Datasheet NM25C640EM8X, NM25C640EM8, NM25C640LVM8, NM25C640UM8, NM25C640ULZVN Datasheet (Fairchild Semiconductor)

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NM25C640 Rev. D.2
NM25C640 64K-Bit Serial CMOS EEPROM
(Serial Periphrial Interface (SPI) Synchronous Bus)
PRELIMINARY
March 1999
© 1999 Fairchild Semiconductor Corporation
General Description
The NM25C640 is a 65,536-bit CMOS EEPROM with an SPI compatible serial interface. The NM25C640 is designed for data storage in applications requiring both non-volatile memory and in­system data updates. This EEPROM is well suited for applications using the 68HC11 series of microcontrollers that support the SPI interface for high speed communication with peripheral devices via a serial bus to reduce pin count. The NM25C640 is imple­mented in Fairchild Semiconductor’s floating gate CMOS process that provides superior endurance and data retention.
The serial data transmission of this device requires four signal lines to control the device operation: Chip Select (CS), Clock (SCK), Data In (SI), and Serial Data Out (SO). All programming cycles are completely self-timed and do not require an erase before WRITE.
BLOCK WRITE protection is provided by programming the STA­TUS REGISTER with one of four levels of write protection. Additionally, separate WRITE enable and WRITE disable instruc­tions are provided for data protection.
Hardware data protection is provided by the WP pin to protect against inadvertent programming. The HOLD pin allows the serial communication to be suspended without resetting the serial sequence.
Block Diagram
Features
2.75 MHz clock rate @ 4.5V to 5.5V
2.1 MHz @ 2.7V to 4.5V
65,536 bits organized as 8,192 x 8
Multiple chips on the same 3-wire bus with separate chip
select lines
Self-timed programming cycle
Simultaneous programming of 1 to 32 bytes at a time
Status register can be polled during programming to monitor
READY/BUSY
Write Protect (WP) pin and write disable instruction for both hardware and software write protection
Block write protect feature to protect against accidental writes
Endurance: 1,000,000 data changes
Data retention greater than 40 years
Packages available: 8-pin DIP or 8-Pin SO
DS500041-1
Instruction
Decoder
Control Logic
and Clock
Generators
High Voltage
Generator
and
Program
Timer
Instruction
Register
Program Enable
Data In/Out Register
8 Bits
Data Out
Buffer
Non-Volatile
Status Register
Decoder
1 of 8,192
Address Counter/ Register
EEPROM Array
65,536 Bits (8,192 x 8)
Read/Write Amps
CS
HOLD
SCK
V
CC
V
SS
V
PP
WP
SI
SO
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NM25C640 Rev. D.2
NM25C640 64K-Bit Serial CMOS EEPROM
(Serial Periphrial Interface (SPI) Synchronous Bus)
Connection Diagram
Dual-In-Line Package (N)
and SO Package (M8)
Top View
Pin Names
CS Chip Select Input
SO Serial Data Output WP Write Protect V
SS
Ground
SI Serial Data Input
SCK Serial Clock Input
HOLD Suspends Serial Data
V
CC
Power Supply
Ordering Information NM 25 C XX LZ E XX Letter Description
Package N 8-Pin DIP
M8 8-Pin SO
Temp. Range None 0 to 70°C
V -40 to +125°C E -40 to +85°C
Voltage Operating Range Blank 4.5V to 5.5V
L 2.7V to 4.5V LZ 2.7V to 4.5V and
<1µA Standby Current
Density/Mode 640 64K, mode 0
C CMOS
Interface 25 SPI
NM Fairchild Nonvolatile
Memory
CS
SO
WP V
SS
V
CC
HOLD SCK SI
8 7 6 5
1 2 3 4
NM25C640
DS500041-2
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NM25C640 Rev. D.2
NM25C640 64K-Bit Serial CMOS EEPROM
(Serial Periphrial Interface (SPI) Synchronous Bus)
Standard Voltage 4.5 VCC 5.5V Specifications Absolute Maximum Ratings (Note 1)
Ambient Storage Temperature -65°C to +150°C All Input or Output Voltage with
Respect to Ground +6.5V to -0.3V Lead Temp. (Soldering, 10 sec.) +300°C ESD Rating 2000V
Operating Conditions
Ambient Operating Temperature
NM25C640 0°C to +70°C NM25C640E -40°C to +85°C NM25C640V -40°C to +125°C
Power Supply (VCC) 4.5V to 5.5V
DC and AC Electrical Characteristics 4.5V V
CC
5.5V (unless otherwise specified)
Symbol Parameter Conditions Min Max Units
I
CC
Operating Current CS = V
IL
3mA
I
CCSB
Standby Current CS = V
CC
50 µA
I
IL
Input Leakage VIN = 0 to V
CC
-1 +1 µA
I
OL
Output Leakage V
OUT
= GND to V
CC
-1 +1 µA
V
IL
CMOS Input Low Voltage -0.3 VCC * 0.3 V
V
IH
CMOS Input High Voltage VCC * 0.7 VCC + 0.3 V
V
OL
Output Low Voltage IOL = 2.1 mA 0.4 V
V
OH
Output High Voltage IOH = -0.8 mA VCC - 0.8 V
f
OP
SCK Frequency 2.75 MHz
t
RI
Input Rise Time 2.0 µs
t
FI
Input Fall Time 2.0 µs
t
CLH
Clock High Time (Note 2) 155 ns
t
CLL
Clock Low Time (Note 2) 155 ns
t
CSH
Min CS High Time (Note 3) 240 ns
t
CSS
CS Setup Time 176 ns
t
DIS
Data Setup Time 50 ns
t
HDS
HOLD Setup Time 90 ns
t
CSN
CS Hold Time 155 ns
t
DIN
Data Hold Time 50 ns
t
HDN
HOLD Hold Time 90 ns
t
PD
Output Delay CL = 200 pF 135 ns
t
DH
Output Hold Time 0 ns
t
LZ
HOLD to Output Low Z 240 ns
t
DF
Output Disable Time CL = 200 pF 290 ns
t
HZ
HOLD to Output High Z 240 ns
t
WP
Write Cycle Time 1–32 Bytes 10 ms
Capacitance T
A
= 25°C, f = 2.1/1 MHz (Note 4)
Symbol Test Typ Max Units
C
OUT
Output Capacitance 3 8 pF
C
IN
Input Capacitance 2 6 pF
Note 1: Stress above those listed under “Absolute Maximum Ratings” may cause permanent damage to the device. This is a stress rating only, and functional operation of the device at these or any other conditions above those indicated in the operational sections of the specification is not implied. Exposure to absolute maximum rating conditions for extended periods may affect device reliability.
Note 2: The fOP frequency specification specifies a minimum clock period of 1/fOP. Therefore, for every fOP clock cycle, t
CLH
+ t
CLL
must be equal to or greater than 1/fOP. For
example, if the 2.1MHz period = 476ns and t
CLH
= 190ns, t
CLL
must be 286ns.
Note 3: CS must be brought high for a minimum of t
CSH
between consecutive instruction cycles.
Note 4: This parameter is periodically sampled and not 100% tested.
AC Test Conditions
Output Load CL = 200 pF Input Pulse Levels 0.1 * VCC – 0.9 * V
CC
Timing Measurement Reference Level 0.3 * VCC - 0.7 • V
CC
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NM25C640 Rev. D.2
NM25C640 64K-Bit Serial CMOS EEPROM
(Serial Periphrial Interface (SPI) Synchronous Bus)
Note 5: Stress above those listed under “Absolute Maximum Ratings” may cause permanent damage to the device. This is a stress rating only, and functional operation of the
device at these or any other conditions above those indicated in the operational sections of the specification is not implied. Exposure to absolute maximum rating conditions for extended periods may affect device reliability. Note 6: The fOP frequency specification specifies a minimum clock period of 1/fOP. Therefore, for every fOP clock cycle, t
CLH
+ t
CLL
must be equal to or greater than 1/fOP. For
example, if the 2.1MHz period = 476ns and t
CLH
= 190ns, t
CLL
must be 286ns.
Note 7: CS must be brought high for a minimum of t
CSH
between consecutive instruction cycles.
Note 8: This parameter is periodically sampled and not 100% tested.
Low Voltage 2.7V VCC 4.5V Specifications Absolute Maximum Ratings (Note 5)
Ambient Storage Temperature -65°C to +150°C All Input or Output Voltage with
Respect to Ground +6.5V to -0.3V Lead Temp. (Soldering, 10 sec.) +300°C ESD Rating 2000V
Operating Conditions
Ambient Operating Temperature
NM25C640L/LZ 0°C to +70°C NM25C640LZ/LZE -40°C to +85°C NM25C640LV -40°C to +125°C
Power Supply (VCC) 2.7V–4.5V
DC and AC Electrical Characteristics 2.7V V
CC
4.5V (unless otherwise specified)
25C640L/LE 25C640LV
25C640LZ/LZE
Symbol Parameter Part Conditions Min. Max. Min Max Units
I
CC
Operating Current CS = V
IL
33mA
I
CCSB
Standby Current L CS = V
CC
10 10 µA
LZ 1 N/A µA
I
IL
Input Leakage VIN = 0 to V
CC
-1 1 -1 1 µA
I
OL
Output Leakage V
OUT
= GND to V
CC
-1 1 -1 1 µA
V
IL
Input Low Voltage -0.3 0.3 * V
CC
-0.3 0.3 * V
CC
V
V
IH
Input High Voltage 0.7 * VCCVCC + 0.3 0.7 * VCCVCC + 0.3 V
V
OL
Output Low Voltage I
OL
= 1.6 mA 0.4 0.4 V
V
OH
Output High Voltage I
OH
= –0.8 mA VCC - 0.8 VCC - 0.8 V
f
OP
SCK Frequency 2.1 1.0 MHz
t
RI
Input Rise Time 2.0 2.0 µs
t
FI
Input Fall Time 2.0 2.0 µs
t
CLH
Clock High Time (Note 6) 190 410 ns
t
CLL
Clock Low Time (Note 6) 190 410 ns
t
CSH
Min. CS High Time (Note 7) 240 500 ns
t
CSS
CS Setup Time 240 500 ns
t
DIS
Data Setup Time 100 100 ns
t
HDS
HOLD Setup Time 90 240 ns
t
CSN
CS Hold Time 240 500 ns
t
DIN
Data Hold Time 100 100 ns
t
HDN
HOLD Hold Time 90 240 ns
t
PD
Output Delay CL = 200 pF 240 500 ns
t
DH
Output Hold Time 0 0 ns
t
LZ
HOLD Output Low Z 100 240 ns
t
DF
Output Disable Time CL = 200 pF 240 500 ns
t
HZ
HOLD to Output Hi Z 100 240 ns
t
WP
Write Cycle Time 1-32 Bytes 15 15 ms
Capacitance T
A
= 25°C, f = 2.1/1 MHz (Note 8)
Symbol Test Typ Max Units
C
OUT
Output Capacitance 3 8 pF
C
IN
Input Capacitance 2 6 pF
AC Test Conditions
Output Load CL = 200pF Input Pulse Levels 0.1 * VCC - 0.9 * V
CC
Timing Measurement Reference Level 0.3 * VCC - 0.7 * V
CC
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NM25C640 Rev. D.2
NM25C640 64K-Bit Serial CMOS EEPROM
(Serial Periphrial Interface (SPI) Synchronous Bus)
AC Test Conditions (Continued)
FIGURE 1. Synchronous Data Timing Diagram
FIGURE 3. SPI Serial Interface
SI SO SCK CS
DATA OUT (MOSI)
DATA IN (MISO)
SERIAL CLOCK (CLK)
SS0 SS1 SS2 SS3
SI SO SCK CS
SI SO SCK CS
SI SO SCK CS
SPI CHIP SELECTION
MASTER MCU
NM25C640
DS500041-3
DS500041-4
SCK
HOLD
SO
t
HZ
t
HDN
t
HDS
t
HDN
t
HDS
t
LZ
DS500041-6
FIGURE 2. Hold Timing
CS
SCK
SI
SO
V
IH
V
IL
V
IH
V
IL
V
IH
V
IL
V
OH
V
OL
t
CSS
t
CSH
t
CSN
t
DIS
t
PD
t
DH
t
DF
t
DIN
t
CLH
t
CLL
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NM25C640 Rev. D.2
NM25C640 64K-Bit Serial CMOS EEPROM
(Serial Periphrial Interface (SPI) Synchronous Bus)
Functional Description
TABLE 1. Instruction Set
Instruction Instruction Operation
Name Opcode
WREN 00000110 Set Write Enable Latch
WRDI 00000100 Reset Write Enable Latch
RDSR 00000101 Read Status Register
WRSR 00000001 Write Status Register
READ 00000011 Read Data from Memory
Array
WRITE 00000010 Write Data to Memory Array
MASTER: The device that generates the serial clock is desig­nated as the master. The NM25C640 can never function as a master.
SLAVE: The NM25C640 always operates as a slave as the serial clock pin is always an input.
TRANSMITTER/RECEIVER: The NM25C640 has separate pins for data transmission (SO) and reception (SI).
MSB: The Most Significant Bit is the first bit transmitted and received.
CHIP SELECT: The chip is selected when pin CS is low. When the chip is
not
selected, data will not be accepted from pin SI, and the
output pin SO is in high impedance. SERIAL OP-CODE: The first byte transmitted after the chip is
selected with CS going low contains the op-code that defines the operation to be performed.
PROTOCOL: When connected to the SPI port of a 68HC11 microcontroller, the NM25C640 accepts a clock phase of 0 and a clock polarity of 0. The SPI protocol for this device defines the byte transmitted on the SI and SO data lines for proper chip operation. See Figure 4.
FIGURE 4. SPI Protocol
CS
SCK
SI
SO
Bit 7 Bit 6 Bit 0
Bit 1Bit 7 Bit 0
CS
SI
SO
INVALID CODE
DS500041-7
DS500041-5
HOLD: The HOLD pin is used in conjunction with the CS to select the device. Once the device is selected and a serial sequence is underway, HOLD may be forced low to suspend further serial communication with the device without resetting the serial se­quence. Note that HOLD must be brought low while the SCK pin is low. The device must remain selected during this sequence. To resume serial communication HOLD is brought high while the SCK pin is low. The SO pin is at a high impedance state during HOLD.
INVALID OP-CODE: After an invalid code is received, no data is shifted into the NM25C640, and the SO data output pin remains high impedance until a new CS falling edge reinitializes the serial communication. See Figure 5 .
FIGURE 5. Invalid Op-Code
Data is clocked in on the positive SCK edge and out on the negative SCK edge.
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NM25C640 Rev. D.2
NM25C640 64K-Bit Serial CMOS EEPROM
(Serial Periphrial Interface (SPI) Synchronous Bus)
Functional Description (Continued)
CS
SI
SO
Read
Op-Code
Byte H Addr. n
Byte L
Addr. n
DatanData
n+1
Data
n+2
Data
n+3
CS
SI
SO
RDSR
Op-Code
SR Data
MSB…LSB
CS
SI
SO
WREN Op-Code
DS500041-8
DS500041-9
DS500041-10
READ SEQUENCE: Reading the memory via the serial SPI link requires the following sequence. The CS line is pulled low to select the device. The READ op-code is transmitted on the SI line followed by the high order address byte (A12–A8), and the low order address byte (A7–A0). The leading three bits in the high order address byte will be ignored. After this is done, data on the SI line becomes don’t care. The data (D7–D0) at the address specified is then shifted out on the SO line. If only one byte is to be read, the CS line can be pulled back to the high level. It is possible to continue the READ sequence as the byte adress is automatically incremented and data will continue to be shifted out. When the highest address is reached (1FFF), the address counter rolls over to lowest address (000) allowing the entire memory to be read in one continuous READ cycle. See Figure 6.
FIGURE 6. Read Sequence
READ STATUS REGISTER (RDSR) : The Read Status Register
(RDSR) instruction provides access to the status register is used to interrogate the READY/BUSY and WRITE ENABLE status of the chip. Two non-volatile status register bits are used to select one of four levels of BLOCK WRITE PROTECTION. The status register format is shown in Table 2.
TABLE 2. Status Register Format
Bit Bit Bit Bit Bit Bit Bit Bit
76543210
X X X X BP1 BP0 WEN RDY
X = Don't Care.
Status register Bit 0 = 0 (RDY) indicates that the device is READY; Bit 0 = 1 indicates that a program cycle is in progress. Bit 1 = 0 (WEN) indicates that the device is not WRITE ENABLED; Bit 1 = 1 indicates that the device is WRITE ENABLED. Non-volatile status register Bits 2 and 3 (BP0 and BP1) indicate the level of BLOCK WRITE PROTECTION selected. The block write protec­tion levels and corresponding status register control bits are shown in Table 3. Note that if a RDSR instruction is executed
during a programming cycle only the RDY bit is valid. All other bits are 1s. See Figure 7.
FIGURE 7. Read Status
TABLE 3. Block Write Protection Levels
Level Status Register Bits Array
Address
BP1 BP0 Protected
0 0 0 None 1 0 1 1800-1FFF 2 1 0 1000-1FFF 3 1 1 0000–1FFF
WRITE ENABLE (WREN): When VCC is applied to the chip, it “powers up” in the write disable state. Therefore, all programming modes must be preceded by a WRITE ENABLE (WREN) instruc­tion. Additionally, the WP must be held high during a write engble instruction. At the completion of a WRITE or WRSR cycle the device is automatically returned to the write disable state. Note that a WRITE DISABLE (WRD) instruction will also return the device to the write disable state. See Figure 8.
FIGURE 8. Write Enable
WRITE DISABLE (WRDI): To protect against accidental data
disturbance the WRITE DISABLE (WRDI) instruction disables all programming modes. See Figure 9.
FIGURE 9. Write Disable
CS
SI
SO
WRDI Op-Code
DS500041-11
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NM25C640 Rev. D.2
NM25C640 64K-Bit Serial CMOS EEPROM
(Serial Periphrial Interface (SPI) Synchronous Bus)
Functional Description (Continued)
WRITE SEQUENCE: To program the device, the WRITE PRO-
TECT (WP) pin must be held high and two separate instructions must be executed. The chip must first be write enabled via the WRITE ENABLE instruction and then a WRITE instruction must be executed. Moreover, the address of the memory location(s) to be programmed must be outside the protected address field selected by the Block Write Protection Level. See Table 3.
A WRITE command requires the following sequence. The CS line is pulled low to select the device, then the WRITE op-code is transmitted on the SI line followed by the high order address byte (A12-A8) and the low order address byte (A7–A0). The leading five bits in the high order address byte will be ignored. The address is followed by the data (D7–D0) to be written. Programming will start after the CS pin is forced back to a high level. Note that the LOW to HIGH transition of the CS pin must occur during the SCK low time immediately after clocking in the D0 data bit. See Figure
10.
FIGURE 10. End of WRITE Sequence
SCK
SI
SO
CS
D0D1D2
CS
SI
SO
Write
Op-Code
Byte H
Addr (n)
Byte L
Addr (n)
Data
(n)
Data
(n+1)
Data (n+2)
Data (n+3)
. . .
Data
(n+31)
CS
SI
SO
WRSR
Op-Code
SR Data
xxxxBP1BP0xx
DS500041-12
DS500041-13
The READY/BUSY status of the device can be determined by executing a READ STATUS REGISTER (RDSR) instruction. Bit 0 = 1 indicates that the WRITE cycle is still in progress and Bit 0 = 0 indicates that the WRITE cycle has ended. During the WRITE programming cycle (Bit 0 = 1) only the READ STATUS REGIS­TER instruction is enabled.
The NM25C640 is capable of a 32 byte PAGE WRITE operation. After receipt of each byte of data the five low order address bits are internally incremented by one. The eight high order bits of the address will remain constant. If the master should transmit more than 32 bytes of data, the address counter will “roll over,” and the previously loaded data will be reloaded. See Figure 11.
FIGURE 11. 32 Byte Page Write
At the completion of a WRITE cycle the device is automatically returned to the write disable state.
If the device is not WRITE enabled, the device will ignore the WRITE instruction and return to the standby state when CS is forced high. A new CS falling edge is required to re-initialize the serial communication.
WRITE STATUS REGISTER (WRSR): The WRITE STATUS REGISTER (WRSR) instruction is used to program the non­volatile status register Bits 2 and 3 (BP0 and BP1). The WRITE PROTECT (WP) pin must be held high and two separate instruc­tions must be executed. The chip must first be write enabled via the WRITE ENABLE instruction and then a WRSR instruction must be executed.
The WRSR command requires the following sequence. The CS line is pulled low to select the device and then the WRSR op-code is transmitted on the SI line followed by the data to be pro­grammed. See Figure 12.
FIGURE 12. Write Status Register
DS500041-14
Note that the first four bits are don’t care bits followed by BP1 and BP0 then two additional don’t care bits. Programming will start after the CS pin is forced back to a high level. As in the WRITE instruction the LOW to HIGH transition of the CS pin must occur during the SCK low time immediately after clocking in the last don’t care bit. See Figure 13.
FIGURE 13. Start WRSR Condition
The READY/BUSY status of the device can be determined by executing a READ STATUS REGISTER (RDSR) instruction. Bit 0 = 1 indicates that the WRSR cycle is still in progress and Bit 0 = 0 indicates that the WRSR cycle has ended.
At the completion of a WRITE cycle the device is automatically returned to the write disable state.
BP0
SCK
SI
SO
CS
DS500041-15
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NM25C640 Rev. D.2
NM25C640 64K-Bit Serial CMOS EEPROM
(Serial Periphrial Interface (SPI) Synchronous Bus)
Molded Small Out-Line Package (M8)
Package Number M08A
Molded Dual-In-Line Package (N)
Package Number N08E
Physical Dimensions inches (millimeters) unless otherwise noted
0.373 - 0.400
(9.474 - 10.16)
0.092
(2.337)
DIA
+
1234
8765
0.250 - 0.005 (6.35 ± 0.127)
87
0.032 ± 0.005
(0.813 ± 0.127)
Pin #1
Option 2
RAD
1
0.145 - 0.200
(3.683 - 5.080)
0.130 ± 0.005
(3.302 ± 0.127)
0.125 - 0.140
(3.175 - 3.556)
0.020
(0.508)
Min
0.018 ± 0.003
(0.457 ± 0.076)
90° ± 4°
Typ
0.100 ± 0.010
(2.540 ± 0.254)
0.040
(1.016)
0.039
(0.991)
Typ.
20° ± 1°
0.065
(1.651)
0.050
(1.270)
0.060
(1.524)
Pin #1 IDENT
Option 1
0.280
MIN
0.300 - 0.320 (7.62 - 8.128)
0.030
(0.762)
MAX
0.125
(3.175)
DIA
NOM
0.009 - 0.015
(0.229 - 0.381)
0.045 ± 0.015
(1.143 ± 0.381)
0.325
+0.040
-0.015
8.255
+1.016
-0.381
95° ± 5°
0.090
(2.286)
(7.112)
IDENT
1234
8765
0.189 - 0.197
(4.800 - 5.004)
0.228 - 0.244
(5.791 - 6.198)
Lead #1
IDENT
Seating
Plane
0.004 - 0.010
(0.102 - 0.254)
0.014 - 0.020
(0.356 - 0.508)
0.014
(0.356)
Typ.
0.053 - 0.069
(1.346 - 1.753)
0.050
(1.270)
Typ
0.016 - 0.050 (0.406 - 1.270) Typ. All Leads
8° Max, Typ.
All leads
0.150 - 0.157
(3.810 - 3.988)
0.0075 - 0.0098 (0.190 - 0.249) Typ. All Leads
0.04
(0.102)
All lead tips
0.010 - 0.020
(0.254 - 0.508)
x 45°
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NM25C640 Rev. D.2
NM25C640 64K-Bit Serial CMOS EEPROM
(Serial Periphrial Interface (SPI) Synchronous Bus)
Fairchild does not assume any responsibility for use of any circuitry described, no circuit patent licenses are implied and Fairchild reserves the right at any time without notice to change said circuitry and specifications.
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2. A critical component is any component of a life support device or system whose failure to perform can be reasonably ex­pected to cause the failure of the life support device or system, or to affect its safety or effectiveness.
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