Datasheet NT128S64VH4A0GM0-8B, NT128S64VH4A0GM0-75B, NT128S64VH4A0GM0-7K Datasheet (NANYA)

Page 1
NT128S64VH4A0GM 128MB : 16M x 64 SDRAM SODIMM
PRELIMINARY 08 /2001 1
© NANYA TECHNOLOGY CORP.
NANYA TECHNOLOGY CORP. reserves the right to change Products and Specifications without notice.
16Mx64 bit One Bank Small Outline SDRAM Module based on 16Mx16, 4Banks, 8K Refresh, 3.3V Synchronous DRAMs with SPD
Features
l 144 Pin JEDEC Standard, 8 Byte Small Outline Dual-In-line
Memory Module
l 16Mx64 Synchronous DRAM SO DIMM l Inputs and outputs are LVTTL (3.3V) compatible l 10 Ohm Resistors on DQs l Single 3.3V ± 0.3V Power Supply l Single Pulsed
RAS
interface
l SDRAMs have four internal banks l Fully Synchronous to positive Clock Edge l Data Mask for Byte Read/Write control l Auto Refresh (CBR) and Self Refresh l Automatic and controlled Precharge Commands
l Programmable Operation:
- CAS Latency: 2, 3
- Burst Type: Sequential or Interleave
- Burst Length: 1, 2, 4, 8,
- Operation: Burst Read and Write or Multiple Burst Read with Single Write
l Suspend Mode and Power Down Mode l 13/9/2 Addressing (Row/Column/Bank) l 8192 refresh cycles distributed across 64ms l Serial Presence Detect l Gold contacts
Description
NT128S64VH4A0GM is a 144-pin Synchronous DRAM Small Outline Dual In-line Memory Module (SO DIMM) that is organized as a 16Mx64 high-speed memory array. The SO DIMM uses four 16Mx16 SDRAMs in 400mil TSOP II packages and achieves high-speed data transfer rates of up to 133 MHz by employing a prefetch / pipeline hybrid architecture that supports the JEDEC 1N rule while allowing very low burst power.
All control, address, and data input/output circuits are synchronized with the positive edge of the externally supplied clock inputs. All inputs are sampled at the positive edge of the externally supplied clock (CK0). Internal operating modes are defined by combinations of the
RAS,CAS
, WE ,S0, DQMB, and CKE0 signals. A command decoder initiates the necessary timings for each operation. A 15 bit
address bus accepts address information in a row/column multiplexing arrangement.
Prior to any access operation, the
CAS
latency, burst type, burst length, and burst operation type must be programmed into the SO DIMM by address inputs A0-A9 during the mode register set cycle. The SO DIMM uses serial presence detects implemented via a serial EEPROM using the two pin IIC protocol. The first 128 bytes of serial PD data are used by the DIMM manufacturer. The last 128 bytes are available to the customer.
All Nanya 144-pin SO DIMMs provide a high performance, flexible 8-byte interface in a 2.66" long space-saving footprint.
Ordering Information
Speed
Part Number
MHz. CL t RCD t RP
Organization Leads Power
143MHz 3 3 3
NT128S64VH4A0GM-7K
133MHz 2 2 2
133MHz 3 3 3
NT128S64VH4A0GM-75B
100MHz 2 2 2
125MHz 3 3 3
NT128S64VH4A0GM-8B
100MHz 2 2 2
16Mx64 Gold 3.3V
* CL = CAS Latency
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NT128S64VH4A0GM 128MB : 16M x 64 SDRAM SODIMM
PRELIMINARY 08 /2001 2
© NANYA TECHNOLOGY CORP.
NANYA TECHNOLOGY CORP. reserves the right to change Products and Specifications without notice.
Pin Description
CK0 Clock Inputs DQ0-DQ63 Data input/output
CKE0 Clock Enable DQMB0-DQMB7 Data Mask
RAS
Row Address Strobe VDD Power (3.3V)
CAS
Column Address Strobe VSS Ground
WE Write Enable NC No Connect
S0
Chip Selects SCL Serial Presence Detect Clock Input
A0-A9, A11, A12 Address Inputs SDA Serial Presence Detect Data input/output
A10 / AP Address Input/Autoprecharge DU Don’t use
BA0, BA1 SDRAM Bank Address
Pinout
Pin Front Pin Back Pin Front Pin Back Pin Front Pin Back
1 VSS 2 VSS 51 DQ14 52 DQ46 95 DQ21 96 DQ53 3 DQ0 4 DQ32 53 DQ15 54 DQ47 97 DQ22 98 DQ54 5 DQ1 6 DQ33 55 VSS 56 VSS 99 DQ23 100 DQ55 7 DQ2 8 DQ34 57 NC 58 NC 101 VDD 102 VDD
9 DQ3 10 DQ35 59 NC 60 NC 103 A6 104 A7 11 VDD 12 VDD 105 A8 106 BA0 13 DQ4 14 DQ36 107 VSS 108 VSS 15 DQ5 16 DQ37
Voltage Key
109 A9 110 BA1
17 DQ6 18 DQ38 61 CK0 62 CKE0 111 A10/ AP
112 A11 19 DQ7 20 DQ39 63 VDD 64 VDD 113 VDD 114 VDD 21 VSS 22 VSS 65
RAS
66
CAS
115 DQMB2
116 DQMB6 23 DQMB0
24 DQMB4
67 WE 68 NC 117 DQMB3
118 DQMB7 25 DQMB1
26 DQMB5
69
S0
70 A12 119 VSS 120 VSS
27 VDD 28 VDD 71 NC 72 NC 121 DQ24 122 DQ56 29 A0 30 A3 73 DU 74 NC 123 DQ25 124 DQ57 31 A1 32 A4 75 VSS 76 VSS 125 DQ26 126 DQ58 33 A2 34 A5 77 NC 78 NC 127 DQ27 128 DQ59 35 VSS 36 VSS 79 NC 80 NC 129 VDD 130 VDD 37 DQ8 38 DQ40 81 VDD 82 VDD 131 DQ28 132 DQ60 39 DQ9 40 DQ41 83 DQ16 84 DQ48 133 DQ29 134 DQ61 41 DQ10 42 DQ42 85 DQ17 86 DQ49 135 DQ30 136 DQ62 43 DQ11 44 DQ43 87 DQ18 88 DQ50 137 DQ31 138 DQ63 45 VDD 46 VDD 89 DQ19 90 DQ51 139 VSS 140 VSS 47 DQ12 48 DQ44 91 VSS 92 VSS 141 SDA 142 SCL 49 DQ13 50 DQ45 93 DQ20 94 DQ52 143 VDD 144 VDD
Note: All pin assignments are consistent for all 8-byte versions.
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NT128S64VH4A0GM 128MB : 16M x 64 SDRAM SODIMM
PRELIMINARY 08 /2001 3
© NANYA TECHNOLOGY CORP.
NANYA TECHNOLOGY CORP. reserves the right to change Products and Specifications without notice.
SDRAM DIMM Block Diagram (1 Bank, 16Mx16 SDRAMs)
S0
DQMB0
LDQM DQ0 DQ1 DQ2 DQ3 DQ4 DQ5 DQ6 DQ7
DQ0
DQ1
DQ2
DQ3
DQ4
DQ5
DQ6
DQ7
CS
D0
DQMB4
LDQM DQ32 DQ33 DQ34 DQ35 DQ36 DQ37 DQ38 DQ39
DQ0
DQ1
DQ2
DQ3
DQ4
DQ5
DQ6
DQ7
CS
D2
DQMB1
UDQM
DQ8 DQ9
DQ10 DQ11 DQ12 DQ13 DQ14 DQ15
DQ8 DQ9 DQ10 DQ11 DQ12 DQ13 DQ14 DQ15
DQMB5
UDQM
DQ40 DQ41 DQ42 DQ43 DQ44 DQ45 DQ46 DQ47
DQ8
DQ9
DQ10
DQ11
DQ12
DQ13
DQ14
DQ15
RAS CAS CKE0 WE A0-A12 BA0 BA1
SDRAMs D0-D3 SDRAMs D0-D3 SDRAMs D0-D3 SDRAMs D0-D3 SDRAMs D0-D3 SDRAMs D0-D3 SDRAMs D0-D3
SPD
A0 A1 A2
SCL
V
DD
V
SS
D0 - D3 D0 - D3
SDA
CK0
CK1
10pF
DQMB2
LDQM DQ16 DQ17 DQ18 DQ19 DQ20 DQ21 DQ22 DQ23
DQ0
DQ1
DQ2
DQ3
DQ4
DQ5
DQ6
DQ7
CS
D1
DQMB6
LDQM DQ48 DQ49 DQ50 DQ51 DQ52 DQ53 DQ54 DQ55
DQ0
DQ1
DQ2
DQ3
DQ4
DQ5
DQ6
DQ7
CS
D3
DQMB3
UDQM
DQ24 DQ25
DQ26 DQ27 DQ28 DQ29 DQ30 DQ31
DQ8 DQ9 DQ10 DQ11 DQ12 DQ13 DQ14 DQ15
DQMB7
UDQM
DQ56 DQ57 DQ58 DQ59 DQ60 DQ61 DQ62 DQ63
DQ8
DQ9
DQ10
DQ11
DQ12
DQ13
DQ14
DQ15
10ohm
D0 D1 D2 D3
DQn Every DQ pin of SDRAM
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NT128S64VH4A0GM 128MB : 16M x 64 SDRAM SODIMM
PRELIMINARY 08 /2001 4
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NANYA TECHNOLOGY CORP. reserves the right to change Products and Specifications without notice.
Input/Output Functional Description
Symbol Type Signal Polarity
Function
CK0 Input Pulse
Positive
Edge
The system clock inputs. All of the SDRAM inputs are sampled on the rising edge of their associated clock.
CKE0 Input Level
Active
High
Activates the SDRAM CK0
signals when high and deactivates them when low. By
deactivating the clocks, CKE0 low initiates the Power Down mode, Suspend mode, or the
Self-Refresh mode.
S0
Input Pulse
Active
Low
Enables the associated SDRAM command decoder when low and disables the
command decoder when high. When the command decoder is disabled, new commands
are ignored but previous operations continue.
RAS,CAS
,WE
Input Pulse
Active
Low
When sampled at the positive rising edge of the clock,
RAS,CAS
,WE define the
operation to be executed by the SDRAM.
BA0, BA1 Input Level - Selects which SDRAM bank is to be active.
A0 - A9
A10/AP
A11, A12
Input Level -
During a Bank Activate command cycle, A0-A12 defines the row address (RA0-RA12
)
when sampled at the rising clock edge. During a Read or Write command cycle, A0-A8 defines the column address (CA0-CA8
)
when sampled at the rising clock edge. In addition to the column address, AP is used to
invoke Autoprecharge operation at the end of the Burst Read or Write cycle. If AP is high,
autoprecharge is selected and BA0/
BA1 define the bank to be precharged. If AP is low,
autoprecharge is disabled.
During a Precharge command cycle, AP is used in conjunction with BA0/BA1 to control
which bank(s) to precharge. If AP is high all 4 banks will be precharged regardless of the
st
ate of BA0/BA1. If AP is low, then BA0/BA1 are used to define which bank to
pre-charge.
DQ0 - DQ63
Input
/Output
Level -
Data and Check Bit input/output pins operate in the same manner as on conventional
DRAMs.
DQMB0 -DQMB7 Input Pulse
Active
High
The Da
ta input/output mask places the DQ buffers in a high impedance state when
sampled high. In Read mode, DQM has a latency of two clock cycles and controls the
output buffers like an output enable. In Write mode, DQM has a latency of zero and
operates as a by
te mask by allowing input data to be written if it is low but blocks the
Write operation if DQM is high.
SDA
Input
/Output
Level -
Serial Data. Bi-
directional signal used to transfer data into and out of the Serial Presence
Detect EEPROM. Since the SDA si
gnal is Open Drain/Open Collector at the EEPROM, a
pull-up resistor is required on the system board.
SCL Input Pulse
- Serial Clock. Used to clock all Serial Presence Detect data into and out of the EEPROM.
Since the SCL signal is inactive in the “high” state, a pull-
up resistor is recommended on
the system board.
VDD , VSS Supply
Power and ground for the module.
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NT128S64VH4A0GM 128MB : 16M x 64 SDRAM SODIMM
PRELIMINARY 08 /2001 5
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Absolute Maximum Ratings
Symbol Parameter Rating Units Notes
V
DD
Power Supply Voltage -0.3 to +4.6
V
IN
Input Voltage -0.3 to V
DD
+0.3
V
OUT
Output Voltage -0.3 to V
DD
+0.3
V 1
T
A
Operating Temperature (ambient) 0 to +70 °C 1
T
STG
Storage Temperature -55 to +125 °C 1
P
D
Power Dissipation 2.52 W 1
I
OUT
Short Circuit Output Current 50 mA 1
Stresses greater than those listed under "Absolute Maximum Ratings" may cause permanent damage to the device.
This is a stress rating only and functional operation of the device at these or any other conditions above those indicated in the operational
sections of this specification is not implied. Exposure to absolute maximum rating conditions for extended periods may affect reliability.
Recommended DC Operating Conditions (T A =0 to 70 °C)
Rating
Symbol Parameter
Min. Typ. Max.
Units Notes
VDD Power Voltage 3.0 3.3 3.6 V 1
VIH Input High Voltage 2.0 - V
DD
+ 0.3
V 1,2
VIL Input Low Voltage -0.3 - 0.8 V 1,3 VOH Output High Voltage 2.4 - - V VOL Output Low Voltage - - 0.4 V
I IL Input Leakage current -10 - 10 uA
1. All voltages referenced to VSS .
2. VIH (max) = V
DD
/ V
DDQ
+ 1.2V for pulse width 5ns
3. VIL (min) = V
SS
/ V
SSQ
- 1.2V for pulse width 5ns .
Capacitance (T A =25 °C , f =1MHz, V DD =3.3 ± 0.3V)
Symbol Parameter Max.
Unit
CI1 Input Capacitance (A0-A9, A10/AP, A11, A12, BA0, BA1,
RAS,CAS
,WE ) 24
CI2 Input Capacitance (CKE0) 21 CI3 Input Capacitance (S0) 20 CI4 Input Capacitance (CK0 ) 13 CI5 Input Capacitance (DQMB0 - DQMB7) 10 CI6 Input Capacitance (SCL) 12
C
IO1
Input/Output Capacitance (DQ0 - DQ63) 11
C
IO2
Input/Output Capacitance (SDA) 15
pF
DC Output Load Circuit
VOH(DC) = 2.4V,IOH= -2mA
VOL(DC) = 0.4V,IOL= -2mA
3.3 V
1200 ohms
870 ohms
50 pF
Output
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NT128S64VH4A0GM 128MB : 16M x 64 SDRAM SODIMM
PRELIMINARY 08 /2001 6
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Operating, Standby, and Refresh Currents (TA =0 to 70 °C , VDD =3.3 ± 0.3V)
Speed
Parameter
Symbol
Test condition
- 7K - 75B - 8B
Unit Note
Operating current I
CC1
1 bank operation , t
RC
= tRC(mim), t
CK
= min
Active-Precharge Command cycling without burst operation
520 480 460 mA 1, 2
I
CC2P
CKE0 V
IL
(max), t
CK
= min,
S0
= V
IH
(min)
8 mA
Precharge
standby current
in power-down mode
I
CC2PS
CKE0 V
IL
(max), t
CK
=oo ,
S0= V
IH
(min)
8 mA
I
CC2N
CKE0 V
IH
(min), t
CK
= min
S0
= V
IH
(min)
120 120 80 mA 3
Precharge
standby current in non
power-down mode
I
CC2NS
CKE0 V
IH
(min), t
CK
=oo,
S0
= V
IH
(min)
32 32 32 mA 4
I
CC3P
CKE0 V
IL
(max), t
CK
=min.
S0
= V
IH
(min) , (Power Down Mode)
24 24 24 mA 5
No Operating current
( Active state : 4 bank)
I
CC3N
CKE0 V
IH
(min), t
CK
=min
S0
= V
IH
(min)
240 240 240 mA 3
Operating current
( Burst mode )
I
CC4
t
CK
=min , Read/ Write command cycling,
Multiple banks active, gapless data, BL=4
480 480 360 mA 2, 6
Auto(CBR)
refresh current
I
CC5
t
CK
=min, CBR command cycling 760 760 680 mA
Self refresh current I
CC6
CKE0 0.2V 12 mA
Serial PD Device Standby Current
I
SB
V
IN
= GND or V
DD
30 µA 7
1. These parameters depend on the cycle rate and are measured with the cycle determined by the minimum value of t CK and t RC . Input signals are changed up to three times during t RC (min).
2. The specified values are obtained with the output open.
3. Input signals are changed once during three clock cycles.
4. Input signals are stable.
5. Active standby current will be higher if Clock Suspend is entered during a Burst Read cycle (add 1mA per DQ).
6. Input signals are changed once during tCK(min) .
7. VDD =3.3V
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NT128S64VH4A0GM 128MB : 16M x 64 SDRAM SODIMM
PRELIMINARY 08 /2001 7
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AC Characteristics (TA =0 to 70 °C , VDD =3.3 ± 0.3V)
1. An initial pause of 200µs,with DQMB0-7 and CKE0 held high, is required after power-up. A Precharge All Banks command must be given followed by a minimum of eight Auto (CBR) Refresh cycles before or after the Mode Register Set operation.
2. The Transition time is measured between VIH and VIL (or between VIH and VIL ).
3. In addition to meeting the transition rate specification, the CLK and CKE signals must transit between VIH and VIL (or between VIL and VIH ) in a monotonic manner.
4. AC timing tests have VIL =0.8V and VIH = 2.0 V with the timing referenced to the 1.40V cross over point.
5. AC measurements assume t T =1.2 ns.
AC Output Load Circuits
Clock
Input
Output
t
HOLD
t
SETUP
t
CKL
t
CKH
t
T
V
IH
V
IL
1.4V
1.4V
t
AC
t
LZ
tOH
1.4V
Output
Zo = 50 ohm
50 pF
AC Output Load Circuit
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NT128S64VH4A0GM 128MB : 16M x 64 SDRAM SODIMM
PRELIMINARY 08 /2001 8
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AC Timing Parameters Clock and Clock Enable Parameters
- 7K - 75B - 8B
Symbol Parameter
Min. Max. Min. Max. Min. Max.
Unit Note
tCK3 Clock Cycle Time,
CAS
Latency = 3 7 1000 7.5 1000 8 1000 ns
tCK2 Clock Cycle Time,
CAS
Latency = 2 7.5 1000 10 1000 10 1000 ns
tAC3(B) Clock Access Time,
CAS
Latency = 3 - 5.4 - 5.4 - 6 ns 1
tAC2(B) Clock Access Time,
CAS
Latency = 2 - 5.4 - 6 - 6 ns 1 tCKH Clock High Pulse Width 2.5 - 2.5 - 3 - ns 2 tCKL Clock Low Pulse Width 2.5 - 2.5 - 3 - ns 2 tCES Clock Enable Set-up Time 1.5 - 1.5 - 2 - ns tCEH Clock Enable Hold Time 0.8 - 0.8 - 1 - ns tSB Power down mode Entry Time 0 7.5 0 7.5 0 12 ns tT Transition Time (Rise and Fall) 0.5 10 0.5 10 0.5 10 ns
1. Access time is measured at 1.4V. In AC Characteristics section, see notes.
2. t CKH is the pulse width of CLK measured from the positive edge to the negative edge referenced to VIH (min). t CKL is the pulse width of CLK measured from the negative edge to the positive edge referenced to VIL (max).
Common Parameters
- 7K - 75B - 8B
Symbol Parameter
Min. Max. Min. Max. Min. Max.
Unit Note
tCS Command Setup Time 1.5 - 1.5 - 2 - ns tCH Command Hold Time 0.8 - 0.8 - 1 - ns tAS Address and Bank Select Set-up Time 1.5 - 1.5 - 2 - ns tAH Address and Bank Select Hold Time 0.8 - 0.8 - 1 - ns tRCD
RAStoCAS
Delay 20 - 20 - 20 - ns 1 tRC Bank Cycle Time 60 - 67.5 - 70 - ns 1 tRFC Auto Refresh to Active/Auto Refresh 60 - 67.5 - 70 - tRAS Active Command Period 45 100K 45 100K 50 100K ns 1 tRP Precharge Time 20 - 20 - 20 - ns 1 tRRD Bank to Bank Delay Time 15 - 15 - 20 - ns 1 tCCD
CAS
to
CAS
Delay Time 1 - 1 - 1 - CLK
1. These parameters account for the number of clock cycle and depend on the operating frequency of the clock, as follows: the number of clock cycles = specified value of timing / clock period (count fractions as a whole number).
Mode Register Set Cycle
- 7K - 75B - 8B
Symbol Parameter
Min. Max. Min. Max. Min. Max.
Unit Note
tRSC Mode Register Set Cycle Time 2 - 2 - 2 - CLK 1
1. These parameters account for the number of clock cycle and depend on the operating frequency of the clock, as follows: the number of clock cycles = specified value of timing / clock period (count fractions as a whole number).
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NT128S64VH4A0GM 128MB : 16M x 64 SDRAM SODIMM
PRELIMINARY 08 /2001 9
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Read Cycle
- 7K - 75B - 8B
Symbol Parameter
Min. Max. Min. Max. Min. Max.
Unit Note
- - - - 2.5 - ns
tOH Data Out Hold Time
2.7 - 2.7 - 3 - ns tLZ Data Out to Low Impedance Time 0 - 0 - 0 - ns tHZ3 Data Out to High Impedance Time 3 5.4 3 5.4 3 6 ns 1 tDQZ DQM Data Out Disable Latency 2 - 2 - 2 - CLK
1. Referenced to the time at which the output achieves the open circuit condition, not to output voltage levels.
Refresh Cycle
- 7K - 75B - 8B
Symbol Parameter
Min. Max. Min. Max. Min. Max.
Unit Note
tREF Refresh Period - 64 - 64 - 64 ms tSREX Self Refresh Exit Time 10 - 10 - 10 - ns
Write Cycle
- 7K - 75B - 8B
Symbol Parameter
Min. Max. Min. Max. Min. Max.
Unit Note
tDS Data In Set-up Time 1.5 - 1.5 - 2 - ns tDH Data In Hold Time 0.8 - 0.8 - 1 - ns tDPL Data input to Precharge 15 - 15 - 15 - ns
tDAL3
Data In to Active Delay
CAS
Latency = 3
5 - 5 - 5 - CLK
tDAL2
Data In to Active Delay
CAS
Latency = 2
5 - - - - - CLK
tDQW DQM Write Mask Latency 0 - 0 - 0 - ns
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NT128S64VH4A0GM 128MB : 16M x 64 SDRAM SODIMM
PRELIMINARY 08 /2001 10
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Serial Presence Detect -- Part 1 of 2
16Mx64 SDRAM SODIMM based on 16Mx16, 4Banks, 8K Refresh, 3.3V SDRAMs with SPD
SPD Entry Value
Serial PD Data Entry
(Hexadecimal)
Byte
Description
-7K -75B -8B -7K -75 -8B
Note
0 Number of Serial PD Bytes Written during Production 128 80 1 Total Number of Bytes in Serial PD device 256 08 2 Fundamental Memory Type SDRAM 04 3 Number of Row Addresses on Assembly 13 0D 4 Number of Column Addresses on Assembly 9 09 5 Number of DIMM Bank 1 01 6 Data Width of Assembly X64 40 7 Data Width of Assembly (cont’) X64 00 8 Voltage Interface Level of this Assembly LVTTL 01 9 SDRAM Device Cycle Time at CL=3 7ns 7.5ns
8ns 70 75 80
10 SDRAM Device Access Time from Clock at CL=3 5.4ns 5.4ns
6ns 54 54 60 11 DIMM Configuration Type Non-Parity 00 12 Refresh Rate/Type 7.8µs / SR 82 13 Primary SDRAM Width X16 10 14 Error Checking SDRAM Device Width N/A 00
15
SDRAM Device Attributes : Minimum Clock Delay, Random Column Access
1 Clock 01
16 SDRAM Device Attributes: Burst Length Supported 1,2,4,8 0F 17 SDRAM Device Attributes: Number of Device Banks 4 04 18 SDRAM Device Attributes:
CAS
Latency 2, 3 2, 3 2, 3 06 06 06
19 SDRAM Device Attributes: CSLatency 0 01 20 SDRAM Device Attributes: WE Latency 0 01 21 SDRAM Module Attributes Unbuffered 00
22 SDRAM Device Attributes: General
Wr-1/Rd Burst, Precharge All,
Auto-Precharge, VDD +/-
10%
0E
23 Minimum Clock Cycle at CL=2 7.5ns 10ns 10ns 75 A0 A0 24 Maximum Data Access Time from Clock at CL=2 5.4ns
6ns 6ns 54 60 60 25 Minimum Clock Cycle Time at CL=1 N/A 00 26 Maximum Data Access Time from Clock at CL=1 N/A 00 27 Minimum Row Precharge Time (tRP) 15ns 20ns 20ns 0F 14 14 28 Minimum Row Active to Row Active delay (tRRD) 15ns 15ns 20ns 0F 0F 14 29 Minimum RAS to CAS delay (tRCD) 15ns 20ns 20ns 0F 14 14 30 Minimum RAS Pulse Width (tRAS) 45ns 45ns 50ns 2D 2D 32 31 Module Bank Density 128MB 20 32 Address and Command Setup Time Before Clock 1.5ns 1.5ns
2ns 15 15 20
33 Address and Command Hold Time After Clock 0.8ns 0.8ns
1ns 08 08 10
34 Data Input Setup Time Before Clock 1.5ns 1.5ns
2ns 15 15 20
35 Data Input Hold Time After Clock 0.8ns 0.8ns
1ns 08 08 10
36-61 Reserved Undefined 00
62 SPD Revision 1.2 1.2 1.2 12 12 12 63 Checksum for bytes 0 - 62 F3 39 80
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NT128S64VH4A0GM 128MB : 16M x 64 SDRAM SODIMM
PRELIMINARY 08 /2001 11
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Serial Presence Detect -- Part 2 of 2
16Mx64 SDRAM SODIMM based on 16Mx16, 4Banks, 8K Refresh, 3.3V SDRAMs with SPD
SPD Entry Value
Serial PD Data Entry
(Hexadecimal)
Byte
Description
-7K -75B -8B -7K -75B -8B
Note
64-71 Manufacturer’s JEDED ID Code NANYA 7F7F7F0B00000000 3
72 Module Manufacturing Location N/A 00
73-90 Module Part number N/A N/A N/A 00 00 00 91-92 Module Revision Code N/A 00 93-94 Module Manufacturing Data Year/Week Code yy/ww 1,2 95-98 Module Serial Number Serial Number 00
99-125 Reserved Undefined 00
126 Modules Supports this Clock Frequency 100MHz 64
127 Attributes for Clock Frequency defined in byte 126
CK0, CK1, CK2,CK3,
CL3, CL2
Concurrent AP
FF
128-255 Open for customer Use Undefined 00
1. yy= Binary coded decimal year code, 0-99(Decimal), 00-63(Hex)
2. ww= Binary coded decimal year code, 01-52(Decimal), 01-34(Hex)
3. NANYA 11decimal (bank four) 0000 1011 binary 0B Hex.
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NT128S64VH4A0GM 128MB : 16M x 64 SDRAM SODIMM
PRELIMINARY 08 /2001 12
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Package Dimensions
Note : All dimension are typical unless otherwise stated.
2.661
2.505
0.157+/- 0.004
FRONT VIEW
Detail A
0.031
Detail B
0.024
0.010Max
1431 59 61
Detail A Detail B
Unit : Inchs
0.157
(2X)Θ
0.071
0.130
0.913
0.181
0.098
1.291
0.787
1.000
0.236
2 60 62 144
Side
0.039 +/- 0.004
0.150 MAX.
0.059+/- 0.004
0.100
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