20A/10A, 12V, 0.060/0.140 Ohm, Logic
Level, Complementary Power MOSFET
These complementary power MOSFETs are manufactured
using an advanced MegaFET process. This process, which
uses feature sizes approaching those of LSI integrated
circuits, gives optimum utilization of silicon, resulting in
outstanding performance. It is designed for use in
applications such as switching regulators, switching
converters, motor drivers, relay drivers, and low voltage bus
switches. This product achieves full rated conduction at a
gate bias in the 3V to 5V range, thereby facilitating true
on-off power control directly from logic level (5V) integrated
circuits.
Operating and Storage Temperature . . . . . . . . . . . . TJ, T
STG
Maximum Temperature for Soldering
Leads at 0.063in (1.6mm) from Case for 10s. . . . . . . . . T
Package Body for 10s, See Techbrief 334 . . . . . . . . . .T
CAUTION: Stresses above those listed in “Absolute Maximum Ratings” may cause permanent damage to the device. This is a stress only rating and operation of the
device at these or any other conditions above those indicated in the operational sections of this specification is not implied.
L
pkg
50
0.33
50
0.33
-55 to 175-55 to 175
300
260
300
260
W
W/oC
o
C
o
C
o
C
NOTE:
1. TJ = 25oC to 150oC.
Electrical Specifications (N-Channel) T
= 25oC, Unless Otherwise Specified
C
PARAMETERSYMBOLTEST CONDITIONSMINTYPMAXUNITS
Drain to Source Breakdown VoltageBV
Gate Threshold VoltageV
GS(TH)VGS
Zero Gate Voltage Drain CurrentI
Gate to Source Leakage CurrentI
Drain to Source On Resistancer
DS(ON)ID
Turn-On Timet
Turn-On Delay Timet
d(ON)
Rise Timet
Turn-Off Delay Timet
d(OFF)
Fall Timet
Turn-Off Timet
Total Gate ChargeQ
g(TOT)VGS
Gate Charge at 5VQ
Threshold Gate ChargeQ
Input CapacitanceC
Output CapacitanceC
Reverse Transfer CapacitanceC
Thermal Resistance Junction to CaseR
Thermal Resistance Junction to AmbientR
PULSE DURATION = 80µs, VGS = -5V, ID = -10A
DUTY CYCLE = 0.5% MAX
1.4
1.2
ON RESISTANCE
1.0
NORMALIZED DRAIN TO SOURCE
0.8
-80-4004080120200
TJ, JUNCTION TEMPERATURE (oC)
FIGURE 32. NORMALIZED DRAIN TOSOURCE ON
RESISTANCE vs JUNCTION TEMPERATURE
1.2
ID = -250µA
1.1
160
0.8
NORMALIZED GATE
THRESHOLD VOLTAGE
0.6
-80-4004080120200
TJ, JUNCTION TEMPERATURE (oC)
160
FIGURE 33. NORMALIZED GATE THRESHOLD VOLTAGE vs
JUNCTION TEMPERATURE
1200
C
ISS
900
600
C, CAPACITANCE (pF)
300
0
0-2-4-6-8-10
C
OSS
C
RSS
VDS, DRAIN TO SOURCE VOLTAGE (V)
VGS = 0V, f = 1MHz
= CGS + C
C
C
C
ISS
RSS
OSS
= C
= CDS + C
GD
GD
GD
FIGURE 35. CAPACITANCE vs DRAIN TO SOURCE VOLTAGE
1.0
BREAKDOWN VOLTAGE
NORMALIZED DRAIN TO SOURCE
0.9
-80-4004080120200
, JUNCTION TEMPERATURE (oC)
T
J
160
FIGURE 34. NORMALIZED DRAIN TOSOURCE BREAKDOWN
VOLTAGE vs JUNCTION TEMPERATURE
-10
VDD = -9.6V
-8
-6
-4
WAVEFORMS IN
-2
, GATE TO SOURCE VOLTAGE (V)
GS
V
0
36
Q
, GATE CHARGE (nC)
g
DESCENDING ORDER:
ID = -10A
I
= -6A
D
ID = -3A
912150
NOTE: Refer to Intersil Application Notes AN7254 and AN7260.
FIGURE 36. NORMALIZEDSWITCHINGWAVEFORMSFOR
CONSTANT GATE CURRENT
4-38
Page 10
RF3V49092, RF3S49092SM
Test Circuits and Waveforms (P-Channel)
V
DS
VARY t
TO OBTAIN
P
REQUIRED PEAK I
0V
V
GS
t
P
AS
L
R
G
-
V
DD
+
DUT
I
AS
0.01Ω
0
V
DD
I
AS
t
P
FIGURE 37. UNCLAMPED ENERGY TEST CIRCUITFIGURE 38. UNCLAMPED ENERGY WAVEFORMS
BV
t
AV
DSS
V
DS
t
ON
t
d(ON)
10%
50%
t
r
90%
10%
V
DS
R
L
V
GS
-
V
DD
V
GS
R
GS
DUT
+
0
V
DS
V
GS
0
PULSE WIDTH
FIGURE 39. SWITCHING TIME TEST CIRCUITFIGURE 40. RESISTIVE SWITCHING WAVEFORMS
V
I
g(REF)
DS
R
L
0
VGS= -1V
V
GS
DUT
V
DD
+
V
0
I
g(REF)
-V
DD
GS
Q
g(TH)
Q
g(-5)
Q
g(TOT)
VGS= -5V
t
d(OFF)
V
DS
t
OFF
50%
90%
90%
t
f
10%
VGS= -10V
FIGURE 41. GATE CHARGE TEST CIRCUITFIGURE 42. GATE CHARGE WAVEFORMS
4-39
Page 11
RF3V49092, RF3S49092SM
Soldering Precautions
The soldering processcreates a considerable thermal stress
on any semiconductor component. The melting temperature
of solder is higher than the maximum rated temperature of
the device. The amount oftime the device is heatedto a high
temperature should beminimized to assure devicereliability.
Therefore, the following precautions should always be
observed in order to minimize the thermal stress to which
the devices are subjected.
1. Always preheat the device.
2. Thedeltatemperature betweenthepreheatandsoldering
should always be less than100
device can result in excessive thermal stress which can
damage the device.
3. The maximumtemperature gradient should be less than
o
5
C per second when changing from preheating to
soldering.
4. The peak temperature in the soldering process should be
at least 30
chosen.
5. The maximumsoldering temperature and time must not
exceed 260oC for 10 seconds on the leads and case of
the device.
6. After soldering iscomplete,thedeviceshould be allowed
to cool naturallyforat least three minutes,as forced cooling will increase thetemperature gradient and may result
in latent failure due to mechanical stress.
7. During cooling,mechanical stress orshock should be
avoided.
o
C higher than the melting point of the solder
o
C.Failureto preheat the
4-40
Page 12
RF3V49092, RF3S49092SM
PSPICE Electrical Model
SUBCKT RF3V49092 2 1 3; N-Channel Model rev 9/6/94
.MODEL DBDMOD D (IS = 7.00e-13 RS = 2.15e-2 TRS1 = 0.5e-3 TRS2 = 3.68e-6 CJO = 1.28e-9 TT = 1.8e-8)
.MODEL DBKMOD D (RS = 1.28e-1 TRS1 = 1.69e-3 TRS2 = -2.0e-6)
.MODEL DPLCAPMOD D (CJO = 0.84e-9 IS = 1e-30 N = 10)
.MODEL MOSMOD NMOS (VTO = 1.63 KP = 11.55 IS = 1e-30 N = 10 TOX = 1 L = 1u W = 1u)
.MODEL RBKMOD RES (TC1 = 9.15e-4 TC2 = 3.13e-7)
.MODEL RDSMOD RES (TC1 = 7.00e-4 TC2 = 5.00e-6)
.MODEL RVTOMOD RES (TC1 = -2.155e-3 TC2 = -2.7e-6)
.MODEL S1AMOD VSWITCH (RON = 1e-5 ROFF = 0.1 VON = -6.05 VOFF= -4.05)
.MODEL S1BMOD VSWITCH (RON = 1e-5 ROFF = 0.1 VON = -4.05 VOFF= -6.05)
.MODEL S2AMOD VSWITCH (RON = 1e-5 ROFF = 0.1 VON = -0.72 VOFF= 4.28)
.MODEL S2BMOD VSWITCH (RON = 1e-5 ROFF = 0.1 VON = 4.28 VOFF= -0.72)
.ENDS
NOTE: For further discussion ofthe PSPICEmodel, consultA New PSPICE Sub-circuit for the Power MOSFET Featuring Global TemperatureOptions; IEEE Power Electronics Specialist Conference Records, 1991.
4-41
Page 13
RF3V49092, RF3S49092SM
PSPICE Electrical Model
SUBCKT RF3V49092 2 1 3 ; P-Channel Model rev 11/8/94
.MODEL DBDMOD D (IS = 3.0e-13 RS = 4.4e-2 TRS1 = 1.0e-3 TRS2 = -7.37e-6 CJO = 1.27e-9 TT = 2.2e-8)
.MODEL DBKMOD D (RS = 7.84e-2 TRS1 = -4.27e-3 TRS2 = 5.77e-5)
.MODEL DPLCAPMOD D (CJO = 2.85e-10 IS = 1e-30 N = 10)
.MODEL MOSMOD PMOS (VTO = -2.1423 KP = 9.206 IS = 1e-30 N = 10 TOX = 1 L = 1u W = 1u)
.MODEL RBKMOD RES (TC1 = 9.61e-4 TC2 = -1.09e-6)
.MODEL RDSMOD RES (TC1 = 2.10e-3 TC2 = 6.99e-6)
.MODEL RVTOMOD RES (TC1 = -1.82e-3 TC2 = 1.47e-7)
.MODEL S1AMOD VSWITCH (RON = 1e-5 ROFF = 0.1 VON = 5.47 VOFF= 3.47)
.MODEL S1BMOD VSWITCH (RON = 1e-5 ROFF = 0.1 VON = 3.47 VOFF= 5.47)
.MODEL S2AMOD VSWITCH (RON = 1e-5 ROFF = 0.1 VON = 1.05 VOFF= -3.95)
.MODEL S2BMOD VSWITCH (RON = 1e-5 ROFF = 0.1 VON = -3.95 VOFF= 1.05)
.ENDS
NOTE: For further discussion ofthe PSPICEmodel, consultA New PSPICE Sub-circuit for the Power MOSFET Featuring Global TemperatureOptions; IEEE Power Electronics Specialist Conference Records, 1991.
All Intersil semiconductor products are manufactured, assembled and tested under ISO9000 quality systems certification.
Intersil semiconductor products are sold bydescription only. Intersil Corporation reserves the right to makechanges in circuit design and/or specifications at any time without notice. Accordingly, the reader is cautioned to verify that data sheets are current before placing orders. Information furnished by Intersil is believed to be accurate and
reliable. However, no responsibility is assumed by Intersil or its subsidiaries for its use; nor for any infringements of patents or other rights of third parties which may result
from its use. No license is granted by implication or otherwise under any patent or patent rights of Intersil or its subsidiaries.
For information regarding Intersil Corporation and its products, see web site www.intersil.com
4-42
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