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NM25C640 Rev. D.2
NM25C640 64K-Bit Serial CMOS EEPROM
(Serial Periphrial Interface (SPI) Synchronous Bus)
Note 5: Stress above those listed under “Absolute Maximum Ratings” may cause permanent damage to the device. This is a stress rating only, and functional operation of the
device at these or any other conditions above those indicated in the operational sections of the specification is not implied. Exposure to absolute maximum rating conditions for
extended periods may affect device reliability.
Note 6: The fOP frequency specification specifies a minimum clock period of 1/fOP. Therefore, for every fOP clock cycle, t
CLH
+ t
CLL
must be equal to or greater than 1/fOP. For
example, if the 2.1MHz period = 476ns and t
CLH
= 190ns, t
CLL
must be 286ns.
Note 7: CS must be brought high for a minimum of t
CSH
between consecutive instruction cycles.
Note 8: This parameter is periodically sampled and not 100% tested.
Low Voltage 2.7V ≤ VCC ≤ 4.5V Specifications
Absolute Maximum Ratings (Note 5)
Ambient Storage Temperature -65°C to +150°C
All Input or Output Voltage with
Respect to Ground +6.5V to -0.3V
Lead Temp. (Soldering, 10 sec.) +300°C
ESD Rating 2000V
Operating Conditions
Ambient Operating Temperature
NM25C640L/LZ 0°C to +70°C
NM25C640LZ/LZE -40°C to +85°C
NM25C640LV -40°C to +125°C
Power Supply (VCC) 2.7V–4.5V
DC and AC Electrical Characteristics 2.7V ≤ V
CC
≤ 4.5V (unless otherwise specified)
25C640L/LE 25C640LV
25C640LZ/LZE
Symbol Parameter Part Conditions Min. Max. Min Max Units
I
CC
Operating Current CS = V
IL
33mA
I
CCSB
Standby Current L CS = V
CC
10 10 µA
LZ 1 N/A µA
I
IL
Input Leakage VIN = 0 to V
CC
-1 1 -1 1 µA
I
OL
Output Leakage V
OUT
= GND to V
CC
-1 1 -1 1 µA
V
IL
Input Low Voltage -0.3 0.3 * V
CC
-0.3 0.3 * V
CC
V
V
IH
Input High Voltage 0.7 * VCCVCC + 0.3 0.7 * VCCVCC + 0.3 V
V
OL
Output Low Voltage I
OL
= 1.6 mA 0.4 0.4 V
V
OH
Output High Voltage I
OH
= –0.8 mA VCC - 0.8 VCC - 0.8 V
f
OP
SCK Frequency 2.1 1.0 MHz
t
RI
Input Rise Time 2.0 2.0 µs
t
FI
Input Fall Time 2.0 2.0 µs
t
CLH
Clock High Time (Note 6) 190 410 ns
t
CLL
Clock Low Time (Note 6) 190 410 ns
t
CSH
Min. CS High Time (Note 7) 240 500 ns
t
CSS
CS Setup Time 240 500 ns
t
DIS
Data Setup Time 100 100 ns
t
HDS
HOLD Setup Time 90 240 ns
t
CSN
CS Hold Time 240 500 ns
t
DIN
Data Hold Time 100 100 ns
t
HDN
HOLD Hold Time 90 240 ns
t
PD
Output Delay CL = 200 pF 240 500 ns
t
DH
Output Hold Time 0 0 ns
t
LZ
HOLD Output Low Z 100 240 ns
t
DF
Output Disable Time CL = 200 pF 240 500 ns
t
HZ
HOLD to Output Hi Z 100 240 ns
t
WP
Write Cycle Time 1-32 Bytes 15 15 ms
Capacitance T
A
= 25°C, f = 2.1/1 MHz (Note 8)
Symbol Test Typ Max Units
C
OUT
Output Capacitance 3 8 pF
C
IN
Input Capacitance 2 6 pF
AC Test Conditions
Output Load CL = 200pF
Input Pulse Levels 0.1 * VCC - 0.9 * V
CC
Timing Measurement Reference Level 0.3 * VCC - 0.7 * V
CC