriptionTest Setup
CE#, OE# = V
OE# = V
IL
IL
Speed Options
Max90100110ns
Max90100110ns
Min0ns
ReadMin0ns
t
Output Enable Hold Time (Note 1)
OEH
Toggle and
Data# Polling
Min10ns
Notes:
1. Not 100% tested.
2. See Figure 11, on page 65 and Table 33 on page 65 for test specifications.
Unit
66S29GL-A MirrorBit™ Flash FamilyS29GL-A_00_A3 April 22, 2005
Page 69
Advance Information
Ta b l e 3 6 . Read-Only Operation-S29GL016A Only
Parameter
JEDECStd.9010
t
AVAV
t
AVQV
t
ELQV
t
GLQV
t
EHQZ
t
GHQZ
t
AXQX
t
Read Cycle Time (Note 1)Min90100ns
RC
t
Address to Output Delay
ACC
t
Chip Enable to Output Delay
CE
t
Page Access TimeMax2530ns
PACC
t
Output Enable to Output Delay Max2530ns
OE
t
Chip Enable to Output High Z (Note 1) Max16ns
DF
t
Output Enable to Output High Z (Note 1) Max16ns
DF
t
Output Hold Time From Addresses, CE# or OE#, Whichever Occurs FirstMin0ns
OH
t
Output Enable Hold Time (Note 1)
OEH
DescriptionTest Setup
CE#, OE# = V
OE# = V
ReadMin0ns
Toggle and Data# PollingMin10ns
Max90100ns
IL
Max90100ns
IL
Speed Options
Notes:
1. Not 100% tested.
2. See Figure 11, on page 65 and Table 33 on page 65 for test specifications.
t
RC
Addresses
Addresses Stable
t
ACC
CE#
t
RH
OE#
t
RH
t
OEH
t
OE
t
DF
Unit
WE#
HIGH Z
Outputs
t
CE
t
OH
HIGH Z
Output Valid
RESET#
RY/BY#
0 V
Figure 13. Read Operation Timings
April 22, 2005 S29GL-A_00_A3S29GL-A MirrorBit™ Flash Family67
Page 70
Advance Information
A23-A2
-
A1
Data Bus
Note: *
Parameter
JEDECStd.
t
Ready
t
Ready
t
RP
t
RH
t
RPD
t
RB
Same Page
A0*
t
ACC
Aa
AbAc
t
PAC C
t
PAC C
t
PAC C
Ad
QaQbQcQd
CE#
OE#
Figure shows device in word mode. Addresses are A1–A-1 for byte mode
.
Figure 14. Page Read Timings
Ta b l e 3 7 . Hardware Reset (RESET#)
DescriptionAll Speed OptionsUnit
RESET# Pin Low (During Embedded Algorithms) to Read Mode (See Note)Max20µs
RESET# Pin Low (NOT During Embedded Algorithms) to Read Mode(See Note) Max500ns
RESET# Pulse WidthMin500ns
Reset High Time Before Read (See Note)Min50ns
RESET# Input Low to Standby Mode (See Note)Min20µs
RY/BY# Output High to CE#, OE# pin LowMin0ns
Note:
Not 100% tested
.
68S29GL-A MirrorBit™ Flash FamilyS29GL-A_00_A3 April 22, 2005
Page 71
RY/BY#
CE#, OE#
RESET#
RY/BY#
Advance Information
t
RH
t
RP
t
Ready
Reset Timings NOT during Embedded Algorithms
Reset Timings during Embedded Algorithms
t
Ready
t
RB
CE#, OE#
RESET#
t
RP
Notes:
1. Not 100% tested.
2. See the Erase And Programming Performance on page 81 for more informati on .
3. For 1–16 words/1–32 bytes programmed.
Figure 15. Reset Timings
t
RH
April 22, 2005 S29GL-A_00_A3S29GL-A MirrorBit™ Flash Family69
Page 72
Advance Information
Ta b l e 3 8 . Erase and Program Operations-S29GL064A
Parameter
JEDECStd.901011
t
AVAV
t
AVWL
t
WLAX
t
DVWH
t
WHDX
t
GHWL
t
ELWL
t
WHEH
t
WLWH
t
WHDL
t
t
t
ASO
t
t
t
t
t
CEPH
t
OEPH
t
GHWL
t
t
t
t
WPH
WC
AS
AH
AHT
DS
DH
CS
CH
WP
Write Cycle Time (Note 1)Min90100110ns
Address Setup TimeMin0ns
Address Setup Time to OE# low during toggle bit polling Min15ns
Address Hold TimeMin45ns
Address Hold Time From CE# or OE# high during toggle bit polling Min0ns
Data Setup TimeMin35ns
Data Hold TimeMin0ns
CE# High during toggle bit pollingMin20ns
OE# High during toggle bit pollingMin20ns
Read Recovery Time Before Write (OE# High to WE# Low)Min0ns
CE# Setup TimeMin0ns
CE# Hold TimeMin0ns
Write Pulse WidthMin35ns
Write Pulse Width HighMin30ns
Description
Write Buffer Program Operation (Note 2, Note 3)Typ240
t
WHWH1
t
WHWH1
Accelerated Single Word Program Operation (Note 2)Typ54
t
WHWH2
t
WHWH2
t
VHH
t
VCS
t
BUSY
t
POLL
Sector Erase Operation (Note 2)Typ0.5sec
V
Rise and Fall Time (Note 1)Min250ns
HH
V
Setup Time Note 1)Min50µs
CC
WE# High to RY/BY# LowMin90100110ns
Program Valid before Status Polling Max4µs
Notes:
1. Not 100% tested.
2. See the Erase And Programming Performance on page 81 for more informati on .
3. For 1–16 words/1–32 bytes programmed.
4. If a program suspend command is issued within t
(that is, the progra m resume command is written). If the suspend command was issued after t
after programming resumes. See
Figure 16, on page 73.
, the device requires t
POLL
before reading status data, once programming resumes
POLL
Speed Options
, status data is available immediately
POLL
Unit
µsSingle Word Program Operation (Note 2)Typ60
70S29GL-A MirrorBit™ Flash FamilyS29GL-A_00_A3 April 22, 2005
Page 73
Advance Information
Ta b l e 3 9 . Erase and Program Operations-S29GL032A Only
Parameter
JEDECStd.901011
t
AVAV
t
AVWL
t
WLAX
t
DVWH
t
WHDX
t
GHWL
t
ELWL
t
WHEH
t
WLWH
t
WHDL
t
t
t
ASO
t
t
AHT
t
t
t
CEPH
t
OEPH
t
GHWL
t
t
t
t
WPH
Write Cycle Time (Note 1)Min90100110ns
WC
Address Setup TimeMin0ns
AS
Address Setup Time to OE# low during toggle bit polling Min15ns
Address Hold TimeMin45ns
AH
Address Hold Time From CE# or OE# high during toggle bit pollingMin0ns
Data Setup TimeMin35ns
DS
Data Hold TimeMin0ns
DH
CE# High during toggle bit pollingMin20ns
OE# High during toggle bit pollingMin20ns
Read Recovery Time Before Write (OE# High to WE# Low)Min0ns
CE# Setup TimeMin0ns
CS
CE# Hold TimeMin0ns
CH
Write Pulse WidthMin35ns
WP
Write Pulse Width HighMin30ns
Description
Speed Options
Write Buffer Program Operation (Note 2, Note 3)Typ240
t
WHWH1
t
WHWH1
Accelerated Single Word Program Operation (Note 2)Typ54
t
WHWH2
t
WHWH2
t
VHH
t
VCS
t
BUSY
t
POLL
Sector Erase Operation (Note 2)Typ0.5sec
V
Rise and Fall Time (Note 1)Min250ns
HH
V
Setup Time (Note 1)Min50µs
CC
WE# High to RY/BY# LowMin90100110ns
Program Valid before Status Polling Max4µs
Notes:
1. Not 100% tested.
2. See Erase And Programming Performance on page 81 for more information
3. For 1–16 words/1–32 bytes programmed.
4. Effective write buffer specification is based upon a 16-word/32-byte write buffer operation.
5. If a program suspend command is issued within t
(that is, the progra m resume command is written). If the suspend command was issued after t
after programming resumes. See
Figure 16, on page 73.
, the device requires t
POLL
before reading status data, once programming resumes
POLL
, status data is available immediately
POLL
Unit
µsSingle Word Program Operation (Note 2)Typ60
April 22, 2005 S29GL-A_00_A3S29GL-A MirrorBit™ Flash Family71
Page 74
Advance Information
Ta b l e 4 0 . Erase and Program Operations-S29GL016A Only
Parameter
JEDECStd.9010
t
AVAV
t
AVWL
t
WLAX
t
DVWH
t
WHDX
t
GHWL
t
ELWL
t
WHEH
t
WLWH
t
WHDL
t
WC
t
t
ASO
t
t
AHT
t
t
t
CEPH
t
OEPH
t
GHWL
t
t
t
t
WPH
Write Cycle Time (Note 11)Min90100ns
Address Setup TimeMin0ns
AS
Address Setup Time to OE# low during toggle bit polling Min15ns
Address Hold TimeMin45ns
AH
Address Hold Time From CE# or OE# high during toggle bit pollingMin0ns
Data Setup TimeMin35ns
DS
Data Hold TimeMin0ns
DH
CE# High during toggle bit pollingMin20ns
OE# High during toggle bit pollingMin20ns
Read Recovery Time Before Write (OE# High to WE# Low)Min0ns
CE# Setup TimeMin0ns
CS
CE# Hold TimeMin0ns
CH
Write Pulse WidthMin35ns
WP
Write Pulse Width HighMin30ns
Description
Speed Options
Write Buffer Program Operation (Note 2, Note 3)Typ240
t
WHWH1
t
WHWH1
Accelerated Single Word Program Operation (Note 2)Typ54
t
WHWH2
t
WHWH2
t
VHH
t
VCS
t
BUSY
t
POLL
Sector Erase Operation (Note 2)Typ0.5sec
V
Rise and Fall Time (Note 1)Min250ns
HH
V
Setup Time (Note 1)Min50µs
CC
WE# High to RY/BY# LowMin90100ns
Program Valid before Status Polling Max4µs
Notes:
1. Not 100% tested.
2. See Erase And Programming Performance on page 81 for more information
3. For 1–16 words/1–32 bytes programmed.
4. Effective write buffer specification is based upon a 16-word/32-byte write buffer operation.
5. If a program suspend command is issued within t
(that is, the progra m resume command is written). If the suspend command was issued after t
after programming resumes. See
Figure 16, on page 73
, the device requires t
POLL
before reading status data, once programming resumes
POLL
, status data is available immediately
POLL
Unit
µsSingle Word Program Operation (Note 2)Typ60
72S29GL-A MirrorBit™ Flash FamilyS29GL-A_00_A3 April 22, 2005
Page 75
Advance Information
Program Command Sequence (last two cycles)
t
WC
Addresses
555h
CE#
OE#
t
WP
WE#
t
CS
t
DS
Data
A0h
RY/BY#
V
CC
t
Notes:
1. PA = program address, PD = program data, D
2. Illustration shows device in word mode.
VCS
Figure 16. Program Operation Timings
t
AS
PAPA
t
AH
t
CH
t
POLL
t
WPH
t
DH
PD
t
BUSY
is the true data at the program ad dress.
OUT
Read Status Data (last two cycles)
PA
t
WHWH1
Status
D
OUT
t
RB
V
V
HH
HH
V
or V
V
or V
IL
ACC
ACC
IL
IH
IH
t
t
VHH
VHH
t
t
VHH
VHH
VIL or V
VIL or V
IH
IH
Figure 17. Accelerated Program Timing Diagram
April 22, 2005 S29GL-A_00_A3S29GL-A MirrorBit™ Flash Family73
Page 76
Advance Information
Erase Command Sequence (last two cycles)Read Status Data
t
AS
555h for chip erase
VA
t
AH
Addresses
t
WC
2AAhSA
CE#
t
t
WP
t
DS
55h
CH
t
WPH
t
DH
30h
10 for Chip Erase
t
BUSY
t
WHWH2
In
Progress
OE#
WE#
Data
t
CS
RY/BY#
t
VCS
V
CC
Notes:
1. SA = sector addres s (for Sect or Erase ), VA = Vali d Addre ss f or read i ng sta tu s dat a (see Write Operation Status on page 56.)
2. Illustration shows device in word mode.
Figure 18. Chip/Sector Erase Operation Timings
Addresses
t
POLL
CE#
t
CH
OE#
t
WE#
DQ7
OEH
t
ACC
t
CE
t
VA
t
RC
OE
t
OH
Complement
VAVA
t
DF
Complement
Tr ue
Valid Data
VA
Complete
t
RB
High Z
DQ0–DQ6
RY/BY#
t
BUSY
Status Data
Status Data
Tr ue
Valid Data
High Z
Note: VA = Valid address. Illustration shows first status cycle after command sequence, last status read cycle, and array
data read cycle.
74S29GL-A MirrorBit™ Flash FamilyS29GL-A_00_A3 April 22, 2005
Page 77
Advance Information
t
AHT
t
AS
Addresses
t
t
ASO
AHT
CE#
t
t
OEH
CEPH
WE#
t
OEPH
OE#
t
DH
DQ6 / DQ2Valid Data
Valid Data
Valid
Status
t
OE
Valid
Status
Valid
Status
(first read)(second read)(stops toggling)
RY/BY#
Note: VA = Valid address; not required for DQ6. Illustration shows first two status cycle after command sequence, last
status read cycle, and array data read cycle.
Figure 20. Toggle Bit Timings (During Embedded Algorithms)
Enter
Embedded
Erasing
WE#
Erase
Erase
Suspend
Erase Suspend
Enter Erase
Suspend Program
Read
Erase
Suspend
Program
Resume
Erase Suspend
Read
Erase
Erase
Erase
Complete
DQ6
DQ2
Note: DQ2 toggles only when read at an address within an erase-suspended sector. The system may use OE# or CE#
to toggle DQ2 and DQ6.
Figure 21. DQ2 vs. DQ6
Ta b l e 4 1 . Temporary Sector Unprotect
Parameter
JEDECStd
t
VID Rise and Fall Time (See Note)Min500ns
VIDR
RESET# Setup Time for Temporary Sector UnprotectMin4µs
t
RSP
Note: Not 100% tested.
DescriptionAll Speed OptionsUnit
April 22, 2005 S29GL-A_00_A3S29GL-A MirrorBit™ Flash Family75
Page 78
Advance Information
RESET#
RY/BY#
RESET#
SA, A6,
A3, A2,
A1, A0
CE#
WE#
V
V
ID
IH
V
ID
VSS, VIL,
or V
IH
t
VIDR
Program or Erase Command Sequence
t
RSP
Figure 22. Temporary Sector Group Unprotect Timing Diagram
Valid*Valid*Valid*
Sector Group Protect or UnprotectVerify
t
RRB
t
VIDR
V
VSS, VIL,
or V
ID
IH
Data
60h60h40h
Sector Group Protect: 150 µs,
Sector Group Unprotect: 15 ms
1 µs
CE#
WE#
OE#
Note: For sector group protect, A6:A0 = 0xx0010. For sector group un protect, A6:A0 = 1xx0010.
Figure 23. Sector Group Protect and Unprotect Timing Diagram
Status
76S29GL-A MirrorBit™ Flash FamilyS29GL-A_00_A3 April 22, 2005
Page 79
Advance Information
Ta b l e 42 . Alternate CE# Controlled Erase and Program Operations-S29GL064A
Parameter
JEDECStd.901011
t
AVAV
t
AVWL
t
ELAX
t
DVEH
t
EHDX
t
GHEL
t
WLEL
t
EHWH
t
ELEH
t
EHEL
t
t
t
t
t
t
GHEL
t
t
t
t
WC
AS
AH
DS
DH
WS
WH
CP
CPH
Write Cycle Time (Note 1)Min90100110ns
Address Setup TimeMin0ns
Address Hold TimeMin45ns
Data Setup TimeMin35ns
Data Hold TimeMin0ns
Read Recovery Time Before Write (OE# High to WE# Low)Min0ns
WE# Setup TimeMin0ns
WE# Hold TimeMin0ns
CE# Pulse WidthMin35ns
CE# Pulse Width HighMin25ns
Description
Speed Options
Write Buffer Program Operation (Notes2, 3)Typ240
t
WHWH1
t
WHWH1
Single Word Prog ram Operation ( Note 2)Typ60
Accelerated Single Word Program Operation (Note 2)Typ54
t
WHWH2
t
WHWH2
t
RH
t
POLL
Sector Erase Operation (Note 2)Typ0.5sec
RESET# High Time Before WriteMin50ns
Program Valid before Status Polling (Note 4)Max4µs
Notes:
1. Not 100% tested.
2. See the Erase And Programming Performance on page 81 for more informati on .
3. For 1–16 words/1–32 bytes programmed.
4. If a program suspend command is issued within t
(that is, the progra m resume command is written). If the suspend command was issued after t
after programming resumes. See
Figure 24, on page 80.
, the device requires t
POLL
before reading status data, once programming resumes
POLL
, status data is available immediately
POLL
Unit
µs
April 22, 2005 S29GL-A_00_A3S29GL-A MirrorBit™ Flash Family77
Page 80
Advance Information
Ta b l e 43 . Alternate CE# Controlled Erase and Program Operations-S29GL032A
Parameter
JEDECStd.901011
t
AVAV
t
AVWL
t
ELAX
t
DVEH
t
EHDX
t
GHEL
t
WLEL
t
EHWH
t
ELEH
t
EHEL
t
t
t
GHEL
t
t
t
WC
t
t
t
DH
WS
WH
t
CPH
Write Cycle Time (Note 1)Min90100110ns
Address Setup TimeMin0ns
AS
Address Hold TimeMin45ns
AH
Data Setup TimeMin35ns
DS
Data Hold TimeMin0ns
Read Recovery Time Before Write
(OE# High to WE# Low)
WE# Setup TimeMin0ns
WE# Hold TimeMin0ns
CE# Pulse WidthMin35ns
CP
CE# Pulse Width HighMin25ns
Description
Min0ns
Speed Options
Write Buffer Program Operation (Notes2, 3)Typ240
t
WHWH1
t
WHWH1
Accelerated Single Word Program Operation (Note 2)Typ54
t
WHWH2
t
WHWH2
t
RH
t
POLL
Sector Erase Operation (Note 2)Typ0.5sec
RESET# High Time Before WriteMin50ns
Program Valid before Status Polling (Note 4)Max4µs
Notes:
1. Not 100% tested.
2. See Erase And Programming Performance on page 81 for more information
3. For 1–16 words/1–32 bytes programmed.
4. If a program suspend command is issued within t
(that is, the progra m resume command is written). If the suspend command was issued after t
after programming resumes. See
Figure 24, on page 80.
, the device requires t
POLL
before reading status data, once programming resumes
POLL
, status data is available immediately
POLL
Unit
µsSingle Word Program Operation (Note 2)Typ60
78S29GL-A MirrorBit™ Flash FamilyS29GL-A_00_A3 April 22, 2005
Page 81
Advance Information
Ta b l e 4 4 . Alternate CE# Controlled Erase and Program Operations-S29GL016A
Parameter
JEDECStd.9010
t
AVAV
t
AVWL
t
ELAX
t
DVEH
t
EHDX
t
GHEL
t
WLEL
t
EHWH
t
ELEH
t
EHEL
t
t
GHEL
t
t
t
WC
t
t
t
t
WS
WH
t
CPH
Write Cycle Time (Note 1)Min90100ns
Address Setup TimeMin0ns
AS
Address Hold TimeMin45ns
AH
Data Setup TimeMin35ns
DS
Data Hold TimeMin0ns
DH
Read Recovery Time Before Write
(OE# High to WE# Low)
WE# Setup TimeMin0ns
WE# Hold TimeMin0ns
CE# Pulse WidthMin35ns
CP
CE# Pulse Width HighMin25ns
Description
Min0ns
Speed Options
Write Buffer Program Operation (Note 2, Note 3)Typ240
t
WHWH1
t
WHWH1
Accelerated Single Word Program Operation (Note 2)Typ54
t
WHWH2
t
WHWH2
t
RH
t
POLL
Sector Erase Operation (Note 2)Typ0.5sec
RESET# High Time Before WriteMin50ns
Program Valid before Status Polling (Note 4)Max4µs
Notes:
1. Not 100% tested.
2. See Erase And Programming Performance on page 81 for more information
3. For 1–16 words/1–32 bytes programmed.
4. If a program suspend command is issued within t
(that is, the progra m resume command is written). If the suspend command was issued after t
after programming resumes. See
Figure 24, on page 80
, the device requires t
POLL
before reading status data, once programming resumes
POLL
, status data is available immediately
POLL
Unit
µsSingle Word Program Operation (Note 2)Typ60
April 22, 2005 S29GL-A_00_A3S29GL-A MirrorBit™ Flash Family79
Page 82
Advance Information
Addresses
WE#
OE#
CE#
Data
RESET#
PBA for program
2AA for erase
t
WC
t
WH
t
WS
t
RH
SA for program buffer to flash
SA for sector erase
555 for chip erase
t
AS
t
AH
t
GHEL
t
CP
t
CPH
t
DS
t
DH
PBD for program
55 for erase
29 for program buffer to flash
30 for sector erase
10 for chip erase
t
BUSY
Data# Polling
t
POLL
t
WHWH1 or 2
PA
DQ7#D
OUT
RY/BY#
Notes:
1. Figure indicates last two bus cycles of a program or erase operation.
2. PA = program address, SA = sector address, PD = program data.
3. DQ7# is the complement of the data written to the device. D
April 22, 2005 S29GL-A_00_A3S29GL-A MirrorBit™ Flash Family81
Page 84
Physical Dimensions
SEE DETAIL B
B
B
SEE DETAIL A
TS048—48-Pin Standard Thin Small Outline Package (TSOP)
STANDARD PIN OUT (TOP VIEW)
2
1
Advance Information
A2
0.10 C
N
-A-
N
2
B
B
PARALLEL TO
SEATING PLANE
SEE DETAIL B
SEE DETAIL A
R
0˚
L
DETAIL A
5
D1
4
D
c
GAGE LINE
0.25MM (0.0098") BSC
N
+1
2
A
DETAIL B
-B-
E
7
e/2
-X-
X = A OR B
5
0.08MM (0.0031")
(c)
SECTION B-B
b
b1
e
A1
C
SEATING
PLANE
C A-B
SM
76
WITH PLATING
c1
BASE METAL
9
MAX
1.20
0.15
1.05
0.23
0.27
0.16
0.21
20.20
18.50
12.10
0.70
5˚
0.20
NOTES:
CONTROLLING DIMENSIONS ARE IN MILLIMETERS (MM).
1
(DIMENSIONING AND TOLERANCING CONFORMS TO ANSI Y14.5M-1982)
2
PIN 1 IDENTIFIER FOR STANDARD PIN OUT (DIE UP).
3
NOT APPLICABLE.
TO BE DETERMINED AT THE SEATING PLANE -C- . THE SEATING PLANE IS DEFINED AS THE PLANE OF
4
CONTACT THAT IS MADE WHEN THE PACKAGE LEADS ARE ALLOWED TO REST FREELY ON A FLAT
HORIZONTAL SURFACE.
5
DIMENSIONS D1 AND E DO NOT INCLUDE MOLD PROTRUSION. ALLOWABLE MOLD PROTUSION IS
0.15MM (.0059") PER SIDE.
6
DIMENSION b DOES NOT INCLUDE DAMBAR PROTUSION. ALLOWABLE DAMBAR PROTUSION SHALL BE
0.08 (0.0031") TOTAL IN EXCESS OF b DIMENSION AT MAX. MATERIAL CONDITION. MINIMUM SPACE
BETWEEN PROTRUSION AND AN ADJACENT LEAD TO BE 0.07 (0.0028").
7
THESE DIMENSIONS APPLY TO THE FLAT SECTION OF THE LEAD BETWEEN 0.10MM (.0039") AND
0.25MM (0.0098") FROM THE LEAD TIP.
8
LEAD COPLANARITY SHALL BE WITHIN 0.10MM (0.004") AS MEASURED FROM THE SEATING PLANE.
9
DIMENSION "e" IS MEASURED AT THE CENTERLINE OF THE LEADS.
3325 \ 16-038.10a
Package
Jedec
Symbol
A
A1
A2
b1
b
c1
c
D
D1
E
e
L
0
R
N
TS 048
MO-142 (B) EC
MIN
NOM
0.05
0.95
0.17
0.17
0.10
0.10
19.80
20.00
18.30
18.40
11.90
12.00
0.50 BASIC
0.50
0˚
0.08
1.00
0.20
0.22
0.60
48
3˚
82S29GL-A MirrorBit™ Flash FamilyS29GL-A_00_A3 April 22, 2005
Page 85
Advance Information
TS056—56-Pin Standard Thin Small Outline Package (TSOP)
2X
STANDARD PIN OUT (TOP VIEW)
2
1
AB
SEE DETAIL B
0.10
2X
N
0.10
A2
2X (N/2 TIPS)
0.10
REVERSE PIN OUT (TOP VIEW)
3
5
E
1
N
N
2
0.25
2X (N/2 TIPS)
PARALLEL TO
SEATING PLANE
N
+1
2
D1
5
4
D
B
A
B
SEE DETAIL A
e
9
A1
C
SEATING
PLANE
N
2
0.08MM (0.0031") M C A - B S
b
76
N
+1
2
WITH PLATING
(c)
7
b1
c1
BASE METAL
SECTION B-B
R
θ°
DETAIL A
(c)
GAUGE PLANE
0.25MM (0.0098") BSC
C
L
DETAIL B
e/2
X
X = A OR B
MAX
1.20
0.15
1.05
0.23
0.27
0.16
0.21
20.20
18.50
14.10
0.70
8˚
0.20
NOTES:
CONTROLLING DIMENSIONS ARE IN MILLIMETERS (mm).
1
(DIMENSIONING AND TOLERANCING CONFORMS TO ANSI Y14.5M-1982)
2
PIN 1 IDENTIFIER FOR REVERSE PIN OUT (DIE UP).
3
PIN 1 IDENTIFIER FOR REVERSE PIN OUT (DIE DOWN), INK OR LASER MARK.
TO BE DETERMINED AT THE SEATING PLANE -C- . THE SEATING PLANE IS DEFINED AS THE PLANE OF
4
CONTACT THAT IS MADE WHEN THE PACKAGE LEADS ARE ALLOWED TO REST FREELY ON A FLAT
HORIZONTAL SURFACE.
5
DIMENSIONS D1 AND E DO NOT INCLUDE MOLD PROTRUSION. ALLOWABLE MOLD PROTUSION IS
0.15mm (.0059") PER SIDE.
6
DIMENSION b DOES NOT INCLUDE DAMBAR PROTUSION. ALLOWABLE DAMBAR PROTUSION SHALL BE
0.08 (0.0031") TOTAL IN EXCESS OF b DIMENSION AT MAX. MATERIAL CONDITION. MINIMUM SPACE
BETWEEN PROTRUSION AND AN ADJACENT LEAD TO BE 0.07 (0.0028").
7
THESE DIMENSIONS APPLY TO THE FLAT SECTION OF THE LEAD BETWEEN 0.10MM (.0039") AND
0.25MM (0.0098") FROM THE LEAD TIP.
8
LEAD COPLANARITY SHALL BE WITHIN 0.10mm (0.004") AS MEASURED FROM THE SEATING PLANE.
9
DIMENSION "e" IS MEASURED AT THE CENTERLINE OF THE LEADS.
3356 \ 16-038.10c
Package
Jedec
Symbol
A
A1
A2
b1
b
c1
c
D
D1
E
e
L
0
R
N
TS 056
MO-142 (D) EC
MIN
NOM
0.05
1.00
0.95
0.20
0.17
0.22
0.17
0.10
0.10
19.80
20.00
18.30
18.40
13.90
14.00
0.50 BASIC
0.50
0.60
0˚
0.08
56
April 22, 2005 S29GL-A_00_A3S29GL-A MirrorBit™ Flash Family83
Page 86
Advance Information
LAA064—64-Ball Fortified Ball Grid Array (BGA)
84S29GL-A MirrorBit™ Flash FamilyS29GL-A_00_A3 April 22, 2005
Page 87
Advance Information
VBN048—48-Ball Fine-pitch Ball Grid Array (BGA) 10x 6 mm Package
D
A
E
-0.50
+0.20
1.00
+0.20
1.00
-0.50
A
A1
PACKAGE VBN 048
JEDEC N/A
10.00 mm x 6.00 mm NOM
PACKAGE
SYMBOL MIN NOM MAX NOTE
A --- --- 1.00 OVERALL THICKNESS
A1 0.17 --- --- BALL HEIGHT
A2 0.62 --- 0.73 BODY THICKNESS
D 10.00 BSC. BODY SIZE
E 6.00 BSC. BODY SIZE
D1 5.60 BSC. BALL FOOTPRINT
E1 4.00 BSC. BALL FOOTPRINT
MD 8 ROW MATRIX SIZE D DIRECTION
ME 6 ROW MATRIX SIZE E DIRECTION
N 48 TOTAL BALL COUNT
φb 0.35 --- 0.45 BALL DIAMETER
e 0.80 BSC. BALL PITCH
SD / SE 0.40 BSC. SOLDER BALL PLACEMENT
NONE DEPOPULATED SOLDER BALLS
Ø0.50
A1 ID.
SEATING PLANE
B
A2
C
D1
e
e
H
6
Øb
M
Ø0.08
C
M
Ø0.15
C0.10
C0.08
BA
C
SD
BCDEFG
7
NOTES:
1. DIMENSIONING AND TOLERANCING PER ASME Y14.5M-1994.
2. ALL DIMENSIONS ARE IN MILLIMETERS.
3. BALL POSITION DESIGNATION PER JESD 95-1, SPP-010 (EXCEPT
AS NOTED).
4. e REPRESENTS THE SOLDER BALL GRID PITCH.
5. SYMBOL "MD" IS THE BALL ROW MATRIX SIZE IN THE
"D" DIRECTION.
SYMBOL "ME" IS THE BALL COLUMN MATRIX SIZE IN THE
"E" DIRECTION.
N IS THE TOTAL NUMBER OF SOLDER BALLS.
6 DIMENSION "b" IS MEASURED AT THE MAXIMUM BALL
DIAMETER IN A PLANE PARALLEL TO DATUM C.
7 SD AND SE ARE MEASURED WITH RESPECT TO DATUMS
A AND B AND DEFINE THE POSITION OF THE CENTER
SOLDER BALL IN THE OUTER ROW.
WHEN THERE IS AN ODD NUMBER OF SOLDER BALLS IN
THE OUTER ROW PARALLEL TO THE D OR E DIMENSION,
RESPECTIVELY, SD OR SE = 0.000.
WHEN THERE IS AN EVEN NUMBER OF SOLDER BALLS IN
THE OUTER ROW, SD OR SE = e/2
8. NOT USED.
9. "+" INDICATES THE THEORETICAL CENTER OF DEPOPULATED
BALLS.
10 A1 CORNER TO BE IDENTIFIED BY CHAMFER, LASER OR INK
MARK, METALLIZED MARK INDENTATION OR OTHER MEANS.
6
5
7
4
SE
3
2
1
A
E1
A1 CORNER
3425\ 16-038.25
April 22, 2005 S29GL-A_00_A3S29GL-A MirrorBit™ Flash Family85
Page 88
Advance Information
VBK048—Ball Fine-pitch Ball Grid Array (BGA) 8.15x 6.15 mm Package
0.10
(4X)
D
A
e
E
H
D1
6
5
4
3
2
1
BCDEFG
A
SE
7
E1
PIN A1
CORNER
INDEX MARK
10
TOP VIEW
A
A1
PACKAGEVBK 048
JEDECN/A
8.15 mm x 6.15 mm NOM
SYMBOLMINNOMMAXNOTE
A------1.00 OVERALL THICKNESS
A10.18------BALL HEIGHT
A20.62---0.76 BODY THICKNESS
D8.15 BSC.BODY SIZE
E6.15 BSC.BODY SIZE
D15.60 BSC.BALL FOOTPRINT
E14.00 BSC.BALL FOOTPRINT
MD8ROW MATRIX SIZE D DIRECTION
ME6ROW MATRIX SIZE E DIRECTION
N48TOTAL BALL COUNT
φb0.35---0.43BALL DIAMETER
e0.80 BSC.BALL PITCH
SD / SE0.40 BSC.SOLDER BALL PLACEMENT
SEATING PLANE
SIDE VIEW
PACKAGE
---DEPOPULATED SOLDER BALLS
A2
B
6
φb
M
φ 0.08
C
M
φ 0.15
BA
C
SD
7
A1 CORNER
BOTTOM VIEW
C0.10
C
C0.08
NOTES:
1. DIMENSIONING AND TOLERANCING PER ASME Y14.5M-1994.
2. ALL DIMENSIONS ARE IN MILLIMETERS.
3. BALL POSITION DESIGNATION PER JESD 95-1, SPP-010 (EXCEPT
AS NOTED).
4. e REPRESENTS THE SOLDER BALL GRID PITCH.
5. SYMBOL "MD" IS THE BALL ROW MATRIX SIZE IN THE
"D" DIRECTION.
SYMBOL "ME" IS THE BALL COLUMN MATRIX SIZE IN THE
"E" DIRECTION.
N IS THE TOTAL NUMBER OF SOLDER BALLS.
6 DIMENSION "b" IS MEASURED AT THE MAXIMUM BALL
DIAMETER IN A PLANE PARALLEL TO DATUM C.
7 SD AND SE ARE MEASURED WITH RESPECT TO DATUMS
A AND B AND DEFINE THE POSITION OF THE CENTER
SOLDER BALL IN THE OUTER ROW.
WHEN THERE IS AN ODD NUMBER OF SOLDER BALLS IN
THE OUTER ROW PARALLEL TO THE D OR E DIMENSION,
RESPECTIVELY, SD OR SE = 0.000.
WHEN THERE IS AN EVEN NUMBER OF SOLDER BALLS IN
THE OUTER ROW, SD OR SE = e/2
8. NOT USED.
9. "+" INDICATES THE THEORETICAL CENTER OF DEPOPULATED
BALLS.
10 A1 CORNER TO BE IDENTIFIED BY CHAMFER, LASER OR INK
MARK, METALLIZED MARK INDENTATION OR OTHER MEANS.
3338 \ 16-038.25 \ 10.05.04
86S29GL-A MirrorBit™ Flash FamilyS29GL-A_00_A3 April 22, 2005
Page 89
Advance Information
Revision Summary
Revision A (October 13, 2004)
Initial Release.
Revision A1 (December 17, 2004)s
Secured Silicon Sector Flash Memory Region
Updated Secured Silicon Sector address table with addresses in x8-mode.
DC Characteristics (CMOS Compatible)
I
re-specified over temperature.
LIT
Corrected WP#/ACC input load current footnote.
Revision A2 (January 28, 2005)
Global
Added S29GL032A information.
Revision A3 (April 22, 2005)
Added S29GL016A information.
Corrected Secured Silicon Sector Indicator Bit in Table 15.
Colophon
The products described in this document are designed, developed and manufactured as contemplated for general use, including without limitation, ordinary
industrial use, general office use, personal use, and household use, but are not designed, developed and manufactured as contemplated (1) for any use that
includes fatal risks or dangers that, unless extremely high safety is secured, could have a serious effect to the public, and could lead directly to death, personal
injury, severe physical damage or other loss (i.e., nuclear reaction control in nuclear facility, aircraft flight control, air traffic control, mass transport control,
medical life support system, missile launch control in weapon system), or (2) for any use where chance of failure is intolerable (i.e., submersible repeater and
artificial satellite). Please note that Spansion will not be liable to you and/or any third party for any claims or damages arising in connection with abovementioned uses of the products. Any semiconductor devices have an inherent chance of failure. You must protect against injury, damage or loss from such
failures by incorporating safety design measures into your facility and equipment such as redundancy, fire protection, and prevention of over-current levels
and other abnormal operating conditions. If any products described in this document represent goods or technologies subject to certain restrictions on export under the Foreign Exchange and Foreign Trade Law of Japan, the US Export Administration Regulations or the applicable laws of any other country, the
prior authorization by the respective government entity will be required for export of those products.
Trademarks and Notice
The contents of this document are subject to change without notice. This document may contain information on a Spansion product under development by
Spansion LLC. Spansion LLC reserves the right to change or discontinue work on any product without notice. The information in this document is provided
as is without warranty or guarantee of any kind as to its accuracy, completeness, operability, fitness for particular purpose, merchantability, non-infringement
of third-party rights, or any other warranty, express, implied, or statutory. Spansion LLC assumes no liability for any damages of any kind arising out of the
use of the information in this document.